JP4479911B2 - 駆動方法、露光方法及び露光装置、並びにデバイス製造方法 - Google Patents
駆動方法、露光方法及び露光装置、並びにデバイス製造方法 Download PDFInfo
- Publication number
- JP4479911B2 JP4479911B2 JP2005518009A JP2005518009A JP4479911B2 JP 4479911 B2 JP4479911 B2 JP 4479911B2 JP 2005518009 A JP2005518009 A JP 2005518009A JP 2005518009 A JP2005518009 A JP 2005518009A JP 4479911 B2 JP4479911 B2 JP 4479911B2
- Authority
- JP
- Japan
- Prior art keywords
- stage
- movement information
- wafer
- moving body
- movement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
- G03F7/70725—Stages control
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004040683 | 2004-02-18 | ||
JP2004040683 | 2004-02-18 | ||
PCT/JP2005/002216 WO2005078777A1 (fr) | 2004-02-18 | 2005-02-15 | Méthode de conduite, méthode d'exposition, dispositif d'exposition, et méthode de fabrication du dispositif |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2005078777A1 JPWO2005078777A1 (ja) | 2007-10-18 |
JP4479911B2 true JP4479911B2 (ja) | 2010-06-09 |
Family
ID=34857899
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005518009A Expired - Fee Related JP4479911B2 (ja) | 2004-02-18 | 2005-02-15 | 駆動方法、露光方法及び露光装置、並びにデバイス製造方法 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP4479911B2 (fr) |
WO (1) | WO2005078777A1 (fr) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3870207B2 (ja) * | 2004-08-05 | 2007-01-17 | キヤノン株式会社 | 液浸露光装置及びデバイス製造方法 |
EP1879217A4 (fr) * | 2005-03-18 | 2010-06-09 | Nikon Corp | Procede d' exposition, appareil d' exposition, procede de fabrication de dispositif et procede d' evaluation d' appareil d' exposition |
US7839485B2 (en) * | 2006-01-19 | 2010-11-23 | Nikon Corporation | Movable body drive method, movable body drive system, pattern formation method, pattern forming apparatus, exposure method, exposure apparatus, and device manufacturing method |
US7230676B1 (en) * | 2006-03-13 | 2007-06-12 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
KR101862528B1 (ko) | 2006-08-31 | 2018-05-29 | 가부시키가이샤 니콘 | 이동체 구동 시스템 및 이동체 구동 방법, 패턴 형성 장치 및 방법, 노광 장치 및 방법, 디바이스 제조 방법, 그리고 결정 방법 |
EP2221669A3 (fr) | 2009-02-19 | 2011-02-09 | ASML Netherlands B.V. | Appareil lithographique, procédé de commande de l'appareil et procédé de fabrication d'un dispositif |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2753930B2 (ja) * | 1992-11-27 | 1998-05-20 | キヤノン株式会社 | 液浸式投影露光装置 |
JP2000058436A (ja) * | 1998-08-11 | 2000-02-25 | Nikon Corp | 投影露光装置及び露光方法 |
-
2005
- 2005-02-15 WO PCT/JP2005/002216 patent/WO2005078777A1/fr active Application Filing
- 2005-02-15 JP JP2005518009A patent/JP4479911B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPWO2005078777A1 (ja) | 2007-10-18 |
WO2005078777A1 (fr) | 2005-08-25 |
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