JP4267906B2 - Mask frame and exposure apparatus - Google Patents

Mask frame and exposure apparatus Download PDF

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Publication number
JP4267906B2
JP4267906B2 JP2002359758A JP2002359758A JP4267906B2 JP 4267906 B2 JP4267906 B2 JP 4267906B2 JP 2002359758 A JP2002359758 A JP 2002359758A JP 2002359758 A JP2002359758 A JP 2002359758A JP 4267906 B2 JP4267906 B2 JP 4267906B2
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JP
Japan
Prior art keywords
mask
slope
frame
exposure apparatus
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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JP2002359758A
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Japanese (ja)
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JP2004191661A (en
Inventor
健一 仲野
隆嗣 近藤
智彦 岡崎
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Topcon Corp
Original Assignee
Topcon Corp
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Filing date
Publication date
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Priority to JP2002359758A priority Critical patent/JP4267906B2/en
Publication of JP2004191661A publication Critical patent/JP2004191661A/en
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Description

【0001】
【発明の属する技術分野】
本発明は、半導体装置を製造する工程の1つであるマスク製造工程で使用されるマスクフレーム及び露光装置に関するものである。
【0002】
【従来の技術】
半導体装置、液晶表示装置等の製造工程に於けるフォトリソグラフィ工程では、マスクに形成された回路パターンを半導体ウェーハ、ガラス基板等の基板に投影露光する露光装置が用いられている。
【0003】
露光装置の1つにプロキシミティ露光装置があり、該プロキシミティ露光装置では基板に対してマスクを離反させて保持し露光するものである。又、近年の半導体ウェーハ、ガラス基板等の基板の大型化に伴い、マスクを被露光体に対して相対移動させて分割露光を行い、基板全体を露光する様になっている。
【0004】
図4〜図6に於いて、基板保持部14とマスク保持部15の概略について説明する。
【0005】
パターンが形成されたマスク1を保持するマスクフレーム2は枠状であり、前記マスク1の周辺部に上面側から当接する。前記マスクフレーム2の下面には真空吸着用の溝3が刻設されており、前記マスク1の周辺部を吸着することで、該マスク1を保持している。
【0006】
該マスク1に対向して移動可能な基板ステージ4が配設され、該基板ステージ4に基板5が載置されている。
【0007】
図示しない投光系より前記マスク1を通して、前記基板5を露光し、更に前記基板ステージ4を移動させ、前記基板5の露光位置を変更して露光する。而して、該基板5の全面を露光する。
【0008】
上記した様に、前記マスク1は周辺部を保持されているので、該マスク1の自重により中央部分に向って撓む現象が発生し、該マスク1の撓みは該マスク1と前記基板5の光学位置に影響を与え、露光性能を悪化させる原因となっていた。
【0009】
この為、マスク保持部で前記マスク1の自重による撓みを抑制する機能を有するものがある。例えば、特許文献1(段落0013、図2参照)にはマスク保持部のマスクフレームが示され、マスク周辺部の支持態様によってマスクの自重による撓みが矯正される様になっている。
【0010】
図7に於いて略述する。
【0011】
フレーム6は互いに対向する様に補正部7が設けられ、該補正部7は前記マスク1の周辺部を挾持した場合、該マスク1の自重による変形を補正する様になっている。即ち、前記補正部7は前記マスク1の周辺部が外側に向って下り傾斜となる様な当接斜面8を有し、前記マスク1の周辺部を挾持した場合に、該マスク1に中央部が盛上がる様な曲げモーメントを与え、自重による曲げモーメントと相殺する様にしている。図7中、9はマスクテーブルである。
【0012】
【特許文献1】
特開2000−31019号公報
【0013】
【発明が解決しようとする課題】
然し乍ら、上記した従来の前記マスク1の撓み矯正に於いては、該マスク1、前記フレーム6が矩形形状をしていた場合には以下の不具合を有している。
【0014】
図8は該フレーム6の角部に於ける前記補正部7を示している。
【0015】
該補正部7の角部では2方向の当接斜面8a,8bが接合するが、両当接斜面は接合線8cに於いて不連続となる。或は、接合線8c部分が円滑に仕上げられたとしても、前記当接斜面8aと前記当接斜面8bとの間を結ぶ曲面は大きな曲率を持つことになる。この為、前記マスク1の撓みを前記補正部7で矯正した場合、該補正部7の角部で大きな歪みを生じることとなり、該補正部7での歪みが周辺に波及すると、矯正力の不足を招き、延いては露光性能に影響を与えていた。
【0016】
本発明は斯かる実情に鑑み、マスク、特に矩形形状のマスクの撓みを矯正した場合に、角部での過度な歪みの発生を抑制し、無理のない撓み矯正を可能としたものである。
【0017】
【課題を解決するための手段】
本発明は、マスクの周辺部を吸着して該マスクを保持する枠状のマスクフレームに於いて、マスク周辺部に密着する前記マスクフレームの当接斜面を3次曲面で形成したマスクフレームに係り、又前記当接斜面は少なくとも2つの異なる曲率を有するマスクフレームに係り、又前記マスクフレームは矩形形状の窓孔を有し、該窓孔の相対する辺に形成される前記当接斜面の曲率は同一であるマスクフレームに係り、又前記マスクフレームが矩形形状の窓孔を有し、前記当接斜面の両端が前記窓孔の角部から離反した位置にあるマスクフレームに係り、又前記当接斜面は窓孔の両端から中央に向って漸次増大する様に形成されたマスクフレームに係り、又マスクの周辺部を吸着して該マスクを保持する枠状のマスクフレームを具備する露光装置に於いて、マスク周辺部に密着する前記マスクフレームの当接斜面を3次曲面で形成した露光装置に係り、又前記当接斜面は少なくとも2つの異なる曲率を有する露光装置に係り、又前記マスクフレームが矩形形状の窓孔を有し、該窓孔の相対する辺に形成される前記当接斜面の曲率は同一である露光装置に係り、又前記マスクフレームが矩形形状の窓孔を有し、前記当接斜面の両端は前記窓孔の角部から離反した位置にある露光装置に係り、更に又前記当接斜面は前記窓孔の両端から中央に向って漸次増大する様に形成された露光装置に係るものである。
【0018】
【発明の実施の形態】
以下、図面を参照しつつ本発明の実施の形態を説明する。
【0019】
図1、図2に於いて、6はフレームであり、露光する為の矩形形状の窓孔11が穿設されている。尚、図中、図4〜図7中で示したものと同等のものには同符号を付してある。
【0020】
該窓孔11の矩形形状12を構成する各短辺12aに沿って当接斜面8aが形成され、各長辺12bに沿って当接斜面8bが形成され、前記当接斜面8a、前記当接斜面8bは球面等の3次曲面である。
【0021】
前記当接斜面8aは、前記矩形形状12の頂点より所要量中心側に離隔した位置から幅が漸次増大し、中央で最大となり、対応する頂点より中心側に所要量離隔した位置で終了する迄漸次減少する弓形状である。
【0022】
同様に、前記当接斜面8bは、前記矩形形状12の頂点より所要量中心側に離隔した位置から幅が漸次増大し、中央で最大となり、対応する頂点より中心側に所要量離隔した位置で終了する迄漸次減少する弓形状である。而して、前記矩形形状12の角部の周囲には当接斜面8が形成されず、前記フレーム6の下面(角部周辺面6a)が広がっている。
【0023】
前記矩形形状12と同心に相似形状に溝3が刻設され、該溝3は前記当接斜面8a、当接斜面8b及び角部周辺面6aに掛渡って形成される。
【0024】
前記溝3は、図示しない真空排気装置に接続されている。
【0025】
以下、作動について説明する。
【0026】
前記フレーム6に前記マスク1を真空吸着により保持すると、該マスク1の周辺短辺部分は前記当接斜面8aに密着し、前記マスク1の周辺長辺部分は前記当接斜面8bに密着する。前記マスク1の周辺部が前記当接斜面8a、当接斜面8bに密着することで前記マスク1の周辺部には中央部を盛上げる様な変位(傾斜)が与えられる。
【0027】
前記当接斜面8a、前記当接斜面8bの両端は矩形形状12の頂点の手前に位置するので、前記マスク1の角部は前記溝3により前記角部周辺面6aに密着する。而して、該角部周辺面6aでの前記マスク1の変位(傾斜)は0であり、前記当接斜面8a、当接斜面8bによって与えられる前記マスク1の変位はそれぞれ変位0の状態から始まるので、該マスク1の角部に過度な歪みが発生することはない。又、前記当接斜面8a、当接斜面8bにより前記マスク1の周辺部に変位が与えられることで、該マスク1の角部は前記角部周辺面6aから浮上がる状態となる。前記マスク1の角部を前記角部周辺面6aに密着する様にすることで、前記マスク1の自重による撓みを矯正する作用が発生する。
【0028】
図3は本発明により該マスク1の自重による撓みを矯正した状態を示している。
【0029】
該マスク1の周辺からの撓みを矯正することで、該マスク1の垂直方向の撓みが微小変位となっている。
【0030】
前記当接斜面8a、当接斜面8bの傾斜量(曲率)については、前記マスク1の大きさにより、計算、実験等により最適な値が求められる。
【0031】
尚、当接斜面8a、当接斜面8bの曲率を異ならせてもよく、又当接斜面8a、当接斜面8bを同一曲率とし曲率中心を異ならせてもよく、或は同一曲率で同一曲率中心としてもよい。更に3次曲面は球体の曲面の一部であっても、楕円球の曲面の一部であってもよい。
【0032】
【発明の効果】
以上述べた如く本発明によれば、マスクの周辺部を吸着して該マスクを保持する枠状のマスクフレーム及び該マスクフレームを具備する露光装置に於いて、マスク周辺部に密着する前記マスクフレームの当接斜面を3次曲面で形成し、又前記当接斜面は両端から中央に向って漸次増大する様に形成されたので、マスク全周に亘って過度な歪みが発生する部分がなく、マスクの無理のない撓み矯正を可能とし、露光性能が向上するという優れた効果を発揮する。
【図面の簡単な説明】
【図1】本発明の実施の形態を示す平面図である。
【図2】同前本発明の実施の形態を示す正断面図である。
【図3】同前本発明の実施の形態の作用を示す説明図である。
【図4】露光装置の基板保持部とマスク保持部を示す平面図である。
【図5】マスクを保持している状態の正断面図である。
【図6】図4のA−A矢視図である。
【図7】従来のマスク保持部を示す断面図である。
【図8】従来のマスクフレームの角部分の説明図である。
【符号の説明】
1 マスク
2 マスクフレーム
3 溝
4 基板ステージ
5 基板
8a 当接斜面
8b 当接斜面
11 窓孔
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a mask frame and an exposure apparatus used in a mask manufacturing process which is one of processes for manufacturing a semiconductor device.
[0002]
[Prior art]
In a photolithography process in a manufacturing process of a semiconductor device, a liquid crystal display device or the like, an exposure apparatus that projects and exposes a circuit pattern formed on a mask onto a substrate such as a semiconductor wafer or a glass substrate is used.
[0003]
There is a proximity exposure apparatus as one of the exposure apparatuses, and the proximity exposure apparatus holds and exposes a mask with respect to the substrate. In addition, with the recent increase in size of substrates such as semiconductor wafers and glass substrates, the mask is moved relative to the object to be exposed to perform divided exposure to expose the entire substrate.
[0004]
The outline of the substrate holding part 14 and the mask holding part 15 will be described with reference to FIGS.
[0005]
A mask frame 2 that holds the mask 1 on which a pattern is formed has a frame shape, and abuts on the peripheral portion of the mask 1 from the upper surface side. A vacuum suction groove 3 is formed on the lower surface of the mask frame 2, and the mask 1 is held by sucking the peripheral portion of the mask 1.
[0006]
A movable substrate stage 4 is disposed facing the mask 1, and a substrate 5 is placed on the substrate stage 4.
[0007]
The substrate 5 is exposed through the mask 1 from a light projection system (not shown), the substrate stage 4 is further moved, and the exposure position of the substrate 5 is changed for exposure. Thus, the entire surface of the substrate 5 is exposed.
[0008]
As described above, since the peripheral portion of the mask 1 is held, a phenomenon in which the mask 1 bends toward the central portion due to its own weight occurs, and the bending of the mask 1 is caused between the mask 1 and the substrate 5. The optical position was affected, and the exposure performance was deteriorated.
[0009]
For this reason, there is a mask holding portion having a function of suppressing bending due to the weight of the mask 1. For example, Patent Document 1 (see paragraph 0013, FIG. 2) shows a mask frame of a mask holding portion, and the deflection due to the weight of the mask is corrected by the support mode of the mask peripheral portion.
[0010]
This is outlined in FIG.
[0011]
The frame 6 is provided with a correction unit 7 so as to face each other, and the correction unit 7 corrects the deformation of the mask 1 due to its own weight when the peripheral part of the mask 1 is held. That is, the correction unit 7 has a contact slope 8 such that the peripheral portion of the mask 1 is inclined downward toward the outside, and when the peripheral portion of the mask 1 is held, A bending moment that gives rise to the height is given to cancel the bending moment due to its own weight. In FIG. 7, 9 is a mask table.
[0012]
[Patent Document 1]
JP 2000-31019 A
[Problems to be solved by the invention]
However, the above-described conventional correction of the deflection of the mask 1 has the following problems when the mask 1 and the frame 6 have a rectangular shape.
[0014]
FIG. 8 shows the correction unit 7 at the corner of the frame 6.
[0015]
The contact slopes 8a and 8b in two directions are joined at the corner of the correction unit 7, but the contact slopes are discontinuous at the joining line 8c. Alternatively, even if the joining line 8c portion is smoothly finished, the curved surface connecting the contact slope 8a and the contact slope 8b has a large curvature. For this reason, when the deflection of the mask 1 is corrected by the correction unit 7, a large distortion is generated at the corner of the correction unit 7, and if the distortion at the correction unit 7 spreads to the periphery, the correction force is insufficient. As a result, the exposure performance was affected.
[0016]
In view of such a situation, the present invention suppresses the occurrence of excessive distortion at a corner when a mask, in particular, a rectangular mask, is corrected for bending, and enables unreasonable bending correction.
[0017]
[Means for Solving the Problems]
The present invention relates to a frame-shaped mask frame that adsorbs a peripheral portion of a mask and holds the mask, and relates to a mask frame in which a contact slope of the mask frame that is in close contact with the peripheral portion of the mask is formed by a cubic surface. The contact slope is related to a mask frame having at least two different curvatures, and the mask frame has a rectangular window hole, and the curvature of the contact slope formed on opposite sides of the window hole. And the mask frame has a rectangular window hole, and both ends of the abutting inclined surface are separated from the corners of the window hole. An exposure apparatus comprising a frame-shaped mask frame that holds the mask by adsorbing the peripheral portion of the mask, and the contact slope relates to a mask frame formed so as to gradually increase from both ends of the window hole toward the center. In this regard, the present invention relates to an exposure apparatus in which a contact slope of the mask frame that is in close contact with a mask peripheral portion is formed by a cubic curve, and the contact slope relates to an exposure apparatus having at least two different curvatures, and the mask frame. Has a rectangular window hole, the curvature of the contact slope formed on the opposite sides of the window hole is the same, and the mask frame has a rectangular window hole, Both ends of the contact slope are related to an exposure apparatus located at a position away from the corner of the window hole, and the contact slope is formed so as to gradually increase from both ends of the window hole toward the center. It concerns the device.
[0018]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
[0019]
In FIGS. 1 and 2, reference numeral 6 denotes a frame having a rectangular window hole 11 for exposure. In addition, in the figure, the same code | symbol is attached | subjected to the thing equivalent to what was shown in FIGS.
[0020]
A contact slope 8a is formed along each short side 12a constituting the rectangular shape 12 of the window hole 11, a contact slope 8b is formed along each long side 12b, and the contact slope 8a, the contact The slope 8b is a cubic curved surface such as a spherical surface.
[0021]
The contact slope 8a gradually increases in width from a position spaced from the vertex of the rectangular shape 12 toward the center of the required amount, reaches a maximum at the center, and ends at a position spaced from the corresponding vertex toward the center by the required amount. The bow shape gradually decreases.
[0022]
Similarly, the contact slope 8b gradually increases in width from a position away from the vertex of the rectangular shape 12 toward the center of the required amount, reaches a maximum at the center, and is spaced away from the corresponding vertex by the required amount toward the center. A bow shape that gradually decreases until the end. Thus, the contact slope 8 is not formed around the corner of the rectangular shape 12, and the lower surface (corner peripheral surface 6a) of the frame 6 is widened.
[0023]
A groove 3 is engraved in a similar shape concentrically with the rectangular shape 12, and the groove 3 is formed across the contact slope 8a, the contact slope 8b, and the corner peripheral surface 6a.
[0024]
The groove 3 is connected to a vacuum exhaust device (not shown).
[0025]
Hereinafter, the operation will be described.
[0026]
When the mask 1 is held on the frame 6 by vacuum suction, the peripheral short side portion of the mask 1 is in close contact with the contact slope 8a, and the peripheral long side portion of the mask 1 is in close contact with the contact slope 8b. When the peripheral part of the mask 1 is brought into close contact with the contact slope 8a and the contact slope 8b, the peripheral part of the mask 1 is given a displacement (inclination) that raises the central part.
[0027]
Since both ends of the contact slope 8 a and the contact slope 8 b are positioned before the apex of the rectangular shape 12, the corner of the mask 1 is in close contact with the peripheral surface 6 a of the corner by the groove 3. Thus, the displacement (inclination) of the mask 1 at the corner peripheral surface 6a is 0, and the displacement of the mask 1 given by the contact slope 8a and the contact slope 8b is from the state of displacement 0, respectively. Since it begins, excessive distortion does not occur at the corners of the mask 1. Further, the peripheral portion of the mask 1 is displaced by the contact slope 8a and the contact slope 8b, so that the corner portion of the mask 1 is lifted from the corner peripheral surface 6a. By causing the corners of the mask 1 to be in close contact with the corner peripheral surface 6a, an action of correcting the bending due to the weight of the mask 1 occurs.
[0028]
FIG. 3 shows a state in which the deflection due to the weight of the mask 1 is corrected according to the present invention.
[0029]
By correcting the deflection from the periphery of the mask 1, the vertical deflection of the mask 1 is a minute displacement.
[0030]
About the amount of inclination (curvature) of the contact slope 8a and the contact slope 8b, an optimum value is obtained by calculation, experiment, etc., depending on the size of the mask 1.
[0031]
The curvatures of the contact slope 8a and the contact slope 8b may be different, the contact slope 8a and the contact slope 8b may be the same curvature, and the centers of curvature may be different, or the same curvature and the same curvature. It may be the center. Further, the cubic curved surface may be a part of the curved surface of the sphere or a part of the curved surface of the elliptic sphere.
[0032]
【The invention's effect】
As described above, according to the present invention, in the frame-shaped mask frame that holds the mask by adsorbing the peripheral portion of the mask, and the mask frame that is in close contact with the peripheral portion of the mask in the exposure apparatus having the mask frame. The abutting slope is formed with a cubic curved surface, and the abutting slope is formed so as to gradually increase from both ends toward the center, so there is no portion where excessive distortion occurs over the entire circumference of the mask, This makes it possible to correct the deflection of the mask without unreasonableness, and exhibits an excellent effect of improving the exposure performance.
[Brief description of the drawings]
FIG. 1 is a plan view showing an embodiment of the present invention.
FIG. 2 is a front sectional view showing the embodiment of the present invention.
FIG. 3 is an explanatory view showing an operation of the embodiment of the present invention.
FIG. 4 is a plan view showing a substrate holding part and a mask holding part of the exposure apparatus.
FIG. 5 is a front sectional view showing a state where a mask is held.
6 is an AA arrow view of FIG. 4;
FIG. 7 is a cross-sectional view showing a conventional mask holding unit.
FIG. 8 is an explanatory diagram of a corner portion of a conventional mask frame.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Mask 2 Mask frame 3 Groove 4 Substrate stage 5 Substrate 8a Contact slope 8b Contact slope 11 Window hole

Claims (6)

マスク周辺部を吸着して該マスクを保持する枠状のマスクフレームに於いて、マスクフレームは矩形形状の窓孔を有し、該窓孔の各辺に沿って前記マスク周辺部に密着する当接斜面が形成され、該当接斜面は前記窓孔の矩形形状の各辺の両端から所定量離反した位置から幅が漸次増大し、辺の中央で幅が最大となる様に弓形状に形成され、マスク中央部を盛上げる様な変位を前記マスク周辺部に付与する3次曲面であることを特徴とするマスクフレーム。In a frame-shaped mask frame for holding the mask by adsorbing mask peripheral portion, the mask frame has a window opening of a rectangular shape, on the mask periphery along each side of the window hole abutment slope close contact is formed, the abutting slope increases the width from the position away a predetermined amount from both ends of each side of the rectangular shape of the window hole is gradually, arcuate as the width at the center is the largest of the sides A mask frame, characterized in that it is a cubic surface that imparts a displacement to the mask peripheral part so as to raise the central part of the mask. 前記当接斜面は少なくとも2つの異なる曲率を有する請求項1のマスクフレーム。  The mask frame according to claim 1, wherein the contact slope has at least two different curvatures. 前記窓孔の相対する辺に形成される前記当接斜面の曲率は同一である請求項1のマスクフレーム。  The mask frame according to claim 1, wherein the curvature of the contact slope formed on opposite sides of the window hole is the same. マスク周辺部を吸着して該マスクを保持する枠状のマスクフレームを具備する露光装置に於いて、前記マスクフレームは矩形形状の窓孔を有し、該窓孔の各辺に沿って前記マスク周辺部に密着する当接斜面が形成され、該当接斜面は前記窓孔の矩形形状の各辺の両端から所定量離反した位置から漸次増大し、辺の中央で幅が最大となる様に弓形状に形成され、マスク中央部を盛上げる様な変位を前記マスク周辺部に付与する3次曲面であることを特徴とする露光装置。The mask peripheral portion adsorbed at the exposure apparatus comprising a frame-shaped mask frame for holding the mask, said mask frame has a window opening of a rectangular shape, along each side of the window hole abutting slope is formed in close contact with the mask periphery, the abutment slope gradually increases from a position a predetermined amount away from both ends of each side of the rectangular shape of the window opening, like the width at the center of the side is maximum An exposure apparatus, wherein the exposure apparatus is a cubic curved surface that is formed in a bow shape and imparts a displacement to the mask peripheral portion so as to raise the central portion of the mask . 前記当接斜面は少なくとも2つの異なる曲率を有する請求項4の露光装置。  The exposure apparatus according to claim 4, wherein the contact slope has at least two different curvatures. 前記窓孔の相対する辺に形成される前記当接斜面の曲率は同一である請求項4の露光装置。  The exposure apparatus according to claim 4, wherein the curvature of the contact slope formed on opposite sides of the window hole is the same.
JP2002359758A 2002-12-11 2002-12-11 Mask frame and exposure apparatus Expired - Fee Related JP4267906B2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100671658B1 (en) 2005-01-05 2007-01-19 삼성에스디아이 주식회사 Mask frame and method for fixing a mask on the mask frame
WO2007066596A1 (en) * 2005-12-09 2007-06-14 Sharp Kabushiki Kaisha Exposure method and exposure device
JP6150043B2 (en) * 2012-03-29 2017-06-21 株式会社ブイ・テクノロジー Exposure equipment
KR101663759B1 (en) * 2016-05-11 2016-10-10 주식회사 티엠씨 adapter unit for align photo mask

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