JPH06120124A - Mask for x-ray exposure and its manufacture - Google Patents
Mask for x-ray exposure and its manufactureInfo
- Publication number
- JPH06120124A JPH06120124A JP26845092A JP26845092A JPH06120124A JP H06120124 A JPH06120124 A JP H06120124A JP 26845092 A JP26845092 A JP 26845092A JP 26845092 A JP26845092 A JP 26845092A JP H06120124 A JPH06120124 A JP H06120124A
- Authority
- JP
- Japan
- Prior art keywords
- ray
- reinforcing frame
- ray exposure
- ray mask
- exposure mask
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、X線露光用マスク(以
下「X線マスク」と称す。)およびその製造方法に関
し、さらに詳しくは、平面精度の高いX線マスクとその
製造方法に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an X-ray exposure mask (hereinafter referred to as "X-ray mask") and a method for manufacturing the same, and more particularly to an X-ray mask having high plane accuracy and a method for manufacturing the same. Is.
【0002】[0002]
【従来の技術】従来のX線マスクの代表的な製造方法を
(図6)〜(図8)に従って説明すると、まず(図6)
に示すように、シリコンウエハ基材1上にX線透過支持
膜2およびX線吸収体パターン3を形成し、かつシリコ
ンウエハ基材1の裏面にバックエッチング用マスク4を
形成した後、シリコンウエハ基材1のバックエッチング
を行ない(図7)、最後に接着剤11を介して補強フレ
ーム5を接着する(図8)。2. Description of the Related Art A typical method for manufacturing a conventional X-ray mask will be described below with reference to FIGS. 6 to 8 (FIG. 6).
As shown in FIG. 1, after the X-ray transparent support film 2 and the X-ray absorber pattern 3 are formed on the silicon wafer base material 1, and the back etching mask 4 is formed on the back surface of the silicon wafer base material 1, Back etching of the base material 1 is performed (FIG. 7), and finally, the reinforcing frame 5 is bonded via the adhesive 11 (FIG. 8).
【0003】X線マスクは、(図8)の補強フレーム5
をX線露光装置に取りつけて使用され、X線吸収体パタ
ーン3と転写されるウエハは数10μmから数μmまで
近接して設置される。このため補強フレーム5の面とX
線透過支持膜2の面とは平行で有ることが転写の工程上
から必要である。従ってX線吸収体パターン3を保持し
たX線透過支持膜2はそれ自身の平面度が高いことが要
求される。The X-ray mask has a reinforcing frame 5 (FIG. 8).
Is used by being attached to an X-ray exposure apparatus, and the wafer to be transferred with the X-ray absorber pattern 3 is installed close to several tens μm to several μm. Therefore, the surface of the reinforcing frame 5 and the X
It is necessary to be parallel to the surface of the line-transparent support film 2 from the viewpoint of the transfer process. Therefore, the X-ray transparent support film 2 holding the X-ray absorber pattern 3 is required to have high flatness.
【0004】しかしながら、(図8)に示す従来のX線
マスクにおいてはX線マスク基板は接着剤11を介して
補強フレーム5に接着されており、接着剤の厚さの違い
に因る補強フレーム5とX線マスク基板との平行度のず
れは除き難かった。また接着剤11の厚さむらによって
シリコンウエハ基材1も歪むためにX線吸収体パターン
3のあるX線透過支持膜2も歪んで平面度が貼合せ前よ
りも悪くなることがあった。However, in the conventional X-ray mask shown in FIG. 8, the X-ray mask substrate is bonded to the reinforcing frame 5 via the adhesive 11, and the reinforcing frame is caused by the difference in the thickness of the adhesive. It was difficult to remove the deviation in parallelism between No. 5 and the X-ray mask substrate. In addition, the silicon wafer base material 1 is also distorted due to the uneven thickness of the adhesive 11, so that the X-ray transmission support film 2 having the X-ray absorber pattern 3 is also distorted and the flatness may be worse than that before the bonding.
【0005】[0005]
【発明が解決しようとする課題】本発明は前記従来の問
題点に鑑みなされたものであり、その目的とするところ
は、補強フレームに対するX線マスク基板の平行度が高
く、また接着に伴う歪から生じる反りを抑制し平面度も
高い、という良品質のX線マスクとその製造方法を提供
し、X線マスクが複製用原版として実際に使用される際
に、良好な性能を発揮できるようにすることにある。SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems of the prior art, and an object of the present invention is to have a high parallelism of the X-ray mask substrate with respect to the reinforcing frame and to prevent distortion caused by bonding. We provide a good quality X-ray mask that suppresses warpage and high flatness and its manufacturing method so that it can exhibit good performance when the X-ray mask is actually used as a master for duplication. To do.
【0006】[0006]
【課題を解決するための手段】前記課題を解決するため
に本発明が提供する手段とは、すなわち、X線マスク基
板と補強フレームとが貼合されてなるX線マスクにおい
て、少なくとも前記補強フレームか、または前記X線マ
スク基板に貫通孔を有することを特徴とするX線マスク
である。[Means for Solving the Problems] Means provided by the present invention in order to solve the above-mentioned problems, namely, in an X-ray mask in which an X-ray mask substrate and a reinforcing frame are bonded together, at least the reinforcing frame Alternatively, the X-ray mask is characterized in that the X-ray mask substrate has a through hole.
【0007】そして好ましくは、前記貫通孔が接着面で
お互いに連結していることを特徴とする前記のX線マス
クである。Preferably, the X-ray mask is characterized in that the through holes are connected to each other by an adhesive surface.
【0008】さらに好ましくは、前記貫通孔の断面積が
接着面で広くなっていることを特徴とする前記のX線マ
スクである。More preferably, the X-ray mask is characterized in that a cross-sectional area of the through hole is widened on an adhesive surface.
【0009】または、X線マスク基板と補強フレームと
が貼合されてなるX線マスクにおいて、前記補強フレー
ムの貼り合わせ面に、X線マスク基板が設けられる領域
から外側にはみ出した部分をもつ溝を有することを特徴
とするX線マスクである。Alternatively, in an X-ray mask in which an X-ray mask substrate and a reinforcing frame are bonded together, a groove having a portion protruding outside the region where the X-ray mask substrate is provided on the bonding surface of the reinforcing frame. It is an X-ray mask characterized by having.
【0010】そして好ましくは、前記溝が接着面でお互
いに連結していることを特徴とする前記のX線マスクで
ある。Preferably, the X-ray mask is characterized in that the grooves are connected to each other by an adhesive surface.
【0011】あるいは、X線マスク基板を補強フレーム
に貼合せてなるX線マスクの製造方法において、少なく
とも前記補強フレームか、または前記X線マスク基板に
ある貫通孔から、接着剤を注入することを特徴とするX
線マスクの製造方法である。Alternatively, in an X-ray mask manufacturing method in which an X-ray mask substrate is attached to a reinforcing frame, an adhesive is injected from at least the reinforcing frame or a through hole in the X-ray mask substrate. Characteristic X
It is a manufacturing method of a line mask.
【0012】そして好ましくは、前記X線マスクの製造
方法において、前記補強フレーム面にありX線マスク基
板が設けられる領域から外側にはみ出した部分をもつ溝
から、接着剤を注入することを特徴とする前記のX線マ
スクの製造方法である。[0012] Preferably, in the method of manufacturing the X-ray mask, the adhesive is injected from a groove having a portion on the reinforcing frame surface which is outside the region where the X-ray mask substrate is provided. The X-ray mask manufacturing method described above.
【0013】(図1)から(図5)は本発明のX線マス
クに関する説明図である。(図1)のX線マスクの製造
では、初めにX線吸収体パターン3を形成しバックエッ
チングしたX線マスク基板を補強フレーム5に接触させ
る。X線マスク基板貼合せ位置8は(図2)の平面図に
示す部分である。補強フレームには予め接着剤注入孔6
と貼合せ凹部7を形成しておく。続いて、接着剤注入孔
6を通して貼合せ凹部7に接着剤を注入し、固形化させ
る。補助フレーム5とX線マスク基板はバックエッチン
グ用マスク4の部分で接触しているため、この両者の平
面度が高い限り接着剤の厚みによって基板が傾いたり、
歪みが発生して平面度が悪くなったりすることはない。(FIG. 1) to (FIG. 5) are explanatory views relating to the X-ray mask of the present invention. In the manufacture of the X-ray mask (FIG. 1), first, the X-ray absorber pattern 3 is formed and the back-etched X-ray mask substrate is brought into contact with the reinforcing frame 5. The X-ray mask substrate bonding position 8 is the portion shown in the plan view of FIG. An adhesive injection hole 6 is previously provided in the reinforcing frame.
And the bonding recess 7 is formed. Then, the adhesive is injected into the bonding concave portion 7 through the adhesive injection hole 6 and solidified. Since the auxiliary frame 5 and the X-ray mask substrate are in contact with each other at the back etching mask 4, the substrate is inclined due to the thickness of the adhesive as long as the flatness of both is high,
The flatness does not deteriorate due to distortion.
【0014】接着剤注入孔6と貼合せ凹部7とは(図
2)においては4か所を示しているが、接着部分の数は
特に限定するものではないが、力のつりあいを考慮する
と、接着部分が2か所以上であればX線マスク基板と補
強フレーム5とを保持することができる。また貼合せ凹
部7は接着剤注入孔6よりも開口を大きくして、接着剤
の接触面積が大きく成るようにすることが望ましい。さ
らに、貼合せ凹部7は接着面においてお互いに溝によっ
て連結されている構造であってもよい。Although the adhesive injection hole 6 and the bonding concave portion 7 are shown at four places in FIG. 2, the number of adhesive portions is not particularly limited, but considering the balance of forces, If there are two or more bonded portions, the X-ray mask substrate and the reinforcing frame 5 can be held. Further, it is desirable that the bonding recess 7 has a larger opening than the adhesive injection hole 6 so that the contact area of the adhesive becomes large. Furthermore, the bonding recesses 7 may have a structure in which they are connected to each other by grooves on the adhesive surface.
【0015】補強フレーム5の形状は角、丸などいずれ
でもよく、要はX線露光装置に適応出来れば差支えが無
く特に限定はしない。また材質については、石英、パイ
レックス等のガラス、あるいは金属板、セラミックス
等、いずれを用いてもよい。要は、X線露光装置に装填
して使用するための寸法形状を得られ、かつX線マスク
用基板との貼り合わせも可能であれば差支えない。尚、
好ましくは熱膨張係数がX線マスク用基板のものに近い
材質である。The shape of the reinforcing frame 5 may be any of corners, circles, etc. The point is that there is no problem as long as it can be applied to the X-ray exposure apparatus, and there is no particular limitation. As for the material, any of quartz, glass such as Pyrex, metal plate, ceramics and the like may be used. In short, it does not matter as long as the dimensions and shape for loading and using in the X-ray exposure apparatus can be obtained and the bonding with the X-ray mask substrate is possible. still,
Preferably, the material has a thermal expansion coefficient close to that of the X-ray mask substrate.
【0016】(図3)は本発明の別のX線マスクを示
す。X線マスク基板と補強フレーム5の接触は(図1)
と同様に行うが(図4)の補強フレーム5の平面図が示
す様に、接着剤注入溝9は補強フレーム5の貼合せ面に
X線マスク基板の横方向から溝状に形成する。X線マス
ク基板と補強フレームを接触させた後に、接着剤注入溝
9から接着剤を注入する。X線マスク貼合せ位置8は
(図4)に示す通りである。注入後は接着剤を固化させ
て完全に接着を完成させる。接着剤注入用の溝の形状は
円形、楕円形、長方形、等々多様に考えられるが、特に
限定するものではない。また接着剤注入溝9は接着面に
おいてお互いに連結されている形状で有ってもよいFIG. 3 shows another X-ray mask of the present invention. The contact between the X-ray mask substrate and the reinforcing frame 5 (Fig. 1)
As shown in the plan view of the reinforcing frame 5 (FIG. 4), the adhesive injection groove 9 is formed in a groove shape from the lateral direction of the X-ray mask substrate on the bonding surface of the reinforcing frame 5. After bringing the X-ray mask substrate and the reinforcing frame into contact with each other, the adhesive is injected from the adhesive injection groove 9. The X-ray mask bonding position 8 is as shown in (FIG. 4). After the injection, the adhesive is solidified to complete the adhesion. The shape of the groove for injecting the adhesive may be circular, oval, rectangular, or the like, but is not particularly limited. Further, the adhesive injection groove 9 may have a shape in which they are connected to each other on the adhesive surface.
【0017】(図5)に本発明の別のX線マスクを示
す。接着剤は予めシリコンウエハ基材1、透過膜2、バ
ックエッチング用マスク4を通して設けた基板用接着剤
注入貫通孔10を通して貼合せ凹部7に注入される。
(図5)においても(図1)、(図2)と同様に貼合せ
凹部7の開口は基板用接着剤注入貫通孔10より大きく
して接着面積を大きくすることが望ましい。FIG. 5 shows another X-ray mask of the present invention. The adhesive is injected into the bonding recess 7 through the substrate adhesive injection through hole 10 which is provided through the silicon wafer substrate 1, the permeable film 2 and the back etching mask 4 in advance.
In (FIG. 5) as well (FIG. 1) and (FIG. 2), it is desirable that the opening of the bonding recess 7 be larger than the adhesive injection through hole 10 for a substrate to increase the adhesion area.
【0018】本発明の(図1)乃至(図5)ではX線マ
スク基板は裏面にバックエッチング用マスク4を残した
形状になっているが、貼合せにはバックエッチング用マ
スク4は特に必要なものではない。In the (FIG. 1) to (FIG. 5) of the present invention, the X-ray mask substrate has a shape in which the back etching mask 4 is left on the back surface, but the back etching mask 4 is particularly necessary for bonding. It's not something.
【0019】[0019]
【作用】本発明によると、X線マスク基板と補強フレー
ムを予め平面同士で接触させておき、その状態で接着剤
を注入して貼り合わせる方式であるために、まず接着剤
の盛り上がりによる不要な厚みが生じる心配がなくな
る。また接着剤の塗布むらの発生も避けられ、X線マス
ク基板と補強フレームとの、それぞれの平面度や表裏の
平行度が保たれていれば、それらの接着によって歪みが
生じる事はなく反りの心配が無くなる。According to the present invention, since the X-ray mask substrate and the reinforcing frame are brought into contact with each other in the planes in advance and the adhesive is injected and bonded in that state, it is unnecessary to swell the adhesive. There is no need to worry about thickness. Further, it is possible to avoid uneven application of the adhesive, and if the flatness and the parallelism of the front and back sides of the X-ray mask substrate and the reinforcing frame are maintained, there will be no distortion due to their adhesion and there will be no warpage. No worries.
【0020】[0020]
【実施例】<実施例1>以下、実施例を示して本発明を
さらに具体的に説明する。3インチ径1mm厚のシリコ
ンウェハ基材上に、X線透過支持膜として2μm厚のS
iNx を減圧CVD法により形成し、その上にX線吸収
体薄膜として 0.7μm厚のタンタル(Ta)をスパッタ
リング法により形成したブランク用基板から、(図
6)、(図7)に示す工程に従ってX線吸収体パターン
を形成し、最後に、熱アルカリ液を用いたウェットエッ
チングにより裏面側からのシリコンウエハ基材のバック
エッチングを行なった。EXAMPLES Example 1 The present invention will be described in more detail below with reference to examples. On a silicon wafer substrate with a diameter of 3 mm and a thickness of 1 mm, an S-layer having a thickness of 2 μm as an X-ray transmission supporting film
Steps shown in (FIG. 6) and (FIG. 7) from a blank substrate on which iN x is formed by a low pressure CVD method and 0.7 μm-thick tantalum (Ta) as an X-ray absorber thin film is formed thereon by a sputtering method. The X-ray absorber pattern was formed according to the above, and finally, the silicon wafer substrate was back-etched from the back surface side by wet etching using a hot alkaline solution.
【0021】このようにして作製したX線マスク基板と
5インチ角で5mm厚みのパイレックス製補強フレーム
を本発明の方法に従って接触させた。補強フレームには
予め接着剤の注入用の貫通孔を(図1)および(図2)
の様に設けておいた。続いてエポキシ系接着剤を注入口
から入れて、X線マスク基板と補強フレーム間には2k
g重の加重を掛けて固定した。接着剤の固形化後にX線
マスク基板の反りを測定したが貼合せ前と変化がなかっ
た。The X-ray mask substrate thus prepared was brought into contact with the 5 inch square 5 mm thick Pyrex reinforcing frame according to the method of the present invention. Through holes for injecting adhesive are previously formed in the reinforcing frame (Fig. 1) and (Fig. 2).
It was set up like. Then put an epoxy adhesive through the injection port and put 2k between the X-ray mask substrate and the reinforcing frame.
It was fixed by applying g-weight. The warpage of the X-ray mask substrate was measured after the adhesive was solidified, but there was no change from that before the bonding.
【0022】<実施例2>実施例1と同様の工程により
X線マスク基板を作製した。補強フレームには予め(図
3)および(図4)に示す溝を形成しておいた。接着剤
は溝の横方向から注入して固形化させた。接着剤の固形
化後にX線マスク基板の反りを測定したが貼合せ前と変
化がなかった。<Example 2> An X-ray mask substrate was manufactured by the same steps as in Example 1. Grooves shown in (FIG. 3) and (FIG. 4) were previously formed in the reinforcing frame. The adhesive was injected from the lateral direction of the groove and solidified. The warpage of the X-ray mask substrate was measured after the adhesive was solidified, but there was no change from that before the bonding.
【0023】[0023]
【発明の効果】以上詳細に説明したように本発明にかか
わるX線マスクおよびその製造方法によれば、補強フレ
ームに対するX線マスク基板の平行度が高くでき、また
接着に伴う歪から生じる反りを抑制し平面度も高くな
り、良品質のX線マスクとその製造方法を提供できた。
そしてこのことからX線マスクが複製用原版として実際
に使用される際に、良好な性能を発揮できるようなっ
た。As described above in detail, according to the X-ray mask and the method for manufacturing the same according to the present invention, the parallelism of the X-ray mask substrate with respect to the reinforcing frame can be increased, and the warp caused by the distortion due to the adhesion can be prevented. As a result, the flatness was suppressed and the flatness was increased, and a good quality X-ray mask and its manufacturing method could be provided.
From this fact, it has become possible to exhibit excellent performance when the X-ray mask is actually used as a master for duplication.
【図1】本発明に係わるX線マスクの一実施例を、断面
図を用いて示す説明図である。FIG. 1 is an explanatory view showing an embodiment of an X-ray mask according to the present invention by using a sectional view.
【図2】(図1)のX線マスクの補強フレームを平面図
で示す説明図である。FIG. 2 is an explanatory view showing a reinforcing frame of the X-ray mask of FIG. 1 in a plan view.
【図3】本発明に係わるX線マスクの他の一実施例を、
断面図を用いて示す説明図である。FIG. 3 shows another embodiment of the X-ray mask according to the present invention,
It is explanatory drawing shown using a cross-sectional view.
【図4】(図3)のX線マスクの補強フレームを平面図
で示す説明図である。FIG. 4 is an explanatory view showing a reinforcing frame of the X-ray mask of FIG. 3 in a plan view.
【図5】本発明に係わるX線マスクの別の一実施例を、
断面図を用いて示す説明図である。FIG. 5 shows another embodiment of the X-ray mask according to the present invention,
It is explanatory drawing shown using a cross-sectional view.
【図6】従来のX線マスクの製造方法の一例を、断面図
を用いて工程順に示す説明図である。6A to 6C are explanatory views showing an example of a conventional method for manufacturing an X-ray mask, in the order of steps using sectional views.
【図7】従来のX線マスクの製造方法の一例を、断面図
を用いて工程順に示す説明図である。FIG. 7 is an explanatory diagram showing an example of a conventional method for manufacturing an X-ray mask in the order of steps using sectional views.
【図8】従来のX線マスクの製造方法の一例を、断面図
を用いて工程順に示す説明図である。FIG. 8 is an explanatory diagram showing an example of a conventional method for manufacturing an X-ray mask in the order of steps using sectional views.
【符号の説明】 1・・・シリコンウエハ基材 2・・・X線透過支持膜 3・・・X線吸収体パターン 4・・・バックエッチング用マスク 5・・・補強フレーム 6・・・接着剤注入孔 7・・・貼合せ凹部 8・・・X線マスク基板貼合せ位置 9・・・接着剤注入溝 10・・・基板用接着剤注入貫通孔 11・・・接着剤[Explanation of Codes] 1 ... Silicon wafer base material 2 ... X-ray transparent support film 3 ... X-ray absorber pattern 4 ... Back etching mask 5 ... Reinforcement frame 6 ... Adhesion Agent injection hole 7 ... Bonding recess 8 ... X-ray mask substrate bonding position 9 ... Adhesive injection groove 10 ... Substrate adhesive injection through hole 11 ... Adhesive
───────────────────────────────────────────────────── フロントページの続き (72)発明者 福原 信彦 東京都台東区台東一丁目5番1号 凸版印 刷株式会社内 ─────────────────────────────────────────────────── ─── Continued Front Page (72) Inventor Nobuhiko Fukuhara 1-5-1 Taito, Taito-ku, Tokyo Toppan Printing Co., Ltd.
Claims (7)
貼合されてなるX線露光用マスクにおいて、少なくとも
該補強フレームまたは該X線露光用マスク基板に、貫通
孔を有することを特徴とするX線露光用マスク。1. An X-ray exposure mask comprising an X-ray exposure mask substrate and a reinforcing frame bonded together, wherein at least the reinforcing frame or the X-ray exposure mask substrate has a through hole. X-ray exposure mask.
ることを特徴とする請求項1記載のX線露光用マスク。2. The X-ray exposure mask according to claim 1, wherein the through holes are connected to each other by an adhesive surface.
いることを特徴とする請求項1乃至2記載のX線露光用
マスク。3. The X-ray exposure mask according to claim 1, wherein the cross-sectional area of the through hole is wide on the adhesive surface.
貼合されてなるX線露光用マスクにおいて、該補強フレ
ームの貼り合わせ面に、X線露光用マスク基板が設けら
れる領域から外側にはみ出した部分をもつ溝を有するこ
とを特徴とするX線露光用マスク。4. An X-ray exposure mask comprising an X-ray exposure mask substrate and a reinforcing frame bonded together, wherein the bonding surface of the reinforcing frame is located outside a region where the X-ray exposure mask substrate is provided. An X-ray exposure mask having a groove having a protruding portion.
とを特徴とする請求項4記載のX線露光用マスク。5. The X-ray exposure mask according to claim 4, wherein the grooves are connected to each other by an adhesive surface.
合せてなるX線露光用マスクの製造方法において、少な
くとも該補強フレームか、または該X線露光用マスク基
板にある貫通孔から、接着剤を注入することを特徴とす
るX線マスクの製造方法。6. A method for manufacturing an X-ray exposure mask, which comprises bonding an X-ray exposure mask substrate to a reinforcing frame, wherein at least the reinforcing frame or a through hole in the X-ray exposure mask substrate is used for bonding. A method for manufacturing an X-ray mask, which comprises injecting an agent.
て、該補強フレーム面にありX線露光用マスク基板が設
けられる領域から外側にはみ出した部分をもつ溝から、
接着剤を注入することを特徴とする請求項6記載のX線
露光用マスクの製造方法。7. A method for manufacturing an X-ray exposure mask, comprising: a groove having a portion on the reinforcing frame surface, the portion protruding outside from a region where the X-ray exposure mask substrate is provided;
An X-ray exposure mask manufacturing method according to claim 6, wherein an adhesive is injected.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26845092A JP3306922B2 (en) | 1992-10-07 | 1992-10-07 | X-ray exposure mask and method of manufacturing the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26845092A JP3306922B2 (en) | 1992-10-07 | 1992-10-07 | X-ray exposure mask and method of manufacturing the same |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH06120124A true JPH06120124A (en) | 1994-04-28 |
JP3306922B2 JP3306922B2 (en) | 2002-07-24 |
Family
ID=17458681
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP26845092A Expired - Fee Related JP3306922B2 (en) | 1992-10-07 | 1992-10-07 | X-ray exposure mask and method of manufacturing the same |
Country Status (1)
Country | Link |
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JP (1) | JP3306922B2 (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5796804A (en) * | 1996-05-25 | 1998-08-18 | Electronics And Telecommunications Research Institute | X-ray mask structure for reducing the distortion of a mask |
JP2004335996A (en) * | 2003-04-15 | 2004-11-25 | Ibiden Co Ltd | Mask structure, its manufacturing method, and reinforcing mask frame |
KR100522725B1 (en) * | 2002-04-04 | 2005-10-20 | 주식회사 디엠에스 | Mask having large area and exposure system having the same |
US7473501B1 (en) | 2008-03-30 | 2009-01-06 | International Business Machines Corporation | Method for reducing photo-mask distortion |
CN108351605A (en) * | 2016-01-27 | 2018-07-31 | 株式会社Lg化学 | Film mask, preparation method, the pattern forming method using film mask and the pattern that is formed by film mask |
US10969677B2 (en) | 2016-01-27 | 2021-04-06 | Lg Chem, Ltd. | Film mask, method for manufacturing same, and method for forming pattern using film mask |
US10969686B2 (en) | 2016-01-27 | 2021-04-06 | Lg Chem, Ltd. | Film mask, method for manufacturing same, and method for forming pattern using film mask and pattern formed thereby |
-
1992
- 1992-10-07 JP JP26845092A patent/JP3306922B2/en not_active Expired - Fee Related
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5796804A (en) * | 1996-05-25 | 1998-08-18 | Electronics And Telecommunications Research Institute | X-ray mask structure for reducing the distortion of a mask |
KR100522725B1 (en) * | 2002-04-04 | 2005-10-20 | 주식회사 디엠에스 | Mask having large area and exposure system having the same |
JP2004335996A (en) * | 2003-04-15 | 2004-11-25 | Ibiden Co Ltd | Mask structure, its manufacturing method, and reinforcing mask frame |
US7473501B1 (en) | 2008-03-30 | 2009-01-06 | International Business Machines Corporation | Method for reducing photo-mask distortion |
CN108351605A (en) * | 2016-01-27 | 2018-07-31 | 株式会社Lg化学 | Film mask, preparation method, the pattern forming method using film mask and the pattern that is formed by film mask |
US10969677B2 (en) | 2016-01-27 | 2021-04-06 | Lg Chem, Ltd. | Film mask, method for manufacturing same, and method for forming pattern using film mask |
US10969686B2 (en) | 2016-01-27 | 2021-04-06 | Lg Chem, Ltd. | Film mask, method for manufacturing same, and method for forming pattern using film mask and pattern formed thereby |
US11029596B2 (en) | 2016-01-27 | 2021-06-08 | Lg Chem, Ltd. | Film mask, method for manufacturing same, and method for forming pattern using film mask and pattern formed thereby |
Also Published As
Publication number | Publication date |
---|---|
JP3306922B2 (en) | 2002-07-24 |
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