JP3891682B2 - Valve device and on-off valve cleaning method - Google Patents

Valve device and on-off valve cleaning method Download PDF

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Publication number
JP3891682B2
JP3891682B2 JP09085098A JP9085098A JP3891682B2 JP 3891682 B2 JP3891682 B2 JP 3891682B2 JP 09085098 A JP09085098 A JP 09085098A JP 9085098 A JP9085098 A JP 9085098A JP 3891682 B2 JP3891682 B2 JP 3891682B2
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Japan
Prior art keywords
valve
cleaning liquid
gas
flow path
cleaning
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JPH11195649A (en
Inventor
邦明 堀江
秀直 鈴木
勉 中田
光直 柴崎
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Ebara Corp
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Ebara Corp
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Description

【0001】
【発明の属する技術分野】
本発明は、開閉弁の洗浄方法及びその装置に係り、特に、チタン酸バリウム/ストロンチウム等の高誘電体又は強誘電体薄膜を基板上に気相成長させる薄膜気相成長装置に使用される開閉弁の内部を洗浄するのに使用して最適な開閉弁の洗浄方法及びその装置に関する。
【0002】
【従来の技術】
近年、半導体産業における集積回路の集積度の向上はめざましく、現状のメガビットオーダから、将来のギガビットオーダを睨んだDRAMの研究開発が行われている。かかるDRAMの製造のためには、小さな面積で大容量が得られるキャパシタ素子が必要である。このような大容量素子の製造に用いる誘電体薄膜として、誘電率が10以下であるシリコン酸化膜やシリコン窒化膜に替えて、誘電率が20程度である五酸化タンタル(Ta25) 薄膜、あるいは誘電率が300程度であるチタン酸バリウム(BaTiO3) 、チタン酸ストロンチウム(SrTiO3)又はこれらの混合物であるチタン酸バリウムストロンチウム等の金属酸化物薄膜材料が有望視されている。また、さらに誘電率が高いPZT、PLZT、Y1等の強誘電体の薄膜材料も有望視されている。
【0003】
ところで、このような素材の成膜を行う方法として、化学気相成長(CVD)が有望とされており、この場合、最終的に成膜室内で原料ガスを被成膜基板に安定的に供給する必要がある。原料ガスは、常温で固体のBa(DPM)2、Sr(DPM)2 などを液状化し、さらに気化特性を安定化させるために有機溶剤(例えばTHFなど)を混合させたものを気化器で加熱し気化することによって生成される。この種の気化器においては、気化器で液体(液体原料)を気化する際に、金属との化合物や中間生成物等が生成される。
【0004】
このような薄膜気相成長装置においては、気化器で気化させた原料ガスを成膜室に供給する原料ガス供給流路の途中に、トラップ装置を有するバイパス流路を開閉弁によって切り換え可能に設けている。これは、成膜工程が終わった時や、気化器の気化状態が安定するまでの原料ガスをこのバイパス流路に流し、トラップ装置で原料ガスの成分をトラップして回収してから排出するものである。
【0005】
【発明が解決しようとする課題】
ところで、この種の原料ガスは気化させることが一般に困難でありかつ反応性が高いので、気化器の2次側に未気化物や反応生成物が流出してしまうことが多い。従って、図5に示すように、この未気化物や反応生成物が弁シート12や弁体14に付着したり、合わせ面を傷つけ、開閉弁10の機能を劣化させるという問題があった。このことは、図示のベローズタイプのものに限らず、ダイヤフラムタイプ等の他の開閉弁にあっても同様である。
【0006】
なお、開閉弁を保温して付着を防ぐことも考えられるが、加熱が不完全で温度が低下した場合には、開閉弁内で原料ガスの再凝縮が発生し、また、加熱し過ぎると原料ガスが変質して付着してしまうという問題がある。
【0007】
本発明は上記に鑑み、例え未気化物や反応生成物を伴った流体が流れても、開閉弁の内部を容易かつ確実に洗浄して、この機能が劣化してしまうのを防止するようにした弁装置を提供することを目的とする。
【0008】
【課題を解決するための手段】
請求項1に記載の発明は、固形物を析出しやすい原料ガスの流路を開閉するための弁装置において、弁体と弁シートの間の隙間に向けてパージガスを供給するガス吐出ポートと、弁体の近傍より弁装置の上流側の流路に向けて洗浄液を供給する洗浄液ポートが設けられていることを特徴とする弁装置である。
【0009】
これにより、弁シートや弁体に付着した固形物をガスで気化促進させ、あるいは吹き飛ばして、バルブシール面から除去してから弁を閉じるので、固形物を挟み込んだ状態で弁が閉じられることによるシール不良や弁シートの傷の発生が防止される。また、弁体の近傍より洗浄液を流すことで弁体の近傍に堆積した固形物を洗浄して、次に弁装置が開いた時に固形物によるシール不良や弁シートの傷の発生が防止される。
【0010】
請求項2に記載の発明は、固形物を析出しやすい原料ガスの流路を開閉するための開閉弁を操作する際に、前記開閉弁を閉じる直前に弁体と弁シートの間の隙間に向けてパージガスを供給し、前記開閉弁を閉じた後に弁体の近傍より開閉弁の上流側の流路に向けて洗浄液を供給することを特徴とする開閉弁の洗浄方法である。
【0011】
れにより、弁体の近傍に堆積した固形物を洗浄して、次に弁装置が開いた時に固形物によるシール不良や弁シートの傷の発生が防止される。
【0013】
【発明の実施の形態】
以下、本発明の実施の形態を図面を参照して説明する。
図1は、例えば液状のBa(DPM)2,Sr(DPM)2等を有機溶剤(例えばTHFなど)中に溶解させた液体原料を気化器20で気化させて原料ガスを生成し、このガス原料と酸素含有ガスとを混合させつつ、成膜室(反応室)22内で一定の温度に加熱した基板に噴射して、この基板上に金属酸化物薄膜を気相成長させる成膜システムを示すものである。
【0014】
気化器20には、上流側の液体原料源に繋がる液体原料流路26と、液体原料をその気化温度以上に加熱するヒータ24が設けられている。また、下流側には、気化した原料ガスを排出する原料ガス流路28が設けられ、これは気化器20の下流で開閉弁32a、成膜室22及びトラップ装置36aに繋がる成膜流路29と、開閉弁32b、トラップ装置36bを有するバイパス流路30に分岐し、トラップ装置36aの下流に設けた開閉弁32cの下流で再度合流してポンプ38に繋がっている。これらの原料ガス流路28、成膜流路29及びバイパス流路30の周囲には、これらを流れる原料ガスの温度を一定に保温するヒータ40が配置されている。
【0015】
トラップ装置36a,36bは、この例においては、液体窒素のような液体または冷却された空気等の冷却用熱媒体を流通させることにより、原料ガスの成分をトラップ部に付着させてこれを排ガスから除去する低温トラップであり、各トラップには、図示しない熱媒体供給源に接続された冷却媒体供給流路及び排出流路がそれぞれ備えられている。なお、トラップ装置の構造はこれに限られるものではない。
【0016】
成膜流路29内に設置された開閉弁32a、及びバイパス流路30内に設置された開閉弁32bには、洗浄液タンク44からポンプ58を経由して延びる洗浄液供給流路42が接続されている。この洗浄液供給流路42は、ポンプ58の下流で2つの分岐流路46a,46bに分岐し、この各分岐流路46a,46bはそれぞれ開閉弁32d,32eを介して各開閉弁32a,32bの1次側に設けられた洗浄液ポート49a,49bにそれぞれ接続されている。各開閉弁32a,32bには、各洗浄液ポート49a,49bに近接してガス注入ポート48a,48bが設けられ、これにはAr等のパージガス源に接続されたガス流路50a,50bがそれぞれ接続されている。
【0017】
洗浄液タンク44内には、例えばテトラヒドロフラン(THF)からなる洗浄液52が貯留されているとともに、この洗浄液52を加温するヒータ54と、洗浄液52の液面をHeガス等のガスで加圧する加圧装置56が備えられている。また、洗浄液供給流路42には、洗浄液52を加圧しながら順次送り出すポンプ58が設置されている。
【0018】
加圧装置56は、洗浄液52をその蒸気圧以上に加圧して常に液体状態で開閉弁32a,32bの内部に供給するために設けられ、ポンプ58のみで洗浄液52をこの蒸気圧以上に加圧できるような場合には必ずしも必要ではない。しかしながら、加圧装置56を備えることによって、ポンプ58の吸込み側で低圧となって、洗浄液52がポンプ58の吸込み側で一部で気化してしまうことを防止することができる。もちろん、洗浄領域の出口末端部に蒸気圧以上のクラッキング圧の逆止弁を設け、洗浄領域内に圧力を掛けるようにしてもよい。
【0019】
更に、気化器20のすぐ上流側の液体原料流路26から分岐して洗浄液タンク44に連絡する洗浄液ベント流路60が設けられている。このベント流路60には開閉弁32fが設けられ、また、液体原料流路26の分岐点の上流側には開閉弁32gが設けられている。
【0020】
以下、この実施の形態の洗浄システムの作用を説明する。成膜を行う時には、成膜流路29内の開閉弁32aを開き、バイパス流路30内の開閉弁32bを閉じて原料ガスを成膜室22内に導く。成膜を行っていない時や気化状態が安定するまでの間は、成膜流路29内の開閉弁32aを閉じ、バイパス流路30内の開閉弁32bを開いて原料ガスをバイパス流路30内に導く。成膜室22から排気流路34、トラップ装置36aを経由した処理ガスと、バイパス流路30内をトラップ装置36bを経由して流れた原料ガスは、それぞれ合流して排気ポンプ38から外部に排気される。
【0021】
これらの過程において、開閉弁32a,32bの内部には原料ガスが流れ、この原料ガス中の未気化成分や反応生成物が、弁シート62や弁体64に付着する。従って、以下に説明するように、開閉弁32a,32bに対するこれらの物質の付着防止及び洗浄工程を行なう。
【0022】
先ず、開閉弁32a,32bを閉じる直前に、各分岐流路46a,46b内の開閉弁32d,32eを閉じた状態で、図2に示すように、各ガス注入ポート48a,48bを開いて加熱したArガス等のパージガスを注入し、開閉弁32a,32bの弁シート62と弁体64との間に付着した付着物を除去する。その後に、開閉弁32a,32bを閉じるが、弁シート62と弁体64に付着した付着物が除去されているため、バルブシール面の損傷を防止して、シール性を維持することができる。
【0023】
次に、各ガス注入ポート48a,48bを閉じ、ポンプ58を駆動させ、同時に各分岐流路46a,46b内の開閉弁32d,32eと洗浄液ポート49a,49bを開く。これにより、図3に示すように、ポンプ58と加圧装置56を介して加圧された洗浄液52を開閉弁32a,32bの1次側に流入させる。そして、洗浄液ベント流路60内の開閉弁32fを開いて、洗浄液52を気化器20から洗浄液ベント流路60内に循環させる。この時、洗浄液52は、気化しないように加圧されているので、液体のまま開閉弁32a,32bから気化器20に流れ、これらの内部の付着物を溶解させて効率的に洗浄する。洗浄液タンク44のヒータ54で洗浄液52を加温することにより、付着物の溶解速度及び飽和溶解度を高めて、洗浄効果を高めることができる。
【0024】
そして、ポンプ58を停止させるとともに、分岐流路46a,46bの開閉弁32d,32eを閉じ、しかる後、ガス注入ポート48a,48bを開いてガス流路50a,50bからパージガスを導入し、これによって、開閉弁32a,32bから気化器20内の洗浄液52を全て洗浄液タンク44に回収して、洗浄を完了する。これにより、気化器20、液体原料流路26及びバイパス流路30を含む流路と、開閉弁32a,32bの弁シート62と弁体64が清浄化される。
【0025】
何回かの洗浄を繰り返し、所定の量の原料ガスが溶解すると、洗浄液の堆積も増えて洗浄能力が低下するので、洗浄液を交換する。液換えのタイミングは、洗浄液の容積、質量、比重、光の透過量、誘電率、粘度等の種々のパラメータの変化により検知することができる。
【0027】
【発明の効果】
以上説明したように、本発明によれば、弁シートや弁体に付着した固形物をガスで吹き飛ばしてバルブシール面から除去してから弁を閉じるので、固形物を挟み込んだ状態で弁が閉じられることによるシール不良や弁シートの傷の発生が防止され、また、弁体の近傍より洗浄液を流すことで弁体の近傍に堆積した固形物を洗浄して、次に弁装置が開いた時に固形物によるシール不良や弁シートの傷の発生が防止される。従って、例え未気化物や反応生成物を伴った流体が流れても、開閉弁の内部を容易かつ確実に洗浄して、この機能が劣化してしまうのを防止するようにした弁装置を提供することができる。
【図面の簡単な説明】
【図1】本発明の実施の形態の概略を示す図である。
【図2】洗浄の一工程を示す要部の拡大断面図である。
【図3】同じく、洗浄の一工程を示す要部の拡大断面図である。
【図4】 従来の開閉弁の断面図である。
【符号の説明】
20 気化器
22 成膜室
28 原料ガス供給流路
30 バイパス流路
32a〜32g 開閉弁
36a,36b トラップ装置
42 洗浄液供給流路
46a,46b 分岐流路
48a,48b ポート
50a,50b ガス注入流路
58 ポンプ
60 洗浄液ベント流路
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an on-off valve cleaning method and apparatus, and more particularly to an open / close used in a thin film vapor deposition apparatus for vapor-depositing a high dielectric or ferroelectric thin film such as barium titanate / strontium on a substrate. The present invention relates to an optimum on-off valve cleaning method and apparatus used for cleaning the inside of a valve.
[0002]
[Prior art]
In recent years, the degree of integration of integrated circuits in the semiconductor industry has been remarkably improved, and research and development of DRAMs with a gigabit order in the future from the current megabit order has been conducted. In order to manufacture such a DRAM, a capacitor element capable of obtaining a large capacity in a small area is required. As a dielectric thin film used for manufacturing such a large capacity element, tantalum pentoxide (Ta 2 O 5 ) having a dielectric constant of about 20 is used instead of a silicon oxide film or a silicon nitride film having a dielectric constant of 10 or less. A thin film or a metal oxide thin film material such as barium titanate (BaTiO 3 ), strontium titanate (SrTiO 3 ) or a mixture thereof having a dielectric constant of about 300 is promising. In addition, ferroelectric thin film materials such as PZT, PLZT, and Y1, which have a higher dielectric constant, are also promising.
[0003]
By the way, chemical vapor deposition (CVD) is considered promising as a method for forming such a material, and in this case, the source gas is finally stably supplied to the deposition target substrate in the deposition chamber. There is a need to. The raw material gas is a solid Ba (DPM) 2 , Sr (DPM) 2, etc. that is liquefied at room temperature and then mixed with an organic solvent (such as THF) in order to stabilize the vaporization characteristics. It is generated by vaporizing. In this type of vaporizer, when a liquid (liquid raw material) is vaporized by the vaporizer, a compound with a metal, an intermediate product, or the like is generated.
[0004]
In such a thin film vapor phase growth apparatus, a bypass channel having a trap device is provided to be switchable by an on-off valve in the middle of a source gas supply channel for supplying a source gas vaporized by a vaporizer to a film forming chamber. ing. This is because when the film formation process is completed or until the vaporization state of the vaporizer is stabilized, the raw material gas is caused to flow through this bypass flow path, and the components of the raw material gas are trapped and collected by the trap device and then discharged. It is.
[0005]
[Problems to be solved by the invention]
By the way, since this kind of source gas is generally difficult to vaporize and has high reactivity, unvaporized substances and reaction products often flow out to the secondary side of the vaporizer. Therefore, as shown in FIG. 5, there is a problem that this unvaporized product or reaction product adheres to the valve seat 12 or the valve body 14, damages the mating surface, and deteriorates the function of the on-off valve 10 . This is not limited to the illustrated bellows type, and the same applies to other on-off valves such as a diaphragm type.
[0006]
In addition, it is conceivable to keep the on-off valve warm to prevent adhesion, but if the heating is incomplete and the temperature drops, recondensation of the raw material gas will occur in the on- off valve , and if it is heated too much, There is a problem that the gas deteriorates and adheres.
[0007]
In view of the above, the present invention is intended to prevent the function from being deteriorated by easily and surely washing the inside of the on-off valve even if a fluid accompanied by unvaporized substances or reaction products flows. An object of the present invention is to provide a valve device.
[0008]
[Means for Solving the Problems]
The invention according to claim 1 is a valve device for opening and closing a flow path of a source gas that easily deposits solids, a gas discharge port that supplies a purge gas toward a gap between a valve body and a valve seat; The valve device is characterized in that a cleaning liquid port is provided for supplying a cleaning liquid from the vicinity of the valve body toward the flow path upstream of the valve device.
[0009]
Thus, the solid adhering to the valve seat and the valve body is vaporized accelerated by gas, or blowing, so closing the valve after removing the valves sealing surface, the valve is closed in a state in which sandwich the solid This prevents the occurrence of poor sealing and damage to the valve seat. In addition, the solid material deposited in the vicinity of the valve body is washed by flowing a cleaning liquid from the vicinity of the valve body, and when the valve device is opened next, the occurrence of a sealing failure or damage to the valve seat due to the solid material is prevented. .
[0010]
According to the second aspect of the present invention, when the on-off valve for opening and closing the flow path of the source gas that is liable to deposit solid matter is operated, the gap between the valve body and the valve seat is immediately before closing the on-off valve. A cleaning gas is supplied to the flow path upstream of the on- off valve from the vicinity of the valve body after supplying the purge gas toward the end and closing the on-off valve.
[0011]
This ensures, by washing the solid deposited in the vicinity of the valve body, then the valve device the occurrence of sealing failure and valve seat scratches by solids Ru is prevented when opened.
[0013]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
In FIG. 1, for example, a liquid raw material in which liquid Ba (DPM) 2 , Sr (DPM) 2 or the like is dissolved in an organic solvent (for example, THF) is vaporized by a vaporizer 20 to generate a raw material gas. A film forming system in which a raw material and an oxygen-containing gas are mixed and sprayed onto a substrate heated to a certain temperature in a film forming chamber (reaction chamber) 22 to vapor-phase grow a metal oxide thin film on the substrate. It is shown.
[0014]
The vaporizer 20 is provided with a liquid source channel 26 connected to the upstream liquid source source, and a heater 24 that heats the liquid source to the vaporization temperature or higher. Further, on the downstream side, a raw material gas flow path 28 for discharging the vaporized raw material gas is provided, and this is a film forming flow path 29 connected to the on-off valve 32a, the film forming chamber 22 and the trap device 36a downstream of the vaporizer 20. If, on-off valve 32b, and branched into the bypass passage 30 having a trap device 36b, and joins again downstream of the opening and closing valve 32 c provided in the downstream of the trap apparatus 36a is connected to pump 38. These raw gas channel 28, around the film formation passage 29及beauty bypass flow path 30, a heater 40 for thermal insulation the temperature of the raw material gas flowing through these constant are arranged.
[0015]
In this example, the trap devices 36a and 36b cause a component of the source gas to adhere to the trap portion by circulating a cooling heat medium such as liquid nitrogen or cooled air, and remove this from the exhaust gas. Each trap is provided with a cooling medium supply passage and a discharge passage connected to a heat medium supply source (not shown). The structure of the trap device is not limited to this.
[0016]
A cleaning liquid supply channel 42 extending from the cleaning liquid tank 44 via the pump 58 is connected to the on-off valve 32 a installed in the film forming channel 29 and the on-off valve 32 b installed in the bypass channel 30. Yes. The cleaning liquid supply channel 42 is branched into two branch channels 46a and 46b downstream of the pump 58. The branch channels 46a and 46b are connected to the on-off valves 32a and 32b via the on-off valves 32d and 32e, respectively. They are connected to cleaning liquid ports 49a and 49b provided on the primary side, respectively. The open / close valves 32a and 32b are provided with gas injection ports 48a and 48b in close proximity to the cleaning liquid ports 49a and 49b, to which gas flow paths 50a and 50b connected to a purge gas source such as Ar are connected, respectively. Has been.
[0017]
A cleaning liquid 52 made of, for example, tetrahydrofuran (THF) is stored in the cleaning liquid tank 44, and a heater 54 for heating the cleaning liquid 52 and pressurization for pressurizing the liquid surface of the cleaning liquid 52 with a gas such as He gas. A device 56 is provided. The cleaning liquid supply flow path 42 is provided with a pump 58 that sequentially feeds the cleaning liquid 52 while pressurizing it.
[0018]
The pressurizing device 56 is provided to pressurize the cleaning liquid 52 to a pressure equal to or higher than its vapor pressure and to constantly supply the cleaning liquid 52 to the inside of the on-off valves 32a and 32b in a liquid state. It is not always necessary when possible. However, by providing the pressurizing device 56, it is possible to prevent the cleaning liquid 52 from partially vaporizing on the suction side of the pump 58 due to a low pressure on the suction side of the pump 58. Of course, a check valve having a cracking pressure equal to or higher than the vapor pressure may be provided at the outlet end of the cleaning region so as to apply pressure to the cleaning region.
[0019]
Further, a cleaning liquid vent channel 60 branched from the liquid raw material channel 26 immediately upstream of the vaporizer 20 and communicating with the cleaning liquid tank 44 is provided. The vent channel 60 is provided with an opening / closing valve 32 f, and an opening / closing valve 32 g is provided upstream of the branch point of the liquid source channel 26.
[0020]
Hereinafter, the operation of the cleaning system of this embodiment will be described. When film formation is performed, the on- off valve 32 a in the film-formation channel 29 is opened, the on- off valve 32 b in the bypass channel 30 is closed, and the source gas is guided into the film-formation chamber 22. While the film is not formed or until the vaporization state is stabilized, the on- off valve 32a in the film-forming channel 29 is closed, and the on- off valve 32b in the bypass channel 30 is opened to supply the source gas to the bypass channel 30. Lead in. The processing gas from the film forming chamber 22 via the exhaust passage 34 and the trap device 36a and the raw material gas flowing through the bypass passage 30 via the trap device 36b are merged and exhausted from the exhaust pump 38 to the outside. Is done.
[0021]
In these processes, the raw material gas flows inside the on-off valves 32 a and 32 b, and unvaporized components and reaction products in the raw material gas adhere to the valve seat 62 and the valve body 64. Therefore, as will be described below, an adhesion prevention and cleaning process for these substances on the on-off valves 32a and 32b is performed.
[0022]
First, immediately before closing the on-off valves 32a and 32b, with the on-off valves 32d and 32e in the branch flow paths 46a and 46b closed, as shown in FIG. 2, the gas injection ports 48a and 48b are opened and heated. It was injected Pajiga scan such as Ar gas, to remove the deposits adhered to between the opening and closing valve 32a, the valve seat 62 and the valve element 64 of 32b. Thereafter, the on-off valves 32a and 32b are closed, but since the deposits attached to the valve seat 62 and the valve body 64 are removed, damage to the valve seal surface can be prevented and the sealing performance can be maintained.
[0023]
Next, the gas injection ports 48a and 48b are closed and the pump 58 is driven, and at the same time, the on-off valves 32d and 32e and the cleaning liquid ports 49a and 49b in the branch flow paths 46a and 46b are opened. Thereby, as shown in FIG. 3, the cleaning liquid 52 pressurized through the pump 58 and the pressurizing device 56 is caused to flow into the primary side of the on-off valves 32a and 32b. Then, the on-off valve 32 f in the cleaning liquid vent channel 60 is opened, and the cleaning liquid 52 is circulated from the vaporizer 20 into the cleaning liquid vent channel 60. At this time, since the cleaning liquid 52 is pressurized so as not to be vaporized, it flows from the on-off valves 32a and 32b to the vaporizer 20 while being in a liquid state, and the adhering substances inside these are dissolved and washed efficiently. By heating the cleaning liquid 52 with the heater 54 of the cleaning liquid tank 44, the dissolution rate and saturation solubility of the deposit can be increased, and the cleaning effect can be increased.
[0024]
Then, the pump 58 together with the stop, the branch flow path 46a, 46b of the on-off valve 32d, closed 32e, thereafter, introducing a purge gas injection ports 48a, gas passages 50a open 48b, from 50b, which Thus, the cleaning liquid 52 in the vaporizer 20 is all collected in the cleaning liquid tank 44 from the on-off valves 32a and 32b, and the cleaning is completed. Thereby, the flow path including the vaporizer 20, the liquid raw material flow path 26 and the bypass flow path 30, and the valve seats 62 and the valve bodies 64 of the on-off valves 32a and 32b are cleaned.
[0025]
When a predetermined amount of the source gas is dissolved by repeating the cleaning several times, the deposition of the cleaning liquid also increases and the cleaning performance decreases, so the cleaning liquid is replaced. The timing of liquid change can be detected by changes in various parameters such as the volume, mass, specific gravity, light transmission amount, dielectric constant, viscosity, etc. of the cleaning liquid.
[0027]
【The invention's effect】
As described above, according to the present invention, the solid matter adhering to the valve seat or the valve body is blown off with gas and removed from the valve seal surface, and then the valve is closed. Therefore, the valve is closed with the solid matter sandwiched therebetween. This prevents the occurrence of poor seals and damage to the valve seat, and the cleaning liquid is poured from the vicinity of the valve body to wash the solid matter that has accumulated near the valve body. Occurrence of poor sealing due to solid matter and damage to the valve seat are prevented. Accordingly, a valve device is provided that prevents the function from deteriorating by easily and reliably cleaning the inside of the on-off valve even if a fluid with unvaporized substances or reaction products flows. can do.
[Brief description of the drawings]
FIG. 1 is a diagram showing an outline of an embodiment of the present invention.
FIG. 2 is an enlarged cross-sectional view of a main part showing one process of cleaning.
FIG. 3 is an enlarged cross-sectional view of a main part showing one cleaning step in the same manner.
FIG. 4 is a cross-sectional view of a conventional on-off valve.
[Explanation of symbols]
20 Vaporizer 22 Deposition chamber 28 Raw material gas supply flow path 30 Bypass flow paths 32a to 32g On-off valves 36a and 36b Trap device 42 Cleaning liquid supply flow paths 46a and 46b Branch flow paths 48a and 48b Ports 50a and 50b Gas injection flow path 58 Pump 60 Cleaning liquid vent flow path

Claims (2)

固形物を析出しやすい原料ガスの流路を開閉するための弁装置において、
弁体と弁シートの間の隙間に向けてパージガスを供給するガス吐出ポートと、弁体の近傍より弁装置の上流側の流路に向けて洗浄液を供給する洗浄液ポートが設けられていることを特徴とする弁装置。
In the valve device for opening and closing the flow path of the raw material gas that easily deposits solid matter,
And a gas discharge port for supplying a purge gas toward the gap between the valve body and the valve seat, that the cleaning liquid port is provided for supplying cleaning liquid toward the upstream side of the flow path of the valve device from the vicinity of the valve body Characteristic valve device.
固形物を析出しやすい原料ガスの流路を開閉するための開閉弁を操作する際に、
前記開閉弁を閉じる直前に弁体と弁シートの間の隙間に向けてパージガスを供給し、
前記開閉弁を閉じた後に弁体の近傍より開閉弁の上流側の流路に向けて洗浄液を供給することを特徴とする開閉弁の洗浄方法。
When operating the on-off valve for opening and closing the flow path of the source gas that tends to precipitate solids,
Supplying purge gas toward the gap between the valve body and the valve seat immediately before closing the on-off valve,
A cleaning method for an on-off valve, characterized in that after the on-off valve is closed, a cleaning liquid is supplied from the vicinity of the valve body toward a flow path upstream of the on- off valve.
JP09085098A 1998-01-05 1998-03-19 Valve device and on-off valve cleaning method Expired - Fee Related JP3891682B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TW087100062A TW471031B (en) 1997-01-08 1998-01-05 Vapor feed supply system
TW87100062 1998-01-05

Publications (2)

Publication Number Publication Date
JPH11195649A JPH11195649A (en) 1999-07-21
JP3891682B2 true JP3891682B2 (en) 2007-03-14

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US6602346B1 (en) 2000-08-22 2003-08-05 Novellus Systems, Inc. Gas-purged vacuum valve
JP4187599B2 (en) * 2003-07-03 2008-11-26 東京エレクトロン株式会社 Decompression treatment apparatus, decompression treatment method, and pressure adjustment valve
JP4707406B2 (en) * 2005-02-15 2011-06-22 株式会社荏原製作所 Safety valve apparatus for depositing underground liquid and apparatus and method for preventing deposit accumulation
WO2009107239A1 (en) * 2008-02-29 2009-09-03 株式会社日立国際電気 Semiconductor producing apparatus and method of pipe purging therefor
JP5343807B2 (en) * 2009-10-09 2013-11-13 新日鐵住金株式会社 Gas gate valve for high temperature furnace
US9133960B2 (en) * 2013-01-29 2015-09-15 Mks Instruments, Inc. Fluid control valves
JP6317998B2 (en) * 2014-05-13 2018-04-25 ヤンマー株式会社 Gasification power generation system
JP6455233B2 (en) * 2015-03-03 2019-01-23 富士電機株式会社 Beverage supply equipment

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JPH11201036A (en) 1999-07-27
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