JP4492267B2 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
JP4492267B2
JP4492267B2 JP2004269112A JP2004269112A JP4492267B2 JP 4492267 B2 JP4492267 B2 JP 4492267B2 JP 2004269112 A JP2004269112 A JP 2004269112A JP 2004269112 A JP2004269112 A JP 2004269112A JP 4492267 B2 JP4492267 B2 JP 4492267B2
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JP
Japan
Prior art keywords
sample
ion
gas
column
primary
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Expired - Lifetime
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JP2004269112A
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English (en)
Japanese (ja)
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JP2006086002A5 (cg-RX-API-DMAC7.html
JP2006086002A (ja
Inventor
益義 山田
泉 和氣
秀夫 鹿島
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Hitachi Ltd
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Hitachi Ltd
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Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP2004269112A priority Critical patent/JP4492267B2/ja
Priority to EP05004827.1A priority patent/EP1638132B1/en
Priority to US11/071,345 priority patent/US7064320B2/en
Publication of JP2006086002A publication Critical patent/JP2006086002A/ja
Publication of JP2006086002A5 publication Critical patent/JP2006086002A5/ja
Application granted granted Critical
Publication of JP4492267B2 publication Critical patent/JP4492267B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/62Detectors specially adapted therefor
    • G01N30/72Mass spectrometers
    • G01N30/7206Mass spectrometers interfaced to gas chromatograph
    • G01N30/7213Mass spectrometers interfaced to gas chromatograph splitting of the gaseous effluent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/168Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2004269112A 2004-09-16 2004-09-16 質量分析装置 Expired - Lifetime JP4492267B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2004269112A JP4492267B2 (ja) 2004-09-16 2004-09-16 質量分析装置
EP05004827.1A EP1638132B1 (en) 2004-09-16 2005-03-04 Mass chromatography
US11/071,345 US7064320B2 (en) 2004-09-16 2005-03-04 Mass chromatograph

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004269112A JP4492267B2 (ja) 2004-09-16 2004-09-16 質量分析装置

Publications (3)

Publication Number Publication Date
JP2006086002A JP2006086002A (ja) 2006-03-30
JP2006086002A5 JP2006086002A5 (cg-RX-API-DMAC7.html) 2007-04-05
JP4492267B2 true JP4492267B2 (ja) 2010-06-30

Family

ID=35509336

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004269112A Expired - Lifetime JP4492267B2 (ja) 2004-09-16 2004-09-16 質量分析装置

Country Status (3)

Country Link
US (1) US7064320B2 (cg-RX-API-DMAC7.html)
EP (1) EP1638132B1 (cg-RX-API-DMAC7.html)
JP (1) JP4492267B2 (cg-RX-API-DMAC7.html)

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* Cited by examiner, † Cited by third party
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US7095019B1 (en) 2003-05-30 2006-08-22 Chem-Space Associates, Inc. Remote reagent chemical ionization source
US7138626B1 (en) 2005-05-05 2006-11-21 Eai Corporation Method and device for non-contact sampling and detection
US7568401B1 (en) 2005-06-20 2009-08-04 Science Applications International Corporation Sample tube holder
US7576322B2 (en) * 2005-11-08 2009-08-18 Science Applications International Corporation Non-contact detector system with plasma ion source
JP4982087B2 (ja) 2006-02-08 2012-07-25 株式会社日立製作所 質量分析装置及び質量分析方法
JP4823794B2 (ja) * 2006-07-24 2011-11-24 株式会社日立製作所 質量分析装置及び探知方法
US8123396B1 (en) 2007-05-16 2012-02-28 Science Applications International Corporation Method and means for precision mixing
US8008617B1 (en) 2007-12-28 2011-08-30 Science Applications International Corporation Ion transfer device
US8227750B1 (en) * 2008-04-28 2012-07-24 Bruker-Michrom, Inc. Method and apparatus for nano-capillary/micro electrospray for use in liquid chromatography-mass spectrometry
EP2294600A1 (en) * 2008-05-30 2011-03-16 Thermo Finnigan LLC Method and apparatus for generation of reagent ions in a mass spectrometer
US8071957B1 (en) 2009-03-10 2011-12-06 Science Applications International Corporation Soft chemical ionization source
JP5622751B2 (ja) 2010-01-25 2014-11-12 株式会社日立ハイテクノロジーズ 質量分析装置
JP5596402B2 (ja) 2010-04-19 2014-09-24 株式会社日立ハイテクノロジーズ 分析装置、イオン化装置及び分析方法
DE112011102744T5 (de) * 2010-08-19 2013-07-04 Leco Corporation Massenspektrometer mit weicher ionisierender Glimmentladung und Konditionierer
EP2423945A3 (en) 2010-08-25 2015-11-18 Hitachi High-Technologies Corporation Drug detection equipment
JP5497615B2 (ja) * 2010-11-08 2014-05-21 株式会社日立ハイテクノロジーズ 質量分析装置
JP6025406B2 (ja) 2012-06-04 2016-11-16 株式会社日立ハイテクノロジーズ 質量分析装置
CN103940899B (zh) * 2014-03-21 2019-03-29 东华理工大学 一种痕量爆炸物的快速检测方法及装置
WO2016142669A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Physically guided rapid evaporative ionisation mass spectrometry ("reims")
WO2016142681A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Spectrometric analysis of microbes
US11031222B2 (en) 2015-03-06 2021-06-08 Micromass Uk Limited Chemically guided ambient ionisation mass spectrometry
EP3264989B1 (en) 2015-03-06 2023-12-20 Micromass UK Limited Spectrometric analysis
GB2555921B (en) 2015-03-06 2021-09-15 Micromass Ltd Endoscopic tissue identification tool
EP3265797B1 (en) 2015-03-06 2022-10-05 Micromass UK Limited Inlet instrumentation for ion analyser coupled to rapid evaporative ionisation mass spectrometry ("reims") device
WO2016142689A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Tissue analysis by mass spectrometry or ion mobility spectrometry
GB2553918B (en) 2015-03-06 2022-10-12 Micromass Ltd Ambient ionization mass spectrometry imaging platform for direct mapping from bulk tissue
JP6845148B2 (ja) 2015-03-06 2021-03-17 マイクロマス ユーケー リミテッド 電気外科的応用のための液体トラップ又は分離器
GB2552430B (en) 2015-03-06 2022-05-11 Micromass Ltd Collision surface for improved ionisation
WO2016142683A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Improved ionisation of gaseous samples
CN112557490B (zh) 2015-03-06 2025-05-23 英国质谱公司 拭子和活检样品的快速蒸发电离质谱和解吸电喷雾电离质谱分析
GB2556436B (en) 2015-03-06 2022-01-26 Micromass Ltd Cell population analysis
US10978284B2 (en) 2015-03-06 2021-04-13 Micromass Uk Limited Imaging guided ambient ionisation mass spectrometry
CN105181785A (zh) * 2015-03-19 2015-12-23 南昌大学 一种快速判别不同化学型香樟树的方法
GB201517195D0 (en) * 2015-09-29 2015-11-11 Micromass Ltd Capacitively coupled reims technique and optically transparent counter electrode
US11454611B2 (en) 2016-04-14 2022-09-27 Micromass Uk Limited Spectrometric analysis of plants
GB2570055B (en) * 2016-07-22 2021-07-21 Synaptive Medical Inc Method for multimodal tissue imaging based on resonance Raman effect on metal based MRI contrast agents and method for ionizing laser plumes
JP6767037B2 (ja) * 2016-07-28 2020-10-14 国立大学法人静岡大学 同位体測定装置及び同位体測定方法
US11482405B2 (en) * 2018-04-05 2022-10-25 Shimadzu Corporation Mass spectrometry device and mass spectrometry method
CN111102914B (zh) * 2019-12-30 2025-11-28 上海安平静电科技有限公司 一种离子发生装置电极间距的确定方法
CA3172849A1 (en) 2020-02-25 2021-09-02 Biochromato, Inc. Ionization device, mass spectrometry system, and ionization method
JP7780360B2 (ja) * 2022-02-25 2025-12-04 シャープ株式会社 Ims分析装置
CN114864373B (zh) * 2022-04-25 2023-08-11 苏州大学 一种电晕放电离子源

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0550648U (ja) * 1991-11-27 1993-07-02 株式会社日立製作所 質量分析計
JPH06310091A (ja) * 1993-04-26 1994-11-04 Hitachi Ltd 大気圧イオン化質量分析計
JPH0915207A (ja) 1995-06-29 1997-01-17 Osaka Oxygen Ind Ltd ガスの高感度分析装置
JP3607997B2 (ja) * 1998-04-09 2005-01-05 大陽日酸株式会社 ガス中の微量不純物の分析装置
JP4054493B2 (ja) 1999-09-20 2008-02-27 株式会社日立製作所 イオン源
EP2296167B1 (en) * 1999-09-20 2012-11-07 Hitachi, Ltd. Ion source, mass spectrometer, detector and monitoring system
JP2001351569A (ja) * 2000-06-02 2001-12-21 Hitachi Ltd ガス測定用オンラインモニター装置
JP3660279B2 (ja) * 2001-07-23 2005-06-15 株式会社日立製作所 試料イオン化装置及び質量分析計
JP3787116B2 (ja) * 2002-11-06 2006-06-21 株式会社日立製作所 化学剤の探知方法
JP2004157057A (ja) * 2002-11-08 2004-06-03 Hitachi Ltd 質量分析装置

Also Published As

Publication number Publication date
US7064320B2 (en) 2006-06-20
US20060054806A1 (en) 2006-03-16
JP2006086002A (ja) 2006-03-30
EP1638132A3 (en) 2007-03-14
EP1638132B1 (en) 2016-02-17
EP1638132A2 (en) 2006-03-22

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