JP3359416B2 - Contact probe - Google Patents

Contact probe

Info

Publication number
JP3359416B2
JP3359416B2 JP05822894A JP5822894A JP3359416B2 JP 3359416 B2 JP3359416 B2 JP 3359416B2 JP 05822894 A JP05822894 A JP 05822894A JP 5822894 A JP5822894 A JP 5822894A JP 3359416 B2 JP3359416 B2 JP 3359416B2
Authority
JP
Japan
Prior art keywords
probe
pin
cylindrical
measurement
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP05822894A
Other languages
Japanese (ja)
Other versions
JPH07244072A (en
Inventor
秀一 清水
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hioki EE Corp
Original Assignee
Hioki EE Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hioki EE Corp filed Critical Hioki EE Corp
Priority to JP05822894A priority Critical patent/JP3359416B2/en
Publication of JPH07244072A publication Critical patent/JPH07244072A/en
Application granted granted Critical
Publication of JP3359416B2 publication Critical patent/JP3359416B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】この発明はコンタクトプローブに
係り、さらに詳しくは、インサーキットテスタ等の基板
検査機に用いられる四端子測定用プローブを狭小な被測
定部位への対応を可能としつつ、実用的強度を同時に保
持させることができるコンタクトプローブに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a contact probe, and more particularly, to a four-terminal measuring probe used in a substrate inspection machine such as an in-circuit tester, which can be used for a small area to be measured. The present invention relates to a contact probe that can simultaneously maintain a target strength.

【0002】[0002]

【従来の技術】四端子測定法は、抵抗体である被測定物
に電流を流すための定電流端子と、その際における電圧
降下状態を検出するための電圧検出端子とを別個にし
て、計4本のリード線を用いて行なわれるものであり、
この測定法によればリード線の抵抗を測定値に含めずに
測定することができるので、高精度の抵抗測定器である
ディジタルマルチメータやLCRメータなどに多く採用
されている。
2. Description of the Related Art In a four-terminal measuring method, a constant current terminal for flowing a current to an object to be measured, which is a resistor, and a voltage detecting terminal for detecting a voltage drop state at that time are separately provided. It is performed using four leads,
According to this measuring method, the resistance of the lead wire can be measured without including it in the measured value, and therefore, it is widely used in digital multimeters, LCR meters, etc., which are high-precision resistance measuring instruments.

【0003】図8と図9とは、上記四端子測定法に対応
するために従来から使用されてきているコンタクトプロ
ーブの構造を示すものである。
FIGS. 8 and 9 show the structure of a contact probe which has been conventionally used to cope with the four-terminal measuring method.

【0004】このうち、図8に示すコンタクトプローブ
は、いわゆる平行型タイプと称されるものであり、その
全体は、先端部に電圧測定ピン1aを有するプランジャ
ー1bをバレル1c内にその進退を自在に付勢して保持
させてなる電圧測定用プローブ1と、先端部に電流測定
ピン2aを有するプランジャー2bをバレル2c内にそ
の進退を自在に付勢して保持させてなる電流測定用プロ
ーブ2と、これらのプローブ1,2相互に絶縁体3を介
在させて一体的に抱持するスリーブ4とで形成されてい
る。
Among them, the contact probe shown in FIG. 8 is of a so-called parallel type, and as a whole, a plunger 1b having a voltage measuring pin 1a at its tip is moved into and out of a barrel 1c. A voltage measuring probe 1 which is urged and held freely, and a current measuring probe which is urged and held by a plunger 2b having a current measuring pin 2a at a tip thereof in a barrel 2c. The probe 2 is formed of a probe 4 and a sleeve 4 integrally holding the probe 1 and 2 with an insulator 3 interposed therebetween.

【0005】また、図9に示すコンタクトプローブは、
いわゆる同軸型タイプと称されるものであり、その全体
は、先端部に電圧測定ピン5aを有するプランジャー5
bをバレル5c内にその進退を自在に付勢して保持させ
てなる電圧測定用プローブ5と、この電圧測定用プロー
ブ5を絶縁体6を介在させた軸の中心に位置させてその
周囲を囲繞するようにして配置される電流測定ピン7a
を備えてなる電流測定用プローブ7と、この電流測定用
プローブ7との間に介装配置させたスプリング材8によ
り電流測定用プローブ7を軸方向への進退を自在にして
保持するスリーブ9とで形成されている。
[0005] The contact probe shown in FIG.
It is a so-called coaxial type, and the whole is a plunger 5 having a voltage measuring pin 5a at the tip.
b in the barrel 5c by freely biasing its advance and retreat, and a voltage measuring probe 5, and the voltage measuring probe 5 is positioned at the center of the shaft with the insulator 6 interposed therebetween, and its periphery is Current measuring pin 7a arranged so as to surround it
And a sleeve 9 for holding the current measurement probe 7 in the axial direction freely by a spring member 8 interposed between the current measurement probe 7 and the current measurement probe 7. It is formed with.

【0006】[0006]

【発明が解決しようとする課題】ところで、図8と図9
とに示すコンタクトプローブによっても四端子測定法の
もとで被測定物を測定することはできる。
FIGS. 8 and 9 show an embodiment of the present invention.
The object to be measured can also be measured by the contact probe shown in (1) and (2) under the four-terminal measurement method.

【0007】しかし、図8と図9とに示すコンタクトプ
ローブは、いずれも構造的に複雑であるため、製品コス
トが高くなる不都合があった。
However, the contact probes shown in FIGS. 8 and 9 are structurally complicated, so that there is a problem that the product cost is increased.

【0008】また、図8と図9とに示すコンタクトプロ
ーブは、ともに電圧測定ピン1a又は5aと電流測定ピ
ン2a又は7aとの間のピン間距離が比較的長いものと
なっていることから、被接触部の面積が比較的広い場合
には対応することができるものの、被接触部の面積が狭
小である場合には使用することができない不具合があっ
た。
The contact probes shown in FIGS. 8 and 9 both have a relatively long pin-to-pin distance between the voltage measuring pin 1a or 5a and the current measuring pin 2a or 7a. It can cope with the case where the area of the contacted portion is relatively large, but cannot be used when the area of the contacted portion is small.

【0009】さらには、このような狭小な面積にも対応
させようとしてコンタクトプローブ自体の細径化を図っ
た場合、ピン間距離を短くすることはできるものの、ピ
ン自体が極細となって耐久性がなくなり、結果的に実用
性のないものになってしまう問題もあった。
Further, if the diameter of the contact probe itself is reduced in order to cope with such a small area, the distance between the pins can be shortened, but the pins themselves become extremely thin and the durability is increased. Has disappeared, resulting in a problem that it is not practical.

【0010】[0010]

【課題を解決するための手段】この発明は従来技術にみ
られた上記課題に鑑みなされたもので、その構成上の特
徴は、先後端部のそれぞれに突出部を張り出させて被着
させた絶縁膜を外周面に備える保持筒部に対し少なくと
も先鋭接触部を除く先端部の外周面に絶縁層を形成して
なる棒状測定ピンを前記先端部は突出させ、後端面は後
部の開口面から後退させて保持させてなる電圧測定用第
1プローブと、該電圧測定用第1プローブにおける前記
棒状測定ピンの後端面に当接される先鋭当接部を先端部
に備えるプローブピンをその外周面に絶縁層を設けたバ
レル部に進退自在に保持させてなる電圧測定用第2プロ
ーブと、筒状本体部の先端部に筒状測定ピンをその先鋭
接触部の側を突出させて挿入止着してなる電流測定用プ
ローブと、介装配置させたスプリング材により前記電流
測定用プローブをその突出方向へと常時付勢しながら保
持するホルダー部とで構成され、前記筒状測定ピンから
は、該筒状測定ピンと前記保持筒部との対面部位相互が
電気的に非導通となるようにして棒状測定ピンの先鋭接
触部を、筒状本体部の後端側からは、前記バレル部の後
端部をそれぞれ突出させることで電流測定用プローブに
対し電圧測定用第1プローブと電圧測定用第2プローブ
とを配設したことにある。
SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems in the prior art, and has a structural feature. A bar-shaped measuring pin formed by forming an insulating layer on the outer peripheral surface of the tip excluding at least the sharp contact portion with respect to the holding cylinder portion provided with the insulating film on the outer peripheral surface is protruded at the front end, and the rear end surface is the opening surface at the rear. A first probe for voltage measurement, which is retracted and held from the probe, and a probe pin having a sharp contact portion at the distal end portion of the first probe for voltage measurement, which is in contact with a rear end surface of the rod-shaped measurement pin, at an outer periphery thereof. A second probe for voltage measurement, which is held in a barrel portion provided with an insulating layer on the surface so as to be able to advance and retreat, and a cylindrical measurement pin is inserted into the distal end of the cylindrical main body portion with its sharp contact portion protruding to stop insertion. Current measurement probe A holder for holding the current measuring probe in the projecting direction while constantly holding the current measuring probe in a protruding direction, and facing the cylindrical measuring pin and the holding cylindrical portion from the cylindrical measuring pin. A current measuring probe by projecting the sharp contact portion of the rod-shaped measuring pin from the rear end side of the cylindrical main body portion so that the portions are electrically non-conductive. In that a first probe for voltage measurement and a second probe for voltage measurement are provided.

【0011】[0011]

【作用】このため、被測定部位に対する電圧測定は、電
圧測定用第1プローブにおける棒状測定ピンの後端面に
電圧測定用第2プローブのプローブピンの先鋭当接部を
当接させて突出方向へと付勢されている棒状測定ピンの
先鋭接触部を被測定部位に押し当てることで行うことが
できる。
For this reason, the voltage measurement on the measured portion is performed by bringing the sharp contact portion of the probe pin of the second voltage measurement probe into contact with the rear end face of the rod-shaped measurement pin of the first voltage measurement probe in the protruding direction. The pressing can be performed by pressing the sharp contact portion of the rod-shaped measuring pin which is urged against the measured portion.

【0012】また、この際、棒状測定ピンは、電流測定
用プローブの側へと相対的に後退させられることになる
ので、やがては電流測定用プローブにおける筒状測定ピ
ンの先鋭接触部が被測定部位に接触するに至り、被測定
部位に対する電流測定も可能となる。
At this time, the rod-shaped measuring pin is relatively retracted toward the current measuring probe, so that the sharp contact portion of the cylindrical measuring pin of the current measuring probe is eventually measured. As a result, the current can be measured for the measured part.

【0013】しかも、電流測定用プローブの側は、ホル
ダー部との間に介装配置させてあるスプリング材により
常時、突出方向へと付勢されているので、被測定部位に
対し電圧測定用としての棒状測定ピンと電流測定用とし
ての筒状測定ピンとを安定的、かつ、確実に同時接触さ
せることができる。
In addition, since the current measuring probe side is always urged in the protruding direction by a spring material interposed between the current measuring probe and the holder, the current measuring probe is used for voltage measurement with respect to the measured portion. The rod-shaped measurement pin and the cylindrical measurement pin for current measurement can be stably and reliably brought into simultaneous contact.

【0014】したがって、全体の構造を同軸タイプとす
るなかで、微小径のもとで形成されている電圧測定用第
1プローブの棒状測定ピンは、その使用時に先鋭接触部
を含む先端部側を電流測定用プローブにおける筒状測定
ピンの先鋭接触部内へと後退させることで軸方向での負
荷加重を筒状測定ピンの側に転嫁することができるの
で、その全体に実用的な強度を付与しつつも狭いピッチ
での計測を可能とすることができる。
Therefore, while the whole structure is of the coaxial type, the rod-shaped measuring pin of the first voltage measuring probe formed with a small diameter has a tip end including a sharp contact portion when used. By retracting the current measuring probe into the sharp contact portion of the cylindrical measuring pin, the load applied in the axial direction can be transferred to the side of the cylindrical measuring pin, so that practical strength is given to the whole. In addition, it is possible to measure at a narrow pitch.

【0015】[0015]

【実施例】図1は、この発明の一実施例を示す全体構成
図であり、図2〜図5は、図1についての詳細構造を明
らかにするために先端部側から後端部側へと四分割して
示す拡大図である。
FIG. 1 is an overall structural view showing an embodiment of the present invention. FIGS. 2 to 5 are views from the front end to the rear end to clarify the detailed structure of FIG. FIG.

【0016】これら図1〜図5によれば、その全体は、
被測定部位に接触させるための先鋭接触部13aを棒状
測定ピン12の先端部13に備えてなる電圧測定用第1
プローブ11と、該電圧測定用第1プローブ11におけ
る前記棒状測定ピン12の後端面14に当接して軸方向
での移動を規制する先鋭当接部23aをプローブピン2
2の先端部23に備えてなる電圧測定用第2プローブ2
1と、先端部33に筒状測定ピン35を備え、かつ、前
記電圧測定用第1プローブ11と電圧測定用第2プロー
ブ21とを直列方向に配列させて保持する電流測定用プ
ローブ31と、該電流測定用プローブ31を進退自在に
保持するホルダー部と41で構成されている。
According to FIG. 1 to FIG. 5, the whole is
A first voltage measuring first device provided with a sharp contact portion 13a at the distal end portion 13 of the rod-shaped measuring pin 12 for making contact with a measured portion.
The probe 11 and the sharp contact portion 23a that abuts on the rear end face 14 of the rod-shaped measurement pin 12 of the first voltage measurement probe 11 to regulate movement in the axial direction are connected to the probe pin 2.
Probe 2 for voltage measurement provided at the tip 23 of the second probe 2
1, a current measurement probe 31 having a cylindrical measurement pin 35 at the tip 33, and holding the first voltage measurement probe 11 and the second voltage measurement probe 21 arranged in series in a serial direction; It is composed of a holder section 41 for holding the current measuring probe 31 so as to be able to move forward and backward.

【0017】この場合、電圧測定用第1プローブ11
は、適宜の導電性の超硬合金材からなる例えば外径が
0.1〜0.2mm程度の棒状測定ピン12と、該棒状
測定ピン12を保持するステンレスパイプ材などの適宜
の金属パイプ材からなる保持筒部16とで形成されてい
る。
In this case, the first probe 11 for voltage measurement
Is a rod-shaped measuring pin 12 having an outer diameter of, for example, about 0.1 to 0.2 mm made of a suitable conductive cemented carbide material, and a suitable metal pipe material such as a stainless steel pipe holding the rod-shaped measuring pin 12. And a holding cylinder portion 16 made of

【0018】このうち、前記棒状測定ピン12は、図6
の(ロ)における囲繞部bを拡大して示す図7の(ロ)
からも明らかなように、少なくとも先鋭接触部13aを
除く先端部13の外周面に例えばポリイミドチューブを
被着したり、適宜の絶縁剤をコーティングするなどして
なる絶縁層15が形成されている。なお、該絶縁層15
は、前記先鋭接触部13aと後端面14とを除く全長に
わたりその外周面に形成するものであってもよい。
Among them, the rod-shaped measuring pin 12 is shown in FIG.
FIG. 7B is an enlarged view of the surrounding portion b in FIG.
As is clear from FIG. 5, an insulating layer 15 is formed on the outer peripheral surface of the tip portion 13 except for at least the sharp contact portion 13a by applying, for example, a polyimide tube or coating an appropriate insulating agent. The insulating layer 15
May be formed on the outer peripheral surface over the entire length excluding the sharp contact portion 13a and the rear end surface 14.

【0019】また、保持筒部16は、先端部と後端部と
のそれぞれに突出部19を張り出させて被着させた例え
ばポリイミドチューブなどの絶縁性合成樹脂材からなる
絶縁膜18を備えて形成されており、このようにして形
成されている保持筒部16に対しては、先鋭接触部13
aを含む先端部13を突出させ、後端面14を後部に位
置する開口面17からやや後退させた状態のもとで前記
棒状測定ピン12を一体的に保持させることで電圧測定
用第1プローブ11が形成されている。なお、保持筒部
16の側への絶縁膜18の被着を確実なものとするため
に、図示例のように空隙部20を介在させた少なくとも
二つ以上の部分に絶縁膜18を分割し、それぞれの分割
部18a,18bの内周面への接着剤の供給を円滑に行
えるようにしておくのが望ましい。
The holding cylinder portion 16 has an insulating film 18 made of an insulating synthetic resin material such as a polyimide tube, for example, in which a projecting portion 19 is protruded from each of a front end portion and a rear end portion and is attached. A sharp contact portion 13 is formed on the holding cylinder 16 formed in this manner.
a first probe for voltage measurement by holding the rod-shaped measurement pin 12 integrally under a state in which the front end portion 13 including a is protruded and the rear end surface 14 is slightly retracted from the opening surface 17 located at the rear portion. 11 are formed. In order to secure the application of the insulating film 18 to the side of the holding cylinder 16, the insulating film 18 is divided into at least two or more portions with the void portion 20 interposed therebetween as shown in the illustrated example. It is preferable that the adhesive can be smoothly supplied to the inner peripheral surfaces of the divided portions 18a and 18b.

【0020】電圧測定用第2プローブ21は、図6の
(イ)における囲繞部aを拡大して示す図7の(イ)か
らも明らかなように、電圧測定用第1プローブ11にお
ける前記棒状測定ピン12の後端面14に当接される先
鋭当接部23aを先端部23に備えるプローブピン22
を例えばポリイミドチューブを被着したり、適宜の絶縁
剤をコーティングするなどして形成された絶縁層25を
その外周面に備えるバレル部24に図示しないスプリン
グ材の付勢力を介して進退自在に保持させることで形成
されている。
The voltage measuring second probe 21 is formed by enlarging the surrounding part a in FIG. 6A, as shown in FIG. 7A. A probe pin 22 having a sharp contact portion 23a at the distal end portion 23 which is in contact with the rear end surface 14 of the measuring pin 12;
An insulating layer 25 formed by, for example, applying a polyimide tube or coating an appropriate insulating agent is held on a barrel portion 24 provided on an outer peripheral surface of the barrel so as to be able to advance and retreat via a biasing force of a spring material (not shown). It is formed by doing.

【0021】一方、電流測定用プローブ31は、前記電
圧測定用第1プローブ11と電圧測定用第2プローブ2
1とを直列状に配列させてその進退を自在に保持するス
テンレスパイプ材などの適宜の金属パイプ材からなる筒
状本体部32と、該筒状本体部32の先端部33に挿入
止着される筒状測定ピン35とで形成されている。な
お、筒状本体部32の先端部33側の外周面には、フッ
素樹脂をコーティングするなどの耐摩耗処理を施すこと
で好ましくは絶縁性をも備える一側摺接層34を予め形
成しておくのが望ましい。
On the other hand, the current measuring probe 31 comprises the first voltage measuring probe 11 and the second voltage measuring probe 2.
1 and a cylindrical main body 32 made of an appropriate metal pipe material such as a stainless steel pipe material for freely holding the advance and retreat of the cylindrical main body 32. The cylindrical main body 32 is inserted and fixed to the distal end 33 of the cylindrical main body 32. And a cylindrical measuring pin 35. The outer peripheral surface of the cylindrical main body 32 on the side of the distal end portion 33 is subjected to an abrasion treatment such as coating with a fluororesin so that a one-side sliding contact layer 34 preferably having an insulating property is formed in advance. It is desirable to keep.

【0022】この場合、筒状測定ピン35は、例えば内
径が0.3mm程度の適宜の導電性の超硬合金パイプ材
からなり、その先端部36側にテーパーを付すことで形
成された先鋭接触部36aを有し、該先鋭接触部36a
を含む先端部36を筒状本体部32の先端部33から突
出させた状態のもとで挿入止着されている。なお、筒状
測定ピン35の先鋭接触部36aは、例えばテーパーの
基端側の外径を0.4mm程度とし、テーパーの先端に
位置する接触縁の外径が内径と略一致するように刃物状
に削成して形成するのが望ましい。
In this case, the cylindrical measuring pin 35 is made of a suitable conductive cemented carbide pipe material having an inner diameter of, for example, about 0.3 mm, and has a sharp contact formed by tapering the tip portion 36 thereof. Portion 36a, the sharp contact portion 36a
Are inserted and fastened in a state in which the distal end portion 36 including the above is projected from the distal end portion 33 of the tubular main body portion 32. The sharp contact portion 36a of the cylindrical measuring pin 35 has, for example, an outer diameter on the base end side of the taper of about 0.4 mm, and a blade such that the outer diameter of the contact edge located at the distal end of the taper substantially matches the inner diameter. It is desirable to form by cutting.

【0023】また、前記ホルダー部41は、電流測定用
プローブ31における筒状本体部32を軸方向への進退
を自在にして保持する合成樹脂等の絶縁材からなる筒状
保持部42と、該筒状保持部42を一体的に抱持する合
成樹脂等の絶縁材からなるホルダー本体部49とで形成
されている。
The holder section 41 includes a cylindrical holding section 42 made of an insulating material such as a synthetic resin for holding the cylindrical main body section 32 of the current measuring probe 31 so as to be able to freely advance and retreat in the axial direction. It is formed of a holder body 49 made of an insulating material such as a synthetic resin that integrally holds the cylindrical holding portion 42.

【0024】このうち、筒状保持部42は、その先端部
43の端面側にその軸方向に沿わせ、かつ、電流測定用
プローブ31における前記筒状本体部32の進退距離に
略相応する長さのもとで設けられている拡径部44の内
周面に例えばフッ素樹脂などの耐摩耗性に富む素材によ
りリング状に形成された他側摺接層45を配設しておく
のが望ましい。
The cylindrical holding portion 42 has a length extending along the axial direction along the end face side of the distal end portion 43 and substantially corresponding to the advancing and retreating distance of the cylindrical main body portion 32 in the current measuring probe 31. The other side sliding contact layer 45 formed in a ring shape from a material having high wear resistance, such as a fluororesin, is provided on the inner peripheral surface of the enlarged diameter portion 44 provided under the support. desirable.

【0025】また、前記筒状保持部42の後端部46
は、他の部位よりその外径を小さくして形成されてお
り、該後端部46に対し前記筒状本体部32の後端部3
7の側に周設された凹陥部38にその後端部40bの側
を係止させて配設されている例えば引張コイルスプリン
グなどで形成されているスプリング材40の先端部40
aが止着されている。その際の止着構造は、図示例のよ
うに前記後端部46の周面に螺旋状に溝部47を刻設
し、この溝部にスプリング材40の先端部40aを係合
止着する構造のほか、スプリング材の40先端部40a
を筒状保持部42の後端部46に周設した凹陥部48を
介して単に係止させたり、筒状保持部42の後端部46
自体にスプリング材40の突端部を埋没掛止させて固定
するなど、適宜の止着構造を採用することができる。
The rear end 46 of the cylindrical holding section 42
Is formed so that its outer diameter is smaller than that of other portions, and the rear end portion 3 of the tubular main body portion 32 is formed with respect to the rear end portion 46.
The distal end portion 40 of a spring material 40 formed by, for example, a tension coil spring or the like, which is disposed so as to lock the rear end portion 40b side in a concave portion 38 provided around the side 7.
a is fixed. The fastening structure at that time has a structure in which a groove 47 is formed spirally on the peripheral surface of the rear end portion 46 as shown in the illustrated example, and the front end portion 40a of the spring material 40 is engaged and fastened to this groove portion. In addition, 40 tip 40a of spring material
May be simply locked via a concave portion 48 provided around the rear end portion 46 of the cylindrical holding portion 42, or the rear end portion 46 of the cylindrical holding portion 42.
An appropriate fastening structure, such as fixing the protruding end portion of the spring material 40 to itself by burying it, can be adopted.

【0026】さらに、前記ホルダー本体部49は、筒状
保持部42の適宜の部位に嵌着するなど、筒状保持部4
2を一体的に抱持するようにして固着されている。この
場合、少なくともホルダー本体部49の後端部50は、
筒状保持部42の後端部46から軸方向に突出させて配
設することで、該後端部46の側に止着されているスプ
リング材40の先端部40aの側の隠蔽を可能にしてお
くのが好ましい。
Further, the holder main body 49 is fitted to an appropriate portion of the cylindrical holding portion 42, for example, by fitting the cylindrical holding portion 4
2 are fixedly held together. In this case, at least the rear end 50 of the holder body 49 is
By disposing the cylindrical holding portion 42 so as to protrude in the axial direction from the rear end portion 46, it is possible to conceal the front end portion 40a of the spring member 40 fixed to the rear end portion 46 side. It is preferable to keep it.

【0027】したがって、前記電流測定用プローブ31
の側は、図6の(イ)からも明らかなようにスプリング
材40を上記の配置関係のもとで配設することによりホ
ルダー部41に対し軸方向に沿って突出するように常時
付勢されながら保持されることになる。
Therefore, the current measuring probe 31
As shown in FIG. 6A, the spring member 40 is always urged to protrude along the axial direction with respect to the holder portion 41 by disposing the spring member 40 in the above arrangement relationship. It will be held while being performed.

【0028】しかも、電流測定用プローブ31に対して
は、前記筒状測定ピン35から該筒状測定ピン35と前
記保持筒部16との対面部位相互を絶縁層15を介する
ことで電気的に非導通の状態にして棒状測定ピン12の
先鋭接触部13aを筒状測定ピン35から突出させた電
圧測定用第1プローブ11と、筒状本体部32の後端側
から前記バレル部24の後端部26を突出させた電圧測
定用第2プローブ21とを直列状に直結させた状態のも
とで保持させることで全体が組み合わされることにな
る。
Further, for the current measuring probe 31, the facing portions of the cylindrical measuring pin 35 and the holding cylindrical portion 16 are electrically connected to each other through the insulating layer 15 from the cylindrical measuring pin 35. The first probe 11 for voltage measurement, in which the sharp contact portion 13a of the rod-shaped measurement pin 12 is made to protrude from the cylindrical measurement pin 35 in a non-conductive state, and after the barrel portion 24 from the rear end side of the cylindrical main body 32 The whole is assembled by holding the voltage measuring second probe 21 having the end portion 26 projecting in a state of being directly connected in series.

【0029】この発明は上述したようにして構成されて
いるので、電圧測定用第1プローブ11における棒状測
定ピン12の後端面14に電圧測定用第2プローブ21
のプローブピン22の先鋭当接部23aを当接して押圧
付勢することで、突出方向に押し出される棒状測定ピン
12の先鋭接触部13aが被測定部位に押し当てること
ができる。
Since the present invention is constructed as described above, the second probe 21 for voltage measurement is attached to the rear end face 14 of the rod-shaped measurement pin 12 of the first probe 11 for voltage measurement.
By pressing the sharp contact portion 23a of the probe pin 22 to press and urge it, the sharp contact portion 13a of the rod-shaped measurement pin 12 extruded in the protruding direction can be pressed against the portion to be measured.

【0030】このような状態のもとでホルダー部41を
被測定部位の側に押し付けると、電流測定用プローブ3
1も同時に同方向へと移動するので、棒状測定ピン12
は電流測定用プローブ31の側へと相対的に後退させら
れることになる。なお、筒状本体部32の側に一側摺接
部34を、筒状保持部42の側に他側摺接部45をそれ
ぞれ配設してある場合には、耐摩耗性を強化することで
耐久性を向上させることができる。
In this state, when the holder 41 is pressed against the part to be measured, the current measuring probe 3 is pressed.
1 also moves in the same direction at the same time.
Is relatively retracted toward the current measuring probe 31. In the case where the one-side sliding contact portion 34 is provided on the side of the cylindrical main body portion 32 and the other-side sliding contact portion 45 is provided on the side of the cylindrical holding portion 42, the wear resistance must be enhanced. With this, the durability can be improved.

【0031】このような状態を継続することで、やがて
は電流測定用プローブ31における筒状測定ピン35の
先鋭接触部36aも被測定部位に接触するに至る。
By continuing such a state, the sharp contact portion 36a of the cylindrical measuring pin 35 of the current measuring probe 31 eventually comes into contact with the measured portion.

【0032】しかも、電流測定用プローブ31の側は、
ホルダー部41との間に介装配置されているスプリング
材40により常時、突出方向へと付勢されているので、
被測定部位に対し、電圧測定用として機能する棒状測定
ピン12のほか、電流測定用として機能する筒状測定ピ
ン35も同時に安定的、かつ、確実に接触されるに至
る。なお、棒状測定ピン12と筒状測定ピン35とは、
介在させた絶縁層15により相互に電気的に非導通の関
係におくことができる。
Moreover, the side of the current measuring probe 31 is
Since it is always urged in the protruding direction by the spring material 40 interposed between the holder portion 41 and the
In addition to the rod-shaped measurement pin 12 functioning for voltage measurement, the cylindrical measurement pin 35 functioning for current measurement comes into stable and reliable contact with the measured portion at the same time. In addition, the rod-shaped measurement pin 12 and the cylindrical measurement pin 35
The insulating layers 15 interposed therebetween can establish a mutually electrically non-conductive relationship.

【0033】したがって、全体の構造を同軸タイプとす
るなかで、微小径のもとで形成されている電圧測定用第
1プローブ11の棒状測定ピン13は、その使用時に先
鋭接触部13aを含む先端部13側を電流測定用プロー
ブ31における筒状測定ピン35の先鋭接触部36a内
へと相対的に後退させることで、被測定部位への接触時
に棒状測定ピン13が受ける軸方向での負荷加重を筒状
測定ピン35の側に転嫁することができるので、その全
体に実用的な強度を付与しつつも狭いピッチでの計測を
可能とすることができる。
Therefore, while the whole structure is of the coaxial type, the rod-shaped measuring pin 13 of the first voltage measuring probe 11 formed under a very small diameter has a tip including a sharp contact portion 13a when used. The portion 13 side is relatively retracted into the sharp contact portion 36a of the cylindrical measuring pin 35 of the current measuring probe 31, so that the rod-shaped measuring pin 13 receives a load in the axial direction when it comes into contact with the measured portion. Can be transferred to the side of the cylindrical measuring pin 35, so that it is possible to perform measurement at a narrow pitch while giving practical strength to the whole.

【0034】また、電圧測定用第1プローブ11から電
圧測定用第2プローブ21へと至る電圧測定経路と、電
流測定用プローブ31により形成される電流測定経路と
は、相互間に絶縁層15のほか、突出部19を含む絶縁
膜17と絶縁層25とを介在させてあるので、それぞれ
を他の干渉を受けない独立した2系統の電気的経路とし
て確保することができる。
The voltage measurement path from the first voltage measurement probe 11 to the second voltage measurement probe 21 and the current measurement path formed by the current measurement probe 31 are separated from each other by the insulating layer 15. In addition, since the insulating film 17 including the protruding portion 19 and the insulating layer 25 are interposed, each of them can be secured as two independent electrical paths that are not affected by other interference.

【0035】[0035]

【発明の効果】以上述べたようにこの発明によれば、電
圧測定用第1プローブにおける棒状測定ピンの後端面に
電圧測定用第2プローブのプローブピンの先鋭当接部を
当接させて突出方向へと付勢されている棒状測定ピンの
先鋭接触部を被測定部位に押し当てながら電流測定用プ
ローブの側へと相対的に後退させることで、電流測定用
プローブにおける筒状測定ピンの先鋭接触部をも被測定
部位に接触させることができるので、被測定部位に対し
電圧測定用としての棒状測定ピンと電流測定用としての
筒状測定ピンとを安定的、かつ、確実に同時接触させる
ことができる。
As described above, according to the present invention, the sharp contact portion of the probe pin of the second probe for voltage measurement comes into contact with the rear end face of the rod-shaped measurement pin of the first probe for voltage measurement and protrudes. The tip of the cylindrical measuring pin of the current measuring probe is relatively retracted toward the current measuring probe while pressing the sharp contact portion of the rod-shaped measuring pin urged in the direction toward the measured portion. Since the contact part can also be brought into contact with the measured part, the rod-shaped measuring pin for voltage measurement and the cylindrical measuring pin for current measurement can be stably and surely brought into simultaneous contact with the measured part. it can.

【0036】このため、全体の構造を同軸タイプとする
なかで、微小径のもとで形成されている電圧測定用第1
プローブの棒状測定ピンは、その使用時に先鋭接触部を
含む先端部側を電流測定用プローブにおける筒状測定ピ
ンの先鋭接触部内に相対的に後退させることで軸方向で
の負荷加重を筒状測定ピンの側に転嫁することができ、
したがって、構造的に実用的な強度を付与しつつも狭い
ピッチでの計測を可能とすることができる。
For this reason, while the whole structure is of the coaxial type, the first voltage measuring first formed under a very small diameter.
The rod-shaped measurement pin of the probe measures the load load in the axial direction by retracting the tip end including the sharp contact portion relatively into the sharp contact portion of the cylindrical measurement pin in the current measurement probe when used. Can be passed on to the side of the pin,
Therefore, it is possible to perform measurement at a narrow pitch while providing practical strength in terms of structure.

【図面の簡単な説明】[Brief description of the drawings]

【図1】この発明の一実施例を示す全体構成図である。FIG. 1 is an overall configuration diagram showing one embodiment of the present invention.

【図2】図1の詳細構造を明らかにするために先端部側
から後端部側へと四分割して示す拡大図のうち、先端部
側の部位についての拡大図である。
FIG. 2 is an enlarged view of a part on a front end side of an enlarged view divided into four parts from a front end side to a rear end side to clarify a detailed structure of FIG. 1;

【図3】同じく先端部側の部位に隣り合う下側中央部側
の部位についての拡大図である。
FIG. 3 is an enlarged view of a lower central portion adjacent to a tip portion.

【図4】同じく下側中央部側の部位に隣り合う上側中央
部側の部位についての拡大図である。
FIG. 4 is an enlarged view of an upper central portion adjacent to a lower central portion;

【図5】同じく上側中央部側の部位に隣り合う後端部側
の部位についての拡大図である。
FIG. 5 is an enlarged view of a rear end portion adjacent to the upper central portion.

【図6】図1における電流測定用プローブとホルダー部
との組み合わせ状態を示す構成図である。
FIG. 6 is a configuration diagram showing a combined state of a current measuring probe and a holder unit in FIG. 1;

【図7】図1における電圧測定用第1プローブと電圧測
定用第2プローブとの配置関係を示す構成図である。
7 is a configuration diagram showing an arrangement relationship between a first probe for voltage measurement and a second probe for voltage measurement in FIG. 1;

【図8】図7における要部を拡大して示す部分説明図で
あり、そのうち、(イ)は直列方向に配列された際の相
互関係を示し、(ロ)は電圧測定用第1プローブの側の
棒状測定ピンの先端部構造を示すものである。
8 is an enlarged partial explanatory view showing a main part in FIG. 7, in which (a) shows a mutual relationship when arranged in a serial direction, and (b) shows a first probe for voltage measurement. 3 shows a tip structure of a rod-like measuring pin on the side.

【図9】いわゆる平行型タイプの四端子測定用プローブ
の従来構造を示す説明図である。
FIG. 9 is an explanatory view showing a conventional structure of a so-called parallel type four-terminal measuring probe.

【図10】いわゆる同軸型タイプの四端子測定用プロー
ブの従来構造を示す説明図である。
FIG. 10 is an explanatory view showing a conventional structure of a so-called coaxial type four-terminal measuring probe.

【符号の説明】[Explanation of symbols]

11 電圧測定用第1プローブ 12 棒状測定ピン 13 先端部 13a 先鋭接触部 14 後端面 15 絶縁層 16 保持筒部 17 開口面 18 絶縁膜 18a,18b 分割部 19 突出部 20 空隙部 21 電圧測定用第2プローブ 22 プローブピン 23 先端部 23a 先鋭当接部 24 バレル部 25 絶縁層 31 電流測定用プローブ 32 筒状本体部 33 先端部 34 一側摺接層 35 筒状測定ピン 36 先端部 36a 先鋭接触部 37 後端部 38 凹陥部 40 スプリング材 40a 先端部 40b 後端部 41 ホルダー部 42 筒状保持部 43 先端部 44 拡径部 45 他側摺接部 46 後端部 47 溝部 48 凹陥部 49 ホルダー本体部 50 後端部 Reference Signs List 11 first probe for voltage measurement 12 rod-shaped measurement pin 13 tip 13a sharp contact portion 14 rear end face 15 insulating layer 16 holding cylinder 17 opening surface 18 insulating film 18a, 18b division 19 protrusion 20 gap 21 voltage measurement 21 2 Probe 22 Probe Pin 23 Tip 23a Sharp Contact 24 Barrel 25 Insulating Layer 31 Current Measurement Probe 32 Cylindrical Main Body 33 Tip 34 One Side Sliding Layer 35 Cylindrical Measurement Pin 36 Tip 36a Sharp Contact 37 rear end portion 38 concave portion 40 spring material 40a front end portion 40b rear end portion 41 holder portion 42 cylindrical holding portion 43 front end portion 44 enlarged diameter portion 45 other side sliding contact portion 46 rear end portion 47 groove portion 48 concave portion 49 holder body Part 50 rear end

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 先後端部のそれぞれに突出部を張り出さ
せて被着させた絶縁膜を外周面に備える保持筒部に対し
少なくとも先鋭接触部を除く先端部の外周面に絶縁層を
形成してなる棒状測定ピンを前記先端部は突出させ、後
端面は後部の開口面から後退させて保持させてなる電圧
測定用第1プローブと、該電圧測定用第1プローブにお
ける前記棒状測定ピンの後端面に当接される先鋭当接部
を先端部に備えるプローブピンをその外周面に絶縁層を
設けたバレル部に進退自在に保持させてなる電圧測定用
第2プローブと、筒状本体部の先端部に筒状測定ピンを
その先鋭接触部の側を突出させて挿入止着してなる電流
測定用プローブと、介装配置させたスプリング材により
前記電流測定用プローブをその突出方向へと常時付勢し
ながら保持するホルダー部とで構成され、前記筒状測定
ピンからは、該筒状測定ピンと前記保持筒部との対面部
位相互が電気的に非導通となるようにして棒状測定ピン
の先鋭接触部を、筒状本体部の後端側からは、前記バレ
ル部の後端部をそれぞれ突出させることで電流測定用プ
ローブに対し電圧測定用第1プローブと電圧測定用第2
プローブとを配設したことを特徴とするコンタクトプロ
ーブ。
1. An insulating layer is formed on an outer peripheral surface of a front end portion excluding at least a sharp contact portion with respect to a holding cylinder portion provided with an insulating film formed on an outer peripheral surface of the front and rear end portions, each of which has a protruding projecting portion. The first probe for voltage measurement is formed by projecting the rod-shaped measurement pin formed at the front end portion and holding the rear end surface by retreating from the opening surface of the rear portion, and the rod-shaped measurement pin in the first probe for voltage measurement. A second probe for voltage measurement in which a probe pin having a sharp contact portion abutting on a rear end surface at a front end portion is held at a barrel portion provided with an insulating layer on its outer peripheral surface so as to be able to advance and retreat, and a cylindrical main body portion A current measuring probe in which a cylindrical measuring pin is inserted and secured by projecting the tip of the cylindrical contact pin to the tip of the current measuring probe, and the current measuring probe is moved in the projecting direction by an interposed spring material. Hold that holds while constantly energizing From the cylindrical measuring pin, the sharp contact portion of the rod-shaped measuring pin is formed so that the facing portions of the cylindrical measuring pin and the holding cylindrical portion are electrically non-conductive. A first probe for voltage measurement and a second probe for voltage measurement are applied to the current measurement probe by projecting the rear end of the barrel from the rear end of the main body.
A contact probe comprising a probe and a probe.
JP05822894A 1994-03-03 1994-03-03 Contact probe Expired - Fee Related JP3359416B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP05822894A JP3359416B2 (en) 1994-03-03 1994-03-03 Contact probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP05822894A JP3359416B2 (en) 1994-03-03 1994-03-03 Contact probe

Publications (2)

Publication Number Publication Date
JPH07244072A JPH07244072A (en) 1995-09-19
JP3359416B2 true JP3359416B2 (en) 2002-12-24

Family

ID=13078231

Family Applications (1)

Application Number Title Priority Date Filing Date
JP05822894A Expired - Fee Related JP3359416B2 (en) 1994-03-03 1994-03-03 Contact probe

Country Status (1)

Country Link
JP (1) JP3359416B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4574222B2 (en) * 2004-05-06 2010-11-04 日本電産リード株式会社 Substrate inspection contact, substrate inspection jig and substrate inspection apparatus using the same
JP2012083234A (en) * 2010-10-13 2012-04-26 Hioki Ee Corp Probe and measuring apparatus

Also Published As

Publication number Publication date
JPH07244072A (en) 1995-09-19

Similar Documents

Publication Publication Date Title
TWI422829B (en) Inspection fixture, electrode structure and method for manufacturing electrode structure
US10649004B2 (en) Contact terminal, inspection jig, and inspection apparatus
JP5378273B2 (en) Contact probe and socket, method for manufacturing tubular plunger, and method for manufacturing contact probe
US6652326B2 (en) Contact apparatus particularly useful with test equipment
US7298153B2 (en) Eccentric offset Kelvin probe
TWI510787B (en) Connecting terminals and connecting fixtures
US10656179B2 (en) Contact terminal, inspection jig, and inspection device
US20010031942A1 (en) Ablation catheter for the generation of linear lesions in the myocardium
JP6041565B2 (en) Inspection jig
KR20190001939A (en) Contact probe and inspection jig
JP3359416B2 (en) Contact probe
JPH0510971A (en) Conductive contact
JP2020076707A (en) Flexible sensor and measurement apparatus
US5744977A (en) High-force spring probe with improved axial alignment
JP3943372B2 (en) Multi-terminal structure for impedance measurement
JPH08160074A (en) Four-terminal measuring probe
JPH09138250A (en) Probe for four-terminal measurement
JPH10319041A (en) Inspection probe
JPH0645258Y2 (en) Coaxial probe for measurement
JP5899650B2 (en) Contact and inspection jig
JPH0723284U (en) Fine pitch probe unit
JP7337716B2 (en) sensor
JPH0411176Y2 (en)
JPH02124469A (en) Probe card
JPS6358757U (en)

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091011

Year of fee payment: 7

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20111011

Year of fee payment: 9

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20111011

Year of fee payment: 9

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20131011

Year of fee payment: 11

LAPS Cancellation because of no payment of annual fees