JP4303108B2 - リニアイオントラップ型質量分析計における空間電荷低減方法 - Google Patents

リニアイオントラップ型質量分析計における空間電荷低減方法 Download PDF

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JP4303108B2
JP4303108B2 JP2003522975A JP2003522975A JP4303108B2 JP 4303108 B2 JP4303108 B2 JP 4303108B2 JP 2003522975 A JP2003522975 A JP 2003522975A JP 2003522975 A JP2003522975 A JP 2003522975A JP 4303108 B2 JP4303108 B2 JP 4303108B2
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mass spectrometer
ion
ion trap
ions
quadrupole
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Japanese (ja)
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JP2005500662A (ja
JP2005500662A5 (cg-RX-API-DMAC7.html
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ダブリュ ヘイガー，ジェイムズ
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Mds Inc Doing Business Mds Sciex AS
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Mds Inc Doing Business Mds Sciex AS
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/4265—Controlling the number of trapped ions; preventing space charge effects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
    • Y10S430/143—Electron beam

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2003522975A 2001-08-30 2002-08-14 リニアイオントラップ型質量分析計における空間電荷低減方法 Expired - Fee Related JP4303108B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US31571501P 2001-08-30 2001-08-30
PCT/CA2002/001257 WO2003019614A2 (en) 2001-08-30 2002-08-14 A method of reducing space charge in a linear ion trap mass spectrometer

Publications (3)

Publication Number Publication Date
JP2005500662A JP2005500662A (ja) 2005-01-06
JP2005500662A5 JP2005500662A5 (cg-RX-API-DMAC7.html) 2006-01-05
JP4303108B2 true JP4303108B2 (ja) 2009-07-29

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JP2003522975A Expired - Fee Related JP4303108B2 (ja) 2001-08-30 2002-08-14 リニアイオントラップ型質量分析計における空間電荷低減方法

Country Status (8)

Country Link
US (2) US20040238737A1 (cg-RX-API-DMAC7.html)
EP (1) EP1421600B1 (cg-RX-API-DMAC7.html)
JP (1) JP4303108B2 (cg-RX-API-DMAC7.html)
AT (1) ATE298463T1 (cg-RX-API-DMAC7.html)
AU (1) AU2002322895A1 (cg-RX-API-DMAC7.html)
CA (1) CA2457631C (cg-RX-API-DMAC7.html)
DE (1) DE60204785T2 (cg-RX-API-DMAC7.html)
WO (1) WO2003019614A2 (cg-RX-API-DMAC7.html)

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7060972B2 (en) * 2000-07-21 2006-06-13 Mds Inc. Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps
US6720554B2 (en) * 2000-07-21 2004-04-13 Mds Inc. Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps
WO2003019614A2 (en) * 2001-08-30 2003-03-06 Mds Inc., Doing Busness As Mds Sciex A method of reducing space charge in a linear ion trap mass spectrometer
US7045797B2 (en) * 2002-08-05 2006-05-16 The University Of British Columbia Axial ejection with improved geometry for generating a two-dimensional substantially quadrupole field
US6897438B2 (en) * 2002-08-05 2005-05-24 University Of British Columbia Geometry for generating a two-dimensional substantially quadrupole field
EP1586104A2 (en) * 2003-01-24 2005-10-19 Thermo Finnigan LLC Controlling ion populations in a mass analyzer
GB0312940D0 (en) * 2003-06-05 2003-07-09 Shimadzu Res Lab Europe Ltd A method for obtaining high accuracy mass spectra using an ion trap mass analyser and a method for determining and/or reducing chemical shift in mass analysis
CA2539221A1 (en) * 2003-09-25 2005-03-31 Mds Inc., Doing Business As Mds Sciex Method and apparatus for providing two-dimensional substantially quadrupole fields having selected hexapole components
DE102004001514A1 (de) * 2004-01-09 2005-08-04 Marcus Dr.-Ing. Gohl Verfahren und Vorrichtung zur Bestimmung des Schmierölgehalts in einem Abgasgemisch
CA2608972A1 (en) * 2005-05-18 2006-11-23 Mds Inc. Doing Business As Mds Sciex Method and apparatus for mass selective axial transport using quadrupolar dc
GB0511083D0 (en) 2005-05-31 2005-07-06 Thermo Finnigan Llc Multiple ion injection in mass spectrometry
DE102005025498B4 (de) 2005-06-03 2008-12-24 Bruker Daltonik Gmbh Füllstandsregelung in Ionenzyklotronresonanz- Massenspetrometern
JP4636943B2 (ja) * 2005-06-06 2011-02-23 株式会社日立ハイテクノロジーズ 質量分析装置
JP4369454B2 (ja) 2006-09-04 2009-11-18 株式会社日立ハイテクノロジーズ イオントラップ質量分析方法
US7633059B2 (en) 2006-10-13 2009-12-15 Agilent Technologies, Inc. Mass spectrometry system having ion deflector
GB0624679D0 (en) * 2006-12-11 2007-01-17 Shimadzu Corp A time-of-flight mass spectrometer and a method of analysing ions in a time-of-flight mass spectrometer
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
US7629575B2 (en) * 2007-12-19 2009-12-08 Varian, Inc. Charge control for ionic charge accumulation devices
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
EP2294603A4 (en) * 2008-06-09 2017-01-18 DH Technologies Development Pte. Ltd. A multipole ion guide for providing an axial electric field whose strength increases with radial position, and a method of operating a multipole ion guide having such an axial electric field
EP2308077B1 (en) * 2008-06-09 2019-09-11 DH Technologies Development Pte. Ltd. Method of operating tandem ion traps
US8822916B2 (en) 2008-06-09 2014-09-02 Dh Technologies Development Pte. Ltd. Method of operating tandem ion traps
GB0810599D0 (en) 2008-06-10 2008-07-16 Micromass Ltd Mass spectrometer
US20100096544A1 (en) * 2008-10-16 2010-04-22 Battelle Memorial Institute Surface Sampling Probe for Field Portable Surface Sampling Mass Spectrometer
GB0900917D0 (en) 2009-01-20 2009-03-04 Micromass Ltd Mass spectrometer
US20100237236A1 (en) * 2009-03-20 2010-09-23 Applera Corporation Method Of Processing Multiple Precursor Ions In A Tandem Mass Spectrometer
WO2010132366A1 (en) * 2009-05-11 2010-11-18 Thermo Finnigan Llc Ion population control in a mass spectrometer having mass-selective transfer optics
GB2490958B (en) * 2011-05-20 2016-02-10 Thermo Fisher Scient Bremen Method and apparatus for mass analysis
EP2732458A4 (en) * 2011-07-11 2015-05-20 Dh Technologies Dev Pte Ltd METHOD FOR CONTROLLING THE SPACE LOAD IN A MASS SPECTROMETER
EP2786399B1 (en) * 2011-11-29 2019-10-09 Thermo Finnigan LLC Method for automated checking and adjustment of mass spectrometer calibration
EP2795665A4 (en) * 2011-12-23 2015-08-12 Dh Technologies Dev Pte Ltd METHOD AND SYSTEM FOR QUANTITATIVE AND QUALITATIVE ANALYSIS USING MASS SPECTROMETRY
US8759752B2 (en) 2012-03-12 2014-06-24 Thermo Finnigan Llc Corrected mass analyte values in a mass spectrum
JP2016516266A (ja) * 2013-03-14 2016-06-02 マイクロマス ユーケー リミテッド データ依存制御の改善方法
US8969794B2 (en) * 2013-03-15 2015-03-03 1St Detect Corporation Mass dependent automatic gain control for mass spectrometer
GB201307404D0 (en) * 2013-04-24 2013-06-05 Micromass Ltd Improved ion mobility spectrometer
US10088451B2 (en) 2013-04-24 2018-10-02 Micromass Uk Limited Ion mobility spectrometer
GB201316164D0 (en) 2013-09-11 2013-10-23 Thermo Fisher Scient Bremen Targeted mass analysis
EP3321953B1 (en) 2016-11-10 2019-06-26 Thermo Finnigan LLC Systems and methods for scaling injection waveform amplitude during ion isolation
US10128099B1 (en) * 2017-07-20 2018-11-13 Thermo Finnigan Llc Systems and methods for regulating the ion population in an ion trap for MSn scans
CN113366609B (zh) * 2019-02-01 2025-03-11 Dh科技发展私人贸易有限公司 用于优化离子阱填充的自动增益控制
GB201906546D0 (en) 2019-05-09 2019-06-26 Thermo Fisher Scient Bremen Gmbh Charge detection for ion current control

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT528250A (cg-RX-API-DMAC7.html) * 1953-12-24
US5107109A (en) * 1986-03-07 1992-04-21 Finnigan Corporation Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer
US4755670A (en) * 1986-10-01 1988-07-05 Finnigan Corporation Fourtier transform quadrupole mass spectrometer and method
US5179278A (en) * 1991-08-23 1993-01-12 Mds Health Group Limited Multipole inlet system for ion traps
DE4326549C1 (de) * 1993-08-07 1994-08-25 Bruker Franzen Analytik Gmbh Verfahren für eine Regelung der Raumladung in Ionenfallen
US6011259A (en) * 1995-08-10 2000-01-04 Analytica Of Branford, Inc. Multipole ion guide ion trap mass spectrometry with MS/MSN analysis
US5420425A (en) * 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
US5572022A (en) * 1995-03-03 1996-11-05 Finnigan Corporation Method and apparatus of increasing dynamic range and sensitivity of a mass spectrometer
US6177668B1 (en) * 1996-06-06 2001-01-23 Mds Inc. Axial ejection in a multipole mass spectrometer
WO2003019614A2 (en) * 2001-08-30 2003-03-06 Mds Inc., Doing Busness As Mds Sciex A method of reducing space charge in a linear ion trap mass spectrometer

Also Published As

Publication number Publication date
WO2003019614A3 (en) 2003-06-19
ATE298463T1 (de) 2005-07-15
WO2003019614A2 (en) 2003-03-06
DE60204785D1 (de) 2005-07-28
EP1421600A2 (en) 2004-05-26
US6627876B2 (en) 2003-09-30
JP2005500662A (ja) 2005-01-06
DE60204785T2 (de) 2006-05-04
CA2457631A1 (en) 2003-03-06
US20030042415A1 (en) 2003-03-06
US20040238737A1 (en) 2004-12-02
AU2002322895A1 (en) 2003-03-10
EP1421600B1 (en) 2005-06-22
CA2457631C (en) 2010-04-27

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