JP4196436B2 - 複合層構造の計算機式断層写真検査方法 - Google Patents
複合層構造の計算機式断層写真検査方法 Download PDFInfo
- Publication number
- JP4196436B2 JP4196436B2 JP20936098A JP20936098A JP4196436B2 JP 4196436 B2 JP4196436 B2 JP 4196436B2 JP 20936098 A JP20936098 A JP 20936098A JP 20936098 A JP20936098 A JP 20936098A JP 4196436 B2 JP4196436 B2 JP 4196436B2
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—2D [Two Dimensional] image generation
- G06T11/003—Reconstruction from projections, e.g. tomography
- G06T11/008—Specific post-processing after tomographic reconstruction, e.g. voxelisation, metal artifact correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10072—Tomographic images
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Quality & Reliability (AREA)
- Chemical & Material Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/902565 | 1997-07-29 | ||
| US08/902,565 US6041132A (en) | 1997-07-29 | 1997-07-29 | Computed tomography inspection of composite ply structure |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH11108859A JPH11108859A (ja) | 1999-04-23 |
| JPH11108859A5 JPH11108859A5 (enExample) | 2005-10-27 |
| JP4196436B2 true JP4196436B2 (ja) | 2008-12-17 |
Family
ID=25416031
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP20936098A Expired - Lifetime JP4196436B2 (ja) | 1997-07-29 | 1998-07-24 | 複合層構造の計算機式断層写真検査方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6041132A (enExample) |
| EP (1) | EP0905509B1 (enExample) |
| JP (1) | JP4196436B2 (enExample) |
| DE (1) | DE69841194D1 (enExample) |
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| US5608814A (en) * | 1993-08-26 | 1997-03-04 | General Electric Company | Method of dynamic thresholding for flaw detection in ultrasonic C-scan images |
| US5570460A (en) * | 1994-10-21 | 1996-10-29 | International Business Machines Corporation | System and method for volume rendering of finite element models |
| US5550376A (en) * | 1995-05-22 | 1996-08-27 | General Electric Company | Method of calibration of imaging devices |
| US5715167A (en) * | 1995-07-13 | 1998-02-03 | General Electric Company | Fixture for calibrated positioning of an object |
| US5795295A (en) * | 1996-06-25 | 1998-08-18 | Carl Zeiss, Inc. | OCT-assisted surgical microscope with multi-coordinate manipulator |
-
1997
- 1997-07-29 US US08/902,565 patent/US6041132A/en not_active Expired - Lifetime
-
1998
- 1998-07-24 JP JP20936098A patent/JP4196436B2/ja not_active Expired - Lifetime
- 1998-07-29 EP EP98306055A patent/EP0905509B1/en not_active Expired - Lifetime
- 1998-07-29 DE DE69841194T patent/DE69841194D1/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH11108859A (ja) | 1999-04-23 |
| EP0905509B1 (en) | 2009-09-30 |
| EP0905509A1 (en) | 1999-03-31 |
| US6041132A (en) | 2000-03-21 |
| DE69841194D1 (de) | 2009-11-12 |
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