JP3870494B2 - 表面欠陥検査装置 - Google Patents

表面欠陥検査装置 Download PDF

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Publication number
JP3870494B2
JP3870494B2 JP18913297A JP18913297A JP3870494B2 JP 3870494 B2 JP3870494 B2 JP 3870494B2 JP 18913297 A JP18913297 A JP 18913297A JP 18913297 A JP18913297 A JP 18913297A JP 3870494 B2 JP3870494 B2 JP 3870494B2
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Japan
Prior art keywords
light
inspection
light source
surface defect
curvature
Prior art date
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Expired - Fee Related
Application number
JP18913297A
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English (en)
Japanese (ja)
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JPH1123243A (ja
JPH1123243A5 (enExample
Inventor
整 久保田
勝一 小野
義博 山華
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzuki Motor Corp
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Suzuki Motor Corp
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Publication date
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Priority to JP18913297A priority Critical patent/JP3870494B2/ja
Publication of JPH1123243A publication Critical patent/JPH1123243A/ja
Publication of JPH1123243A5 publication Critical patent/JPH1123243A5/ja
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Publication of JP3870494B2 publication Critical patent/JP3870494B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
JP18913297A 1997-06-30 1997-06-30 表面欠陥検査装置 Expired - Fee Related JP3870494B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18913297A JP3870494B2 (ja) 1997-06-30 1997-06-30 表面欠陥検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18913297A JP3870494B2 (ja) 1997-06-30 1997-06-30 表面欠陥検査装置

Publications (3)

Publication Number Publication Date
JPH1123243A JPH1123243A (ja) 1999-01-29
JPH1123243A5 JPH1123243A5 (enExample) 2005-04-07
JP3870494B2 true JP3870494B2 (ja) 2007-01-17

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ID=16235950

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18913297A Expired - Fee Related JP3870494B2 (ja) 1997-06-30 1997-06-30 表面欠陥検査装置

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JP (1) JP3870494B2 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19909534B4 (de) * 1999-03-04 2011-07-07 BYK-Gardner GmbH, 82538 Vorrichtung und Verfahren zur Bestimmung der Qualität strukturierter Oberflächen
JP2002214151A (ja) * 2001-01-17 2002-07-31 Nippon Steel Corp 表面疵検査方法
WO2005038445A1 (ja) 2003-10-21 2005-04-28 Daihatsu Motor Co., Ltd. 表面欠陥検査方法及び装置
DE102005003690A1 (de) * 2005-01-26 2006-07-27 Byk-Gardner Gmbh Vorrichtung zur Untersuchung optischer Oberflächeneigenschaften
JP5481012B2 (ja) * 2006-06-05 2014-04-23 吉郎 山田 表面検査装置
JP5323320B2 (ja) * 2006-07-19 2013-10-23 有限会社シマテック 表面検査装置
KR101005077B1 (ko) * 2008-07-10 2010-12-30 성우테크론 주식회사 범퍼 검사장치
JP4612088B2 (ja) * 2008-10-10 2011-01-12 トヨタ自動車株式会社 画像処理方法、塗装検査方法及び装置
JP5634728B2 (ja) * 2010-03-29 2014-12-03 ジエイ・クオリティ株式会社 照明装置
JP6086362B2 (ja) 2012-12-03 2017-03-01 シーシーエス株式会社 検査システム及び検査用照明装置
JP6301194B2 (ja) * 2014-05-26 2018-03-28 浜松ホトニクス株式会社 光学プレート、光照射装置、光測定装置、光照射方法、及び、光測定方法
JP6531295B2 (ja) * 2016-05-20 2019-06-19 国立大学法人 香川大学 反射光検出装置及び反射光検出方法
KR102001342B1 (ko) * 2018-08-14 2019-07-17 김정덕 렌즈 표면 검사장치
CN111323433A (zh) * 2018-12-13 2020-06-23 深圳中科飞测科技有限公司 检测装置及其检测方法

Also Published As

Publication number Publication date
JPH1123243A (ja) 1999-01-29

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