JP3618481B2 - レーザ走査型顕微鏡 - Google Patents

レーザ走査型顕微鏡 Download PDF

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Publication number
JP3618481B2
JP3618481B2 JP22478096A JP22478096A JP3618481B2 JP 3618481 B2 JP3618481 B2 JP 3618481B2 JP 22478096 A JP22478096 A JP 22478096A JP 22478096 A JP22478096 A JP 22478096A JP 3618481 B2 JP3618481 B2 JP 3618481B2
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JP
Japan
Prior art keywords
sensitivity
photoelectric conversion
circuit
signal
laser scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP22478096A
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English (en)
Japanese (ja)
Other versions
JPH1068657A (ja
JPH1068657A5 (enExample
Inventor
祐仁 荒井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Priority to JP22478096A priority Critical patent/JP3618481B2/ja
Priority to US08/921,866 priority patent/US5945669A/en
Publication of JPH1068657A publication Critical patent/JPH1068657A/ja
Publication of JPH1068657A5 publication Critical patent/JPH1068657A5/ja
Application granted granted Critical
Publication of JP3618481B2 publication Critical patent/JP3618481B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP22478096A 1996-08-27 1996-08-27 レーザ走査型顕微鏡 Expired - Fee Related JP3618481B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP22478096A JP3618481B2 (ja) 1996-08-27 1996-08-27 レーザ走査型顕微鏡
US08/921,866 US5945669A (en) 1996-08-27 1997-08-22 Laser scan microscope and light-measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22478096A JP3618481B2 (ja) 1996-08-27 1996-08-27 レーザ走査型顕微鏡

Publications (3)

Publication Number Publication Date
JPH1068657A JPH1068657A (ja) 1998-03-10
JPH1068657A5 JPH1068657A5 (enExample) 2004-09-09
JP3618481B2 true JP3618481B2 (ja) 2005-02-09

Family

ID=16819099

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22478096A Expired - Fee Related JP3618481B2 (ja) 1996-08-27 1996-08-27 レーザ走査型顕微鏡

Country Status (2)

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US (1) US5945669A (enExample)
JP (1) JP3618481B2 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10003570A1 (de) * 2000-01-27 2001-08-02 Leica Microsystems Mikroskop-Aufbau
GB2363857A (en) * 2000-06-23 2002-01-09 Yokogawa Electric Corp Nipkow disk confocal scanner with optical image separation system
DE10132638A1 (de) * 2001-07-05 2003-01-16 Leica Microsystems Scanmikroskop und Verfahren zur wellenlängenabhängigen Detektion
DE102004058565B4 (de) 2004-10-18 2022-04-21 Leica Microsystems Cms Gmbh Scanmikroskop
DE102005047217A1 (de) * 2005-10-01 2007-04-05 Carl Zeiss Jena Gmbh Verfahren zur Steuerung eines optischen Scanners und Steuereinrichtung für einen optischen Scanner
JP5185771B2 (ja) * 2008-10-27 2013-04-17 オリンパス株式会社 顕微鏡
JP6393285B2 (ja) * 2013-03-13 2018-09-19 シーエスアイアール 放電を計測および検出するための装置、方法およびシステム
JP6441020B2 (ja) 2014-10-17 2018-12-19 オリンパス株式会社 レーザ顕微鏡
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3714441A (en) * 1971-12-13 1973-01-30 Servo Corp Photomultiplier gain control circuit
JPS5059034A (enExample) * 1973-09-24 1975-05-22
HU187978B (en) * 1983-10-07 1986-03-28 Mta Koezponti Fizikai Kutato Intezete,Hu Method and circuit arrangement for measuring light at least in a range of six order of magnitude, preferably for tld apparatuses
US5262635A (en) * 1991-11-20 1993-11-16 Bio-Rad Laboratories, Inc. Techniques for correcting non-linearity in a photodetector using predefined calibration information
JPH05336405A (ja) * 1992-06-02 1993-12-17 Hitachi Ltd 画像信号処理装置
JP2570094B2 (ja) * 1993-04-14 1997-01-08 日本電気株式会社 画像特殊効果回路
FR2711792B1 (fr) * 1993-10-21 1996-12-20 Instruments Sa Dispositif de mesure de flux lumineux.
JP3560663B2 (ja) * 1994-12-07 2004-09-02 オリンパス株式会社 走査型光学顕微鏡

Also Published As

Publication number Publication date
JPH1068657A (ja) 1998-03-10
US5945669A (en) 1999-08-31

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