JP4345148B2 - 米粒品位判別装置 - Google Patents

米粒品位判別装置 Download PDF

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Publication number
JP4345148B2
JP4345148B2 JP21809199A JP21809199A JP4345148B2 JP 4345148 B2 JP4345148 B2 JP 4345148B2 JP 21809199 A JP21809199 A JP 21809199A JP 21809199 A JP21809199 A JP 21809199A JP 4345148 B2 JP4345148 B2 JP 4345148B2
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JP
Japan
Prior art keywords
rice
grain
image
light
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP21809199A
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English (en)
Japanese (ja)
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JP2001041895A5 (cg-RX-API-DMAC10.html
JP2001041895A (ja
Inventor
覺 佐竹
学 池田
貴広 土井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Satake Corp
Original Assignee
Satake Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Satake Corp filed Critical Satake Corp
Priority to JP21809199A priority Critical patent/JP4345148B2/ja
Priority to KR1020000020004A priority patent/KR20000077034A/ko
Priority to CA002306060A priority patent/CA2306060A1/en
Priority to AT00303384T priority patent/ATE284029T1/de
Priority to DK00303384T priority patent/DK1046902T3/da
Priority to EP00303384A priority patent/EP1046902B1/en
Priority to AU28908/00A priority patent/AU771766B2/en
Priority to TW089107491A priority patent/TW477896B/zh
Priority to DE60016304T priority patent/DE60016304D1/de
Priority to US09/556,947 priority patent/US6427128B1/en
Priority to CNB001070177A priority patent/CN1296701C/zh
Publication of JP2001041895A publication Critical patent/JP2001041895A/ja
Publication of JP2001041895A5 publication Critical patent/JP2001041895A5/ja
Application granted granted Critical
Publication of JP4345148B2 publication Critical patent/JP4345148B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP21809199A 1999-04-22 1999-07-30 米粒品位判別装置 Expired - Fee Related JP4345148B2 (ja)

Priority Applications (11)

Application Number Priority Date Filing Date Title
JP21809199A JP4345148B2 (ja) 1999-07-30 1999-07-30 米粒品位判別装置
KR1020000020004A KR20000077034A (ko) 1999-04-22 2000-04-17 입상물의 품질을 평가하기 위한 장치 및 방법
CA002306060A CA2306060A1 (en) 1999-04-22 2000-04-18 Apparatus and method for evaluating quality of granular object
AU28908/00A AU771766B2 (en) 1999-04-22 2000-04-20 Apparatus and method for evaluating quality of granular object
DK00303384T DK1046902T3 (da) 1999-04-22 2000-04-20 Apparat og fremgangsmåde til evaluering af kvaliteten af granulære objekter
EP00303384A EP1046902B1 (en) 1999-04-22 2000-04-20 Apparatus and method for evaluating quality of granular objects
AT00303384T ATE284029T1 (de) 1999-04-22 2000-04-20 Vorrichtung und verfahren zur auswertung der qualität von körnigen objekten
TW089107491A TW477896B (en) 1999-04-22 2000-04-20 Apparatus and method for evaluating quality of granular object
DE60016304T DE60016304D1 (de) 1999-04-22 2000-04-20 Vorrichtung und Verfahren zur Auswertung der Qualität von körnigen Objekten
US09/556,947 US6427128B1 (en) 1999-04-22 2000-04-21 Apparatus and method for evaluating quality of granular object
CNB001070177A CN1296701C (zh) 1999-04-22 2000-04-24 评估颗粒状物体质量的装置和方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21809199A JP4345148B2 (ja) 1999-07-30 1999-07-30 米粒品位判別装置

Publications (3)

Publication Number Publication Date
JP2001041895A JP2001041895A (ja) 2001-02-16
JP2001041895A5 JP2001041895A5 (cg-RX-API-DMAC10.html) 2006-09-14
JP4345148B2 true JP4345148B2 (ja) 2009-10-14

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP21809199A Expired - Fee Related JP4345148B2 (ja) 1999-04-22 1999-07-30 米粒品位判別装置

Country Status (1)

Country Link
JP (1) JP4345148B2 (cg-RX-API-DMAC10.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012208107A (ja) * 2011-03-28 2012-10-25 Youngtek Electronics Corp 複数の電子素子の外観を検出するためのマルチチャンネル検出システム

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100458506B1 (ko) * 2002-08-21 2004-12-03 주식회사 대원지에스아이 큐를 이용한 광학장치와 공기분사기 사이의 시간지연처리수단을 구비하는 곡물 선별기
JP4126009B2 (ja) * 2003-12-25 2008-07-30 株式会社山本製作所 粒状被検査物状態判別装置
JP4590553B2 (ja) * 2005-01-24 2010-12-01 国立大学法人 新潟大学 生籾被害粒の非破壊判定方法
KR100800291B1 (ko) * 2007-07-13 2008-02-01 주식회사에이멕스 곡물의 크기를 이용한 선별방법
JP6024949B2 (ja) * 2012-06-27 2016-11-16 株式会社サタケ 穀粒外観測定装置
JP6210616B2 (ja) * 2013-02-27 2017-10-11 地方独立行政法人 岩手県工業技術センター 酒米の検査装置
JP6229278B2 (ja) 2013-03-06 2017-11-15 株式会社サタケ 穀粒透視器
US10969218B2 (en) 2014-03-31 2021-04-06 Yuyama Mfg. Co., Ltd. Medicine photographing device
CN111929303B (zh) * 2020-08-27 2025-05-27 石河子大学 一种收购环节机采籽棉水杂快速检测系统
JP7044150B1 (ja) * 2020-12-18 2022-03-30 株式会社サタケ 基準部材、および穀粒判別器
CN116670498A (zh) * 2020-12-23 2023-08-29 株式会社佐竹 谷粒判别装置
CN113791008B (zh) * 2021-08-25 2024-03-15 安徽高哲信息技术有限公司 一种粮食不完善粒检测设备及检测方法
CN113731845B (zh) * 2021-08-26 2025-01-28 苏州韦士肯检测科技有限公司 一种轴承检测设备
CN119044165B (zh) * 2024-10-30 2025-02-28 河北凯阔食品集团股份有限公司 用于亚麻籽油生产的亚麻籽原材料品质检测系统及方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012208107A (ja) * 2011-03-28 2012-10-25 Youngtek Electronics Corp 複数の電子素子の外観を検出するためのマルチチャンネル検出システム

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