JP4384542B2 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
JP4384542B2
JP4384542B2 JP2004152835A JP2004152835A JP4384542B2 JP 4384542 B2 JP4384542 B2 JP 4384542B2 JP 2004152835 A JP2004152835 A JP 2004152835A JP 2004152835 A JP2004152835 A JP 2004152835A JP 4384542 B2 JP4384542 B2 JP 4384542B2
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JP
Japan
Prior art keywords
mass spectrometer
ion
ions
frequency
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004152835A
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English (en)
Japanese (ja)
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JP2005339812A5 (enExample
JP2005339812A (ja
Inventor
崇 馬場
宏之 佐竹
安章 高田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
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Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Priority to JP2004152835A priority Critical patent/JP4384542B2/ja
Priority to US11/126,218 priority patent/US7129478B2/en
Publication of JP2005339812A publication Critical patent/JP2005339812A/ja
Priority to US11/517,334 priority patent/US7397025B2/en
Publication of JP2005339812A5 publication Critical patent/JP2005339812A5/ja
Application granted granted Critical
Publication of JP4384542B2 publication Critical patent/JP4384542B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0095—Particular arrangements for generating, introducing or analyzing both positive and negative analyte ions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2004152835A 2004-05-24 2004-05-24 質量分析装置 Expired - Fee Related JP4384542B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2004152835A JP4384542B2 (ja) 2004-05-24 2004-05-24 質量分析装置
US11/126,218 US7129478B2 (en) 2004-05-24 2005-05-11 Mass spectrometer
US11/517,334 US7397025B2 (en) 2004-05-24 2006-09-08 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004152835A JP4384542B2 (ja) 2004-05-24 2004-05-24 質量分析装置

Publications (3)

Publication Number Publication Date
JP2005339812A JP2005339812A (ja) 2005-12-08
JP2005339812A5 JP2005339812A5 (enExample) 2007-04-12
JP4384542B2 true JP4384542B2 (ja) 2009-12-16

Family

ID=35374317

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004152835A Expired - Fee Related JP4384542B2 (ja) 2004-05-24 2004-05-24 質量分析装置

Country Status (2)

Country Link
US (2) US7129478B2 (enExample)
JP (1) JP4384542B2 (enExample)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8003934B2 (en) * 2004-02-23 2011-08-23 Andreas Hieke Methods and apparatus for ion sources, ion control and ion measurement for macromolecules
EP1735806A4 (en) * 2004-02-23 2009-08-19 Ciphergen Biosystems Inc ION SOURCE WITH CONTROLLED OVERLAYING OF ELETROSTATIC AND GAS FLOW FIELDS
JP4384542B2 (ja) * 2004-05-24 2009-12-16 株式会社日立ハイテクノロジーズ 質量分析装置
JP4806214B2 (ja) * 2005-01-28 2011-11-02 株式会社日立ハイテクノロジーズ 電子捕獲解離反応装置
JP5341323B2 (ja) * 2007-07-17 2013-11-13 株式会社日立ハイテクノロジーズ 質量分析装置
JP2009068981A (ja) * 2007-09-13 2009-04-02 Hitachi High-Technologies Corp 質量分析システム及び質量分析方法
US7989765B2 (en) * 2007-11-30 2011-08-02 Agilent Technologies, Inc. Method and apparatus for trapping ions
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
WO2009081445A1 (ja) 2007-12-20 2009-07-02 Shimadzu Corporation 質量分析装置
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
WO2009155082A1 (en) * 2008-05-30 2009-12-23 The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University A radio-frequency-free hybrid electrostatic/magnetostatic cell for transporting, trapping, and dissociating ions in mass spectrometers
US8227764B2 (en) * 2008-07-25 2012-07-24 Perkinelmer Health Sciences, Inc. YTTRIA-metal thermionic filaments
JP5481115B2 (ja) * 2009-07-15 2014-04-23 株式会社日立ハイテクノロジーズ 質量分析計及び質量分析方法
JP5362009B2 (ja) * 2009-07-24 2013-12-11 株式会社日立製作所 質量分析方法
US20110049360A1 (en) * 2009-09-03 2011-03-03 Schoen Alan E Collision/Reaction Cell for a Mass Spectrometer
CA2882118C (en) 2012-08-16 2021-01-12 Douglas F. Barofsky Electron source for an rf-free electromagnetostatic electron-induced dissociation cell and use in a tandem mass spectrometer
DE102013201499A1 (de) * 2013-01-30 2014-07-31 Carl Zeiss Microscopy Gmbh Verfahren zur massenspektrometrischen Untersuchung von Gasgemischen sowie Massenspektrometer hierzu
WO2014132357A1 (ja) * 2013-02-27 2014-09-04 株式会社島津製作所 質量分析装置
TWI515857B (zh) * 2013-08-07 2016-01-01 恆顥科技股份有限公司 觸控電極
GB2534892B (en) * 2015-02-03 2020-09-09 Auckland Uniservices Ltd An ion mirror, an ion mirror assembly and an ion trap
EP3062332A1 (de) * 2015-02-25 2016-08-31 Universität Innsbruck Verfahren und Vorrichtung zur chemischen Ionisation eines Gasgemisches
US10283335B2 (en) * 2016-06-03 2019-05-07 e-MSion, Inc. Reflectron-electromagnetostatic cell for ECD fragmentation in mass spectrometers
LU100109B1 (en) * 2017-02-28 2018-09-07 Luxembourg Inst Science & Tech List Ion source device
US11217437B2 (en) * 2018-03-16 2022-01-04 Agilent Technologies, Inc. Electron capture dissociation (ECD) utilizing electron beam generated low energy electrons
LU100773B1 (en) 2018-04-24 2019-10-24 Luxembourg Inst Science & Tech List Multiple beam secondary ion mass spectometry device
JP2019191044A (ja) 2018-04-26 2019-10-31 シャープ株式会社 電子捕獲型検出器
US10985002B2 (en) * 2019-06-11 2021-04-20 Perkinelmer Health Sciences, Inc. Ionization sources and methods and systems using them
US20210175063A1 (en) 2019-12-10 2021-06-10 Thermo Finnigan Llc Axial ci source - off-axis electron beam
US12417852B1 (en) 2020-01-14 2025-09-16 Beam Alpha, Inc. Ion transport
US12272537B2 (en) 2020-06-08 2025-04-08 Beam Alpha, Inc. Ion source
CN113996140A (zh) * 2020-07-28 2022-02-01 北京凯隆分析仪器有限公司 磁性气体分离装置、其应用及磁性气体分离方法
JP2023539068A (ja) * 2020-08-26 2023-09-13 ビーム アルファ、インコーポレイテッド 混合型原子力変換

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5340983A (en) * 1992-05-18 1994-08-23 The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University Method and apparatus for mass analysis using slow monochromatic electrons
DE69328979T2 (de) 1992-05-29 2001-02-15 Varian, Inc. Verfahren zum Betrieb von Ionenfallenmassenspektrometern
US5420425A (en) 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
US5783824A (en) 1995-04-03 1998-07-21 Hitachi, Ltd. Ion trapping mass spectrometry apparatus
CA2229070C (en) 1995-08-11 2007-01-30 Mds Health Group Limited Spectrometer with axial field
JP3294106B2 (ja) 1996-05-21 2002-06-24 株式会社日立製作所 三次元四重極質量分析法および装置
US6177668B1 (en) 1996-06-06 2001-01-23 Mds Inc. Axial ejection in a multipole mass spectrometer
US6919562B1 (en) * 2002-05-31 2005-07-19 Analytica Of Branford, Inc. Fragmentation methods for mass spectrometry
JP2004157057A (ja) * 2002-11-08 2004-06-03 Hitachi Ltd 質量分析装置
JP4384542B2 (ja) * 2004-05-24 2009-12-16 株式会社日立ハイテクノロジーズ 質量分析装置

Also Published As

Publication number Publication date
US7397025B2 (en) 2008-07-08
US7129478B2 (en) 2006-10-31
US20050258354A1 (en) 2005-11-24
US20070023648A1 (en) 2007-02-01
JP2005339812A (ja) 2005-12-08

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