JP2006153766A5 - - Google Patents

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Publication number
JP2006153766A5
JP2006153766A5 JP2004347676A JP2004347676A JP2006153766A5 JP 2006153766 A5 JP2006153766 A5 JP 2006153766A5 JP 2004347676 A JP2004347676 A JP 2004347676A JP 2004347676 A JP2004347676 A JP 2004347676A JP 2006153766 A5 JP2006153766 A5 JP 2006153766A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004347676A
Other languages
Japanese (ja)
Other versions
JP2006153766A (ja
JP4328713B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2004347676A priority Critical patent/JP4328713B2/ja
Priority claimed from JP2004347676A external-priority patent/JP4328713B2/ja
Priority to US11/217,125 priority patent/US7336885B2/en
Publication of JP2006153766A publication Critical patent/JP2006153766A/ja
Publication of JP2006153766A5 publication Critical patent/JP2006153766A5/ja
Application granted granted Critical
Publication of JP4328713B2 publication Critical patent/JP4328713B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2004347676A 2004-11-30 2004-11-30 試験装置、光接続部、及び製造方法 Expired - Fee Related JP4328713B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2004347676A JP4328713B2 (ja) 2004-11-30 2004-11-30 試験装置、光接続部、及び製造方法
US11/217,125 US7336885B2 (en) 2004-11-30 2005-08-31 Test apparatus, optical coupler and method of manufacturing same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004347676A JP4328713B2 (ja) 2004-11-30 2004-11-30 試験装置、光接続部、及び製造方法

Publications (3)

Publication Number Publication Date
JP2006153766A JP2006153766A (ja) 2006-06-15
JP2006153766A5 true JP2006153766A5 (enExample) 2009-01-29
JP4328713B2 JP4328713B2 (ja) 2009-09-09

Family

ID=36567491

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004347676A Expired - Fee Related JP4328713B2 (ja) 2004-11-30 2004-11-30 試験装置、光接続部、及び製造方法

Country Status (2)

Country Link
US (1) US7336885B2 (enExample)
JP (1) JP4328713B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005045452A1 (ja) * 2003-11-05 2005-05-19 Advantest Corporation 試験装置及びケーブルガイドユニット
JP4853273B2 (ja) * 2006-12-20 2012-01-11 横河電機株式会社 半導体テスタ
CN108680802B (zh) * 2018-03-28 2019-10-29 北京航空航天大学 一种基于传输延迟的高速光耦贮存可靠性检测方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4898448A (en) * 1988-05-02 1990-02-06 Gte Products Corporation Fiber distribution panel
US4900123A (en) * 1988-08-29 1990-02-13 Gte Products Corporation 1550 nm fiber distribution panel
JPH10142298A (ja) * 1996-11-15 1998-05-29 Advantest Corp 集積回路デバイス試験装置
US20030219194A1 (en) * 2002-04-19 2003-11-27 Barthel William F. Optical fiber management system and method
US6983095B2 (en) * 2003-11-17 2006-01-03 Fiber Optic Network Solutions Corporation Systems and methods for managing optical fibers and components within an enclosure in an optical communications network

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