JP4277339B2 - アクティブ画素センサの読み出しチャネル - Google Patents

アクティブ画素センサの読み出しチャネル Download PDF

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Publication number
JP4277339B2
JP4277339B2 JP01641899A JP1641899A JP4277339B2 JP 4277339 B2 JP4277339 B2 JP 4277339B2 JP 01641899 A JP01641899 A JP 01641899A JP 1641899 A JP1641899 A JP 1641899A JP 4277339 B2 JP4277339 B2 JP 4277339B2
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Prior art keywords
voltage
output
active pixel
signal
capacitor
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Japanese (ja)
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JPH11275471A (ja
JPH11275471A5 (https=
Inventor
エリック・ワイ・チョウ
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マイクロン テクノロジー， インク．
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/04—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only
    • H03F3/08—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light
    • H03F3/082—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light with FET's
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/677—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction for reducing the column or line fixed pattern noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Power Engineering (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
JP01641899A 1998-02-02 1999-01-26 アクティブ画素センサの読み出しチャネル Expired - Lifetime JP4277339B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US018022 1998-02-02
US09/018,022 US6201572B1 (en) 1998-02-02 1998-02-02 Analog current mode assisted differential to single-ended read-out channel operable with an active pixel sensor

Publications (3)

Publication Number Publication Date
JPH11275471A JPH11275471A (ja) 1999-10-08
JPH11275471A5 JPH11275471A5 (https=) 2005-12-08
JP4277339B2 true JP4277339B2 (ja) 2009-06-10

Family

ID=21785824

Family Applications (1)

Application Number Title Priority Date Filing Date
JP01641899A Expired - Lifetime JP4277339B2 (ja) 1998-02-02 1999-01-26 アクティブ画素センサの読み出しチャネル

Country Status (4)

Country Link
US (1) US6201572B1 (https=)
EP (1) EP0933928B1 (https=)
JP (1) JP4277339B2 (https=)
DE (1) DE69924312T2 (https=)

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US6529237B1 (en) * 1997-12-02 2003-03-04 Texas Instruments Incorporated Complete CDS/PGA sample and hold amplifier
US6801258B1 (en) * 1998-03-16 2004-10-05 California Institute Of Technology CMOS integration sensor with fully differential column readout circuit for light adaptive imaging
US6734907B1 (en) * 1998-04-30 2004-05-11 Minolta Co., Ltd. Solid-state image pickup device with integration and amplification
US6836291B1 (en) 1998-04-30 2004-12-28 Minolta Co., Ltd. Image pickup device with integral amplification
US6765613B1 (en) * 1998-07-22 2004-07-20 Micron Technology, Inc. Low light sensor signal to noise improvement
US6587145B1 (en) * 1998-08-20 2003-07-01 Syscan Technology (Shenzhen) Co., Ltd. Image sensors generating digital signals from light integration processes
US6563540B2 (en) 1999-02-26 2003-05-13 Intel Corporation Light sensor with increased dynamic range
JP4358351B2 (ja) * 1999-04-27 2009-11-04 浜松ホトニクス株式会社 光検出装置
US6753912B1 (en) * 1999-08-31 2004-06-22 Taiwan Advanced Sensors Corporation Self compensating correlated double sampling circuit
US6453422B1 (en) * 1999-12-23 2002-09-17 Intel Corporation Reference voltage distribution for multiload i/o systems
US6873364B1 (en) * 2000-06-08 2005-03-29 Micron Technology, Inc. Low-power signal chain for image sensors
KR100397663B1 (ko) * 2000-06-23 2003-09-13 (주) 픽셀플러스 데이터 입출력선이 리셋 모드의 전압으로 유지되는 씨모스 이미지 센서
US7286174B1 (en) 2001-06-05 2007-10-23 Dalsa, Inc. Dual storage node pixel for CMOS sensor
US6797933B1 (en) * 2001-06-29 2004-09-28 Vanguard International Semiconductor Corporation On-chip design-for-testing structure for CMOS APS (active pixel sensor) image sensor
FR2838903B1 (fr) * 2002-04-17 2005-08-05 St Microelectronics Sa Procede et dispositif de lecture de cellules photosensibles
US7443427B2 (en) * 2002-08-23 2008-10-28 Micron Technology, Inc. Wide dynamic range linear-and-log active pixel
US20050174455A1 (en) * 2004-01-27 2005-08-11 Transchip, Inc. Column amplifier for image sensors
US6873282B1 (en) * 2004-03-04 2005-03-29 Charles Douglas Murphy Differential time-to-threshold A/D conversion in digital imaging arrays
US20050200730A1 (en) * 2004-03-11 2005-09-15 Beck Jeffery S. Active pixel sensor array sampling system and method
JP4817354B2 (ja) * 2004-11-05 2011-11-16 ローム株式会社 半導体チップ
JP4425809B2 (ja) * 2005-02-03 2010-03-03 富士通マイクロエレクトロニクス株式会社 撮像装置
US7250893B2 (en) * 2005-05-17 2007-07-31 Silicon Light Machines Corporation Signal processing circuit and method for use with an optical navigation system
US8471191B2 (en) 2005-12-16 2013-06-25 Cypress Semiconductor Corporation Optical navigation system having a filter-window to seal an enclosure thereof
US7765251B2 (en) * 2005-12-16 2010-07-27 Cypress Semiconductor Corporation Signal averaging circuit and method for sample averaging
US7659776B2 (en) * 2006-10-17 2010-02-09 Cypress Semiconductor Corporation Offset voltage correction for high gain amplifier
US7742514B1 (en) 2006-10-31 2010-06-22 Cypress Semiconductor Corporation Laser navigation sensor
JP2008136047A (ja) * 2006-11-29 2008-06-12 Sony Corp 固体撮像装置及び撮像装置
US20080204567A1 (en) * 2007-02-23 2008-08-28 Weize Xu Sample and hold circuits with buffer offset removed
US8063422B2 (en) * 2008-04-25 2011-11-22 Infrared Newco, Inc. Image detection apparatus and methods
US8541727B1 (en) 2008-09-30 2013-09-24 Cypress Semiconductor Corporation Signal monitoring and control system for an optical navigation sensor
US7723659B1 (en) 2008-10-10 2010-05-25 Cypress Semiconductor Corporation System and method for screening semiconductor lasers
FR2943179B1 (fr) * 2009-03-13 2016-06-03 E2V Semiconductors Capteur d'image mos et procede de lecture avec transistor en regime de faible inversion.
EP2254330A1 (en) * 2009-05-18 2010-11-24 Thomson Licensing Method and system for operating an image data collection device
US8836835B2 (en) 2010-10-04 2014-09-16 International Business Machines Corporation Pixel sensor cell with hold node for leakage cancellation and methods of manufacture and design structure
US11272132B2 (en) 2019-06-07 2022-03-08 Pacific Biosciences Of California, Inc. Temporal differential active pixel sensor

Family Cites Families (8)

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Publication number Priority date Publication date Assignee Title
JP3287056B2 (ja) * 1993-03-24 2002-05-27 ソニー株式会社 固体撮像装置
US5841126A (en) * 1994-01-28 1998-11-24 California Institute Of Technology CMOS active pixel sensor type imaging system on a chip
US5471515A (en) * 1994-01-28 1995-11-28 California Institute Of Technology Active pixel sensor with intra-pixel charge transfer
US5631704A (en) * 1994-10-14 1997-05-20 Lucent Technologies, Inc. Active pixel sensor and imaging system having differential mode
EP0757475B1 (en) * 1995-08-02 2004-01-21 Canon Kabushiki Kaisha Solid-state image sensing device with common output line
US5898168A (en) * 1997-06-12 1999-04-27 International Business Machines Corporation Image sensor pixel circuit
JP3673620B2 (ja) * 1997-07-18 2005-07-20 キヤノン株式会社 光電変換装置
US5900623A (en) * 1997-08-11 1999-05-04 Chrontel, Inc. Active pixel sensor using CMOS technology with reverse biased photodiodes

Also Published As

Publication number Publication date
US6201572B1 (en) 2001-03-13
JPH11275471A (ja) 1999-10-08
DE69924312T2 (de) 2006-03-16
DE69924312D1 (de) 2005-04-28
EP0933928B1 (en) 2005-03-23
EP0933928A3 (en) 2000-11-29
EP0933928A2 (en) 1999-08-04

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