JP3363103B2 - Appearance inspection device - Google Patents

Description

Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an image pickup apparatus, for example, a mounted component mounted on a printed circuit board. The present invention relates to a visual inspection apparatus for inspecting the external appearance of a subject including whether or not the configuration is normal. 2. Description of the Related Art A conventional visual inspection apparatus of this type relies on a visual inspection for directly observing a subject with human eyes to determine whether or not the subject is normally constructed. However, visual inspection has many problems in terms of work environment, work efficiency, etc., and it is not possible to completely perform the visual inspection of the subject, so it includes fine defective parts and must be judged as defective. Nevertheless, it is leaked to the market as a good product, resulting in problems such as repairs and returns. In order to solve such a problem, an apparatus for automatically performing an appearance inspection without visual inspection has been developed. However, a conventional appearance inspection apparatus, for example, solders a mounted component on a printed circuit board. The probe pins are brought into contact with one or more pairs of lands that are the solder parts attached, and the impedance between them is measured, or the conduction state between them is detected, and the mounting state of the component is determined based on the presence or absence of this impedance and the conduction state. , Constants, soldering conditions, etc. are inspected. Further, as a conventional visual inspection device, an object such as a circuit component mounted on a printed circuit board is imaged by an image pickup device such as a television camera, and binary image information of the imaged object is taken. There has also been developed an image processing apparatus that performs image processing by image processing or the like and inspects the appearance of a subject based on the information obtained by the image processing. [0005] Among the above-mentioned conventional visual inspection apparatuses, the conventional visual inspection apparatus for inspecting the appearance of a subject by bringing a probe pin into contact with a land of a printed circuit board has recently been used in electronic equipment. The components mounted on the printed circuit board are also downsized due to the miniaturization of the internal components due to the miniaturization and weight reduction, and the density is increased, so there is no space for contacting the probe pins, or the thickness of the printed circuit board However, since it is thin, for example, 0.4 mm, the printed circuit board is pierced or penetrated by the probe pins, and it is difficult to make an inspection for contacting the probe pins. Further, in a conventional visual inspection apparatus for inspecting the appearance of a subject using image processing, since image processing is performed by binarization, it is difficult to discriminate a subtle color of the subject, and the There is a problem that the work of setting the threshold value for determining pass / fail is not constant, and there are many erroneous determinations. [0007] The present invention has been made in view of the above,
It is an object of the present invention to provide a visual inspection apparatus capable of absorbing variations in components and accurately performing a visual inspection of a subject with a small number of erroneous determinations. [0008] In order to achieve the above object, according to the present invention, an object is imaged by an imaging means, and the appearance of the object is determined based on the image information. A division unit that divides a predetermined inspection region of an imaging region of a subject by the imaging unit into a plurality of division lattices, and each of a plurality of pixels constituting each of the division lattices Calculating means for calculating a luminance value, a hue value, and a saturation value of each pixel from the R, G, and B values, and calculating the calculated luminance value, hue value, and saturation value of each pixel as a reference luminance value, a reference luminance value, and a reference luminance value, respectively. A hue value, a comparison with a reference saturation value, pixel determination means for determining pass / fail of each pixel, and the plurality of pixels determined by the pixel determination means for each of a plurality of pixels constituting each of a plurality of divided grids. Based on the quality of the pixel, Divided grids that are configured as pass, quasi-pass, or reject, and the number of grids that are determined by the predetermined acceptance ratio among the split grids that are determined to be quasi-passed by the split grid determiner. Carrying means for raising the quasi-accepted divided grid to a passed divided grid, and the sum of the number of passed divided grids determined to be passed by the divided grid determining means and the number of passed divided grids raised to the passed divided grid by the raised means The gist of the present invention is to have an in-examination-area appearance determining unit that determines the quality of the appearance of the subject portion in each inspection area based on a ratio of the entire divided grid in the inspection area. According to the first aspect of the present invention, for each of a plurality of pixels constituting each divided grid, the R, G,
The brightness value, hue value, and saturation value are calculated from the B value, and the brightness value, hue value, and saturation value of each pixel are compared with the reference brightness value, the reference hue value, and the reference saturation value, respectively. The pass / fail of each of the plurality of pixels constituting each divided grid is determined as pass, quasi-pass, or reject based on the pass / fail of each of the pixels, and the divided grid determined as quasi-pass is determined. The acceptance ratio is raised to the acceptable division grid, and the appearance of the subject part in each inspection area is judged based on the ratio of the acceptance division grid to the entire division grid in the inspection area, so that the appearance inspection is performed without contacting the specimen. Can be performed, labor can be greatly reduced, efficiency can be improved, and erroneous determination can be greatly reduced by three-stage determination of pixels, divided grids, and inspection areas. Also,
Because it can be configured to be able to change the criterion for each test area according to the contents of the subject portion in the test area,
Appropriate appearance inspection can be performed for various subjects. Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a block diagram illustrating a configuration of a visual inspection apparatus according to an embodiment of the present invention. The appearance inspection apparatus shown in FIG. 1 is an LED illuminating means 3 composed of RGB primary color LEDs for illuminating a subject 1 composed of mounted components such as ICs and LSIs mounted on a printed circuit board, for example.
And a color camera 5 serving as an imaging unit for imaging the subject 1 illuminated by the LED illumination unit 3. [0011] Image information of the subject 1 captured by the camera 5 is supplied to a video capture unit 7, which divides the image information into RGB signals of respective pixels constituting the image information. The data is input to the color processing unit 91.
The color processing unit 91 supplies these RGB signals to the calculation unit 93, and the calculation unit 93 calculates a luminance value, a hue value, and a saturation value for each pixel from these RGB signals. This operation unit 93
The luminance value, hue value, and saturation value of each pixel calculated by the above are supplied to the comparison unit 95, and are compared with the reference luminance value, the reference hue value, and the reference saturation value, respectively.
Supplied to The determination unit 97 determines the quality of the appearance of the subject based on the comparison result, and displays the determination result on the display unit 11.
Output to and display. FIG. 2 is a detailed configuration diagram showing the configuration of the appearance inspection apparatus shown in FIG. 1 in more detail. As shown in FIG. 2, the subject 1 is mounted on the subject mounting unit 13, and the Y-axis driving unit 15 and the Y-axis motor 17 mounted on the lower side of the subject mounting unit 13 The camera 5 can move in any direction in the Y-axis direction. The camera 5 is mounted on an X-axis drive unit 19, which is configured to be driven by an X-axis motor 21. As a result, the camera 5
Can be moved to any position in the X-axis direction, so that any part of the subject 1 in the X-axis direction can be imaged. Thus, the subject 1 is moved to an arbitrary position in the Y-axis direction by the Y-axis drive unit 15 and the Y-axis motor 17, and the camera 5 is moved to the X-axis drive unit 19 and the X-axis motor 2.
By configuring the camera 5 to move to an arbitrary position in the X-axis direction by using the camera 1, the camera 5 is configured to be able to image an arbitrary portion of the subject 1. Further, the LED illuminating means 3 for illuminating the subject 1 is supplied with power from the illumination power supply 33, and the camera 5 is supplied with power from the camera power supply 23. Note that the camera 5 and the LED illuminating means 3 constitute an imaging unit 43. The video capture unit 7, C described with reference to FIG.
The PU 9 and the display unit 11 are provided in the processing unit 25 in FIG. The processing unit 25 includes, in addition to these components, an XY-axis control unit 31 that controls an X-axis driver 27 and a Y-axis driver 29 that drive the X-axis motor 21 and the Y-axis motor 17, respectively; , A memory 37 for registering image information of the subject 1 captured by the camera 5 and the like, a keyboard 39 for inputting various information including reference information and instructions, and a mouse 41. The appearance inspection apparatus of the present embodiment configured as described above uses the R value, G value, and B value of each input pixel constituting the image information of the subject 1 captured by the camera 5 as follows. The calculation unit 93 in the CPU 9 calculates a luminance value, a hue value, and a saturation value for each input pixel by using the following formula. ## EQU1 ## Luminance value Y = 0.3R + 0.59G + 0.11B Color difference signal 1 C1 = 0.7R−0.59G−0.11B Color difference signal 2 C2 = −0.3R−0.59G + 0.89B and The saturation value S and the hue value H are calculated from the color difference signals C1 and C2 thus obtained by the following equations. C1 = Saturation value S × sin (hue value H) C2 = Saturation value S × cos (hue value H) By calculating the luminance value, hue value, and saturation value for each input pixel by the above calculation, The calculated luminance value, hue value, and saturation value of each input pixel are compared with the reference luminance value, the reference hue value, and the reference saturation value by the comparator 95, and the luminance value, the hue value, The determination unit 97 determines whether each of the value and the saturation value is within a predetermined tolerance with respect to each of the reference values. (Reference luminance value−tolerance) ≦ luminance value of input pixel ≦
(Reference luminance value + tolerance) (reference hue value-tolerance) ≤ input pixel hue value ≤ (reference hue value + tolerance) (reference saturation value-tolerance) ≤ input pixel saturation value ≤ (reference (Saturation value + tolerance) Then, according to the determination result, if all of the luminance value, hue value, and saturation value of the input pixel are within a predetermined tolerance with respect to the respective reference values, the pixel is determined as follows. It is determined that the pixel is a good pixel that matches the reference pixel, and if not, that is, if the respective values of luminance, hue, and saturation are not within a predetermined tolerance with respect to the respective reference values, there is no match. It is determined that there is no mismatch pixel. The above-described pass / fail judgment for each pixel is performed by dividing the subject 1 into a plurality of inspection frames, which are inspection areas, and further dividing each of the plurality of inspection frames into a plurality of divided grids. It is done about. This division processing will be described in more detail with reference to FIG. As shown in FIG. 3A, the subject 1 is inspected for each desired inspection frame 51 in an area 500 imaged by the camera 5. Note that the inspection frames do not necessarily have to have the same size, and the size may be changed according to the inspection position for each subject. Each inspection frame 51 is further divided into a plurality of divided grids 53 as shown in the middle of FIG. 3A, and each of the plurality of divided grids 53 is further divided into a plurality of pixels 55. I have. The above-mentioned pass / fail judgment for each pixel is performed for a plurality of pixels constituting each of the plurality of divided grids 53 thus divided. In the example of FIG. 3, each division grid 53 is composed of 4 × 4 16 pixels, and the above-described pass / fail determination is performed for each of the 16 pixels. FIG. 3B shows the result of performing such a pass / fail determination for each of the 16 pixels. In FIG. 3B, a mark “○” indicates a pixel determined to be a good match pixel as a result of the pass / fail determination. , And the mark “x” indicates the result determined to be a mismatched pixel. When the quality of each of the plurality of pixels constituting the divided grid 53 is determined in this manner, the quality of the divided grid 53 is determined from the quality determination result of each of the pixels. The pass / fail judgment of the divided grid 53
Calculate the occupancy ratio of the coincidence excellent pixels in all the plurality of pixels constituting the above, compare this occupancy ratio with a predetermined divided grid pass rate, and when the occupancy ratio of the coincidence excellent pixels is equal to or greater than the divided grid pass rate, The divided grating 53 is determined to be acceptable. If the occupation ratio of the matching good pixels in the divided grid 53 is within a range obtained by subtracting a predetermined allowable range from a predetermined divided grid pass rate, the divided grid 53 is determined to be quasi-pass. Judge as pass. For example, in the divisional grid 53 shown in FIG. 3B, the total number of pixels is 16 and the number of matching good pixels indicated by "O" is 13, so the occupation ratio of matching good pixels Is 13/16 × 100 ≒ 81%, so if the passing rate of the divided grid is, for example, 60%, the divided grid 53 is determined to be passed. If such pass / fail judgment on the divided grid 53 is performed for each of the plurality of divided grids 53 constituting the inspection frame 51 as shown in the middle of FIG. 3A, for example, FIG. As shown in c), each of the plurality of divided gratings 53 constituting the inspection frame 51 is determined to be passed, semi-passed, or failed. In FIG. 3 (c), the characters "go" surrounded by circles indicate pass, the characters "quasi" indicate quasi-pass, and "x" indicate reject. As described above, when each of the divided grids 53 constituting the inspection frame 51 is determined as pass, quasi-pass, or reject, of the divided grids 53 determined to be “quasi-passed”, The ratio set by the predetermined allowable number, that is, the allowable number ratio is advanced to pass, and the others are rejected. More specifically, in the example of the inspection frame 51 shown in FIG. 3C, the number of divided grids 53 determined to be passed is thirteen, and the number of divided grids 53 determined to be quasi-passed is determined. 5, and the number of the divided grids 53 determined to be rejected is two, but among the five divided grids 53 determined to be quasi-passed, the divided grids 53 for a predetermined acceptable number ratio pass. It is moved up. If the predetermined acceptable number ratio is, for example, 60%, out of the five divided grids 53 determined to be quasi-pass, 5
× 60/100 = 3 divided gratings 53 are carried over to pass, and the remaining two are passed as failed. As described above, the pass / fail judgment of each of the plurality of divided gratings 53 constituting the inspection frame 51 is made, and then the judgment of the entire inspection frame 51 is made. The pass / fail judgment for the entire inspection frame 51 is made by calculating the number of acceptable divided grids and the number of failed divided lattices of the plurality of divided lattices 53 constituting the inspection frame 51, and The ratio of the number of accepted lattices to the total number is calculated. Then, the passed lattice number ratio is compared with a predetermined inspection frame pass rate. If the passed lattice number ratio is larger than the predetermined inspection frame pass rate, the inspection frame 51
It is determined that they match with the reference image in, and otherwise, it is determined that they do not match. To be more specific, an example of the inspection frame 51 shown in FIG. 3C will be described.
Since the number of divided grids 53b carried up from the quasi-passed divided grid 53b to the acceptable divided grid 53a is, for example, 3 when the allowable number is 60%, the number of divided grids 53a determined to be acceptable is 3 The total number is 16 (13 + 3), which is 2 of the total number of the divided grids 53 constituting the entire inspection frame 51.
By dividing 16 by 0, the acceptable lattice number ratio of the inspection frame 51 is 16/20 × 100 = 80%. If the inspection frame pass rate of the inspection frame 51 is, for example, 70%, the passing lattice number ratio 80% of the inspection frame 51 is larger than the inspection frame pass rate, so that it is determined that they match. . The above-described pass / fail judgment for the entire inspection frame 51 is performed for the entire inspection frame 51 of the subject 1, that is, for a desired inspection frame 51 in an area 500 where the subject 1 is imaged by the camera 5. Thereby, the appearance inspection of the predetermined portion of the subject 1 can be completed. Next, the overall operation of the visual inspection apparatus of the present embodiment will be described with reference to the flowcharts shown in FIGS. First, the pass / fail judgment processing for each pixel will be described with reference to the flowchart shown in FIG.
In the process of FIG. 4, first, a reference image is input (step S11), and then the subject 1 is
The inspection is started by setting the above (step S1
3). Then, image information of the subject 1 obtained by imaging the subject 1 set on the subject mounting unit 13 with the camera 5 is input to the CPU 9 via the video capture unit 7 of the processing unit 25 (step S15). The image information of the subject 1 input to the CPU 9 is input to a calculation unit 93 via a color processing unit 91, where the R information, the G value, and the B value of each pixel are calculated based on the above-described formula. To calculate a luminance value, a hue value, and a saturation value (step S
17). The calculated luminance value, hue value, and saturation value of the pixel are compared with a reference luminance value, a reference hue value, and a reference saturation value, respectively, by the comparing unit 95, and each of the luminance value, the hue value, and the saturation value is calculated. The determination unit 97 determines whether the value is within a predetermined tolerance with respect to each reference value (step S19). According to the determination result of this pixel, if all of the luminance value, hue value, and saturation value of the input pixel are within a predetermined tolerance with respect to the respective reference values, the pixel is determined as a reference pixel. It is determined that the matching excellent pixel, that is, the dot is OK (step S21). If not, that is, at least one of the luminance, hue, and saturation values is within a predetermined tolerance with respect to each reference value. If not, it is determined that the pixel does not match, that is, a dot NG (step S23). The above-described pass / fail judgment of each pixel is repeatedly performed for all the pixels (dots) in the divided grid 53 (step S25). The process proceeds to the quality judgment of the lattice 53 (step S27). Next, with reference to the flow chart shown in FIG. In FIG. 5, first, the number of matching good pixels (O
The number of unmatched pixels (the number of K dots) and the number of mismatched pixels (the number of NG dots) are calculated (steps S35, S37, S39). And
The calculated ratio of good pixels in the divisional grid 53 (O
(The number of K dots) is compared with the predetermined pass rate of the divided grid (step S41), and if the ratio of matching good pixels is equal to or higher than the pass rate of the divided grid, the divided grid 53 is passed (OK).
Is determined (step S43). If the number of matching good pixels in the divided grid 53 is not equal to or greater than the pass rate of the divided grid, the occupation ratio of the matched good pixels in the divided grid 53 is calculated. It is checked whether the ratio is within a range obtained by subtracting a predetermined allowable range from the ratio (step S45),
If it is within this range, the divided grid 53 is determined to be quasi-pass (quasi-OK), and if it is not within this range, it is determined to be reject (NG) (step S51). Further, as described above, semi-pass (quasi-OK)
Of the divided grids 53 determined as above, the ratio with the accepted number is calculated as described above in order to pass the divided grid corresponding to the accepted number ratio to pass (step S4).
9), the divided grids 53 of the accepted number ratio pass (OK)
(Step S43). The above-described pass / fail determination for the divided grid 53 is repeatedly performed for all the divided grids 53 in the inspection frame 51 (steps S53 and S53).
55) When the pass / fail determination for all the divided grids 53 in the inspection frame 51 is completed, the process proceeds to pass / fail determination of the inspection frame 51 (step S57). Next, with reference to the flow chart shown in FIG. 6, the process of judging the quality of the inspection frame 51 will be described. FIG.
First, the number of divided lattices (OK lattices) determined to be acceptable and the number of divided lattices (NG lattices) determined to be unacceptable in the inspection frame 51 are calculated. The number ratio is calculated (step S61).
Then, the calculated acceptable lattice number ratio is compared with a predetermined inspection frame acceptance ratio, and it is checked whether the accepted lattice ratio is equal to or more than the inspection frame acceptance ratio (step S63). When the ratio of the number of accepted lattices is equal to or greater than the pass rate of the inspection frame, it is determined that the image in the inspection frame 51 matches the reference image (step S65), otherwise, it is determined that the image does not match (step S65). S67). Then, such a pass / fail judgment process of the inspection frame 51 is repeatedly performed for all the inspection frames 51 of the subject 1 (steps S59 and S7).
1) When all the inspection frames 51 in the inspection frame 51 are completed, the inspection ends. As described above, according to the present invention,
R for each of a plurality of pixels constituting each divided grid,
A luminance value, a hue value, and a saturation value are calculated from the G and B values, and the luminance value, the hue value, and the saturation value of each pixel are compared with respective reference values to determine whether each pixel is good or bad. Based on the quality of each pixel constituting each divided grid, each divided grid is determined as pass, quasi-pass, or reject, and the divided grid determined as quasi-passed is raised to a passed divided grid by a predetermined acceptance ratio, and a passed divided grid is passed. Since the quality of each inspection area is determined based on the ratio in the inspection area, the appearance inspection can be performed without contacting the subject, the labor can be greatly reduced, the efficiency can be improved, and the pixel can be improved. The erroneous determination can be greatly reduced by the determination of the three stages, that is, the divided grid and the inspection area.
Further, since the determination criterion can be changed for each test area according to the content of the subject portion in the test area, an appropriate appearance test can be performed corresponding to various test subjects.

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a block diagram showing a configuration of a visual inspection device according to an embodiment of the present invention. FIG. 2 is a detailed configuration diagram showing the configuration of the appearance inspection apparatus shown in FIG. 1 in further detail. FIG. 3 is a diagram showing a divided configuration when a subject is inspected. FIG. 4 is a flowchart showing pass / fail determination processing for each pixel in the visual inspection device shown in FIG. 1; FIG. 5 is a flowchart showing pass / fail judgment processing for each divided grid in the visual inspection device shown in FIG. 1; FIG. 6 is a flowchart showing pass / fail determination processing for each inspection frame in the visual inspection device shown in FIG. 1; [Description of Signs] 1 Subject 5 Camera 7 Video capture unit 9 CPU 91 Color processing unit 93 Operation unit 95 Comparison unit 97 Judgment unit

──────────────────────────────────────────────────続 き Continuation of front page (56) References JP-A-10-150299 (JP, A) JP-A-2-41578 (JP, A) JP-A-7-63686 (JP, A) JP-A-60-1985 142482 (JP, A) JP-A-10-4296 (JP, A) (58) Fields investigated (Int. Cl. ⁷ , DB name) H05K 13/08 H05K 13/00 H05K 13/04

Claims (1)

(57) [Claim 1] An appearance inspection apparatus which images an object by an imaging means and inspects the appearance of the object based on the imaged image information. Dividing means for dividing a predetermined examination region of the imaging region of the subject into a plurality of divided grids; and a luminance value of each pixel from the R, G, and B values of each of the plurality of pixels constituting each of the divided lattices. Calculating means for calculating the hue value and the saturation value, and comparing the calculated brightness value, hue value and saturation value of each pixel with a reference brightness value, a reference hue value and a reference saturation value, respectively. Pixel determining means for determining the quality of each of the plurality of pixels constituting each of the plurality of divided grids, each of the plurality of pixels constituting each of the plurality of divided grids based on the quality of the plurality of pixels determined by the pixel determining means Pass grid is judged as pass, quasi pass or reject Dividing grid determining means to perform, among the divided grids determined to be quasi-passed by the dividing grid determining means, carry-up means for raising the number of quasi-passing divided grids determined by a predetermined acceptance ratio to a accepted divided grid; Based on the ratio of the sum of the number of accepted divided grids determined to be passed by the lattice determination unit and the number of accepted divided lattices carried up to the accepted divided lattice by the carry-up unit to the total divided lattices in the examination region, An external appearance determining device for determining the external appearance of the subject portion in an inspection area.