JP4478530B2 - 微小寸法測定機 - Google Patents
微小寸法測定機 Download PDFInfo
- Publication number
- JP4478530B2 JP4478530B2 JP2004233284A JP2004233284A JP4478530B2 JP 4478530 B2 JP4478530 B2 JP 4478530B2 JP 2004233284 A JP2004233284 A JP 2004233284A JP 2004233284 A JP2004233284 A JP 2004233284A JP 4478530 B2 JP4478530 B2 JP 4478530B2
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/80—Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration
Description
18 X軸用フレーム
20 Y軸用フレーム
22 基台
24 測定テーブル
26、28 検出部
30 X軸駆動部(X方向用補助駆動部)
32 Y軸駆動部(主駆動部)
36 PC
38 表示装置
46 フラットパネル
48 液晶モニタ
50 検出部本体
56 CCDカメラ
58 Z軸サーボモータ(Z方向用補助駆動部)
60 Y軸サーボモータ(Y方向用補助駆動部)
Claims (3)
- 被測定物上の複数のパターンをそれぞれ撮像する複数の検出部と、前記複数の検出部の撮像による画像を処理して前記複数のパターンに関する微小寸法を算出する画像処理部と、前記被測定物の被測定領域を臨む空間を少なくとも移動空間として、前記複数の検出部を前記移動空間において、前記被測定物の測定面に平行で互いに直交するX軸及びY軸の二次元の方向に沿って移動させる駆動部とを備え、
前記駆動部は、前記二次元のうちY軸方向に沿って前記複数の検出部全体を移動させる主駆動部と、前記複数の検出部をそれぞれX軸方向に沿って非同期で移動させる複数のX方向用補助駆動部と、前記複数の検出部をそれぞれY軸方向に沿って非同期で移動させる複数のY方向用補助駆動部とから構成されてなる微小寸法測定機。 - 被測定物上の複数のパターンをそれぞれ撮像する複数の検出部と、前記複数の検出部の撮像による画像を処理して前記複数のパターンに関する微小寸法を算出する画像処理部と、前記被測定物の被測定領域を臨む空間を少なくとも移動空間として、前記複数の検出部を前記移動空間において、前記被測定物の測定面に平行で互いに直交するX軸及びY軸と、前記X軸及びY軸に直交するZ軸の三次元の方向に沿って移動させる駆動部とを備え、
前記複数の検出部をそれぞれX軸方向に沿って非同期で移動させる複数のX方向用補助駆動部と、前記複数の検出部をそれぞれY軸方向に沿って非同期で移動させる複数のY方向用補助駆動部と、前記複数の検出部をそれぞれZ軸方向に沿って非同期で移動させる複数のZ方向用補助駆動部とを備えてなることを特徴とする微小寸法測定機。 - 請求項2に記載の微小寸法測定機において、前記複数のX方向用補助駆動部、前記複数のY方向用補助駆動部または前記複数のZ方向用補助駆動部のうち少なくともいずれか一つは、X軸、Y軸またはZ軸方向のうち指定の方向に沿って配置されたマグネットと、前記各検出部に配置されたコイルとを備えたリニアモータで構成されてなることを特徴とする微小寸法測定機。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004233284A JP4478530B2 (ja) | 2004-08-10 | 2004-08-10 | 微小寸法測定機 |
KR1020040094530A KR101119873B1 (ko) | 2004-08-10 | 2004-11-18 | 미소칫수 측정기 |
TW094100609A TW200606390A (en) | 2004-08-10 | 2005-01-10 | Micro-size admeasuring apparatus |
CNB2005100527650A CN100455988C (zh) | 2004-08-10 | 2005-03-14 | 微小尺寸测量仪 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004233284A JP4478530B2 (ja) | 2004-08-10 | 2004-08-10 | 微小寸法測定機 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006052971A JP2006052971A (ja) | 2006-02-23 |
JP4478530B2 true JP4478530B2 (ja) | 2010-06-09 |
Family
ID=36030557
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004233284A Active JP4478530B2 (ja) | 2004-08-10 | 2004-08-10 | 微小寸法測定機 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4478530B2 (ja) |
KR (1) | KR101119873B1 (ja) |
CN (1) | CN100455988C (ja) |
TW (1) | TW200606390A (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101788270B (zh) * | 2010-02-10 | 2011-11-09 | 中国科学院自动化研究所 | 一种基于测距技术的行李尺寸在线测量系统及其方法 |
JP5393864B1 (ja) * | 2012-10-24 | 2014-01-22 | 株式会社牧野フライス製作所 | ワーク形状測定方法およびワーク形状測定装置 |
JP6104667B2 (ja) * | 2013-03-28 | 2017-03-29 | 株式会社日立ハイテクサイエンス | アクチュエータの位置算出装置、位置算出方法及び位置算出プログラム |
CN104359399B (zh) * | 2014-10-28 | 2017-10-27 | 米亚精密金属科技(东莞)有限公司 | 一种滴胶键测量机 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4866629A (en) * | 1987-11-13 | 1989-09-12 | Industrial Technology Research Institute | Machine vision process and apparatus for reading a plurality of separated figures |
DE3806686A1 (de) * | 1988-03-02 | 1989-09-14 | Wegu Messtechnik | Mehrkoordinatenmess- und -pruefeinrichtung |
JPH0421806A (ja) * | 1990-05-17 | 1992-01-24 | Seiko Iconics Kk | 反射型結像光学系 |
JPH09101115A (ja) * | 1995-10-04 | 1997-04-15 | Nikon Corp | 画像測定装置 |
DE19615246A1 (de) * | 1996-04-18 | 1997-10-23 | Krupp Foerdertechnik Gmbh | Photogrammetrie-Verfahren zur dreidimensionalen Verfolgung von bewegten Objekten |
CN2306483Y (zh) * | 1997-08-23 | 1999-02-03 | 李德功 | 微小形体单界光纵横断面仪 |
JP2000259829A (ja) | 1999-03-04 | 2000-09-22 | Sokkia Co Ltd | 画像認識方法 |
-
2004
- 2004-08-10 JP JP2004233284A patent/JP4478530B2/ja active Active
- 2004-11-18 KR KR1020040094530A patent/KR101119873B1/ko active IP Right Grant
-
2005
- 2005-01-10 TW TW094100609A patent/TW200606390A/zh unknown
- 2005-03-14 CN CNB2005100527650A patent/CN100455988C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
TWI335415B (ja) | 2011-01-01 |
TW200606390A (en) | 2006-02-16 |
KR20060014346A (ko) | 2006-02-15 |
CN1734229A (zh) | 2006-02-15 |
KR101119873B1 (ko) | 2012-02-22 |
CN100455988C (zh) | 2009-01-28 |
JP2006052971A (ja) | 2006-02-23 |
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