JP4579003B2 - 物理量センサの製造方法 - Google Patents
物理量センサの製造方法 Download PDFInfo
- Publication number
- JP4579003B2 JP4579003B2 JP2005045296A JP2005045296A JP4579003B2 JP 4579003 B2 JP4579003 B2 JP 4579003B2 JP 2005045296 A JP2005045296 A JP 2005045296A JP 2005045296 A JP2005045296 A JP 2005045296A JP 4579003 B2 JP4579003 B2 JP 4579003B2
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- JP
- Japan
- Prior art keywords
- physical quantity
- quantity sensor
- jig
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- portions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000004519 manufacturing process Methods 0.000 title claims description 32
- 239000011347 resin Substances 0.000 claims description 78
- 229920005989 resin Polymers 0.000 claims description 78
- 238000003825 pressing Methods 0.000 claims description 10
- 238000007789 sealing Methods 0.000 claims description 2
- 239000000945 filler Substances 0.000 description 9
- 230000017525 heat dissipation Effects 0.000 description 9
- 238000002347 injection Methods 0.000 description 9
- 239000007924 injection Substances 0.000 description 9
- 238000000034 method Methods 0.000 description 9
- 239000000463 material Substances 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 238000005452 bending Methods 0.000 description 4
- 238000003780 insertion Methods 0.000 description 4
- 230000037431 insertion Effects 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 4
- 229910001369 Brass Inorganic materials 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 239000010951 brass Substances 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 1
- 239000011231 conductive filler Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49171—Fan-out arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Landscapes
- Moulds For Moulding Plastics Or The Like (AREA)
- Injection Moulding Of Plastics Or The Like (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Description
また、ステージ部に、冶具の少なくとも一部の形状と係合する凹部または凸部を形成することによって、冶具を所定量挿入する簡易な操作で適正にステージ部を傾斜させることができるとともに、金型内に樹脂を射出する際に、ステージ部に形成された凹部または凸部と冶具が係合するため、確実にステージ部が保持され、樹脂の射出による歪みやずれが生じることはなく、ステージ部を所定の傾斜角に固定することができる。
Claims (3)
- 矩形枠部と、該矩形枠部から内方に突出する複数のリードと、連結リードにより前記矩形枠部と連結される複数のステージ部とを備えるリードフレームを用いて、該リードフレームの前記複数のステージ部にそれぞれ物理量センサチップを固着し、前記物理量センサチップおよび前記リードを樹脂封止する物理量センサの製造方法において、
1つの冶具を前記複数のステージ部に押圧することによって前記複数のステージ部を前記矩形枠部に対して傾斜させるとともに前記物理量センサチップを傾斜させ、傾斜した前記複数のステージ部が前記冶具の少なくとも一部の形状と係合する凹部または凸部を備え、該1つの冶具によって傾斜が保持された状態で樹脂封止することを特徴とする物理量センサの製造方法。 - 請求項1記載の物理量センサの製造方法において、
前記冶具を抜脱したのち、前記冶具を抜脱した凹部に充填物を充填することを特徴とする物理量センサの製造方法。 - 請求項1から2のいずれか記載の物理量センサの製造方法において、
前記連結リードが、前記2つのステージ部を傾斜させる際に折り曲げることができる折曲部を有することを特徴とする物理量センサの製造方法。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005045296A JP4579003B2 (ja) | 2005-02-22 | 2005-02-22 | 物理量センサの製造方法 |
PCT/JP2005/018470 WO2006040987A1 (ja) | 2004-10-08 | 2005-10-05 | 物理量センサの製造方法 |
TW94134803A TWI280400B (en) | 2004-10-08 | 2005-10-05 | Manufacturing method for physical amount sensors |
KR20077008902A KR20070049687A (ko) | 2004-10-08 | 2005-10-05 | 물리량 센서의 제조 방법 |
US11/696,949 US7754130B2 (en) | 2004-10-08 | 2007-04-05 | Method for manufacturing physical quantity sensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005045296A JP4579003B2 (ja) | 2005-02-22 | 2005-02-22 | 物理量センサの製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006231536A JP2006231536A (ja) | 2006-09-07 |
JP4579003B2 true JP4579003B2 (ja) | 2010-11-10 |
Family
ID=37039730
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005045296A Expired - Fee Related JP4579003B2 (ja) | 2004-10-08 | 2005-02-22 | 物理量センサの製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4579003B2 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20070049687A (ko) * | 2004-10-08 | 2007-05-11 | 야마하 가부시키가이샤 | 물리량 센서의 제조 방법 |
-
2005
- 2005-02-22 JP JP2005045296A patent/JP4579003B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2006231536A (ja) | 2006-09-07 |
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