JP4261943B2 - Electronic component manufacturing method and electronic component - Google Patents

Electronic component manufacturing method and electronic component Download PDF

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Publication number
JP4261943B2
JP4261943B2 JP2003058091A JP2003058091A JP4261943B2 JP 4261943 B2 JP4261943 B2 JP 4261943B2 JP 2003058091 A JP2003058091 A JP 2003058091A JP 2003058091 A JP2003058091 A JP 2003058091A JP 4261943 B2 JP4261943 B2 JP 4261943B2
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Japan
Prior art keywords
columnar conductor
electronic component
insulating layer
columnar
wiring patterns
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JP2003058091A
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JP2004273495A (en
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真史 後藤
薫 川崎
洋 山本
睦子 中野
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TDK Corp
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TDK Corp
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Description

【0001】
【発明の属する技術分野】
本発明は、電子部品の製造方法および、電子部品に係り、特に積層対象となる層間の電気的接合に柱状導体を用いるようにした電子部品の製造方法および、電子部品に関する。
【0002】
【従来の技術】
従来、複数の配線パターンを積み重ねるとともに、これら積み重ねられた配線パターンの間に層間接続部を設け、複雑な配線機能を達成するようにした多層配線構造が知られている。
【0003】
そして同構造を形成するための製造方法が種々提案・開示されている。図7は、従来における一般的な層間接続部を示した断面説明図である。
【0004】
同図においては、下層側1に絶縁層2が形成されている。そして当該絶縁層2には層間接続部となる第1柱状導体3が前記絶縁層2を貫通するように設けられている。そしてこのように形成された下層側1の上面には、配線パターン4が形成され、前記第1柱状導体3との電気的導通を図るようにしている。
【0005】
ところで同図においては、下層側1と上層側5との接続を行う目的から、下層側1に設けられた第1柱状導体3の上方に配線パターン4を介して、第2柱状導体6が形成されている。そしてこの第2柱状導体6は、通常、第1柱状導体3の天井部分を覆うようレジスト等を塗布し、又はドライフィルム等を貼り付け、フォトエッチングによるマスク形成と、このマスクを用いたメッキの析出等により形成される。
【0006】
なおこのようなレジストを用い柱状導体となるポストを形成する詳細として、ドライフィルムレジストをラミネートした後、露光現像によってポスト形成用の開口部を形成する。そして開口部形成後は、当該開口部内に電解銅めっきによりポストを形成する方法が知られている(例えば、特許文献1参照。)。
【0007】
また柱状導体の頭部上を覆うレジストパターンに覆われていない樹脂層をジェットスクラブ処理(いわゆるブラスト処理)によって除去し、前記柱状導体の頭部を露出させるものも知られている(例えば、特許文献2参照。)。
【0008】
【特許文献1】
特開平10−75063号公報([0024])
【0009】
【特許文献2】
特開平10−22636号公報([0012])
【0010】
【発明が解決しようとする課題】
ところで上述した従来の技術では下記に示すような問題点があった。
【0011】
すなわち図7に示すように第1柱状導体3と第2柱状導体6とを重ね合わせる方式では、マスクの取り付け誤差やマスク自体の変形(温度湿度での膨張、収縮)、あるいは基板自体の変形などの要因によってマスクの位置精度が低下すると、第1柱状導体3と第2柱状導体6との相対位置ずれが発生し、その結果、図8に示すように第2柱状導体6に変形が生じ、抵抗値の増大や柱状導体を介した放熱特性が悪化するというおそれがあった。
【0012】
そして層間接続部となる柱状導体は、電子部品に対する小型化の要請から、その直径も縮小しており、マスクの位置精度に起因する上記課題は一層顕著になっていた。
【0013】
ここでマスクの位置精度を向上させることで上記課題を解決しようとすると、取り付け精度の管理などが厳格になり管理コストの高騰などといった新たな問題が発生する。
【0014】
また図9に示すように、第3柱状導体7の頭部上を覆うレジストパターン8に覆われていない樹脂層9をジェットスクラブ処理によって除去する場合、前記レジストパターン8に位置ずれが生じると、前記ジェットスクラブが第3柱状導体7の周囲の樹脂層9にかかり、当該樹脂層9が掘られ、図中、クロスハッチング部に示すような空隙10が生じるおそれがあった。このような課題をマスクの位置精度の向上で解決しようとすると、上記と同様、マスクの取り付け精度の管理などが厳格になり管理コストの高騰などといった新たな問題が発生する。
【0015】
本発明は、上記従来の問題点に着目し、従来のマスクの精度を厳格にすることなく、層間接続をなす柱状導体の接続信頼性を向上させる方法および、同方法を用いた電子部品を提供することを目的とする。
【0016】
【課題を解決するための手段】
本発明は、柱状導体を少なくとも絶縁層内を貫通する首下部と、この首下部の断面積を越えるだけの面積を備え上層側との配線接続をなす接続用頭部とで構成すれば、マスクの誤差を前記首下部より拡径された接続用頭部にて吸収することができるという知見に基づいてなされたものである。
【0017】
すなわち本発明に係る電子部品の製造方法は、複数の配線パターンと、これら配線パターンの間に介在する絶縁層とを備えるとともに、前記絶縁層を貫通する柱状導体にて前記配線パターン間の電気的接続を行う電子部品の製造方法であって、前記柱状導体の設定高さを越えるよう前記柱状導体を形成した後、上方より前記柱状導体を研磨することで前記柱状導体の高さを前記設定高さに揃えるとともに、前記柱状導体の首下部断面積を越えるだけの接続用頭部を形成し、この拡径された接続用頭部に上層側を接続する手順とした。
【0018】
また他の電子部品の製造方法としては、複数の配線パターンと、これら配線パターンの間に介在する絶縁層とを備えるとともに、前記絶縁層を貫通する柱状導体にて前記配線パターン間の電気的接続を行う電子部品の製造方法であって、前記柱状導体の設定高さを越えるよう前記柱状導体を形成し、上方より前記柱状導体を研磨することで前記柱状導体の高さを前記設定高さに揃えるとともに、前記柱状導体の首下部断面積を越えるだけの接続用頭部を形成した後、前記柱状導体が埋まるよう前記絶縁層を形成し、拡径された前記接続用頭部に重なる前記絶縁層領域に開口を形成することで前記接続用頭部を露出させ、上層側を接続する手順とした。
【0019】
そして本発明に係る電子部品は、配線パターンとこの配線パターンを覆う絶縁層とを少なくとも厚み方向に複数配置した電子部品であって、前記絶縁層を挟んで位置する配線パターン間を、その内部が密に形成された柱状導体で接続するとともに、この柱状導体に少なくとも首下部断面積を超えるだけの接続用頭部を設け、この拡径された接続用頭部に上層側を接続するよう構成した。
【0020】
上記構成によれば、まずあらかじめ設定した柱状導体の高さを超えるように、前記柱状導体を形成する。その後、この柱状導体の上方から当該柱状導体に研磨を施せば、柱状導体の全高は、あらかじめ設定した柱状導体の高さに倣うとともに、研磨が施された柱状導体の頭部は、その径が拡大する。なおこの接続用頭部は研磨により形成されることから、上方より見るとその面積内に首下部の面積が含まれるような位置関係となる(すなわち接続用頭部の投影面積内に首下部の投影面積が含まれる)。
【0021】
このように柱状導体の頭部に拡径した接続用頭部を形成すれば、上層に位置する配線パターンや柱状導体は、拡径された前記接続用頭部に対して、接続がなされるのでマスク等の位置ずれに対し、接続信頼性を確保することができる。
【0022】
また上記作用に加え、柱状導体を形成した後、絶縁層にて前記柱状導体を埋め、その後、接続用頭部の上方に位置する前記絶縁層を除去し、上層側との接続をなす開口を前記絶縁層に形成する場合でも、柱状導体における接続用頭部の径が大きく設定されているので、上記と同様、開口部の形成位置に対する制約が緩和され、上層に位置する配線パターンや柱状導体は、開口部から露出する前記接続用頭部に対して、接続がなされるので接続信頼性を確保することができる。
【0023】
【発明の実施の形態】
以下に本発明に係る電子部品の製造方法および、電子部品について好適な具体的実施の形態を図面を参照して詳細に説明する。
【0024】
図1は、本実施の形態に係る製造方法を用いた電子部品の断面拡大図である。
【0025】
同図に示すように、本実施の形態に係る電子部品の製造方法を用いて製造された電子部品20では、厚み方向に複数の層が形成され、(層間接続部となる)複数の柱状導体22A、22Bがこれら層間を接続するよう重ねられている(本実施の形態では2段ないし3段)。そしてこれら柱状導体22A、22B、22Cの周囲には絶縁層24が介在しており、柱状導体22A、22B、22Cや配線パターン26周囲の絶縁作用をなすようにしている。
【0026】
ところで前記柱状導体22A、22B、22Cには、上層側との接続をなすための接続用頭部28A、28B、28C(図示せず)と、当該接続用頭部28A、28B、28Cの下方に位置する首下部30A、30B、30Cとで構成されている。なお上述したこれら柱状導体22A、22B、22Cは、位置が異なるだけであり、その形状は同一であることから、柱状導体22Aをもとにして形状説明を行うこととする。
【0027】
柱状導体22Aは、上述したように接続用頭部28Aと、この接続用頭部28Aの直下に位置する首下部30Aとで構成されている。ここで前記接続用頭部28Aは、前記首下部30Aの断面積を超えるよう径が拡大されているとともに、前記接続用頭部28Aの投影面内に、前記首下部30Aの投影面が含まれるような位置関係となっている。また接続用頭部28Aの面積は、少なくとも首下部30Aを越えるとともに、接続対象となる上層側の柱状導体の形成位置の精度に応じて適宜設定すればよい。
【0028】
このように構成された電子部品20の製造方法について以下に説明を行う。
【0029】
本実施に係る製造方法を適用して上述した柱状導体を形成するためには、まず図2(1)に示すように、配線パターン32の上方にドライフィルム34を貼り合わせ、その後フォトエッチングを施すことで、前記ドライフィルム34の表面に開口36を形成する。なおドライフィルム34の厚み(図中、A寸法)は、あらかじめ設定した柱状導体の高さよりも低く設定する。
【0030】
そして同図(2)に示すように前記配線パターン32を電極として開口36内にメッキ(図中、ハッチング部)を析出させ、その後、同図(3)に示すように、ドライフィルム34の上側表面から盛り上がるように、前記メッキを自然成長させる。なおドライフィルム34の上側表面から盛り上がるメッキの高さ(図中、B寸法)は、あらかじめ設定された柱状導体の高さを超えるまで成長させる。
【0031】
このようにあらかじめ設定された柱状導体の高さまでメッキを成長させ柱状導体38を形成した後は、図3(1)に示すように、研磨手段となる砥石40を柱状導体38の上端部に接触させ、前記柱状導体38の高さをあらかじめ設定した高さ(図中、C寸法)に揃えるようにする。また前記砥石40を柱状導体38の上端部に接触させ研磨を施すと、柱状導体38の上端部の一部がドライフィルム34上のメッキ周縁部へと移動し、メッキ周縁部の外方にオーバーハング部42を形成する。柱状導体38に対し研磨が終了した状態を同図(2)に示す。
【0032】
そして上記工程によって研磨が終了した後は、同図(3)に示すようにドライフィルム34を除去すれば、接続用頭部44と首下部46とを備えた柱状導体38を形成することができる。
【0033】
このような手順を経て形成された柱状導体38の効果を以下に示す。
【0034】
図4は、絶縁層にて覆われた柱状導体の上部に開口を形成する工程を示した断面説明図である。同図(1)に示すように、柱状導体38を絶縁層48で埋めた後、開口50の形成領域を除いた箇所にマスク52を形成する。そしてマスク52形成後は、その上方よりジェットスクラブ処理を施し、接続用頭部44の上方に位置する絶縁層48の除去を行う。ここで柱状導体38には、拡径された接続用頭部44が形成されているので、例えばマスクの形成誤差によって同図(2)に示すように、左側に開口50がオフセットしても、当該開口50の領域が絶縁層48に重なることがなく、前記開口50の底部には、確実に接続用頭部44を露出させることができるのである。また同図(3)に示すようにマスクの形成誤差によって開口50が拡大しても、同図(2)と同様、前記開口50の底部に接続用頭部44を露出させることができる。
【0035】
なお上述した本実施の形態では、メッキをドライフィルム表面から自然成長させることで接続用頭部と首下部とを備えた柱状導体を形成することとしたが、この形態に限定されることもなく、例えば、ドライフィルムを2層重ね合わせるようにして接続用頭部と首下部とを形成するような以下の方法を用いても、本発明に係る柱状導体を形成することが可能である。
【0036】
本実施の形態に係る他の製造方法を適用して柱状導体を形成するには、まず図5(1)に示すようにすでに形成された配線パターン54の上層に、第1および第2ドライフィルム56、58を貼り合わせるとともに、その後、フォトエッチング処理を施すことにより、前記第1および第2ドライフィルム56、58に柱状導体における首下部断面形状に相当する下穴60を形成する。なお前記第1および第2ドライフィルム56、58の厚みは以下のように設定すればよい。すなわち第1ドライフィルム56の厚み(図中、寸法D)は、少なくとも形成対象となる柱状導体の高さよりも低く設定され、そして前記第2ドライフィルム58の厚みは、第1および第2ドライフィルム56、58を重ねた際(図中、寸法E)、前記柱状導体の高さを越えるだけの寸法になるよう設定する。なお本形態の形態を実施する場合、例えば、第1ドライフィルム56の材質を溶剤系の剥離液により剥離が可能であるような材質とするとともに、第2ドライフィルム58の材質をアルカリ系の剥離液にて剥離できる材質として、選択的に剥離ができるようにすることが好ましい。このように第1および第2ドライフィルム56、58の材質を異ならせ、同一の剥離液で剥離できないようにすれば、これらドライフィルムの境界を明確にすることが可能になる。また本実施の形態では、第1および第2ドライフィルム56、58を用いることとしたが、この形態に限定されることもなく、例えば前記第1および第2ドライフィルム56、58に代えて、同一の剥離液で剥離できないような異なるレジストを適用してもよい。
【0037】
その後、同図(2)に示すように配線パターン54を電極として、下穴60にメッキを析出し第2ドライフィルム58の上端付近まで金属を充填させ柱状導体62を形成させた後は、同図(3)に示すように第2ドライフィルム58を除去し、柱状導体62の上端部を露出させる。
【0038】
このように第2ドライフィルム58の除去により、柱状導体62の上端部を露出した後は、図6(1)に示すように、研磨手段となる砥石64を柱状導体62の上端部に接触させ、前記柱状導体62の高さをあらかじめ設定した高さ(図中、C寸法)に揃えるようにする。また前記砥石64を柱状導体62の上端部に接触させ研磨を施すと、柱状導体62の上端部の一部が第1ドライフィルム56の上面側へと移動し、オーバーハング部66を形成する。柱状導体62に対し研磨が終了した状態を同図(2)に示す。
【0039】
そして柱状導体62に対し研磨が終了した後は、同図(3)に示すように第1ドライフィルム56を除去すれば、接続用頭部68と首下部70とを備えた柱状導体40を形成することができる。
【0040】
【発明の効果】
以上説明したように本発明によれば、複数の配線パターンと、これら配線パターンの間に介在する絶縁層とを備えるとともに、前記絶縁層を貫通する柱状導体にて前記配線パターン間の電気的接続を行う電子部品の製造方法であって、前記柱状導体の設定高さを越えるよう前記柱状導体を形成した後、上方より前記柱状導体を研磨することで前記柱状導体の高さを前記設定高さに揃えるとともに、前記柱状導体の首下部断面積を越えるだけの接続用頭部を形成し、この拡径された接続用頭部に上層側を接続するようにしたので、従来のマスクの精度を厳格にすることなく、層間接続をなす柱状導体の接続信頼性を向上させることが可能になる。
【図面の簡単な説明】
【図1】本実施の形態に係る製造方法を用いた電子部品の断面拡大図である。
【図2】本実施の形態に係る柱状導体を形成する方法を示す断面説明図である。
【図3】本実施の形態に係る柱状導体を形成する方法を示す断面説明図である。
【図4】絶縁層にて覆われた柱状導体の上部に開口を形成する工程を示した断面説明図である。
【図5】本実施の形態に係る柱状導体を形成する他の方法を示す断面説明図である。
【図6】本実施の形態に係る柱状導体を形成する他の方法を示す断面説明図である。
【図7】従来における一般的な層間接続部を示した断面説明図である。
【図8】第1柱状導体と第2柱状導体との相対位置ずれが発生した状態を示す断面説明図である。
【図9】レジストパターンに覆われていない樹脂層をジェットスクラブ処理によって除去する状態を示す断面説明図である。
【符号の説明】
1………下層側
2………絶縁層
3………第1柱状導体
4………配線パターン
5………上層側
6………第2柱状導体
7………第3柱状導体
8………レジストパターン
9………樹脂層
10………空隙
20………電子部品
22A、22B、22C………柱状導体
24………絶縁層
26………配線パターン
28A、28B、28C………接続用頭部
30A、30B、30C………首下部
32………配線パターン
34………ドライフィルム
36………開口
38………柱状導体
40………砥石
42………オーバーハング部
44………接続用頭部
46………首下部
48………絶縁層
50………開口
52………マスク
54………配線パターン
56………第1ドライフィルム
58………第2ドライフィルム
60………下穴
62………柱状導体
64………砥石
66………オーバーハング部
68………接続用頭部
70………首下部
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an electronic component manufacturing method and an electronic component, and more particularly, to an electronic component manufacturing method and an electronic component in which columnar conductors are used for electrical connection between layers to be laminated.
[0002]
[Prior art]
2. Description of the Related Art Conventionally, a multilayer wiring structure is known in which a plurality of wiring patterns are stacked and an interlayer connection portion is provided between the stacked wiring patterns to achieve a complicated wiring function.
[0003]
Various manufacturing methods for forming the structure have been proposed and disclosed. FIG. 7 is a cross-sectional explanatory view showing a conventional general interlayer connection.
[0004]
In the figure, an insulating layer 2 is formed on the lower layer side 1. The insulating layer 2 is provided with a first columnar conductor 3 serving as an interlayer connection portion so as to penetrate the insulating layer 2. A wiring pattern 4 is formed on the upper surface of the lower layer side 1 thus formed so as to achieve electrical continuity with the first columnar conductor 3.
[0005]
In the figure, for the purpose of connecting the lower layer side 1 and the upper layer side 5, a second columnar conductor 6 is formed above the first columnar conductor 3 provided on the lower layer side 1 via the wiring pattern 4. Has been. The second columnar conductor 6 is usually coated with a resist or the like so as to cover the ceiling portion of the first columnar conductor 3, or a dry film or the like is applied thereto, and a mask is formed by photoetching and plating using this mask is performed. It is formed by precipitation or the like.
[0006]
As details of forming a post that becomes a columnar conductor using such a resist, a dry film resist is laminated, and then an opening for forming a post is formed by exposure and development. And after opening part formation, the method of forming a post by electrolytic copper plating in the said opening part is known (for example, refer patent document 1).
[0007]
Also known is a method in which a resin layer not covered with a resist pattern covering the top of the columnar conductor is removed by jet scrubbing (so-called blasting) to expose the head of the columnar conductor (for example, a patent). Reference 2).
[0008]
[Patent Document 1]
Japanese Patent Laid-Open No. 10-75063 ([0024])
[0009]
[Patent Document 2]
JP-A-10-22636 ([0012])
[0010]
[Problems to be solved by the invention]
Incidentally, the above-described conventional technique has the following problems.
[0011]
That is, as shown in FIG. 7, in the method in which the first columnar conductor 3 and the second columnar conductor 6 are overlapped, mask attachment error, mask deformation (expansion and contraction due to temperature and humidity), or substrate deformation, etc. When the mask position accuracy is reduced due to the above factors, the relative displacement between the first columnar conductor 3 and the second columnar conductor 6 occurs, and as a result, the second columnar conductor 6 is deformed as shown in FIG. There was a possibility that the increase in the resistance value and the heat dissipation characteristics via the columnar conductors were deteriorated.
[0012]
The diameter of the columnar conductor serving as the interlayer connection portion has also been reduced due to a demand for miniaturization of the electronic component, and the above-described problem due to the mask position accuracy has become more prominent.
[0013]
Here, if it is going to solve the said subject by improving the positional accuracy of a mask, management of attachment accuracy etc. will become severe, and new problems, such as a rise in management cost, will generate | occur | produce.
[0014]
As shown in FIG. 9, when the resin layer 9 that is not covered with the resist pattern 8 that covers the top of the third columnar conductor 7 is removed by jet scrubbing, if the resist pattern 8 is misaligned, The jet scrub is applied to the resin layer 9 around the third columnar conductor 7, and the resin layer 9 is dug, and there is a possibility that a gap 10 as shown in the cross-hatched portion in the figure is generated. When trying to solve such a problem by improving the positional accuracy of the mask, as described above, management of the mask mounting accuracy becomes strict and new problems such as an increase in management cost occur.
[0015]
The present invention pays attention to the above-mentioned conventional problems, and provides a method for improving the connection reliability of columnar conductors for interlayer connection without making the accuracy of conventional masks strict, and an electronic component using the method The purpose is to do.
[0016]
[Means for Solving the Problems]
The present invention provides a mask if the columnar conductor is composed of at least a lower neck portion penetrating through the insulating layer and a connection head portion having an area exceeding the cross-sectional area of the lower neck portion and making a wiring connection with the upper layer side. This is based on the knowledge that the error can be absorbed by the connecting head whose diameter is expanded from the lower neck.
[0017]
That is, the electronic component manufacturing method according to the present invention includes a plurality of wiring patterns and an insulating layer interposed between the wiring patterns, and an electrical connection between the wiring patterns by a columnar conductor penetrating the insulating layer. A method of manufacturing an electronic component to be connected, wherein after forming the columnar conductor to exceed a set height of the columnar conductor, the columnar conductor is polished from above so that the height of the columnar conductor is set to the set height. In addition, the connecting head is formed so as to exceed the cross-sectional area of the neck lower portion of the columnar conductor, and the upper layer side is connected to the enlarged connecting head.
[0018]
As another method of manufacturing an electronic component, a plurality of wiring patterns and an insulating layer interposed between the wiring patterns are provided, and electrical connection between the wiring patterns is performed by a columnar conductor penetrating the insulating layer. The columnar conductor is formed so as to exceed the set height of the columnar conductor, and the columnar conductor is polished from above to reduce the height of the columnar conductor to the set height. And forming an insulating layer so as to fill the columnar conductor, and overlapping the connection head that has been expanded in diameter. By forming an opening in the layer region, the connecting head was exposed and the upper layer side was connected.
[0019]
The electronic component according to the present invention is an electronic component in which a plurality of wiring patterns and insulating layers covering the wiring patterns are arranged at least in the thickness direction, and the interior of the wiring pattern located between the insulating layers is between The connection is made with densely formed columnar conductors, and a connection head is provided on the columnar conductor so as to exceed at least the neck lower cross-sectional area, and the upper layer side is connected to the expanded connection head. .
[0020]
According to the said structure, the said columnar conductor is first formed so that the height of the columnar conductor set beforehand may be exceeded. Thereafter, if the columnar conductor is polished from above the columnar conductor, the total height of the columnar conductor follows the preset columnar conductor height, and the diameter of the head of the polished columnar conductor is Expanding. Since the connecting head is formed by polishing, when viewed from above, the area is such that the area of the lower neck is included in the area (that is, the lower part of the neck is within the projected area of the connecting head). Projection area included).
[0021]
In this way, if the connection head having an enlarged diameter is formed on the head of the columnar conductor, the wiring pattern and the columnar conductor located in the upper layer are connected to the connection head having an enlarged diameter. Connection reliability can be ensured against displacement of the mask or the like.
[0022]
In addition to the above action, after forming the columnar conductor, the columnar conductor is filled with an insulating layer, and then the insulating layer located above the connection head is removed to provide an opening for connection with the upper layer side. Even in the case where the insulating layer is formed, since the diameter of the connecting head in the columnar conductor is set to be large, the restriction on the position where the opening is formed is eased as described above, and the wiring pattern and columnar conductor located in the upper layer are relaxed. Since the connection is made to the connection head exposed from the opening, connection reliability can be ensured.
[0023]
DETAILED DESCRIPTION OF THE INVENTION
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of a method for manufacturing an electronic component and an electronic component according to the present invention will be described in detail with reference to the drawings.
[0024]
FIG. 1 is an enlarged cross-sectional view of an electronic component using the manufacturing method according to the present embodiment.
[0025]
As shown in the figure, in electronic component 20 manufactured using the method for manufacturing an electronic component according to the present embodiment, a plurality of layers are formed in the thickness direction, and a plurality of columnar conductors (to serve as interlayer connection portions). 22A and 22B are stacked so as to connect these layers (in the present embodiment, two to three stages). An insulating layer 24 is interposed around the columnar conductors 22A, 22B, and 22C so as to provide an insulating action around the columnar conductors 22A, 22B, and 22C and the wiring pattern 26.
[0026]
By the way, the columnar conductors 22A, 22B, and 22C have connection heads 28A, 28B, and 28C (not shown) for connection to the upper layer side, and below the connection heads 28A, 28B, and 28C. It is comprised by the neck lower part 30A, 30B, 30C which is located. Note that the columnar conductors 22A, 22B, and 22C described above are only different in position and have the same shape. Therefore, the shape will be described based on the columnar conductor 22A.
[0027]
As described above, the columnar conductor 22A includes the connection head portion 28A and the neck lower portion 30A located immediately below the connection head portion 28A. Here, the diameter of the connection head 28A is enlarged so as to exceed the cross-sectional area of the neck lower portion 30A, and the projection surface of the neck lower portion 30A is included in the projection surface of the connection head 28A. The positional relationship is as follows. Further, the area of the connecting head 28A may be set as appropriate according to the accuracy of the formation position of the columnar conductor on the upper layer side to be connected while at least exceeding the neck lower portion 30A.
[0028]
A method for manufacturing the electronic component 20 configured as described above will be described below.
[0029]
In order to apply the manufacturing method according to this embodiment to form the above-described columnar conductor, first, as shown in FIG. 2A, a dry film 34 is bonded to the upper side of the wiring pattern 32, and then photoetching is performed. Thus, an opening 36 is formed on the surface of the dry film 34. In addition, the thickness (A dimension in the figure) of the dry film 34 is set lower than the height of the columnar conductor set in advance.
[0030]
Then, as shown in FIG. 2 (2), plating (hatched portion in the figure) is deposited in the opening 36 using the wiring pattern 32 as an electrode, and then the upper side of the dry film 34 is shown in FIG. 3 (3). The plating is naturally grown so as to rise from the surface. The height of the plating that rises from the upper surface of the dry film 34 (B dimension in the figure) is grown until it exceeds the height of the columnar conductor set in advance.
[0031]
After the plating is grown to the height of the columnar conductor set in advance as described above and the columnar conductor 38 is formed, as shown in FIG. 3 (1), the grindstone 40 serving as a polishing means is brought into contact with the upper end portion of the columnar conductor 38. Thus, the height of the columnar conductor 38 is set to a preset height (C dimension in the figure). Further, when the grinding stone 40 is brought into contact with the upper end portion of the columnar conductor 38 and polishing is performed, a part of the upper end portion of the columnar conductor 38 moves to the plating peripheral portion on the dry film 34 and overlies outside the plating peripheral portion. The hang part 42 is formed. FIG. 2B shows a state in which the columnar conductor 38 has been polished.
[0032]
After the polishing is completed by the above process, the columnar conductor 38 having the connection head portion 44 and the neck lower portion 46 can be formed by removing the dry film 34 as shown in FIG. .
[0033]
The effect of the columnar conductor 38 formed through such a procedure will be described below.
[0034]
FIG. 4 is a cross-sectional explanatory view showing a step of forming an opening in the upper part of the columnar conductor covered with the insulating layer. As shown in FIG. 1A, after the columnar conductors 38 are filled with an insulating layer 48, a mask 52 is formed at a location excluding the formation region of the openings 50. After the mask 52 is formed, a jet scrub process is performed from above, and the insulating layer 48 located above the connection head 44 is removed. Here, the columnar conductor 38 is formed with a connection head 44 having an enlarged diameter. Therefore, even if the opening 50 is offset to the left side as shown in FIG. The region of the opening 50 does not overlap the insulating layer 48, and the connection head 44 can be reliably exposed at the bottom of the opening 50. Further, even if the opening 50 is enlarged due to a mask formation error as shown in FIG. 3C, the connection head 44 can be exposed at the bottom of the opening 50 as in FIG.
[0035]
In the above-described embodiment, the columnar conductor having the connection head and the neck lower part is formed by spontaneously growing the plating from the dry film surface. However, the present invention is not limited to this form. For example, it is possible to form the columnar conductor according to the present invention by using the following method in which the connecting head and the neck lower part are formed by superposing two layers of dry films.
[0036]
In order to form a columnar conductor by applying another manufacturing method according to the present embodiment, first, as shown in FIG. 5 (1), first and second dry films are formed on the already formed wiring pattern 54. 56 and 58 are bonded together, and then a photoetching process is performed to form a pilot hole 60 corresponding to the cross-sectional shape of the neck lower part of the columnar conductor in the first and second dry films 56 and 58. The thicknesses of the first and second dry films 56 and 58 may be set as follows. That is, the thickness (dimension D in the drawing) of the first dry film 56 is set at least lower than the height of the columnar conductor to be formed, and the thickness of the second dry film 58 is the first and second dry films. When 56 and 58 are stacked (dimension E in the figure), the dimension is set so as to exceed the height of the columnar conductor. In the case of carrying out this embodiment, for example, the first dry film 56 is made of a material that can be peeled off by a solvent-based stripping solution, and the second dry film 58 is made of an alkali-based peel. It is preferable that the material that can be peeled with the liquid can be peeled selectively. Thus, if the materials of the first and second dry films 56 and 58 are made different so that they cannot be peeled off by the same stripping solution, the boundary between these dry films can be clarified. In the present embodiment, the first and second dry films 56 and 58 are used. However, the first and second dry films 56 and 58 are not limited thereto. For example, instead of the first and second dry films 56 and 58, Different resists that cannot be stripped with the same stripping solution may be applied.
[0037]
Thereafter, as shown in FIG. 2 (2), the wiring pattern 54 is used as an electrode, plating is deposited in the pilot hole 60, the metal is filled up to the vicinity of the upper end of the second dry film 58, and the columnar conductor 62 is formed. As shown in FIG. 3C, the second dry film 58 is removed, and the upper end portion of the columnar conductor 62 is exposed.
[0038]
After the upper end portion of the columnar conductor 62 is exposed by removing the second dry film 58 as described above, a grindstone 64 serving as a polishing means is brought into contact with the upper end portion of the columnar conductor 62 as shown in FIG. The height of the columnar conductors 62 is set to a predetermined height (C dimension in the figure). When the grinding stone 64 is brought into contact with the upper end portion of the columnar conductor 62 and polishing is performed, a part of the upper end portion of the columnar conductor 62 moves to the upper surface side of the first dry film 56 to form an overhang portion 66. FIG. 2B shows the state in which the columnar conductor 62 has been polished.
[0039]
After the columnar conductor 62 is polished, the columnar conductor 40 including the connection head 68 and the neck lower portion 70 is formed by removing the first dry film 56 as shown in FIG. can do.
[0040]
【The invention's effect】
As described above, according to the present invention, a plurality of wiring patterns and an insulating layer interposed between the wiring patterns are provided, and electrical connection between the wiring patterns is performed by a columnar conductor penetrating the insulating layer. A method of manufacturing an electronic component, comprising: forming the columnar conductor so as to exceed a set height of the columnar conductor, and then polishing the columnar conductor from above to set the height of the columnar conductor to the set height. And connecting the upper layer side to the enlarged diameter connecting head so as to exceed the cross-sectional area of the lower part of the neck of the columnar conductor. Without being strict, it is possible to improve the connection reliability of the columnar conductors that make the interlayer connection.
[Brief description of the drawings]
FIG. 1 is an enlarged cross-sectional view of an electronic component using a manufacturing method according to an embodiment.
FIG. 2 is an explanatory cross-sectional view showing a method of forming a columnar conductor according to the present embodiment.
FIG. 3 is an explanatory cross-sectional view showing a method of forming a columnar conductor according to the present embodiment.
FIG. 4 is an explanatory cross-sectional view showing a step of forming an opening in the upper part of a columnar conductor covered with an insulating layer.
FIG. 5 is an explanatory cross-sectional view showing another method of forming a columnar conductor according to the present embodiment.
FIG. 6 is an explanatory cross-sectional view showing another method for forming a columnar conductor according to the present embodiment.
FIG. 7 is an explanatory cross-sectional view showing a conventional general interlayer connection portion.
FIG. 8 is an explanatory cross-sectional view showing a state in which a relative displacement between the first columnar conductor and the second columnar conductor has occurred.
FIG. 9 is an explanatory cross-sectional view showing a state in which a resin layer not covered with a resist pattern is removed by a jet scrub process.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 ......... Lower layer side 2 ......... Insulating layer 3 ......... First columnar conductor 4 ......... Wiring pattern 5 ......... Upper layer side 6 ......... Second columnar conductor 7 ......... Third columnar conductor 8 ... …… Resist pattern 9 ……… Resin layer 10 ………… Void 20 ………… Electronic components 22A, 22B, 22C ……… Columnar conductor 24 ……… Insulating layer 26 ………… Wiring patterns 28A, 28B, 28C …… ... Connecting heads 30A, 30B, 30C ......... Lower neck 32 ......... Wiring pattern 34 ......... Dry film 36 ......... Opening 38 ......... Columnar conductor 40 ...... Whetstone 42 ......... Overhang 44 ......... Connecting head 46 ......... Lower neck 48 ......... Insulating layer 50 ......... Opening 52 ......... Mask 54 ......... Wiring pattern 56 ......... First dry film 58 ......... Second Dry film 60 ......... Preliminary hole 62 ......... Columnar conductor 64 ......... Whetstone 66 ...... overhang portion 68 ......... connection head 70 ......... neck lower

Claims (4)

複数の配線パターンと、これら配線パターンの間に介在する絶縁層とを備えるとともに、前記絶縁層を貫通する柱状導体にて前記配線パターン間の電気的接続を行う電子部品の製造方法であって、
前記柱状導体の設定高さを越えるよう前記柱状導体を形成し、
前記柱状導体を上方より回転砥石により研磨することで前記柱状導体の高さを前記設定高さに揃えるとともに、前記研磨をすることによって前記柱状導体の一部を移動させて前記柱状導体から側方に張り出すオーバーハング部を形成して前記柱状導体の首下部断面積を越えるだけの接続用頭部を形成し、
前記接続用頭部に上層側の電極を接続する、ことを特徴とする電子部品の製造方法。
A method of manufacturing an electronic component comprising a plurality of wiring patterns and an insulating layer interposed between the wiring patterns, and electrically connecting the wiring patterns with a columnar conductor penetrating the insulating layer,
Forming the columnar conductor to exceed the set height of the columnar conductor;
By polishing the columnar conductor from above with a rotating grindstone, the height of the columnar conductor is made equal to the set height, and by polishing, a part of the columnar conductor is moved to the side from the columnar conductor. Forming an overhang portion projecting over to form a connection head that only exceeds the neck lower cross-sectional area of the columnar conductor,
An electronic component manufacturing method comprising connecting an upper layer side electrode to the connection head.
前記接続用頭部を形成した後、前記柱状導体が埋設されるよう前記絶縁層を形成し、前記接続用頭部に重なる前記絶縁層領域に開口を形成することで前記接続用頭部を露出させ、前記上層側の電極を接続することを特徴とする請求項1に記載の電子部品の製造方法。  After the connection head is formed, the insulating layer is formed so that the columnar conductor is embedded, and the connection head is exposed by forming an opening in the insulating layer region overlapping the connection head. 2. The method of manufacturing an electronic component according to claim 1, wherein the upper layer side electrode is connected. 前記柱状導体は、前記設定高さを超えるように形成される際に、前記柱状導体の頭部において前記柱状導体外方に張り出す領域を有することを特徴とする請求項1或いは2に記載の電子部品の製造方法。  The columnar conductor has a region projecting outward of the columnar conductor at the head of the columnar conductor when the columnar conductor is formed to exceed the set height. Manufacturing method of electronic components. 配線パターンとこの配線パターンを覆う絶縁層とを少なくとも厚み方向に複数配置した電子部品であって、
前記絶縁層を挟んで位置する配線パターンと、
前記絶縁層を挟んで配置された配線パターンを各々接続する内部が密に形成された柱状導体と、を有し、
前記柱状導体は、前記柱状導体の本体の断面積を超えた断面積を有した接続用頭部を有し、
前記接続用頭部の拡径部分は前記柱状導体の上面を回転砥石により研磨する際に前記柱状導体の一部が展延されてなる領域を有することを特徴とする電子部品。
An electronic component in which a plurality of wiring patterns and insulating layers covering the wiring patterns are arranged in the thickness direction,
A wiring pattern located across the insulating layer;
A columnar conductor in which the inside connecting each of the wiring patterns arranged across the insulating layer is formed densely, and
The columnar conductor has a connecting head having a cross-sectional area exceeding the cross-sectional area of the main body of the columnar conductor;
The diameter-enlarged portion of the connecting head has an area in which a part of the columnar conductor is extended when the upper surface of the columnar conductor is polished with a rotating grindstone .
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