JP4401686B2 - Ｘ線検査装置及び方法 - Google Patents

Ｘ線検査装置及び方法 Download PDF

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Publication number
JP4401686B2
JP4401686B2 JP2003153790A JP2003153790A JP4401686B2 JP 4401686 B2 JP4401686 B2 JP 4401686B2 JP 2003153790 A JP2003153790 A JP 2003153790A JP 2003153790 A JP2003153790 A JP 2003153790A JP 4401686 B2 JP4401686 B2 JP 4401686B2
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Japan
Prior art keywords
collimator
central axis
target
aperture
ray
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JP2003153790A
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English (en)
Japanese (ja)
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JP2004004092A (ja
JP2004004092A5 (enExample
Inventor
アンドリュー・ジョセフ・ガリシュ
トマス・ウィリアム・バードウェル
ラルフ・ジェラルド・アイザクス
フランシス・ハワード・リトル
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General Electric Co
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General Electric Co
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/316—Accessories, mechanical or electrical features collimators

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2003153790A 2002-05-31 2003-05-30 Ｘ線検査装置及び方法 Expired - Fee Related JP4401686B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/161,276 US6711235B2 (en) 2002-05-31 2002-05-31 X-ray inspection apparatus and method

Publications (3)

Publication Number Publication Date
JP2004004092A JP2004004092A (ja) 2004-01-08
JP2004004092A5 JP2004004092A5 (enExample) 2006-07-13
JP4401686B2 true JP4401686B2 (ja) 2010-01-20

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ID=29419742

Family Applications (1)

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JP2003153790A Expired - Fee Related JP4401686B2 (ja) 2002-05-31 2003-05-30 Ｘ線検査装置及び方法

Country Status (3)

Country Link
US (1) US6711235B2 (enExample)
EP (1) EP1367386A1 (enExample)
JP (1) JP4401686B2 (enExample)

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US7140771B2 (en) * 2003-09-22 2006-11-28 Leek Paul H X-ray producing device with reduced shielding
US7133491B2 (en) * 2004-01-15 2006-11-07 Bio-Imaging Research, Inc. Traveling X-ray inspection system with collimators
US7224772B2 (en) * 2004-07-20 2007-05-29 University Of Florida Research Foundation, Inc. Radiography by selective detection of scatter field velocity components
US7315609B2 (en) * 2004-09-16 2008-01-01 The Boeing Company Real-time X-ray scanner and remote crawler apparatus and method
US7050535B2 (en) 2004-09-16 2006-05-23 The Boeing Company X-ray laminography inspection system and method
US7464596B2 (en) * 2004-09-24 2008-12-16 The Boeing Company Integrated ultrasonic inspection probes, systems, and methods for inspection of composite assemblies
US7640810B2 (en) * 2005-07-11 2010-01-05 The Boeing Company Ultrasonic inspection apparatus, system, and method
US7444876B2 (en) * 2005-08-26 2008-11-04 The Boeing Company Rapid prototype integrated linear ultrasonic transducer inspection apparatus, systems, and methods
US7617732B2 (en) * 2005-08-26 2009-11-17 The Boeing Company Integrated curved linear ultrasonic transducer inspection apparatus, systems, and methods
DE102004058007B4 (de) * 2004-12-01 2009-02-12 Siemens Ag Röntgen-Computertomograf
US7249512B2 (en) * 2005-01-24 2007-07-31 The Boeing Company Non-destructive stringer inspection apparatus and method
US7313959B2 (en) * 2005-05-25 2008-01-01 The Boeing Company Magnetically attracted apparatus, system, and method for remote bondline thickness measurement
CH698140B1 (de) * 2006-01-20 2009-05-29 Alstom Technology Ltd Verfahren zur Digitalisierung dreidimensionaler Bauteile.
US7497620B2 (en) * 2006-03-28 2009-03-03 General Electric Company Method and system for a multiple focal spot x-ray system
JP5589282B2 (ja) * 2008-12-26 2014-09-17 ソニー株式会社 Ｘ線断層撮像装置
FR2960642B1 (fr) * 2010-05-28 2012-07-13 Snecma Procede de controle non destructif et dispositif de mise en oeuvre du procede
CN105452804B (zh) * 2013-05-10 2019-01-15 株式会社尼康 X线装置及构造物的制造方法
KR20150058672A (ko) * 2013-11-19 2015-05-29 삼성전자주식회사 엑스선 영상 장치 및 그 제어 방법
DE102016103413B4 (de) * 2016-02-26 2017-11-09 Deutsches Elektronen-Synchrotron Desy Spaltsystem
DE102016219708A1 (de) * 2016-10-11 2017-11-16 Siemens Healthcare Gmbh Variable Filtervorrichtung für ein Röntgengerät sowie Röntgengerät
DE102016013315B4 (de) 2016-11-08 2024-07-11 RayScan Technologies GmbH Messsystem und Verfahren zum Betreiben eines Messsystems
US10948428B2 (en) 2018-05-25 2021-03-16 Delavan Inc. Reducing scatter for computed tomography
JP7143567B2 (ja) * 2018-09-14 2022-09-29 株式会社島津テクノリサーチ 材料試験機および放射線ｃｔ装置

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US4096391A (en) * 1976-10-15 1978-06-20 The Board Of Trustees Of The University Of Alabama Method and apparatus for reduction of scatter in diagnostic radiology
US4203037A (en) 1977-08-01 1980-05-13 University Of Pittsburgh Collimated radiation apparatus
US4277684A (en) 1977-08-18 1981-07-07 U.S. Philips Corporation X-Ray collimator, particularly for use in computerized axial tomography apparatus
DE2756659A1 (de) * 1977-12-19 1979-06-21 Philips Patentverwaltung Anordnung zur bestimmung der absorptionsverteilung
US4489426A (en) 1981-12-23 1984-12-18 General Electric Company Collimator with adjustable aperture
US4404591A (en) * 1982-01-04 1983-09-13 North American Philips Corporation Slit radiography
DE3301899A1 (de) * 1983-01-21 1984-07-26 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren und anordnung zur messung strahlungsabhaengiger eigenschaften eines koerpers
US4691332A (en) 1983-03-14 1987-09-01 American Science And Engineering, Inc. High energy computed tomography
US4638499A (en) 1984-08-06 1987-01-20 General Electric Company High resolution collimator system for X-ray detector
JPS61249452A (ja) 1985-04-30 1986-11-06 株式会社東芝 Ｘ線診断装置
NL8800738A (nl) * 1988-03-24 1989-10-16 Philips Nv Roentgenonderzoekapparaat met een instelbaar spleetvormig diafragma.
US5119408A (en) 1990-10-31 1992-06-02 General Electric Company Rotate/rotate method and apparatus for computed tomography x-ray inspection of large objects
RU2098797C1 (ru) * 1994-11-30 1997-12-10 Алексей Владиславович Курбатов Способ получения проекции объекта с помощью проникающего излучения и устройство для его осуществления
GB2297835A (en) 1995-02-08 1996-08-14 Secr Defence Three dimensional detection of contraband using x rays
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US6005919A (en) * 1996-10-25 1999-12-21 Radionics, Inc. Jaw and circular collimator
EP0877930A1 (en) 1996-11-05 1998-11-18 PANalytical B.V. X-ray analysis apparatus provided with a double collimator mask
US6054712A (en) * 1998-01-23 2000-04-25 Quanta Vision, Inc. Inspection equipment using small-angle topography in determining an object's internal structure and composition
US6304628B1 (en) 1999-02-17 2001-10-16 Siemens Medical Systems, Inc. Wedge angle optimization for a virtual wedge treatment
US6175615B1 (en) 1999-04-12 2001-01-16 General Electric Company Radiation imager collimator
US6496557B2 (en) * 2000-02-09 2002-12-17 Hologic, Inc. Two-dimensional slot x-ray bone densitometry, radiography and tomography
US6330300B1 (en) * 2000-08-23 2001-12-11 Siemens Medical Solutions Usa, Inc. High definition intensity modulating radiation therapy system and method

Also Published As

Publication number Publication date
EP1367386A1 (en) 2003-12-03
US6711235B2 (en) 2004-03-23
JP2004004092A (ja) 2004-01-08
US20030223547A1 (en) 2003-12-04

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