JP4492267B2 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
JP4492267B2
JP4492267B2 JP2004269112A JP2004269112A JP4492267B2 JP 4492267 B2 JP4492267 B2 JP 4492267B2 JP 2004269112 A JP2004269112 A JP 2004269112A JP 2004269112 A JP2004269112 A JP 2004269112A JP 4492267 B2 JP4492267 B2 JP 4492267B2
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JP
Japan
Prior art keywords
sample
ion
gas
column
primary
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Expired - Lifetime
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JP2004269112A
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English (en)
Japanese (ja)
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JP2006086002A (ja
JP2006086002A5 (enExample
Inventor
益義 山田
泉 和氣
秀夫 鹿島
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Hitachi Ltd
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Hitachi Ltd
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Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP2004269112A priority Critical patent/JP4492267B2/ja
Priority to EP05004827.1A priority patent/EP1638132B1/en
Priority to US11/071,345 priority patent/US7064320B2/en
Publication of JP2006086002A publication Critical patent/JP2006086002A/ja
Publication of JP2006086002A5 publication Critical patent/JP2006086002A5/ja
Application granted granted Critical
Publication of JP4492267B2 publication Critical patent/JP4492267B2/ja
Anticipated expiration legal-status Critical
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/62Detectors specially adapted therefor
    • G01N30/72Mass spectrometers
    • G01N30/7206Mass spectrometers interfaced to gas chromatograph
    • G01N30/7213Mass spectrometers interfaced to gas chromatograph splitting of the gaseous effluent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/168Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2004269112A 2004-09-16 2004-09-16 質量分析装置 Expired - Lifetime JP4492267B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2004269112A JP4492267B2 (ja) 2004-09-16 2004-09-16 質量分析装置
EP05004827.1A EP1638132B1 (en) 2004-09-16 2005-03-04 Mass chromatography
US11/071,345 US7064320B2 (en) 2004-09-16 2005-03-04 Mass chromatograph

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004269112A JP4492267B2 (ja) 2004-09-16 2004-09-16 質量分析装置

Publications (3)

Publication Number Publication Date
JP2006086002A JP2006086002A (ja) 2006-03-30
JP2006086002A5 JP2006086002A5 (enExample) 2007-04-05
JP4492267B2 true JP4492267B2 (ja) 2010-06-30

Family

ID=35509336

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004269112A Expired - Lifetime JP4492267B2 (ja) 2004-09-16 2004-09-16 質量分析装置

Country Status (3)

Country Link
US (1) US7064320B2 (enExample)
EP (1) EP1638132B1 (enExample)
JP (1) JP4492267B2 (enExample)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7095019B1 (en) 2003-05-30 2006-08-22 Chem-Space Associates, Inc. Remote reagent chemical ionization source
US7138626B1 (en) 2005-05-05 2006-11-21 Eai Corporation Method and device for non-contact sampling and detection
US7568401B1 (en) 2005-06-20 2009-08-04 Science Applications International Corporation Sample tube holder
US7576322B2 (en) * 2005-11-08 2009-08-18 Science Applications International Corporation Non-contact detector system with plasma ion source
JP4982087B2 (ja) 2006-02-08 2012-07-25 株式会社日立製作所 質量分析装置及び質量分析方法
JP4823794B2 (ja) * 2006-07-24 2011-11-24 株式会社日立製作所 質量分析装置及び探知方法
US8123396B1 (en) 2007-05-16 2012-02-28 Science Applications International Corporation Method and means for precision mixing
US8008617B1 (en) 2007-12-28 2011-08-30 Science Applications International Corporation Ion transfer device
US8227750B1 (en) * 2008-04-28 2012-07-24 Bruker-Michrom, Inc. Method and apparatus for nano-capillary/micro electrospray for use in liquid chromatography-mass spectrometry
WO2009155007A1 (en) * 2008-05-30 2009-12-23 Thermo Finnigan Llc Method and apparatus for generation of reagent ions in a mass spectrometer
US8071957B1 (en) 2009-03-10 2011-12-06 Science Applications International Corporation Soft chemical ionization source
WO2011089912A1 (ja) 2010-01-25 2011-07-28 株式会社日立ハイテクノロジーズ 質量分析装置
JP5596402B2 (ja) 2010-04-19 2014-09-24 株式会社日立ハイテクノロジーズ 分析装置、イオン化装置及び分析方法
CN103069538B (zh) * 2010-08-19 2016-05-11 莱克公司 具有软电离辉光放电和调节器的质谱仪
US8319194B2 (en) 2010-08-25 2012-11-27 Hitachi High-Technologies Corporation Drug detection equipment
JP5497615B2 (ja) * 2010-11-08 2014-05-21 株式会社日立ハイテクノロジーズ 質量分析装置
JP6025406B2 (ja) 2012-06-04 2016-11-16 株式会社日立ハイテクノロジーズ 質量分析装置
CN103940899B (zh) * 2014-03-21 2019-03-29 东华理工大学 一种痕量爆炸物的快速检测方法及装置
GB2554202B (en) 2015-03-06 2021-08-18 Micromass Ltd Imaging guided ambient ionisation mass spectrometry
KR102158736B1 (ko) 2015-03-06 2020-09-23 마이크로매스 유케이 리미티드 개선된 이온화용 충돌 표면
WO2016142681A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Spectrometric analysis of microbes
GB2556436B (en) 2015-03-06 2022-01-26 Micromass Ltd Cell population analysis
WO2016142691A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Rapid evaporative ionisation mass spectrometry ("reims") and desorption electrospray ionisation mass spectrometry ("desi-ms") analysis of swabs and biopsy samples
EP3726562B1 (en) 2015-03-06 2023-12-20 Micromass UK Limited Ambient ionization mass spectrometry imaging platform for direct mapping from bulk tissue
CA2978048A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Liquid trap or separator for electrosurgical applications
GB2551669B (en) 2015-03-06 2021-04-14 Micromass Ltd Physically guided rapid evaporative ionisation mass spectrometry ("Reims")
KR102017409B1 (ko) 2015-03-06 2019-10-21 마이크로매스 유케이 리미티드 기체성 샘플의 개선된 이온화 방법
EP3265797B1 (en) 2015-03-06 2022-10-05 Micromass UK Limited Inlet instrumentation for ion analyser coupled to rapid evaporative ionisation mass spectrometry ("reims") device
GB2556994B (en) 2015-03-06 2021-05-12 Micromass Ltd Identification of bacterial strains in biological samples using mass spectrometry
US10777398B2 (en) 2015-03-06 2020-09-15 Micromass Uk Limited Spectrometric analysis
US11139156B2 (en) 2015-03-06 2021-10-05 Micromass Uk Limited In vivo endoscopic tissue identification tool
WO2016142679A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Chemically guided ambient ionisation mass spectrometry
CN105181785A (zh) * 2015-03-19 2015-12-23 南昌大学 一种快速判别不同化学型香樟树的方法
GB201517195D0 (en) 2015-09-29 2015-11-11 Micromass Ltd Capacitively coupled reims technique and optically transparent counter electrode
WO2017178833A1 (en) 2016-04-14 2017-10-19 Micromass Uk Limited Spectrometric analysis of plants
US11583182B2 (en) * 2016-07-22 2023-02-21 Synaptive Medical Inc. Method for multimodal tissue imaging based on resonance Raman effect on metal based MRI contrast agents and method for ionizing laser plumes through atmospheric pressure chemical ionization
JP6767037B2 (ja) * 2016-07-28 2020-10-14 国立大学法人静岡大学 同位体測定装置及び同位体測定方法
US11482405B2 (en) * 2018-04-05 2022-10-25 Shimadzu Corporation Mass spectrometry device and mass spectrometry method
CN111102914B (zh) * 2019-12-30 2025-11-28 上海安平静电科技有限公司 一种离子发生装置电极间距的确定方法
JP7453642B2 (ja) * 2020-02-25 2024-03-21 株式会社バイオクロマト イオン化装置、質量分析システム及びイオン化方法
JP7780360B2 (ja) * 2022-02-25 2025-12-04 シャープ株式会社 Ims分析装置
CN114864373B (zh) * 2022-04-25 2023-08-11 苏州大学 一种电晕放电离子源

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0550648U (ja) * 1991-11-27 1993-07-02 株式会社日立製作所 質量分析計
JPH06310091A (ja) * 1993-04-26 1994-11-04 Hitachi Ltd 大気圧イオン化質量分析計
JPH0915207A (ja) * 1995-06-29 1997-01-17 Osaka Oxygen Ind Ltd ガスの高感度分析装置
JP3607997B2 (ja) 1998-04-09 2005-01-05 大陽日酸株式会社 ガス中の微量不純物の分析装置
EP2296167B1 (en) * 1999-09-20 2012-11-07 Hitachi, Ltd. Ion source, mass spectrometer, detector and monitoring system
JP4054493B2 (ja) 1999-09-20 2008-02-27 株式会社日立製作所 イオン源
JP2001351569A (ja) * 2000-06-02 2001-12-21 Hitachi Ltd ガス測定用オンラインモニター装置
JP3660279B2 (ja) * 2001-07-23 2005-06-15 株式会社日立製作所 試料イオン化装置及び質量分析計
JP3787116B2 (ja) * 2002-11-06 2006-06-21 株式会社日立製作所 化学剤の探知方法
JP2004157057A (ja) * 2002-11-08 2004-06-03 Hitachi Ltd 質量分析装置

Also Published As

Publication number Publication date
EP1638132B1 (en) 2016-02-17
US20060054806A1 (en) 2006-03-16
JP2006086002A (ja) 2006-03-30
US7064320B2 (en) 2006-06-20
EP1638132A3 (en) 2007-03-14
EP1638132A2 (en) 2006-03-22

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