JP3945464B2 - Electronic component characteristic measuring apparatus and method - Google Patents

Description

  The present invention relates to an electronic component characteristic measuring apparatus and method for measuring characteristics such as impedance of various electronic components.

  As an apparatus for measuring characteristics such as impedance of an electronic component in the past and a method thereof, for example, a plurality of measurement contacts to be brought into contact with a plurality of terminals provided in the electronic component, and a connection body that connects the measurement contact and the measurement device The measurement contact is movable, the measurement contact is brought into contact with and operated by a plurality of terminals of the electronic component, and various characteristics of the electronic component are measured (see Patent Document 1).

FIG. 3 is a perspective view of the main part of the conventional characteristic measuring apparatus for electronic components described in Patent Document 1, which is made of a conductive material and includes a plurality of terminals 1 for assembly or connection to various electronic devices. An electronic component 2 disposed at an end, a plurality of measurement contacts 3 to 6 which are movable to be brought into contact with the terminal 1 of the electronic component 2, and the measurement contacts 3 to 6 and a measuring device for measuring impedance and the like. The connection bodies 8 to 11 to be connected are provided, and the measurement contacts 3 to 6 are brought into contact with and movable with the terminal 1 of the electronic component 2.
Japanese Patent Publication No. 2000-230948

  However, in the conventional characteristic measuring apparatus and method, if there are dirt or impurities on the surface of the terminal of the electronic component and the contact surface of the measuring contact, they contribute to an increase in contact resistance, and the characteristic, that is, the electric characteristic It became a factor of error for the true value.

  In addition, the same position (contact point) of the measurement contact contacts the terminal of the electronic component for each measurement, so that dirt or impurities accumulate on the contact point of the measurement contact, resulting in increased contact resistance. Conversely, wear of the measuring contact may change its shape and change its contact resistance, which may cause variations in the measured value, so it is necessary to replace the measuring contact within a certain period. It was.

  The present invention is intended to solve the above-described conventional problems, wherein the contact (contact) portion of the measurement contact is configured to be rotatable and movable in one direction, and the contact (contact) of the measurement contact. To provide an apparatus and method for measuring characteristics of an electronic component capable of suppressing an increase in contact resistance by removing dirt and impurities and reducing the frequency of replacement of measurement contacts by changing a point without being limited to a specific place. It is the purpose.

  In order to solve the conventional problems, the present invention has the following configuration.

  The invention according to the first aspect of the present invention particularly relates to a transport mechanism for an electronic component having a plurality of terminals, a plurality of contact bodies that come into contact with the terminals of the electronic component, and the contact bodies that are fitted into the terminals of the electronic component. A one-way rotating mechanism that makes the contact body contact while sliding without rotating when contacting, and a lever that rotates when detached from the terminal, and a lever that is connected to the one-way rotating mechanism and is held movably The connection mechanism for connecting the lever and the measuring device is configured such that the outer peripheral surface of the contact body slides or rotates on the surface of the terminal, and the surface of the terminal of the electronic component and the contact body As a result, it is possible to remove dirt, impurities, and the like on the outer peripheral surface, to make sure that they come into contact with each other and to measure with high accuracy.

  The invention according to claim 2 of the present invention is particularly configured such that a pair of opposing contact bodies are simultaneously brought into contact with and separated from the plurality of terminals of the electronic component at the same time. In addition to the function and effect of the first aspect, the contact forces in the opposite directions due to friction are canceled out, and the function and effect that an unnecessary force on the electronic component can be reduced can be obtained.

  The invention according to claim 3 of the present invention is particularly formed by forming the one-way rotation mechanism by a ratchet, and thereby the effect of being able to reliably rotate the contact body only in one direction at low cost. Is obtained.

  The invention according to claim 4 of the present invention is particularly formed by forming the one-way rotation mechanism by a one-way clutch, and thereby, the contact body can be reliably rotated only in one direction and controlled with high accuracy. The effect is obtained.

  The invention according to claim 5 of the present invention is particularly formed by using a configuration in which the contact body and the one-way rotation mechanism are connected via a rotary actuator, whereby the contact body is rotated or moved. Is also stable, and the effect of being able to reliably connect to the measuring device can be obtained.

  The invention according to claim 6 of the present invention uses, in particular, a configuration in which a friction plate made of a conductive material is pressed on one surface of the contact body, and a separate electrical connection is made from the friction plate to a connection mechanism or a measuring instrument. As a result, it is possible to obtain an operational effect that the contact body is stable even when rotating or moving, and can be reliably connected to a measuring instrument.

  According to the seventh aspect of the present invention, in particular, after an electronic component having a plurality of terminals is placed at a predetermined location, the contact body of the measurement contact corresponding to the terminal is moved without rotating, and the terminal The outer surface of the contact body is slid on the surface of the contact member to clean and contact the surface of the terminal, and then the electrical characteristics of the electronic component are measured. After the measurement of the electrical characteristics is completed, the contact body is rotated. In this method, the outer peripheral surface of the contact body that contacts the terminal of the next electronic component to be measured is made new by moving it away from the electrode, and the outer peripheral surface of the contact body is the surface of the terminal. By sliding or rotating, the surface of the terminal and the outer peripheral surface of the contact body can be cleaned of dirt and impurities, and can always come into contact with the new outer peripheral surface.

  According to the apparatus and method for measuring characteristics of an electronic component according to the present invention, it is possible to remove the dirt and impurities on the surface of the terminal of the electronic component and the outer peripheral surface of the contact body at the measurement contact, thereby suppressing an increase in contact resistance. By changing (moving) the contact point of the contact body at the measurement contact without being limited to a specific location, it is possible to prevent accumulation concentration and wear concentration of dirt and impurities, and to measure reliably and accurately. There is an effect that the exchange frequency can be reduced.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

  FIG. 1 is a perspective view of a main part of an electronic component characteristic measuring apparatus according to an embodiment of the present invention, and FIG. 2 is an enlarged side view for explaining the operation of the measuring contact. In addition, about the structural member demonstrated in the prior art, the same code | symbol is provided and detailed description is abbreviate | omitted.

  1 and 2, reference numeral 2 denotes an electronic component having a plurality of terminals 1, which are mounted at regular intervals on one surface of a conveyor belt 18 that moves at regular intervals in the direction of the arrow. Reference numerals 21 to 24 correspond to the plurality of terminals 1 and are measuring contacts each made of a conductive material.

  The measurement contacts 21 to 24 are respectively fitted into the one-way rotation mechanisms 21a to 24a and the one-way rotation mechanisms 21a to 24a that are rotatable only in the direction of the arrow shown in FIG. It is comprised by the disk-shaped contact bodies 21b-24b which contact | abut to the surface of 1 and the levers 21c-24c which are arm-shaped holding mechanisms.

  Reference numerals 8 to 11 are conductive elastic materials, one end of which is connected and fixed to the protrusions of the levers 21c to 24c of the measurement contacts 21 to 24 by connection screws 14, and 15 is a U-shaped arm shape made of an insulating material. A wiring body 16 is a fixing screw, and is connected to the other end of the connection bodies 8 to 11 and a lead wire 17 for connection to a measuring device (not shown) for measuring characteristics such as impedance of the electronic component 2. And it fixes to the edge part of the wiring body 15, and the connection mechanism is comprised by the above.

  Reference numerals 12 and 13 are shafts for supporting and rotating the levers 21c, 22c and 23c, 24c. Reference numeral 7 is a metal-shaped or hard insulating material, which is movable in the direction of the arrow and has an open upper end. The shafts 12 and 13 are held at the upper end of the opening.

  Reference numeral 19 denotes a spring disposed inside the square shape of the measurement block 7, with one end on the bottom inside the square shape in the pair of measurement blocks 7 and the other end on the one-way rotation mechanisms 21 a to 24 a and the contact body 21 b to 21 b. The other ends of the levers 21c to 24c not provided with 24b are brought into contact with each other, and the other ends of the levers 21c to 24c are moved upward, that is, the contact bodies 21b to 24b are moved downward (contact with the terminal 1 of the electronic component 2). The surface is a surface).

  Now, in the present invention, when measuring electrical characteristics such as impedance (particularly low impedance) in the electronic component 2 with the measurement contacts 21 to 24, the movement of the levers 21c to 24c and the one-way rotation mechanisms 21a to 24a are used for contact. The bodies 21b to 24b do not rotate and are brought into contact with the plurality of terminals 1 in the electronic component 2 while removing dirt, impurities, and the like on the outer peripheral surfaces of the contact bodies 21b to 24b by friction, and predetermined electrical characteristics are measured.

  When the measurement of the predetermined electrical characteristics is completed and the contact bodies 21b to 24b are detached from the terminal 1, the contact bodies 21b to 24b are moved by the movement of the levers 21c to 24c and the one-way rotation mechanisms 21a to 24a. Electrical characteristics such as impedance of the electronic component 2 in which the contact points (positions) of the contact bodies 21b to 24b change in the next measurement when the contact bodies 21b to 24b rotate due to friction between the outer peripheral surface and the surface of the terminal 1 are measured. Measuring device and method thereof.

  That is, first, the electronic component 2 mounted on the conveyor belt 18 is set to the linear position of the measurement contacts 21 to 24 arranged in pairs by the intermittent movement of the conveyor belt 18 in the arrow direction. Next, the pair of measurement blocks 7 move so as to approach each other, and the outer peripheral surfaces of the contact bodies 21 b to 24 b are brought into contact with the edges of the terminals 1 of the electronic component 2.

  Further, the measurement block 7, that is, the levers 21 c to 24 c are moved (advanced) and brought into contact with the outer peripheral surface of the contact bodies 21 b to 24 b and the surface of the terminal 1 of the electronic component 2, that is, the flat portion. 2. Measure and measure electrical characteristics such as impedance. At that time, the contact members 21b to 24b do not rotate by the elastic force of the spring 19 and the one-way rotating mechanisms 21a to 24a, but slide and slide against the surface of the terminal 1 by friction.

  When the measurement of electrical characteristics such as impedance in the electronic component 2 by the measuring device is completed, the measurement block 7, that is, the levers 21c to 24c is moved (retracted) to return to the original position. At that time, due to the elastic force of the spring 19 and the one-way rotating mechanisms 21a to 24a, the contact bodies 21b to 24b are detached from the surface of the terminal 1 while rotating without sliding.

  Subsequently, the conveyor belt 18 is intermittently moved, the same operation is performed, and electrical characteristics such as impedance in the next electronic component 2 are measured.

  That is, when measuring the electrical characteristics such as the impedance of the electronic component 2, the measurement contacts 21 to 24 are moved (advanced) to contact the contact bodies 21 b to 24 b with the plurality of terminals 1 of the electronic component 2. In addition, the unidirectional rotating mechanisms 21a to 24a are set in a non-rotatable direction (opposite to the arrow direction in FIG. 2D), as shown in FIGS. 2A to 2C. At the contact point A25 and the contact point B26, the surface of the terminal 1 and the outer peripheral surfaces of the contact bodies 21b to 24b are slid without sliding and rotating, and the surface of the terminal 1 and the contact bodies 21b to 24b The dirt and impurities on the outer peripheral surface are removed.

  Further, as shown in FIG. 2 (c), after the movement (advance) of the measurement contacts 21 to 24 is completed, the electrical characteristics such as impedance in the electronic component 2 are measured by the measuring device, and FIG. 2 (e), when moving (retracting) the measurement contacts 21 to 24 to return them to their original positions, the outer peripheral surfaces of the one-way rotating mechanisms 21a to 24a and the contact bodies 21b to 24b and the terminal 1 The contact point A25 and the contact point B26 are changed (moved) to the locations (positions) of the contact point C27 and the contact point D28 by rotating in the direction of the arrow shown in FIG.

  Thereby, when measuring electrical characteristics such as impedance in the next electronic component 2, electrical characteristics such as impedance can be measured at the contact point C27 and the contact point D28 which are new contact locations (positions). It is.

  In the present embodiment, the measurement contacts 21 to 24 are movable forward and backward, that is, in a horizontal straight line. However, the distance of horizontal movement may be shortened as a configuration to which a function of being movable up and down, that is, vertically is added.

  In addition, as shown in FIG. 1, if one or more pairs of opposed measurement contacts 21 to 24 are brought into contact with each other at the same time and separated from each other at the same time, they can be brought into contact with each other by friction compared to contact (contact) by movement from one direction. This cancels out the contact force in the opposite direction, and it is possible to reduce unnecessary action force on the electronic component 2 (for example, a displacement with respect to the electronic component 2, an effect of insufficient contact or nonuniformity).

  Furthermore, if a ratchet or a one-way clutch is used as the one-way rotating mechanisms 21a to 24a, the contact bodies 21b to 24b can be reliably rotated only in one direction.

  Furthermore, in the connection from the contact bodies 21b to 24b to the lead wire 17 in the connection configuration of the measurement contacts 21 to 24 and the measurement device, the contact bodies 21b to 24b and the one-way rotation mechanisms 21a to 24a are connected to a rotary actuator (mercury contact). ), Or by pressing a friction plate made of a conductive material on one surface of the contact bodies 21b to 24b, and separately connecting to the lead wire 17 or the measuring instrument from the friction plate.

  The apparatus and method for measuring characteristics of an electronic component according to the present invention can suppress an increase in contact resistance between the surface of the terminal and the measurement contact in the electronic component, prevent accumulation of dirt and impurities, and concentration of wear, and reliably and accurately. It has the effect of being able to measure well and reducing the frequency of replacement of measuring contacts, such as an electronic component characteristic measuring apparatus and method for measuring the impedance, chemical and physical characteristics of various electronic components. Useful as an application.

FIG. 2 is a perspective view of the main part configuration in the electronic component characteristic measuring apparatus of the present invention. Enlarged side view explaining the operation of the measurement contact A perspective view of a main part of a conventional electronic component characteristic measuring apparatus

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Terminal 2 Electronic component 7 Measuring block 8 Connection body 9 Connection body 10 Connection body 11 Connection body 12 Axis 13 Axis 14 Connection screw 15 Wiring body 16 Fixing screw 17 Lead wire 18 Conveyance belt 19 Spring 21 Measurement contact 21a Unidirectional rotation mechanism 21b Contact body 21c Lever 22 Measuring contact 22a One-way rotation mechanism 22b Contact body 22c Lever 23 Measurement contact 23a One-way rotation mechanism 23b Contact body 23c Lever 24 Measurement contact 24a One-way rotation mechanism 24b Contact body 24c Lever 25 Contact point A
26 Contact point B
27 Contact point C
28 Contact point D

Claims (7)

A transport mechanism for an electronic component having a plurality of terminals, a plurality of contact members that contact the terminals of the electronic component, and a contact member that slides without rotating when the contact member is inserted into contact with the terminals of the electronic component. It is composed of a one-way rotation mechanism that is brought into contact with the terminal and rotated when it is detached from the terminal, a lever that is connected to the one-way rotation mechanism and is held movably, and a connection mechanism that connects the lever and the measuring instrument. A device for measuring the characteristics of electronic components. 2. The electronic component characteristic measuring apparatus according to claim 1, wherein a pair of opposing contact bodies are simultaneously brought into contact with and separated from the plurality of terminals of the electronic component at the same time. 3. The electronic component characteristic measuring apparatus according to claim 1, wherein the one-way rotating mechanism is formed by a ratchet. 3. The electronic component characteristic measuring apparatus according to claim 1, wherein the one-way rotating mechanism is formed by a one-way clutch. The electronic component characteristic measuring apparatus according to claim 1, wherein the contact body and the one-way rotating mechanism are connected via a rotary actuator. 3. The structure according to claim 1, wherein a friction plate made of a conductive material is pressed on one surface of the contact body, and a separate electrical connection is made from the friction plate to a connection mechanism or a measuring device. Equipment for measuring the characteristics of electronic components. After placing an electronic component having a plurality of terminals at a predetermined location, the contact body of the measurement contact corresponding to the terminal is moved without rotating, and the outer peripheral surface of the contact body is slid on the surface of the terminal. After cleaning and contacting the surface of the terminal, the electrical characteristics of the electronic component are measured, and after the measurement of the electrical characteristics is completed, the contact body is moved while being rotated and separated from the electrode. A method for measuring the characteristics of an electronic component in which the outer peripheral surface of the contact body in contact with the terminal of the electronic component to be measured is new.

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