JP4010299B2 - Semiconductor light emitting device and method for forming the same - Google Patents

Semiconductor light emitting device and method for forming the same Download PDF

Info

Publication number
JP4010299B2
JP4010299B2 JP2003507903A JP2003507903A JP4010299B2 JP 4010299 B2 JP4010299 B2 JP 4010299B2 JP 2003507903 A JP2003507903 A JP 2003507903A JP 2003507903 A JP2003507903 A JP 2003507903A JP 4010299 B2 JP4010299 B2 JP 4010299B2
Authority
JP
Japan
Prior art keywords
light
light emitting
diffusing agent
semiconductor
emitting device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2003507903A
Other languages
Japanese (ja)
Other versions
JPWO2003001612A1 (en
Inventor
滋嗣 幸田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nichia Corp
Original Assignee
Nichia Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nichia Corp filed Critical Nichia Corp
Publication of JPWO2003001612A1 publication Critical patent/JPWO2003001612A1/en
Application granted granted Critical
Publication of JP4010299B2 publication Critical patent/JP4010299B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/52Encapsulations
    • H01L33/54Encapsulations having a particular shape
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L101/00Compositions of unspecified macromolecular compounds
    • C08L101/12Compositions of unspecified macromolecular compounds characterised by physical features, e.g. anisotropy, viscosity or electrical conductivity
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/16Fillings or auxiliary members in containers or encapsulations, e.g. centering rings
    • H01L23/18Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device
    • H01L23/24Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device solid or gel at the normal operating temperature of the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/293Organic, e.g. plastic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/05573Single external layer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • H01L2224/061Disposition
    • H01L2224/06102Disposition the bonding areas being at different heights
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16245Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/17Structure, shape, material or disposition of the bump connectors after the connecting process of a plurality of bump connectors
    • H01L2224/1701Structure
    • H01L2224/1703Bump connectors having different sizes, e.g. different diameters, heights or widths
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144Gold (Au) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48257Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a die pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/49105Connecting at different heights
    • H01L2224/49107Connecting at different heights on the semiconductor or solid-state body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85909Post-treatment of the connector or wire bonding area
    • H01L2224/8592Applying permanent coating, e.g. protective coating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12044OLED
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0091Scattering means in or on the semiconductor body or semiconductor body package
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/44Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the coatings, e.g. passivation layer or anti-reflective coating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/50Wavelength conversion elements
    • H01L33/507Wavelength conversion elements the elements being in intimate contact with parts other than the semiconductor body or integrated with parts other than the semiconductor body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/58Optical field-shaping elements
    • H01L33/60Reflective elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Dispersion Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Led Device Packages (AREA)

Description

【0001】
(技術分野)
本発明は、スイッチ内照明、フルカラーディスプレイ、液晶バックライト等の光源として用いられる半導体装置に関し、特に信頼性に優れた発光装置に関するものである。
【0002】
(背景技術)
今日、高輝度、高出力な半導体素子や小型且つ高感度な発光装置が開発され種々の分野に利用されている。このような発光装置は小型、低消費電力や軽量などの特徴を生かして、例えば、光プリンターヘッドの光源、液晶バックライト光源、各種メータの光源や各種読み取りセンサーなどに利用されている。
【0003】
このような発光装置は、例えば、半導体素子を収納可能な凹部を有し、該凹部底面から正及び負のリード電極が一方の主面が露出するように挿入され一体成形されたパッケージを用い、前記凹部底面から露出されたリード電極上に半導体素子としてLEDチップがダイボンドされ、LEDチップの各電極とパッケージに設けられたリード電極とが金線等により電気的に接続されている。また凹部内にてLEDチップ及び金線が封止部材である樹脂にて被覆されている。これにより、パッケージ内部の構成部材は水分や外力などの外部環境から保護され、極めて信頼性の高い発光装置が得られる。
【0004】
現在、技術の飛躍的な進歩により、LEDチップの高出力化および短波長化が実現されている。このようなLEDチップは、大電流を投下することにより高出力の光を放出することが可能な反面、発光時に高温の発熱を伴う。これに起因して、LEDチップ近傍に配置される封止樹脂の変色劣化が生じる。特に、前記LEDチップ近傍に配置される封止部材として、熱に弱い炭素−炭素の二重結合を有する透光性有機部材を用いると、結合が切れて黄変し光学特性が損なわれる。また、各部材の熱膨張率の差により、ワイヤ断線や各部材にクラックが発生し、使用経過時間が増すにつれて急激に信頼性が低下する傾向にある。
【0005】
そこで、近紫外領域の光を発光し高熱を発生する発光素子を使用する場合、近紫外領域の光に対する耐光性および耐熱性に優れ、熱応力に対して可塑性を有するシリコーン樹脂が好適に用いられている。シリコーン樹脂の主骨格は、光劣化の原因となる炭素−炭素間の2重結合を有していないため、電子遷移吸収がおこりにくく、長時間光が照射されてもほとんど劣化しない。また、柔軟性に優れているため、熱応力による半導体装置の損傷を防止することができる。
【0006】
一方、シリコーン樹脂を主体とする硬化物は、柔軟性に優れている場合、降下物表面は機械的強度が弱くタック性を有している。また、シリコーン樹脂は熱に対して高い安定性を有しており、シリコーンを主体とする硬化物の形状は、硬化過程において熱収縮することはなく硬化前の充填時に決定する。このため、上述の如く凹部を有するパッケージにシリコーン樹脂からなる封止部材を設ける場合、シリコーン樹脂充填量は、表面が外部と接触しないように微調整する必要がある。具体的には、前記パッケージの端部外郭上面より一段下がった位置までシリコーン樹脂を主体とする組成物を注入し熱硬化することで、タック性を有する表面が外部と接触することを抑制している。これにより、信頼性の高い発光装置が得られる。
【0007】
しかしながら、より小型化・薄型化の発光装置が望まれている現在において、上記のように凹部を有するパッケージ内にシリコーン樹脂組成物を微調整して充填することは、非常に困難であり、作業効率が悪く良好な歩留まりが得られない。
【0008】
(発明の開示)
本発明は、上述の問題を解決するために為されたものであり、高い信頼性と良好な光学特性を有する小型化半導体装置を歩留まり良く得ることを目的とする。
本発明者は種々の実験の結果、優れた熱安定性を有し硬化前後において体積が変化しない樹脂を主体とする熱硬化性組成物の硬化物材料に、吸油量が調整可能な拡散剤を添加して硬化すると、前記熱硬化性組成物の体積を熱硬化過程において減少させることが可能であることを見いだし、本発明を成すに至った。
【0009】
本発明の半導体装置は、半導体素子と、該半導体素子が収納された凹部を有するパッケージと、前記凹部内に充填された封止部材と、を有する半導体装置であって、前記封止部材は、親水性主鎖と疎水性側鎖とを有する透光性ポリマー樹脂と、少なくとも前記ポリマー樹脂を吸収することが可能で吸油量(日本工業規格JIS K5101)が30ml/100g〜150ml/100gである光拡散剤と、を必須成分とする硬化性組成物の硬化物であり、前記封止部材の上面は、端部から中央部にかけて放物線状の凹みを有することを特徴とする。
【0010】
このように構成された半導体装置は、優れた信頼性と光学特性とを有し、歩留まり良く得ることができる。特に、上面が放物線状に凹んでいることにこれにより、タック性を有する前記上面が、実装時等に外部と接触することをさらに抑制することができる。また、前記封止部材が透光性である場合、一面均一に発光することが可能な発光装置が得られる。
【0011】
また、本発明の半導体装置において、前記封止部材の硬度は、5shore(A)〜80shore(D)であることが好ましく、これにより、大電流の投下を可能とし、高出力の半導体装置が得られる
【0012】
た、本発明の半導体装置において、前記拡散剤は、針状もしくは柱状の形状を有していることが好ましく、これにより、拡散剤のポリマー樹脂吸収率が高まり、少量の拡散剤量にて所望とする封止部材形状を実現することができる。
また、本発明の半導体装置において、前記拡散剤はあられ石型結晶であることが好ましく、これにより良好に光が拡散され、均一に発光することが可能な半導体装置が得られる。
【0013】
また、本発明の半導体装置において、前記拡散剤は、平均粒子径値が0.1μm〜5.0μmであることが好ましく、これにより、色むらが抑制され均一で且つ高い光度にて発光することが可能な半導体装置が得られる。
また、本発明の半導体装置において、前記拡散剤の屈折率は、前記半導体素子の屈折率より低く且つ前記透光性ポリマー樹脂の屈折率より高いことが好ましく、これにより、半導体素子から発光される光を内部に密閉することなく良好に外部へ取り出すことができ、高い光度が得られる。
【0014】
また、本発明の半導体装置において、前記封止部材は、前記半導体素子側から前記拡散剤の含有量の多い第一の層と前記第一の層より前記拡散剤の含有量の少ない第二の層とを有し、前記半導体素子の表面は前記第一の層にてほぼ被覆されていることが好ましい。これにより、半導体素子から発光される光の取り出し効率を高くすることができる。
【0015】
また、本発明の半導体装置において、前記封止部材は、半導体素子から発光される光の少なくとも一部を吸収し異なる波長を有する光を発光することが可能な蛍光物質を含有させることも可能であり、これにより発光装置間の色バラツキが少なく均一に発光することが可能な色変換型半導体装置が得られる。
また、本発明の半導体装置において、前記蛍光物質の屈折率は、前記半導体素子の屈折率より低く且つ前記拡散剤の屈折率より高いことが好ましく、これにより、半導体素子から発光される光の取り出し効率を向上させることができる。
【0016】
また、本発明の半導体装置において、前記蛍光物質と前記半導体素子との屈折率差は、前記蛍光物質と前記拡散剤との屈折率差とほぼ等しいことが好ましく、これにより、混色性に優れた発光装置が得られる。
【0017】
また、本発明の半導体装置において、透光性ポリマー樹脂、拡散剤、および蛍光物質を必須成分とする硬化性組成物を硬化させてなる封止部材は、前記半導体素子と前記第一の層との間に、前記半導体素子から発光される光の少なくとも一部を吸収し異なる波長を有する光を発光することが可能な前記蛍光物質を含有する色変換層を有することが好ましい。つまり、前記半導体素子の表面に、蛍光物質を含有する色変換層、拡散剤の含有量の多い第一の層、そして前記第一の層より拡散剤の含有量の少ない第二の層、が順次積層されていることが好ましく、これにより、半導体素子から発光される光と、前記色変換層にて前記光の一部が吸収され変換された光とが、前記第一の層にて反射散乱され良好に混色される。次に第二の層を通過することにより混色光の指向性が改善される。この効果は、粒径が大きい蛍光物質、とくに中心粒径が15μmから50μmである蛍光物質を使用した際に顕著に現れ、高輝度で且つ均一に発光することが可能な発光装置が得られる。
【0018】
また、本発明の半導体装置の形成方法は、半導体素子と、該半導体素子を収納することが可能な凹部を有するパッケージと、前記凹部内に充填された封止部材と、を有する発光装置の形成方法であって、
親水性主鎖と疎水性側鎖とを有する透光性ポリマー樹脂と該透光性ポリマー樹脂を吸収することが可能で吸油量(日本工業規格JIS K5101)が30ml/100g〜150ml/100gである光拡散剤とを必須成分とする硬化性組成物液を調整する第一の工程と、
前記硬化性組成物液を前記パッケージの凹部内にパッケージ上面とほぼ同一平面のラインまで注入する第二の工程と、
熱処理を施すことによって、前記硬化性組成物液を硬化させると同時に前記封止部材の上面を端部から中央部にかけて放物線状の凹みを形成する第3の工程と、
を有することを特徴とする。これにより、信頼性及び光学特性の優れた半導体装置を量産性良く得ることができる。
【0019】
(発明を実施するための最良の形態)
以下、図面を参照にしながら、本発明に係る実施の形態について説明する。
図1は、本発明の形態であるSMD型発光ダイオードの模式的平面図および模式的断面図である。凹部を有し、該凹部底面から一対のリード電極2,3の各先端部表面が露出された樹脂製パッケージ1を用いている。前記凹部底面に発光素子4が載置され、該発光素子4の各電極と前記各リード電極先端部とがそれぞれ金線ワイヤ6にて電気的に接続されている。前記発光素子4は、サファイア基板上に窒化ガリウムであるバッファ層を介して窒化物半導体(AlGaInN、0≦X≦1、0≦Y≦1、0≦Z≦1、X+Y+Z=1)からなるpn接合が形成されてなる。このように設置された発光素子4は、親水性主鎖と疎水性側鎖とを有する透光性ポリマー樹脂に少なくとも前記ポリマー樹脂を吸収する度合いを調整することが可能な拡散剤が攪拌されて得られた硬化性組成物の硬化物8にて覆われている。以下、本発明の実施の形態における各構成について詳述する。
【0020】
(半導体素子4)
本発明において半導体素子4は、特に限定されないが、本実施の形態では発光素子を用い、外部へ光を放出する発光装置を形成している。本実施の形態において、蛍光物質を共に用いる場合、該蛍光物質を効率よく励起することが可能な光を発光する発光層を有する発光素子が好ましい。このような発光素子として、ZnSeやGaNなど種々の半導体を挙げることができるが、蛍光物質を効率良く励起できる短波長を発光することが可能な窒化物半導体(InAlGa1−X−YN、0≦X、0≦Y、X+Y≦1)が好適に挙げられる。また、前記窒化物半導体に、所望に応じてボロンやリンを含有させることもできる。半導体層の構造としては、MIS接合、PIN接合やpn接合などを有するホモ構造、ヘテロ構造あるいはダブルヘテロ構成のものが挙げられる。このような半導体層は、材料やその混晶度によって発光波長を種々選択することができる。また、半導体活性層を量子効果が生ずる薄膜に形成させた単一量子井戸構造や多重量子井戸構造とすることもできる。
【0021】
窒化物半導体を使用した場合、半導体用基板にはサファイア、スピネル、SiC、Si、ZnO、GaN等の材料が好適に用いられる。結晶性の良い窒化物半導体を量産性よく形成させるためにはサファイア基板を用いることが好ましい。このサファイア基板上にMOCVD法などを用いて窒化物半導体を形成させることができる。例えば、サファイア基板上にGaN、AlN、GaAIN等のバッファ層を形成し、その上にpn接合を有する窒化物半導体を形成させ、半導体素子とする。また基板上に半導層を積層した後、基板を取り除き、基板を有しない半導体素子とすることも可能である。
【0022】
窒化物半導体を使用したpn接合を有する半導体素子例として、バッファ層上に、n型窒化ガリウムで形成した第1のコンタクト層、n型窒化アルミニウム・ガリウムで形成させた第1のクラッド層、窒化インジウム・ガリウムで形成した活性層、p型窒化アルミニウム・ガリウムで形成した第2のクラッド層、p型窒化ガリウムで形成した第2のコンタクト層を順に積層させたダブルヘテロ構成などが挙げられる。窒化物半導体は、不純物をドープしない状態でn型導電性を示す。発光効率を向上させるなど所望のn型窒化物半導体を形成させる場合は、n型ドーパントとしてSi、Ge、Se、Te、C等を適宜導入することが好ましい。一方、p型窒化物半導体を形成させる場合は、p型ドーパントであるZn、Mg、Be、Ca、Sr、Ba等をドープさせる。窒化物半導体は、p型ドーパントをドープしただけではp型化しにくいため、p型ドーパント導入後に炉による加熱やプラズマ照射等により低抵抗化させることが好ましい。電極形成後、半導体ウエハーからチップ状にカットさせることで窒化物半導体からなる半導体素子を形成させることができる。また、パターニングにより、各電極のボンディング部のみを露出させ素子全体を覆うようにSiO等からなる絶縁性保護膜を形成すると、小型化半導体装置を信頼性高く形成することができる。
【0023】
本発明の発光装置において、白色系を発光させる場合は、蛍光物質からの発光波長との補色関係や透光性樹脂の劣化等を考慮して、半導体素子の発光波長は400nm以上530nm以下が好ましく、420nm以上490nm以下がより好ましい。さらに半導体素子の励起効率および蛍光物質の発光効率を向上させるためには、半導体素子の発光波長は450nm以上475nm以下が好ましい。
【0024】
また、本発明の封止部材に用いられる樹脂は、比較的紫外線により劣化されにくく、400nmより短い紫外線領域或いは可視光の短波長領域を主発光波長とする半導体素子を用いることも可能である。また、このような近紫外線領域の波長を発光する発光素子と、その波長の一部を吸収して他の波長を発光することが可能な蛍光物質と、を組み合わせることにより、色ムラの少ない色変換型発光装置を得ることができる。このような色変換型発光装置の発光色は、蛍光物質から放出された光のみを利用するため、比較的簡単に色調整を行うことができる。特に、紫外領域の波長を発光する半導体素子を利用する場合、可視光を発光する半導体素子を用いた場合と比較して、各半導体素子間の波長などのバラツキを吸収し蛍光物質の発光色のみによって色度を決定できるため、量産性を向上させることができる。
【0025】
(封止部材8)
本実施の形態において、上記の半導体素子が配置されたパッケージの凹部内に表面が発光面となる封止部材が設けられる。前記封止部材は、親水性主鎖と疎水性側鎖からなる透光性ポリマー樹脂と、該ポリマー樹脂を吸収することが可能な拡散剤と、を有する硬化性組成物の硬化物にて構成されており、前記封止部材の上面は前記パッケージの外郭上面より下方の内側に位置している。
【0026】
このような封止部材は、例えば、上記ポリマー樹脂と吸油可能な拡散剤とを有する液状硬化性組成物を、例えば発光素子が配置された凹部型パッケージ内の、前記凹部の両端部上面と同一平面ライン又はそれ以上のラインまで充填させた後、熱処理により硬化させると、硬化物は硬化前と比較して体積が減少し、得られた硬化物の上面高さは前記凹部の両端部上面より下方となる。このように、本来、熱処理により硬化収縮することのない樹脂を主体とする組成物に、吸油可能な拡散剤を共存させることにより、前記組成物の体積を硬化反応中に減少させることができる。これにより、硬化物表面がタック性を有する組成物を使用した際にも、前記組成物の充填量を微調整することなく、前記表面をパッケージの外郭より内側とすることができる。これにより、内部および外部双方において信頼性の高い発光装置が得られる。
【0027】
このように本発明の封止部材は、透光性ポリマー樹脂と上記拡散剤を必須成分とする硬化性組成物液を凹部パッケージの外郭上面とほぼ同一平面ラインに充填させ、熱硬化するだけで容易に得ることができ、充填量を見た目により微調整する必要がない。またパッケージの容積により封止部材の充填量が定まり、また拡散剤の表面処理の度合いおよび含有量により前記封止部材の硬化前から硬化後への体積収縮率が定まるため、各半導体装置における封止部材の体積を一定とすることができる。これにより量産性及び歩留まりが向上される。このように本発明に用いられる拡散剤は、高い信頼性を有する樹脂を用いた封止部材を、所望とする厚さに容易に形成することができる。特に本発明では、熱安定性の高いポリマー樹脂を必須成分とする熱硬化性組成物を用いることにより、信頼性の高い半導体装置を量産性良く形成することができる。
【0028】
また、半導体装置の発光面となる前記封止部材の上面は、滑らかで且つ両端部から中央部にかけて放物線状に凹んだ形状とすることが好ましく、これにより、信頼性が高く且つ光学特性の優れた半導体装置が得られる。さらに前記凹みは、長軸及び短軸にてほぼ左右対称であることが好ましく、これにより、良好な指向特性を有する発光装置が得られる。このような発光面は、熱安定性の高い親水性主鎖と疎水性主鎖からなるポリマー樹脂と吸油量の調整可能な拡散剤とを必須成分とする組成物を用い、硬化過程において前記ポリマー樹脂の体積減少させることにより容易に得ることができる。
【0029】
一方、前記拡散剤を用いず、熱安定性の高い親水性主鎖と疎水性主鎖からなるポリマー樹脂を必須成分とする組成物を前記パッケージ凹部内に少なめに注入し、封止部材を形成すると、各半導体装置において前記ポリマー樹脂の注入量を一定にすることは困難であり、各半導体装置間において封止部材の膜厚にバラツキが生じる。また、前記封止部材を粘度の高い樹脂組成物を硬化させて形成した場合、前記封止部材の上面は凸凹になる傾向にあり、色むらや指向特性のバラツキの原因となる。また、前記ポリマー樹脂に蛍光物質等を含有させた場合、各発光装置間において色バラツキが生じる。
【0030】
このように本発明では、前記ポリマー樹脂と前記拡散剤を必須とする硬化性組成物を、常にパッケージの容積全体を封止するように注入させるため、一定量の硬化性組成物を各半導体装置に注入させることができる。これにより、蛍光物質や顔料を含有させても色バラツキが少なく歩留まりの優れた半導体装置が得られる。
ここで、本実施の形態の半導体装置における封止部材の具体的形成方法を述べる。
【0031】
1.第一の工程
前記透光性ポリマー樹脂として、粘度が7000mPa・Sで且つ屈折率が1.53であるシリコーン樹脂を用い、前記シリコーン樹脂を主体とするシリコーン樹脂組成物に平均粒子径が1.0μtmで且つ吸油量が70ml/100gである軽質炭酸カルシウムを攪拌させる。
【0032】
(透光性ポリマー樹脂)
本発明でもちいられる、親水性主鎖と疎水性側鎖からなる透光性ポリマー樹脂を主体とする硬化性組成物の硬化物は、前記親水性主鎖の性質により優れた耐光性、柔軟性、および熱安定性を有している。このような樹脂として、例えば、シロキサン結合を骨格としそのケイ素元素に有機基が直接結合したシロキサン系シリコーン樹脂が挙げられる。シロキサン系シリコーン樹脂に用いられる有機基は、耐熱性の観点からみてメチル基とフェニル基を用いることが好ましく、ジメチルシロキサン系シリコーン樹脂、フェニルシロキサン系シリコーン樹脂、フェニルメチルシロキサン系シリコーン樹脂を好適に用いることができ、特に窒化物系半導体素子を使用する場合、フェニルメチルシロキサン系シリコーン樹脂を用いると、良好に光を取り出すことができ好ましい。
前記透光性ポリマー樹脂の粘度は、作業性の観点からみて、2000mPa・s〜20000mPa・sが好ましく、より好ましくは3000mPa・s〜10000mPa・sである。
【0033】
前記透光性ポリマー樹脂中に前記拡散剤を含有し攪拌した際、熱が生じ樹脂は熱っせられ不安定な状態となりがちであるため、樹脂は充填する前に温度が定温に戻り安定するまで一定時間放置することが好ましい。熱安定性が高く且つ前記範囲の粘度を有する樹脂を用いることにより、攪拌した後に一定時間放置しても樹脂中での前記拡散剤の分散状態を好ましい状態で維持することが可能となる。これにより、信頼性および歩留まりが向上される。
【0034】
また、硬化後の硬度は、5shore(A)〜80shore(D)が好ましく、より好ましくは5shore(A)〜40shore(D)である。これにより内部応力によるワイヤ切れや各部材のクラックを防止することができる。このように熱安定性に優れ且つ柔軟性に優れた樹脂を用いることにより、大電流の投下を可能とし、高輝度に発光することが可能な半導体装置が得られる。
【0035】
また、上記半導体素子(屈折率2)と共に用いることを考慮し、前記ポリマー樹脂の屈折率は1.4〜1.65であることが好ましい。本発明では、シリコーン樹脂等の親水性主鎖と疎水性主鎖からなる透光性ポリマー樹脂を使用するが、用いるポリマー樹脂は特に限定されず、エポキシ樹脂、アクリル樹脂、ウレタン樹脂、ジアリルフタレート樹脂、フッ素樹脂、等を用いることも可能である。
【0036】
拡散剤)
本発明では、上記ポリマー樹脂を主体とする硬化性組成物中に、少なくとも前記ポリマー樹脂を吸収することが可能な拡散剤として、吸油可能な拡散剤を用いている。本発明で用いられる具体的拡散剤として、軽質炭酸カルシウム、重質炭酸カルシウム、タルク、ホワイトカーボン、炭酸マグネシウム、含水硅酸アルミニウム・マグネシウム、硫酸バリウム等があげられる。
【0037】
本発明で用いられる拡散剤の形状は、六方晶形等の立方形、紡錘形、破砕形、針状もしくは柱状等の棒状等、種々の構造のものを用いることができる。特に針状もしくは柱状等の棒状を有する拡散剤を用いることが好ましく、このような拡散剤をポリマー樹脂中に分散しパッケージ凹部内に充填すると、前記拡散剤は面積の広い表面が発光素子と対向した状態で沈降する。さらに小さい粒子を有する拡散剤を用いた場合、前記拡散剤はそれぞれの粒子間引力により一方の先端部が一箇所において凝集し他方の先端部間はそれぞれ離間した凝集体となる。このような凝集体は、封止部材を厚み方向において良好に収縮させることができる他、各粒子間および各凝集体間に一定の距離を設けることができるため、光取り出し効率を妨げることなく良好に光を拡散することができる。
また、拡散剤の粒径は、平均粒子径が0.1μm〜5.0μmの範囲であることが好ましく、より好ましくは1.0μm〜2.5μmであることが好ましい。このような平均粒子径値を有する拡散剤は、硬化時の熱作用により前記ポリマー樹脂を効率よく吸収することができる。
【0038】
ここで、本明細書において平均粒子径とは、空気透過法を基本原理としたサブシーブサイザー法によって測定されたものである。また、拡散剤が破砕形、針状、もしくは柱状等の棒状結晶等の場合、透過型電子顕微鏡法により測定される長辺長は1.0μm〜3.0μmが好ましい。
【0039】
また前記拡散剤は、前記半導体素子の屈折率よりも低く前記ポリマー樹脂よりも高い屈折率を有することが好ましく、これにより光の取り出し効率が向上され好ましい。特に、炭酸カルシウムからなる拡散剤は、あられ型(アラゴナイト型)結晶の拡散剤を用いることが好ましく、これにより拡散剤にて光を良好に屈折させることができる。
前記透光性ポリマー樹脂の体積減少率は、前記拡散剤の含有量を調整する他、前記拡散剤に施す表面処理の程度によって調整することが可能である。このような拡散剤の表面処理は、Al、Fe、Si等を用いて施すことができる。拡散剤は、表面処理を施す度合いが大きいほど吸油量が小さくなる傾向にある。また、本発明における透光性ポリマー樹脂は、表面処理を殆ど行わず用いることが好ましく、これにより少ない含有量にて前記透光性ポリマー樹脂の体積を大幅に減少させることができる。つまり、拡散剤の上記透光性ポリマー樹脂の吸収量と吸油量とは、相互関係にあると考えら、前記拡散剤の含有量を増すほど前記透光性ポリマー樹脂を主体とする封止部材の硬化前後における体積減少率は大きくなる。このように、樹脂の所望とする体積減少量に合わせて拡散剤を調整して用いるとができ、本発明はあらゆる容積サイズのパッケージを利用した半導体装置に適応することが可能である。
【0040】
拡散剤の吸油量は、表面処理を施していない状態で、30ml/100g〜150ml/100gであることが好ましく、より好ましくは50ml/100g〜150ml/100gである。これにより後に表面処理を行うことで幅広い吸油量の設定が可能となる。本明細書において吸油量とは、日本工業規格(JIS K5101)の吸油量試験法により測定された値とする。
また拡散剤の封止部材中における含有量は、0.5%〜5%が好ましく、これにより、発光素子の光取り出し効率を低下させることなく発光装置の光度、信頼性、および作業性を向上させつつ、上記硬化性組成物の体積を熱処理後において減少させることができる。
【0041】
2.第二および第三の工程
得られた硬化性組成物液を一定時間放置して樹脂の熱を定温に戻した後、発光措置が配置されたパッケージ凹部内に前記凹部の端部上面とほぼ同一平面ラインまで注入し(第二の工程)、加熱硬化させる(第三の工程)。この加熱硬化過程において、軽質炭酸カルシウムの何らかの作用により、充填後の前記硬化性組成物の体積が減少される。こうして得られた硬化物である封止部材の表面は、端部上面から中央部にかけて放物線状の凹部を有する形状となる。前記凹部は、長軸及び短軸においてほぼ左右対称である。
【0042】
上記作用は、おそらく、軽質炭酸カルシウムの吸油量の割合が、加熱硬化過程において促進され、前記シリコーン樹脂の一部が軽質炭酸カルシウムにより吸収されていると思われる。また、軽質炭酸カルシウムの体積は、前記樹脂を吸収した後も増加することなく、ほぼ一定であると考えられる。もしくは、軽質炭酸カルシウムのシリコーン樹脂吸収による体積増加率よりも前記シリコーン樹脂の体積減少率が高いと考えられる。これにより、硬化後の封止部材の体積は充填時よりも減少し、結果、硬化収縮された封止部材表面はパッケージ凹部両端部の上面から中央部にかけて放物線状で且つ発光面からみて長軸及び短軸に対してほぼ左右対称な凹部となる。これにより、良好な発光面が得られ優れた指向特性を有する半導体装置が得られる。また前記表面は、前記パッケージ凹部両端部の上面より下方に形成されるため、前記表面が検査や実装中にて外部に接触することを抑制でき、信頼性の高い半導体装置が得られる。
【0043】
(蛍光物質8)
本実施の形態の半導体装置は、封止部材中に蛍光物質8を含有させてもよい。ここで、本発明で用いられる蛍光物質について詳述する。本発明では、各構成部材に無機傾向物質や有機蛍光物質等、種々の蛍光物質を含有させることが出来る。このような蛍光物質の一例として、無機蛍光物質である希土類元素を含有する蛍光物質がある。希土類元素含有蛍光物質として、具体的には、Y、Lu,Sc、La,Gd、およびSmの群から選択される少なくとも1つの元素と、Al、Ga、およびInの群から選択される少なくとも1つの元素とを有するガーネット(ざくろ石)型蛍光体が挙げられる。
本実施の形態の半導体装置に用いた蛍光物質は、窒化物系半導体からを発光層とする半導体素子から発光された光を、励起させて異なる波長の光を発光できるセリウムで付活されたイットリウム・アルミニウム酸化物系蛍光物質をベースとしたものである。具体的なイットリウム・アルミニウム酸化物系蛍光物質としては、YAlO:Ce、YAl12:Ce(YAG:Ce)やYAl:Ce、更にはこれらの混合物などが挙げられる。イットリウム・アルミニウム酸化物系蛍光物質にBa、Sr、Mg、Ca、Zn、Prの少なくとも一種が含有されていてもよい。また、Siを含有させることによって、結晶成長の反応を抑制し蛍光物質の粒子を揃えることができる。
【0044】
本明細書において、Ceで付活されたイットリウム・アルミニウム酸化物系蛍光物質は特に広義に解釈するものとし、イットリウムの一部あるいは全体を、Lu、Sc、La、Gd及びSmからなる群から選ばれる少なくとも1つの元素に置換され、あるいは、アルミニウムの一部あるいは全体をBa、Tl、Ga、Inの何れが又は両方で置換され蛍光作用を有する蛍光体を含む広い意味に使用する。
更に詳しくは、一般式(YGd1−zAl12:Ce(但し、0<z≦1)で示されるフォトルミネッセンス蛍光体や一般式(Re1−aSmRe'12:Ce(但し、0≦a<1、0≦b≦1、Reは、Y、Gd、La、Scから選択される少なくとも一種、Re'は、Al、Ga、Inから選択される少なくとも一種である。)で示されるフォトルミネッセンス蛍光体である。
【0045】
またフォトルミネッセンス蛍光体は、結晶中にGd(ガドリニウム)を含有することにより、460nm以上の長波長域の励起発光効率を高くすることができる。Gdの含有量の増加により、発光ピーク波長が長波長に移動し全体の発光波長も長波長側にシフトする。すなわち、赤みの強い発光色が必要な場合、Gdの置換量を多くすることで達成できる。一方、Gdが増加すると共に、青色光によるフォトルミネッセンスの発光輝度は低下する傾向にある。さらに、所望に応じてCeに加えTb、Cu、Ag、Au、Fe、Cr、Nd、Dy、Co、Ni、Ti、Eu、およびPr等を含有させることもできる。
また、ガーネット構造を持ったイットリウム・アルミニウム・ガーネット系蛍光体の組成のうち、Alの一部をGaで置換すると、発光波長は短波長側にシフトすることができる。一方、組成のYの一部をGdで置換すると、発光波長が長波長側にシフトすることができる。Yの一部をGdで置換する場合、Gdへの置換を1割未満にし、且つCeの含有(置換)を0.03から1.0にすることが好ましい。Gdへの置換が2割未満では緑色成分が大きく赤色成分が少なくなるが、Ceの含有量を増やすことで赤色成分を補え、輝度を低下させることなく所望の色調を得ることができる。このような組成にすると蛍光物質自体の温度特性が良好となり発光ダイオードの信頼性を向上させることができる。また、赤色成分を多く有するように調整されたフォトルミネッセンス蛍光体を使用すると、ピンク等の中間色を発光することが可能となり、演色性に優れた半導体装置を形成することができる。
【0046】
このようなフォトルミネッセンス蛍光体は、Y、Gd、Al、及びCeの原料として酸化物、又は高温で容易に酸化物になる化合物を使用し、それらを化学量論比で十分に混合して原料を得る。又は、Y、Gd、Ceの希土類元素を化学量論比で酸に溶解した溶解液を蓚酸で共沈したものを焼成して得られる共沈酸化物と、酸化アルミニウムとを混合して混合原料を得る。これにフラックスとしてフッ化バリウムやフッ化アンモニウム等のフッ化物を適量混合して坩堝に詰め、空気中1350〜1450℃の温度範囲で2〜5時間焼成して焼成品を得、つぎに焼成品を水中でボールミルして、洗浄、分離、乾燥、最後に篩を通すことで得ることができる。
【0047】
本願発明の半導体装置において、このようなフォトルミネッセンス蛍光体は、2種類以上のセリウムで付活されたイットリウム・アルミニウム・ガーネット蛍光体や他の蛍光体を混合させてもよい。
【0048】
一方、半導体素子から放出される発光スペクトルが紫外領域や視感度が極めて低い可視光(例えば420nm以下)である場合、前記発光スペクトルの少なくとも一部を吸収し、2以上の発光ピークを持った発光スペクトルを発し、前記発光スペクトルは少なくとも一部が互いに補色となる蛍光である蛍光物質を用いることが好ましい。上記蛍光物質は、補色領域を含む2以上の発光スペクトルのピークを有しているため、蛍光物質自体の色調ズレが極めて小さく半導体素子のバラツキを吸収し、半導体装置の色調ズレを抑制することができる。上記2以上のピークを持った発光スペクトルは、短波長側の発光ピークの半値幅がそれよりも長波長側の発光ピークの半値幅よりも狭いことが好ましく、これにより、長波長の成分を比較的容易に取り出すことができると共に演色性の優れた半導体装置とすることができる。また、前記蛍光物質と共に、上記2以上の発光ピーク間に発光ピークをもった別の蛍光物質を用いると、白色を発光可能であると共に所望の中間色が高輝度に発光可能な半導体装置が得られる。更に、組成によって少なくとも一部が補色となる2以上の発光スペクトルの強度比が調整されていると、白色領域は少しのずれでも人間の目が敏感に感ずることができるものの、これによって、微調整が可能となる。
【0049】
具体的蛍光物質として、例えば、少なくともMg、Ca、Ba、Sr、Znから選択される1種を含むMで代表される元素と、少なくともMn、Fe、Cr、Snから選択される1種を含むM'で代表される元素とを有するEuで附活されたアルカリ土類金属ハロゲンアパタイト蛍光体を用いることができ、量産性良い白色系が高輝度に発光可能な半導体装置が得られる。特に、少なくともMn及び/又はClを含むEuで附活されたアルカリ土類金属ハロゲンアパタイト蛍光体は、耐光性や、耐環境性に優れている。また、窒化物半導体から放出された発光スペクトルを効率よく吸収することができる。さらに、白色領域を発光可能であると共に組成によってその領域を調整することができる。また、長波長の紫外領域を吸収して黄色や赤色を高輝度に発光可能である。そのため、演色性に優れた半導体装置とすることができる。なお、アルカリ土類金属ハロゲンアパタイト蛍光体例としてアルカリ土類金属クロルアパタイト蛍光体が含まれることは言うまでもない。
【0050】
前記アルカリ土類金属ハロゲンアパタイト蛍光体において、一般式が(M1−x−yEuM'10(POなどで表される場合(ただし、MはMg、Ca、Ba、Sr、Znから選択される少なくとも1種、M'はMn、Fe、Cr、Snから選択される少なくとも1種、Qはハロゲン元素のF、Cl、Br、およびIから選択される少なくとも1種、である。0.0001≦x≦0.5、0.0001≦y≦0.5である。)、量産性よく混色光が発光可能な半導体装置が得られる。
【0051】
また、前記アルカリ土類金属ハロゲンアパタイト蛍光体に加えて、BaMgAl1627:Eu、(Sr,Ca,Ba)(POCl:Eu、SrAl:Eu、ZnS:Cu、ZnGeO:Mn、BaMgAl1627:Eu,Mn、ZnGeO:Mn、YS:Eu、LaS:Eu、GdS:Euから選択される少なくとも1種の蛍光体を含有させると、より詳細な色調を調整可能であると共に比較的簡単な構成で演色性の高い白色光を得ることができる。
【0052】
上記蛍光体は、次に示す方法で得ることができる。構成元素のリン酸塩酸化物もしくは熱分解によって酸化物などになり得る各種化合物と塩化アンモニウムを所定量秤量し、ボールミル等で混合した後、坩堝に入れ、N,Hの還元雰囲気において、800℃から1200℃の温度で3〜7時間焼成する。得られた焼成品を湿式で粉砕、篩後、脱水、乾燥してアルカリ土類金属ハロゲンアパタイト蛍光体を得ることができる。
【0053】
前記x値は、第一附活材Eu元素の組成比を示すもので0.0001≦x≦0.5が好ましく、xが0.0001未満では発光輝度が低下し、xが0.5を越えても濃度消光によって発光輝度が低下する傾向にある。より好ましくは、0.005≦x≦0.4、さらに好ましくは、0.01≦x≦0.2である。
【0054】
また、前記y値は、Mn、Fe、Cr、Snのうちの少なくとも1種の元素の組成比を示すもので、0.0001≦y≦0.5が好ましく、より好ましくは0.005≦y≦0.4であり、さらに好ましくは0.01≦y≦0.3である。yが0.5を越えると濃度消光によって発光輝度が低下する傾向にある。
この蛍光体は紫外線から比較的短波長の可視光(たとえば、主波長が440nm以下)の励起により可視光である青色から白色系(たとえば、JIS Z8110の慣用色における白色、或いは系統色名図の基本色となる白色)、および赤色の発光色を示す。
特に、365nm程度の比較的長波長の紫外線によっても効率よく高輝度に発光可能であると共に赤色成分をも十分含むことから、平均演色性指数Raが80以上の良好な演色性を得ることもできる。
【0055】
また、上記蛍光体は、その組成比を変えることで、青色系〜白色系〜赤色系に種々変化させ色調を調整することができることが分かる。即ち、MがSrの場合、450nm付近にピークを持つEu2+の発光により発光色は青色を発光するが、MのMnでyの値を大きくするとMnの発光により蛍光体の発光色は青色〜白色系〜赤色系の発光色を示す。MがCaの場合もEu、Mn量に同様な変化を示すが、MがBaの場合は発光色の変化は少ない。また、本発明に用いられるこの蛍光体は長波長紫外線から比較的短波長可視光(例えば、230nm乃至300nmから400nm乃至425nm)で効率よく励起され、発光色はJIS Z8110でいうところの基本色名白色の領域に含まれる。なお、この蛍光体は紫外線全域で効率よく励起されることから、短波長紫外線用途使用としても有効に利用されうるものとして期待することができる。
【0056】
このような蛍光体を用いた半導体装置からは紫外線LEDや紫外線LDで励起された上述の蛍光体のうち、約460nm付近のピークと約580nm付近のピークの2つのピークを持った発光スペクトルを発光することが可能となる。この発光スペクトルは少なくともほぼ460nm付近のスペクトル成分と580nm付近のスペクトル成分を有し互いに補色となる蛍光を発している。この少なくともMn及び/又はClを含むEuで附活されたアルカリ土類金属ハロゲンアパタイト蛍光体に緑色を発光する蛍光体としてSrAl:Euを加えることによって更に演色性を高めることができる。
さらに、上述の蛍光体は所望に応じてEuに加えTb、Cu、Ag、Au、Cr、Nd、Dy、Co、Ni、Ti、およびPr等を含有させることもできる。
【0057】
また、本発明で用いられる蛍光物質の粒径は1μm〜100μmの範囲が好ましく、より好ましくは10μm〜50μmの範囲が好ましく、さらに好ましくは15μm〜30μmである。15μmより小さい粒径を有する蛍光物質は、比較的凝集体を形成しやすく、液状樹脂中において密になって沈降されるため、光の透過効率を減少させてしまう。本発明では、このような蛍光物質を有しない蛍光物質を用いることにより蛍光物質による光の隠蔽を抑制し半導体装置の出力を向上させる。また本発明の粒径範囲である蛍光物質は光の吸収率及び変換効率が高く且つ励起波長の幅が広い。このように、光学的に優れた特徴を有する大粒径蛍光物質を含有させることにより、半導体素子の主波長周辺の光をも良好に変換し発光することができ、半導体装置の量産性が向上される。
【0058】
ここで本発明において、蛍光物質の粒径は、体積基準粒度分布曲線により得られる値である。前記体積基準粒度分布曲線は、レーザ回折・散乱法により粒度分布を測定し得られるもので、具体的には、気温25℃、湿度70%の環境下において、濃度が0.05%であるヘキサメタリン酸ナトリウム水溶液に各物質を分散させ、レーザ回折式粒度分布測定装置(SALD−2000A)により、粒径範囲0.03μm〜700μmにて測定し得られたものである。本明細書において、この体積基準粒度分布曲線において積算値が50%のときの粒径値を中心粒径といい、本発明で用いられる蛍光物質の中心粒径は15μm〜50μmの範囲であることが好ましい。また、この中心粒径値を有する蛍光物質が頻度高く含有されていることが好ましく、頻度値は20%〜50%が好ましい。このように粒径のバラツキが小さい蛍光物質を用いることにより色ムラが抑制され良好な色調を有する半導体装置が得られる。また、蛍光物質は、本発明で用いられる拡散剤と類似の形状を有することが好ましい。本明細書において、類似の形状とは、各粒径の真円との近似程度を表す円形度(円形度=粒子の投影面積に等しい真円の周囲長さ/粒子の投影の周囲長さ)の値の差が20%未満の場合をいう。これにより、拡散剤による光の拡散と励起された蛍光体からの光が、理想的な状態で混ざり合い、より均一な発光が得られる。
【0059】
(実施例)
以下、本発明の実施例について説明する。なお、本発明は以下に示す実施例のみに限定されるものではない。
【0060】
【実施例1】
本発明の半導体装置として、図1に示すような表面実装(SMD)型の半導体装置を形成する。LEDチップは、発光層として単色性発光ピークが可視光である475nmのIn0.2Ga0.8N半導体を有する窒化物半導体素子を用いる。より具体的にはLEDチップは、洗浄させたサファイア基板上にTMG(トリメチルガリウム)ガス、TMI(トリメチルインジウム)ガス、窒素ガス及びドーパントガスをキャリアガスと共に流し、MOCVD法で窒化物半導体を成膜させることにより形成させることができる。ドーパントガスとしてSiHとCpMgを切り替えることによってn型窒化物半導体やp型窒化物半導体となる層を形成させる。
【0061】
LEDチップの素子構造としてはサファイア基板上に、アンドープの窒化物半導体であるn型GaN層、Siドープのn型電極が形成されn型コンタクト層となるGaN層、アンドープの窒化物半導体であるn型GaN層、次に発光層を構成するバリア層となるGaN層、井戸層を構成するInGaN層、バリア層となるGaN層を1セットとしGaN層に挟まれたInGaN層を5層積層させた多重量子井戸構造としてある。発光層上にはMgがドープされたp型クラッド層としてAlGaN層、Mgがドープされたp型コンタクト層であるGaN層を順次積層させた構成としてある。(なお、サファイア基板上には低温でGaN層を形成させバッファ層とさせてある。また、p型半導体は、成膜後400℃以上でアニールさせてある。)
【0062】
エッチングによりサファイア基板上の窒化物半導体に同一面側で、pn各コンタクト層表面を露出させる。各コンタクト層上に、スパッタリング法を用いて正負各台座電極をそれぞれ形成させた。なお、p型窒化物半導体上の全面には金属薄膜を透光性電極として形成させた後に、透光性電極の一部に台座電極を形成させてある。出来上がった半導体ウエハーにスクライブラインを引いた後、外力により分割させ、発光主波長が460nmであるLEDチップ(光屈折率2.1)を形成させる。
【0063】
次に、正及び負からなる一対のリード電極がインサートされて閉じられた金型内に、パッケージ成形体の下面側にあるゲートから溶融された成形用PPC樹脂を流し込み硬化してパッケージを形成する。前記パッケージは、半導体素子を収納可能な凹部を有し、該凹部底面から正及び負のリード電極が一方の主面が露出されるように一体成形されている。尚、このパッケージにおいて、正及び負のリード電極のアウタリード部は、パッケージの接合面の両端部でその接合面に沿って内側に折り曲げられてなり、その内側に折り曲げられた部分ではんだ付けされるように構成されている。
【0064】
このように形成されたパッケージの凹部底面に前記LEDチップをエポキシ樹脂にてLEDチップをダイボンドする。ここでダイボンドに用いられる接合部材は特に限定されず、Au−Sn合金や導電性材料が含有された樹脂やガラス等を用いることができる。含有される導電性材料はAgが好ましく、含有量が80%〜90%であるAgペーストを用いると放熱性に優れて且つ接合後の応力が小さい半導体装置が得られる。次に、ダイボンドされたLEDチップの各電極と、パッケージ凹部底面から露出された各リード電極とをそれぞれAuワイヤにて電気的導通を取る。本実施例ではワイヤにて電気的接続を取ったが、各電極とリード電極とを対向させるフリップチップ実装をすることも可能である。
【0065】
次に、フェニルメチル系シリコーン樹脂組成物100wt%(屈折率1.53)に対して、拡散剤として平均粒子径1.0μm、吸油量70ml/100g、である軽質炭酸カルシウム(屈折率1.62)を3wt%含有させ、自転公転ミキサーにて5分間攪拌を行う。次に攪拌処理により生じた熱を冷ますため、30分間放置し樹脂を定温に戻し安定化させる。
【0066】
このような軽質炭酸カルシウムは、粒子径のバラツキが少なく、前記組成物中においてほぼ均一に分散することができる。また、本実施例で用いられた軽質炭酸カルシウムは、柱状の形状を有し、且つあられ石型(アラゴナイト型)結晶を有している。このような拡散剤は、高い樹脂吸収性能と光拡散性能とを有しており、信頼性および光学特性に優れた発光装置を形成することができる。
【0067】
軽質炭酸カルシウムは、消石炭を高温にて炭酸ガスと反応させ焼成し、化学的に製造される。このため、純度の低い非晶質石灰石を原料とすることが可能でありコストを低くすることができる。また、設計の自由度が大きく、形状及び粒度をコントロールして、各粒子が均質な拡散剤を得ることができる。
【0068】
こうして得られた硬化性組成物を前記パッケージ凹部内に、前記凹部の両端部上面と同一平面ラインまで充填させる。最後に、70℃×3時間、及び150℃×1時間熱処理を施す。これにより、前記凹部の両端部上面から中央部にかけてほぼ左右対称の放物線状に凹みを有する発光面が得られる。
【0069】
また、前記硬化性組成物の硬化物からなる封止部材は、前記拡散剤の含有量の多い第一の層と、前記第一の層より前記拡散剤の含有量の少ないもしくは含有していない第二の層との2層に分離しており、前記LEDチップの表面は前記第一の層にて被覆されている。これにより、LEDチップから発光される光を効率良く外部へ取り出すことができると共に均一な発光が得られる。前記第一の層は、前記凹部の底面から前記LEDチップの表面にかけて連続して形成されていることが好ましく、これにより、発光面の形状を滑らかな凹部とすることができる。
【0070】
このようにして得られた半導体装置は、光度500mcd、光出力4mWであり、更に良好な指向特性が得られる。また、高温保管試験(100℃)、高温高湿保管試験(80℃、85%RH)、低温保管試験(−40℃)において、出力の低下はほとんどみられず、高い信頼性を有するといえる。
【0071】
(比較例1.)
比較のために、拡散剤を用いない以外は実施例1と同様にして半導体装置を形成する。このようにして得られた比較例1の半導体装置は、タック性を有する封止部材表面と前記凹部の両端部上面とがほぼ同一平面ラインである。このため、封止部材の表面に異物が付着し、外観上および光学特性上に悪影響が生じる。また、前記封止部材表面の信頼性を損なわないように実装することは非常に困難である。また、この比較例の半導体装置の光度及び光出力を測定すると、実施例1の半導体装置と比較して光度および光出力はともに5%低下する。
【0072】
(比較例2.)
比較のために、拡散剤を有しない硬化性組成物を前記パッケージ凹部内に、実施例1よりも少なく充填する以外は、実施例1と同様にして半導体装置を形成する。このようにして得られた比較例2の半導体装置は、各半導体装置間において封止部材の膜厚にバラツキが生じる。このため、各半導体装置間において光度および光出力がさまざまとなる。
【0073】
【実施例2】
封止部材に蛍光物質を含有させる以外は、実施例1と同様にして半導体装置を形成する。
蛍光物質は、Y、Gd、Ceの希土類元素を化学量論比で酸に溶解した溶解液を蓚酸で共沈させ、これを焼成して得られる共沈酸化物と、酸化アルミニウムとを混合して混合原料を得る。さらにフラックスとしてフッ化バリウムを混合した後坩堝に詰め、空気中1400℃の温度で3時間焼成することにより焼成品が得られる。焼成品を水中でボールミルして、洗浄、分離、乾燥、最後に篩を通して中心粒径が22Aμmである(Y0.995Gd0.0052.750Al12:Ce0.250蛍光物質を形成する。
【0074】
上記シリコーン樹脂組成物(屈折率1.53)に、上記蛍光物質(屈折率1.84)5.5wt%、及び拡散剤として平均粒子径2.0μm、吸油量70ml/100gである軽質炭酸カルシウム(屈折率1.62)を3wt%含有させ、自転公転ミキサーにて5分間攪拌を行う。次に攪拌処理により生じた熱を冷ますため、30分間放置し樹脂を定温に戻し安定化させる。こうして得られた硬化性組成物を前記パッケージ凹部内に、前記凹部の両端部上面と同一平面ラインまで充填させる。最後に、70℃×2時間、及び150℃×1時間熱処理を施す。これにより、前記凹部の両端部上面から中央部にかけてほぼ左右対称の放物線状に凹みを有する発光面が得られる。
【0075】
また、本実施例の封止部材は、前記蛍光物質を有する色変換層と、前記拡散剤の含有量の多い第一の層と、前記第一の層より前記拡散剤の含有量の少ないもしくは含有していない第二の層との、3層に分離しており、前記LEDチップの表面は前記色変換層と第一の層の2層にて被覆されている。これにより、LEDチップから発光される光の一部が色変換層にて効率よく波長変換され、前記第一の層にて前記LEDチップから発光される光と変換後の光とを良好に混合分散することができる。このように、混色分散を発光面から離れた箇所にて行うことにより、光の均一性が向上される。また、色変換層とLEDチップとの屈折率差(0.26)は、前記色変換層と第一の層との屈折率差(0.22)と近似のため、光を効率良く外部へ取り出すことができる。前記色変換層および第一の層は、前記凹部の底面から前記LEDチップの表面にかけて連続して形成されていることが好ましく、これにより、発光面の形状を滑らかな凹部とすることができる。また各層は、それぞれ均一な膜厚を有することが好ましい。
【0076】
このようにして得られた色変換型半導体装置は、光度500mcd、光出力4mWであり、更に良好な指向特性が得られる。また、高温保管試験(100℃)、高温高湿保管試験(80℃、85%RH)、低温保管試験(−40℃)において、出力の低下はほとんどみられず、高い信頼性を有するといえる。またCIE色度座標における色度の3σは0.0099であり、色バラツキが非常に少ない半導体装置が得られる。
【0077】
【実施例3】
蛍光物質として、発光素子の波長を吸収し黄緑色に発光するY(Al0.8Ga0.212:Ceと、前記発光素子の波長を吸収し赤色に発光する(Sr0.679Ca0.291Eu0.03Siとを使用する以外は、実施例2と同様にして発光ダイオードを形成すると、さらに演色性に優れた発光ダイオードが得られる。
【0078】
【実施例4】
蛍光物質として、組成式が(Y0.995Gd0.0052.750Al12:Ce0.250蛍光物質を用いる以外は、実施例2と同様にして発光ダイオードを形成すると、さらに演色性に優れた発光ダイオードが得られる。
【0079】
【実施例5】
蛍光物質として、中心粒径が約4μmであるY2.965Al5.1512:Ce0.035と中心粒径が約8μmである(Y0.98Gd0.022.965Al5.1512:Ce0.15とを1:1に混合した混合蛍光体を用いる以外は、実施例2と同様にして発光ダイオードを形成するとさらに均一性および演色性に優れ輝度の高い発光ダイオードが得られる。このように、同じ励起光により励起され同系色でありながら微妙に異なる波長の光を発光する2種類の蛍光物質を用いることにより、発光色の調整幅を広げることができる。また、前記2種類の蛍光物質は、それぞれ異なる中心粒径値を有しているので、これらの相互作用により好ましく分散することができ、発光色の均一性を高めることができる。また、本実施例で用いた蛍光物質の如く、Gdの置換量の少ないYAG系蛍光体は、温度特性に優れているため、長時間の使用においても高輝度に発光することが可能である。
【0080】
【実施例6】
主波長が464nmであるLEDチップを用い、蛍光物質として中心粒径が約8μmである(Y0.95Gd0.052.850Al5.1512:Ce0.15を用いる以外は、実施例2と同様にして発光ダイオードを形成すると、さらに均一性および演色性に優れ輝度の高い発光ダイオードが得られる。
【0081】
【実施例7】
主波長が466nmであるLEDチップを用い、蛍光物質として中心粒径が約8μmである(Y0.90Gd0.12.850Al5.1512:Ce0.15を用いる以外は、実施例2と同様にして発光ダイオードを形成すると、さらに均一性および演色性に優れ輝度の高い発光ダイオードが得られる。
【0082】
【実施例8】
拡散剤として平均粒子径が5μm、吸油量32ml/100gである重質炭酸カルシウム(屈折率1.57)を用いる。実施例1と同様の膜厚の封止部材を得るためには、重質炭酸カルシウムの含有量は、フェニルメチル系シリコーン樹脂組成物100wt%(屈折率1.53)に対して3wt%必要となり、実施例1と比較すると若干光取り出し効率が低下する。
このような重質炭酸カルシウムは、採掘した石灰石をそのまま粉砕・分級したものを用いる。このため、純度の高い結晶質石灰石を原料として用いることが好ましい。
【0083】
【実施例9】
拡散剤として、炭酸カルシウムとリン酸系化合物の反応物である多孔質炭酸カルシウムを用いる。実施例1と同様の膜厚を有する封止部材を形成するには、フェニルメチル系シリコーン樹脂組成物100wt%(屈折率1.53)に対して3wt%となり、少ない含有量で所望とする発光ダイオードが得られる。
本実施例における多孔質炭酸カルシウムは、原料の炭酸カルシウムにリン酸系化合物を反応させ、多孔質化したものである。
原料として用いられる炭酸カルシウムは、特に限定されず、重質炭酸カルシウム、軽質炭酸カルシウム等、種々のものを用いることができる。また、粒子の大きさ、形状、分散状態、結晶形、炭酸カルシウム中の不純物の程度等も特に限定されない。
また、使用するリン酸系化合物は、用いる炭酸カルシウムとの反応性が良好であることが好ましく、可溶性リン酸系化合物が好ましい。可溶性リン酸系化合物としては、例えばHPO、KPO、KHPO、NaHPO・12HO、(NH)PO・3HO等が挙げられる。使用するリン酸系化合物は、1種類に限定されず、2種以上を併用してもよい。
【0084】
【実施例10】
樹脂組成物としてジメチルシロキサン系シリコーン樹脂組成物を使用する以外は、実施例1と同様にして発光ダイオードを形成すると、実施例1と同様の効果が得られるが、実施例1と比較して封止部材の硬化前と硬化後における体積減少率は低くなる。
【0085】
【実施例11】
LEDチップの各電極上にAuバンプを形成し、超音波接合にてパッケージ凹部底面から露出された各リード電極とそれぞれ電気的導通を取る、フリップチップ実装を行う以外は、実施例1と同様にして発光ダイオードを形成すると、実施例3と同様の硬化が得られる他、発光面側に光を遮断するワイヤが存在しないため、さらに均一な発光が得られる。また、LEDチップとリード電極との接合にエポキシ樹脂等の耐光性および耐熱性に弱い部材を使用せず、金属のみにて接合するため、大電流を投下した際においても高い信頼性を維持することができる。
【0086】
(産業状の利用の可能性)
以上のように、本発明の半導体装置は、熱安定性の高い親水性主鎖と疎水性主鎖からなるポリマー樹脂を用い、これと共に光拡散作用と共に前記ポリマー樹脂の体積を熱硬化過程において減少させることが可能な拡散剤を用いて封止部材を形成することにより、高い信頼性を有し且つ良好な光学特性を有する半導体装置を量産性良く得ることができる。また、大電流を投下しても劣化することなく信頼性を維持することも可能であり、信頼性が高く且つ照明と同等の明るさを発光することが可能な半導体装置を提供でき、産業上の利用価値は極めて高い。
【図面の簡単な説明】
【図1】 図1は本発明の発光装置を示す模式的平面図及び模式的断面図である。
【図2】 図2は本発明の他の発光装置を示す模式的平面図及び模式的断面図である。
【図3】 図3は本発明の他の発光装置を示す模式的平面図及び模式的断面図である。
[0001]
  (Technical field)
  The present invention relates to a semiconductor device used as a light source such as in-switch illumination, a full color display, a liquid crystal backlight, and the like, and particularly relates to a light emitting device having excellent reliability.
[0002]
  (Background technology)
  Today, high-luminance and high-power semiconductor elements and small and highly sensitive light-emitting devices have been developed and used in various fields. Such a light emitting device is utilized for, for example, a light source of an optical printer head, a light source of a liquid crystal backlight, a light source of various meters, various reading sensors and the like by taking advantage of features such as small size, low power consumption and light weight.
[0003]
  Such a light-emitting device uses, for example, a package that has a recess capable of accommodating a semiconductor element, and is integrally formed by inserting the positive and negative lead electrodes so that one main surface is exposed from the bottom surface of the recess. An LED chip as a semiconductor element is die-bonded on the lead electrode exposed from the bottom of the recess, and each electrode of the LED chip and the lead electrode provided in the package are electrically connected by a gold wire or the like. In addition, the LED chip and the gold wire are covered with a resin as a sealing member in the recess. Thereby, the components inside the package are protected from the external environment such as moisture and external force, and a highly reliable light-emitting device can be obtained.
[0004]
  Currently, LED chips have higher output and shorter wavelengths due to dramatic technological advances. Such an LED chip can emit high-power light by dropping a large current, but is accompanied by high-temperature heat generation during light emission. Due to this, discoloration deterioration of the sealing resin disposed in the vicinity of the LED chip occurs. In particular, when a light-transmitting organic member having a carbon-carbon double bond that is weak against heat is used as the sealing member disposed in the vicinity of the LED chip, the bond is broken and the optical properties are impaired. In addition, due to the difference in the thermal expansion coefficient of each member, wire breakage or cracks occur in each member, and the reliability tends to decrease rapidly as the elapsed time of use increases.
[0005]
  Therefore, when using a light emitting element that emits light in the near ultraviolet region and generates high heat, a silicone resin that is excellent in light resistance and heat resistance to light in the near ultraviolet region and has plasticity against thermal stress is suitably used. ing. Since the main skeleton of the silicone resin does not have a carbon-carbon double bond that causes photodegradation, electron transition absorption hardly occurs, and hardly deteriorates even when irradiated for a long time. Moreover, since it is excellent in flexibility, damage to the semiconductor device due to thermal stress can be prevented.
[0006]
  On the other hand, when the cured product mainly composed of silicone resin is excellent in flexibility, the fallout surface has low mechanical strength and tackiness. In addition, the silicone resin has high stability to heat, and the shape of the cured product mainly composed of silicone is determined at the time of filling before curing without being thermally contracted in the curing process. For this reason, when providing the sealing member which consists of a silicone resin in the package which has a recessed part as mentioned above, it is necessary to finely adjust the silicone resin filling amount so that the surface may not contact the exterior. Specifically, by injecting a composition mainly composed of a silicone resin up to a position one step below the upper surface of the outer edge of the package and thermosetting it, the surface having tackiness is prevented from coming into contact with the outside. Yes. Thereby, a highly reliable light-emitting device can be obtained.
[0007]
  However, at the present time when light-emitting devices that are smaller and thinner are desired, it is very difficult to fine-tune and fill the silicone resin composition into the package having the recesses as described above. The efficiency is poor and good yield cannot be obtained.
[0008]
  (Disclosure of the Invention)
  The present invention has been made to solve the above-described problems, and an object of the present invention is to obtain a miniaturized semiconductor device having high reliability and good optical characteristics with high yield.
As a result of various experiments, the present inventor can adjust the oil absorption amount to a cured material of a thermosetting composition mainly composed of a resin that has excellent thermal stability and does not change in volume before and after curing.lightIt has been found that when a diffusing agent is added and cured, the volume of the thermosetting composition can be reduced in the thermosetting process, and the present invention has been achieved.
[0009]
  The semiconductor device of the present invention is a semiconductor device having a semiconductor element, a package having a recess in which the semiconductor element is accommodated, and a sealing member filled in the recess, the sealing member comprising: Translucent polymer resin having hydrophilic main chain and hydrophobic side chain, and capable of absorbing at least the polymer resinLight whose oil absorption (Japanese Industrial Standard JIS K5101) is 30 ml / 100 g to 150 ml / 100 gA cured product of a curable composition comprising a diffusing agent as an essential component.The upper surface of the sealing member has a parabolic recess from the end to the center.It is characterized by that.
[0010]
  The semiconductor device thus configured has excellent reliability and optical characteristics, and can be obtained with a high yield.In particular, since the upper surface is recessed in a parabolic shape, it is possible to further prevent the upper surface having tackiness from coming into contact with the outside during mounting or the like. Further, when the sealing member is translucent, a light emitting device capable of emitting light uniformly over the entire surface is obtained.
[0011]
  In the semiconductor device of the present invention, the sealing member preferably has a hardness of 5 Shore (A) to 80 Shore (D), thereby enabling a large current to be dropped and a high output semiconductor device to be obtained. Be.
[0012]
MaIn the semiconductor device of the present invention,lightThe diffusing agent preferably has a needle-like or columnar shape,lightIncreases the polymer resin absorption rate of the diffusing agent,lightA desired sealing member shape can be realized by the amount of the diffusing agent.
  In the semiconductor device of the present invention,lightThe diffusing agent is preferably an aragonite-type crystal, whereby a semiconductor device capable of diffusing light well and emitting light uniformly can be obtained.
[0013]
  In the semiconductor device of the present invention,lightThe diffusing agent preferably has an average particle size value of 0.1 μm to 5.0 μm, whereby a semiconductor device capable of emitting light at a uniform and high luminous intensity with uneven color unevenness is obtained.
  In the semiconductor device of the present invention,lightThe refractive index of the diffusing agent issemiconductorIt is preferable that the refractive index is lower than the refractive index of the element and higher than the refractive index of the translucent polymer resin. This allows the light emitted from the semiconductor element to be taken out to the outside without being sealed inside. Is obtained.
[0014]
  Moreover, in the semiconductor device of the present invention, the sealing member is formed from the semiconductor element side.lightFrom the first layer having a high content of diffusing agent and the first layer,lightA second layer having a low content of diffusing agent, andsemiconductorIt is preferable that the surface of the element is substantially covered with the first layer. Thereby, the extraction efficiency of the light emitted from the semiconductor element can be increased.
[0015]
  In the semiconductor device of the present invention, the sealing member may contain a fluorescent material capable of absorbing at least a part of light emitted from the semiconductor element and emitting light having different wavelengths. Thus, a color conversion type semiconductor device capable of emitting light uniformly with little color variation between the light emitting devices can be obtained.
  In the semiconductor device of the present invention, the refractive index of the fluorescent material may besemiconductorLower than the refractive index of the element and saidlightIt is preferably higher than the refractive index of the diffusing agent, whereby the extraction efficiency of light emitted from the semiconductor element can be improved.
[0016]
  In the semiconductor device of the present invention, the fluorescent substance and thesemiconductorThe refractive index difference between the element and the fluorescent materiallightIt is preferable that the difference in refractive index with the diffusing agent is substantially the same, whereby a light emitting device having excellent color mixing properties can be obtained.
[0017]
  In the semiconductor device of the present invention, a translucent polymer resin,lightA sealing member obtained by curing a curable composition containing a diffusing agent and a fluorescent substance as an essential component is provided between the semiconductor element and the first layer., Capable of absorbing at least part of light emitted from the semiconductor element and emitting light having different wavelengthsIt is preferable to have a color conversion layer containing the fluorescent material. That is, a color conversion layer containing a fluorescent material on the surface of the semiconductor element,lightFrom the first layer having a high content of diffusing agent, and the first layerlightIt is preferable that the second layer having a low content of the diffusing agent is sequentially laminated, whereby the light emitted from the semiconductor element and a part of the light are absorbed and converted by the color conversion layer. The reflected light is reflected and scattered by the first layer and mixed well. Next, the directivity of the mixed color light is improved by passing through the second layer. This effect is prominent when a fluorescent material having a large particle size, particularly a fluorescent material having a center particle size of 15 μm to 50 μm, and a light emitting device capable of emitting light with high brightness and uniformity can be obtained.
[0018]
  According to another aspect of the present invention, there is provided a method for forming a semiconductor device, comprising: forming a light emitting device having a semiconductor element, a package having a recess capable of accommodating the semiconductor element, and a sealing member filled in the recess. A method,
Translucent polymer resin having hydrophilic main chain and hydrophobic side chain and capable of absorbing the translucent polymer resinLight whose oil absorption (Japanese Industrial Standard JIS K5101) is 30 ml / 100 g to 150 ml / 100 gA first step of adjusting a curable composition liquid containing a diffusing agent as an essential component;
  A second step of injecting the curable composition liquid into the recess of the package to a line substantially flush with the upper surface of the package;
  Heat treatmentByCuring the curable composition liquidAt the same time, a parabolic recess is formed from the end to the center of the upper surface of the sealing member.A third step,
It is characterized by having. Thereby, a semiconductor device having excellent reliability and optical characteristics can be obtained with high productivity.
[0019]
  (Best Mode for Carrying Out the Invention)
  Embodiments according to the present invention will be described below with reference to the drawings.
  FIG. 1 is a schematic plan view and a schematic cross-sectional view of an SMD type light emitting diode which is an embodiment of the present invention. The resin package 1 is used which has a recess and from which the surface of each tip of the pair of lead electrodes 2 and 3 is exposed from the bottom of the recess. The light emitting element 4 is placed on the bottom surface of the recess, and each electrode of the light emitting element 4 and each lead electrode tip are electrically connected by a gold wire 6. The light-emitting element 4 includes a nitride semiconductor (Al) through a buffer layer made of gallium nitride on a sapphire substrate.XGaYInZN, 0 ≦ X ≦ 1, 0 ≦ Y ≦ 1, 0 ≦ Z ≦ 1, and X + Y + Z = 1) are formed. The light emitting element 4 installed in this way can adjust at least the degree of absorption of the polymer resin in the translucent polymer resin having a hydrophilic main chain and a hydrophobic side chain.lightThe diffusing agent is covered with a cured product 8 of a curable composition obtained by stirring. Hereafter, each structure in embodiment of this invention is explained in full detail.
[0020]
  (Semiconductor element 4)
  In the present invention, the semiconductor element 4 is not particularly limited, but in the present embodiment, a light emitting element is used to form a light emitting device that emits light to the outside. In this embodiment mode, when a fluorescent substance is used together, a light-emitting element having a light-emitting layer that emits light capable of efficiently exciting the fluorescent substance is preferable. Examples of such a light-emitting element include various semiconductors such as ZnSe and GaN, but a nitride semiconductor (In that can emit a short wavelength capable of efficiently exciting a fluorescent material).XAlYGa1-XYN, 0 ≦ X, 0 ≦ Y, and X + Y ≦ 1) are preferable. Further, the nitride semiconductor may contain boron or phosphorus as desired. Examples of the structure of the semiconductor layer include a homostructure having a MIS junction, a PIN junction, a pn junction, and the like, a heterostructure, and a double heterostructure. Such a semiconductor layer can have various emission wavelengths depending on the material and the degree of mixed crystal. In addition, a single quantum well structure or a multiple quantum well structure in which the semiconductor active layer is formed in a thin film in which a quantum effect is generated can be used.
[0021]
  When a nitride semiconductor is used, a material such as sapphire, spinel, SiC, Si, ZnO, or GaN is preferably used for the semiconductor substrate. In order to form a nitride semiconductor with good crystallinity with high productivity, it is preferable to use a sapphire substrate. A nitride semiconductor can be formed on the sapphire substrate by MOCVD or the like. For example, a buffer layer made of GaN, AlN, GaAIN, or the like is formed on a sapphire substrate, and a nitride semiconductor having a pn junction is formed thereon to form a semiconductor element. Further, after the semiconductor layer is stacked on the substrate, the substrate can be removed to obtain a semiconductor element having no substrate.
[0022]
  As an example of a semiconductor element having a pn junction using a nitride semiconductor, a first contact layer formed of n-type gallium nitride, a first clad layer formed of n-type aluminum nitride / gallium on a buffer layer, nitrided Examples include a double hetero configuration in which an active layer formed of indium gallium, a second cladding layer formed of p-type aluminum nitride / gallium, and a second contact layer formed of p-type gallium nitride are sequentially stacked. Nitride semiconductors exhibit n-type conductivity without being doped with impurities. When forming a desired n-type nitride semiconductor, for example, to improve luminous efficiency, it is preferable to appropriately introduce Si, Ge, Se, Te, C, etc. as an n-type dopant. On the other hand, when forming a p-type nitride semiconductor, the p-type dopants such as Zn, Mg, Be, Ca, Sr, and Ba are doped. Since a nitride semiconductor is difficult to be converted to a p-type simply by doping a p-type dopant, it is preferable to reduce the resistance by heating in a furnace or plasma irradiation after the introduction of the p-type dopant. After the electrodes are formed, a semiconductor element made of a nitride semiconductor can be formed by cutting the semiconductor wafer into chips. Also, by patterning, only the bonding part of each electrode is exposed and the entire element is covered.2When an insulating protective film made of, for example, is formed, a miniaturized semiconductor device can be formed with high reliability.
[0023]
  In the light emitting device of the present invention, when white light is emitted, the emission wavelength of the semiconductor element is preferably 400 nm or more and 530 nm or less in consideration of the complementary color relationship with the emission wavelength from the fluorescent material, deterioration of the translucent resin, and the like. 420 nm or more and 490 nm or less is more preferable. Furthermore, in order to improve the excitation efficiency of the semiconductor element and the emission efficiency of the fluorescent material, the emission wavelength of the semiconductor element is preferably 450 nm or more and 475 nm or less.
[0024]
  Further, the resin used for the sealing member of the present invention is relatively difficult to be deteriorated by ultraviolet rays, and it is also possible to use a semiconductor element whose main emission wavelength is an ultraviolet region shorter than 400 nm or a short wavelength region of visible light. In addition, by combining a light emitting element that emits a wavelength in the near ultraviolet region and a fluorescent material that can absorb a part of the wavelength and emit other wavelengths, a color with less color unevenness can be obtained. A conversion type light emitting device can be obtained. Since the emission color of such a color conversion type light-emitting device uses only light emitted from the fluorescent material, color adjustment can be performed relatively easily. In particular, when using a semiconductor element that emits light in the ultraviolet region, compared to the case of using a semiconductor element that emits visible light, only the emission color of the fluorescent material absorbs variations such as the wavelength between the semiconductor elements. Since the chromaticity can be determined by, mass productivity can be improved.
[0025]
  (Sealing member 8)
  In the present embodiment, a sealing member whose surface is a light emitting surface is provided in a recess of a package in which the semiconductor element is disposed. The sealing member is capable of absorbing a translucent polymer resin composed of a hydrophilic main chain and a hydrophobic side chain, and the polymer resin.lightA curable composition having a diffusing agent, and the upper surface of the sealing member is located on the inner side below the outer upper surface of the package.
[0026]
  Such a sealing member can absorb oil with the polymer resin, for example.lightA liquid curable composition having a diffusing agent is filled, for example, in a recessed package in which a light emitting element is disposed, up to the same plane line as the upper surface of both ends of the recessed portion or more, and then cured by heat treatment. Then, the volume of the cured product is reduced compared to that before curing, and the height of the upper surface of the obtained cured product is lower than the upper surfaces of both end portions of the concave portion. Thus, it is possible to absorb oil into a composition mainly composed of a resin that does not cure and shrink by heat treatment.lightBy coexisting a diffusing agent, the volume of the composition can be reduced during the curing reaction. As a result, even when a composition having a tackiness on the surface of the cured product is used, the surface can be placed inside the outline of the package without finely adjusting the filling amount of the composition. Thereby, a highly reliable light-emitting device can be obtained both inside and outside.
[0027]
  Thus, the sealing member of the present invention includes a translucent polymer resin and the abovelightThe curable composition liquid containing a diffusing agent as an essential component can be easily obtained by simply filling the surface of the recess package with the same plane line as the outer surface of the recess package and thermally curing, and there is no need to finely adjust the filling amount according to the appearance. . In addition, the volume of the sealing member is determined by the volume of the package, andlightSince the volume shrinkage rate from before curing to after curing of the sealing member is determined by the degree and content of the surface treatment of the diffusing agent, the volume of the sealing member in each semiconductor device can be made constant. Thereby, mass productivity and yield are improved. Thus used in the present inventionlightThe diffusing agent can easily form a sealing member using a highly reliable resin in a desired thickness. In particular, in the present invention, a highly reliable semiconductor device can be formed with high productivity by using a thermosetting composition containing a polymer resin having high heat stability as an essential component.
[0028]
  Further, it is preferable that the upper surface of the sealing member serving as the light emitting surface of the semiconductor device is smooth and has a shape that is recessed in a parabolic shape from both end portions to the central portion, thereby providing high reliability and excellent optical characteristics. A semiconductor device can be obtained. Furthermore, it is preferable that the said dent is substantially bilaterally symmetrical with respect to the major axis and the minor axis, whereby a light emitting device having good directivity can be obtained. Such a light-emitting surface has a highly heat-stable polymer resin composed of a hydrophilic main chain and a hydrophobic main chain, and the oil absorption can be adjusted.lightIt can be easily obtained by using a composition containing a diffusing agent as an essential component and reducing the volume of the polymer resin in the curing process.
[0029]
  On the other hand, saidlightWhen a sealing member is formed by injecting a small amount of a composition containing a polymer resin composed of a hydrophilic main chain and a hydrophobic main chain having high heat stability without using a diffusing agent into the package recesses, In a semiconductor device, it is difficult to make the injection amount of the polymer resin constant, and the film thickness of the sealing member varies between the semiconductor devices. Further, when the sealing member is formed by curing a resin composition having a high viscosity, the upper surface of the sealing member tends to be uneven, which causes uneven color and variation in directivity. In addition, when the polymer resin contains a fluorescent substance or the like, color variation occurs between the light emitting devices.
[0030]
  Thus, in the present invention, the polymer resin and thelightSince the curable composition requiring the diffusing agent is always injected so as to seal the entire volume of the package, a certain amount of the curable composition can be injected into each semiconductor device. Thereby, even if a fluorescent substance or a pigment is contained, a semiconductor device with little color variation and excellent yield can be obtained.
  Here, a specific method for forming the sealing member in the semiconductor device of the present embodiment will be described.
[0031]
1. First step
  As the translucent polymer resin, a silicone resin having a viscosity of 7000 mPa · S and a refractive index of 1.53 is used. The silicone resin composition mainly composed of the silicone resin has an average particle diameter of 1.0 μtm and an oil absorption. Light calcium carbonate having an amount of 70 ml / 100 g is stirred.
[0032]
  (Translucent polymer resin)
  The cured product of a curable composition mainly comprising a translucent polymer resin composed of a hydrophilic main chain and a hydrophobic side chain, which is used in the present invention, has excellent light resistance and flexibility due to the properties of the hydrophilic main chain. , And has thermal stability. An example of such a resin is a siloxane-based silicone resin in which a siloxane bond is a skeleton and an organic group is directly bonded to the silicon element. From the viewpoint of heat resistance, the organic group used in the siloxane-based silicone resin is preferably a methyl group or a phenyl group, and a dimethylsiloxane-based silicone resin, a phenylsiloxane-based silicone resin, or a phenylmethylsiloxane-based silicone resin is preferably used. In particular, when a nitride-based semiconductor element is used, it is preferable to use a phenylmethylsiloxane-based silicone resin because it can extract light well.
  From the viewpoint of workability, the viscosity of the translucent polymer resin is preferably 2000 mPa · s to 20000 mPa · s, more preferably 3000 mPa · s to 10000 mPa · s.
[0033]
  In the translucent polymer resin,lightWhen the diffusing agent is contained and stirred, heat is generated and the resin is likely to be heated and become unstable. Therefore, it is preferable to leave the resin for a certain period of time until the temperature returns to a constant temperature and stabilizes before filling. By using a resin having high thermal stability and a viscosity in the above range, even if the resin is left for a certain time after stirring, the resin in the resinlightIt becomes possible to maintain the dispersion state of the diffusing agent in a preferable state. Thereby, reliability and yield are improved.
[0034]
  Further, the hardness after curing is preferably 5 Shore (A) to 80 Shore (D), and more preferably 5 Shore (A) to 40 Shore (D). This can prevent wire breakage and cracks in each member due to internal stress. Thus, by using a resin having excellent thermal stability and excellent flexibility, a semiconductor device capable of emitting a large current and emitting light with high luminance can be obtained.
[0035]
  In consideration of use with the semiconductor element (refractive index 2), the refractive index of the polymer resin is preferably 1.4 to 1.65. In the present invention, a translucent polymer resin comprising a hydrophilic main chain and a hydrophobic main chain such as a silicone resin is used, but the polymer resin to be used is not particularly limited, and an epoxy resin, an acrylic resin, a urethane resin, a diallyl phthalate resin is used. It is also possible to use fluorine resin or the like.
[0036]
  (lightDiffusion agent)
  In the present invention, at least the polymer resin can be absorbed in the curable composition mainly composed of the polymer resin.lightCan absorb oil as a diffusing agentlightA diffusing agent is used. Specifics used in the present inventionlightExamples of the diffusing agent include light calcium carbonate, heavy calcium carbonate, talc, white carbon, magnesium carbonate, hydrous aluminum oxalate / magnesium, and barium sulfate.
[0037]
  Used in the present inventionlightAs the shape of the diffusing agent, those having various structures such as a cubic shape such as a hexagonal crystal, a spindle shape, a crushed shape, a rod shape such as a needle shape or a column shape can be used. In particular, it has a rod shape such as a needle shape or a column shapelightIt is preferable to use a diffusing agent, such aslightWhen the diffusing agent is dispersed in the polymer resin and filled in the package recess,lightThe diffusing agent settles in a state where the surface having a large area faces the light emitting element. With even smaller particleslightWhen a diffusing agent is used,lightOne end of the diffusing agent is agglomerated at one location due to the attractive force between the particles, and the other end becomes an aggregate separated from each other. Such an aggregate can satisfactorily shrink the sealing member in the thickness direction, and can provide a certain distance between each particle and each aggregate, so that it does not hinder the light extraction efficiency. Can diffuse light.
  Also,lightThe average particle diameter of the diffusing agent is preferably in the range of 0.1 μm to 5.0 μm, more preferably 1.0 μm to 2.5 μm. Having such an average particle size valuelightThe diffusing agent can efficiently absorb the polymer resin by a thermal action during curing.
[0038]
  Here, in this specification, the average particle diameter is measured by the sub-sieving method based on the air permeation method. Also,lightWhen the diffusing agent is a crushed, needle-like, or columnar rod-like crystal or the like, the long side length measured by transmission electron microscopy is preferably 1.0 μm to 3.0 μm.
[0039]
  Also saidlightThe diffusing agent preferably has a refractive index lower than that of the semiconductor element and higher than that of the polymer resin, which is preferable because it improves light extraction efficiency. In particular, calcium carbonatelightThe diffusing agent is hail type (aragonite type) crystallightIt is preferable to use a diffusing agent, therebylightLight can be refracted well by the diffusing agent.
The volume reduction rate of the translucent polymer resin islightIn addition to adjusting the content of the diffusing agent,lightIt can be adjusted depending on the degree of surface treatment applied to the diffusing agent. like thislightThe surface treatment of the diffusing agent is Al2O3, Fe2O3, Si or the like can be used.lightThe diffusing agent tends to reduce the oil absorption as the degree of surface treatment increases. Moreover, it is preferable to use the light-transmitting polymer resin in the present invention with almost no surface treatment, whereby the volume of the light-transmitting polymer resin can be greatly reduced with a small content. That meanslightThe absorption amount and the oil absorption amount of the translucent polymer resin of the diffusing agent are considered to be in correlation with each other,lightAs the content of the diffusing agent increases, the volume reduction rate before and after curing of the sealing member mainly composed of the translucent polymer resin increases. Thus, according to the desired volume reduction amount of the resinlightThe diffusing agent can be adjusted and used, and the present invention can be applied to a semiconductor device using a package of any volume size.
[0040]
  lightThe oil absorption amount of the diffusing agent is preferably 30 ml / 100 g to 150 ml / 100 g, more preferably 50 ml / 100 g to 150 ml / 100 g in a state where the surface treatment is not performed. This makes it possible to set a wide range of oil absorption by performing surface treatment later. In this specification, the oil absorption amount is a value measured by the oil absorption amount test method of Japanese Industrial Standard (JIS K5101).
  AlsolightThe content of the diffusing agent in the sealing member is preferably 0.5% to 5%, thereby improving the light intensity, reliability, and workability of the light emitting device without reducing the light extraction efficiency of the light emitting element. However, the volume of the curable composition can be reduced after the heat treatment.
[0041]
2. Second and third process
  The obtained curable composition liquid is allowed to stand for a certain period of time, and the heat of the resin is returned to a constant temperature. Then, the resin is poured into a package recess in which a light emitting measure is arranged up to almost the same plane line as the upper surface of the end of the recess (first Second step), heat curing (third step). In this heat curing process, the volume of the curable composition after filling is reduced by some action of light calcium carbonate. The surface of the sealing member, which is a cured product thus obtained, has a shape having a parabolic recess from the upper surface of the end portion to the center portion. The recess is substantially symmetrical with respect to the major axis and the minor axis.
[0042]
  The above-described action is presumably because the proportion of light calcium carbonate absorbed is promoted during the heat-curing process, and a part of the silicone resin is absorbed by the light calcium carbonate. Further, the volume of light calcium carbonate is considered to be substantially constant without increasing even after absorbing the resin. Or it is thought that the volume reduction rate of the said silicone resin is higher than the volume increase rate by the silicone resin absorption of light calcium carbonate. As a result, the volume of the cured sealing member is smaller than that at the time of filling, and as a result, the surface of the cured and contracted sealing member is parabolic from the upper surface to the center of both ends of the package recess, and the long axis is viewed from the light emitting surface. And it becomes a recessed part substantially symmetrical with respect to a short axis. Thereby, a semiconductor device having a good light emitting surface and excellent directivity can be obtained. In addition, since the surface is formed below the upper surfaces of both ends of the package recess, the surface can be prevented from coming into contact with the outside during inspection or mounting, and a highly reliable semiconductor device can be obtained.
[0043]
  (Fluorescent substance 8)
  The semiconductor device of the present embodiment may contain the fluorescent material 8 in the sealing member. Here, the fluorescent substance used in the present invention will be described in detail. In the present invention, each constituent member can contain various fluorescent substances such as an inorganic tendency substance and an organic fluorescent substance. As an example of such a fluorescent substance, there is a fluorescent substance containing a rare earth element which is an inorganic fluorescent substance. As the rare earth element-containing fluorescent material, specifically, at least one element selected from the group of Y, Lu, Sc, La, Gd, and Sm, and at least one selected from the group of Al, Ga, and In Garnet (garnet) type phosphors having two elements.
  The fluorescent material used in the semiconductor device of this embodiment is a semiconductor having a light emitting layer made of a nitride semiconductor.Body elementIt is based on a cerium-activated yttrium / aluminum oxide fluorescent material that can emit light of different wavelengths by exciting the light emitted from the child. As a specific yttrium / aluminum oxide fluorescent material, YAlO3: Ce, Y3Al5O12: Ce (YAG: Ce) or Y4Al2O9: Ce, and also a mixture thereof. The yttrium / aluminum oxide phosphor may contain at least one of Ba, Sr, Mg, Ca, Zn, and Pr. Moreover, by containing Si, the reaction of crystal growth can be suppressed and the particles of the fluorescent material can be aligned.
[0044]
  In this specification, the yttrium / aluminum oxide phosphor activated by Ce is to be interpreted in a broad sense, and a part or all of yttrium is selected from the group consisting of Lu, Sc, La, Gd and Sm. Or a part or all of aluminum is used in a broad sense including a phosphor having a fluorescent action in which any one or both of Ba, Tl, Ga, and In are substituted.
  More specifically, the general formula (YzGd1-z)3Al5O12: Photoluminescence phosphor represented by Ce (where 0 <z ≦ 1) or a general formula (Re1-aSma)3Re '5O12: Ce (where 0 ≦ a <1, 0 ≦ b ≦ 1, Re is at least one selected from Y, Gd, La, Sc, and Re ′ is at least one selected from Al, Ga, In) The photoluminescence phosphor shown in FIG.
[0045]
  Further, the photoluminescence phosphor can increase the excitation emission efficiency in a long wavelength region of 460 nm or more by containing Gd (gadolinium) in the crystal. As the Gd content increases, the emission peak wavelength shifts to a longer wavelength, and the entire emission wavelength also shifts to the longer wavelength side. That is, when a strong reddish emission color is required, it can be achieved by increasing the amount of Gd substitution. On the other hand, as Gd increases, the emission luminance of photoluminescence by blue light tends to decrease. Furthermore, in addition to Ce, Tb, Cu, Ag, Au, Fe, Cr, Nd, Dy, Co, Ni, Ti, Eu, Pr, and the like can be contained as desired.
  Further, when a part of Al is replaced with Ga in the composition of the yttrium / aluminum / garnet phosphor having a garnet structure, the emission wavelength can be shifted to the short wavelength side. On the other hand, when part of Y in the composition is replaced with Gd, the emission wavelength can be shifted to the longer wavelength side. When substituting a part of Y with Gd, it is preferable that the substitution with Gd is less than 10%, and the Ce content (substitution) is 0.03 to 1.0. If the substitution with Gd is less than 20%, the green component is large and the red component is small. However, by increasing the Ce content, the red component can be supplemented and a desired color tone can be obtained without lowering the luminance. With such a composition, the temperature characteristics of the fluorescent substance itself are good, and the reliability of the light emitting diode can be improved. In addition, when a photoluminescent phosphor adjusted to have a large amount of red component is used, it becomes possible to emit an intermediate color such as pink, and a semiconductor device having excellent color rendering properties can be formed.
[0046]
  Such a photoluminescent phosphor uses an oxide or a compound that easily becomes an oxide at a high temperature as a raw material for Y, Gd, Al, and Ce, and mixes them sufficiently in a stoichiometric ratio. Get. Alternatively, a mixed raw material obtained by mixing a coprecipitation oxide obtained by firing a solution obtained by coprecipitation of a solution obtained by dissolving a rare earth element of Y, Gd, and Ce in an acid in a stoichiometric ratio with oxalic acid and aluminum oxide. Get. An appropriate amount of fluoride such as barium fluoride or ammonium fluoride is mixed as a flux and packed in a crucible, and baked in air at a temperature range of 1350 to 1450 ° C. for 2 to 5 hours to obtain a baked product. Can be obtained by ball milling in water, washing, separating, drying and finally passing through a sieve.
[0047]
  In the semiconductor device of the present invention, such a photoluminescent phosphor may be a mixture of yttrium / aluminum / garnet phosphor activated by two or more kinds of cerium and other phosphors.
[0048]
  On the other hand, when the emission spectrum emitted from the semiconductor element is in the ultraviolet region or visible light with extremely low visibility (for example, 420 nm or less), the emission has at least a part of the emission spectrum and has two or more emission peaks. It is preferable to use a fluorescent material that emits a spectrum and whose emission spectrum is fluorescence that is at least partially complementary to each other. Since the fluorescent material has two or more emission spectrum peaks including a complementary color region, the color tone of the fluorescent material itself is extremely small and absorbs the variation of the semiconductor element, thereby suppressing the color tone shift of the semiconductor device. it can. In the emission spectrum having two or more peaks, it is preferable that the half-value width of the emission peak on the short wavelength side is narrower than the half-value width of the emission peak on the longer wavelength side. Thus, the semiconductor device can be easily taken out and has excellent color rendering properties. Further, when another fluorescent material having an emission peak between the two or more emission peaks is used together with the fluorescent material, a semiconductor device capable of emitting white light and emitting a desired intermediate color with high luminance can be obtained. . Furthermore, if the intensity ratio of two or more emission spectra, at least part of which are complementary colors, is adjusted depending on the composition, the white area can be sensitive to the human eye even with a slight shift, but this allows fine adjustment. Is possible.
[0049]
  As a specific fluorescent material, for example, an element represented by M including at least one selected from Mg, Ca, Ba, Sr, and Zn and at least one selected from Mn, Fe, Cr, and Sn are included. An alkaline earth metal halogen apatite phosphor activated with Eu having an element represented by M ′ can be used, and a semiconductor device capable of emitting a white light system with high luminance and high luminance can be obtained. In particular, an alkaline earth metal halogen apatite phosphor activated with Eu containing at least Mn and / or Cl is excellent in light resistance and environmental resistance. In addition, the emission spectrum emitted from the nitride semiconductor can be efficiently absorbed. Further, the white region can emit light, and the region can be adjusted by the composition. Further, it can emit yellow and red light with high brightness by absorbing the ultraviolet region of a long wavelength. Therefore, a semiconductor device having excellent color rendering can be obtained. Needless to say, alkaline earth metal chloroapatite phosphors are included as examples of alkaline earth metal halogen apatite phosphors.
[0050]
  In the alkaline earth metal halogen apatite phosphor, the general formula is (M1-xyEuxM 'y)10(PO4)6Q2(Where M is at least one selected from Mg, Ca, Ba, Sr, Zn, M ′ is at least one selected from Mn, Fe, Cr, Sn, and Q is a halogen element) At least one selected from F, Cl, Br, and I. 0.0001 ≦ x ≦ 0.5 and 0.0001 ≦ y ≦ 0.5.) A semiconductor device capable of emitting light is obtained.
[0051]
  In addition to the alkaline earth metal halogen apatite phosphor, BaMg2Al16O27: Eu, (Sr, Ca, Ba)5(PO4)3Cl: Eu, SrAl2O4: Eu, ZnS: Cu, Zn2GeO4: Mn, BaMg2Al16O27: Eu, Mn, Zn2GeO4: Mn, Y2O2S: Eu, La2O2S: Eu, Gd2O2When at least one phosphor selected from S: Eu is contained, more detailed color tone can be adjusted, and white light with high color rendering can be obtained with a relatively simple configuration.
[0052]
  The phosphor can be obtained by the following method. A predetermined amount of ammonium chloride and various compounds that can be converted into phosphate oxide or pyrolysis of the constituent elements and ammonium chloride are weighed and mixed with a ball mill or the like, and then placed in a crucible.2, H2In a reducing atmosphere, baking is performed at a temperature of 800 to 1200 ° C. for 3 to 7 hours. The obtained fired product can be wet pulverized, sieved, dehydrated and dried to obtain an alkaline earth metal halogen apatite phosphor.
[0053]
  The x value indicates the composition ratio of the first activator Eu element, and is preferably 0.0001 ≦ x ≦ 0.5. When x is less than 0.0001, the emission luminance decreases, and x is 0.5. Even if it exceeds, the emission luminance tends to decrease due to concentration quenching. More preferably, 0.005 ≦ x ≦ 0.4, and still more preferably 0.01 ≦ x ≦ 0.2.
[0054]
  The y value indicates a composition ratio of at least one element of Mn, Fe, Cr, and Sn, preferably 0.0001 ≦ y ≦ 0.5, more preferably 0.005 ≦ y. ≦ 0.4, more preferably 0.01 ≦ y ≦ 0.3. If y exceeds 0.5, the emission luminance tends to decrease due to concentration quenching.
  This phosphor can be obtained by exciting visible light having a relatively short wavelength from ultraviolet rays (for example, the main wavelength is 440 nm or less) from blue to white (for example, white in a conventional color of JIS Z8110, or White color as a basic color) and red emission color are shown.
In particular, since it can emit light efficiently and with high luminance even with a relatively long wavelength ultraviolet ray of about 365 nm and sufficiently contains a red component, a good color rendering property with an average color rendering index Ra of 80 or more can be obtained. .
[0055]
  Moreover, it turns out that the said fluorescent substance can be variously changed into blue type-white type-red type by changing the composition ratio, and can adjust a color tone. That is, when M is Sr, Eu has a peak near 450 nm.2+The emission color of the phosphor emits blue, but when the value of y is increased with Mn of M, the emission color of the phosphor shows emission colors of blue to white to red due to Mn emission. When M is Ca, the same amount of Eu and Mn is shown, but when M is Ba, the emission color changes little. In addition, the phosphor used in the present invention is efficiently excited by long-wavelength ultraviolet to relatively short-wavelength visible light (for example, 230 nm to 300 nm to 400 nm to 425 nm), and the emission color is a basic color name as defined in JIS Z8110. Included in the white area. In addition, since this fluorescent substance is efficiently excited in the whole ultraviolet region, it can be expected that the phosphor can be effectively used for short wavelength ultraviolet use.
[0056]
  A semiconductor device using such a phosphor emits an emission spectrum having two peaks, a peak around 460 nm and a peak around 580 nm, among the above-described phosphors excited by an ultraviolet LED or ultraviolet LD. It becomes possible to do. The emission spectrum has at least a spectral component near 460 nm and a spectral component near 580 nm and emits fluorescence that is complementary to each other. As the phosphor emitting green light, the alkaline earth metal halogen apatite phosphor activated with Eu containing at least Mn and / or Cl is used.2O4: By adding Eu, color rendering can be further improved.
  Furthermore, the above-mentioned phosphor can contain Tb, Cu, Ag, Au, Cr, Nd, Dy, Co, Ni, Ti, Pr, etc. in addition to Eu as desired.
[0057]
  The particle size of the fluorescent material used in the present invention is preferably in the range of 1 μm to 100 μm, more preferably in the range of 10 μm to 50 μm, and even more preferably in the range of 15 μm to 30 μm. A fluorescent material having a particle size of less than 15 μm is relatively easy to form an aggregate, and is densely settled in a liquid resin, thus reducing the light transmission efficiency. In the present invention, by using such a fluorescent material that does not have a fluorescent material, concealment of light by the fluorescent material is suppressed and the output of the semiconductor device is improved. In addition, the fluorescent material having a particle size range of the present invention has high light absorption and conversion efficiency and a wide excitation wavelength range. Thus, by including a large particle size fluorescent material having optically excellent characteristics, light around the dominant wavelength of the semiconductor element can be converted and emitted well, and the mass productivity of the semiconductor device is improved. Is done.
[0058]
  Here, in the present invention, the particle size of the fluorescent material is a value obtained from a volume-based particle size distribution curve. The volume-based particle size distribution curve is obtained by measuring the particle size distribution by a laser diffraction / scattering method. Specifically, in an environment of an air temperature of 25 ° C. and a humidity of 70%, hexametalin having a concentration of 0.05%. Each substance was dispersed in an aqueous sodium acid solution and measured with a laser diffraction particle size distribution analyzer (SALD-2000A) in a particle size range of 0.03 μm to 700 μm. In the present specification, the particle size value when the integrated value is 50% in this volume-based particle size distribution curve is referred to as the center particle size, and the center particle size of the fluorescent material used in the present invention is in the range of 15 μm to 50 μm. Is preferred. Moreover, it is preferable that the fluorescent substance which has this center particle size value is contained frequently, and the frequency value is preferably 20% to 50%. By using a fluorescent material with small variations in particle size in this way, a semiconductor device having a good color tone with suppressed color unevenness can be obtained. Moreover, the fluorescent substance is used in the present invention.lightIt preferably has a similar shape as the diffusing agent. In the present specification, the similar shape means a circularity representing the degree of approximation of each particle size with a perfect circle (circularity = perimeter length of a perfect circle equal to the projected area of the particle / perimeter length of the projected particle). The difference between the values is less than 20%. ThislightThe diffusion of light by the diffusing agent and the light from the excited phosphor are mixed in an ideal state, and more uniform light emission is obtained.
[0059]
  (Example)
  Examples of the present invention will be described below. In addition, this invention is not limited only to the Example shown below.
[0060]
[Example 1]
  As a semiconductor device of the present invention, a surface mount (SMD) type semiconductor device as shown in FIG. 1 is formed. The LED chip has a 475 nm In as a light emitting layer with a monochromatic emission peak of visible light.0.2Ga0.8A nitride semiconductor element having an N semiconductor is used. More specifically, in the LED chip, TMG (trimethylgallium) gas, TMI (trimethylindium) gas, nitrogen gas, and dopant gas are flowed with a carrier gas on a cleaned sapphire substrate, and a nitride semiconductor is formed by MOCVD. Can be formed. SiH as dopant gas4And Cp2A layer to be an n-type nitride semiconductor or a p-type nitride semiconductor is formed by switching Mg.
[0061]
  As an element structure of the LED chip, an n-type GaN layer which is an undoped nitride semiconductor on a sapphire substrate, a GaN layer where an Si-doped n-type electrode is formed to become an n-type contact layer, and an n-type nitride semiconductor which is an undoped nitride semiconductor 5 layers of InGaN layers sandwiched between GaN layers, each comprising a type GaN layer, a GaN layer that constitutes a light emitting layer, a InGaN layer that constitutes a well layer, and a GaN layer that constitutes a barrier layer It is a multiple quantum well structure. On the light emitting layer, an AlGaN layer as a p-type cladding layer doped with Mg and a GaN layer as a p-type contact layer doped with Mg are sequentially laminated. (Note that a GaN layer is formed on the sapphire substrate at a low temperature to serve as a buffer layer. The p-type semiconductor is annealed at 400 ° C. or higher after film formation.)
[0062]
  Etching exposes the surface of each pn contact layer on the same side as the nitride semiconductor on the sapphire substrate. Positive and negative pedestal electrodes were formed on each contact layer by sputtering. A metal thin film is formed on the entire surface of the p-type nitride semiconductor as a translucent electrode, and then a pedestal electrode is formed on a part of the translucent electrode. A scribe line is drawn on the completed semiconductor wafer and then divided by an external force to form an LED chip (light refractive index 2.1) having a main emission wavelength of 460 nm.
[0063]
  Next, a molded PPC resin melted from a gate on the lower surface side of the package molded body is poured into a mold closed with a pair of positive and negative lead electrodes inserted and closed to form a package. . The package has a recess capable of accommodating a semiconductor element, and the positive and negative lead electrodes are integrally formed so that one main surface is exposed from the bottom surface of the recess. In this package, the outer lead portions of the positive and negative lead electrodes are bent inward along the bonding surfaces at both ends of the bonding surface of the package, and are soldered at the bent portions. It is configured as follows.
[0064]
  The LED chip is die-bonded to the bottom surface of the concave portion of the package formed in this way with an epoxy resin. Here, the bonding member used for die bonding is not particularly limited, and an Au—Sn alloy or a resin or glass containing a conductive material can be used. The conductive material contained is preferably Ag. When an Ag paste having a content of 80% to 90% is used, a semiconductor device having excellent heat dissipation and low stress after bonding can be obtained. Next, each electrode of the die-bonded LED chip and each lead electrode exposed from the bottom surface of the package recess are electrically connected by an Au wire. In this example,To yaHowever, it is also possible to perform flip chip mounting in which each electrode and the lead electrode are opposed to each other.
[0065]
  Next, for phenylmethyl silicone resin composition 100 wt% (refractive index 1.53),lightAs a diffusing agent, 3 wt% of light calcium carbonate (refractive index: 1.62) having an average particle size of 1.0 μm and an oil absorption of 70 ml / 100 g is contained, and stirred for 5 minutes with a rotating and rotating mixer. Next, in order to cool the heat generated by the stirring treatment, the resin is allowed to stand for 30 minutes to return to a constant temperature and stabilized.
[0066]
  Such light calcium carbonate has little variation in particle diameter and can be dispersed almost uniformly in the composition. Moreover, the light calcium carbonate used in the present Example has a columnar shape and has a rough stone type (aragonite type) crystal. like thislightThe diffusing agent has high resin absorption performance and light diffusing performance, and can form a light emitting device with excellent reliability and optical characteristics.
[0067]
  Light calcium carbonate is produced chemically by reacting calcined coal with carbon dioxide at a high temperature and calcining it. For this reason, amorphous limestone with low purity can be used as a raw material, and cost can be reduced. In addition, the degree of freedom of design is large, and the shape and particle size are controlled so that each particle is homogeneous.lightA diffusing agent can be obtained.
[0068]
  The curable composition thus obtained is filled in the package recess to the same plane as the upper surfaces of both ends of the recess. Finally, heat treatment is performed at 70 ° C. × 3 hours and 150 ° C. × 1 hour. Thereby, the light emission surface which has a substantially symmetrical parabolic recess from the upper surface of the both ends of the said recessed part to the center part is obtained.
[0069]
  Moreover, the sealing member which consists of hardened | cured material of the said curable composition is the said.lightThe first layer having a high content of the diffusing agent, and the first layerlightThe LED chip is separated into two layers, a second layer containing little or no diffusing agent, and the surface of the LED chip is covered with the first layer. Thereby, the light emitted from the LED chip can be efficiently extracted to the outside, and uniform light emission can be obtained. The first layer is preferably formed continuously from the bottom surface of the recess to the surface of the LED chip, whereby the shape of the light emitting surface can be a smooth recess.
[0070]
  The semiconductor device obtained in this way has a luminous intensity of 500 mcd and an optical output of 4 mW, and further excellent directivity can be obtained. In addition, in the high temperature storage test (100 ° C.), the high temperature and high humidity storage test (80 ° C., 85% RH), and the low temperature storage test (−40 ° C.), there is almost no decrease in output, and it can be said that it has high reliability. .
[0071]
  (Comparative example 1.)
  For comparison,lightA semiconductor device is formed in the same manner as in Example 1 except that no diffusing agent is used. In the semiconductor device of Comparative Example 1 obtained in this way, the surface of the sealing member having tackiness and the upper surfaces of both end portions of the recess are substantially on the same plane line. For this reason, a foreign substance adheres to the surface of the sealing member, and adversely affects the appearance and optical characteristics. Moreover, it is very difficult to mount so as not to impair the reliability of the surface of the sealing member. Further, when the luminous intensity and the optical output of the semiconductor device of this comparative example are measured, both the luminous intensity and the optical output are reduced by 5% as compared with the semiconductor device of the first embodiment.
[0072]
  (Comparative Example 2.)
  For comparison,lightA semiconductor device is formed in the same manner as in Example 1 except that the package recess is filled with a curable composition having no diffusing agent in a smaller amount than in Example 1. In the semiconductor device of Comparative Example 2 obtained in this manner, the film thickness of the sealing member varies between the semiconductor devices. For this reason, the light intensity and the light output vary between the semiconductor devices.
[0073]
[Example 2]
  A semiconductor device is formed in the same manner as in Example 1 except that the sealing member contains a fluorescent material.
The fluorescent substance is prepared by coprecipitation of a solution obtained by dissolving rare earth elements of Y, Gd, and Ce in acid at a stoichiometric ratio with oxalic acid, and firing the resulting mixture to mix the coprecipitated oxide and aluminum oxide. To obtain mixed raw materials. Further, barium fluoride is mixed as a flux, then packed in a crucible, and fired in air at a temperature of 1400 ° C. for 3 hours to obtain a fired product. The fired product is ball-milled in water, washed, separated, dried, and finally passed through a sieve to have a center particle size of 22 Aμm (Y0.995Gd0.005)2.750Al5O12: Ce0.250Form a fluorescent material.
[0074]
  5.5 wt% of the fluorescent material (refractive index 1.84) and the silicone resin composition (refractive index 1.53), andlightAs a diffusing agent, 3 wt% of light calcium carbonate (refractive index: 1.62) having an average particle diameter of 2.0 μm and an oil absorption of 70 ml / 100 g is contained, and the mixture is stirred for 5 minutes by a rotating and rotating mixer. Next, in order to cool the heat generated by the stirring treatment, the resin is allowed to stand for 30 minutes to return to a constant temperature and stabilized. The curable composition thus obtained is filled in the package recess to the same plane as the upper surfaces of both ends of the recess. Finally, heat treatment is performed at 70 ° C. × 2 hours and 150 ° C. × 1 hour. Thereby, the light emission surface which has a substantially symmetrical parabolic recess from the upper surface of the both ends of the said recessed part to the center part is obtained.
[0075]
  Further, the sealing member of the present embodiment includes a color conversion layer having the fluorescent material,lightThe first layer having a high content of the diffusing agent, and the first layerlightThe LED chip is separated into three layers, a second layer containing little or no diffusing agent, and the surface of the LED chip is covered with two layers of the color conversion layer and the first layer. Yes. Thereby, a part of the light emitted from the LED chip is efficiently wavelength-converted in the color conversion layer, and the light emitted from the LED chip and the converted light are mixed well in the first layer. Can be dispersed. Thus, the uniformity of light is improved by performing the color mixture dispersion at a location away from the light emitting surface. Also, the refractive index difference (0.26) between the color conversion layer and the LED chip is close to the refractive index difference (0.22) between the color conversion layer and the first layer. It can be taken out. The color conversion layer and the first layer are preferably formed continuously from the bottom surface of the recess to the surface of the LED chip, whereby the shape of the light emitting surface can be a smooth recess. Each layer preferably has a uniform film thickness.
[0076]
  The color conversion type semiconductor device obtained in this way has a luminous intensity of 500 mcd and an optical output of 4 mW, so that even better directional characteristics can be obtained. In addition, in the high temperature storage test (100 ° C.), the high temperature and high humidity storage test (80 ° C., 85% RH), and the low temperature storage test (−40 ° C.), there is almost no decrease in output, and it can be said that it has high reliability. . Further, the chromaticity 3σ in the CIE chromaticity coordinates is 0.0099, and a semiconductor device with very little color variation can be obtained.
[0077]
[Example 3]
  As a fluorescent material, it absorbs the wavelength of the light emitting element and emits yellowish green light3(Al0.8Ga0.2)5O12: Ce absorbs the wavelength of the light emitting element and emits red light (Sr0.679Ca0.291Eu0.03)2Si5N8When a light emitting diode is formed in the same manner as in Example 2 except that the above is used, a light emitting diode having further excellent color rendering properties can be obtained.
[0078]
[Example 4]
  As a fluorescent substance, the composition formula is (Y0.995Gd0.005)2.750Al5O12: Ce0.250When a light emitting diode is formed in the same manner as in Example 2 except that a fluorescent material is used, a light emitting diode having further excellent color rendering properties can be obtained.
[0079]
[Example 5]
  As a fluorescent material, Y having a center particle diameter of about 4 μm2.965Al5.15O12: Ce0.035And the center particle size is about 8 μm (Y0.98Gd0.02)2.965Al5.15O12: Ce0.15When a light emitting diode is formed in the same manner as in Example 2 except that a mixed phosphor in which 1: 1 is mixed is used, a light emitting diode having excellent uniformity and color rendering and high luminance can be obtained. In this way, by using two types of fluorescent materials that are excited by the same excitation light and emit light having slightly different wavelengths while having similar colors, the adjustment range of the emission color can be expanded. Further, since the two kinds of fluorescent materials have different central particle diameter values, they can be preferably dispersed by their interaction, and the uniformity of the emission color can be improved. In addition, since the YAG phosphor with a small amount of Gd substitution, such as the phosphor used in this example, has excellent temperature characteristics, it can emit light with high brightness even when used for a long time.
[0080]
[Example 6]
  An LED chip having a dominant wavelength of 464 nm is used, and the center particle diameter is about 8 μm as a fluorescent material (Y0.95Gd0.05)2.850Al5.15O12: Ce0.15When a light emitting diode is formed in the same manner as in Example 2 except that is used, a light emitting diode having excellent uniformity and color rendering and high luminance can be obtained.
[0081]
[Example 7]
  An LED chip having a dominant wavelength of 466 nm is used, and the center particle diameter is about 8 μm as a fluorescent material (Y0.90Gd0.1)2.850Al5.15O12: Ce0.15When a light emitting diode is formed in the same manner as in Example 2 except that is used, a light emitting diode having excellent uniformity and color rendering and high luminance can be obtained.
[0082]
[Example 8]
  lightHeavy calcium carbonate (refractive index of 1.57) having an average particle diameter of 5 μm and an oil absorption of 32 ml / 100 g is used as a diffusing agent. In order to obtain a sealing member having the same film thickness as in Example 1, the heavy calcium carbonate content needs to be 3 wt% with respect to 100 wt% (refractive index of 1.53) of the phenylmethyl silicone resin composition. As compared with Example 1, the light extraction efficiency is slightly lowered.
  Such heavy calcium carbonate is obtained by pulverizing and classifying mined limestone as it is. For this reason, it is preferable to use crystalline limestone with high purity as a raw material.
[0083]
[Example 9]
  lightAs the diffusing agent, porous calcium carbonate which is a reaction product of calcium carbonate and a phosphoric acid compound is used. In order to form a sealing member having a film thickness similar to that of Example 1, phenylmethyl silicone resin composition 100 wt% (refractive index 1.53)Vs.Thus, the desired light emitting diode can be obtained with a small content.
The porous calcium carbonate in this embodiment is made porous by reacting a raw material calcium carbonate with a phosphoric acid compound.
  The calcium carbonate used as a raw material is not particularly limited, and various materials such as heavy calcium carbonate and light calcium carbonate can be used. Further, the size, shape, dispersion state, crystal form, degree of impurities in calcium carbonate, etc. are not particularly limited.
Moreover, it is preferable that the phosphoric acid type compound to be used has favorable reactivity with the calcium carbonate to be used, and a soluble phosphoric acid type compound is preferable. Examples of the soluble phosphate compound include H3PO4, K3PO4, KH2PO4, Na2HPO4・ 12H2O, (NH4) PO3・ 3H2O etc. are mentioned. The phosphoric acid compound to be used is not limited to one type, and two or more types may be used in combination.
[0084]
[Example 10]
  Except for using a dimethylsiloxane-based silicone resin composition as the resin composition, when a light emitting diode is formed in the same manner as in Example 1, the same effect as in Example 1 can be obtained. The volume reduction rate before and after curing of the stop member is low.
[0085]
Example 11
  An Au bump is formed on each electrode of the LED chip, and is electrically connected to each lead electrode exposed from the bottom of the package recess by ultrasonic bonding. When the light emitting diode is formed, the same curing as in Example 3 can be obtained and the light blocking the light on the light emitting surface side.YaSince it does not exist, more uniform light emission can be obtained. In addition, since the LED chip and the lead electrode are joined only with metal without using a light- and heat-resistant member such as an epoxy resin, high reliability is maintained even when a large current is dropped. It is possibleThe
[0086]
  (Possibility of industrial use)
  As described above, the semiconductor device of the present invention uses a polymer resin having a hydrophilic main chain and a hydrophobic main chain with high thermal stability, and reduces the volume of the polymer resin in the thermosetting process together with the light diffusion action. PossiblelightBy forming the sealing member using a diffusing agent, a semiconductor device having high reliability and good optical characteristics can be obtained with high mass productivity. Further, it is possible to maintain reliability without deterioration even when a large current is applied, and it is possible to provide a semiconductor device that is highly reliable and capable of emitting light as bright as illumination. The utility value of is extremely high.
[Brief description of the drawings]
FIG. 1 is a schematic plan view and a schematic cross-sectional view showing a light emitting device of the present invention.
FIG. 2 is a schematic plan view and a schematic cross-sectional view showing another light emitting device of the present invention.
FIG. 3 is a schematic plan view and a schematic sectional view showing another light emitting device of the present invention.

Claims (12)

半導体素子と、該半導体素子が収納された凹部を有するパッケージと、前記凹部内に充填された封止部材と、を有する半導体発光装置であって、
前記封止部材は、親水性主鎖と疎水性側鎖とを有する透光性ポリマー樹脂と、少なくとも前記ポリマー樹脂を吸収することが可能で吸油量(日本工業規格JIS K5101)が50ml/100g〜150ml/100gである光拡散剤と、を必須成分とする硬化性組成物の硬化物であり、
前記透光性ポリマー樹脂が、フェニメチル系シリコーン樹脂であり、
前記封止部材の上面は、端部から中央部にかけて放物線状の凹みを有することを特徴とする半導体発光装置。
A semiconductor light emitting device having a semiconductor element, a package having a recess in which the semiconductor element is housed, and a sealing member filled in the recess,
The sealing member can absorb a translucent polymer resin having a hydrophilic main chain and a hydrophobic side chain, and at least the polymer resin, and has an oil absorption (Japanese Industrial Standard JIS K5101) of 50 ml / 100 g ~ And a cured product of a curable composition containing 150 ml / 100 g of a light diffusing agent as an essential component,
The translucent polymer resin is a phenyl-methyl silicone resin,
The top surface of the sealing member has a parabolic recess from an end portion to a central portion.
前記封止部材の硬度は、5shore(A)〜80shore(D)であることを特徴とする請求項1に記載の半導体発光装置。  The semiconductor light emitting device according to claim 1, wherein the sealing member has a hardness of 5 Shore (A) to 80 Shore (D). 前記光拡散剤は、針状もしくは柱状形状であることを特徴とする請求項1又は2に記載の半導体発光装置。  The semiconductor light emitting device according to claim 1, wherein the light diffusing agent has a needle shape or a columnar shape. 前記光拡散剤は、あられ石型結晶であることを特徴とする請求項1乃至3のいずれか1項に記載の半導体発光装置。  The semiconductor light emitting device according to claim 1, wherein the light diffusing agent is an aragonite crystal. 前記光拡散剤は、平均粒子径値が0.1μm〜5.0μmであることを特徴とする請求項1乃至4のいずれか1項に記載の半導体発光装置。  5. The semiconductor light emitting device according to claim 1, wherein the light diffusing agent has an average particle size value of 0.1 μm to 5.0 μm. 前記光拡散剤の屈折率は、前記半導体素子の屈折率より低く且つ前記透光性ポリマー樹脂の屈折率より高いことを特徴とする請求項1乃至5のいずれか1項に記載の半導体発光装置。  The semiconductor light emitting device according to claim 1, wherein a refractive index of the light diffusing agent is lower than a refractive index of the semiconductor element and higher than a refractive index of the translucent polymer resin. . 前記封止部材は、前記半導体素子側から前記光拡散剤の含有量の多い第一の層と前記第一の層より前記光拡散剤の含有量の少ない第二の層とを有し、前記半導体素子の表面は前記第一の層にてほぼ被覆されていることを特徴とする請求項1乃至6のいずれか1項に記載の半導体発光装置。  The sealing member includes a first layer having a high content of the light diffusing agent from the semiconductor element side and a second layer having a low content of the light diffusing agent than the first layer, The semiconductor light-emitting device according to claim 1, wherein a surface of the semiconductor element is substantially covered with the first layer. 前記封止部材は、前記半導体素子から発光される光の少なくとも一部を吸収し異なる波長を有する光を発光することが可能な蛍光物質を含有していることを特徴とする請求項1乃至の7いずれか1項に記載の半導体発光装置。  The said sealing member contains the fluorescent substance which can light-emit the light which absorbs at least one part of the light emitted from the said semiconductor element, and has a different wavelength. 7. The semiconductor light emitting device according to claim 1. 前記蛍光物質の屈折率は、前記半導体素子の屈折率より低く且つ前記光拡散剤の屈折率より高いことを特徴とする請求項8記載の半導体発光装置。  9. The semiconductor light emitting device according to claim 8, wherein a refractive index of the fluorescent material is lower than a refractive index of the semiconductor element and higher than a refractive index of the light diffusing agent. 前記蛍光物質と前記半導体素子との屈折率差は、前記蛍光物質と前記光拡散剤との屈折率差とほぼ等しいことを特徴とする請求項8又は9に記載の半導体発光装置。  10. The semiconductor light emitting device according to claim 8, wherein a refractive index difference between the fluorescent material and the semiconductor element is substantially equal to a refractive index difference between the fluorescent material and the light diffusing agent. 前記封止部材は、前記半導体素子と前記第一の層との間に、前記半導体素子から発光される光の少なくとも一部を吸収し異なる波長を有する光を発光することが可能な蛍光物質を含有する色変換層を有することを特徴とする請求項7に記載の半導体発光装置。  The sealing member is a fluorescent material capable of absorbing at least a part of light emitted from the semiconductor element and emitting light having different wavelengths between the semiconductor element and the first layer. 8. The semiconductor light emitting device according to claim 7, further comprising a color conversion layer to be contained. 半導体素子と、該半導体素子を収納することが可能な凹部を有するパッケージと、前記凹部内に充填された封止部材と、を有する半導体発光装置の形成方法であって、
親水性主鎖と疎水性側鎖とを有する透光性ポリマー樹脂としてのフェニルメチル系シリコーン樹脂と、該フェニルメチル系シリコーン樹脂を吸収することが可能で吸油量(日本工業規格JIS K5101)が50ml/100g〜150ml/100gである光拡散剤とを必須成分とする硬化性組成物液を調整する第一の工程と、
前記硬化性組成物液を前記パッケージの凹部内にパッケージ上面とほぼ同一平面のラインまで注入する第二の工程と、
熱処理を施すことによって、前記硬化性組成物液を硬化させると同時に前記封止部材の上面に端部から中央部にかけて放物線状の凹みを形成する第の工程と、
を有することを特徴とする半導体発光装置の形成方法。
A method for forming a semiconductor light emitting device, comprising: a semiconductor element; a package having a recess capable of accommodating the semiconductor element; and a sealing member filled in the recess.
And phenylmethyl silicone resin as the translucent polymer resin having a hydrophilic backbone and hydrophobic side chains, possible oil absorption to absorb the phenylmethyl silicone resin (Japanese Industrial Standard JIS K5101) A first step of preparing a curable composition liquid comprising a light diffusing agent having an essential component of 50 ml / 100 g to 150 ml / 100 g,
A second step of injecting the curable composition liquid into the recess of the package to a line substantially flush with the upper surface of the package;
A third step of curing the curable composition liquid by performing a heat treatment and simultaneously forming a parabolic dent on the upper surface of the sealing member from an end portion to a central portion;
A method for forming a semiconductor light emitting device, comprising:
JP2003507903A 2001-06-20 2002-06-20 Semiconductor light emitting device and method for forming the same Expired - Lifetime JP4010299B2 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2001187294 2001-06-20
JP2001187294 2001-06-20
JP2002072142 2002-03-15
JP2002072142 2002-03-15
PCT/JP2002/006176 WO2003001612A1 (en) 2001-06-20 2002-06-20 Semiconductor device and its fabriction method

Publications (2)

Publication Number Publication Date
JPWO2003001612A1 JPWO2003001612A1 (en) 2004-10-14
JP4010299B2 true JP4010299B2 (en) 2007-11-21

Family

ID=26617304

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003507903A Expired - Lifetime JP4010299B2 (en) 2001-06-20 2002-06-20 Semiconductor light emitting device and method for forming the same

Country Status (2)

Country Link
JP (1) JP4010299B2 (en)
WO (1) WO2003001612A1 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013084702A (en) * 2011-10-07 2013-05-09 Fujifilm Corp Semiconductor light emitting element and manufacturing method of the same
KR20140010927A (en) * 2010-07-28 2014-01-27 지이 라이팅 솔루션스, 엘엘씨 Phosphor suspended in silicone, molded/formed and used in a remote phosphor configuration
KR20140145410A (en) * 2013-06-13 2014-12-23 엘지이노텍 주식회사 Light emitting device
KR101641744B1 (en) 2011-10-07 2016-07-21 엘지이노텍 주식회사 Light emitting device package and backlight unit having the same
JP2016225374A (en) * 2015-05-27 2016-12-28 四国計測工業株式会社 LED light emitting device
WO2017122691A1 (en) * 2016-01-15 2017-07-20 株式会社ダイセル Anti-reflection material

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4705701B2 (en) * 2003-04-25 2011-06-22 日亜化学工業株式会社 Light emitting device
JP2005064233A (en) 2003-08-12 2005-03-10 Stanley Electric Co Ltd Wavelength conversion type led
US7915085B2 (en) 2003-09-18 2011-03-29 Cree, Inc. Molded chip fabrication method
CN100472823C (en) 2003-10-15 2009-03-25 日亚化学工业株式会社 Light-emitting device
JP4231418B2 (en) * 2004-01-07 2009-02-25 株式会社小糸製作所 Light emitting module and vehicle lamp
JP2005243795A (en) * 2004-02-25 2005-09-08 Matsushita Electric Ind Co Ltd Optical semiconductor device
TWI286393B (en) * 2004-03-24 2007-09-01 Toshiba Lighting & Technology Lighting apparatus
KR100616594B1 (en) * 2004-07-02 2006-08-28 삼성전기주식회사 RGB Light Emitting Diode Package with Improved Color Miscibility
TW200614548A (en) * 2004-07-09 2006-05-01 Matsushita Electric Ind Co Ltd Light-emitting device
JP2006140362A (en) * 2004-11-15 2006-06-01 Nitto Denko Corp Optical semiconductor device sealing sheet and optical semiconductor device manufacturing method using the same
US7710016B2 (en) 2005-02-18 2010-05-04 Nichia Corporation Light emitting device provided with lens for controlling light distribution characteristic
JP5082427B2 (en) * 2005-12-26 2012-11-28 東芝ライテック株式会社 Light emitting device
US9159888B2 (en) 2007-01-22 2015-10-13 Cree, Inc. Wafer level phosphor coating method and devices fabricated utilizing method
US9024349B2 (en) 2007-01-22 2015-05-05 Cree, Inc. Wafer level phosphor coating method and devices fabricated utilizing method
KR100855065B1 (en) * 2007-04-24 2008-08-29 삼성전기주식회사 Light emitting diode package
US9041285B2 (en) 2007-12-14 2015-05-26 Cree, Inc. Phosphor distribution in LED lamps using centrifugal force
US8878219B2 (en) 2008-01-11 2014-11-04 Cree, Inc. Flip-chip phosphor coating method and devices fabricated utilizing method
TWI403006B (en) 2009-01-15 2013-07-21 Everlight Electronics Co Ltd Light emitting diode and method for fabricating the same
US10546846B2 (en) 2010-07-23 2020-01-28 Cree, Inc. Light transmission control for masking appearance of solid state light sources
JP5803137B2 (en) * 2010-09-16 2015-11-04 セイコーエプソン株式会社 Light source device and projector
US9166126B2 (en) 2011-01-31 2015-10-20 Cree, Inc. Conformally coated light emitting devices and methods for providing the same
KR101784007B1 (en) 2011-04-13 2017-10-23 엘지이노텍 주식회사 Light emitting device and method for fabricating the same
JP5971991B2 (en) * 2012-03-09 2016-08-17 モメンティブ・パフォーマンス・マテリアルズ・ジャパン合同会社 Silicone rubber composition
DE212020000839U1 (en) 2020-11-05 2023-07-21 Hitachi Energy Switzerland Ag Power semiconductor device and power module

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2781475B2 (en) * 1991-07-19 1998-07-30 シャープ株式会社 Optical device
DE4219287A1 (en) * 1992-06-12 1993-12-16 Merck Patent Gmbh Inorganic fillers and organic matrix materials with refractive index adjustment
JPH06111612A (en) * 1992-09-25 1994-04-22 Sumitomo Chem Co Ltd Resin plate body for illumination
JP3024439B2 (en) * 1993-06-07 2000-03-21 信越化学工業株式会社 Organopolysiloxane composition
JPH07176795A (en) * 1993-12-21 1995-07-14 Rohm Co Ltd Formation of chip led lens using potting resin
JP3228321B2 (en) * 1997-08-29 2001-11-12 日亜化学工業株式会社 Chip type LED
JP3153171B2 (en) * 1998-06-09 2001-04-03 日東電工株式会社 Optical semiconductor device and epoxy resin composition for encapsulating optical semiconductor
JP2000150966A (en) * 1998-11-16 2000-05-30 Matsushita Electronics Industry Corp Semiconductor light emitting device and manufacture thereof
JP3337000B2 (en) * 1999-06-07 2002-10-21 サンケン電気株式会社 Semiconductor light emitting device
JP3412152B2 (en) * 1999-06-08 2003-06-03 サンケン電気株式会社 Semiconductor light emitting device

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20140010927A (en) * 2010-07-28 2014-01-27 지이 라이팅 솔루션스, 엘엘씨 Phosphor suspended in silicone, molded/formed and used in a remote phosphor configuration
KR101885933B1 (en) * 2010-07-28 2018-08-06 지이 라이팅 솔루션스, 엘엘씨 Phosphor suspended in silicone, molded/formed and used in a remote phosphor configuration
JP2013084702A (en) * 2011-10-07 2013-05-09 Fujifilm Corp Semiconductor light emitting element and manufacturing method of the same
KR101641744B1 (en) 2011-10-07 2016-07-21 엘지이노텍 주식회사 Light emitting device package and backlight unit having the same
KR20140145410A (en) * 2013-06-13 2014-12-23 엘지이노텍 주식회사 Light emitting device
KR101655505B1 (en) * 2013-06-13 2016-09-07 엘지이노텍 주식회사 Light emitting device
JP2016225374A (en) * 2015-05-27 2016-12-28 四国計測工業株式会社 LED light emitting device
WO2017122691A1 (en) * 2016-01-15 2017-07-20 株式会社ダイセル Anti-reflection material
JPWO2017122691A1 (en) * 2016-01-15 2018-11-01 株式会社ダイセル Anti-reflective material
JP7127989B2 (en) 2016-01-15 2022-08-30 株式会社ダイセル Antireflection material

Also Published As

Publication number Publication date
JPWO2003001612A1 (en) 2004-10-14
WO2003001612A1 (en) 2003-01-03

Similar Documents

Publication Publication Date Title
JP4010299B2 (en) Semiconductor light emitting device and method for forming the same
JP4222017B2 (en) Light emitting device
KR101065522B1 (en) Light-emitting device
JP4415548B2 (en) Light emitting device using oxynitride phosphor
JP4760082B2 (en) Light emitting device, phosphor for light emitting element, and method for manufacturing the same
JPWO2006077740A1 (en) Light emitting device and manufacturing method thereof
JP4430264B2 (en) Surface mount light emitting device
JP4222059B2 (en) Light emitting device
JP5066786B2 (en) Nitride phosphor and light emitting device using the same
JP5326182B2 (en) Light emitting device, phosphor for light emitting element, and method for manufacturing the same
JP4892861B2 (en) Nitride phosphor and light emitting device using the same
JP2005008844A (en) Phosphor, and light emitter using the same
JP2003321675A (en) Nitride fluorophor and method for producing the same
JP2003046141A (en) Light emitting device and method of manufacturing the same
JP2004244560A (en) Silicon nitride-based phosphor and light emitting device using the same
JP4214768B2 (en) Nitride phosphor and light emitting device using the same
JP2004221163A (en) Light emitting device, its forming method, planar light emitting device using the light emitting device
JP4874510B2 (en) Light emitting device and manufacturing method thereof
JP4442101B2 (en) Oxynitride phosphor and light emitting device using the same
JP4218328B2 (en) Nitride phosphor and light emitting device using the same
JP4221950B2 (en) Phosphor
JP2002050800A (en) Light-emitting device and forming method therefor
JP4613546B2 (en) Light emitting device
JP4466446B2 (en) Light emitting device using oxynitride phosphor
JP4215046B2 (en) Nitride phosphor and light emitting device using the same

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20050228

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20060524

RD02 Notification of acceptance of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7422

Effective date: 20060524

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20060526

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20060912

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20061110

RD03 Notification of appointment of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7423

Effective date: 20061110

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20070206

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070406

A911 Transfer to examiner for re-examination before appeal (zenchi)

Free format text: JAPANESE INTERMEDIATE CODE: A911

Effective date: 20070529

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070703

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070712

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20070814

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20070827

R150 Certificate of patent or registration of utility model

Ref document number: 4010299

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100914

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100914

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100914

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110914

Year of fee payment: 4

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110914

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120914

Year of fee payment: 5

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120914

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130914

Year of fee payment: 6

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term