JP4334327B2 - 対象物の大きさおよび位置を測定するためのホログラフィ光学素子およびその使用方法ならびに当該ホログラフィ光学素子を有する装置 - Google Patents

対象物の大きさおよび位置を測定するためのホログラフィ光学素子およびその使用方法ならびに当該ホログラフィ光学素子を有する装置 Download PDF

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Publication number
JP4334327B2
JP4334327B2 JP2003406381A JP2003406381A JP4334327B2 JP 4334327 B2 JP4334327 B2 JP 4334327B2 JP 2003406381 A JP2003406381 A JP 2003406381A JP 2003406381 A JP2003406381 A JP 2003406381A JP 4334327 B2 JP4334327 B2 JP 4334327B2
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JP
Japan
Prior art keywords
optical element
holographic optical
hoe
interference fringes
wavefront
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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JP2003406381A
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English (en)
Japanese (ja)
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JP2004191977A5 (US07576130-20090818-C00114.png
JP2004191977A (ja
Inventor
シュトゥーダー ウルス−ペーター
ケーザー ベダ
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ツムバッハ エレクトロニク アクチェンゲゼルシャフト
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Priority claimed from EP02027560A external-priority patent/EP1429111A1/de
Application filed by ツムバッハ エレクトロニク アクチェンゲゼルシャフト filed Critical ツムバッハ エレクトロニク アクチェンゲゼルシャフト
Publication of JP2004191977A publication Critical patent/JP2004191977A/ja
Publication of JP2004191977A5 publication Critical patent/JP2004191977A5/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/32—Holograms used as optical elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
JP2003406381A 2002-12-09 2003-12-04 対象物の大きさおよび位置を測定するためのホログラフィ光学素子およびその使用方法ならびに当該ホログラフィ光学素子を有する装置 Expired - Fee Related JP4334327B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP02027560A EP1429111A1 (de) 2002-12-09 2002-12-09 Holographisches optisches Element mit mehreren Interferenzmustern
EP03026493.1A EP1429112B1 (de) 2002-12-09 2003-11-21 Holographisches optisches Element mit mehreren Interferenzmustern

Publications (3)

Publication Number Publication Date
JP2004191977A JP2004191977A (ja) 2004-07-08
JP2004191977A5 JP2004191977A5 (US07576130-20090818-C00114.png) 2006-12-28
JP4334327B2 true JP4334327B2 (ja) 2009-09-30

Family

ID=32327846

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003406381A Expired - Fee Related JP4334327B2 (ja) 2002-12-09 2003-12-04 対象物の大きさおよび位置を測定するためのホログラフィ光学素子およびその使用方法ならびに当該ホログラフィ光学素子を有する装置

Country Status (3)

Country Link
EP (1) EP1429112B1 (US07576130-20090818-C00114.png)
JP (1) JP4334327B2 (US07576130-20090818-C00114.png)
CA (1) CA2452600C (US07576130-20090818-C00114.png)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100616744B1 (ko) 2005-02-25 2006-08-28 (주)모비솔 홀로그래픽 광학 소자를 이용한 포인팅 장치
DE102019206374A1 (de) 2019-05-03 2020-11-05 Audi Ag Erfassungsvorrichtung mit zumindest einer Sensoreinrichtung, einer Auswerteeinrichtung, einer Lichtquelle sowie einem Trägermedium

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5018803A (en) * 1985-02-04 1991-05-28 Robotic Vision Systems, Inc. Three-dimensional volumetric sensor
CH674774A5 (US07576130-20090818-C00114.png) * 1986-04-03 1990-07-13 Zumbach Electronic Ag
CH683370A5 (de) * 1992-04-10 1994-02-28 Zumbach Electronic Ag Verfahren und Vorrichtung zur Messung der Abmessung eines Objekts.
DE19647613C2 (de) * 1996-11-18 1998-11-12 Laser Applikationan Gmbh Verfahren und Vorrichtung zur Messung der Dicke von unrunden länglichen und in Richtung ihrer Längsachse vorgeschobenen Werkstücken mit beliebiger und sich ändernder Winkellage

Also Published As

Publication number Publication date
CA2452600A1 (en) 2004-06-09
EP1429112B1 (de) 2018-03-21
EP1429112A1 (de) 2004-06-16
JP2004191977A (ja) 2004-07-08
CA2452600C (en) 2012-05-15

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