JP4495888B2 - 単結晶超合金のための構造解析方法 - Google Patents

単結晶超合金のための構造解析方法 Download PDF

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Publication number
JP4495888B2
JP4495888B2 JP2001255635A JP2001255635A JP4495888B2 JP 4495888 B2 JP4495888 B2 JP 4495888B2 JP 2001255635 A JP2001255635 A JP 2001255635A JP 2001255635 A JP2001255635 A JP 2001255635A JP 4495888 B2 JP4495888 B2 JP 4495888B2
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Japan
Prior art keywords
acid
single crystal
bath
cathode
corrosion
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Expired - Lifetime
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JP2001255635A
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English (en)
Japanese (ja)
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JP2002161399A (ja
JP2002161399A5 (https=
Inventor
ミシエル・リユイミ
シルビー・プトネ
フイリツプ・プバンヌ
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Safran Aircraft Engines SAS
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SNECMA SAS
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Publication date
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Publication of JP2002161399A5 publication Critical patent/JP2002161399A5/ja
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    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F1/00—Etching metallic material by chemical means
    • C23F1/10—Etching compositions
    • C23F1/14—Aqueous compositions
    • C23F1/16—Acidic compositions
    • C23F1/26—Acidic compositions for etching refractory metals
    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25F—PROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
    • C25F3/00—Electrolytic etching or polishing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/32—Polishing; Etching
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/204—Structure thereof, e.g. crystal structure
    • G01N33/2045—Defects

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Metallurgy (AREA)
  • Electrochemistry (AREA)
  • Food Science & Technology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Medicinal Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Mechanical Engineering (AREA)
  • ing And Chemical Polishing (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)
  • Turbine Rotor Nozzle Sealing (AREA)
  • Cleaning And De-Greasing Of Metallic Materials By Chemical Methods (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Electroplating And Plating Baths Therefor (AREA)
JP2001255635A 2000-08-28 2001-08-27 単結晶超合金のための構造解析方法 Expired - Lifetime JP4495888B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0010979A FR2813392B1 (fr) 2000-08-28 2000-08-28 Procede de revelation structurale pour superalliages monocristallins
FR0010979 2000-08-28

Publications (3)

Publication Number Publication Date
JP2002161399A JP2002161399A (ja) 2002-06-04
JP2002161399A5 JP2002161399A5 (https=) 2008-05-22
JP4495888B2 true JP4495888B2 (ja) 2010-07-07

Family

ID=8853757

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001255635A Expired - Lifetime JP4495888B2 (ja) 2000-08-28 2001-08-27 単結晶超合金のための構造解析方法

Country Status (7)

Country Link
US (1) US6582585B2 (https=)
EP (1) EP1184656B1 (https=)
JP (1) JP4495888B2 (https=)
CA (1) CA2356303C (https=)
FR (1) FR2813392B1 (https=)
RU (1) RU2268953C2 (https=)
UA (1) UA72911C2 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201200360D0 (en) * 2012-01-11 2012-02-22 Rolls Royce Plc Component production method
JP2013160619A (ja) * 2012-02-03 2013-08-19 Mitsubishi Heavy Ind Ltd 電解エッチング方法及び構造部材の保全方法
CN105318109A (zh) * 2014-06-30 2016-02-10 江苏大力城电气有限公司 一种恒力支吊架用连接卡扣
EP4546365A3 (en) 2015-11-24 2025-08-06 Insulet Corporation Wearable automated medication delivery system
FR3101643B1 (fr) 2019-10-08 2022-05-06 Safran Piece d'aeronef en superalliage comprenant du rhenium et/ou du ruthenium et procede de fabrication associe

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5424318B2 (https=) * 1974-07-03 1979-08-20
US4234397A (en) * 1978-08-15 1980-11-18 United Technologies Corporation Nondestructive metallographic examination of gas turbine components
US4445988A (en) * 1980-09-29 1984-05-01 The United States Of America As Represented By The Department Of Energy Micrographic detection of plastic deformation in nickel base alloys
SU1236007A1 (ru) * 1983-05-23 1986-06-07 Предприятие П/Я М-5612 Способ обработки изделий из никел
US4548903A (en) * 1984-03-30 1985-10-22 The United States Of America As Represented By The Secretary Of The Air Force Method to reveal microstructures in single phase alloys
US4801367A (en) * 1984-12-31 1989-01-31 White Cap Dental Company, Inc. Apparatus for electro-etching
JPH01191056A (ja) * 1988-01-26 1989-08-01 Nippon Sheet Glass Co Ltd ＺｎＳｅ単結晶の転位密度の測定方法
JP2568637B2 (ja) * 1988-07-19 1997-01-08 株式会社日立製作所 高温用機器の損傷検出法
US5186796A (en) * 1989-06-05 1993-02-16 Stelco Inc. Method and apparatus for electrolytic etching of metals
RU2023767C1 (ru) * 1990-06-25 1994-11-30 Шабанов Геннадий Дмитриевич Раствор для электрохимического полирования металлов
JP3064107B2 (ja) * 1992-07-16 2000-07-12 三菱重工業株式会社 オーステナイト系耐熱鋼の高温損傷評価方法
JP3661801B2 (ja) * 1995-05-18 2005-06-22 同和鉱業株式会社 Ｉｉ−ｖｉ 族化合物半導体単結晶体の転位密度測定方法
AU5435198A (en) * 1996-11-08 1998-05-29 Mountain States Analytical, Inc. Sample preparation for metals analysis using accelerated acid digestion (aad)
FR2780982B1 (fr) * 1998-07-07 2000-09-08 Onera (Off Nat Aerospatiale) Superalliage monocristallin a base de nickel a haut solvus

Also Published As

Publication number Publication date
JP2002161399A (ja) 2002-06-04
EP1184656B1 (fr) 2015-01-28
CA2356303A1 (fr) 2002-02-28
US6582585B2 (en) 2003-06-24
FR2813392B1 (fr) 2002-12-06
US20020023846A1 (en) 2002-02-28
UA72911C2 (uk) 2005-05-16
RU2268953C2 (ru) 2006-01-27
EP1184656A1 (fr) 2002-03-06
FR2813392A1 (fr) 2002-03-01
CA2356303C (fr) 2011-09-27

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