JP4596794B2 - Alignment equipment for vacuum deposition - Google Patents

Alignment equipment for vacuum deposition Download PDF

Info

Publication number
JP4596794B2
JP4596794B2 JP2004052575A JP2004052575A JP4596794B2 JP 4596794 B2 JP4596794 B2 JP 4596794B2 JP 2004052575 A JP2004052575 A JP 2004052575A JP 2004052575 A JP2004052575 A JP 2004052575A JP 4596794 B2 JP4596794 B2 JP 4596794B2
Authority
JP
Japan
Prior art keywords
connecting plate
mask
vacuum
substrate
vacuum vessel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004052575A
Other languages
Japanese (ja)
Other versions
JP2005240121A (en
Inventor
利幸 岡田
昌弘 菊地
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Zosen Corp
Original Assignee
Hitachi Zosen Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Zosen Corp filed Critical Hitachi Zosen Corp
Priority to JP2004052575A priority Critical patent/JP4596794B2/en
Publication of JP2005240121A publication Critical patent/JP2005240121A/en
Application granted granted Critical
Publication of JP4596794B2 publication Critical patent/JP4596794B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Electroluminescent Light Sources (AREA)
  • Physical Vapour Deposition (AREA)

Description

本発明は、真空蒸着用アライメント装置に関するものである。   The present invention relates to an alignment apparatus for vacuum deposition.

従来、半導体基板などを製造する際に、真空容器内で半導体材料が蒸発されるとともに、基板表面に蒸着されて所定の導体パターンが形成されている。
この導体パターンを形成する場合、通常、基板の表面に導体パターンが形成されたマスクを配置し、その表面に塗布されたフォトレジストが露光されることにより行われている(例えば、特許文献1参照)。
特開2003−157973
Conventionally, when a semiconductor substrate or the like is manufactured, a semiconductor material is evaporated in a vacuum vessel and is deposited on the surface of the substrate to form a predetermined conductor pattern.
When forming this conductor pattern, usually, a mask having a conductor pattern formed thereon is placed on the surface of the substrate, and a photoresist applied on the surface is exposed (for example, see Patent Document 1). ).
JP2003-157773

ところで、真空容器内において、マスクに対して基板を所定位置に配置する必要があり、この位置合わせのためのアライメント装置が設けられている。
このアライメント装置は真空容器内に配置されることになるが、位置決め精度が高いアライメント装置を真空容器内に配置する場合、ガス放出が少ない特種な材料の部品、潤滑剤、放熱対策などを必要とするため、装置そのものが非常に高価なものとなる。
By the way, in the vacuum container, it is necessary to arrange the substrate at a predetermined position with respect to the mask, and an alignment device for this alignment is provided.
This alignment device will be placed in the vacuum vessel. However, when an alignment device with high positioning accuracy is placed in the vacuum vessel, it requires special material parts, lubricants, heat dissipation measures, etc. that emit less gas. Therefore, the device itself becomes very expensive.

一方、このような事態を回避するために、アライメント装置を真空容器の外部に配置することが考えられる。
このように、アライメント装置を真空容器の外部に配置する場合には、アライメント装置におけるマスク保持部材の真空容器内への挿入部分における真空維持機構が必要となり、したがって特殊なシール機構、または加工が必要となり、やはり装置が高価なものとなる。
On the other hand, in order to avoid such a situation, it is conceivable to arrange the alignment device outside the vacuum vessel.
As described above, when the alignment device is arranged outside the vacuum vessel, a vacuum maintaining mechanism is required at the portion where the mask holding member of the alignment device is inserted into the vacuum vessel, and therefore a special sealing mechanism or processing is required. After all, the device becomes expensive.

さらに、マスク保持部材の真空容器内への挿入部分には、真空力により、言い換えれば、大気圧による大きい外力を受けて、歪が生じ位置合わせ精度が低下する虞れがあった。
そこで、上記課題を解決するため、本発明は、装置自体の製造コストが安価で且つ高精度な位置決めを維持し得る真空蒸着用アライメント装置を提供することを目的とする。
Furthermore, the portion where the mask holding member is inserted into the vacuum container is subjected to a large external force due to the vacuum force, in other words, atmospheric pressure, which may cause distortion and lower the alignment accuracy.
Therefore, in order to solve the above-described problems, an object of the present invention is to provide an alignment apparatus for vacuum vapor deposition that can maintain positioning with high accuracy at a low manufacturing cost of the apparatus itself.

上記課題を解決するため、本発明に係る真空蒸着用アライメント装置は、真空容器内に保持された基板の表面に蒸着材料を所定パターンでもって蒸着させる際に用いられるマスクに対して当該基板の位置決めを行うアライメント装置であって、
上記真空容器内に保持されたマスクの上方に、当該真空容器の壁体部に形成された貫通穴を挿通された吊持部材を介して保持された基板の保持体と、
上記真空容器の外方に設けられるとともに上記吊持部材に連結された連結用板体と、
この連結用板体を移動させて保持体に保持された蒸着室内の基板のマスクに対する位置を調整し得る位置調整手段と、
上記吊持部材に外嵌されるとともに壁体部の貫通穴の外周と上記連結用板体との間に設けられて真空側と大気側とを遮断する第1伸縮式筒状遮断部材と、
上記第1伸縮式筒状遮断部材の内側が真空状態であることにより発生する連結用板体への押圧力と逆方向の付勢力を発生させる付勢手段とを具備し、
上記付勢手段を、連結用板体を跨ぐように壁体部上に立設された側面視が門形状の取付用フレームと、この取付用フレームと上記連結用板体とに亘って接続された第2伸縮式筒状遮断部材とから構成するとともに、この第2伸縮式筒状遮断部材を上記取付用フレーム内に形成された連通用穴を介して真空容器内に連通させ、
上記位置調整手段を、上記連結用板体をマスクの表面と平行な平面内で平行移動および回転させ得る平面内移動装置と、上記連結用板体をマスクと直交する軸心方向で移動させ得る鉛直移動装置とから構成し、
さらに上記平面内移動装置を、真空容器の壁体部側に設けられる駆動用支持機構および案内用支持機構と、これら支持機構により支持されてマスクの表面と平行に移動し得る移動板とから構成するとともに、この移動板と連結用板体とを昇降用案内機構を介して鉛直方向での移動を許容し得るようになし、 且つ上記昇降用案内機構を、上記移動板に立設されたガイド軸と、上記連結用板体側に設けられて上記ガイド軸をマスクと直交する軸心方向で移動自在に案内するガイド筒とから構成したものである。
To solve the above problems, a vacuum deposition alignment apparatus according to the present onset Ming, of the substrate relative to the mask used when depositing with a vapor deposition material on the surface of the substrate held in the vacuum chamber in a predetermined pattern An alignment device that performs positioning,
Above the mask held in the vacuum vessel, a substrate holding body held via a suspension member inserted through a through hole formed in the wall of the vacuum vessel,
A connecting plate provided outside the vacuum vessel and connected to the suspension member;
Position adjusting means capable of adjusting the position of the substrate in the vapor deposition chamber held by the holding body relative to the mask by moving the connecting plate;
A first telescopic cylindrical blocking member that is externally fitted to the suspension member and is provided between the outer periphery of the through hole of the wall portion and the connecting plate, and blocks the vacuum side and the atmosphere side;
A biasing means for generating a biasing force in a direction opposite to the pressing force to the connecting plate generated when the inside of the first telescopic cylindrical blocking member is in a vacuum state;
The biasing means is connected across the gate-shaped mounting frame, which is erected on the wall body so as to straddle the connecting plate, and the mounting frame and the connecting plate. The second telescopic cylindrical blocking member and the second telescopic cylindrical blocking member communicated with the inside of the vacuum container through the communication hole formed in the mounting frame.
The position adjusting means can move the connecting plate in a plane parallel to the surface of the mask and can move and move the connecting plate in an axial direction perpendicular to the mask. Consisting of a vertical movement device,
Further, the in-plane moving device includes a driving support mechanism and a guide support mechanism provided on the wall body side of the vacuum vessel, and a moving plate supported by these support mechanisms and capable of moving in parallel with the mask surface. In addition, the moving plate and the connecting plate body can be allowed to move in the vertical direction via the elevating guide mechanism, and the elevating guide mechanism is erected on the moving plate. A shaft and a guide cylinder provided on the connecting plate body side and movably guiding the guide shaft in an axial direction perpendicular to the mask .

上記真空蒸着用アライメント装置の構成によると、所定の真空下でマスクに対する基板の位置合わせを行う際に、真空容器の外部に基板のアライメント装置を配置したので、真空下を考慮した材料等を用いる必要がないとともに、特殊なシール機構などについても必要とせず、したがって装置自体の製造コストを安価にすることができる。 According to the above configuration vacuum deposition alignment apparatus, when performing the alignment of the substrate relative to the mask under a predetermined vacuum, since the substrate is placed in the alignment apparatus to the outside of the vacuum vessel, a material or the like in consideration of the under vacuum It is not necessary to use a special seal mechanism or the like, so that the manufacturing cost of the device itself can be reduced.

また、真空下で大気圧による押圧力に対向し得る付勢力を付与し得る付勢手段を具備したので、アライメント装置に余分な外力が作用するのを防止することができ、したがってマスクに対する基板の位置合わせを高精度に維持することができる。   In addition, since an urging means that can apply an urging force that can be opposed to the pressing force due to the atmospheric pressure under vacuum is provided, it is possible to prevent an extra external force from acting on the alignment apparatus, and accordingly, the substrate is not moved against the mask. The alignment can be maintained with high accuracy.

本発明の実施の形態に係る真空蒸着用アライメント装置を、図1〜図6に基づき説明する。
この真空蒸着用アライメント装置は真空蒸着装置に設けられるもので、例えば有機ELディスプレイの表示部の製造時に、マスクを用いてガラス基板の表面に有機材料を所定のパターンでもって蒸着させて導体パターンを得る際に、ガラス基板を保持するとともにマスクに対する当該ガラス基板の位置調整(アライメント)を行うためのものである。
An alignment apparatus for vacuum vapor deposition according to an embodiment of the present invention will be described with reference to FIGS.
This vacuum deposition alignment apparatus is provided in a vacuum deposition apparatus. For example, when a display unit of an organic EL display is manufactured, an organic material is deposited on the surface of a glass substrate with a predetermined pattern using a mask to form a conductor pattern. In obtaining, the glass substrate is held and the position of the glass substrate relative to the mask is adjusted (alignment).

図1に示すように、このアライメント装置1は、真空下でガラス基板の表面に有機材料を蒸着させるための蒸着室2を有する真空容器3の上壁部3aに取付用フランジ(壁体部の一例である)1aを介して設けられている。なお、取付用フランジを介さずに、真空容器の上面全体に亘って設けられる上壁部に、直接、取り付けるようにしてもよい。   As shown in FIG. 1, this alignment apparatus 1 includes a mounting flange (a wall portion of a wall portion) on an upper wall portion 3a of a vacuum vessel 3 having a vapor deposition chamber 2 for depositing an organic material on the surface of a glass substrate under vacuum. 1a), which is an example. In addition, you may make it attach directly to the upper wall part provided over the whole upper surface of a vacuum vessel, without passing through a flange for attachment.

上記真空容器3の蒸着室2の下部には蒸発源4が配置されるとともに、真空容器3の蒸着室2内の上方位置には、アライメント装置1を介してガラス基板(以下、基板という)5が保持され、またこの基板5の下方には、所定の導体パターンを形成するためのマスク6がその取付枠7を介してマスク保持体8により保持されている。なお、真空容器3の側壁部3bには、基板5およびマスク6の搬入出用開口部9が設けられており、基板5およびマスク6の搬入および搬出については、ロボットハンド(図示せず)が用いられる。   An evaporation source 4 is disposed below the vapor deposition chamber 2 of the vacuum vessel 3, and a glass substrate (hereinafter referred to as a substrate) 5 is disposed above the vapor deposition chamber 2 of the vacuum vessel 3 through the alignment device 1. A mask 6 for forming a predetermined conductor pattern is held by a mask holder 8 via an attachment frame 7 below the substrate 5. The side wall 3b of the vacuum vessel 3 is provided with a loading / unloading opening 9 for the substrate 5 and the mask 6. A robot hand (not shown) is used for loading and unloading the substrate 5 and the mask 6. Used.

上記アライメント装置1には、図2〜図4に示すように、板状のホルダ本体部11aに基板5を吸着し得るシート状の静電チャック部11bが設けられてなる例えば平面視が矩形状の基板ホルダ(基板の保持体)11と、この基板ホルダ11の左右2箇所に下端部が連結されるとともに上端部が取付用フランジ1aに形成された貫通穴1bを挿通されて真空容器3の外部に突出された2本の円筒状の吊持部材12と、真空容器3の外部に設けられて上記2本の吊持部材12の上端部に且つその上端開口部が上面に開口するように貫通して連結された例えば平面視矩形状の連結用板体13と、上記取付用フランジ1aの上面に配置されて連結用板体13を移動させて基板ホルダ11に保持された蒸着室2内における基板5のマスク6に対する位置を調整し得る位置調整手段14と、上記各吊持部材12に外嵌されるとともに取付用フランジ1aの貫通穴1bの外周と上記連結用板体13との間に設けられて真空側と大気側とを遮断する伸縮式筒状遮断部材(第1伸縮式筒状遮断部材で、例えば真空ベローズが用いられる)15と、この筒状遮断部材15の内側が真空状態であることにより発生する連結用板体13への押圧力(押付力)と逆方向の付勢力を発生させる(付与する)付勢手段16とが具備されている。なお、上記筒状遮断部材15と取付用フランジ1a側および連結用板体13側とは、それぞれ所定内径の下部環状取付座17および上部環状取付座18を介して連結されており、取付用フランジ1a側に設けられる上部環状取付座18への筒状遮断部材15における取付部開口面積(接触面積)に真空による力(大気圧による押圧力)が作用することになる。 As shown in FIGS. 2 to 4, the alignment apparatus 1 is provided with a sheet-like electrostatic chuck portion 11 b capable of attracting the substrate 5 to a plate-like holder main body portion 11 a. The substrate holder (substrate holding body) 11 and the left and right portions of the substrate holder 11 are connected to the lower end portion and the upper end portion is inserted through a through hole 1b formed in the mounting flange 1a. Two cylindrical suspension members 12 projecting to the outside, and provided on the outside of the vacuum vessel 3 so that the upper end portions of the two suspension members 12 and the upper end opening thereof open to the upper surface. For example, a connecting plate body 13 having a rectangular shape in plan view, which is connected through, and an inside of the vapor deposition chamber 2 which is arranged on the upper surface of the mounting flange 1 a and is moved by the connecting plate body 13 and held by the substrate holder 11. Of the substrate 5 with respect to the mask 6 Position adjusting means 14 that can be adjusted, and is provided between the outer periphery of the through-hole 1b of the mounting flange 1a and the connecting plate 13 by being externally fitted to each of the suspension members 12, and the vacuum side and the atmosphere. telescopic tubular blocking member for blocking the side (the first telescopic tubular shielding member, for example vacuum bellows is used) 15, generated by the inner side of the tubular shut-off member 15 is in a vacuum state There is provided urging means 16 that generates (applies) an urging force in a direction opposite to the pressing force (pressing force) to the connecting plate 13. The cylindrical blocking member 15 is connected to the mounting flange 1a side and the connecting plate body 13 side via a lower annular mounting seat 17 and an upper annular mounting seat 18 each having a predetermined inner diameter. A force (pressing force due to atmospheric pressure) due to vacuum acts on an opening area (contact area) of the attachment portion of the cylindrical blocking member 15 to the upper annular attachment seat 18 provided on the 1a side.

上記位置調整手段14は、連結用板体13を、マスク6の表面と平行な平面内で平行移動、回転(板体の中心を回転中心とした回転)および旋回(板体の中心とは異なる位置を中心にした回転)させ得る平面内移動装置21と、マスク6(連結用板体の表面でもある)と直交する鉛直方向(軸心方向)で移動させ得る鉛直移動装置22とから構成されている。   The position adjusting means 14 translates, rotates (rotates about the center of the plate body) and turns (rotates about the center of the plate body) in a plane parallel to the surface of the mask 6. The in-plane moving device 21 that can be rotated around the position) and the vertical moving device 22 that can be moved in the vertical direction (axial direction) perpendicular to the mask 6 (also the surface of the connecting plate). ing.

上記平面内移動装置21は、図4および図5に示すように、平面視が矩形状の支持板31と、この支持板31上の4隅の内、3箇所に配置された駆動用支持機構32および残りの1箇所に配置された案内用支持機構33と、これら各支持機構32,33に設けられた連結具34を介して支持された移動板35とから構成されており、またこの移動板35と連結用板体13とは昇降用案内機構36を介して鉛直方向での移動を許容するとともに水平面内での移動が連動(追従)するように構成されている。   As shown in FIGS. 4 and 5, the in-plane moving device 21 includes a support plate 31 having a rectangular shape in plan view, and driving support mechanisms arranged at three positions among four corners on the support plate 31. 32 and a guide support mechanism 33 arranged at the remaining one place, and a moving plate 35 supported via a connecting tool 34 provided in each of the support mechanisms 32 and 33. The plate 35 and the connecting plate 13 are configured to allow movement in the vertical direction via the lifting guide mechanism 36 and to move (follow) movement in the horizontal plane.

上記駆動用支持機構32は、公知の技術であり、図5に示すように、水平面内で、すなわちX−Y軸方向でリニアガイド機構37を介して移動し得るとともに、サーボモータ38により一方の軸方向(X軸またはY軸方向)に沿って強制移動を行い得るもので、また案内用支持機構33は、上記と同様のリニアガイド機構39を介してX−Y軸方向で自由に移動し得るようにされたものである。   The drive support mechanism 32 is a well-known technique, and as shown in FIG. 5, the drive support mechanism 32 can move through a linear guide mechanism 37 in a horizontal plane, that is, in the XY axis direction. It can be forcibly moved along the axial direction (X-axis or Y-axis direction), and the guide support mechanism 33 can freely move in the XY-axis direction via a linear guide mechanism 39 similar to the above. It has been made to get.

そして、3個の駆動用支持機構32の内、2個については、同一方向で強制移動し得るように配置されるとともに、残りの1個については、上記2個の強制移動方向と直交する方向で強制移動し得るように配置されて、これら3個の内、所定(1個、2個または3個)の駆動用支持機構32におけるサーボモータ38を駆動することにより、移動板35を、X軸方向(図5(b)参照)、Y軸方向(図5(c)参照)、X軸およびY軸に対して斜め方向(図5(d)参照)、並びに移動板35の中心を回転軸とする回転方向でもって(図5(e)参照)、また任意の支持機構32側を中心として旋回させる旋回方向でもって(図5(f)参照)、移動板35を水平面内で任意の方向並びに任意の回転角または旋回角でもって移動させ得るものである。   Of the three drive support mechanisms 32, two are arranged so that they can be forcibly moved in the same direction, and the remaining one is in a direction perpendicular to the two forcible movement directions. By moving the servo motor 38 in a predetermined (one, two, or three) driving support mechanisms 32 among these three, the moving plate 35 is moved to the X position. Axial direction (see FIG. 5B), Y-axis direction (see FIG. 5C), diagonal direction with respect to the X-axis and Y-axis (see FIG. 5D), and the center of the moving plate 35 are rotated. With the rotation direction as an axis (see FIG. 5 (e)) and with the turning direction for turning around the arbitrary support mechanism 32 side (see FIG. 5 (f)), the movable plate 35 can be moved freely in the horizontal plane. Can be moved in any direction and with any rotation or turning angle A.

上記昇降用案内機構36は、図3および図4に示すように、移動板35の上面に一体に設けられた平面視矩形状の取付板41と、この取付板41の前後で且つ左右位置で立設された4本のガイド軸42と、連結用板体13側に設けられてこれら各ガイド軸42に外嵌して上下方向で移動自在に案内される4個のガイド筒43とから構成されている。なお、図面上では、前部または後部に係る左右のガイド軸42およびガイド筒43だけを示している。   As shown in FIGS. 3 and 4, the elevating guide mechanism 36 includes a mounting plate 41 that is integrally formed on the upper surface of the moving plate 35 and has a rectangular shape in plan view, and the front and rear of the mounting plate 41 and at the left and right positions. It is composed of four guide shafts 42 that are erected and four guide cylinders 43 that are provided on the connecting plate 13 side and are externally fitted to the guide shafts 42 and are guided to be movable in the vertical direction. Has been. In the drawing, only the left and right guide shafts 42 and the guide cylinder 43 relating to the front part or the rear part are shown.

そして、鉛直移動装置22として、電動シリンダ(サーボモータにより駆動されるもの)が用いられ、この電動シリンダの出退用ロッド部22aが上記取付板41に連結されており、その出退用ロッド部22aを出退させることにより、連結用板体13を介して基板ホルダ11が昇降されて、マスク6に対する基板5の間隔が調整される。   An electric cylinder (driven by a servo motor) is used as the vertical moving device 22, and a rod part 22 a for exiting and retracting the electric cylinder is connected to the mounting plate 41. The substrate holder 11 is moved up and down through the connection plate 13 by moving the substrate 22 a back and forth, and the distance between the substrate 5 and the mask 6 is adjusted.

上記付勢手段16は、貫通穴1bを介して蒸着室2に連通されて真空状態になる筒状遮断部材15内の端面側に作用する大気圧による押圧力を打ち消す(または、軽減する)ためのものである。   The urging means 16 communicates with the vapor deposition chamber 2 through the through-hole 1b to cancel (or reduce) the pressing force due to the atmospheric pressure acting on the end face side in the cylindrical blocking member 15 that is in a vacuum state. belongs to.

すなわち、この付勢手段16は、連結用板体13を跨ぐように取付用フランジ1a上に立設された側面視が門形状の取付用フレーム51と、上記連結用板体13の左右位置に設けられた台座部52の上面に設けられた所定内径の下部環状取付座53と上記取付用フレーム51の水平部51aの下面に設けられた所定内径の上部環状取付座54と、これら上下部の環状取付座53,54同士に亘って接続された伸縮式筒状遮断部材(第2伸縮式筒状遮断部材で、例えば真空用ベローズが用いられる)55とから構成されるとともに、これら左右における各筒状遮断部材55内は、取付用フレーム51内に形成された連通用穴56を介して真空容器3内に連通されており、したがって、この連通用穴56の基端側は取付用フランジ1aに形成された連通穴1cを介して真空容器3内に連通されるとともに、他端側は取付用フレーム51の水平部51aに設けられた上部環状取付座54に対応する位置に開口されている。 That is, the urging means 16 is provided at the left and right positions of the gate-shaped mounting frame 51 and the connecting plate body 13 in a side view standing on the mounting flange 1 a so as to straddle the connecting plate body 13. A lower annular mounting seat 53 having a predetermined inner diameter provided on the upper surface of the provided pedestal portion 52; an upper annular mounting seat 54 having a predetermined inner diameter provided on the lower surface of the horizontal portion 51a of the mounting frame 51; annular mounting seat 53 attached telescoping tubular blocking member over each other while being composed of (second telescopic tubular shielding member, for example vacuum bellows is used) 55., in right and left Each cylindrical blocking member 55 communicates with the inside of the vacuum vessel 3 through a communication hole 56 formed in the mounting frame 51. Therefore, the base end side of the communication hole 56 is a mounting flange. Formed in 1a With communicates with the vacuum chamber 3 through the communication hole 1c, the other end is opened at a position corresponding to the upper annular attachment seat 54 provided on the horizontal portion 51a of the mounting frame 51.

そして、少なくとも、連結用板体13の上面(実際には、台座部52の上面)に設けられた下部環状取付座53とその下面に設けられた上部環状取付座18とにおける開口面積同士が等しくなるようにされている。すなわち、連結用板体13の上下面には、同一面積の真空接触部が設けられることになり、真空に起因して発生する押圧力が連結用板体13の上下面から均等に作用するため、連結用板体13に余分な外力が働くのが防止されている。   The opening areas of at least the lower annular mounting seat 53 provided on the upper surface of the connecting plate 13 (actually, the upper surface of the pedestal portion 52) and the upper annular mounting seat 18 provided on the lower surface thereof are equal. It is supposed to be. That is, the upper and lower surfaces of the connecting plate 13 are provided with vacuum contact portions having the same area, and the pressing force generated due to the vacuum acts evenly from the upper and lower surfaces of the connecting plate 13. Further, it is possible to prevent excessive external force from acting on the connecting plate 13.

また、図4に示すように、上記吊持部材12としては筒状のものが用いられるとともに、基板ホルダ11には両吊持部材12内の連通用穴12aに接続される通路(穴部である)11cが設けられて、吊持部材12の上端開口から水などの冷却流体を供給することにより、基板5を冷却し得るようにされており、またこれらの連通用穴12aの上端から静電チャック部11bへの電気配線が行われる。   As shown in FIG. 4, a cylindrical member is used as the suspension member 12, and a passage (hole portion) connected to the communication hole 12 a in the suspension members 12 is provided in the substrate holder 11. 11c) is provided so that the substrate 5 can be cooled by supplying a cooling fluid such as water from the upper end opening of the suspension member 12, and from the upper end of these communication holes 12a. Electrical wiring to the electric chuck portion 11b is performed.

さらに、図1および図3に示すように、マスク保持体8に保持されたマスク6に対して基板5の位置合わせを行うために、すなわち図6に示すように、マスク6の対角線上の隅部に設けられた円形のマスク側マークM1内に、基板5側に設けられた点状の基板側マークM2が入るように位置合わせを行うためのCCDカメラ装置57が連結用板体13側に設けられており、勿論、取付用フランジ1a側には、覗き窓58が設けられている。   Further, as shown in FIGS. 1 and 3, in order to align the substrate 5 with respect to the mask 6 held by the mask holder 8, that is, as shown in FIG. The CCD camera device 57 for positioning so that the dot-like substrate side mark M2 provided on the substrate 5 side enters the circular mask side mark M1 provided on the substrate is provided on the connecting plate 13 side. Of course, a viewing window 58 is provided on the mounting flange 1a side.

上記構成において、真空容器3内にてマスク6に対する基板5の位置合わせを行う作業について説明する。
まず、図1に示すように、真空容器3の側壁部3bに形成された搬入出用開口部9より、ロボットハンドを用いて、基板5をマスク保持体8により保持されたマスク6の上方に挿入するとともに、静電チャック部11bにて基板5を保持した後、ロボットハンドを真空容器3から出し、そして搬入出用開口部9を閉じる。なお、真空容器3内にマスク等を搬入または搬出する際には、少なくとも搬入出用開口部(正確に言えば、搬入出用開口部9に接続された空間側)9については、真空容器3内と同じ真空度に保たれた状態にされている。
An operation of aligning the substrate 5 with respect to the mask 6 in the vacuum container 3 in the above configuration will be described.
First, as shown in FIG. 1, the substrate 5 is placed above the mask 6 held by the mask holder 8 from the loading / unloading opening 9 formed in the side wall 3 b of the vacuum vessel 3 using a robot hand. While inserting and holding the board | substrate 5 in the electrostatic chuck | zipper part 11b, a robot hand is taken out from the vacuum vessel 3, and the opening part 9 for carrying in / out is closed. When a mask or the like is carried into or out of the vacuum vessel 3, at least the carry-in / out opening (to be precise, the space connected to the carry-in / out opening 9) 9 is used. It is kept in the same vacuum level as the inside.

この真空下では、上述したように、連結用板体13の上下面には、筒状遮断部材15,55(正確には、環状取付座18,53)により、同一面積の真空接触部が設けられたことになるため、当該連結用板体13には、真空による余分な外力が働くことはない。   Under this vacuum, as described above, the upper and lower surfaces of the connecting plate 13 are provided with vacuum contact portions of the same area by the cylindrical blocking members 15 and 55 (more precisely, the annular mounting seats 18 and 53). Therefore, no extra external force due to vacuum is applied to the connecting plate 13.

次に、マスク保持体8により蒸着室2内に保持されたマスク6に対して、上記基板ホルダ11により保持された基板5の位置合わせが行われる。
このマスク6に対する基板5の位置合わせには、対角線上に配置された2台のCCDカメラ装置57が用いられる。
Next, the substrate 5 held by the substrate holder 11 is aligned with the mask 6 held in the vapor deposition chamber 2 by the mask holder 8.
For alignment of the substrate 5 with respect to the mask 6, two CCD camera devices 57 arranged on a diagonal line are used.

すなわち、図6に示すように、マスク6側に設けられた円形のマスク側マークM1内に、基板5側に設けられた点状の基板側マークM2が入るように、位置調整手段14の平面内移動装置21が駆動された後、鉛直移動装置22により、マスク6の表面に、殆ど接触するように基板5が移動される。   That is, as shown in FIG. 6, the plane of the position adjusting means 14 is arranged so that the dot-like substrate side mark M2 provided on the substrate 5 side enters the circular mask side mark M1 provided on the mask 6 side. After the inner moving device 21 is driven, the substrate 5 is moved by the vertical moving device 22 so as to be almost in contact with the surface of the mask 6.

マスク6に対する基板5の位置合わせが完了すると、蒸発源4の加熱により、蒸着材料がマスク6のパターンに応じて基板5の表面に付着されて所定の導体パターンが形成される。   When the alignment of the substrate 5 with respect to the mask 6 is completed, the evaporation source 4 is heated to adhere the vapor deposition material to the surface of the substrate 5 according to the pattern of the mask 6 to form a predetermined conductor pattern.

所定の導体パターンが形成されると、ロボットアームにより搬入出用開口部9から基板5を取り出した後、新しい基板5を真空容器3内に挿入して基板ホルダ11に保持させ、そして上述したように、位置合わせを行い導体パターンを形成すればよい。   When the predetermined conductor pattern is formed, after the substrate 5 is taken out from the loading / unloading opening 9 by the robot arm, the new substrate 5 is inserted into the vacuum vessel 3 and held on the substrate holder 11 and as described above. In addition, alignment may be performed to form a conductor pattern.

このように、所定の真空下で、マスク6に対する基板5の位置合わせを行う際に、真空容器3の外部に基板5のアライメント装置1を配置したので、装置自体の構成を安価なものにすることができる。   As described above, when aligning the substrate 5 with respect to the mask 6 under a predetermined vacuum, the alignment device 1 for the substrate 5 is disposed outside the vacuum vessel 3, so that the configuration of the device itself is made inexpensive. be able to.

また、このアライメント装置1における基板5の吊持部材12を真空容器3の外部に導くための貫通穴1bを形成した際に、この貫通穴1bを大気側と遮断するための筒状遮断部材15の連結用板体13への取付部分の反対側に、当該筒状遮断部材15と同一の断面積を有するとともに真空容器3の真空下に連通された筒状遮断部材55(環状取付座18の開口面積)を接続するようにしたので、すなわち真空下で大気圧による押圧力に対向し得る付勢手段16を具備したので、アライメント装置1に余分な外力が作用するのを防止することができ、したがって装置に歪が発生することがないので、マスクに対する基板の位置合わせを高精度でもって行うことができる。   Further, when the through hole 1b for guiding the suspension member 12 of the substrate 5 in the alignment apparatus 1 to the outside of the vacuum vessel 3 is formed, the cylindrical blocking member 15 for blocking the through hole 1b from the atmosphere side. On the opposite side of the mounting portion to the connecting plate 13, the cylindrical blocking member 55 (the annular mounting seat 18 of the annular mounting seat 18) has the same cross-sectional area as the cylindrical blocking member 15 and communicated with the vacuum vessel 3 under vacuum. (Opening area) is connected, that is, the biasing means 16 that can be opposed to the pressing force due to the atmospheric pressure under vacuum is provided, so that it is possible to prevent an extra external force from acting on the alignment apparatus 1. Therefore, since no distortion occurs in the apparatus, the alignment of the substrate with respect to the mask can be performed with high accuracy.

詳しく説明すると、下記のような効果が得られる。
1.基板5を水平面内で移動させる平面内移動装置21および鉛直方向で移動させる鉛直移動装置22を真空容器3の外部(大気圧下)に配置したので、特殊な真空用機械要素や、モータの冷却装置を必要としないので、安価で且つ高精度なアライメント装置を提供することができる。
2.各移動装置21,22を真空容器3の外部(大気圧下)に配置するとともに、真空下で作用する押圧力に対向し得る付勢力を付与し得る付勢手段16を具備したので、真空により生じる各移動装置21,22に作用する力を軽減することができ、したがって移動装置におけるモータなどの駆動機器として容量の小さいものを用いることができるので、より安価な構成にし得る。
3.また、各移動装置21,22を真空容器3の外部(大気圧下)に配置するとともに、真空下で作用する押圧力に対向し得る付勢力を付与し得る付勢手段16を具備したので、装置自体に歪が発生するのを抑制し得るとともに、基板5の位置合わせ用のカメラ装置57における視野ずれを防止でき、したがって高精度な位置合わせを行うことができる。
4.静電チャック部11bにより基板5を保持するようにしているので、基板5の平面度を維持することが可能となり、したがってマスク6との距離を非常に小さくすることができるので、より高精度な位置合わせを行うことができる。
5.また、静電チャック部11bにより基板5を保持するようにしているので、基板5の平面度を維持して基板5をマスク6に均等な面圧で接触させることが可能となり、したがってより高精度な位置合わせを行うことができる。
6.基板ホルダ11を支持する吊持部材12およびホルダ本体部11a内に連通用穴12aおよび通路11cを形成するとともに、これら連通用穴12aおよび通路11c内を大気圧下としたので、基板ホルダ11の冷却を容易に行い得るとともに、静電チャック部11bへの電気配線についても容易に行うことができる。
More specifically, the following effects can be obtained.
1. Since the in-plane moving device 21 for moving the substrate 5 in the horizontal plane and the vertical moving device 22 for moving in the vertical direction are arranged outside the vacuum vessel 3 (under atmospheric pressure), special vacuum mechanical elements and motor cooling are provided. Since no apparatus is required, an inexpensive and highly accurate alignment apparatus can be provided.
2. Since each of the moving devices 21 and 22 is disposed outside the vacuum vessel 3 (under atmospheric pressure) and includes a biasing means 16 that can apply a biasing force that can be opposed to the pressing force acting under vacuum, Since the force which acts on each moving apparatus 21 and 22 which arises can be reduced, and what has a small capacity | capacitance can be used as drive devices, such as a motor in a moving apparatus, it can be set as a cheaper structure.
3. In addition, since each moving device 21, 22 is arranged outside the vacuum vessel 3 (under atmospheric pressure), and provided with a biasing means 16 that can apply a biasing force that can be opposed to the pressing force acting under vacuum, The distortion of the apparatus itself can be suppressed, and the visual field shift in the camera apparatus 57 for alignment of the substrate 5 can be prevented, so that highly accurate alignment can be performed.
4). Since the substrate 5 is held by the electrostatic chuck portion 11b, the flatness of the substrate 5 can be maintained, and therefore the distance from the mask 6 can be made very small. Alignment can be performed.
5. Further, since the substrate 5 is held by the electrostatic chuck portion 11b, the flatness of the substrate 5 can be maintained and the substrate 5 can be brought into contact with the mask 6 with a uniform surface pressure, and therefore, higher accuracy can be achieved. Alignment can be performed.
6). The communication holes 12a and the passages 11c are formed in the suspension member 12 and the holder main body 11a for supporting the substrate holder 11, and the communication holes 12a and the passages 11c are under atmospheric pressure. Cooling can be easily performed, and electrical wiring to the electrostatic chuck portion 11b can be easily performed.

ところで、上述した実施の形態においては、有機EL材料をガラス基板に蒸着させる真空蒸着装置におけるアライメント装置として説明したが、勿論、真空蒸着の対象としては、この有機EL材料に限定されるものでもなく、例えば半導体装置の製造に際して、真空容器内でマスクを用いて基板上に導体パターンを形成するための装置であれば、どのような真空蒸着装置にでも適用し得るものである。 However, those in the form of implementation described above has been described an organic EL material as an alignment device in a vacuum deposition apparatus for depositing the glass substrate, of course, as the target of the vacuum deposition, to be limited to the organic EL material In addition, for example, when a semiconductor device is manufactured, the present invention can be applied to any vacuum evaporation apparatus as long as it is an apparatus for forming a conductor pattern on a substrate using a mask in a vacuum vessel.

本発明の実施の形態に係るアライメント装置が設けられた真空蒸着装置の概略構成を示す断面図である。Alignment device according to the shape condition of the present invention is a cross-sectional view showing a schematic configuration of a vacuum vapor deposition apparatus provided. 同アライメント装置における基板ホルダおよびマスクの概略斜視図である。It is a schematic perspective view of the substrate holder and mask in the alignment apparatus. 同アライメント装置の概略斜視図である。It is a schematic perspective view of the alignment apparatus. 同アライメント装置の断面図である。It is sectional drawing of the alignment apparatus. 同アライメント装置における平面内移動装置の平面図で、(a)は平面内移動装置の構成を示すもので、(b)〜(f)はその動作を説明するものである。It is a top view of the in-plane movement apparatus in the alignment apparatus, (a) shows the structure of an in-plane movement apparatus, (b)-(f) demonstrates the operation | movement. 同アライメント装置における基板とマスクとの位置合わせ動作を説明する平面図である。It is a top view explaining the alignment operation | movement of the board | substrate and mask in the alignment apparatus.

1 アライメント装置
1a 取付用フランジ
1b 貫通穴
2 蒸着室
3 真空容器
5 ガラス基板
6 マスク
11 基板ホルダ
12 吊持部材
12a 連通用穴
13 連結用板体
14 位置調整手段
15 筒状遮断部材
16 付勢手段
18 上部環状取付座
21 平面内移動装置
22 鉛直移動装置
51 取付用フレーム
52 台座部
53 下部環状取付座
55 筒状遮断部材
56 連通用穴
DESCRIPTION OF SYMBOLS 1 Alignment apparatus 1a Mounting flange 1b Through-hole 2 Deposition chamber 3 Vacuum container 5 Glass substrate 6 Mask 11 Substrate holder 12 Suspension member 12a Communication hole 13 Connecting plate 14 Position adjustment means 15 Cylindrical blocking member 16 Energizing means 18 Upper annular mounting seat 21 In-plane moving device 22 Vertical moving device 51 Mounting frame 52 Base portion 53 Lower annular mounting seat 55 Cylindrical blocking member 56 Communication hole

Claims (1)

真空容器内に保持された基板の表面に蒸着材料を所定パターンでもって蒸着させる際に用いられるマスクに対して当該基板の位置決めを行うアライメント装置であって、
上記真空容器内に保持されたマスクの上方に、当該真空容器の壁体部に形成された貫通穴を挿通された吊持部材を介して保持された基板の保持体と、
上記真空容器の外方に設けられるとともに上記吊持部材に連結された連結用板体と、
この連結用板体を移動させて保持体に保持された蒸着室内の基板のマスクに対する位置を調整し得る位置調整手段と、
上記吊持部材に外嵌されるとともに壁体部の貫通穴の外周と上記連結用板体との間に設けられて真空側と大気側とを遮断する第1伸縮式筒状遮断部材と、
上記第1伸縮式筒状遮断部材の内側が真空状態であることにより発生する連結用板体への押圧力と逆方向の付勢力を発生させる付勢手段とを具備し、
上記付勢手段を、連結用板体を跨ぐように壁体部上に立設された側面視が門形状の取付用フレームと、この取付用フレームと上記連結用板体とに亘って接続された第2伸縮式筒状遮断部材とから構成するとともに、この第2伸縮式筒状遮断部材を上記取付用フレーム内に形成された連通用穴を介して真空容器内に連通させ、
上記位置調整手段を、上記連結用板体をマスクの表面と平行な平面内で平行移動および回転させ得る平面内移動装置と、上記連結用板体をマスクと直交する軸心方向で移動させ得る鉛直移動装置とから構成し、
さらに上記平面内移動装置を、真空容器の壁体部側に設けられる駆動用支持機構および案内用支持機構と、これら支持機構により支持されてマスクの表面と平行に移動し得る移動板とから構成するとともに、この移動板と連結用板体とを昇降用案内機構を介して鉛直方向での移動を許容し得るようになし、 且つ上記昇降用案内機構を、上記移動板に立設されたガイド軸と、上記連結用板体側に設けられて上記ガイド軸をマスクと直交する軸心方向で移動自在に案内するガイド筒とから構成したことを特徴とする真空蒸着用アライメント装置。
An alignment apparatus for positioning the substrate with respect to a mask used when vapor deposition material is deposited in a predetermined pattern on the surface of the substrate held in a vacuum vessel,
Above the mask held in the vacuum vessel, a substrate holding body held via a suspension member inserted through a through hole formed in the wall of the vacuum vessel,
A connecting plate provided outside the vacuum vessel and connected to the suspension member;
Position adjusting means capable of adjusting the position of the substrate in the vapor deposition chamber held by the holding body relative to the mask by moving the connecting plate;
A first telescopic cylindrical blocking member that is externally fitted to the suspension member and is provided between the outer periphery of the through hole of the wall portion and the connecting plate, and blocks the vacuum side and the atmosphere side;
A biasing means for generating a biasing force in a direction opposite to the pressing force to the connecting plate generated when the inside of the first telescopic cylindrical blocking member is in a vacuum state;
The biasing means is connected across the gate-shaped mounting frame, which is erected on the wall body so as to straddle the connecting plate, and the mounting frame and the connecting plate. The second telescopic cylindrical blocking member and the second telescopic cylindrical blocking member communicated with the inside of the vacuum container through the communication hole formed in the mounting frame.
The position adjusting means can move the connecting plate in a plane parallel to the surface of the mask and can move and move the connecting plate in an axial direction perpendicular to the mask. Consisting of a vertical movement device,
Further, the in-plane moving device includes a driving support mechanism and a guide support mechanism provided on the wall body side of the vacuum vessel, and a moving plate supported by these support mechanisms and capable of moving in parallel with the mask surface. In addition, the moving plate and the connecting plate body can be allowed to move in the vertical direction via the elevating guide mechanism, and the elevating guide mechanism is erected on the moving plate. An alignment apparatus for vacuum vapor deposition comprising a shaft and a guide tube provided on the connecting plate body side and movably guiding the guide shaft in an axial direction perpendicular to the mask .
JP2004052575A 2004-02-27 2004-02-27 Alignment equipment for vacuum deposition Expired - Fee Related JP4596794B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004052575A JP4596794B2 (en) 2004-02-27 2004-02-27 Alignment equipment for vacuum deposition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004052575A JP4596794B2 (en) 2004-02-27 2004-02-27 Alignment equipment for vacuum deposition

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2010091018A Division JP5153813B2 (en) 2010-04-12 2010-04-12 Alignment equipment for vacuum deposition

Publications (2)

Publication Number Publication Date
JP2005240121A JP2005240121A (en) 2005-09-08
JP4596794B2 true JP4596794B2 (en) 2010-12-15

Family

ID=35022159

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004052575A Expired - Fee Related JP4596794B2 (en) 2004-02-27 2004-02-27 Alignment equipment for vacuum deposition

Country Status (1)

Country Link
JP (1) JP4596794B2 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100549215C (en) * 2005-08-25 2009-10-14 日立造船株式会社 Calibration device for vacuum evaporation plating
WO2007023552A1 (en) * 2005-08-25 2007-03-01 Hitachi Zosen Corporation Alignment device for vacuum deposition
KR100712953B1 (en) * 2006-06-16 2007-05-02 두산디앤디 주식회사 Substrate align device and align method using the same
KR101060652B1 (en) * 2008-04-14 2011-08-31 엘아이지에이디피 주식회사 Organic material deposition apparatus and deposition method using the same
JP5783811B2 (en) * 2010-07-06 2015-09-24 キヤノン株式会社 Deposition equipment
JP5639431B2 (en) * 2010-09-30 2014-12-10 キヤノントッキ株式会社 Deposition equipment
JP5693378B2 (en) * 2011-05-25 2015-04-01 株式会社アルバック Mobile device
KR20200087549A (en) * 2019-01-11 2020-07-21 캐논 톡키 가부시키가이샤 Film forming apparatus, manufacturing apparatus of electronic device, film forming method, and manufacturing method of electronic device
JP7379072B2 (en) * 2019-01-11 2023-11-14 キヤノントッキ株式会社 Film forming equipment, electronic device manufacturing equipment, film forming method, and electronic device manufacturing equipment
CN116121697A (en) * 2022-11-04 2023-05-16 南方科技大学 Electrode alignment and growth system and method for ultra-high vacuum film samples

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004027291A (en) * 2002-06-25 2004-01-29 Tokki Corp Vapor deposition apparatus
JP2004176124A (en) * 2002-11-27 2004-06-24 Ulvac Japan Ltd Alignment apparatus, film deposition system, and alignment method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004027291A (en) * 2002-06-25 2004-01-29 Tokki Corp Vapor deposition apparatus
JP2004176124A (en) * 2002-11-27 2004-06-24 Ulvac Japan Ltd Alignment apparatus, film deposition system, and alignment method

Also Published As

Publication number Publication date
JP2005240121A (en) 2005-09-08

Similar Documents

Publication Publication Date Title
JP4785856B2 (en) Alignment equipment for vacuum deposition
KR101993532B1 (en) Film formation apparatus, film formation method and manufacturing method of electronic device
JP4624236B2 (en) Alignment equipment for vacuum deposition
JP5639431B2 (en) Deposition equipment
JP5277059B2 (en) Film forming apparatus and film forming system
JP4596794B2 (en) Alignment equipment for vacuum deposition
KR101190106B1 (en) Alignment device for vacuum deposition
KR20150096438A (en) Film formation device
WO2021015224A1 (en) Alignment mechanism, alignment method, film formation device, and film formation method
JP5153813B2 (en) Alignment equipment for vacuum deposition
JP7499571B2 (en) Film forming apparatus, electronic device manufacturing apparatus, film forming method, and electronic device manufacturing method
JP2013125795A (en) Substrate positioning device and substrate positioning method
KR102179271B1 (en) Film forming apparatus, manufacturing apparatus of electronic device, film forming method, and manufacturing method of electronic device
KR101623203B1 (en) Vacuum chuck apparatus
JP7048696B2 (en) Film forming equipment
KR102257008B1 (en) Film forming apparatus, film forming method, and manufacturing method of electronic device
JP7051969B2 (en) Film forming equipment
KR20200059517A (en) laser processing apparatus
JP7379072B2 (en) Film forming equipment, electronic device manufacturing equipment, film forming method, and electronic device manufacturing equipment
WO2024047999A1 (en) Film formation device, method for driving film formation device, and film formation method
WO2024053192A1 (en) Film forming device, method for operating film forming device, and film forming method
TWI377259B (en)
JP2020111823A (en) Film deposition apparatus and method for manufacturing electronic device
KR20210026672A (en) Vacuum apparatus

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20061221

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20080430

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20090716

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090721

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090907

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20091007

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100223

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100412

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20100824

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20100921

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20131001

Year of fee payment: 3

LAPS Cancellation because of no payment of annual fees