JP4563113B2 - Silicon oxide film forming method, semiconductor device manufacturing method, and substrate processing apparatus - Google Patents

Description

The present invention relates to a method for forming a silicon oxide film, a method for manufacturing a semiconductor device, and a substrate processing apparatus , and in particular, silicon oxide for forming a silicon oxide film on a semiconductor wafer (hereinafter referred to as a wafer) when manufacturing a semiconductor device. The present invention relates to a film forming method , a semiconductor device manufacturing method having a silicon oxide film forming step, and a substrate processing apparatus suitably used for the silicon oxide film forming step .

In recent years, with the increase in density and multilayer wiring of semiconductor devices, film formation at low temperature is required, and furthermore, surface flatness, recessed portion embedding property, step coverage property are excellent, and moisture and impurity transmission are suppressed. There has been a need for silicon oxide film materials. As a conventional method for forming a silicon oxide film by a CVD method, film formation (680 ° C.-700 ° C.) by thermal decomposition of tetraethoxysilane (TEOS: Si (OC ₂ H ₅ ) ₄ ) has been mainly used. In order to prevent the re-diffusion of silicon, a low temperature is required, and silicon oxide film formation (580 ° C.-600 ° C.) using a combination of Bistally butylaminosilane and O ₂ has come to be used. Further, as a silicon oxide film forming method (400 ° C.-500 ° C.) capable of forming at a low temperature, triethoxysilane (HSi (OC ₂ H ₅ ) ₃ ) or bismethylsilylethane (H ₂ Si (CH ₃ ) CH ₂ CH There is an oxide film formation method using a combination of a raw material such as ₂ Si (CH ₃ ) H ₂ ) and O ₂ .

However, the low temperature oxide film forming method using these materials has a problem that the step coverage characteristic is poor. For this reason, in order to satisfy the above requirements, a thermal CVD method using O ₃ and TEOS as source gases has been performed. However, this method tends to depend on the surface. For example, if left in a clean room, adsorbed water and hydroxyl groups are formed on the surface, causing voids and causing surface roughness.

In the conventional film forming method, the oxide is formed through the process of adhesion of the raw material to the wafer surface, decomposition of the raw material by heat, reaction with oxidizing species, and separation of by-products from the wafer surface. For example, in the TEOS film formation process, it is considered that film formation ideally proceeds as follows. (1) TEOS is adsorbed on Si surface, (2) OH group on Si surface and OC ₂ H ₅ group of TEOS form Si—O—Si bond, (3) Other OC ₂ H ₅ groups on TEOS There leaving as a by-product, such as _{C 2 H 5 OH, (4} ) forming a SiO ₂ film on the Si surface, the SiO ₂ through the steps film is formed. Here, if a part of the Si surface is covered with a hydrophilic group such as OH, the adsorption of TEOS and the conversion to an oxide film at that part proceed at a very high rate. For this reason. The film formation rate at the portion covered with the hydrophilic group is high, the film formation rate at the portion covered with the hydrophobic group is low, and the surface flatness is deteriorated. In addition, in forming an oxide film using TEOS and O ₃ as raw materials, intermediate products such as Si (OC ₂ H ₅ ) ₂ (OH) ₂ and Si ₂ (OC ₂ H ₅ ) ₆ are formed in the gas phase. And adsorbed on the wafer surface. For this reason, in the embedding in the recess, the thick film is large at the opening of the recess and the film thickness is small at the bottom of the recess due to the concentration distribution of these intermediate products. This is more remarkable as the O ₃ concentration is larger, and the step coverage is worsened.

  As described above, the silicon oxide film forming method by the thermal CVD method using the decomposition of the raw material gas by heat has problems in surface flatness, recess embedding property, and step coverage.

On the other hand, atomic layer deposition of triethoxysilane (TRIES: SiH (OC ₂ H ₅ ) ₃ ), trisdimethylaminosilicon (TriDMASi: SiH (N (CH ₃ ) ₂ ) ₃ ), hereinafter referred to as TDMAS) and O ₃ ( When performing ALD), SiO ₂ is deposited one layer at a time, so surface roughness due to abnormal growth on the surface, or defects such as step coverage in embedding in recesses are not seen, and good film formation characteristics are obtained. It is done.

  In atomic layer deposition, two types (or more) of source gases used for deposition are alternately supplied onto the substrate under a certain deposition condition (temperature, time, etc.) on a single atomic layer basis. In this method, the film is adsorbed by using a surface reaction to form a film. In atomic layer deposition, a purge step is inserted between the step of flowing the first source gas to the substrate and the step of flowing the second source gas to the substrate, so that a sub-layer in the gas layer is formed like thermal CVD. There is no influence by the product, and it is possible to form a film one by one completely. For this reason, the embedding characteristic in a recessed part is favorable.

However, in the atomic layer film formation, the film formation is performed one layer at a time, so there is a disadvantage that the film formation speed is slow. In the atomic layer film formation using TDMAS and O ₃ , the film formation speed is 0.2 nm / nm at 500 ° C. It is about min, which is disadvantageous for thick film formation such as embedding.

Therefore, a primary object of the present invention is capable of film formation at low temperatures, surface flatness, recess embedding property, excellent step coverage, a method of forming a silicon oxide film which is excellent in film forming rate, the silicon oxide film It is providing the manufacturing method of the semiconductor device which has these formation processes, and the substrate processing apparatus used suitably for the formation process of the said silicon oxide film .

According to the present invention,
A silicon oxide film forming method for forming a silicon oxide film on a substrate carried into a processing chamber and heated to a predetermined temperature,
A step of the first source gas containing silicon atoms is supplied, an amorphous silicon film of several atomic layers by a CVD method on the substrate in the processing chamber,
A step of discharging and stopping the supply of the first source gas, the first raw material gas remaining in the processing chamber from the said processing chamber,
Supplying a second source gas containing oxygen atoms into the processing chamber, and reacting with the amorphous silicon film formed on the substrate to form a silicon oxide film;
A step of discharging and stopping the supply of the pre-Symbol second source gas, the second source gas remaining in the processing chamber from the said processing chamber,
The method of forming a silicon oxide film comprising the step of forming a silicon oxide film having a predetermined thickness on the substrate by repeating this cycle a plurality of times .
Moreover, according to the present invention,
A silicon oxide film forming method for forming a silicon oxide film on a substrate carried into a processing chamber and heated to a predetermined temperature,
Supplying a first source gas containing silicon atoms into the processing chamber and thermally decomposing the first source gas to form an amorphous silicon film of several atomic layers on the substrate;
Stopping the supply of the first source gas and discharging the first source gas remaining in the processing chamber from the processing chamber;
Supplying a second source gas containing oxygen atoms into the processing chamber, and reacting with the amorphous silicon film formed on the substrate to form a silicon oxide film;
Stopping the supply of the second source gas and discharging the second source gas remaining in the processing chamber from the processing chamber;
The method of forming a silicon oxide film comprising the step of forming a silicon oxide film having a predetermined thickness on the substrate by repeating this cycle a plurality of times.

Preferably, the first source gas contains silane (SiH ₄ ) , and the temperature of the substrate in each step is set to 350 to 450 ° C. When silane (SiH ₄ ) is used as the source gas, an amorphous silicon film can be formed in this temperature range.

Preferably, the first source gas contains disilane (Si ₂ H ₆ ) , and the temperature of the substrate in each step is set to 450 to 550 ° C. When disilane (Si ₂ H ₆ ) is used as the source gas, an amorphous silicon film can be formed in this temperature range.
Preferably, the pressure in the processing chamber in each step is 1 Pa or more and 10,000 Pa or less.

Also according to the invention,
A processing chamber for processing the substrate;
Heating means for heating the substrate to a predetermined temperature,
First source gas supply means for supplying a first source gas containing silicon atoms to the processing chamber;
Second source gas supply means for supplying a second source gas containing oxygen atoms to the processing chamber;
Exhaust means for exhausting the processing chamber;
In a state where the substrate carried into the processing chamber is heated to a predetermined temperature, the first source gas is supplied into the processing chamber, and an amorphous silicon film of several atomic layers is formed on the substrate by a CVD method. Processing, stopping the supply of the first source gas, discharging the first source gas remaining in the processing chamber from the processing chamber, and supplying the second source gas into the processing chamber. A process of reacting with the amorphous silicon film formed on the substrate to form a silicon oxide film, and the supply of the second source gas is stopped and the second source gas remaining in the process chamber is reduced. as treatment and, one cycle discharged from the processing chamber by repeating this cycle a plurality of times, so as to form a silicon oxide film having a predetermined thickness on said substrate, said heating means, said first And control means for controlling the raw material gas supply means, said second source gas supply means and said exhaust means,
The substrate processing apparatus according to claim Rukoto which have a are provided.
Also according to the invention,
A processing chamber for processing the substrate;
Heating means for heating the substrate to a predetermined temperature;
First source gas supply means for supplying a first source gas containing silicon atoms to the processing chamber;
Second source gas supply means for supplying a second source gas containing oxygen atoms to the processing chamber;
Exhaust means for exhausting the processing chamber;
In a state in which the substrate carried into the processing chamber is heated to a predetermined temperature, the first source gas is supplied into the processing chamber to thermally decompose the first source gas, and several atoms are formed on the substrate. A process of forming a layer of amorphous silicon film, a process of stopping the supply of the first source gas and discharging the first source gas remaining in the process chamber from the process chamber, and the process chamber A process of supplying a second source gas to react with the amorphous silicon film formed on the substrate to form a silicon oxide film, and stopping the supply of the second source gas to remain in the process chamber The process of discharging the second source gas from the processing chamber is set as one cycle, and by repeating this cycle a plurality of times, the silicon oxide film having a predetermined thickness is formed on the substrate. And heat means, said first source gas supply means, control means for controlling the second source gas supply means and said exhaust means,
A substrate processing apparatus is provided.

Moreover, according to the present invention,
Processing is carried into the chamber, a method of manufacturing a semiconductor device having a step of forming a silicon oxide film on a substrate heated to a predetermined temperature,
In the step of forming the silicon oxide film,
Supplying a first source gas containing silicon atoms into the processing chamber and forming an amorphous silicon film of several atomic layers on the substrate by a CVD method ;
Stopping the supply of the first source gas and discharging the first source gas remaining in the processing chamber from the processing chamber;
Supplying a second source gas containing oxygen atoms into the processing chamber, and reacting with the amorphous silicon film formed on the substrate to form a silicon oxide film;
Stopping the supply of the pre-Symbol second raw material gas, a step of discharging the second raw material gas remaining in the processing chamber from the processing chamber,
A semiconductor device manufacturing method is provided in which a silicon oxide film having a predetermined thickness is formed on the substrate by repeating this cycle a plurality of times .
Moreover, according to the present invention,
A method for manufacturing a semiconductor device comprising a step of forming a silicon oxide film on a substrate that is carried into a processing chamber and heated to a predetermined temperature,
In the step of forming the silicon oxide film,
Supplying a first source gas containing silicon atoms into the processing chamber and thermally decomposing the first source gas to form an amorphous silicon film of several atomic layers on the substrate;
Stopping the supply of the first source gas and discharging the first source gas remaining in the processing chamber from the processing chamber;
Supplying a second source gas containing oxygen atoms into the processing chamber, and reacting with the amorphous silicon film formed on the substrate to form a silicon oxide film;
Stopping the supply of the second source gas and discharging the second source gas remaining in the processing chamber from the processing chamber;
A semiconductor device manufacturing method is provided in which a silicon oxide film having a predetermined thickness is formed on the substrate by repeating this cycle a plurality of times.

According to the present invention, a method for forming a silicon oxide film, which can be formed at a low temperature, has excellent surface flatness, recess embedding property, step coverage, and excellent film formation speed, and a process for forming the silicon oxide film. There are provided a substrate processing apparatus suitably used in a method for manufacturing a semiconductor device having the semiconductor device and a process for forming the silicon oxide film .

As a result of diligent research on a method for increasing the deposition rate, the present inventors proceeded with the adsorption of the second source gas after the first source gas was adsorbed in the atomic layer deposition, It has been found that the film formation rate increases dramatically when adsorption by the first source gas forms a silicon thin film of several atomic layers instead of one atomic layer. For example, in the growth of amorphous silicon using Si ₂ H ₆ , a film formation rate of about 3 nm / min can be obtained at 500 ° C. After the amorphous silicon thin film is formed using Si ₂ H ₆ as the first source gas and then the amorphous silicon thin film is oxidized using ozone as the second source gas, the oxide film is adsorbed one atomic layer at a time. It is possible to increase the deposition rate as compared with the case of forming. For convenience, this film forming method will be referred to as PLCVD (Poly Atomic CVD).

  In a preferred embodiment of the present invention, a first source gas containing silicon atoms is supplied into the processing chamber to form an amorphous silicon film of several atomic layers on the substrate, and then the supply of the first source gas is stopped. The first source gas remaining in the processing chamber is discharged from the processing chamber, and then the second source gas containing oxygen atoms is supplied into the processing chamber and reacted with the amorphous silicon film formed on the substrate to form silicon. After forming the oxide film, the supply of the second source gas is stopped, the second source gas remaining in the processing chamber is discharged from the processing chamber, and thereafter, the silicon oxide film is formed by repeating these steps. To do.

  In this way, the first source gas is supplied to form an amorphous silicon film of several atomic layers on the substrate, and then the first source gas is discharged from the processing chamber, and then contains oxygen atoms in the processing chamber. The second source gas is supplied and reacted with the amorphous silicon film formed on the substrate to form a silicon oxide film. After that, the second source gas is discharged from the processing chamber. Unlike the film formation, there is no influence of by-products in the gas layer, and several atomic layers can be formed completely. For this reason, surface flatness, recessed part embedding property, and step coverage property are favorable.

  Furthermore, since a single atomic layer film is not formed by the first source gas, but an amorphous silicon film of several atomic layers is formed, the deposition rate can be increased as compared with the atomic layer deposition.

As the first raw material gas containing silicon _atoms, organic compounds containing Si atoms such as SiH 4, _Si 2 _{H 6} hydrogen compound or _SiH 3 of silicon, such as (CH ₃₎ is preferably used.

As the second source gas containing oxygen atoms, ozone (O ₃ ), O ₂ or N ₂ O is preferably used.

When O ₂ is used as the second source gas containing oxygen atoms, it is preferable to supply O ₂ to the processing chamber as active species by plasma excitation.

  Further, when an amorphous silicon film of several atomic layers is formed on a substrate by supplying a first source gas, an amorphous silicon film formed on a substrate by supplying a second source gas containing oxygen atoms When the silicon oxide film is formed by reacting with, the processing chamber pressure is preferably set to 1 Pa or more and 10,000 Pa or less.

Further, when the first source gas is discharged from the processing chamber or the second source gas is discharged from the processing chamber, it is preferable to perform a purge with an inert gas. As the inert gas, helium (He), neon (Ne), argon (Ar) or nitrogen (N ₂ ) is preferably used.

  Next, preferred embodiments of the present invention will be described in detail with reference to the drawings.

FIG. 1 is a schematic longitudinal sectional view for explaining a substrate processing furnace of the substrate processing apparatus according to the first embodiment. In Example 1, O ₃ is used as the oxidizing agent.

  A processing chamber 52 capable of reducing the pressure for processing the wafer 200 as a substrate is provided inside a heater 207 as a heating means. Outside the processing chamber 52, the processing chamber wall heater 21 for heating the wall of the processing chamber 52 is installed together with the heater 3. The wafer 200 is disposed on the substrate support 12 installed in the processing chamber 52 and heated to a predetermined temperature by the heater 207.

A SiH ₄ or Si ₂ H ₆ supply pipe 10 and an O ₃ supply pipe 11 are connected to the processing chamber 52. From SiH ₄ or _Si 2 _{H 6} supply pipe 10, through valve 34 from SiH ₄ or _Si 2 _{H 6} feeder 4, SiH ₄ or _Si 2 _{H 6} is supplied into the processing chamber 52, SiH ₄ or Si ₂ A SiH ₄ or Si ₂ H ₆ supply piping heater 22 is provided in the SiH ₄ or Si ₂ H ₆ supply piping 10 from the H ₆ supply device 4 to the processing chamber 52. From O ₃ supply pipe 11, the _{O 3} generator 5, via a flow controller 32 and valve 35 for controlling the flow rate, _{O 3} is supplied into the processing chamber 52. The O ₃ generator 5, the oxygen pipe 30 for supplying oxygen as a raw material for O ₃ in O ₃ generator 5, and the nitrogen pipe 31 is connected.

  An inert gas supply pipe 6 for supplying an inert gas is connected to the processing chamber 52 via a flow rate controller 33 and a valve 36 for controlling the flow rate of the inert gas.

  The processing chamber 52 is connected to a vacuum pump 246 for reducing the pressure of the processing chamber 52 through a valve 37 and a pressure controller 38 for controlling the pressure of the processing chamber by an exhaust pipe 231 that is an exhaust pipe for exhausting gas. Has been. The exhaust pipe 231 from the processing chamber 52 to the vacuum pump 246 is provided with an exhaust pipe heater 20 for heating the exhaust pipe 231.

A control device 321 serving as a control means includes a heater 207, a processing chamber wall heater 21, a SiH ₄ or Si ₂ H ₆ supply pipe heater 22, an exhaust pipe heater 20, flow controllers 32 and 33, and a pressure controller 38. , Valves 34, 35, 36, 37, pump 246, etc., and temperature of heater 207, processing chamber wall heater 21, SiH ₄ or Si ₂ H ₆ supply pipe heater 22, and exhaust pipe heater 20 Adjustment, flow rate adjustment of the flow rate controllers 32 and 33, control of the pressure controller 38, opening and closing operations of the valves 34, 35, 36, and 37, start and stop of the pump 8, and the like are performed.

Next, as an example of film formation by PLCVD, a case where a silicon oxide film is formed using SiH ₄ or Si ₂ H ₆ and O ₃ as raw materials will be described.

  First, the semiconductor silicon wafer 200 to be formed is carried into the processing chamber 52. After carrying in, the following four steps are sequentially executed. During steps 1 to 4, the wafer 200 is heated to a predetermined temperature by the heater 207.

[Step 1]
In step 1, SiH ₄ or Si ₂ H ₆ gas is flowed. First SiH ₄ or both opening the valve 42 provided with _Si 2 _{H 6} supply line valve 34 provided in the 10 to exhaust pipe 231, SiH ₄ or _Si 2 _{H 6} supply pipe from SiH ₄ or _Si 2 _{H 6} feeder 4 10 is exhausted from the exhaust pipe 7 while supplying SiH ₄ or Si ₂ H ₆ to the processing chamber 52. At this time, the pressure in the processing chamber 52 is adjusted to a predetermined pressure by the pressure controller 38.

At this time, the gas flowing into the processing chamber 52 is only SiH ₄ or Si ₂ H ₆ gas, and there is no O ₃ . Accordingly, SiH ₄ or Si ₂ H ₆ forms an amorphous silicon thin film on the Si substrate surface of the wafer 200 without causing a gas phase reaction.

[Step 2]
In step 2, the valve 34 of the SiH ₄ or Si ₂ H ₆ supply pipe 10 is closed to stop the supply of SiH ₄ or Si ₂ H ₆ . The valve 37 of the exhaust pipe 231 is kept open, the inside of the processing chamber 52 is exhausted by the pump 246, and residual SiH ₄ or Si ₂ H ₆ is removed from the processing chamber 52. Further, the valve 36 provided in the inert gas supply pipe 6 is opened, and an inert gas such as N ₂ whose flow rate is adjusted by the flow rate controller 33 is supplied from the inert gas supply pipe 6 to the processing chamber 52 for processing. to purge the chamber 52, to discharge the residual SiH ₄ or _Si 2 _{H 6} in the processing chamber 52 the processing chamber 52 to the outside.

[Step 3]
In step 3, O ₃ gas is flowed. Both the valve 35 provided in the O ₃ supply pipe 11 and the valve 37 provided in the exhaust pipe 231 are opened, and the O ₃ gas whose flow rate is adjusted by the flow rate controller 32 from the O ₃ supply pipe 11 into the processing chamber 52. While supplying, the exhaust pipe 231 is exhausted. At this time, the pressure in the processing chamber 52 is adjusted to a predetermined pressure by the pressure controller 38.
By supplying O ₃ , the amorphous silicon thin film formed by SiH ₄ or Si ₂ H ₆ on the surface of the Si substrate reacts with O ₃ to form a SiO ₂ film on the wafer 200.

[Step 4]
In Step 4, the inside of the processing chamber 52 is again purged with an inert gas. The valve 35 of the O ₃ supply pipe 11 is closed to stop the supply of O ₃ . The valve 37 of the exhaust pipe 231 is kept open, the inside of the processing chamber 52 is exhausted by the pump 246, and residual O ₃ is removed from the processing chamber 52. Further, the valve 36 provided in the inert gas supply pipe 6 is opened, and an inert gas such as N ₂ whose flow rate is adjusted by the flow rate controller 33 is supplied from the inert gas supply pipe 6 to the processing chamber 52 for processing. The inside of the chamber 52 is purged, and residual O ₃ in the processing chamber 52 is discharged out of the processing chamber 52.

Steps 1 to 4 are defined as one cycle, and this cycle is repeated a plurality of times to form a SiO ₂ film having a predetermined thickness on the wafer 200.

FIG. 2 is a schematic longitudinal sectional view for explaining the substrate processing furnace of the substrate processing apparatus according to the second embodiment. In Example 2, O ₃ is used as the oxidizing agent.

  A reaction tube 203 is provided inside a heater 207 as a heating means as a processing container for processing the wafer 200 as a substrate, and the lower end opening of the reaction tube 203 is sealed by a seal cap 219 as a lid and is an airtight member. The processing chamber 202 is formed by at least the heater 207, the reaction tube 203, and the seal cap 219, and the processing chamber 201 is formed by at least the reaction tube 203 and the seal cap 219. A boat 217 as a substrate holding unit is installed in the seal cap 219 via a quartz cap 218 and is inserted into the processing chamber 201. On the boat 217, a plurality of wafers 200 to be batch-processed are stacked horizontally in multiple stages. The heater 207 heats the wafer 200 inserted into the processing chamber 201 to a predetermined temperature.

A SiH ₄ or Si ₂ H ₆ supply pipe 10 and an O ₃ supply pipe 11 are provided in communication with the processing chamber 201. From the SiH ₄ or Si ₂ H ₆ supply pipe 10, a nozzle installed in the processing chamber 201 via a flow rate controller 41 and a valve 34 for controlling the flow rate from the SiH ₄ or Si ₂ H ₆ supply unit 4. A source gas SiH ₄ or Si ₂ H ₆ is supplied into the processing chamber 201 via the H.234. From the O ₃ supply pipe 11, through the flow rate controller 32 and the valve 35 for controlling the flow rate from the O ₃ generator 5, and further through the nozzle 233 installed in the processing chamber 201, the inside of the processing chamber 201. Is supplied with a raw material gas O ₃ . The SiH ₄ or _Si 2 _{H 6} supply pipe 10 from a SiH ₄ or _Si 2 _{H 6} feeder 4 to the process chamber 201, SiH ₄ or _Si 2 _{H 6} supply pipe heater 22 is provided, _{O 3} supply pipe 11 An O ₃ supply pipe heater 24 is provided in the O ₃ supply pipe 11 from the valve 35 to the processing furnace 101 installed in the apparatus. The O ₃ generator 5, the O ₃ generator 5, the oxygen pipe 30 for supplying oxygen as a raw material for O ₃ in O ₃ generator 5, and the nitrogen pipe 31 is connected.

An inert gas supply pipe 40 for supplying an inert gas is connected to the SiH ₄ or Si ₂ H ₆ supply pipe 10 via a valve 39 on the downstream side of the valve 34. The inert gas supply pipe 40 from the valve 39 to the connection portion between the SiH ₄ or Si ₂ H ₆ supply pipe 10 and the inert gas supply pipe 40 is also provided with a SiH ₄ or Si ₂ H ₆ supply pipe heater 22. It has been. In addition, an inert gas supply pipe 6 for supplying an inert gas is connected to the O ₃ supply pipe 11 via a valve 36 on the downstream side of the valve 35. An O ₃ supply pipe heater 24 is also provided in the inert gas supply pipe 6 from the valve 36 to the connection portion between the O ₃ supply pipe 11 and the inert gas supply pipe 6.

  The processing chamber 201 is connected to a vacuum pump 246 through a valve 243 by an exhaust pipe 231 that is an exhaust pipe for exhausting gas. The exhaust pipe 231 from the reaction tube 203 to the vacuum pump 246 is provided with an exhaust pipe heater 20 for heating the exhaust pipe 231.

A nozzle 234 is installed along the loading direction of the wafer 200 from the lower part to the upper part of the reaction tube 203. The nozzle 234 is provided with a plurality of gas supply holes for supplying gas. This gas supply hole is opened at an intermediate position between the adjacent wafers 200, and gas is supplied to the wafers 200. A nozzle 233 is similarly installed along the loading direction of the wafer 1 at a position rotated about 120 ° on the inner periphery of the reaction tube 203 from the position of the nozzle 234. The nozzle 233 is similarly provided with a plurality of gas supply holes. The nozzle 234 communicates with the SiH ₄ or Si ₂ H ₆ supply pipe 10 as described above, and is inactive connected to the SiH ₄ or Si ₂ H ₆ gas and the SiH ₄ or Si ₂ H ₆ supply pipe 10 in the processing chamber 201. An inert gas is supplied from the gas supply pipe 40. The nozzle 233 communicates with the O ₃ supply pipe 11 as described above, and supplies the O ₃ gas and the inert gas from the inert gas supply pipe 6 connected to the O ₃ supply pipe 11 into the processing chamber 201. . The source gas is alternately supplied from the nozzle 234 and the nozzle 233 into the processing chamber 201 to perform film formation.

  A boat 217 for mounting a plurality of wafers 200 in multiple stages at the same interval is provided in the reaction tube 203. This boat 217 is placed in the reaction tube 203 by a boat elevator mechanism (see the boat elevator 121 in FIG. 8). You can go in and out. Further, in order to improve the uniformity of processing, a boat rotation mechanism 267 that is a rotation means for rotating the boat 217 is provided. By rotating the boat rotation mechanism 267, the boat 217 held by the quartz cap 218 is removed. It is designed to rotate.

The control device 321 serving as a control means includes a heater 207, a SiH ₄ or Si ₂ H ₆ supply pipe heater 22, an O ₃ supply pipe heater 24, an exhaust pipe heater 20, flow rate controllers 32, 33, 41, and valves. 34, 35, 36, 39, 243, vacuum pump 246, boat rotation mechanism 267, boat elevating mechanism etc., connected to heater 207, SiH ₄ or Si ₂ H ₆ supply pipe heater 22, O ₃ supply pipe Temperature adjustment of heater 24 and exhaust pipe heater 20, flow rate adjustment of flow rate controllers 32, 33, 41, opening / closing operation of valves 34, 35, 36, 39, 243, start / stop of vacuum pump 246, boat rotation mechanism Rotational speed adjustment of 267, raising / lowering operation control of a boat raising / lowering mechanism, etc. are performed.

Next, as an example of film formation by the PLCVD method, a case where a silicon oxide film is formed using SiH ₄ or Si ₂ H ₆ and O ₃ as raw materials will be described.

  First, the semiconductor silicon wafer 200 to be formed is loaded into the boat 217 and carried into the processing chamber 201. After carrying in, the following four steps are sequentially executed. During steps 1 to 4, the wafer 200 is heated to a predetermined temperature by the heater 207.

[Step 1]
In step 1, SiH ₄ or Si ₂ H ₆ gas is flowed. First, the valve 34 provided on the SiH ₄ or Si ₂ H ₆ supply pipe 10 and the valve 243 provided on the exhaust pipe 231 were both opened, and the flow rate was adjusted by the flow rate controller 41 from the SiH ₄ or Si ₂ H ₆ supply unit 4. The SiH ₄ or Si ₂ H ₆ gas is exhausted from the exhaust pipe 231 while being supplied into the processing chamber 201 from the gas supply port of the nozzle 234 through the SiH ₄ or Si ₂ H ₆ supply pipe 10. At this time, the pressure in the processing chamber 201 is kept at a predetermined pressure.

At this time, the gas flowing into the processing chamber 201 is only SiH ₄ or Si ₂ H ₆ gas, and there is no O ₃ . Accordingly, SiH ₄ or Si ₂ H ₆ forms an amorphous silicon thin film on the Si substrate surface of the wafer 200 without causing a gas phase reaction.

[Step 2]
In step 2, the valve 34 of the SiH ₄ or Si ₂ H ₆ supply pipe 10 is closed to stop the supply of SiH ₄ or Si ₂ H ₆ . The valve 243 of the exhaust pipe 231 is kept open, the inside of the processing chamber 201 is exhausted by the vacuum pump 246, and the residual SiH ₄ or Si ₂ H ₆ is removed from the processing chamber 201. Further, the valve 39 provided in the inert gas supply pipe 40 is opened, an inert gas such as N _{2 is} supplied from the inert gas supply pipe 40 into the processing chamber 201, and the processing chamber 201 is purged. Residual SiH ₄ or Si ₂ H ₆ in the chamber 201 is discharged out of the processing chamber 201. Furthermore, the valve 36 provided in the inert gas supply pipe 6 is opened, and an inert gas such as N ₂ whose flow rate is adjusted by the flow rate controller 33 is also supplied into the processing chamber 201 from the inert gas supply pipe 6. .

[Step 3]
In step 3, O ₃ gas is flowed. Both the valve 35 provided in the O ₃ supply pipe 11 and the valve 243 provided in the exhaust pipe 231 are opened, and the O ₃ gas whose flow rate is adjusted by the flow rate controller 32 from the O ₃ supply pipe 11 into the processing chamber 201. While supplying, the exhaust pipe 231 is exhausted. At this time, the pressure in the processing chamber 201 is adjusted to a predetermined pressure.
By supplying O ₃ , the amorphous silicon thin film formed by SiH ₄ or Si ₂ H ₆ on the surface of the Si substrate reacts with O ₃ to form a SiO ₂ film on the wafer 200.

[Step 4]
In Step 4, the inside of the processing chamber 201 is again purged with an inert gas. The valve 35 of the O ₃ supply pipe 11 is closed to stop the supply of O ₃ . The valve 243 of the exhaust pipe 231 is kept open, the inside of the processing chamber 201 is exhausted by the vacuum pump 246, and residual O ₃ is removed from the processing chamber 201. Further, the valve 36 provided in the inert gas supply pipe 6 is opened, and an inert gas such as N ₂ whose flow rate is adjusted by the flow rate controller 33 is supplied into the processing chamber 201 from the inert gas supply pipe 6. Purge the processing chamber 201. Further, the valve 39 provided in the inert gas supply pipe 40 is opened, and an inert gas such as N ₂ is supplied from the inert gas supply pipe 40 to the processing chamber 201.

Steps 1 to 4 are defined as one cycle, and this cycle is repeated a plurality of times to form a SiO ₂ film having a predetermined thickness on the wafer 200.

FIG. 3 is a schematic longitudinal sectional view for explaining the substrate processing furnace of the substrate processing apparatus of the third embodiment. FIG. 4 is a schematic view for explaining the substrate processing furnace of the substrate processing apparatus of the third embodiment. It is a cross-sectional view. In Example 3, O ₂ is used as the oxidizing agent.

  A reaction tube 203 is provided inside a heater 207 as a heating means as a processing container for processing the wafer 200 as a substrate, and the lower end opening of the reaction tube 203 is sealed by a seal cap 219 as a lid and is an airtight member. The process chamber 202 is formed by at least the heater 207, the reaction tube 203, and the seal cap 219, and the process chamber 201 is formed by at least the reaction tube 203 and the seal cap 219. A boat 217 as a substrate holding unit is installed in the seal cap 219 via a quartz cap 218 and is inserted into the processing chamber 201. On the boat 217, a plurality of wafers 200 to be batch-processed are stacked horizontally in multiple stages. The heater 207 heats the wafer 200 inserted into the processing chamber 201 to a predetermined temperature.

An SiH ₄ or Si ₂ H ₆ supply pipe 10 and an O ₂ supply pipe 13 are provided in communication with the processing chamber 201. From the SiH ₄ or Si ₂ H ₆ supply pipe 10, a gas supply unit 249 and a gas supply unit 249 are further connected via a flow rate controller 41 and a valve 34 for controlling the flow rate from the SiH ₄ or Si ₂ H ₆ supply unit 4. through the gas supply holes 248c provided in the material gas SiH ₄ or _Si 2 _{H 6} is supplied into the processing chamber 201, _{O 2} as a source gas from the _{O 2} supply pipe 213, to control the flow rate The activated species are supplied into the processing chamber 201 through the flow rate controller 32 and the valve 35 as well as through the buffer chamber 237 formed in the processing chamber 201. The SiH ₄ or _Si 2 _{H 6} supply pipe 10 from a SiH ₄ or _Si 2 _{H 6} feeder 4 to the process chamber 201, SiH ₄ or _Si 2 _{H 6} supply pipe heater 22 is provided, _{O 2} supply pipe 213 the _{O 2} supply pipe 13 from the valve 35 to the processing chamber 201 installed in the, _{O 2} supply pipe heater 43 is provided.

The SiH ₄ or _Si 2 _{H 6} supply pipe 10, the inert gas supply pipe 40 for supplying an inert gas is connected to the downstream side of the valve 34 via a valve 39. The inert gas supply pipe 40 from the valve 39 to the connection portion between the SiH ₄ or Si ₂ H ₆ supply pipe 10 and the active gas supply pipe 40 is also provided with a SiH ₄ or Si ₂ H ₆ supply pipe heater 22. ing. In addition, an inert gas supply pipe 6 for supplying an inert gas is connected to the O ₂ supply pipe 13 via a valve 36 on the downstream side of the valve 35. An O ₂ supply pipe heater 43 is also provided in the inert gas supply pipe 6 from the valve 36 to the connection portion between the O ₂ supply pipe 213 and the inert gas supply pipe 6.

  The processing chamber 201 is connected to a vacuum pump 246 through a valve 243 by an exhaust pipe 231 that is an exhaust pipe for exhausting gas. The exhaust pipe 231 from the reaction tube 203 to the vacuum pump 246 is provided with an exhaust pipe heater 20 for heating the exhaust pipe 231.

  In the arc-shaped space between the inner wall of the reaction tube 203 and the wafer 200, a buffer chamber 237, which is a gas dispersion space, is provided along the loading direction of the wafer 200 on the inner wall above the lower portion of the reaction tube 203. A gas supply hole 248 a is provided at the end of the wall where the wafer 200 is adjacent to the buffer chamber 237. The gas supply hole 248 a opens toward the center of the reaction tube 203. The gas supply holes 248a have the same opening area from the lower part to the upper part, and are provided at the same opening pitch.

  At the end of the buffer chamber 237 opposite to the end where the gas supply hole 248 a is provided, the nozzle 233 is also installed along the stacking direction of the wafer 200 from the lower part to the upper part of the reaction tube 203. The nozzle 233 is provided with gas supply holes 248b which are supply holes for supplying a plurality of gases. When the differential pressure between the buffer chamber 237 and the processing chamber 201 is small, the gas supply hole 248b may have the same opening area from the upstream side to the downstream side with the same opening pitch, but the differential pressure is large. In such a case, the opening area may be increased from the upstream side toward the downstream side, or the opening pitch may be decreased.

  By adjusting the opening area and the opening pitch of the gas supply holes 248b from the upstream side to the downstream side, first, the gas having the same flow rate is ejected from each gas supply hole 248b, although the flow rate is almost the same. Then, the gas ejected from each gas supply hole 248b is ejected into the buffer chamber 237 and introduced once to equalize the gas flow rate difference.

  That is, in the buffer chamber 237, the gas ejected from each gas supply hole 248b is ejected from the gas supply hole 248a into the processing chamber 201 after the particle velocity of each gas is reduced in the buffer chamber 237. During this time, when the gas ejected from each gas supply hole 248b is ejected from each gas supply hole 248a, the gas can have a uniform flow rate and flow velocity.

  In the buffer chamber 237, rod-shaped electrodes 269 and 270 having an elongated structure are disposed protected by an electrode protection tube 275 that protects the electrode from the top to the bottom, and one of the rod-shaped electrodes 269 and 270 is aligned. It is connected to a high frequency power source 273 via a device 272, and the other is connected to ground which is a reference potential. As a result, plasma is generated in the plasma generation region 224 of the rod-shaped electrodes 269 and 270.

  The electrode protection tube 275 has a structure in which each of the rod-shaped electrodes 269 and 270 can be inserted into the buffer chamber 237 in a state of being isolated from the atmosphere of the buffer chamber 237. Here, if the inside of the electrode protection tube 275 has the same atmosphere as the outside air (atmosphere), the rod-shaped electrodes 269 and 270 inserted into the electrode protection tube 275 are oxidized by the heating of the heater 207. Therefore, the inside of the electrode protection tube 275 is filled or purged with an inert gas such as nitrogen, and an inert gas purge mechanism (not shown) for preventing the oxidation of the rod-shaped electrodes 269 and 270 by suppressing the oxygen concentration sufficiently low. Is provided.

  A gas supply unit 249 is provided on the inner wall of the reaction tube 203 rotated about 120 ° from the position of the gas supply hole 248a. The gas supply unit 249 is a supply unit that shares the gas supply species with the buffer chamber 237 when a plurality of types of gases are alternately supplied one by one to the wafer 200 in film formation by the PLCVD method.

Similarly to the buffer chamber 237, the gas supply unit 249 also has supply holes 248c that are supply holes for supplying gas at the same pitch at positions adjacent to the wafer 200, and a SiH ₄ or Si ₂ H ₆ supply pipe at the bottom. 10 is connected.

  When the differential pressure between the buffer chamber 237 and the processing chamber 201 is small, the supply hole 248c may have the same opening area from the upstream side to the downstream side with the same opening pitch, but the differential pressure is large. For this, it is preferable to increase the opening area from the upstream side toward the downstream side or to decrease the opening pitch.

  A boat 217 for mounting a plurality of wafers 200 in multiple stages at the same interval is provided in the reaction tube 203. This boat 217 is placed in the reaction tube 203 by a boat elevator mechanism (see the boat elevator 121 in FIG. 8). You can go in and out. Further, in order to improve the uniformity of processing, a boat rotation mechanism 267 that is a rotation means for rotating the boat 217 is provided. By rotating the boat rotation mechanism 267, the boat 217 held by the quartz cap 218 is removed. It is designed to rotate.

The control device 321 serving as a control means includes a heater 207, a SiH ₄ or Si ₂ H ₆ supply pipe heater 22, an O ₂ supply pipe heater 43, an exhaust pipe heater 20, flow controllers 32, 33, 41, and valves. 34, 35, 36, 39, 243, vacuum pump 246, boat rotation mechanism 267, boat elevating mechanism, high frequency power supply 233, etc., connected to heater 207, SiH ₄ or Si ₂ H ₆ supply pipe heater 22, O ₂ supply pipe heater 43, exhaust pipe heater 20 temperature adjustment, flow rate controller 32, 33, 41 flow rate adjustment, valve 34, 35, 36, 39, 243 open / close operation, pump 246 start / stop, Adjustment of the rotation speed of the boat rotating mechanism 267, control of the lifting operation of the boat lifting mechanism, power supply control of the high frequency power source 233, and the like are performed.

Next, as an example of film formation by the PLCVD method, a case where an oxide film is formed using SiH ₄ or Si ₂ H ₆ and O ₂ as raw materials will be described.

  First, the semiconductor silicon wafer 200 to be formed is loaded into the boat 217 and carried into the processing chamber 201. After carrying in, the following four steps are sequentially executed. During steps 1 to 4, the wafer 200 is heated to a predetermined temperature by the heater 207.

[Step 1]
In step 1, SiH ₄ or Si ₂ H ₆ gas is flowed. First, the valve 34 provided on the SiH ₄ or Si ₂ H ₆ supply pipe 10 and the valve 243 provided on the exhaust pipe 231 were both opened, and the flow rate was adjusted by the flow rate controller 41 from the SiH ₄ or Si ₂ H ₆ supply unit 4. SiH ₄ or Si ₂ H ₆ gas is supplied to the gas supply unit 249 through the SiH ₄ or Si ₂ H ₆ supply pipe 10, and exhausted from the exhaust pipe 231 while being supplied from the gas supply hole 248 c to the processing chamber 201. At this time, the inside of the processing chamber 201 is maintained at a predetermined pressure.

At this time, the gas flowing into the processing chamber 201 is only SiH ₄ or Si ₂ H ₆ gas, and there is no O ₂ . Accordingly, SiH ₄ or Si ₂ H ₆ forms an amorphous silicon thin film on the Si substrate surface of the wafer 200 without causing a gas phase reaction.

[Step 2]
In step 2, the valve 34 of the SiH ₄ or Si ₂ H ₆ supply pipe 10 is closed to stop the supply of SiH ₄ or Si ₂ H ₆ . Valve 243 of the exhaust pipe 231 is kept open to evacuate the inside of the process chamber 201 by a pump 246, to eliminate the residual SiH ₄ or _Si 2 _{H 6} from the processing chamber 201. Further, the valve 39 provided in the inert gas supply pipe 40 is opened, and an inert gas such as N ₂ is supplied from the inert gas supply pipe 40 into the process chamber 201 to purge the process chamber 201. Residual SiH ₄ or Si ₂ H ₆ in the processing chamber 201 is discharged out of the processing chamber 201. Furthermore, the valve 36 provided in the inert gas supply pipe 6 is opened, and an inert gas such as N ₂ whose flow rate is adjusted by the flow rate controller 33 is also supplied into the processing chamber 201 from the inert gas supply pipe 6. .

[Step 3]
In step 3, an active species obtained by plasma-exciting O ₂ gas is flowed. Both the valve 35 provided in the O ₂ supply pipe 13 and the valve 243 provided in the exhaust pipe 231 are opened, and the O ₂ gas whose flow rate is adjusted by the flow controller 32 from the O ₂ supply pipe 13 is supplied to the gas supply hole of the nozzle 233. The gas is ejected from 248b to the buffer chamber 237 and ejected into the processing chamber 201 through the gas supply hole 248a. At that time, high-frequency power is applied between the rod-shaped electrodes 269 and 270 from the high-frequency power source 273 via the matching unit 272 to excite plasma of O ₂ and exhaust it from the exhaust pipe 243 while supplying it into the processing chamber 201 as active species. . At this time, the processing chamber 201 is maintained at a predetermined pressure.

Since O ₂ has a high reaction temperature, it is allowed to flow as an active species by plasma excitation. Therefore, the wafer reaction process can be performed in a low temperature range. By supplying active species obtained by plasma excitation of O ₂ gas, the amorphous silicon thin film formed by SiH ₄ or Si ₂ H ₆ on the surface of the Si substrate reacts with the active species of O ₂ , and SiO ₂ is deposited on the wafer 200. A film is formed.

[Step 4]
In Step 4, the inside of the processing chamber 201 is again purged with an inert gas. Close the valve 35 of the O ₂ supply pipe 13, stops the supply of _{O 2.} The valve 243 of the exhaust pipe 231 is kept open, the inside of the processing chamber 201 is exhausted by the pump 246, and residual O ₂ is removed from the processing chamber 201. Further, the valve 36 provided in the inert gas supply pipe 6 is opened, and an inert gas such as N ₂ whose flow rate is adjusted by the flow rate controller 33 is supplied into the processing chamber 201 from the inert gas supply pipe 6. Purge the processing chamber 201. Further, the valve 39 provided in the inert gas supply pipe 40 is opened, and an inert gas such as N ₂ is supplied from the inert gas supply pipe 40 to the processing chamber 201.

Steps 1 to 4 are defined as one cycle, and this cycle is repeated a plurality of times to form a SiO ₂ film having a predetermined thickness on the wafer 200.

  Next, an outline of the substrate processing apparatus according to the second and third embodiments will be described with reference to FIGS.

  A cassette stage 105 is provided on the front side of the inside of the housing 101 as a holder transfer member that transfers the cassette 100 as a substrate storage container to and from an external transfer device (not shown). Is provided with a cassette elevator 115 as lifting means, and a cassette transfer machine 114 as a conveying means is attached to the cassette elevator 115. A cassette shelf 109 as a means for placing the cassette 100 is provided on the rear side of the cassette elevator 115, and a spare cassette shelf 110 is also provided above the cassette stage 105. A clean unit 118 is provided above the spare cassette shelf 110 so that clean air is circulated inside the housing 101.

  A processing furnace 202 is provided above the rear portion of the housing 101, and a boat 217 as a substrate holding unit that holds the wafers 200 as substrates in a horizontal posture in multiple stages is raised and lowered to the processing furnace 202 below the processing furnace 202. A boat elevator 121 as an elevating means is provided, and a seal cap 219 as a lid is attached to the tip of an elevating member 122 attached to the boat elevator 121 to support the boat 217 vertically. Between the boat elevator 121 and the cassette shelf 109, a transfer elevator 113 as an elevating means is provided, and a wafer transfer machine 112 as a transfer means is attached to the transfer elevator 113. Next to the boat elevator 121, a furnace port shutter 116 is provided as a closing unit that has an opening / closing mechanism and hermetically closes the wafer loading / unloading port 131 below the processing furnace 202.

  The cassette 100 loaded with the wafers 200 is loaded into the cassette stage 105 from an external transfer device (not shown) in an upward posture, and is rotated by 90 ° on the cassette stage 105 so that the wafer 200 is in a horizontal posture. Further, the cassette 100 is transported from the cassette stage 105 to the cassette shelf 109 or the spare cassette shelf 110 by cooperation of the raising / lowering operation of the cassette elevator 115, the transverse operation, the advance / retreat operation of the cassette transfer machine 114, and the rotation operation.

  The cassette shelf 109 has a transfer shelf 123 in which the cassette 100 to be transferred by the wafer transfer device 112 is stored. The cassette 100 to which the wafer 200 is transferred is transferred by the cassette elevator 115 and the cassette transfer device 114. Transferred to the transfer shelf 123.

  When the cassette 100 is transferred to the transfer shelf 123, the wafers 200 are transferred from the transfer shelf 123 to the boat 217 in a lowered state by the cooperation of the advance / retreat operation, the rotation operation, and the lifting / lowering operation of the transfer elevator 113. Is transferred.

  When a predetermined number of wafers 200 are transferred to the boat 217, the boat 217 is inserted into the processing furnace 202 by the boat elevator 121, and the processing furnace 202 is airtightly closed by the seal cap 219. The wafer 200 is heated in the hermetically closed processing furnace 202 and a processing gas is supplied into the processing furnace 202 to process the wafer 200.

  When the processing on the wafer 200 is completed, the wafer 200 is transferred from the boat 217 to the cassette 100 of the transfer shelf 123 by the reverse procedure of the operation described above, and the cassette 100 is transferred from the transfer shelf 123 by the cassette transfer device 114. It is transferred to the cassette stage 105 and carried out of the housing 101 by an external transfer device (not shown).

  The furnace port shutter 116 hermetically closes the wafer loading / unloading port 131 of the processing furnace 202 when the boat 217 is in the lowered state, and prevents outside air from being caught in the processing furnace 202.

  The transport operation of the cassette transfer machine 114 and the like is controlled by the transport control means 124.

  Next, an example in which a silicon oxide film is formed on a semiconductor silicon wafer by the PLCVD method will be described.

First, FIG. 7 shows an SiO ₂ film formation process sequence by the PLCVD method in this embodiment.
One cycle consists of four steps. In the first step, first, SiH ₄ or Si ₂ H ₆ is flowed to form an amorphous silicon thin film on the Si substrate surface. In the second step, purging is performed with an inert gas, and SiH ₄ or Si ₂ H ₆ in the processing chamber is discharged out of the processing chamber. In the third step, ozone is flowed, and SiO ₂ is formed by the reaction between the amorphous silicon thin film formed on the Si substrate surface and ozone. In the fourth step, the processing chamber is purged with an inert gas, and residual ozone in the processing chamber is discharged out of the processing chamber. When showing the respective steps Time as an example, the first step (SiH ₄ or _Si 2 _{H 6} supply process) is 10-30 seconds, second step (purge process) is 15 seconds, the third step (ozone supplying step) 5 to 60 seconds and the fourth step (purge process) is 3 seconds.

FIG. 8 shows the relationship between the film formation temperature and the film formation rate when an SiO ₂ film is formed by PLCVD using Si ₂ H ₆ and O ₃ .

9 shows a case of forming the SiO ₂ film by PLCVD method using a _Si 2 _{H 6} and _{O 3,} and the number of cycles when forming the SiO ₂ film by TDMASi and _{O 3} by atomic layer deposition method The relationship of film thickness was shown. The number of cycles and the film thickness are in a linear relationship, and the increase in film thickness per cycle in the case of atomic layer deposition is 0.12 nm. On the other hand, in the case of film formation by the PLCVD method using Si ₂ H ₆ and O ₃ , the film formation speed is about four times as high.

As described above, by performing the film formation by the PLCVD method in which SiH ₄ or Si ₂ H ₆ and ozone are alternately supplied to the reaction chamber, the SiO ₂ film having good surface flatness at low temperature and good step coverage. Can be obtained. Compared to the deposition method using atomic layer deposition, a faster deposition rate was obtained, which proved effective in shortening the process time.

It is a schematic longitudinal cross-sectional view for demonstrating the substrate processing furnace of the substrate processing apparatus of Example 1 of this invention. It is a schematic longitudinal cross-sectional view for demonstrating the substrate processing furnace of the substrate processing apparatus of Example 2 of this invention. It is a schematic longitudinal cross-sectional view for demonstrating the substrate processing furnace of the substrate processing apparatus of Example 3 of this invention. It is a schematic cross-sectional view for demonstrating the substrate processing furnace of the substrate processing apparatus of Example 3 of this invention. It is a schematic oblique view for demonstrating the substrate processing apparatus of Example 2, 3 of this invention. It is a schematic longitudinal cross-sectional view for demonstrating the substrate processing apparatus of Example 2, 3 of this invention. It is a diagram illustrating a SiO ₂ film formation process sequence according PLCVD method in the fourth embodiment of the present invention. The Si ₂ H ₆ and _{O 3} and PLCVD method using a diagram showing the relationship between the deposition temperature and deposition rate in the case of forming the SiO ₂ film. Shows a SIO ₂ film formation time of the cycle count and the thickness relationships and _Si 2 _{H 6} and by PLCVD by _{O 3} SiO ₂ film forming cycle number and thickness of the relation during by the ALD method by TDMASi and _{O 3} It is.

Explanation of symbols

4 ... SiH ₄ or _Si 2 _{H 6} feeder 5 ... _{O 3} generator 6 ... inert gas supply pipe 10 ... SiH ₄ or _Si 2 _{H 6} supply pipe 11 ... _{O 3} supply pipe 12 ... substrate support 13 ... _{O 2} Supply pipe 20 ... Exhaust pipe heater 21 ... Processing chamber wall heater 22 ... SiH ₄ or Si ₂ H ₆ supply pipe heater 24 ... O ₃ supply pipe heater 30 ... Oxygen pipe 31 ... Nitrogen pipe 32 ... Flow controller 33 ... Flow controller 34 ... Valve 35 ... Valve 36 ... Valve 37 ... Valve 38 ... Pressure controller 52 ... Processing chamber 39 ... Valve 40 ... Inert gas supply pipe 41 ... Flow controller 43 ... O ₂ supply pipe heater 100 ... Cassette 101 ... Case 105 ... Cassette stage 109 ... Cassette shelf 110 ... Preliminary cassette shelf 112 ... Wafer transfer machine 113 ... Transfer elevator DESCRIPTION OF SYMBOLS 114 ... Cassette transfer machine 115 ... Cassette elevator 116 ... Furnace port shutter 118 ... Clean unit 121 ... Boat elevator 122 ... Lifting member 123 ... Transfer shelf 124 ... Transfer control means 200 ... Wafer 201 ... Processing chamber 202 ... Processing furnace 203 ... Reaction tube 207 ... Heater 217 ... Boat 218 ... Quartz cap 219 ... Seal cap 220 ... O-ring 224 ... Plasma generation region 231 ... Gas exhaust pipe 233 ... Nozzle 234 ... Nozzle 237 ... Buffer chamber 243 ... Valve 246 ... Vacuum pump 248a ... Gas Supply hole 248b ... Gas supply hole 248c ... Gas supply hole 249 ... Gas supply part 267 ... Boat rotation mechanism 269 ... Rod electrode 270 ... Rod electrode 272 ... Matching device 273 ... High frequency power supply 275 ... Electrode protection tube 321 ... Controller

Claims (9)

A silicon oxide film forming method for forming a silicon oxide film on a substrate carried into a processing chamber and heated to a predetermined temperature,
Supplying a first source gas containing silicon atoms into the processing chamber, and forming an amorphous silicon film of several atomic layers on the substrate by a CVD method ;
A step of discharging and stopping the supply of the first source gas, the first raw material gas remaining in the processing chamber from the said processing chamber,
Supplying a second source gas containing oxygen atoms into the processing chamber, and reacting with the amorphous silicon film formed on the substrate to form a silicon oxide film;
A step of discharging and stopping the supply of the pre-Symbol second source gas, the second source gas remaining in the processing chamber from the said processing chamber,
And forming a silicon oxide film having a predetermined film thickness on the substrate by repeating this cycle a plurality of times . A silicon oxide film forming method for forming a silicon oxide film on a substrate carried into a processing chamber and heated to a predetermined temperature,
Supplying a first source gas containing silicon atoms into the processing chamber and thermally decomposing the first source gas to form an amorphous silicon film of several atomic layers on the substrate;
Stopping the supply of the first source gas and discharging the first source gas remaining in the processing chamber from the processing chamber;
Supplying a second source gas containing oxygen atoms into the processing chamber, and reacting with the amorphous silicon film formed on the substrate to form a silicon oxide film;
Stopping the supply of the second source gas and discharging the second source gas remaining in the processing chamber from the processing chamber;
  And forming a silicon oxide film having a predetermined film thickness on the substrate by repeating this cycle a plurality of times. The first source gas is SiH ₄ The method for forming a silicon oxide film according to claim 1, wherein a temperature of the substrate in each of the steps is set to 350 to 450 ° C. 4. The first source gas is Si ₂ H ₆ The method for forming a silicon oxide film according to claim 1, wherein a temperature of the substrate in each of the steps is set to 450 to 550 ° C. 4. 5. The method for forming a silicon oxide film according to claim 3, wherein the pressure in the processing chamber in each step is set to 1 Pa or more and 10,000 Pa or less. A method for manufacturing a semiconductor device comprising a step of forming a silicon oxide film on a substrate that is carried into a processing chamber and heated to a predetermined temperature,
In the step of forming the silicon oxide film,
Supplying a first source gas containing silicon atoms into the processing chamber, and forming an amorphous silicon film of several atomic layers on the substrate by a CVD method;
Stopping the supply of the first source gas and discharging the first source gas remaining in the processing chamber from the processing chamber;
Supplying a second source gas containing oxygen atoms into the processing chamber, and reacting with the amorphous silicon film formed on the substrate to form a silicon oxide film;
Stopping the supply of the second source gas and discharging the second source gas remaining in the processing chamber from the processing chamber;
1 is a cycle, and this cycle is repeated a plurality of times to form a silicon oxide film having a predetermined thickness on the substrate. A method for manufacturing a semiconductor device comprising a step of forming a silicon oxide film on a substrate that is carried into a processing chamber and heated to a predetermined temperature,
In the step of forming the silicon oxide film,
Supplying a first source gas containing silicon atoms into the processing chamber and thermally decomposing the first source gas to form an amorphous silicon film of several atomic layers on the substrate;
Stopping the supply of the first source gas and discharging the first source gas remaining in the processing chamber from the processing chamber;
Supplying a second source gas containing oxygen atoms into the processing chamber, and reacting with the amorphous silicon film formed on the substrate to form a silicon oxide film;
Stopping the supply of the second source gas and discharging the second source gas remaining in the processing chamber from the processing chamber;
1 is a cycle, and this cycle is repeated a plurality of times to form a silicon oxide film having a predetermined thickness on the substrate. A processing chamber for processing the substrate;
Heating means for heating the substrate to a predetermined temperature;
First source gas supply means for supplying a first source gas containing silicon atoms to the processing chamber;
Second source gas supply means for supplying a second source gas containing oxygen atoms to the processing chamber;
Exhaust means for exhausting the processing chamber;
In a state where the substrate carried into the processing chamber is heated to a predetermined temperature, the first source gas is supplied into the processing chamber, and an amorphous silicon film of several atomic layers is formed on the substrate by a CVD method. Processing, stopping the supply of the first source gas, discharging the first source gas remaining in the processing chamber from the processing chamber, and supplying the second source gas into the processing chamber. A process of reacting with the amorphous silicon film formed on the substrate to form a silicon oxide film, and the supply of the second source gas is stopped and the second source gas remaining in the process chamber is reduced. The process of discharging from the processing chamber is defined as one cycle, and this cycle is repeated a plurality of times so that a silicon oxide film having a predetermined thickness is formed on the substrate. And control means for controlling the raw material gas supply means, said second source gas supply means and said exhaust means,
A substrate processing apparatus comprising: A processing chamber for processing the substrate;
Heating means for heating the substrate to a predetermined temperature;
First source gas supply means for supplying a first source gas containing silicon atoms to the processing chamber;
Second source gas supply means for supplying a second source gas containing oxygen atoms to the processing chamber;
Exhaust means for exhausting the processing chamber;
In a state where the substrate carried into the processing chamber is heated to a predetermined temperature, the first source gas is supplied into the processing chamber to thermally decompose the first source gas, and several atoms are formed on the substrate. A process of forming a layer of amorphous silicon film, a process of stopping the supply of the first source gas and discharging the first source gas remaining in the process chamber from the process chamber, and the process chamber A process of supplying a second source gas to react with the amorphous silicon film formed on the substrate to form a silicon oxide film, and stopping the supply of the second source gas to remain in the process chamber The process of discharging the second source gas from the processing chamber is set as one cycle, and by repeating this cycle a plurality of times, the silicon oxide film having a predetermined thickness is formed on the substrate. And heat means, said first source gas supply means, control means for controlling the second source gas supply means and said exhaust means,
A substrate processing apparatus comprising:

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