JP2001041895A5 - - Google Patents

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Publication number
JP2001041895A5
JP2001041895A5 JP1999218091A JP21809199A JP2001041895A5 JP 2001041895 A5 JP2001041895 A5 JP 2001041895A5 JP 1999218091 A JP1999218091 A JP 1999218091A JP 21809199 A JP21809199 A JP 21809199A JP 2001041895 A5 JP2001041895 A5 JP 2001041895A5
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JP
Japan
Prior art keywords
grain
rice
image
light
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1999218091A
Other languages
English (en)
Japanese (ja)
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JP4345148B2 (ja
JP2001041895A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from JP21809199A external-priority patent/JP4345148B2/ja
Priority to JP21809199A priority Critical patent/JP4345148B2/ja
Priority to KR1020000020004A priority patent/KR20000077034A/ko
Priority to CA002306060A priority patent/CA2306060A1/en
Priority to AT00303384T priority patent/ATE284029T1/de
Priority to DK00303384T priority patent/DK1046902T3/da
Priority to EP00303384A priority patent/EP1046902B1/en
Priority to AU28908/00A priority patent/AU771766B2/en
Priority to TW089107491A priority patent/TW477896B/zh
Priority to DE60016304T priority patent/DE60016304D1/de
Priority to US09/556,947 priority patent/US6427128B1/en
Priority to CNB001070177A priority patent/CN1296701C/zh
Publication of JP2001041895A publication Critical patent/JP2001041895A/ja
Publication of JP2001041895A5 publication Critical patent/JP2001041895A5/ja
Publication of JP4345148B2 publication Critical patent/JP4345148B2/ja
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP21809199A 1999-04-22 1999-07-30 米粒品位判別装置 Expired - Fee Related JP4345148B2 (ja)

Priority Applications (11)

Application Number Priority Date Filing Date Title
JP21809199A JP4345148B2 (ja) 1999-07-30 1999-07-30 米粒品位判別装置
KR1020000020004A KR20000077034A (ko) 1999-04-22 2000-04-17 입상물의 품질을 평가하기 위한 장치 및 방법
CA002306060A CA2306060A1 (en) 1999-04-22 2000-04-18 Apparatus and method for evaluating quality of granular object
AU28908/00A AU771766B2 (en) 1999-04-22 2000-04-20 Apparatus and method for evaluating quality of granular object
DK00303384T DK1046902T3 (da) 1999-04-22 2000-04-20 Apparat og fremgangsmåde til evaluering af kvaliteten af granulære objekter
EP00303384A EP1046902B1 (en) 1999-04-22 2000-04-20 Apparatus and method for evaluating quality of granular objects
AT00303384T ATE284029T1 (de) 1999-04-22 2000-04-20 Vorrichtung und verfahren zur auswertung der qualität von körnigen objekten
TW089107491A TW477896B (en) 1999-04-22 2000-04-20 Apparatus and method for evaluating quality of granular object
DE60016304T DE60016304D1 (de) 1999-04-22 2000-04-20 Vorrichtung und Verfahren zur Auswertung der Qualität von körnigen Objekten
US09/556,947 US6427128B1 (en) 1999-04-22 2000-04-21 Apparatus and method for evaluating quality of granular object
CNB001070177A CN1296701C (zh) 1999-04-22 2000-04-24 评估颗粒状物体质量的装置和方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21809199A JP4345148B2 (ja) 1999-07-30 1999-07-30 米粒品位判別装置

Publications (3)

Publication Number Publication Date
JP2001041895A JP2001041895A (ja) 2001-02-16
JP2001041895A5 true JP2001041895A5 (cg-RX-API-DMAC10.html) 2006-09-14
JP4345148B2 JP4345148B2 (ja) 2009-10-14

Family

ID=16714499

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21809199A Expired - Fee Related JP4345148B2 (ja) 1999-04-22 1999-07-30 米粒品位判別装置

Country Status (1)

Country Link
JP (1) JP4345148B2 (cg-RX-API-DMAC10.html)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100458506B1 (ko) * 2002-08-21 2004-12-03 주식회사 대원지에스아이 큐를 이용한 광학장치와 공기분사기 사이의 시간지연처리수단을 구비하는 곡물 선별기
JP4126009B2 (ja) * 2003-12-25 2008-07-30 株式会社山本製作所 粒状被検査物状態判別装置
JP4590553B2 (ja) * 2005-01-24 2010-12-01 国立大学法人 新潟大学 生籾被害粒の非破壊判定方法
KR100800291B1 (ko) * 2007-07-13 2008-02-01 주식회사에이멕스 곡물의 크기를 이용한 선별방법
TWI421488B (zh) * 2011-03-28 2014-01-01 久元電子股份有限公司 用於檢測多個電子元件外觀的多軌式檢測系統
JP6024949B2 (ja) * 2012-06-27 2016-11-16 株式会社サタケ 穀粒外観測定装置
JP6210616B2 (ja) * 2013-02-27 2017-10-11 地方独立行政法人 岩手県工業技術センター 酒米の検査装置
JP6229278B2 (ja) 2013-03-06 2017-11-15 株式会社サタケ 穀粒透視器
US10969218B2 (en) 2014-03-31 2021-04-06 Yuyama Mfg. Co., Ltd. Medicine photographing device
CN111929303B (zh) * 2020-08-27 2025-05-27 石河子大学 一种收购环节机采籽棉水杂快速检测系统
JP7044150B1 (ja) * 2020-12-18 2022-03-30 株式会社サタケ 基準部材、および穀粒判別器
CN116670498A (zh) * 2020-12-23 2023-08-29 株式会社佐竹 谷粒判别装置
CN113791008B (zh) * 2021-08-25 2024-03-15 安徽高哲信息技术有限公司 一种粮食不完善粒检测设备及检测方法
CN113731845B (zh) * 2021-08-26 2025-01-28 苏州韦士肯检测科技有限公司 一种轴承检测设备
CN119044165B (zh) * 2024-10-30 2025-02-28 河北凯阔食品集团股份有限公司 用于亚麻籽油生产的亚麻籽原材料品质检测系统及方法

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