JP3990889B2 - 質量分析装置およびこれを用いる計測システム - Google Patents

質量分析装置およびこれを用いる計測システム Download PDF

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Publication number
JP3990889B2
JP3990889B2 JP2001312118A JP2001312118A JP3990889B2 JP 3990889 B2 JP3990889 B2 JP 3990889B2 JP 2001312118 A JP2001312118 A JP 2001312118A JP 2001312118 A JP2001312118 A JP 2001312118A JP 3990889 B2 JP3990889 B2 JP 3990889B2
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Prior art keywords
ions
ion trap
mass spectrometer
ion
voltage
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JP2001312118A
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Japanese (ja)
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JP2003123685A (ja
JP2003123685A5 (enExample
Inventor
昭彦 奥村
集 平林
泉 和気
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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Priority to JP2001312118A priority Critical patent/JP3990889B2/ja
Priority to EP02011538A priority patent/EP1302973B1/en
Priority to US10/153,615 priority patent/US6900430B2/en
Publication of JP2003123685A publication Critical patent/JP2003123685A/ja
Publication of JP2003123685A5 publication Critical patent/JP2003123685A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/401—Time-of-flight spectrometers characterised by orthogonal acceleration, e.g. focusing or selecting the ions, pusher electrode
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2001312118A 2001-10-10 2001-10-10 質量分析装置およびこれを用いる計測システム Expired - Fee Related JP3990889B2 (ja)

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Application Number Priority Date Filing Date Title
JP2001312118A JP3990889B2 (ja) 2001-10-10 2001-10-10 質量分析装置およびこれを用いる計測システム
EP02011538A EP1302973B1 (en) 2001-10-10 2002-05-23 Mass spectrometer and measurement system and method for time-of-flight mass spectrometry
US10/153,615 US6900430B2 (en) 2001-10-10 2002-05-24 Mass spectrometer and measurement system using the mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001312118A JP3990889B2 (ja) 2001-10-10 2001-10-10 質量分析装置およびこれを用いる計測システム

Related Child Applications (1)

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JP2005344873A Division JP4248540B2 (ja) 2005-11-30 2005-11-30 質量分析装置およびこれを用いる計測システム

Publications (3)

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JP2003123685A JP2003123685A (ja) 2003-04-25
JP2003123685A5 JP2003123685A5 (enExample) 2005-06-16
JP3990889B2 true JP3990889B2 (ja) 2007-10-17

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US (1) US6900430B2 (enExample)
EP (1) EP1302973B1 (enExample)
JP (1) JP3990889B2 (enExample)

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JP2008108739A (ja) * 2007-11-26 2008-05-08 Hitachi High-Technologies Corp 質量分析装置およびこれを用いる計測システム
US10324071B2 (en) 2014-11-17 2019-06-18 Shimadzu Corporation Chromatograph mass spectrometer

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JP4802041B2 (ja) * 2006-05-23 2011-10-26 日本電子株式会社 らせん軌道型飛行時間型質量分析計
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JP5341323B2 (ja) * 2007-07-17 2013-11-13 株式会社日立ハイテクノロジーズ 質量分析装置
JP4966780B2 (ja) * 2007-07-30 2012-07-04 株式会社日立ハイテクノロジーズ 液体クロマトグラフ／質量分析計を用いた分析方法
JP2009068981A (ja) * 2007-09-13 2009-04-02 Hitachi High-Technologies Corp 質量分析システム及び質量分析方法
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JP5094362B2 (ja) * 2007-12-21 2012-12-12 株式会社日立ハイテクノロジーズ 質量分析装置およびその制御方法
US7709790B2 (en) * 2008-04-01 2010-05-04 Thermo Finnigan Llc Removable ion source that does not require venting of the vacuum chamber
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GB2454962B (en) * 2008-07-25 2009-10-28 Kratos Analytical Ltd Method and apparatus for ion axial spatial distribution focusing
CN102413907B (zh) * 2009-04-13 2015-06-17 萨莫芬尼根有限责任公司 质谱仪中混合的离子布居的获取与分析
JP5314603B2 (ja) * 2010-01-15 2013-10-16 日本電子株式会社 飛行時間型質量分析装置
GB201003566D0 (en) * 2010-03-03 2010-04-21 Ilika Technologies Ltd Mass spectrometry apparatus and methods
CN106055895B (zh) * 2010-09-15 2021-02-19 Dh科技发展私人贸易有限公司 产物离子谱的数据独立获取及参考谱库匹配
JP2012084299A (ja) * 2010-10-08 2012-04-26 Jeol Ltd タンデム型飛行時間型質量分析計
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GB201104292D0 (en) 2011-03-15 2011-04-27 Micromass Ltd M/z targets attenuation on time of flight instruments
WO2012132550A1 (ja) 2011-03-25 2012-10-04 株式会社島津製作所 飛行時間型質量分析装置
DE102011100525B4 (de) * 2011-05-05 2015-12-31 Bruker Daltonik Gmbh Betrieb eines Flugzeitmassenspektrometers mit orthogonalem Ionenauspulsen
CN104160473B (zh) * 2012-04-02 2017-03-15 Dh科技发展私人贸易有限公司 使用离子阱跨越质量范围进行连续窗口化获取的系统及方法
EP2850645B1 (en) * 2012-05-18 2018-10-31 DH Technologies Development Pte. Ltd. Systems and methods for using interleaving window widths in tandem mass spectrometry
JP6195528B2 (ja) * 2014-02-19 2017-09-13 東京エレクトロン株式会社 プラズマ処理装置及びその運転方法
GB201409074D0 (en) 2014-05-21 2014-07-02 Thermo Fisher Scient Bremen Ion ejection from a quadrupole ion trap
US9711341B2 (en) * 2014-06-10 2017-07-18 The University Of North Carolina At Chapel Hill Mass spectrometry systems with convective flow of buffer gas for enhanced signals and related methods
US9425033B2 (en) * 2014-06-19 2016-08-23 Bruker Daltonics, Inc. Ion injection device for a time-of-flight mass spectrometer
JP6311791B2 (ja) * 2014-08-08 2018-04-18 株式会社島津製作所 飛行時間型質量分析装置
JP6237907B2 (ja) * 2014-08-19 2017-11-29 株式会社島津製作所 飛行時間型質量分析装置
WO2016042632A1 (ja) * 2014-09-18 2016-03-24 株式会社島津製作所 飛行時間型質量分析装置
EP3404695B1 (en) * 2016-01-12 2019-11-27 Shimadzu Corporation Time-of-flight mass spectrometer
CN113420882B (zh) * 2021-06-17 2023-08-22 南方科技大学 离子阱装置以及离子阱装置的鞍点移动方法

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Cited By (2)

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Publication number Priority date Publication date Assignee Title
JP2008108739A (ja) * 2007-11-26 2008-05-08 Hitachi High-Technologies Corp 質量分析装置およびこれを用いる計測システム
US10324071B2 (en) 2014-11-17 2019-06-18 Shimadzu Corporation Chromatograph mass spectrometer

Also Published As

Publication number Publication date
EP1302973B1 (en) 2012-09-12
EP1302973A3 (en) 2006-04-12
US20030066958A1 (en) 2003-04-10
US6900430B2 (en) 2005-05-31
JP2003123685A (ja) 2003-04-25
EP1302973A2 (en) 2003-04-16

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