JP4488729B2 - Thickness measuring device and grinding device - Google Patents

Thickness measuring device and grinding device Download PDF

Info

Publication number
JP4488729B2
JP4488729B2 JP2003422623A JP2003422623A JP4488729B2 JP 4488729 B2 JP4488729 B2 JP 4488729B2 JP 2003422623 A JP2003422623 A JP 2003422623A JP 2003422623 A JP2003422623 A JP 2003422623A JP 4488729 B2 JP4488729 B2 JP 4488729B2
Authority
JP
Japan
Prior art keywords
plate
grinding
holding
thickness
holding pad
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2003422623A
Other languages
Japanese (ja)
Other versions
JP2005177928A (en
Inventor
真治 保田
利光 後藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Disco Corp
Original Assignee
Disco Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Disco Corp filed Critical Disco Corp
Priority to JP2003422623A priority Critical patent/JP4488729B2/en
Publication of JP2005177928A publication Critical patent/JP2005177928A/en
Application granted granted Critical
Publication of JP4488729B2 publication Critical patent/JP4488729B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Landscapes

  • Mechanical Treatment Of Semiconductor (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Grinding Of Cylindrical And Plane Surfaces (AREA)

Description

本発明は、板状物の厚みを計測する装置及びその装置を組み込んだ研削装置に関するものである。   The present invention relates to an apparatus for measuring the thickness of a plate-like object and a grinding apparatus incorporating the apparatus.

例えば半導体ウェーハのような板状物の面を所望の厚さに形成しようとするときは、チャックテーブルにおいて板状物を保持し、その板状物の露出面に回転する研削砥石を接触させて研削を行う。そして、触針式のハイトゲージを用いて研削中の板状物の厚みが計測され、計測値が所望の厚みの値と一致した時に研削を終了するのが一般的である。   For example, when the surface of a plate-like object such as a semiconductor wafer is to be formed to a desired thickness, the plate-like object is held on the chuck table and a rotating grinding wheel is brought into contact with the exposed surface of the plate-like object. Grind. In general, the thickness of the plate-like object being ground is measured using a stylus-type height gauge, and the grinding is generally terminated when the measured value matches the desired thickness value.

特開2000−006018号公報JP 2000-006018 A

しかしながら、ハイトゲージは故障しやすく、故障が生じると板状物の厚みを正確に認識することができなくなるため、板状物を所望の厚みに仕上げることができなくなる。従って、板状物を常に所望の厚みにするためには、研削後の板状物を、定期的にまたはランダムに取り出して別の手段によってその板状物の厚みを計測してハイトゲージの信頼性を確認するという余分な工程が必要となり、生産性が低下するという問題がある。   However, the height gauge is prone to failure, and if a failure occurs, it becomes impossible to accurately recognize the thickness of the plate-like material, so that the plate-like material cannot be finished to a desired thickness. Therefore, in order to always obtain the desired thickness for the plate-like material, the plate-like material after grinding is taken out periodically or randomly, and the thickness of the plate-like material is measured by another means to measure the reliability of the height gauge. There is a problem that an extra step of confirming is required, and productivity is lowered.

そこで、本発明が解決しようとする課題は、板状物に関する種々の加工において、その厚みを効率良く計測できるようにすることである。   Therefore, a problem to be solved by the present invention is to make it possible to efficiently measure the thickness in various processes related to a plate-like object.

本発明は、板状物を保持するチャックテーブルと、該チャックテーブルに保持された板状物を研削する研削手段と、研削後の該板状物を洗浄する洗浄手段と、板状物をチャックテーブルから洗浄手段に搬送する搬送手段とを少なくとも備えた研削装置に関するもので、洗浄手段は、板状物を支持する支持テーブルと、支持テーブルに支持された板状物に洗浄水を供給する洗浄水供給ノズルとを備え、搬送手段は、保持面において板状物を保持する保持パッドと、保持パッドをチャックテーブルから支持テーブルに移動させると共に保持パッドに保持された板状物を支持テーブルに押圧するアーム部とから構成され、搬送手段の保持パッドにおいて板状物を保持していない状態で保持パッドの保持面を支持テーブルの支持面に密着させた時の保持面の垂直方向の位置を記憶し、記憶した保持面の垂直方向の位置と、保持パッドの保持面において板状物を保持した状態で板状物を支持テーブルの支持面に押圧した時の保持面の垂直方向の位置との差を板状物の厚みとして求める計測手段が支持テーブルに隣接して配設されている。The present invention relates to a chuck table for holding a plate-like object, a grinding means for grinding the plate-like object held on the chuck table, a cleaning means for cleaning the plate-like object after grinding, and a chuck for the plate-like object. The present invention relates to a grinding apparatus including at least a conveying unit that conveys from a table to a cleaning unit, and the cleaning unit is a cleaning unit that supports a plate-like object, and cleaning that supplies cleaning water to the plate-like object supported by the support table. A water supply nozzle, and the conveying means moves the holding pad from the chuck table to the support table and presses the plate-like object held by the holding pad against the support table. And a holding portion when the holding surface of the holding pad is brought into close contact with the supporting surface of the support table in a state where the plate-like object is not held by the holding pad of the conveying means. The vertical position of the surface is memorized, and the stored position when the plate-like object is pressed against the support surface of the support table while holding the plate-like object on the holding surface of the holding pad. Measuring means for determining the difference from the vertical position of the surface as the thickness of the plate-like object is disposed adjacent to the support table.

本発明に係る研削装置では、搬送手段の保持パッドにおいて板状物を保持していない状態で保持パッドの保持面を洗浄手段の支持テーブルの支持面に密着させた時の保持面の垂直方向の位置を記憶し、記憶した保持面の垂直方向の位置と、保持パッドの保持面において板状物を保持した状態で板状物を支持テーブルの支持面に押圧した時の保持面の垂直方向の位置との差を板状物の厚みとして求める計測手段が支持テーブルに隣接して配設されているため、板状物の厚みを正確に認識することができる。また、余分な工程を経ることなく研削後の板状物の厚みを計測することができ、研削中における板状物の厚みの計測に誤差があるかどうかを確認することもできるため、効率的である。 In the grinding apparatus according to the present invention, when the holding surface of the holding pad is brought into close contact with the supporting surface of the supporting table of the cleaning means in a state where the plate-like object is not held by the holding pad of the conveying means, The position is memorized, and the memorized vertical position of the holding surface and the vertical direction of the holding surface when the plate-like object is pressed against the support surface of the support table in a state where the plate-like object is held on the holding surface of the holding pad. Since the measuring means for obtaining the difference from the position as the thickness of the plate-like object is disposed adjacent to the support table, the thickness of the plate-like object can be accurately recognized. In addition, the thickness of the plate after grinding can be measured without going through extra steps, and it is also possible to check whether there is an error in the measurement of the thickness of the plate during grinding. It is.

図1に示す厚み計測装置1は、板状物を保持する支持テーブル2と、板状物を保持して搬送する搬送手段3と、板状物の厚みを計測する計測手段4とから構成される。   A thickness measuring apparatus 1 shown in FIG. 1 includes a support table 2 that holds a plate-like object, a conveying means 3 that holds and conveys the plate-like object, and a measuring means 4 that measures the thickness of the plate-like object. The

支持テーブル2は、ポーラスセラミックス等の多孔質部材により形成される支持面20を有しており、支持面20に作用する吸引力等によって板状物を保持することができる。   The support table 2 has a support surface 20 formed of a porous member such as porous ceramics, and can hold a plate-like object by a suction force or the like acting on the support surface 20.

搬送手段3は、保持面300において板状物を保持する保持パッド30と、保持パッド30を支持し旋回または昇降するアーム部31とを備えている。保持パッド30の側部には、水平方向に延びる接触端子301が固定されている。なお、アーム部31と保持パッド30との間には、衝突時の衝撃を和らげるために、ばねのような緩衝部材が配設されている。   The transport means 3 includes a holding pad 30 that holds a plate-like object on the holding surface 300, and an arm portion 31 that supports the holding pad 30 and rotates or moves up and down. A contact terminal 301 extending in the horizontal direction is fixed to a side portion of the holding pad 30. A buffer member such as a spring is disposed between the arm portion 31 and the holding pad 30 in order to reduce the impact at the time of collision.

計測手段4は、搬送手段3の保持パッド30に保持された板状物を支持テーブル2の支持面20に押圧した状態で、保持パッド30の保持面300と支持面20との間隔を計測する機能を有しており、保持パッド30の昇降方向に進退する計測ロッド40と、計測ロッド40を進退自在に保持すると共に計測ロッド40の位置を計測する本体部41と、計測により求めた計測ロッド40の位置を記憶する記憶部42と、記憶部42の記憶内容に基づき板状物の厚みを算出する算出部43とから構成される接触式計測器である。計測ロッド40は、接触端子301の下方に位置しており、接触端子301と接触し、接触端子301の位置に応じて昇降する。計測手段4としては、例えばハイデンハイン株式会社から提供されている測長器を用いることができる。   The measuring unit 4 measures the distance between the holding surface 300 of the holding pad 30 and the support surface 20 in a state where the plate-like object held by the holding pad 30 of the transport unit 3 is pressed against the support surface 20 of the support table 2. A measuring rod 40 that has a function and moves forward and backward in the up-and-down direction of the holding pad 30; a main body portion 41 that holds the measuring rod 40 so as to be movable forward and backward; and measures the position of the measuring rod 40; The contact-type measuring instrument includes a storage unit 42 that stores 40 positions and a calculation unit 43 that calculates the thickness of the plate-like object based on the stored contents of the storage unit 42. The measuring rod 40 is located below the contact terminal 301, contacts the contact terminal 301, and moves up and down according to the position of the contact terminal 301. As the measuring means 4, for example, a length measuring device provided by HEIDENHAIN Co., Ltd. can be used.

搬送手段3の保持パッド30に保持された板状物の厚みを計測する場合は、まず、図2に示すように、搬送手段3の保持パッド30において板状物を保持していない状態で、保持パッド30の保持面300を支持テーブル2の支持面20に密着させ、そのときの計測ロッド40の垂直方向の位置Z1を本体部41において計測して記憶部42に記憶させておく。   When measuring the thickness of the plate-like object held on the holding pad 30 of the conveying means 3, first, as shown in FIG. 2, in a state where the plate-like object is not held on the holding pad 30 of the conveying means 3, The holding surface 300 of the holding pad 30 is brought into close contact with the support surface 20 of the support table 2, and the vertical position Z1 of the measuring rod 40 at that time is measured by the main body 41 and stored in the storage unit 42.

次に、図3に示すように、保持パッド30の保持面300において板状物7を保持し、支持テーブル2の支持面20に板状物7を押圧する。そして、そのときの計測ロッド40の垂直方向の位置Z2を本体部41において計測して記憶部42に記憶させておく。   Next, as shown in FIG. 3, the plate-like object 7 is held on the holding surface 300 of the holding pad 30, and the plate-like object 7 is pressed against the support surface 20 of the support table 2. Then, the vertical position Z2 of the measuring rod 40 at that time is measured by the main body 41 and stored in the storage unit 42.

算出部43は、記憶部42に記憶されているZ1及びZ2の値を読み出し、(Z1−Z2)の計算をすることにより板状物7の厚みを求めることができる。このように、保持パッド30によって板状物の面が支持テーブル2に押し付けられた状態でその厚みを求めることができるため、板状物に傷をつけることがない。   The calculation unit 43 reads the values of Z1 and Z2 stored in the storage unit 42, and can calculate the thickness of the plate-like object 7 by calculating (Z1-Z2). Thus, since the thickness can be obtained in a state where the surface of the plate-like object is pressed against the support table 2 by the holding pad 30, the plate-like object is not damaged.

なお、支持テーブル2及び保持パッド30の大きさや形状によっては接触端子301は必ずしも必要とされない場合もあるが、接触端子の大きさや形状を調整することにより、計測手段4との距離を調整することができ、加工装置に対する計測手段4の組み込み位置の自由度が増す。   Note that the contact terminal 301 may not necessarily be required depending on the size and shape of the support table 2 and the holding pad 30, but the distance from the measuring means 4 can be adjusted by adjusting the size and shape of the contact terminal. Thus, the degree of freedom of the installation position of the measuring means 4 with respect to the processing apparatus is increased.

厚み計測装置1が搭載される装置としては、例えば図4に示す研削装置5がある。この研削装置5は、板状物の面を研削して所望の厚みに形成する装置であり、板状物7を収容するカセット500、501と、カセット500からの板状物7の搬出またはカセット501への板状物7の搬入を行う搬出入手段51と、板状物の位置合わせを行う位置合わせテーブル52と、板状物を搬送する第一の搬送手段53及び第二の搬送手段54と、板状物7を保持する4つのチャックテーブル550、551、552、553と、これらのチャックテーブルを回転可能に支持すると共に自身も回転可能なターンテーブル56と、各チャックテーブルに保持された板状物を研削する第一の研削手段57及び第二の研削手段58と、研削後の板状物を洗浄する洗浄手段59とを有している。   As an apparatus on which the thickness measuring apparatus 1 is mounted, for example, there is a grinding apparatus 5 shown in FIG. The grinding device 5 is a device for grinding a surface of a plate-like object to have a desired thickness, and cassettes 500 and 501 for accommodating the plate-like object 7 and carrying out or cassettes of the plate-like object 7 from the cassette 500. A carry-in / out means 51 for carrying the plate-like object 7 into and 501, an alignment table 52 for aligning the plate-like object, a first conveying means 53 and a second conveying means 54 for conveying the plate-like object. And four chuck tables 550, 551, 552, and 553 for holding the plate-like object 7, a turntable 56 that supports these chuck tables in a rotatable manner, and can also rotate itself, and is held by each chuck table. It has the 1st grinding means 57 and the 2nd grinding means 58 which grind a plate-shaped object, and the washing | cleaning means 59 which wash | cleans the plate-shaped object after grinding.

第一の研削手段57及び第二の研削手段58は起立した壁部60に対して昇降可能となっている。壁部60の一方の面には垂直方向に一対の第一のガイドレール61及び第二のガイドレール62が配設されており、第一のガイドレール61には第一の研削手段57を支持する第一の支持部63が摺動可能に係合し、第二のガイドレール62には第二の研削手段58を支持する第二の支持部64が摺動可能に係合している。そして、パルスモータ65の駆動により支持部63が昇降するのに伴い第一の研削手段57が昇降し、パルスモータ66の駆動により支持部64が昇降するのに伴い第二の研削手段58が昇降する構成となっている。第一の研削手段57、第二の研削手段58の垂直方向の位置は、パルスモータ65、66に供給されるパルス数に基づいて正確に認識することができる。 The first grinding means 57 and the second grinding means 58 can be raised and lowered with respect to the standing wall portion 60. A pair of first guide rails 61 and second guide rails 62 are disposed on one surface of the wall portion 60 in the vertical direction. The first guide rails 61 support the first grinding means 57. The first support portion 63 is slidably engaged, and the second guide rail 62 is slidably engaged with the second support portion 64 that supports the second grinding means 58. The first grinding means 57 moves up and down as the support portion 63 moves up and down by driving the pulse motor 65, and the second grinding means 58 moves up and down as the support portion 64 moves up and down by driving the pulse motor 66. It is the composition to do. The vertical positions of the first grinding means 57 and the second grinding means 58 can be accurately recognized based on the number of pulses supplied to the pulse motors 65 and 66.

第一の研削手段57は、垂直方向の軸心を有するスピンドル570の下端にマウンタ571を介して研削ホイール572が装着され、研削ホイール572の下面に粗研削砥石573が固着された構成となっており、スピンドル570の回転に伴って粗研削砥石573が回転する構成となっている。一方、第二の研削手段58は、垂直方向の軸心を有するスピンドル580の下端にマウンタ581を介して研削ホイール582が装着され、研削ホイール582の下面に仕上げ研削砥石583が固着された構成となっており、スピンドル580の回転に伴って仕上げ研削砥石583が回転する構成となっている。   The first grinding means 57 has a configuration in which a grinding wheel 572 is attached to the lower end of a spindle 570 having a vertical axis through a mounter 571, and a rough grinding wheel 573 is fixed to the lower surface of the grinding wheel 572. Thus, the coarse grinding wheel 573 rotates with the rotation of the spindle 570. On the other hand, the second grinding means 58 has a configuration in which a grinding wheel 582 is attached to a lower end of a spindle 580 having a vertical axis through a mounter 581 and a finish grinding wheel 583 is fixed to the lower surface of the grinding wheel 582. Thus, the finish grinding wheel 583 rotates with the rotation of the spindle 580.

カセット500には研削前の板状物7が複数段に重ねて収納されており、搬出入手段51によって1枚ずつ搬出されて位置合わせテーブル52に載置される。そしてここで板状物7が一定の位置に位置合わせされた後、第一の搬送手段53に吸着されると共に第一の搬送手段53が旋回動することによって、チャックテーブル550に板状物7が載置され、保持される。   The plate-like object 7 before grinding is stored in a plurality of stages in the cassette 500 and is carried out one by one by the carrying-in / out means 51 and placed on the alignment table 52. Then, after the plate-like object 7 is aligned at a fixed position, the plate-like object 7 is adsorbed by the first conveying means 53 and the first conveying means 53 pivots, so that the plate-like object 7 is placed on the chuck table 550. Is placed and held.

次に、ターンテーブル56が所要角度(本実施形態では90度)回転して板状物7が第一の研削手段57の直下に位置付けられる。このとき、ターンテーブル56が回転する前にチャックテーブル550が位置していた位置には、チャックテーブル551が自動的に位置付けられる。   Next, the turntable 56 is rotated by a required angle (90 degrees in this embodiment), and the plate-like object 7 is positioned immediately below the first grinding means 57. At this time, the chuck table 551 is automatically positioned at the position where the chuck table 550 is located before the turntable 56 rotates.

そして、粗研削砥石573が回転しながら第一の研削手段57が下降することにより、粗研削砥石573が板状物7の面に接触して当該面が粗研削される。次に、ターンテーブル56が所要角度回転して板状物7が第二の研削手段58の直下に位置付けられ、仕上げ研削砥石583が回転しながら第二の研削手段58が下降することにより、仕上げ研削砥石583が板状物7の粗研削後の面に接触して当該面が仕上げ研削され、板状物7が所望の厚みに形成される。板状物7が所望の厚みに形成されたかどうかは、第二の研削手段58を駆動するパルスモータ66に供給されたパルス数から第二の研削手段58の垂直方向の位置を認識することにより求めることができる。   Then, the first grinding means 57 descends while the rough grinding wheel 573 rotates, so that the rough grinding wheel 573 comes into contact with the surface of the plate-like object 7 and the surface is rough ground. Next, the turntable 56 is rotated by a required angle so that the plate-like object 7 is positioned immediately below the second grinding means 58, and the second grinding means 58 is lowered while the finish grinding wheel 583 is rotated, thereby completing the finish. The grinding wheel 583 comes into contact with the surface after the rough grinding of the plate-like object 7 and the surface is finish-ground, so that the plate-like object 7 is formed to a desired thickness. Whether or not the plate-like object 7 is formed to a desired thickness is determined by recognizing the vertical position of the second grinding means 58 from the number of pulses supplied to the pulse motor 66 that drives the second grinding means 58. Can be sought.

仕上げ研削終了後は、ターンテーブル56が所要角度回転することにより板状物7が洗浄手段59の近傍に位置付けられる。そして、第二の搬送手段54によって板状物7が洗浄手段59に搬送される。   After finishing grinding, the turntable 56 is rotated by a required angle so that the plate-like object 7 is positioned in the vicinity of the cleaning means 59. Then, the plate-like object 7 is conveyed to the cleaning means 59 by the second conveying means 54.

図5に示すように、第二の搬送手段54としては、図1に示した搬送手段3を用いることができる。この第二の搬送手段54の内部には、保持パッド30の洗浄に用いる洗浄水または吸引用のエアーが流通する流通路540が形成されており、この流通路540は、バルブ541、542を介して洗浄水供給源543及び吸引源544にそれぞれ接続されている。   As shown in FIG. 5, the transport means 3 shown in FIG. 1 can be used as the second transport means 54. A flow passage 540 through which cleaning water or suction air used for cleaning the holding pad 30 circulates is formed inside the second transport means 54, and this flow passage 540 is provided via valves 541 and 542. Are connected to a cleaning water supply source 543 and a suction source 544, respectively.

一方、洗浄手段59は、洗浄する板状物を支持するスピンナーテーブル590と、スピンナーテーブル590に支持された板状物に洗浄水を供給する洗浄水供給ノズル591とを備え、スピンナーテーブル590としては、図1に示した支持テーブル2を使用することができる。そして、スピンナーテーブル590の近傍には図1に示した計測手段4が配設され、スピンナーテーブル590と第二の搬送手段54と計測手段4とで厚み計測装置1を構成している。   On the other hand, the cleaning means 59 includes a spinner table 590 that supports a plate-like object to be cleaned, and a cleaning water supply nozzle 591 that supplies cleaning water to the plate-like object supported by the spinner table 590. As the spinner table 590, The support table 2 shown in FIG. 1 can be used. 1 is disposed in the vicinity of the spinner table 590, and the spinner table 590, the second transport means 54, and the measurement means 4 constitute the thickness measuring apparatus 1.

なお、図示していないが、洗浄手段59には、洗浄の際に洗浄水が周囲に飛散するのを防止するためのシャッターが配設されており、シャッターが下降し、スピンナーテーブル59の周囲がシャッターによって密閉された状態で洗浄が行われる。従って、計測手段4は、シャッターの外側に配設されていることが好ましい。   Although not shown, the cleaning means 59 is provided with a shutter for preventing the cleaning water from splashing around during cleaning, and the shutter is lowered so that the periphery of the spinner table 59 Cleaning is performed in a state of being sealed by the shutter. Therefore, it is preferable that the measuring means 4 is disposed outside the shutter.

研削後の板状物7がスピンナーテーブル590に搬送される前に、図6に示すように、スピンナーテーブル590において板状物を支持していない状態で第二の搬送手段54を構成する保持パッド30の保持面300をスピンナーテーブル590の支持面20に密着させる。このとき、接触端子301が計測ロッド40を下方に押し込むため、そのときの計測ロッド40の位置を本体部41において予め計測しておき、その位置を原点として記憶部42に記憶させておく。この原点を記憶させる工程は、一度しておけばよい。   Before the ground plate 7 is transported to the spinner table 590, as shown in FIG. 6, the holding pad constituting the second transport means 54 in a state where the spinner table 590 does not support the plate. 30 holding surfaces 300 are brought into close contact with the support surface 20 of the spinner table 590. At this time, since the contact terminal 301 pushes the measurement rod 40 downward, the position of the measurement rod 40 at that time is measured in advance in the main body 41 and the position is stored in the storage unit 42 as the origin. The step of storing the origin may be performed once.

研削後の板状物7は、第二の搬送手段54を構成する保持パッド30に吸着され、アーム部31によってチャックテーブルからスピンナーテーブル590の直下に位置付けられた後に下降し、図7に示すように、保持パッド30によって板状物7がスピンナーテーブル590の支持面20に押圧された状態で保持される。このとき、接触端子301が計測ロッド40を下方に押し込むため、そのときの計測ロッド40の位置を本体部41において計測し、その位置を記憶部42に記憶させる。   The ground plate-like object 7 is adsorbed by the holding pad 30 that constitutes the second conveying means 54, and is lowered from the chuck table by the arm portion 31 after being positioned directly below the spinner table 590, as shown in FIG. Further, the plate-like object 7 is held by the holding pad 30 while being pressed against the support surface 20 of the spinner table 590. At this time, since the contact terminal 301 pushes the measurement rod 40 downward, the position of the measurement rod 40 at that time is measured in the main body 41 and the position is stored in the storage unit 42.

図6に示したように板状物がない状態で保持パッド30をスピンナーテーブル590の支持面20に密着させた場合と、板状物7が保持パッド20に保持された状態で支持面20に押圧された場合とでは、計測ロッド40の位置が板状物7の厚みの分だけ異なるので、記憶部42に記憶された計測ロッドの2つの位置の差を算出部43で算出すれば、板状物7の厚みを認識することができる。そして、仕上げ研削終了時にパルスモータ66に供給されたパルス数に基づいて求めた板状物7の厚みと、算出部43において求めた板状物7の厚みとを比較し、値が一致しない場合には、第二の研削手段58において誤差が生じていると判断することができる。   As shown in FIG. 6, when the holding pad 30 is brought into close contact with the support surface 20 of the spinner table 590 without the plate-like object, and when the plate-like object 7 is held by the holding pad 20, Since the position of the measuring rod 40 differs by the thickness of the plate-like object 7 when pressed, if the difference between the two positions of the measuring rod stored in the storage unit 42 is calculated by the calculating unit 43, the plate The thickness of the object 7 can be recognized. When the thickness of the plate-like object 7 obtained based on the number of pulses supplied to the pulse motor 66 at the end of finish grinding is compared with the thickness of the plate-like object 7 obtained in the calculation unit 43, the values do not match. Therefore, it can be determined that an error has occurred in the second grinding means 58.

第二の搬送手段54は、板状物7を各チャックテーブルから洗浄手段59へ搬送する手段でもあるため、余分な工程を経ることなく、かかる搬送と板状物7の厚みの測定とを連続して行うことができ、効率的である。   Since the second conveying means 54 is also a means for conveying the plate-like object 7 from each chuck table to the cleaning means 59, the conveyance and the measurement of the thickness of the plate-like object 7 are continuously performed without passing through extra steps. And can be done efficiently.

また、ターンテーブル56の近傍にハイトゲージが配設され、研削中の板状物7の厚みをハイトゲージで計測する場合には、厚み計測装置1による計測結果と研削後にハイトゲージで計測した結果とを照合し、厚みの値が一致しない場合にはハイトゲージに不具合があると判断することができる。   Further, when a height gauge is disposed in the vicinity of the turntable 56 and the thickness of the plate-like object 7 being ground is measured with the height gauge, the measurement result by the thickness measuring device 1 is collated with the result measured with the height gauge after grinding. If the thickness values do not match, it can be determined that the height gauge is defective.

なお、図4で示した研削装置5では第二の搬送手段54と洗浄手段59の支持テーブル590と計測手段4とで厚み計測装置1を構成したが、計測装置1を構成する搬送手段及び支持テーブルは、第二の搬送手段54及び支持テーブル590とは別に配設されていてもよい。また、厚み計測装置1は、研削装置以外の加工装置に搭載することもできる。   In the grinding device 5 shown in FIG. 4, the thickness measuring device 1 is configured by the second transporting unit 54, the support table 590 of the cleaning unit 59, and the measuring unit 4, but the transporting unit and the support that configure the measuring device 1. The table may be provided separately from the second transport unit 54 and the support table 590. Moreover, the thickness measuring apparatus 1 can also be mounted in processing apparatuses other than a grinding apparatus.

本発明は、板状物の厚みを正確に認識する必要がある各種の加工に利用することができる。   The present invention can be used for various processes that require accurate recognition of the thickness of a plate-like object.

厚み計測装置の一例を示す斜視図である。It is a perspective view which shows an example of a thickness measuring apparatus. 板状物がない状態における計測ロッドの位置を計測する様子を示す正面図である。It is a front view which shows a mode that the position of the measuring rod in a state without a plate-shaped object is measured. 板状物がある状態における計測ロッドの位置を計測する様子を示す正面図である。It is a front view which shows a mode that the position of the measuring rod in a state with a plate-shaped object is measured. 研削装置の一例を示す斜視図である。It is a perspective view which shows an example of a grinding device. 研削装置における厚み計測装置の構成を示す断面図である。It is sectional drawing which shows the structure of the thickness measuring apparatus in a grinding device. 研削装置において、板状物がない状態における計測ロッドの位置を計測する様子を示す正面図である。It is a front view which shows a mode that the position of the measuring rod in a state without a plate-shaped object is measured in a grinding device. 研削装置において、板状物がある状態における計測ロッドの位置を計測する様子を示す正面図である。It is a front view which shows a mode that the position of the measurement rod in a state with a plate-shaped object is measured in a grinding device.

1:計測装置
2:支持テーブル
20:支持面
3:搬送手段
30:保持パッド
300:保持面 301:接触端子
31:アーム部
4:計測手段
40:計測ロッド 41:本体部 42:記憶部 43:算出部
5:研削装置
500、501:カセット
51:搬出入手段 52:位置合わせテーブル
53:第一の搬送手段
54:第二の搬送手段
540:流通路 541、542:バルブ 543:洗浄水供給源
544:吸引源
550、551、552、553:チャックテーブル
56:ターンテーブル
57:第一の研削手段
570:スピンドル 571:マウンタ 572:研削ホイール
573:粗研削砥石
58:第二の研削手段
580:スピンドル 581:マウンタ 582:研削ホイール
583:研削砥石
59:洗浄手段
590:スピンナーテーブル 591:洗浄水供給ノズル
60:壁部 61:第一のガイドレール
62:第二のガイドレール 63:第一の支持部 64:第二の支持部
65、66:パルスモータ
1: Measuring device 2: Support table 20: Support surface 3: Conveying means 30: Holding pad 300: Holding surface 301: Contact terminal 31: Arm part 4: Measuring means 40: Measuring rod 41: Main body part 42: Storage part 43: Calculation unit 5: Grinding device 500, 501: Cassette 51: Loading / unloading means 52: Positioning table 53: First conveying means 54: Second conveying means 540: Flow path 541, 542: Valve 543: Washing water supply source 544: suction source 550, 551, 552, 553: chuck table 56: turntable 57: first grinding means 570: spindle 571: mounter 572: grinding wheel 573: rough grinding wheel 58: second grinding means 580: spindle 581: Mounter 582: Grinding wheel 583: Grinding wheel 59: Cleaning means 590: Spinner table 591 Cleaning water supply nozzle 60: Wall portion 61: first guide rail 62: second guide rail 63: first support portion 64: second support portion 65, 66: pulse motor

Claims (1)

板状物を保持するチャックテーブルと、該チャックテーブルに保持された板状物を研削する研削手段と、研削後の該板状物を洗浄する洗浄手段と、該板状物を該チャックテーブルから該洗浄手段に搬送する搬送手段とを少なくとも備えた研削装置であって、
該洗浄手段は、板状物を支持する支持テーブルと、該支持テーブルに支持された板状物に洗浄水を供給する洗浄水供給ノズルとを備え、
該搬送手段は、保持面において板状物を保持する保持パッドと、該保持パッドを該チャックテーブルから該支持テーブルに移動させると共に該保持パッドに保持された板状物を該支持テーブルに押圧するアーム部とから構成され、
該搬送手段の該保持パッドにおいて板状物を保持していない状態で該保持パッドの保持面を該支持テーブルの支持面に密着させた時の該保持面の垂直方向の位置を記憶し、該記憶した該保持面の垂直方向の位置と、該保持パッドの保持面において板状物を保持した状態で該板状物を該支持テーブルの支持面に押圧した時の該保持面の垂直方向の位置との差を該板状物の厚みとして求める計測手段が該支持テーブルに隣接して配設されている研削装置。
A chuck table for holding the plate-like object, a grinding means for grinding the plate-like object held on the chuck table, a cleaning means for cleaning the plate-like object after grinding, and the plate-like object from the chuck table A grinding device comprising at least a conveying means for conveying to the cleaning means,
The cleaning means includes a support table that supports a plate-like object, and a cleaning water supply nozzle that supplies cleaning water to the plate-like object supported by the support table,
The conveying means moves the holding pad from the chuck table to the support table and presses the plate-like object held by the holding pad against the support table. It consists of an arm part and
Storing the vertical position of the holding surface when the holding surface of the holding pad is brought into close contact with the support surface of the support table in a state where the plate-like object is not held by the holding pad of the transport means ; The stored vertical position of the holding surface and the vertical direction of the holding surface when the plate-like object is pressed against the supporting surface of the support table in a state where the plate-like object is held on the holding surface of the holding pad. A grinding apparatus in which measuring means for determining a difference from the position as the thickness of the plate-like object is disposed adjacent to the support table.
JP2003422623A 2003-12-19 2003-12-19 Thickness measuring device and grinding device Expired - Lifetime JP4488729B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003422623A JP4488729B2 (en) 2003-12-19 2003-12-19 Thickness measuring device and grinding device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003422623A JP4488729B2 (en) 2003-12-19 2003-12-19 Thickness measuring device and grinding device

Publications (2)

Publication Number Publication Date
JP2005177928A JP2005177928A (en) 2005-07-07
JP4488729B2 true JP4488729B2 (en) 2010-06-23

Family

ID=34783434

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003422623A Expired - Lifetime JP4488729B2 (en) 2003-12-19 2003-12-19 Thickness measuring device and grinding device

Country Status (1)

Country Link
JP (1) JP4488729B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5258029B2 (en) * 2008-07-18 2013-08-07 Necアクセステクニカ株式会社 Electronics
JP2020097089A (en) * 2018-12-19 2020-06-25 株式会社ディスコ Grinding device
JP7328104B2 (en) * 2019-09-27 2023-08-16 株式会社ディスコ Grinding equipment

Also Published As

Publication number Publication date
JP2005177928A (en) 2005-07-07

Similar Documents

Publication Publication Date Title
JP6941464B2 (en) Substrate cleaning equipment and substrate processing equipment
JP2006021264A (en) Grinding apparatus
WO2018207704A1 (en) Cleaning device, substrate processing device, cleaning device maintenance method, and computer-readable recording medium including cleaning device maintenance program
JP7045140B2 (en) Wafer processing method and processing equipment
JP6552930B2 (en) Grinding device
TW202132046A (en) Processing apparatus
JP4488729B2 (en) Thickness measuring device and grinding device
JP7303709B2 (en) processing equipment
JP5261125B2 (en) How to detect the chuck table origin height position
TWI651163B (en) Grinding method
CN113043156B (en) Grinding device
WO2022004383A1 (en) Substrate processing system and substrate processing method
TW201916976A (en) Grinding method of workpiece and grinding device that prevents the front surface protection member adhered to a front side of a workpiece from being erroneously ground by a grinding stone
TWI819165B (en) Substrate processing device and substrate processing method
TWI821480B (en) Substrate processing apparatus, and method for specifying area to be partially polished by substrate processing apparatus
JP2022046137A (en) Substrate treatment method and substrate treatment system
JPH11195693A (en) Work alignment device of surface grinder
JP5165450B2 (en) Grinding apparatus and plate thickness calculation method
JP5231070B2 (en) Gas bearing contact detection mechanism
JPH11198007A (en) Surface grinding device
JP6487790B2 (en) Processing equipment
JP7460461B2 (en) processing equipment
JP2023160031A (en) Processing device
JP7328104B2 (en) Grinding equipment
JP5939935B2 (en) Grinding equipment

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20061127

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20090618

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090623

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090818

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20100304

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20100330

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130409

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Ref document number: 4488729

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130409

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130409

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140409

Year of fee payment: 4

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term