JP4008152B2 - 電荷結合素子およびその製造方法 - Google Patents
電荷結合素子およびその製造方法 Download PDFInfo
- Publication number
- JP4008152B2 JP4008152B2 JP13467999A JP13467999A JP4008152B2 JP 4008152 B2 JP4008152 B2 JP 4008152B2 JP 13467999 A JP13467999 A JP 13467999A JP 13467999 A JP13467999 A JP 13467999A JP 4008152 B2 JP4008152 B2 JP 4008152B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor layer
- conductive semiconductor
- gate electrode
- coupled device
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 15
- 239000004065 semiconductor Substances 0.000 claims description 65
- 229910045601 alloy Inorganic materials 0.000 claims description 34
- 239000000956 alloy Substances 0.000 claims description 34
- 238000010438 heat treatment Methods 0.000 claims description 21
- 229910052751 metal Inorganic materials 0.000 claims description 17
- 239000002184 metal Substances 0.000 claims description 17
- 239000000758 substrate Substances 0.000 claims description 16
- 238000012544 monitoring process Methods 0.000 claims description 4
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 17
- 238000000034 method Methods 0.000 description 15
- 238000003746 solid phase reaction Methods 0.000 description 10
- 239000012535 impurity Substances 0.000 description 7
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 7
- 238000012546 transfer Methods 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 4
- 229910002601 GaN Inorganic materials 0.000 description 3
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000012071 phase Substances 0.000 description 3
- 230000001681 protective effect Effects 0.000 description 3
- 229910017401 Au—Ge Inorganic materials 0.000 description 2
- -1 GaAs compound Chemical class 0.000 description 2
- 238000005275 alloying Methods 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000003801 milling Methods 0.000 description 2
- 229910052763 palladium Inorganic materials 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 1
- 229910052582 BN Inorganic materials 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 1
- 239000011358 absorbing material Substances 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052741 iridium Inorganic materials 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910052762 osmium Inorganic materials 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 239000007790 solid phase Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Images
Landscapes
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Junction Field-Effect Transistors (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13467999A JP4008152B2 (ja) | 1999-05-14 | 1999-05-14 | 電荷結合素子およびその製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13467999A JP4008152B2 (ja) | 1999-05-14 | 1999-05-14 | 電荷結合素子およびその製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2000323703A JP2000323703A (ja) | 2000-11-24 |
| JP2000323703A5 JP2000323703A5 (enExample) | 2005-04-07 |
| JP4008152B2 true JP4008152B2 (ja) | 2007-11-14 |
Family
ID=15134046
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13467999A Expired - Fee Related JP4008152B2 (ja) | 1999-05-14 | 1999-05-14 | 電荷結合素子およびその製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4008152B2 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9252237B2 (en) | 2012-05-09 | 2016-02-02 | Taiwan Semiconductor Manufacturing Company, Ltd. | Transistors, semiconductor devices, and methods of manufacture thereof |
-
1999
- 1999-05-14 JP JP13467999A patent/JP4008152B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2000323703A (ja) | 2000-11-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP3640945B2 (ja) | トレンチゲート型半導体装置及びその製造方法 | |
| EP1975991B1 (en) | Method of manufacture a diode having reduced on-resistance | |
| JP2995723B2 (ja) | ウェーハ・ボンディングを利用した縦型電流半導体デバイスおよびその製作方法 | |
| US4607270A (en) | Schottky barrier diode with guard ring | |
| US20120153303A1 (en) | Semiconductor element and method for manufacturing same | |
| CN101548387A (zh) | 碳化硅半导体元件及其制造方法 | |
| JP2727818B2 (ja) | 半導体装置 | |
| TW201230143A (en) | Lateral conduction schottky diode plural mesas | |
| EP0345435B1 (en) | Semiconductor device with a high breakdown voltage and method for its manufacture | |
| JP2002185019A (ja) | 半導体装置及びその製造方法 | |
| JP7563002B2 (ja) | 半導体装置 | |
| JP7512624B2 (ja) | 炭化珪素半導体装置 | |
| WO1995004375A1 (en) | Semiconductor device and its manufacture | |
| CN119108431B (zh) | 一种氧化镓单片的异质集成器件及其制造方法 | |
| EP0164517B1 (en) | Heterojunction transistors | |
| WO2014083771A1 (ja) | 半導体素子及びその製造方法 | |
| WO2004023544A1 (ja) | 半導体装置及び半導体装置の製造方法 | |
| JP4008152B2 (ja) | 電荷結合素子およびその製造方法 | |
| US11107895B2 (en) | Semiconductor device | |
| US20230011193A1 (en) | Semiconductor power devices having doped and silicided polysilicon temperature sensors therein | |
| JP7478604B2 (ja) | 半導体装置およびその製造方法 | |
| CN101320688B (zh) | 制造半导体器件的方法及所制造出的半导体器件 | |
| CN111326586A (zh) | 半导体装置 | |
| US4811070A (en) | Heterojunction bipolar transistor with inversion layer base | |
| JP5272613B2 (ja) | Iii族窒化物系化合物半導体素子及びその製造方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Written amendment |
Effective date: 20040531 Free format text: JAPANESE INTERMEDIATE CODE: A523 |
|
| A621 | Written request for application examination |
Effective date: 20050307 Free format text: JAPANESE INTERMEDIATE CODE: A621 |
|
| A977 | Report on retrieval |
Effective date: 20070523 Free format text: JAPANESE INTERMEDIATE CODE: A971007 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20070605 |
|
| A521 | Written amendment |
Effective date: 20070706 Free format text: JAPANESE INTERMEDIATE CODE: A523 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20070814 |
|
| A61 | First payment of annual fees (during grant procedure) |
Effective date: 20070829 Free format text: JAPANESE INTERMEDIATE CODE: A61 |
|
| FPAY | Renewal fee payment (prs date is renewal date of database) |
Year of fee payment: 3 Free format text: PAYMENT UNTIL: 20100907 |
|
| R150 | Certificate of patent (=grant) or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| LAPS | Cancellation because of no payment of annual fees |