JP4328713B2 - 試験装置、光接続部、及び製造方法 - Google Patents

試験装置、光接続部、及び製造方法 Download PDF

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Publication number
JP4328713B2
JP4328713B2 JP2004347676A JP2004347676A JP4328713B2 JP 4328713 B2 JP4328713 B2 JP 4328713B2 JP 2004347676 A JP2004347676 A JP 2004347676A JP 2004347676 A JP2004347676 A JP 2004347676A JP 4328713 B2 JP4328713 B2 JP 4328713B2
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Japan
Prior art keywords
test head
cable
storage
optical fiber
main frame
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Expired - Fee Related
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JP2004347676A
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Japanese (ja)
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JP2006153766A5 (enExample
JP2006153766A (ja
Inventor
淳 小野
俊幸 岡安
明博 藤本
正志 柴田
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Advantest Corp
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Advantest Corp
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Publication date
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Priority to JP2004347676A priority Critical patent/JP4328713B2/ja
Priority to US11/217,125 priority patent/US7336885B2/en
Publication of JP2006153766A publication Critical patent/JP2006153766A/ja
Publication of JP2006153766A5 publication Critical patent/JP2006153766A5/ja
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Publication of JP4328713B2 publication Critical patent/JP4328713B2/ja
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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/44Mechanical structures for providing tensile strength and external protection for fibres, e.g. optical transmission cables
    • G02B6/4439Auxiliary devices
    • G02B6/444Systems or boxes with surplus lengths
    • G02B6/4453Cassettes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Light Guides In General And Applications Therefor (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2004347676A 2004-11-30 2004-11-30 試験装置、光接続部、及び製造方法 Expired - Fee Related JP4328713B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2004347676A JP4328713B2 (ja) 2004-11-30 2004-11-30 試験装置、光接続部、及び製造方法
US11/217,125 US7336885B2 (en) 2004-11-30 2005-08-31 Test apparatus, optical coupler and method of manufacturing same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004347676A JP4328713B2 (ja) 2004-11-30 2004-11-30 試験装置、光接続部、及び製造方法

Publications (3)

Publication Number Publication Date
JP2006153766A JP2006153766A (ja) 2006-06-15
JP2006153766A5 JP2006153766A5 (enExample) 2009-01-29
JP4328713B2 true JP4328713B2 (ja) 2009-09-09

Family

ID=36567491

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004347676A Expired - Fee Related JP4328713B2 (ja) 2004-11-30 2004-11-30 試験装置、光接続部、及び製造方法

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US (1) US7336885B2 (enExample)
JP (1) JP4328713B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005045452A1 (ja) * 2003-11-05 2005-05-19 Advantest Corporation 試験装置及びケーブルガイドユニット
JP4853273B2 (ja) * 2006-12-20 2012-01-11 横河電機株式会社 半導体テスタ
CN108680802B (zh) * 2018-03-28 2019-10-29 北京航空航天大学 一种基于传输延迟的高速光耦贮存可靠性检测方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4898448A (en) * 1988-05-02 1990-02-06 Gte Products Corporation Fiber distribution panel
US4900123A (en) * 1988-08-29 1990-02-13 Gte Products Corporation 1550 nm fiber distribution panel
JPH10142298A (ja) * 1996-11-15 1998-05-29 Advantest Corp 集積回路デバイス試験装置
US20030219194A1 (en) * 2002-04-19 2003-11-27 Barthel William F. Optical fiber management system and method
US6983095B2 (en) * 2003-11-17 2006-01-03 Fiber Optic Network Solutions Corporation Systems and methods for managing optical fibers and components within an enclosure in an optical communications network

Also Published As

Publication number Publication date
US20060115223A1 (en) 2006-06-01
US7336885B2 (en) 2008-02-26
JP2006153766A (ja) 2006-06-15

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