JP3381193B2 - 高温超伝導薄膜を特徴付けるための装置 - Google Patents

高温超伝導薄膜を特徴付けるための装置

Info

Publication number
JP3381193B2
JP3381193B2 JP50644094A JP50644094A JP3381193B2 JP 3381193 B2 JP3381193 B2 JP 3381193B2 JP 50644094 A JP50644094 A JP 50644094A JP 50644094 A JP50644094 A JP 50644094A JP 3381193 B2 JP3381193 B2 JP 3381193B2
Authority
JP
Japan
Prior art keywords
resonator
sapphire
membrane
piston
dielectric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP50644094A
Other languages
English (en)
Japanese (ja)
Other versions
JPH08500674A (ja
Inventor
ドロシー，ロバート・グレン
ヌグエン，ビエト・スアン
シエン，ジ−ユアン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EI Du Pont de Nemours and Co
Original Assignee
EI Du Pont de Nemours and Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by EI Du Pont de Nemours and Co filed Critical EI Du Pont de Nemours and Co
Publication of JPH08500674A publication Critical patent/JPH08500674A/ja
Application granted granted Critical
Publication of JP3381193B2 publication Critical patent/JP3381193B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/70—High TC, above 30 k, superconducting device, article, or structured stock
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/70—High TC, above 30 k, superconducting device, article, or structured stock
    • Y10S505/701—Coated or thin film device, i.e. active or passive
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/725—Process of making or treating high tc, above 30 k, superconducting shaped material, article, or device
    • Y10S505/726—Measuring or testing of superconducting property
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/825—Apparatus per se, device per se, or process of making or operating same
    • Y10S505/866—Wave transmission line, network, waveguide, or microwave storage device

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Control Of Motors That Do Not Use Commutators (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
  • Thermistors And Varistors (AREA)
  • Adhesive Tapes (AREA)
  • Laminated Bodies (AREA)
  • Inorganic Compounds Of Heavy Metals (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP50644094A 1992-08-21 1993-08-18 高温超伝導薄膜を特徴付けるための装置 Expired - Fee Related JP3381193B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US93414492A 1992-08-21 1992-08-21
US07/934,144 1992-08-21
PCT/US1993/007649 WO1994004935A1 (fr) 1992-08-21 1993-08-18 Appareil destine a determiner les caracteristiques de couches minces supraconductrices a haute temperature

Publications (2)

Publication Number Publication Date
JPH08500674A JPH08500674A (ja) 1996-01-23
JP3381193B2 true JP3381193B2 (ja) 2003-02-24

Family

ID=25465036

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50644094A Expired - Fee Related JP3381193B2 (ja) 1992-08-21 1993-08-18 高温超伝導薄膜を特徴付けるための装置

Country Status (11)

Country Link
US (2) US5457087A (fr)
EP (1) EP0656123B1 (fr)
JP (1) JP3381193B2 (fr)
KR (1) KR100273994B1 (fr)
AT (1) ATE144329T1 (fr)
CA (1) CA2142827C (fr)
DE (1) DE69305525T2 (fr)
DK (1) DK0656123T3 (fr)
ES (1) ES2092836T3 (fr)
GR (1) GR3022190T3 (fr)
WO (1) WO1994004935A1 (fr)

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DE4204369C2 (de) * 1992-02-14 1994-08-25 Forschungszentrum Juelich Gmbh Verfahren zur Qualitätsbestimmung eines einzelnen supraleitenden Filmes und Vorrichtung zur Durchführung dieses Verfahrens
DE19500077C1 (de) 1995-01-04 1996-04-11 Deutsche Forsch Luft Raumfahrt Millimeterwellen-Meßverfahren
DE19524633A1 (de) * 1995-07-06 1997-01-09 Bosch Gmbh Robert Wellenleiter-Resonatoranordnung sowie Verwendung
US6083883A (en) * 1996-04-26 2000-07-04 Illinois Superconductor Corporation Method of forming a dielectric and superconductor resonant structure
JP3731314B2 (ja) * 1997-03-28 2006-01-05 王子製紙株式会社 配向測定装置
US6293012B1 (en) 1997-07-21 2001-09-25 Ysi Incorporated Method of making a fluid flow module
US5932799A (en) * 1997-07-21 1999-08-03 Ysi Incorporated Microfluidic analyzer module
US6073482A (en) * 1997-07-21 2000-06-13 Ysi Incorporated Fluid flow module
JP3634619B2 (ja) * 1998-04-06 2005-03-30 アルプス電気株式会社 誘電体共振器およびこれを用いた誘電体フィルタ
US6408215B1 (en) * 1998-04-22 2002-06-18 Agilent Technologies, Inc. Isothermal port for microwave network analyzer and method
US6366096B1 (en) 1999-08-06 2002-04-02 University Of Maryland, College Park Apparatus and method for measuring of absolute values of penetration depth and surface resistance of metals and superconductors
US6894584B2 (en) 2002-08-12 2005-05-17 Isco International, Inc. Thin film resonators
US7135869B2 (en) * 2004-01-20 2006-11-14 The Boeing Company Thickness measuring systems and methods using a cavity resonator
CN100466375C (zh) * 2005-01-21 2009-03-04 南京大学 测量超导材料微波表面电阻的复合谐振腔
US7173435B1 (en) 2006-01-27 2007-02-06 The Boeing Company Thickness measuring apparatus and method using a microwave cavity resonator
US7791339B2 (en) * 2007-09-07 2010-09-07 Varian, Inc. RF-switched superconducting resonators and methods of switching thereof
CN106017743B (zh) * 2016-05-19 2018-07-03 中国计量科学研究院 一种应用于110GHz～170GHz频率微量热计的热电转换传感器

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US4198050A (en) * 1978-02-09 1980-04-15 Adolph E. Goldfarb Game device with release ramp and scoring recesses
JPS6251804A (ja) * 1985-08-30 1987-03-06 Toshiba Corp 共振装置
IT1223708B (it) * 1988-07-21 1990-09-29 Cselt Centro Studi Lab Telecom Risonatore a cavita caricato dielettricamente
US4902971A (en) * 1988-09-14 1990-02-20 Guzik Technical Enterprises, Inc. Magnetic head and disc tester employing pivot arm on linearly movable slide
US5059891A (en) * 1989-03-20 1991-10-22 The Johns Hopkins University Microwave method for detection of weak links in superconductors
JPH02277302A (ja) * 1989-04-18 1990-11-13 Fujitsu Ltd 磁界結合ループ
US4959614A (en) * 1989-08-03 1990-09-25 The United States Of America As Represented By The Secretary Of The Navy Apparatus for determining microwave characteristics of superconductive materials using a resonant cavity and calibration waveguides
US5034711A (en) * 1990-01-23 1991-07-23 Hughes Aircraft Company Dielectric resonator support system for a waveguide
US5105158A (en) * 1990-02-13 1992-04-14 Space Systems/Loral, Inc. Dielectric microwave resonator probe
US5164358A (en) * 1990-10-22 1992-11-17 Westinghouse Electric Corp. Superconducting filter with reduced electromagnetic leakage
JPH04207405A (ja) * 1990-11-30 1992-07-29 Fujitsu Ltd 誘電体フィルタ
US5179074A (en) * 1991-01-24 1993-01-12 Space Systems/Loral, Inc. Hybrid dielectric resonator/high temperature superconductor filter
US5324713A (en) * 1991-11-05 1994-06-28 E. I. Du Pont De Nemours And Company High temperature superconductor support structures for dielectric resonator
US5440238A (en) * 1991-11-07 1995-08-08 Sandia Corporation Surface property detection apparatus and method
US5239269A (en) * 1991-11-07 1993-08-24 The United States Of America As Represented By The United States Department Of Energy Apparatus and method for measuring and imaging surface resistance

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Ｒ．Ｃ．Ｔａｂｅｒ，Ａ ｐａｒａｌｌｅｌ ｐｌａｔｅ ｒｅｓｏｎａｔｏｒ ｔｅｃｈｎｉｑｕｅ ｆｏｒ ｍｉｃｒｏｗａｖｅ ｌｏｓｓ ｍｅａｓｕｒｅｍｅｎｔｓ ｏｎ ｓｕｐｅｒｃｏｎｄｕｃｔｏｒｓ，Ｒｅｖｉｅｗ ｏｆ Ｓｃｉｅｎｔｉｆｉｃ Ｉｎｓｔｒｕｍｅｎｔｓ，ｖｏｌ．６１，ｎｏ．８，Ａｕｇｕｓｔ １９９０，ｐｐ．２２００−２２０６
Ｓ．Ｊ．Ｆｉｅｄｚｉｕｓｚｋｏ，Ｐ．Ｄ．Ｈｅｉｄｍａｎｎ，ＤＩＥＬＥＣＴＲＩＣ ＲＥＳＯＮＡＴＯＲ ＵＳＥＤ ＡＳ Ａ ＰＲＯＢＥ ＦＯＲ ＨＩＧＨ Ｔｃ ＳＵＰＥＲＣＯＮＤＵＣＴＯＲ ＭＥＡＳＵＲＥＭＥＮＴＳ，１９８９ ＩＥＥＥ ＭＴＴ−Ｓ ＩＮＴＥＲＮＡＴＩＯＮＡＬ ＭＩＣＲＯＷＡＶＥ ＳＹＭＰＯＳＩＵＭ ＤＩＧＥＳＴ，ｖｏｌ．１，１５，Ｊｕｎｅ １９８９，ｐｐ．５５５−５５８

Also Published As

Publication number Publication date
GR3022190T3 (en) 1997-03-31
ATE144329T1 (de) 1996-11-15
CA2142827A1 (fr) 1994-03-03
EP0656123B1 (fr) 1996-10-16
DK0656123T3 (da) 1996-11-18
US5457087A (en) 1995-10-10
ES2092836T3 (es) 1996-12-01
DE69305525T2 (de) 1997-03-20
JPH08500674A (ja) 1996-01-23
WO1994004935A1 (fr) 1994-03-03
US5563505A (en) 1996-10-08
CA2142827C (fr) 2001-07-24
EP0656123A1 (fr) 1995-06-07
DE69305525D1 (de) 1996-11-21
KR100273994B1 (ko) 2000-12-15

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