JP4509613B2 - Substrate processing equipment - Google Patents

Substrate processing equipment Download PDF

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JP4509613B2
JP4509613B2 JP2004079749A JP2004079749A JP4509613B2 JP 4509613 B2 JP4509613 B2 JP 4509613B2 JP 2004079749 A JP2004079749 A JP 2004079749A JP 2004079749 A JP2004079749 A JP 2004079749A JP 4509613 B2 JP4509613 B2 JP 4509613B2
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substrate
space
processing chamber
processing apparatus
downstream
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JP2005268572A (en
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光明 芳谷
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Screen Holdings Co Ltd
Dainippon Screen Manufacturing Co Ltd
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Screen Holdings Co Ltd
Dainippon Screen Manufacturing Co Ltd
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Description

この発明は、フラットパネルディスプレイ(FPD)用ガラス基板、半導体ウエハ、フォトマスク用ガラス基板、プリント基板等の基板を搬送しつつ、基板に対し気体を吹き付けて、基板に付着した処理液を吹き飛ばして除去する基板処理装置に関する。   In the present invention, a substrate such as a glass substrate for a flat panel display (FPD), a semiconductor wafer, a glass substrate for a photomask, or a printed circuit board is conveyed, and a gas is blown to the substrate to blow off a processing solution attached to the substrate. The present invention relates to a substrate processing apparatus to be removed.

FPD装置、半導体装置等の製造プロセスにおいて、処理液を使用してFPD用ガラス基板、半導体ウエハ等の基板の表面に対し湿式処理を施した後、例えば基板の表面へ純水等の洗浄液を供給して基板を洗浄処理した後には、基板の表面に付着した洗浄液を除去するために、基板の表面へ気体を吹き付けて基板表面から洗浄液を吹き飛ばす液切り処理が行われる。この液切り処理は、処理チャンバ内においてローラコンベア等により基板を水平方向へ搬送しつつ、基板搬送路を挟んでその上・下両側に配設された各エアーナイフから基板の上・下両面に向けてそれぞれ気体を噴射することに行われる。この液切り処理においては、基板の表面へ気体が吹き付けられることにより基板表面から洗浄液が飛散してミストが発生し、処理を終えた基板の表面に洗浄液ミストが再付着する、といったことが起こる。このような問題を解決するために、図9に概略構成を示すような基板処理装置が提案されている。   In the manufacturing process of FPD devices, semiconductor devices, etc., after processing the surface of a substrate such as a glass substrate for FPD or a semiconductor wafer using a processing solution, a cleaning solution such as pure water is supplied to the surface of the substrate, for example. Then, after the substrate is cleaned, in order to remove the cleaning liquid adhering to the surface of the substrate, a liquid draining process is performed in which gas is blown onto the surface of the substrate and the cleaning liquid is blown off from the substrate surface. In this liquid draining process, the substrate is transported in a horizontal direction by a roller conveyor or the like in the processing chamber, and the air knives disposed on both the upper and lower sides of the substrate transport path are used for both upper and lower surfaces of the substrate. It is performed by injecting gas toward each. In this liquid draining process, gas is blown onto the surface of the substrate, so that the cleaning liquid scatters from the surface of the substrate to generate mist, and the cleaning liquid mist is reattached to the surface of the substrate after the processing. In order to solve such a problem, a substrate processing apparatus having a schematic configuration shown in FIG. 9 has been proposed.

図9に側断面図を示した基板処理装置は、密閉型の処理チャンバ1を備えている。処理チャンバ1には、湿式処理、例えば純水等の洗浄液による洗浄処理が施された基板Wが搬入される基板搬入口2、および、液切り処理された基板Wが搬出される基板搬出口3が設けられており、下部に排気口4が形設され、排気口4には排気用配管を介して排気ポンプ(図示せず)が流路接続されている。処理チャンバ1の内部には、基板Wを基板搬入口2から基板搬出口3に向かって水平方向へ搬送するためのローラコンベア等の搬送機構(搬送機構の図示を省略し、二点鎖線で基板搬送路5を示している)が設けられている。また、処理チャンバ1の内部には、基板搬送路5を挟んでその上・下両側にそれぞれエアーナイフ6a、6bが配設されている。そして、処理チャンバ1の内部に、基板搬送路5の上方側の空間を、エアーナイフ6a、6bの配設位置でその上流側の空間aと下流側の空間bとに仕切る仕切り部材7が配設されている。また、処理チャンバ1の天井部には送風口8が設けられており、その送風口8を通して下流側の空間b内へ清浄空気(クリーンエア)を供給する送風機構9が設置されており、送風機構9は、ファンおよびHEPA等のフィルタを備えている。   The substrate processing apparatus whose side sectional view is shown in FIG. 9 includes a sealed processing chamber 1. In the processing chamber 1, a substrate carry-in port 2 into which a substrate W that has been subjected to a wet process, for example, a cleaning process using a cleaning liquid such as pure water, and a substrate carry-out port 3 from which the substrate W that has been subjected to the liquid draining process are carried out. The exhaust port 4 is formed in the lower part, and an exhaust pump (not shown) is connected to the exhaust port 4 through an exhaust pipe. Inside the processing chamber 1, a transport mechanism such as a roller conveyor for transporting the substrate W from the substrate carry-in port 2 toward the substrate carry-out port 3 in the horizontal direction (illustration of the transport mechanism is omitted, and the substrate is indicated by a two-dot chain line) The conveyance path 5 is shown). In the processing chamber 1, air knives 6a and 6b are disposed on both the upper and lower sides of the substrate transfer path 5, respectively. A partition member 7 is arranged inside the processing chamber 1 to partition the space above the substrate transfer path 5 into an upstream space a and a downstream space b at the positions where the air knives 6a and 6b are disposed. It is installed. The processing chamber 1 is provided with a blower port 8 in the ceiling, and a blower mechanism 9 that supplies clean air through the blower port 8 to the downstream space b is installed. The mechanism 9 includes a fan and a filter such as HEPA.

図9に示した構成を備えた基板処理装置では、送風機構9によって処理チャンバ1の天井部の送風口8から下流側の空間b内へ清浄空気が供給されることにより、下流側の空間b内を流下して処理チャンバ1下部の排気口4に向かう清浄空気の流れ(ダウンフロー)を生じる。また、エアーナイフ6a、6bの噴出口から基板Wの上・下両面に向けて噴射された気体は、それによって基板Wの表面から吹き飛ばされた洗浄液のミストと共に、排気ポンプの吸引力により上流側の空間a内から処理チャンバ1下部の排気口4に向かって流れ、排気口4を通して排気される。したがって、エアーナイフ6a、6bによる液切り処理を終えた基板Wが基板搬出口3に向かって搬送される間に、基板Wの表面から洗浄液が飛散して発生したミストが基板Wの表面に再付着する、といったことが防止される(例えば、特許文献1参照。)。
特開平9−94546号公報(第4−7頁、図1、図3)
In the substrate processing apparatus having the configuration shown in FIG. 9, the clean air is supplied from the air blowing port 8 on the ceiling portion of the processing chamber 1 to the downstream space b by the air blowing mechanism 9, thereby the downstream space b. A flow (down flow) of clean air is generated that flows down to the exhaust port 4 at the bottom of the processing chamber 1. In addition, the gas jetted from the outlets of the air knives 6a and 6b toward the upper and lower surfaces of the substrate W is upstream by the suction force of the exhaust pump together with the mist of the cleaning liquid blown off from the surface of the substrate W. From the space a toward the exhaust port 4 below the processing chamber 1 and exhausted through the exhaust port 4. Therefore, the mist generated by the cleaning liquid splashing from the surface of the substrate W is re-appeared on the surface of the substrate W while the substrate W that has been liquid drained by the air knives 6a and 6b is transported toward the substrate carry-out port 3. It is prevented that it adheres (for example, refer patent document 1).
JP-A-9-94546 (page 4-7, FIG. 1 and FIG. 3)

近年、基板のサイズが大きくなるのに伴い、処理チャンバの容積も大きくなってきているため、図9に示した構成を有する従来の基板処理装置では、処理チャンバ1内のダウンフローに必要とされる清浄空気の流量が増加し、送風機構9も大型化することとなる。また、基板が大型化することにより、エアーナイフ6a、6bからの気体の吐出流量が増加し、それに伴って処理チャンバ1内における気流が乱れ易くなる。このため、処理チャンバ1の上流側の空間a内に飛散した洗浄液のミストが、仕切り部材7の周縁部などの僅かな隙間からでも下流側の空間b内へ流入し易くなり、液切り処理を終えた基板Wの表面に洗浄液ミストが再付着する可能性がある。さらに、処理チャンバ1内への清浄空気の供給流量やエアーナイフ6a、6bからの気体の吐出流量が増加するため、処理チャンバ1内からの排気流量も増加し、排気ポンプも大型化することとなる。また、基板のサイズが大きくなるのに伴ってローラコンベアの回転軸が長くなり、このため回転軸を両端部だけでなく中央部でも軸受により支持する必要があり、この結果、回転軸の回転動作による発塵物が基板に付着する可能性が高まる、といった問題点がある。   In recent years, as the size of the substrate has increased, the volume of the processing chamber has also increased. Therefore, the conventional substrate processing apparatus having the configuration shown in FIG. 9 is required for downflow in the processing chamber 1. The flow rate of clean air to be increased increases, and the blower mechanism 9 is also increased in size. Further, as the substrate becomes larger, the gas discharge flow rate from the air knives 6a and 6b increases, and accordingly, the air flow in the processing chamber 1 is easily disturbed. For this reason, the mist of the cleaning liquid scattered in the space a on the upstream side of the processing chamber 1 can easily flow into the space b on the downstream side even from a slight gap such as the peripheral edge of the partition member 7. There is a possibility that the cleaning liquid mist adheres again to the surface of the finished substrate W. Furthermore, since the supply flow rate of clean air into the processing chamber 1 and the discharge flow rate of gas from the air knives 6a and 6b increase, the exhaust flow rate from the processing chamber 1 also increases, and the exhaust pump becomes larger. Become. Also, as the substrate size increases, the rotation axis of the roller conveyor becomes longer, so it is necessary to support the rotation axis not only at both ends but also at the center with bearings. As a result, the rotation operation of the rotation axis As a result, there is a problem that the possibility that dust generated by the particles adheres to the substrate increases.

この発明は、以上のような事情に鑑みてなされたものであり、液切り処理を終えた基板の表面に処理液のミストや発塵物が付着することを防止することができ、また、処理チャンバ内のダウンフローに必要とされる清浄空気の流量を低減させ、処理チャンバ内における気流の乱れを少なくし、処理チャンバ内からの排気流量も低減させることができる基板処理装置を提供することを目的とする。   The present invention has been made in view of the circumstances as described above, and can prevent the mist and dust generation of the processing liquid from adhering to the surface of the substrate after the liquid draining process. To provide a substrate processing apparatus capable of reducing the flow rate of clean air required for downflow in a chamber, reducing the turbulence of airflow in the processing chamber, and reducing the exhaust flow rate from the processing chamber. Objective.

請求項1に係る発明は、基板搬入口および基板搬出口を有し下部に排気口が形設された密閉型の処理チャンバと、この処理チャンバの内部に、互いに平行にかつ基板の搬送方向に沿って配列され、処理チャンバ内において基板を所定方向へ搬送する複数本の搬送ローラと、前記処理チャンバの内部に配設され、前記搬送ローラによって搬送される基板の少なくとも上面側主面へ気体を吹き付けて、基板の上面側主面に付着した処理液を吹き飛ばして除去する気体噴射手段と、前記処理チャンバの内部の、少なくとも基板搬送路の上方側の空間を、前記気体噴射手段に対して上流側の空間と下流側の空間とに仕切る仕切り部材と、この仕切り部材によって仕切られた前記下流側の空間内へ清浄空気を供給し、下流側の空間内において清浄空気を流下させる清浄空気供給手段と、前記処理チャンバの排気口を通して処理チャンバ内を排気する排気手段と、を備えた基板処理装置において、少なくとも前記下流側の空間側における基板搬送路の直下に、基板搬送路の上方側の空間における前記下流側の空間とその下方側の空間との間を仕切るように、前記搬送ローラの支持ローラ部に対応する部分に複数個の開口部が形成された平板状の上下仕切り部材を配設したことを特徴とする。 According to a first aspect of the present invention, there is provided a hermetically sealed processing chamber having a substrate carry-in port and a substrate carry-out port and having an exhaust port formed in a lower portion thereof, and the inside of the process chamber in parallel to each other and in the substrate transport direction. are arranged along a plurality conveying rollers for conveying the substrate in a predetermined direction in the processing chamber, is disposed within the processing chamber, the gas to at least the upper surface side main surface of the substrate which is transported by the transport roller A gas jetting means for blowing off and removing the processing liquid adhering to the main surface on the upper surface side of the substrate; and a space inside the processing chamber at least above the substrate transport path upstream of the gas jetting means. A partition member for partitioning into a space on the side and a space on the downstream side, supplying clean air into the downstream space partitioned by the partition member, and supplying the clean air in the space on the downstream side A clean air supply means for Do, in the substrate processing apparatus provided with an exhaust means for exhausting the inside of the processing chamber through an exhaust port of the process chamber, immediately under the substrate transportation path in the space side of at least the downstream substrate carrying A plate-like shape in which a plurality of openings are formed in a portion corresponding to the support roller portion of the conveying roller so as to partition the space on the lower side and the space on the lower side in the space on the upper side of the path. An upper and lower partition member is provided.

請求項2に係る発明は、請求項1に記載の基板処理装置において、前記上下仕切り部材に複数の通気孔が形成されたことを特徴とする。
請求項3に斯かる発明は、請求項1または請求項2に記載の基板処理装置において、前記上下仕切り部材を、前記搬送ローラの回転軸およびその軸受の配設位置より上方側に配設したことを特徴とする。
According to a second aspect of the present invention, in the substrate processing apparatus of the first aspect, a plurality of vent holes are formed in the upper and lower partition members.
According to a third aspect of the present invention, in the substrate processing apparatus according to the first or second aspect, the upper and lower partition members are disposed above the rotational position of the transport roller and its bearing. It is characterized by that.

請求項4に係る発明は、請求項1ないし請求項3のいずれかに記載の基板処理装置において、前記上流側の空間側における基板搬送路の直下に、基板搬送路の上方側の空間における前記上流側の空間とその下方側の空間との間を仕切るように、前記搬送ローラの支持ローラ部に対応する部分に複数個の開口部が形成された平板状の上流側上下仕切り部材が配設されたことを特徴とする。 The invention according to claim 4, in the substrate processing apparatus according to any one of claims 1 to 3, directly below the substrate transportation path in the space side of the upstream side, the in the upper side of the space of the substrate transport path A flat plate-like upstream upper and lower partition member having a plurality of openings formed in a portion corresponding to the support roller portion of the transport roller is disposed so as to partition the upstream space and the space below the upstream space. It is characterized by that.

請求項5に係る発明は、請求項1ないし請求項4のいずれかに記載の基板処理装置において、前記処理チャンバの内部に、前記搬送ローラによって搬送される基板の下面側主面へ気体を吹き付けて、基板の下面側主面に付着した処理液を吹き飛ばして除去する下方側気体噴射手段が配設され、前記処理チャンバの内部の、基板搬送路の下方側の空間を、前記下方側気体噴射手段に対して上流側の空間と下流側の空間とに仕切る下方側仕切り部材が設けられたことを特徴とする。 According to a fifth aspect of the present invention, in the substrate processing apparatus according to any one of the first to fourth aspects, a gas is blown into the lower chamber side main surface of the substrate transported by the transport roller into the processing chamber. And a lower gas jetting means for blowing off and removing the processing liquid adhering to the lower surface side main surface of the substrate, and the lower gas jetting is performed in the space below the substrate transport path inside the processing chamber. A lower side partitioning member for partitioning an upstream space and a downstream space with respect to the means is provided.

請求項1に係る発明の基板処理装置においては、処理チャンバの内部の、基板搬送路の上方側の空間が、気体噴射手段に対して上流側の空間と下流側の空間とに仕切り部材で仕切られているので、液切り処理により発生した処理液のミストを含む気体は、排気手段により吸引されて、上流側の空間内から処理チャンバ下部の排気口に向かって流れ、排気口を通して処理チャンバ内から排出される。一方、下流側の空間内には、清浄空気供給手段によって清浄空気が供給されることにより、下流側の空間内を流下して処理チャンバ下部の排気口に向かう清浄空気の流れ(ダウンフロー)を生じる。したがって、気体噴射手段による液切り処理を終えた基板の表面に処理液のミストが再付着することが防止される。そして、処理チャンバ内の、基板搬送路の上方側の空間における下流側の空間とその下方側の空間との間が上下仕切り部材によって仕切られており、清浄空気は、上下仕切り部材の、搬送ローラの支持ローラ部に対応する部分に形成された複数個の開口部を通って基板搬送路の上方側の空間における下流側の空間内からその下方側の空間へ流れるので、清浄空気の供給流量を低減させても、基板搬送路の上方側の空間における下流側の空間内にダウンフローを生じ、また、基板搬送路の上方側の空間における下流側の空間は陽圧状態となる。このため、下流側の空間内を搬送される基板の表面に処理液のミストが再付着することはない。また、処理チャンバ内への清浄空気の供給流量を低減させることにより、処理チャンバ内からの排気流量も低減する。さらに、基板搬送路の上方側の空間における下流側の空間内から清浄空気が上下仕切り部材の複数個の開口部を通って流下する際の整流作用により、処理チャンバ内における気流の乱れが少なくなるので、処理液のミストや発塵物を含んだ気体が処理チャンバ内から淀みなく排出されて、処理チャンバ内の雰囲気が速やかに置換される。また、基板搬送路の上方側の空間における下流側の空間内へ供給された清浄空気は、上下仕切り部材の複数個の開口部を通って下方側の空間へ流れるので、その流速が大きくなり、このため、搬送ローラの駆動部における発塵物が清浄空気の流れに逆らって上昇し、基板搬送路の上方側の空間における下流側の空間内へ流入して基板に付着する、といった可能性は極めて低くなる。
したがって、請求項1に係る発明の基板処理装置を使用すると、液切り処理を終えた基板の表面に処理液のミストや発塵物が付着することを防止することができ、また、処理チャンバ内のダウンフローに必要とされる清浄空気の流量を低減させて、清浄空気の供給機構を小型化することができ、処理チャンバ内からの排気流量も低減させて、排気機構も小型化することができる。
In the substrate processing apparatus according to the first aspect of the present invention, the space above the substrate transfer path inside the processing chamber is partitioned by the partition member into the upstream space and the downstream space with respect to the gas injection means. Therefore, the gas containing the mist of the processing liquid generated by the liquid draining process is sucked by the exhaust means, flows from the space on the upstream side toward the exhaust port at the lower part of the processing chamber, and passes through the exhaust port in the processing chamber. Discharged from. On the other hand, when clean air is supplied into the downstream space by the clean air supply means, the flow (down flow) of clean air flowing down the downstream space and flowing toward the exhaust port at the lower part of the processing chamber. Arise. Therefore, it is possible to prevent the mist of the processing liquid from re-adhering to the surface of the substrate that has been subjected to the liquid draining process by the gas jetting means. The space between the downstream side in the space above the substrate transfer path in the processing chamber and the space below it are partitioned by the upper and lower partition members, and the clean air is transported by the transport rollers of the upper and lower partition members. Since the flow from the downstream space in the upper space of the substrate transport path to the lower space through a plurality of openings formed in the portion corresponding to the support roller portion, the supply flow rate of clean air is reduced. also be reduced, resulting a downflow in the space on the downstream side in the upper side of the space of the substrate transport path, also the space on the downstream side in the upper side of the space of the substrate transfer path becomes positive pressure state. For this reason, the mist of the processing liquid does not reattach to the surface of the substrate transported in the downstream space. Further, by reducing the supply flow rate of clean air into the processing chamber, the exhaust flow rate from the processing chamber is also reduced. Furthermore, the turbulence of clean air flowing from the downstream space in the space above the substrate transport path through the plurality of openings of the upper and lower partition members reduces the turbulence of the air flow in the processing chamber. Therefore, the gas containing the mist of the processing liquid and the dust generation material is exhausted from the processing chamber without stagnation, and the atmosphere in the processing chamber is quickly replaced. In addition, the clean air supplied into the downstream space in the upper space of the substrate transport path flows to the lower space through the plurality of openings of the upper and lower partition members, so that the flow velocity increases. For this reason, there is a possibility that dust generated in the drive unit of the transport roller rises against the flow of clean air, flows into the downstream space in the space above the substrate transport path, and adheres to the substrate. Extremely low.
Therefore, when the substrate processing apparatus of the invention according to claim 1 is used, it is possible to prevent the mist of the processing liquid and dust from adhering to the surface of the substrate that has been subjected to the liquid draining process, and the inside of the processing chamber. The flow rate of clean air required for downflow of the process can be reduced, the clean air supply mechanism can be reduced in size, the exhaust flow rate from the processing chamber can be reduced, and the exhaust mechanism can also be reduced in size. it can.

請求項2に係る発明の基板処理装置では、処理チャンバの下流側の空間内へ供給された清浄空気は、上下仕切り部材に形成された複数の通気孔を通って下方側の空間へ流れる。
請求項3に係る発明の基板処理装置では、搬送ローラの回転軸が軸受で支持されて回転する際に塵埃が発生しても、その発塵物が基板搬送路の上方側の空間における下流側の空間内へ流入して基板に付着する、といった可能性が極めて低くなる。
In the substrate processing apparatus according to the second aspect of the present invention, the clean air supplied into the space on the downstream side of the processing chamber flows to the space on the lower side through the plurality of vent holes formed in the upper and lower partition members.
In the substrate processing apparatus according to the third aspect of the present invention, even if dust is generated when the rotation shaft of the transport roller is supported by the bearing and rotates, the generated dust is downstream in the space above the substrate transport path. The possibility of flowing into the space and adhering to the substrate becomes extremely low.

請求項4に係る発明の基板処理装置では、処理チャンバ内の、基板搬送路の上方側の空間における上流側の空間とその下方側の空間との間が上流側上下仕切り部材によって仕切られており、気体噴射手段から噴射された気体は、上流側上下仕切り部材の、搬送ローラの支持ローラ部に対応する部分に形成された複数個の開口部を通って基板搬送路の上方側の空間における上流側の空間内からその下方側の空間へ流れるので、基板搬送路の上方側の空間における上流側の空間は陽圧状態となり、また、上流側上下仕切り部材の複数個の開口部を通って下方側の空間へ流れる気体の流速が大きくなる。このため、搬送ローラの駆動部における発塵物が清浄空気の流れに逆らって上昇し、基板搬送路の上方側の空間における上流側の空間内へ流入して基板に付着する、といった可能性は極めて低くなる。 In the substrate processing apparatus according to the fourth aspect of the present invention, the upstream space in the space above the substrate transport path in the processing chamber and the space below it are partitioned by the upstream vertical partition member. The gas ejected from the gas ejecting means passes upstream in the space above the substrate transport path through a plurality of openings formed in a portion corresponding to the support roller portion of the transport roller of the upstream upper and lower partition members. The space on the upstream side in the space above the substrate transport path is in a positive pressure state and flows downward through a plurality of openings in the upstream side upper and lower partition members. The flow velocity of the gas flowing into the side space increases. For this reason, there is a possibility that dust generated in the drive unit of the transport roller rises against the flow of clean air, flows into the upstream space in the space above the substrate transport path, and adheres to the substrate. Extremely low.

請求項5に係る発明の基板処理装置では、処理チャンバの内部の、基板搬送路の下方側の空間が、下方側気体噴射手段に対して上流側の空間と下流側の空間とに下方側仕切り部材で仕切られているので、液切り処理により発生した処理液のミストを含む気体は、排気手段により吸引されて、上流側の空間内から処理チャンバ下部の排気口に向かって流れ、排気口を通して処理チャンバ内から排出される。したがって、下方側気体噴射手段による液切り処理を終えた基板の表面に処理液のミストが再付着することが防止される。 In the substrate processing apparatus according to the fifth aspect of the present invention, the space below the substrate transfer path inside the processing chamber is divided into a space on the upstream side and a space on the downstream side with respect to the lower gas injection means. Since it is partitioned by the member, the gas containing the mist of the processing liquid generated by the liquid draining process is sucked by the exhaust means, flows from the upstream space toward the exhaust port at the lower part of the processing chamber, and passes through the exhaust port. It is discharged from the processing chamber. Therefore, it is possible to prevent the mist of the processing liquid from reattaching to the surface of the substrate after the liquid draining process by the lower gas injection means.

以下、この発明の最良の実施形態について図1ないし図8を参照しながら説明する。
図1および図2は、この発明の実施形態の1例を示し、図1は、基板処理装置の概略構成を示す側断面図であり、図2は、図1中の矢印V方向から見た部分断面図である。
Hereinafter, the best embodiment of the present invention will be described with reference to FIGS.
1 and 2 show an example of an embodiment of the present invention, FIG. 1 is a side sectional view showing a schematic configuration of a substrate processing apparatus, and FIG. 2 is viewed from the direction of arrow V in FIG. It is a fragmentary sectional view.

この基板処理装置は、図9に示した従来の装置と同様に、密閉型の処理チャンバ10を備えており、処理チャンバ10には、湿式処理、例えば純水等の洗浄液による洗浄処理が施された基板Wが搬入される基板搬入口12、および、液切り処理された基板Wが搬出される基板搬出口14が設けられている。また、処理チャンバ10の下部には排気口16が形設され、排気口16には、排気用配管を介して排気ポンプ(図示せず)が流路接続されている。処理チャンバ10の内部には、基板Wを基板搬入口12から基板搬出口14に向かって水平方向へ搬送するためのローラコンベア18(二点鎖線で基板搬送路20を示している)が設けられている。ローラコンベア18は、互いに平行にかつ基板Wの搬送方向に沿って配列された複数本の搬送ローラ22により構成されている。搬送ローラ22は、処理チャンバ10の固定部に固着された軸受24に回転自在に支持された回転軸26に、基板Wの下面に当接して基板Wを支持する複数の支持ローラ部28を固着して構成されている。複数本の搬送ローラ22のうちの一部の回転軸26には、モータ30の回転軸が連結されており、当該搬送ローラ22と他の搬送ローラ22とは、それぞれの回転軸26に固着されたプーリ32およびベルト34を介して動力的に連結されている。   Similar to the conventional apparatus shown in FIG. 9, this substrate processing apparatus includes a sealed processing chamber 10, and the processing chamber 10 is subjected to a wet process, for example, a cleaning process using a cleaning liquid such as pure water. A substrate carry-in port 12 into which the substrate W is carried in and a substrate carry-out port 14 through which the substrate W that has been subjected to the liquid draining process are carried out are provided. An exhaust port 16 is formed in the lower part of the processing chamber 10, and an exhaust pump (not shown) is connected to the exhaust port 16 through an exhaust pipe. Inside the processing chamber 10, there is provided a roller conveyor 18 (a substrate transport path 20 is indicated by a two-dot chain line) for transporting the substrate W in the horizontal direction from the substrate transport inlet 12 toward the substrate transport outlet 14. ing. The roller conveyor 18 is composed of a plurality of transport rollers 22 arranged in parallel with each other and along the transport direction of the substrate W. The transport roller 22 is fixed to a rotation shaft 26 rotatably supported by a bearing 24 fixed to a fixed portion of the processing chamber 10, and a plurality of support roller portions 28 that contact the lower surface of the substrate W and support the substrate W are fixed. Configured. A rotation shaft of a motor 30 is connected to a part of the rotation shafts 26 of the plurality of conveyance rollers 22, and the conveyance roller 22 and the other conveyance rollers 22 are fixed to the respective rotation shafts 26. The pulleys 32 and the belt 34 are connected dynamically.

また、処理チャンバ10の内部には、基板搬送路20を挟んでその上・下両側にそれぞれエアーナイフ36a、36bが配設されている。さらに、処理チャンバ10の内部には、基板搬送路20の上方側の空間を、エアーナイフ36a、36bの配設位置でその上流側の空間Aと下流側の空間Bとに仕切る仕切り部材38が配設されている。また、処理チャンバ10の天井部には送風口40が設けられており、その送風口40を通して下流側の空間B内へ清浄空気(クリーンエア)を供給する送風機構42が設置されており、送風機構42は、ファンおよびHEPA等のフィルタを備えている。   In the processing chamber 10, air knives 36a and 36b are disposed on the upper and lower sides of the substrate transfer path 20, respectively. Further, inside the processing chamber 10, there is a partition member 38 that divides the space above the substrate transport path 20 into a space A on the upstream side and a space B on the downstream side at the positions where the air knives 36a and 36b are disposed. It is arranged. Further, a blower opening 40 is provided in the ceiling portion of the processing chamber 10, and a blower mechanism 42 that supplies clean air into the space B on the downstream side through the blower opening 40 is installed. The mechanism 42 includes a fan and a filter such as HEPA.

そして、この処理チャンバ10の内部には、下流側の空間Bとその下方側の空間との間を仕切るように平板状の上下仕切り部材44が配設されている。上下仕切り部材44には、図3に横断面図を示すように、搬送ローラ22の支持ローラ部28に対応する部分に複数個の開口部46が形成されており、その開口部46が清浄空気の通路となる。なお、図4に横断面図を示すように、複数個の開口部46の他に複数個の通気孔48を上下仕切り部材44に形成するようにしてもよい。また、この装置では、上流側の空間Aとその下方側の空間との間を仕切るように、上下仕切り部材44と同様に搬送ローラ22の支持ローラ部28に対応する部分に複数個の開口部が形成された平板状の上流側上下仕切り部材50が配設されている。上下仕切り部材44および上流側上下仕切り部材50は、基板搬送路20の直下であって、搬送ローラ22の回転軸26およびその軸受24の配設位置より上方側にそれぞれ設置されている。   A flat plate-shaped upper and lower partition member 44 is disposed inside the processing chamber 10 so as to partition the space B on the downstream side and the space on the lower side thereof. As shown in a cross-sectional view in FIG. 3, the upper and lower partition members 44 are formed with a plurality of openings 46 at portions corresponding to the support roller portions 28 of the transport roller 22, and the openings 46 are clean air. It becomes the passage. As shown in the cross-sectional view of FIG. 4, a plurality of vent holes 48 may be formed in the upper and lower partition members 44 in addition to the plurality of openings 46. Further, in this apparatus, a plurality of openings are formed in a portion corresponding to the support roller portion 28 of the transport roller 22 in the same manner as the upper and lower partition members 44 so as to partition the space A on the upstream side and the space on the lower side thereof. A flat plate-like upstream side upper and lower partition member 50 is provided. The upper and lower partition members 44 and the upstream upper and lower partition members 50 are respectively disposed directly below the substrate transport path 20 and above the position where the rotation shaft 26 of the transport roller 22 and the bearing 24 are disposed.

上記した構成を備えた基板処理装置においては、仕切り部材38によって仕切られた下流側の空間B内へ送風機構42により清浄空気が供給され、下流側の空間B内に清浄空気のダウンフローを生じ、その清浄空気は、上下仕切り部材44の開口部46を通って下方側の空間内へ流下し、処理チャンバ10内から排気口16を通って排気される。また、エアーナイフ36a、36bから基板Wの上・下両主面へ気体が吹き付けられることにより基板W面から飛散した洗浄液のミストは、仕切り部材38によって仕切られた上流側の空間A内から気体と共に上流側上下仕切り部材50の開口部を通って下方側の空間内へ流下し、処理チャンバ10内から排気口16を通って排出される。したがって、エアーナイフ36a、36bによる液切り処理を終えてエアーナイフ36a、36bの配設位置を通過した基板Wの表面に洗浄液のミストが再付着することが防止される。   In the substrate processing apparatus having the above-described configuration, clean air is supplied by the blower mechanism 42 into the downstream space B partitioned by the partition member 38, and a clean air downflow occurs in the downstream space B. The clean air flows down into the lower space through the opening 46 of the upper and lower partition members 44, and is exhausted from the processing chamber 10 through the exhaust port 16. Further, the mist of the cleaning liquid splashed from the surface of the substrate W when the gas is blown from the air knives 36 a and 36 b to the upper and lower main surfaces of the substrate W is gas from the upstream space A partitioned by the partition member 38. At the same time, it flows down into the space on the lower side through the opening of the upstream side upper and lower partition members 50, and is discharged from the processing chamber 10 through the exhaust port 16. Therefore, it is possible to prevent the mist of the cleaning liquid from re-adhering to the surface of the substrate W that has passed through the positions where the air knives 36a and 36b are finished after the liquid cutting process by the air knives 36a and 36b.

また、処理チャンバ10内の下流側の空間Bとその下方側の空間との間は上下仕切り部材44によって仕切られており、清浄空気は、上下仕切り部材44の開口部46を通って下流側の空間B内からその下方側の空間へ流れるので、下流側の空間B内にダウンフローを生じさせるために必要な清浄空気の供給流量を低減させることができる。また、処理チャンバ10内への清浄空気の供給流量が低減することにより、処理チャンバ10内からの排気流量も低減させることができる。さらに、下流側の空間B内から清浄空気が上下仕切り部材44の開口部46を通って流下する際の整流作用により、処理チャンバ10内における気流の乱れが少なくなる。このため、洗浄液のミストや発塵物を含んだ気体は、処理チャンバ10内から淀みなく排出されて、処理チャンバ10内の雰囲気が速やかに置換される。また、上下仕切り部材44が設置されていることにより整流効果が得られるので、下流側の空間B内におけるダウンフローを整流するために処理チャンバ10の高さ寸法を大きくする必要が無くなる。このため、処理チャンバ10の高さを低くして、処理チャンバ10の容積を小さくすることができる。また、上下仕切り部材44が設置されていることにより、清浄空気が供給される下流側の空間Bが陽圧状態となり、さらに、下流側の空間B内へ供給された清浄空気は、上下仕切り部材44の開口部46を通って下方側の空間へ流れるので、その流速が大きくなる。このため、搬送ローラ22の回転軸26が複数の軸受24で支持されて回転する際に塵埃が発生しても、その発塵物が清浄空気の流れに逆らって上昇し、下流側の空間B内へ流入して基板Wに付着する、といった可能性は極めて低くなる。   Further, the space B on the downstream side in the processing chamber 10 and the space on the lower side thereof are partitioned by an upper and lower partition member 44, and the clean air passes through the opening 46 of the upper and lower partition member 44 and is downstream. Since it flows from the space B to the space below it, it is possible to reduce the supply flow rate of clean air necessary to cause a downflow in the downstream space B. In addition, the flow rate of exhaust air from the processing chamber 10 can be reduced by reducing the supply flow rate of clean air into the processing chamber 10. Furthermore, the turbulence of clean air flowing from the downstream space B through the opening 46 of the upper and lower partition members 44 reduces the turbulence of the air flow in the processing chamber 10. For this reason, the gas containing the mist of the cleaning liquid and the dust generation material is exhausted from the processing chamber 10 without stagnation, and the atmosphere in the processing chamber 10 is quickly replaced. Further, since the upper and lower partition members 44 are installed, a rectifying effect is obtained, so that it is not necessary to increase the height of the processing chamber 10 in order to rectify the downflow in the downstream space B. For this reason, the height of the processing chamber 10 can be lowered and the volume of the processing chamber 10 can be reduced. Further, since the upper and lower partition members 44 are installed, the downstream space B to which clean air is supplied is in a positive pressure state, and further, the clean air supplied into the downstream space B is separated from the upper and lower partition members. Since it flows to the space below through the opening 46 of 44, the flow velocity becomes large. For this reason, even if dust is generated when the rotation shaft 26 of the transport roller 22 is supported by the plurality of bearings 24 and rotates, the generated dust rises against the flow of clean air, and the downstream space B The possibility of inflowing and adhering to the substrate W is extremely low.

また、処理チャンバ10内の上流側の空間Aとその下方側の空間との間が上流側上下仕切り部材50によって仕切られており、エアーナイフ36a、36bから噴射された気体は、上流側上下仕切り部材50の開口部を通って上流側の空間A内からその下方側の空間へ流れるので、上流側の空間Aは陽圧状態となり、また、上流側上下仕切り部材50の開口部を通って下方側の空間へ流れる気体の流速が大きくなる。このため、上流側の空間Aにおいても、搬送ローラ22の回転軸26の回転動作に伴う発塵物が清浄空気の流れに逆らって上昇し基板Wに付着する、といった可能性を極めて低くすることができる。   Further, the space A on the upstream side in the processing chamber 10 and the space on the lower side thereof are partitioned by the upstream upper and lower partition members 50, and the gas injected from the air knives 36a and 36b is separated from the upstream upper and lower partitions. Since the air flows from the upstream space A to the lower space through the opening of the member 50, the upstream space A is in a positive pressure state, and passes through the opening of the upstream upper and lower partition members 50. The flow velocity of the gas flowing into the side space increases. For this reason, also in the upstream space A, the possibility that dust generated due to the rotation of the rotation shaft 26 of the transport roller 22 rises against the flow of clean air and adheres to the substrate W is extremely reduced. Can do.

次に、図5は、この発明の別の実施形態を示し、基板処理装置の概略構成を示す側断面図である。この図において、図1に関して説明した部材と同一機能を有する部材については、図1で使用した符号と同一符号を付しており、それについての説明を省略する。   Next, FIG. 5 is a side sectional view showing a schematic configuration of a substrate processing apparatus according to another embodiment of the present invention. In this figure, members having the same functions as those described with reference to FIG. 1 are denoted by the same reference numerals as those used in FIG. 1, and description thereof is omitted.

図5に示した装置では、基板搬入口54および基板搬出口56を有する処理チャンバ52の内部に、基板搬送路20の上方側の空間を、エアーナイフ36a、36bの配設位置でその上流側の空間Cと下流側の空間Dとに仕切る仕切り部材58が配設されている他に、基板搬送路20の下方側の空間を、エアーナイフ36a、36bの配設位置でその上流側の空間Eと下流側の空間Fとに仕切る下方側仕切り部材60が配設されている。そして、処理チャンバ52の下部には、上流側の空間E側および下流側の空間F側の両方に排気口62、64がそれぞれ形設されている。また、処理チャンバ52の内部には、下流側の空間Dとその下方側の空間Fとの間を仕切るように、上記した上下仕切り部材44と同様に搬送ローラの支持ローラ部に対応する部分に複数個の開口部が形成された平板状の上下仕切り部材66が配設されている。   In the apparatus shown in FIG. 5, the space above the substrate transfer path 20 is disposed in the processing chamber 52 having the substrate carry-in port 54 and the substrate carry-out port 56 at the upstream side of the air knife 36a, 36b. In addition to the partition member 58 for partitioning the space C and the downstream space D, the space below the substrate transport path 20 is the upstream space at the position where the air knives 36a and 36b are disposed. A lower partitioning member 60 that partitions E into a downstream space F is provided. In the lower part of the processing chamber 52, exhaust ports 62 and 64 are respectively formed on both the upstream space E side and the downstream space F side. Further, in the processing chamber 52, a portion corresponding to the support roller portion of the transport roller is provided in the same manner as the upper and lower partition members 44 so as to partition the downstream space D and the lower space F. A flat plate-like upper and lower partition member 66 having a plurality of openings is provided.

図5に示した構成を有する基板処理装置では、処理チャンバ52の内部における基板搬送路20の上方側および下方側の各空間が、仕切り部材58および下方側仕切り部材60によってそれぞれ上流側の空間C、Eと下流側の空間D、Fとに仕切られており、上流側の空間E内および下流側の空間F内から各排気口62、64を通してそれぞれ排気が行われる。このため、エアーナイフ36a、36bから基板Wの上・下両主面へ気体が吹き付けられることにより基板W面から飛散した洗浄液のミストが、エアーナイフ36a、36bによる液切り処理を終えてエアーナイフ36a、36bの配設位置を通過した基板Wの表面に再付着することがより確実に防止される。   In the substrate processing apparatus having the configuration shown in FIG. 5, the space on the upper side and the lower side of the substrate transfer path 20 inside the processing chamber 52 is separated into the upstream space C by the partition member 58 and the lower partition member 60, respectively. , E and downstream spaces D and F, and exhaust is performed through the exhaust ports 62 and 64 from the upstream space E and the downstream space F, respectively. For this reason, the mist of the cleaning liquid scattered from the surface of the substrate W when the gas is blown from the air knives 36a and 36b to the upper and lower main surfaces of the substrate W finishes the liquid draining process by the air knives 36a and 36b. Reattachment to the surface of the substrate W that has passed through the arrangement positions of 36a and 36b is more reliably prevented.

次に、図6に基板搬送面の平面図を示した基板処理装置では、エアーナイフ68が、基板搬送方向と直交する方向に対して平面視で傾斜させるように配置されている。また、ローラコンベアが、回転軸に小径の支持ローラ部が複数固着された複数本の小径搬送ローラ70および回転軸に大径の支持ローラ部が複数固着された複数本の大径搬送ローラ72から構成されており、複数本の大径搬送ローラ72の配設位置にエアーナイフ68が配置されている。そして、エアーナイフ68の下流側に、小径搬送ローラ70の支持ローラ部および大径搬送ローラ72の支持ローラ部にそれぞれ対応する部分に複数個の開口部76、78が形成され平面形状が台形をなす平板状の上下仕切り部材74が配設されている。   Next, in the substrate processing apparatus whose plan view of the substrate transfer surface is shown in FIG. 6, the air knife 68 is disposed so as to be inclined in a plan view with respect to a direction orthogonal to the substrate transfer direction. The roller conveyor includes a plurality of small-diameter conveying rollers 70 each having a plurality of small-diameter support roller portions fixed to the rotating shaft, and a plurality of large-diameter conveying rollers 72 each having a plurality of large-diameter supporting roller portions fixed to the rotating shaft. The air knife 68 is arranged at the arrangement position of the plurality of large-diameter conveying rollers 72. A plurality of openings 76 and 78 are formed on the downstream side of the air knife 68 at portions corresponding to the support roller portion of the small-diameter conveyance roller 70 and the support roller portion of the large-diameter conveyance roller 72, respectively, and the planar shape is trapezoidal. A flat plate-shaped upper and lower partition member 74 is provided.

また、図7に概略平断面図を示した基板処理装置では、図6に示した装置と同様にエアーナイフ(図示せず)が、基板搬送方向と直交する方向に対して平面視で傾斜して配置され、処理チャンバ80の内部に、基板搬送路の上方側の空間をエアーナイフの配設位置でその上流側の空間Gと下流側の空間Hとに仕切る仕切り部材82が、基板搬送方向と直交する方向に対して平面視で傾斜して配設されている。また、下流側の空間H内へ清浄空気を供給するために、3台の小型の送風機構84a、84b、84cが並列して設置されている。このように、1台の大型の送風機構を設置する代わりに複数台の小型の送風機構84a、84b、84cを設置するようにすると、清浄空気のダウンフローの整流効果が高まる。これにより、処理チャンバ80の高さを低くして、処理チャンバ80の容積を小さくすることが可能となる。また、例えば図8に示すように、複数個の通気部が形成された平板状の上下仕切り部材86によって下方側の空間との間を仕切られた下流側の空間Hにイオナイザ88を設置したときは、清浄空気のダウンフローの整流効果が高まることにより、イオンを均等に拡散させ易くなり、イオナイザ88の除電能力を最大限に引き出すことができる。なお、図8において、図1で使用した符号と同一符号を付した部材は、図1に関して説明した部材と同一機能を有する部材を示す。   Further, in the substrate processing apparatus shown in the schematic plan view of FIG. 7, the air knife (not shown) is inclined in a plan view with respect to the direction orthogonal to the substrate transport direction as in the apparatus shown in FIG. In the processing chamber 80, a partition member 82 that divides the space above the substrate transport path into an upstream space G and a downstream space H at the position where the air knife is disposed is in the substrate transport direction. Are inclined with respect to the direction orthogonal to the plane view. In order to supply clean air into the downstream space H, three small air blowing mechanisms 84a, 84b, 84c are installed in parallel. In this way, when a plurality of small air blowing mechanisms 84a, 84b, 84c are installed instead of installing one large air blowing mechanism, the rectifying effect of the clean air downflow is enhanced. As a result, the height of the processing chamber 80 can be lowered and the volume of the processing chamber 80 can be reduced. For example, as shown in FIG. 8, when the ionizer 88 is installed in the downstream space H that is partitioned from the lower space by a flat plate-shaped upper and lower partition member 86 in which a plurality of ventilation portions are formed. Since the rectifying effect of the downflow of clean air is enhanced, ions can be easily diffused evenly, and the charge removal capability of the ionizer 88 can be maximized. In FIG. 8, members denoted by the same reference numerals as those used in FIG. 1 indicate members having the same functions as those described with reference to FIG. 1.

この発明の実施形態の1例を示し、基板処理装置の概略構成を示す側断面図である。1 is a side sectional view illustrating a schematic configuration of a substrate processing apparatus according to an embodiment of the present invention. 図1に示した基板処理装置を図1中の矢印V方向から見た部分断面図である。It is the fragmentary sectional view which looked at the substrate processing apparatus shown in FIG. 1 from the arrow V direction in FIG. 図1に示した基板処理装置の構成要素である上下仕切り部材の横断面図である。It is a cross-sectional view of the upper and lower partition member which is a component of the substrate processing apparatus shown in FIG. 上下仕切り部材の別の構成例を示す横断面図である。It is a cross-sectional view which shows another structural example of an up-and-down partition member. この発明の別の実施形態を示し、基板処理装置の概略構成を示す側断面図である。It is a sectional side view which shows another embodiment of this invention and shows schematic structure of a substrate processing apparatus. この発明の変形例を示し、基板処理装置における基板搬送面の平面図である。It is a top view of the board | substrate conveyance surface in a substrate processing apparatus which shows the modification of this invention. この発明の別の変形例を示し、基板処理装置の概略平断面図である。It is another schematic modification of this invention, and is a schematic plane sectional view of a substrate processing apparatus. 図7に示した基板処理装置の概略構成を示す側断面図である。It is a sectional side view which shows schematic structure of the substrate processing apparatus shown in FIG. 従来の基板処理装置の概略構成の1例を示す側断面図である。It is a sectional side view which shows an example of schematic structure of the conventional substrate processing apparatus.

符号の説明Explanation of symbols

10、52、80 処理チャンバ
12、54 基板搬入口
14、56 基板搬出口
16、62、64 排気口
18 ローラコンベア
20 基板搬送路
22、70、72 搬送ローラ
24 軸受
26 搬送ローラの回転軸
36a、36b、68 エアーナイフ
38、58、82 仕切り部材
40 送風口
42、84a、84b、84c 送風機構
44、66、74、86 上下仕切り部材
46、76、78 開口部
48 通気孔
50 上流側上下仕切り部材
60 下方側仕切り部材
W 基板
A、C、E、G 上流側の空間
B、D、F、H 下流側の空間
10, 52, 80 Processing chamber 12, 54 Substrate carry-in port 14, 56 Substrate carry-out port 16, 62, 64 Exhaust port 18 Roller conveyor 20 Substrate transport path 22, 70, 72 Transport roller 24 Bearing 26 Rotating shaft 36a of transport roller 36b, 68 Air knife 38, 58, 82 Partition member 40 Blower port 42, 84a, 84b, 84c Blower mechanism 44, 66, 74, 86 Vertical partition member 46, 76, 78 Opening 48 Ventilation hole 50 Upstream vertical partition member 60 Lower partition member
W Board A, C, E, G Upstream space B, D, F, H Downstream space

Claims (5)

基板搬入口および基板搬出口を有し下部に排気口が形設された密閉型の処理チャンバと、
この処理チャンバの内部に、互いに平行にかつ基板の搬送方向に沿って配列され、処理チャンバ内において基板を所定方向へ搬送する複数本の搬送ローラと、
前記処理チャンバの内部に配設され、前記搬送ローラによって搬送される基板の少なくとも上面側主面へ気体を吹き付けて、基板の上面側主面に付着した処理液を吹き飛ばして除去する気体噴射手段と、
前記処理チャンバの内部の、少なくとも基板搬送路の上方側の空間を、前記気体噴射手段に対して上流側の空間と下流側の空間とに仕切る仕切り部材と、
この仕切り部材によって仕切られた前記下流側の空間内へ清浄空気を供給し、下流側の空間内において清浄空気を流下させる清浄空気供給手段と、
前記処理チャンバの排気口を通して処理チャンバ内を排気する排気手段と、
を備えた基板処理装置において、
少なくとも前記下流側の空間側における基板搬送路の直下に、基板搬送路の上方側の空間における前記下流側の空間とその下方側の空間との間を仕切るように、前記搬送ローラの支持ローラ部に対応する部分に複数個の開口部が形成された平板状の上下仕切り部材を配設したことを特徴とする基板処理装置。
A sealed processing chamber having a substrate carry-in port and a substrate carry-out port and having an exhaust port formed in the lower part;
A plurality of transport rollers arranged in parallel to each other in the processing chamber and along the transport direction of the substrate, and transports the substrate in a predetermined direction in the processing chamber;
A gas jetting means disposed inside the processing chamber, for blowing gas to at least the upper surface main surface of the substrate conveyed by the conveying roller , and blowing away the processing liquid adhering to the upper surface main surface of the substrate; ,
A partition member that divides at least the space above the substrate transfer path inside the processing chamber into a space on the upstream side and a space on the downstream side with respect to the gas ejection unit;
Clean air supply means for supplying clean air into the downstream space partitioned by the partition member and causing the clean air to flow down in the downstream space;
Exhaust means for exhausting the interior of the processing chamber through the exhaust port of the processing chamber;
In a substrate processing apparatus comprising:
The support roller portion of the transport roller so as to partition between the downstream space in the space above the substrate transport path and the space below it immediately below the substrate transport path at least in the downstream space side A substrate processing apparatus comprising a flat plate-like upper and lower partition member having a plurality of openings formed in a portion corresponding to .
請求項1に記載の基板処理装置において、
前記上下仕切り部材に複数の通気孔が形成されたことを特徴とする基板処理装置。
The substrate processing apparatus according to claim 1,
A substrate processing apparatus, wherein a plurality of air holes are formed in the upper and lower partition members.
請求項1または請求項2に記載の基板処理装置において、In the substrate processing apparatus of Claim 1 or Claim 2,
前記上下仕切り部材は、前記搬送ローラの回転軸およびその軸受の配設位置より上方側に配設されたことを特徴とする基板処理装置。  The substrate processing apparatus, wherein the upper and lower partition members are disposed above a position where a rotation shaft of the transport roller and a bearing thereof are disposed.
請求項1ないし請求項3のいずれかに記載の基板処理装置において、
前記上流側の空間側における基板搬送路の直下に、基板搬送路の上方側の空間における前記上流側の空間とその下方側の空間との間を仕切るように、前記搬送ローラの支持ローラ部に対応する部分に複数個の開口部が形成された平板状の上流側上下仕切り部材が配設されたことを特徴とする基板処理装置。
The substrate processing apparatus according to claim 1 , wherein:
Immediately below the substrate transport path on the upstream space side, on the support roller portion of the transport roller so as to partition the upstream space in the space above the substrate transport path and the space below it. A substrate processing apparatus, comprising: a plate-like upstream upper and lower partition member having a plurality of openings formed in corresponding portions .
請求項1ないし請求項4のいずれかに記載の基板処理装置において、
前記処理チャンバの内部に、前記搬送ローラによって搬送される基板の下面側主面へ気体を吹き付けて、基板の下面側主面に付着した処理液を吹き飛ばして除去する下方側気体噴射手段が配設され、
前記処理チャンバの内部の、基板搬送路の下方側の空間を、前記下方側気体噴射手段に対して上流側の空間と下流側の空間とに仕切る下方側仕切り部材が設けられたことを特徴とする基板処理装置。
The substrate processing apparatus according to claim 1 , wherein:
Inside the processing chamber, there is disposed a lower side gas jetting means for blowing gas to the lower surface side main surface of the substrate conveyed by the conveying roller and blowing away the processing liquid adhering to the lower surface side main surface of the substrate. And
A lower partitioning member for partitioning the space below the substrate transfer path inside the processing chamber into a space on the upstream side and a space on the downstream side with respect to the lower gas injection means is provided. Substrate processing apparatus.
JP2004079749A 2004-03-19 2004-03-19 Substrate processing equipment Expired - Fee Related JP4509613B2 (en)

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JP2003077883A (en) * 2001-09-05 2003-03-14 Tokyo Electron Ltd Substrate-drying method and substrate-drying equipment

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