JP4027108B2 - フォトマスク - Google Patents
フォトマスク Download PDFInfo
- Publication number
- JP4027108B2 JP4027108B2 JP2002029084A JP2002029084A JP4027108B2 JP 4027108 B2 JP4027108 B2 JP 4027108B2 JP 2002029084 A JP2002029084 A JP 2002029084A JP 2002029084 A JP2002029084 A JP 2002029084A JP 4027108 B2 JP4027108 B2 JP 4027108B2
- Authority
- JP
- Japan
- Prior art keywords
- transmittance
- photomask
- light
- region
- intermediate layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Diffracting Gratings Or Hologram Optical Elements (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002029084A JP4027108B2 (ja) | 2002-02-06 | 2002-02-06 | フォトマスク |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002029084A JP4027108B2 (ja) | 2002-02-06 | 2002-02-06 | フォトマスク |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2003228160A JP2003228160A (ja) | 2003-08-15 |
JP2003228160A5 JP2003228160A5 (enrdf_load_stackoverflow) | 2005-08-11 |
JP4027108B2 true JP4027108B2 (ja) | 2007-12-26 |
Family
ID=27750016
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2002029084A Expired - Fee Related JP4027108B2 (ja) | 2002-02-06 | 2002-02-06 | フォトマスク |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4027108B2 (enrdf_load_stackoverflow) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100345008C (zh) * | 2005-06-29 | 2007-10-24 | 浙江工业大学 | 一种超分辨微结构衍射光学元件的制作方法 |
JP4967616B2 (ja) * | 2006-11-17 | 2012-07-04 | 凸版印刷株式会社 | 多段階段状素子並びにモールドの製造方法 |
JP5008479B2 (ja) * | 2007-06-28 | 2012-08-22 | ラピスセミコンダクタ株式会社 | レジストパターンの形成方法及びフォトマスク |
CN107643557A (zh) * | 2016-07-21 | 2018-01-30 | 擎中科技(上海)有限公司 | 一种光栅结构、立体显示装置及光栅结构的制作方法 |
CN111856636B (zh) * | 2020-07-03 | 2021-10-22 | 中国科学技术大学 | 一种变间距光栅掩模线密度分布可控微调方法 |
-
2002
- 2002-02-06 JP JP2002029084A patent/JP4027108B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2003228160A (ja) | 2003-08-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH04136854A (ja) | 半導体装置の製造方法 | |
JPH06175347A (ja) | ホトマスクおよびそれを用いたパタン形成方法 | |
KR910018847A (ko) | 투영 포토리토그래피에 대한 이상 마스크와 이것의 제조방법 | |
US7378196B2 (en) | Method of manufacturing mask for correcting optical proximity effect | |
KR20100109771A (ko) | 림 영역을 가진 투과율 조절형 위상 반전 포토마스크 및 그 제조 방법 | |
JP2004062200A (ja) | 回折光学素子及びその製作方法 | |
JP4027108B2 (ja) | フォトマスク | |
JP5239417B2 (ja) | マイクロレンズアレイの製造方法及び濃度分布マスク及びその設計方法 | |
JP4787866B2 (ja) | パターン化されたフォトレジスト層の形成方法 | |
KR100475083B1 (ko) | 미세한 콘택홀 어레이를 위한 포토마스크, 그 제조방법 및사용방법 | |
JP2002072442A (ja) | 位相シフトマスクの製造方法、レジストパターンの形成方法および半導体装置の製造方法 | |
JP4834235B2 (ja) | グレートーン露光用フォトマスク | |
JPH07287386A (ja) | 位相シフトマスク及びその製造方法 | |
US6013397A (en) | Method for automatically forming a phase shifting mask | |
JP3968275B2 (ja) | バンプ構造を有する傾斜リフレクタの製造方法および傾斜リフレクタのバンプ構造製造方法 | |
JP4570007B2 (ja) | 微小な集光レンズの形成方法 | |
US20030203286A1 (en) | High-transmittance halftone phase shift mask and manufacturing method of semiconductor device | |
CN113156549B (zh) | 微透镜结构及其制造方法 | |
JPH0990602A (ja) | 位相シフトマスク及びその製造方法 | |
KR19980053146A (ko) | 위상반전 마스크 및 그 제조방법 | |
KR0166846B1 (ko) | 반도체 마스크 및 그의 제조방법 | |
US7335449B2 (en) | Masks each having a central main pattern region and a peripheral phantom pattern region with light-transmitting features in both pattern regions having the shame shape and pitch and methods of manufacturing the same | |
US5718990A (en) | Semiconductor mask and method of manufacturing the same | |
KR100419971B1 (ko) | 반도체소자 제조시의 패턴 형성을 위한 마스크 및 그 제조방법 | |
KR19980054333A (ko) | 위상반전 마스크의 제조방법 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20050124 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050124 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20070704 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20070709 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20070831 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20071002 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20071009 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20101019 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20101019 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20111019 Year of fee payment: 4 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20111019 Year of fee payment: 4 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20121019 Year of fee payment: 5 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20131019 Year of fee payment: 6 |
|
RD03 | Notification of appointment of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: R3D03 |
|
LAPS | Cancellation because of no payment of annual fees |