JP4111614B2 - 顕微鏡における複素信号検出方法 - Google Patents

顕微鏡における複素信号検出方法 Download PDF

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Publication number
JP4111614B2
JP4111614B2 JP37359798A JP37359798A JP4111614B2 JP 4111614 B2 JP4111614 B2 JP 4111614B2 JP 37359798 A JP37359798 A JP 37359798A JP 37359798 A JP37359798 A JP 37359798A JP 4111614 B2 JP4111614 B2 JP 4111614B2
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Japan
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image
complex
signal
real
measurement
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Expired - Fee Related
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JP37359798A
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Japanese (ja)
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JPH11258057A (ja
JPH11258057A5 (https=
Inventor
国昭 永山
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Japan Science and Technology Agency
National Institute of Japan Science and Technology Agency
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Japan Science and Technology Agency
National Institute of Japan Science and Technology Agency
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  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Image Processing (AREA)
JP37359798A 1997-12-26 1998-12-28 顕微鏡における複素信号検出方法 Expired - Fee Related JP4111614B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP37359798A JP4111614B2 (ja) 1997-12-26 1998-12-28 顕微鏡における複素信号検出方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP9-361439 1997-12-26
JP36143997 1997-12-26
JP37359798A JP4111614B2 (ja) 1997-12-26 1998-12-28 顕微鏡における複素信号検出方法

Publications (3)

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JPH11258057A JPH11258057A (ja) 1999-09-24
JPH11258057A5 JPH11258057A5 (https=) 2004-12-09
JP4111614B2 true JP4111614B2 (ja) 2008-07-02

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JP37359798A Expired - Fee Related JP4111614B2 (ja) 1997-12-26 1998-12-28 顕微鏡における複素信号検出方法

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12560790B2 (en) 2023-03-22 2026-02-24 Kabushiki Kaisha Toshiba Optical measurement method, optical measurement apparatus, and non-transitory storage medium storing optical measurement program

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7419833B2 (en) 2000-11-17 2008-09-02 Nagayama Ip Holdings Llc Method for nucleic acid sequencing
JP2002153271A (ja) 2000-11-17 2002-05-28 Jeol Ltd Ｄｎａあるいはｒｎａの塩基配列決定方法およびｄｎａシーケンサー
JP4842442B2 (ja) * 2001-01-24 2011-12-21 住友化学株式会社 収束光位相差顕微鏡装置および収束光位相差顕微鏡観察方法
CA2559324A1 (en) * 2004-03-11 2005-09-22 Nano-Or Technologies (Israel) Ltd. Methods and apparatus for wavefront manipulations and improved 3-d measurements
US7576325B2 (en) * 2004-05-20 2009-08-18 National University Corporation Hokkaido University Electron microscopic method and electron microscope using same
JP4575387B2 (ja) * 2004-10-14 2010-11-04 ライトロン株式会社 劣化情報復元方法と復元装置
JP4568730B2 (ja) * 2004-10-14 2010-10-27 ライトロン株式会社 劣化情報復元方法と復元装置
JP4518979B2 (ja) * 2005-03-03 2010-08-04 ライトロン株式会社 微細な試料を可視化する装置と方法、微細な格子の乱れを可視化する装置と方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12560790B2 (en) 2023-03-22 2026-02-24 Kabushiki Kaisha Toshiba Optical measurement method, optical measurement apparatus, and non-transitory storage medium storing optical measurement program

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JPH11258057A (ja) 1999-09-24

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