JP4169221B2 - インバータ式x線高電圧装置 - Google Patents
インバータ式x線高電圧装置 Download PDFInfo
- Publication number
- JP4169221B2 JP4169221B2 JP04427798A JP4427798A JP4169221B2 JP 4169221 B2 JP4169221 B2 JP 4169221B2 JP 04427798 A JP04427798 A JP 04427798A JP 4427798 A JP4427798 A JP 4427798A JP 4169221 B2 JP4169221 B2 JP 4169221B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- circuit
- inverter
- converter circuit
- power supply
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000003990 capacitor Substances 0.000 claims description 31
- 238000010586 diagram Methods 0.000 description 9
- 230000008859 change Effects 0.000 description 7
- 230000000694 effects Effects 0.000 description 7
- 230000009467 reduction Effects 0.000 description 7
- 238000001816 cooling Methods 0.000 description 5
- 230000004907 flux Effects 0.000 description 3
- 238000009499 grossing Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000004804 winding Methods 0.000 description 3
- 230000015556 catabolic process Effects 0.000 description 2
- 230000003111 delayed effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 230000007257 malfunction Effects 0.000 description 2
- 230000008929 regeneration Effects 0.000 description 2
- 238000011069 regeneration method Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000002594 fluoroscopy Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP04427798A JP4169221B2 (ja) | 1998-02-12 | 1998-02-12 | インバータ式x線高電圧装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP04427798A JP4169221B2 (ja) | 1998-02-12 | 1998-02-12 | インバータ式x線高電圧装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH11233286A JPH11233286A (ja) | 1999-08-27 |
| JPH11233286A5 JPH11233286A5 (enrdf_load_stackoverflow) | 2005-08-18 |
| JP4169221B2 true JP4169221B2 (ja) | 2008-10-22 |
Family
ID=12687023
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP04427798A Expired - Lifetime JP4169221B2 (ja) | 1998-02-12 | 1998-02-12 | インバータ式x線高電圧装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4169221B2 (enrdf_load_stackoverflow) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5089834B2 (ja) * | 2001-02-09 | 2012-12-05 | 株式会社日立メディコ | X線発生装置及びこれを用いたx線ct装置 |
| JP4715040B2 (ja) * | 2001-06-08 | 2011-07-06 | 富士電機システムズ株式会社 | 半導体装置 |
| CN102781154B (zh) * | 2012-08-03 | 2014-11-26 | 合肥美亚光电技术股份有限公司 | 混合模式x射线的产生方法及混合模式x射线发生装置 |
| JP5997553B2 (ja) * | 2012-09-10 | 2016-09-28 | 株式会社日立製作所 | X線高電圧装置およびその制御方法 |
| JP7053391B2 (ja) * | 2018-07-06 | 2022-04-12 | 富士フイルムヘルスケア株式会社 | 高電圧発生装置およびx線画像診断装置 |
| CN111787676A (zh) * | 2020-07-27 | 2020-10-16 | 辽宁道特凯力科技有限公司 | 医用诊断x线高压发生器变频kv控制系统 |
-
1998
- 1998-02-12 JP JP04427798A patent/JP4169221B2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH11233286A (ja) | 1999-08-27 |
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