JP4050109B2 - ビット誤り率のテスト方法、及び、ビット誤り率のテストシステム - Google Patents

ビット誤り率のテスト方法、及び、ビット誤り率のテストシステム Download PDF

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Publication number
JP4050109B2
JP4050109B2 JP2002242894A JP2002242894A JP4050109B2 JP 4050109 B2 JP4050109 B2 JP 4050109B2 JP 2002242894 A JP2002242894 A JP 2002242894A JP 2002242894 A JP2002242894 A JP 2002242894A JP 4050109 B2 JP4050109 B2 JP 4050109B2
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Japan
Prior art keywords
test
error rate
bit error
posterior
distribution function
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Expired - Fee Related
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JP2002242894A
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Japanese (ja)
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JP2003087226A5 (enExample
JP2003087226A (ja
Inventor
リー・エー・バーフォード
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Agilent Technologies Inc
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Agilent Technologies Inc
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
JP2002242894A 2001-08-31 2002-08-23 ビット誤り率のテスト方法、及び、ビット誤り率のテストシステム Expired - Fee Related JP4050109B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/944,740 US6816988B2 (en) 2001-08-31 2001-08-31 Method and system for minimal-time bit-error-rate testing
US944740 2001-08-31

Publications (3)

Publication Number Publication Date
JP2003087226A JP2003087226A (ja) 2003-03-20
JP2003087226A5 JP2003087226A5 (enExample) 2005-11-04
JP4050109B2 true JP4050109B2 (ja) 2008-02-20

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JP2002242894A Expired - Fee Related JP4050109B2 (ja) 2001-08-31 2002-08-23 ビット誤り率のテスト方法、及び、ビット誤り率のテストシステム

Country Status (3)

Country Link
US (1) US6816988B2 (enExample)
JP (1) JP4050109B2 (enExample)
DE (1) DE10236900B4 (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2824915A1 (fr) * 2001-05-15 2002-11-22 Koninkl Philips Electronics Nv Dispositif de test de la conformite d'une connexion
US7231558B2 (en) * 2002-03-18 2007-06-12 Finisar Corporation System and method for network error rate testing
US20060165416A1 (en) * 2002-06-03 2006-07-27 Carter Moursund Wireless infrared network transceiver and methods and systems for operating same
DE10318830B4 (de) * 2003-04-25 2005-05-12 Infineon Technologies Ag Verfahren und Auswertung einer Bitfehlerratenmessung zur Angabe einer Kanalqualität
US20050097403A1 (en) * 2003-10-20 2005-05-05 Ker-Min Chen USB interface and testing method thereof
US7475304B1 (en) 2005-02-25 2009-01-06 The United States Of America As Represented By The Secretary Of The Air Force Bit error tester
US20060200710A1 (en) * 2005-03-04 2006-09-07 Azea Networks, Ltd. Bit error rate performance estimation and control
US20070086354A1 (en) * 2005-10-17 2007-04-19 Erickson Bruce A Method and apparatus for performing a bit error rate test, and for configuring the receiving or transmitting end of a communication link
US8327204B2 (en) * 2005-10-27 2012-12-04 Dft Microsystems, Inc. High-speed transceiver tester incorporating jitter injection
US7681091B2 (en) * 2006-07-14 2010-03-16 Dft Microsystems, Inc. Signal integrity measurement systems and methods using a predominantly digital time-base generator
US7813297B2 (en) * 2006-07-14 2010-10-12 Dft Microsystems, Inc. High-speed signal testing system having oscilloscope functionality
WO2008098202A2 (en) * 2007-02-09 2008-08-14 Dft Microsystems, Inc. Physical-layer testing of high-speed serial links in their mission environments
US7917319B2 (en) * 2008-02-06 2011-03-29 Dft Microsystems Inc. Systems and methods for testing and diagnosing delay faults and for parametric testing in digital circuits
US7996168B2 (en) * 2009-03-06 2011-08-09 Advantest Corporation Method and apparatus for time vernier calibration
US8627156B1 (en) * 2010-10-26 2014-01-07 Agilent Technologies, Inc. Method and system of testing bit error rate using signal with mixture of scrambled and unscrambled bits
US10719427B1 (en) * 2017-05-04 2020-07-21 Amazon Technologies, Inc. Contributed test management in deployment pipelines
US10346232B2 (en) * 2017-08-16 2019-07-09 Western Digital Technologies, Inc. Non-volatile storage with failure prediction
US10802911B2 (en) * 2017-08-16 2020-10-13 Western Digital Technologies, Inc. Non-volatile storage with wear-adjusted failure prediction
US10917203B2 (en) * 2019-05-17 2021-02-09 Oracle International Corporation Estimate bit error rates of network cables

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4387461A (en) * 1981-03-11 1983-06-07 Ford Aerospace & Communications Corporation Experientially determined signal quality measurement device for antipodal data
JPH07225263A (ja) * 1994-02-09 1995-08-22 Advantest Corp ビット誤り測定器
GB2340277B (en) * 1995-02-24 2000-05-03 Advantest Corp Bit error measurement system
US6072779A (en) * 1997-06-12 2000-06-06 Aware, Inc. Adaptive allocation for variable bandwidth multicarrier communication
CA2197263A1 (en) * 1997-02-11 1998-08-11 Dan Burke Method of detecting signal degradation fault conditions within sonet and sdh signals

Also Published As

Publication number Publication date
JP2003087226A (ja) 2003-03-20
DE10236900A1 (de) 2003-04-03
US20030065990A1 (en) 2003-04-03
DE10236900B4 (de) 2007-05-03
US6816988B2 (en) 2004-11-09

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