JP3306922B2 - X-ray exposure mask and method of manufacturing the same - Google Patents

X-ray exposure mask and method of manufacturing the same

Info

Publication number
JP3306922B2
JP3306922B2 JP26845092A JP26845092A JP3306922B2 JP 3306922 B2 JP3306922 B2 JP 3306922B2 JP 26845092 A JP26845092 A JP 26845092A JP 26845092 A JP26845092 A JP 26845092A JP 3306922 B2 JP3306922 B2 JP 3306922B2
Authority
JP
Japan
Prior art keywords
ray
adhesive
ray exposure
reinforcing frame
mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP26845092A
Other languages
Japanese (ja)
Other versions
JPH06120124A (en
Inventor
公助 植山
正 松尾
欽司 大久保
信彦 福原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toppan Inc
Original Assignee
Toppan Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toppan Inc filed Critical Toppan Inc
Priority to JP26845092A priority Critical patent/JP3306922B2/en
Publication of JPH06120124A publication Critical patent/JPH06120124A/en
Application granted granted Critical
Publication of JP3306922B2 publication Critical patent/JP3306922B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、X線露光用マスク(以
下「X線マスク」と称す。)およびその製造方法に関
し、さらに詳しくは、平面精度の高いX線マスクとその
製造方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a mask for X-ray exposure (hereinafter referred to as "X-ray mask") and a method of manufacturing the same, and more particularly, to an X-ray mask having high planar accuracy and a method of manufacturing the same. It is.

【0002】[0002]

【従来の技術】従来のX線マスクの代表的な製造方法を
(図6)〜(図8)に従って説明すると、まず(図6)
に示すように、シリコンウエハ基材1上にX線透過支持
膜2およびX線吸収体パターン3を形成し、かつシリコ
ンウエハ基材1の裏面にバックエッチング用マスク4を
形成した後、シリコンウエハ基材1のバックエッチング
を行ない(図7)、最後に接着剤11を介して補強フレ
ーム5を接着する(図8)。
2. Description of the Related Art A typical method of manufacturing a conventional X-ray mask will be described with reference to FIGS.
As shown in FIG. 1, an X-ray transmission support film 2 and an X-ray absorber pattern 3 are formed on a silicon wafer substrate 1 and a back etching mask 4 is formed on the back surface of the silicon wafer substrate 1. The base material 1 is back-etched (FIG. 7), and finally the reinforcing frame 5 is bonded via the adhesive 11 (FIG. 8).

【0003】X線マスクは、(図8)の補強フレーム5
をX線露光装置に取りつけて使用され、X線吸収体パタ
ーン3と転写されるウエハは数10μmから数μmまで
近接して設置される。このため補強フレーム5の面とX
線透過支持膜2の面とは平行で有ることが転写の工程上
から必要である。従ってX線吸収体パターン3を保持し
たX線透過支持膜2はそれ自身の平面度が高いことが要
求される。
[0003] The X-ray mask is a reinforcing frame 5 shown in FIG.
Is used by attaching to the X-ray exposure apparatus, and the wafer to be transferred with the X-ray absorber pattern 3 is set close to several tens μm to several μm. Therefore, the surface of the reinforcing frame 5 and X
It is necessary for the transfer process to be parallel to the surface of the line transmitting support film 2. Therefore, the X-ray transmission support film 2 holding the X-ray absorber pattern 3 is required to have high flatness.

【0004】しかしながら、(図8)に示す従来のX線
マスクにおいてはX線マスク基板は接着剤11を介して
補強フレーム5に接着されており、接着剤の厚さの違い
に因る補強フレーム5とX線マスク基板との平行度のず
れは除き難かった。また接着剤11の厚さむらによって
シリコンウエハ基材1も歪むためにX線吸収体パターン
3のあるX線透過支持膜2も歪んで平面度が貼合せ前よ
りも悪くなることがあった。
[0004] However, in the conventional X-ray mask shown in FIG. 8, the X-ray mask substrate is bonded to the reinforcing frame 5 via the adhesive 11, and the reinforcing frame due to the difference in the thickness of the adhesive. It was difficult to remove the deviation of the parallelism between the sample No. 5 and the X-ray mask substrate. In addition, since the silicon wafer substrate 1 is distorted due to the uneven thickness of the adhesive 11, the X-ray transmission support film 2 having the X-ray absorber pattern 3 is also distorted, and the flatness may be worse than before bonding.

【0005】[0005]

【発明が解決しようとする課題】本発明は前記従来の問
題点に鑑みなされたものであり、その目的とするところ
は、補強フレームに対するX線マスク基板の平行度が高
く、また接着に伴う歪から生じる反りを抑制し平面度も
高い、という良品質のX線マスクとその製造方法を提供
し、X線マスクが複製用原版として実際に使用される際
に、良好な性能を発揮できるようにすることにある。
SUMMARY OF THE INVENTION The present invention has been made in consideration of the above-mentioned conventional problems, and has as its object to increase the degree of parallelism of an X-ray mask substrate with respect to a reinforcing frame and to prevent distortion due to adhesion. To provide a high-quality X-ray mask that suppresses the warpage caused by the X-ray and has a high flatness, and a method of manufacturing the same, so that the X-ray mask can exhibit good performance when it is actually used as a master for duplication. Is to do.

【0006】[0006]

【課題を解決するための手段】前記課題を解決するため
に本発明が提供する手段とは、すなわち、X線露光用マ
スク基板と貼り合せ凹部が設けられた補強フレームとが
貼合されてなるX線露光用マスクにおいて、X線露光
用マスク基板に、接着剤注入用貫通孔を備え、該貫通孔
と貼り合せ凹部とが接着面で互いに連結しており、該貫
通孔を通じて接着剤が注入されていることを特徴とする
X線露光用マスクである。
The means provided by the present invention for solving the above-mentioned problems is that an X-ray exposure mask substrate and a reinforcing frame provided with a bonding concave portion are bonded to each other. in X-ray exposure mask, to the X-ray exposure mask substrate, with the adhesive injection holes, and the combined recesses and paste through hole are connected to each other by the adhesive surface, the adhesive through the through hole An X-ray exposure mask characterized by being implanted.

【0007】[0007]

【0008】さらに好ましくは、前記貫通孔の断面積が
接着面で広くなっていることを特徴とする前記のX線マ
スクである。
[0008] More preferably, the X-ray mask is characterized in that the cross-sectional area of the through-hole is wider at the bonding surface.

【0009】あるいは、X線露光用マスク基板を貼り合
せ凹部が設けられた補強フレームに貼合せてなるX線露
光用マスクの製造方法において、X線露光用マスク基
板に予め接着剤注入用貫通孔を設け、該補強フレームと
X線露光用マスク基板を接触させた後、該貫通孔から、
接着剤を注入し、該貫通孔が接着面でお互いに連結する
様にX線露光用マスク基板と補強フレームを貼り合わせ
ることを特徴とするX線露光用マスクの製造方法であ
る。
Alternatively, a mask substrate for X-ray exposure is bonded
The method of manufacturing a X-ray exposure mask comprising laminated reinforcing frame provided with recesses so, the pre-adhesive injection holes to the X-ray exposure mask substrate provided, the reinforcing frame and the X-ray exposure mask After contacting the substrate, from the through hole,
Inject adhesive and connect the through holes to each other at the adhesive surface
A method of manufacturing a mask for X-ray exposure, comprising bonding a mask substrate for X-ray exposure and a reinforcing frame as described above.

【0010】(図1)から(図5)X線マスクに関す
る説明図である。(図1)のX線マスクの製造では、初
めにX線吸収体パターン3を形成しバックエッチングし
たX線マスク基板を補強フレーム5に接触させる。X線
マスク基板貼合せ位置8は(図2)の平面図に示す部分
である。補強フレームには予め接着剤注入孔6と貼合せ
凹部7を形成しておく。続いて、接着剤注入孔6を通し
て貼合せ凹部7に接着剤を注入し、固形化させる。補助
フレーム5とX線マスク基板はバックエッチング用マス
ク4の部分で接触しているため、この両者の平面度が高
い限り接着剤の厚みによって基板が傾いたり、歪みが発
生して平面度が悪くなったりすることはない。
FIGS. 1 to 5 are explanatory diagrams relating to an X-ray mask. In the manufacture of the X-ray mask shown in FIG. 1, first, the X-ray absorber substrate 3 is formed and the back-etched X-ray mask substrate is brought into contact with the reinforcing frame 5. The X-ray mask substrate bonding position 8 is the portion shown in the plan view of FIG. An adhesive injection hole 6 and a bonding recess 7 are formed in the reinforcing frame in advance. Subsequently, an adhesive is injected into the bonding concave portion 7 through the adhesive injection hole 6 to be solidified. Since the auxiliary frame 5 and the X-ray mask substrate are in contact with each other at the portion of the mask 4 for back etching, as long as the flatness of both is high, the substrate is tilted or distorted due to the thickness of the adhesive, resulting in poor flatness. It does not become.

【0011】 接着剤注入孔6と貼合せ凹部7とは(図
2)においては4か所を示しているが、接着部分の数は
特に限定するものではないが、力のつりあいを考慮する
と、接着部分が2か所以上であればX線マスク基板と補
強フレーム5とを保持することができる。また貼合せ凹
部7は接着剤注入孔6よりも開口を大きくして、接着剤
の接触面積が大きく成るようにすることが望ましい。さ
らに、貼合せ凹部7は接着面においてお互いに溝によっ
て連結されている構造であってもよい。
Although the adhesive injection hole 6 and the bonding concave portion 7 are shown at four positions in FIG. 2 (FIG. 2), the number of bonding portions is not particularly limited. If there are two or more bonded portions, the X-ray mask substrate and the reinforcing frame 5 can be held. Further, it is desirable that the bonding recess 7 has a larger opening than the adhesive injection hole 6 so that the contact area of the adhesive becomes large. Further, the bonding concave portions 7 may have a structure in which the bonding surfaces are connected to each other by grooves.

【0012】 補強フレーム5の形状は角、丸などいずれ
でもよく、要はX線露光装置に適応出来れば差支えが無
く特に限定はしない。また材質については、石英、パイ
レックス等のガラス、あるいは金属板、セラミックス
等、いずれを用いてもよい。要は、X線露光装置に装填
して使用するための寸法形状を得られ、かつX線マスク
用基板との貼り合わせも可能であれば差支えない。尚、
好ましくは熱膨張係数がX線マスク用基板のものに近い
材質である。
[0012] The shape of the reinforcing frame 5 is square, it may be any such circle, permissible without not particularly limited as long short accommodate X-ray exposure apparatus. As for the material, any of quartz, glass such as Pyrex, metal plate, ceramics and the like may be used. The point is that there is no problem as long as a dimensional shape to be used by mounting it on an X-ray exposure apparatus can be obtained and it is also possible to bond the substrate to an X-ray mask substrate. still,
Preferably, the material has a thermal expansion coefficient close to that of the X-ray mask substrate.

【0013】 (図3)は別のX線マスクを示す。本発明
の範囲ではないが、X線マスク基板と補強フレーム5の
接触は(図1)と同様に行うが(図4)の補強フレーム
5の平面図が示す様に、接着剤注入溝9は補強フレーム
5の貼合せ面にX線マスク基板の横方向から溝状に形成
し、X線マスク基板と補強フレームを接触させた後に、
接着剤注入溝9から接着剤を注入することもできる。こ
の時、X線マスク貼合せ位置8は(図4)に示す通りで
ある。注入後は接着剤を固化させて完全に接着を完成さ
せる。接着剤注入用の溝の形状は円形、楕円形、長方
形、等々多様に考えられるが、特に限定するものではな
く、接着剤注入溝9は接着面においてお互いに連結され
ている形状で有ってもよい
FIG . 3 shows another X-ray mask. The present invention
The contact between the X-ray mask substrate and the reinforcing frame 5 is performed in the same manner as in FIG. 1 (FIG. 1), but as shown in the plan view of the reinforcing frame 5 in FIG. Form a groove on the bonding surface of 5 from the lateral direction of the X-ray mask substrate
After contacting the X-ray mask substrate and the reinforcing frame,
An adhesive can be injected from the adhesive injection groove 9 . This
At this time, the X-ray mask bonding position 8 is as shown in FIG. After the injection, the adhesive is solidified to complete the bonding completely. The shape of the groove for injecting the adhesive may be various, such as circular, oval, rectangular, etc., but is not particularly limited.
Alternatively, the adhesive injection grooves 9 may have a shape connected to each other on the adhesive surface.

【0014】(図5)に本発明X線マスクを示す。接
着剤は予めシリコンウエハ基材1、透過膜2、バックエ
ッチング用マスク4を通して設けた基板用接着剤注入貫
通孔10を通して貼合せ凹部7に注入される。(図5)
においても(図1)、(図2)と同様に貼合せ凹部7の
開口は基板用接着剤注入貫通孔10より大きくして接着
面積を大きくすることが望ましい。
FIG. 5 shows an X-ray mask of the present invention. The adhesive is injected into the bonding recess 7 through an adhesive injection through hole 10 for the substrate, which is provided in advance through the silicon wafer substrate 1, the permeable film 2, and the mask 4 for back etching. (Fig. 5)
Also in (FIG. 1) and (FIG. 2), it is desirable that the opening of the bonding concave portion 7 is larger than the adhesive injection through hole 10 for the substrate to increase the bonding area.

【0015】 (図1)乃至(図5)ではX線マスク基板
は裏面にバックエッチング用マスク4を残した形状にな
っているが、貼合せにはバックエッチング用マスク4は
特に必要なものではない。
In FIG . 1 to FIG. 5, the X-ray mask substrate has a shape in which the back etching mask 4 is left on the back surface, but the back etching mask 4 is not particularly required for bonding. Absent.

【0016】[0016]

【作用】本発明によると、X線マスク基板と補強フレー
ムを予め平面同士で接触させておき、その状態で接着剤
を注入して貼り合わせる方式であるために、まず接着剤
の盛り上がりによる不要な厚みが生じる心配がなくな
る。また接着剤の塗布むらの発生も避けられ、X線マス
ク基板と補強フレームとの、それぞれの平面度や表裏の
平行度が保たれていれば、それらの接着によって歪みが
生じる事はなく反りの心配が無くなる。
According to the present invention, the X-ray mask substrate and the reinforcing frame are brought into contact with each other in a plane beforehand, and the adhesive is injected and bonded in that state. There is no need to worry about thickness. Also, it is possible to avoid uneven application of the adhesive, and if the flatness and the parallelism of the front and back of the X-ray mask substrate and the reinforcing frame are maintained, the adhesion does not cause distortion and warpage. No more worries.

【0017】[0017]

【実施例】<参考例1> 以下、実施例を示して本発明をさらに具体的に説明す
る。3インチ径1mm厚のシリコンウェハ基材上に、X
線透過支持膜として2μm厚のSiNx を減圧CVD法
により形成し、その上にX線吸収体薄膜として 0.7μm
厚のタンタル(Ta)をスパッタリング法により形成し
たブランク用基板から、(図6)、(図7)に示す工程
に従ってX線吸収体パターンを形成し、最後に、熱アル
カリ液を用いたウェットエッチングにより裏面側からの
シリコンウエハ基材のバックエッチングを行なった。
EXAMPLES Reference Example 1 Hereinafter, the present invention will be described more specifically with reference to examples. X on a 3 inch diameter 1 mm thick silicon wafer substrate
A 2 .mu.m thick SiNx film is formed by a low pressure CVD method as a radiation transmitting support film, and a 0.7 .mu.m
An X-ray absorber pattern is formed according to the steps shown in FIGS. 6 and 7 from a blank substrate on which a thick tantalum (Ta) is formed by a sputtering method. Finally, wet etching using a hot alkaline solution is performed. Back etching of the silicon wafer substrate from the back side.

【0018】 このようにして作製したX線マスク基板と
5インチ角で5mm厚みのパイレックス製補強フレーム
を本発明の方法に従って接触させた。補強フレームには
予め接着剤の注入用の貫通孔を(図1)および(図2)
の様に設けておいた。続いてエポキシ系接着剤を注入口
から入れて、X線マスク基板と補強フレーム間には2k
g重の加重を掛けて固定した。接着剤の固形化後にX線
マスク基板の反りを測定したが貼合せ前と変化がなかっ
た。
The X-ray mask substrate thus produced was brought into contact with a 5-inch square, 5 mm thick reinforcing frame made of Pyrex according to the method of the present invention. The reinforcing frame is provided with through holes for injecting an adhesive in advance (FIG. 1) and (FIG. 2).
It was set up like this. Subsequently, an epoxy-based adhesive was injected from the injection port, and 2k was placed between the X-ray mask substrate and the reinforcing frame.
The weight was fixed by applying a g weight. After the solidification of the adhesive, the warpage of the X-ray mask substrate was measured.

【0019】<参考例2>参考 例1と同様の工程によりX線マスク基板を作製し
た。補強フレームには予め(図3)および(図4)に示
す溝を形成しておいた。接着剤は溝の横方向から注入し
て固形化させた。接着剤の固形化後にX線マスク基板の
反りを測定したが貼合せ前と変化がなかった。
Reference Example 2 An X-ray mask substrate was manufactured by the same steps as in Reference Example 1. The grooves shown in FIGS. 3 and 4 were previously formed in the reinforcing frame. The adhesive was injected from the side of the groove and solidified. After the solidification of the adhesive, the warpage of the X-ray mask substrate was measured.

【0020】[0020]

【発明の効果】以上詳細に説明したように本発明にかか
わるX線マスクおよびその製造方法によれば、補強フレ
ームに対するX線マスク基板の平行度が高くでき、また
接着に伴う歪から生じる反りを抑制し平面度も高くな
り、良品質のX線マスクとその製造方法を提供できた。
そしてこのことからX線マスクが複製用原版として実際
に使用される際に、良好な性能を発揮できるようなっ
た。
As described above in detail, according to the X-ray mask and the method for manufacturing the same according to the present invention, the parallelism of the X-ray mask substrate with respect to the reinforcing frame can be increased, and the warpage caused by the distortion caused by the bonding can be prevented. Suppression and flatness were improved, and a high-quality X-ray mask and a manufacturing method thereof could be provided.
Thus, when the X-ray mask is actually used as a duplication master, good performance can be exhibited.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係わるX線マスクの一参考例を、断面
図を用いて示す説明図である。
FIG. 1 is an explanatory diagram showing a reference example of an X-ray mask according to the present invention using a cross-sectional view.

【図2】(図1)のX線マスクの補強フレームを平面図
で示す説明図である。
FIG. 2 is an explanatory view showing a reinforcing frame of the X-ray mask of FIG. 1 in a plan view.

【図3】本発明に係わらないX線マスクの一実施例を、
断面図を用いて示す説明図である。
FIG. 3 shows an embodiment of an X-ray mask not related to the present invention.
It is explanatory drawing shown using a sectional view.

【図4】(図3)のX線マスクの補強フレームを平面図
で示す説明図である。
FIG. 4 is an explanatory view showing a reinforcing frame of the X-ray mask of FIG. 3 in a plan view.

【図5】本発明に係わるX線マスクの別の一実施例を、
断面図を用いて示す説明図である。
FIG. 5 shows another embodiment of the X-ray mask according to the present invention.
It is explanatory drawing shown using a sectional view.

【図6】従来のX線マスクの製造方法の一例を、断面図
を用いて工程順に示す説明図である。
FIG. 6 is an explanatory view showing an example of a conventional method of manufacturing an X-ray mask in the order of steps using cross-sectional views.

【図7】従来のX線マスクの製造方法の一例を、断面図
を用いて工程順に示す説明図である。
FIG. 7 is an explanatory view showing an example of a conventional method for manufacturing an X-ray mask in the order of steps using cross-sectional views.

【図8】従来のX線マスクの製造方法の一例を、断面図
を用いて工程順に示す説明図である。
FIG. 8 is an explanatory diagram showing an example of a conventional method for manufacturing an X-ray mask in the order of steps using cross-sectional views.

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平3−290918(JP,A) 特開 昭63−236322(JP,A) 特開 平2−94427(JP,A) 特開 平1−152625(JP,A) 特開 平5−291123(JP,A) (58)調査した分野(Int.Cl.7,DB名) H01L 21/027 G03F 1/16 ────────────────────────────────────────────────── ─── Continuation of the front page (56) References JP-A-3-290918 (JP, A) JP-A-63-236322 (JP, A) JP-A-2-94427 (JP, A) JP-A-1- 152625 (JP, A) JP-A-5-291123 (JP, A) (58) Fields investigated (Int. Cl. 7 , DB name) H01L 21/027 G03F 1/16

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】X線露光用マスク基板と貼り合せ凹部が設
けられた補強フレームとが貼合されてなるX線露光用マ
スクにおいて、少なくともX線露光用マスク基板に、
接着剤注入用貫通孔を備え、該貫通孔と貼り合せ凹部と
が接着面で互いに連結しており、該貫通孔を通じて接着
剤が注入されていることを特徴とするX線露光用マス
ク。
An X-ray exposure mask substrate and a bonding recess are provided.
In the vignetting reinforcing frame pasted is X-ray exposure mask comprising, on at least the X-ray exposure mask substrate,
An X-ray exposure mask, comprising a through hole for injecting an adhesive , wherein the through hole and the bonding concave portion are connected to each other at an adhesive surface, and the adhesive is injected through the through hole.
【請求項2】 前記貫通孔の断面積が接着面で広くなって
いることを特徴とする請求項記載のX線露光用マス
ク。
Wherein said X-ray exposure mask according to claim 1, wherein the cross-sectional area of the through hole is characterized in that it is wider at the adhesive surface.
【請求項3】 X線露光用マスク基板を貼り合せ凹部が設
けられた補強フレームに貼合せてなるX線露光用マスク
の製造方法において、X線露光用マスク基板に予め
着剤注入用貫通孔を設け、該補強フレームとX線露光用
マスク基板を接触させた後、該貫通孔から、接着剤を注
入し、該貫通孔が接着面でお互いに連結する様にX線露
光用マスク基板と補強フレームを貼り合わせることを特
徴とするX線露光用マスクの製造方法。
3. An X-ray exposure mask substrate is bonded to form a concave portion.
The method of manufacturing a X-ray exposure mask comprising laminated reinforcing frame kicked, advance against the said X-ray exposure mask substrate
After a through hole for injecting an adhesive is provided, and the reinforcing frame is brought into contact with the mask substrate for X-ray exposure, an adhesive is injected from the through hole, and X is applied so that the through holes are connected to each other at the bonding surface. A method of manufacturing a mask for X-ray exposure, comprising bonding a mask substrate for X-ray exposure to a reinforcing frame.
JP26845092A 1992-10-07 1992-10-07 X-ray exposure mask and method of manufacturing the same Expired - Fee Related JP3306922B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26845092A JP3306922B2 (en) 1992-10-07 1992-10-07 X-ray exposure mask and method of manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26845092A JP3306922B2 (en) 1992-10-07 1992-10-07 X-ray exposure mask and method of manufacturing the same

Publications (2)

Publication Number Publication Date
JPH06120124A JPH06120124A (en) 1994-04-28
JP3306922B2 true JP3306922B2 (en) 2002-07-24

Family

ID=17458681

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26845092A Expired - Fee Related JP3306922B2 (en) 1992-10-07 1992-10-07 X-ray exposure mask and method of manufacturing the same

Country Status (1)

Country Link
JP (1) JP3306922B2 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0170594B1 (en) * 1996-05-25 1999-03-20 양승택 Structure of glass ring for mask
KR100522725B1 (en) * 2002-04-04 2005-10-20 주식회사 디엠에스 Mask having large area and exposure system having the same
JP2004335996A (en) * 2003-04-15 2004-11-25 Ibiden Co Ltd Mask structure, its manufacturing method, and reinforcing mask frame
US7473501B1 (en) 2008-03-30 2009-01-06 International Business Machines Corporation Method for reducing photo-mask distortion
EP3410215B1 (en) 2016-01-27 2020-06-17 LG Chem, Ltd. Film mask, method for manufacturing same, and method for forming pattern using film mask and pattern formed thereby
US11029596B2 (en) 2016-01-27 2021-06-08 Lg Chem, Ltd. Film mask, method for manufacturing same, and method for forming pattern using film mask and pattern formed thereby
JP6690814B2 (en) 2016-01-27 2020-04-28 エルジー・ケム・リミテッド Film mask, method for manufacturing the same, and pattern forming method using the same

Also Published As

Publication number Publication date
JPH06120124A (en) 1994-04-28

Similar Documents

Publication Publication Date Title
JPS58140156A (en) Solid-state image pickup device
JP2911954B2 (en) X-ray mask structure
JP3306922B2 (en) X-ray exposure mask and method of manufacturing the same
JP2751261B2 (en) Semiconductor substrate bonding method
JPH073380B2 (en) Integrated pressure sensor
JP3271507B2 (en) Electrode forming method for electronic component and masking device used for the method
JP3233111B2 (en) Circuit board mounting method and circuit board mounting structure
JPS62220914A (en) Method and apparatus for adjusting and mounting optical member on mechanical part or chasis
JP3223581B2 (en) X-ray exposure mask and method of manufacturing the same
JP2802665B2 (en) Mask assembly method
JPH06112239A (en) Method and apparatus for insertion of chip into housing at inside of board by intermediate film
JPH05243469A (en) Lead frame for semiconductor device
JP3173905B2 (en) Semiconductor pressure sensor
JP2003066402A5 (en)
JPS641926B2 (en)
JPH04204224A (en) Ceramic or quartz load cell
JPH04289508A (en) Production of thin-film magnetic head
JPH1130735A (en) Hybrid optical circuit
JPS6334946A (en) Plate for sticking semiconductor wafer
JPS62281324A (en) X-ray mask and manufacture thereof
JPS59188620A (en) Manufacturing device of liquid crystal display element
JPS61214443A (en) Semiconductor device and manufacture thereof
JPH0241804B2 (en)
JPH0344912A (en) Semiconductor device and manufacture thereof
JPH029011A (en) Manufacture of thin film combination head

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees