JP3269315B2 - Peeling inspection equipment - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a peeling inspection apparatus for inspecting whether or not a peeling process for exposing a core wire of an end portion of an electric wire by stripping a covering of the end portion of the electric wire has been properly performed.

[0002]

2. Description of the Related Art In the manufacture of a wire harness composed of a large number of electric wires and the like, a stripping process is performed in which the end of each electric wire is stripped to expose a core wire at the end of the electric wire. Thereafter, the terminal fitting is crimped. That is, as shown in FIG. 8, a cut is made in the coating of the end of the electric wire W, [FIG.
(A)], the coating S on the end of the electric wire W is removed,
Is exposed (FIG. 8B). And
A terminal fitting T is crimped to the end of the electric wire W [FIG.
(C)].

[0003] In this case, when the skinning process is properly performed, the end of the electric wire W is as shown in FIG. That is, only the coating on the end of the electric wire W is removed cleanly, and the core C is not cut or chipped.
However, when the skinning process is not properly performed, for example, as shown in FIG. 9B, the coating S at the end of the electric wire W is not peeled off, or as shown in FIG. Not only the coating of W but also the core wire is cut off, or as shown in FIG.
Half or most of the core wire C at the end is missing.
The ends of the stripped wires W are shown in FIGS.
In the state shown in (e), even if the terminal fitting is crimped there,
There are drawbacks in that proper conduction between the terminal fitting and the electric wire W cannot be obtained, and the terminal fitting is easily detached.

[0004] Therefore, conventionally, various inspection apparatuses have been proposed for inspecting whether or not the end portion of the electric wire has been appropriately peeled. For example, JP-A-59-12341
As disclosed in Japanese Patent Publication No. 3 (2003), there is provided an inspection apparatus that includes a light emitting device and a light receiving device, and detects the state of skinning by passing an end of a wire through an optical path from the light emitting device to the light receiving device. there were.

Further, as disclosed in Japanese Patent Publication No. 5-15036, there is an inspection apparatus which determines the quality of skinning by image processing using a television camera.

[0006]

In the former inspection apparatus using the light emitting unit and the light receiving unit, the end of the electric wire is moved in the lateral direction (the direction perpendicular to the longitudinal direction of the electric wire), and the optical path is moved during the movement. Was passed through and inspected. Therefore, as shown in FIGS. 10A to 10C, when the stripped length h at the end of the electric wire W is different, the position of the optical path L, that is, the light emitting unit or the light receiving unit is correspondingly changed. Had to be changed, which was troublesome.

[0007] Further, as shown in FIG. 11, when the peeling ends halfway, it should be determined that the peeling is defective, but the position of the optical path L coincides with the uncovered portion F. If so, it is determined that the skinning process has been performed normally. Further, although the skinning process is performed normally, as shown in FIG. 12, when the distal end portion Ca of the core wire C expands in a divergent shape, if the optical path L matches the distal end portion Ca, It is judged that the peeling is defective.

On the other hand, in the latter inspection apparatus using image processing, although the peeling state of the end of the electric wire can be surely inspected, there is a problem that the cost is high. In view of the above, the present invention has been made in view of the above-mentioned problem, and it is possible to cope with a case where the peeling lengths are different without changing a mounting position with one set of a light emitting unit and a light receiving unit. An object of the present invention is to provide an inexpensive skin peeling inspection apparatus which can reliably check the quality of the peeling test and has a simple structure.

[0009]

In order to achieve the above-mentioned object, the invention according to claim 1 is provided in a longitudinal direction along a feeding path.
By a pair of skinning blade was cut into the wire to be fed and the said wire in the longitudinal direction of the electric wire are moved relative, a skinning device stripping the coating of the wire, the feeding path
Terminal pressure placed on the side of the peeling device, separated from
In the terminal crimping machine and a wear device, a stripping processing inspection apparatus which is applied to the skin stripping device <br/>, a light emitting unit, a signal corresponding to the amount of received light receives light from the light emitting unit output A light receiving section and a straight optical path through which the ends of the electric wires pass during the stripping operation, arranged in a state where a positional relationship is maintained at a predetermined distance in the longitudinal direction of the electric wires with respect to the above-mentioned peeling blade. An optical path forming means for forming a signal, and a pass / fail judgment means for receiving a signal corresponding to the passage of the end of the electric wire from the light receiving section, comparing the signal with a preset comparative reference value, and judging pass / fail of the skinning process. wherein, said optical path forming means, said skin stripping blades
Attached to the block that holds the above edge after peeling
The terminal is crimped by the child crimping device and returned to the feed path
To the end of the electric wire, let the optical path of the optical path forming means pass,
The quality of the terminal crimping is determined by the quality determining means.
It is characterized in that you have manner.

[0010] A peeling inspection apparatus according to a second aspect of the present invention is the peeling inspection apparatus according to the first aspect, wherein the optical path forming means is a light emitting section and a light receiving section. A peeling inspection apparatus according to claim 3 is the peeling inspection apparatus according to claim 1, wherein the optical path forming means is:
It is characterized by a pair of reflectors that sequentially reflect light emitted from the light emitting unit and guide the light to the light receiving unit.

[0011] stripping processing inspection apparatus according to claim 4, in stripping processing inspection apparatus according to any one of claims 1 to 3, stripping top Symbol transdermal device, across the cutting blade for cutting the wire state In, having a pair of peeling blades arranged at predetermined intervals in the longitudinal direction of the electric wire, the coating portion of each end of the pair of electric wires separated by the cutting blade, each pair of skinning blades In the cut state, the two electric wires are moved so as to be separated in the longitudinal direction, thereby performing a peeling operation. The optical path forming means is provided with two sets corresponding to the passage of the end of each electric wire. It is characterized by being carried out.

[0012] According to the configuration of the first aspect of the present invention,
During the stripping operation, a certain range of the end of the stripped electric wire continuously passes through an optical path which is positioned at a predetermined distance from the stripping blade in the longitudinal direction of the electric wire.
As a result, the state of the terminal of the wire in a certain range is continuously checked. Quality determination Priority determination means receives a signal corresponding to the passage of the wire end portions from the light receiving unit, the signal,
Compared with preset reference values to <br/>-size constant the quality of the skinning process. In addition, the end of the wire to which the terminal was crimped after peeling
The end passes through the optical path, and the quality
Determine whether or not. In particular, light is applied to the block holding the peeling blade.
Since the road forming means is attached, both are accurately positioned
can do. In addition, the whole is an integrated unit
Can be easily integrated into terminal crimping machines, etc.
It becomes.

According to the configuration of the invention according to claim 2,
The required optical path can be easily formed. According to the configuration of the third aspect of the present invention, since the reflecting plate is used, the mounting can be performed even in a narrow space .

According to the configuration of the invention according to claim 4 ,
In a peeling apparatus of a type in which a pair of wires separated by the cutting blade are moved so as to be separated in the longitudinal direction and peeled at the same time, it is possible to simultaneously determine the quality of the peeling of the ends of the pair of wires. it can.

[0015]

BRIEF DESCRIPTION OF THE DRAWINGS FIG. FIG. 1 is an illustrative view showing a configuration of an apparatus for inspecting the end of a wire according to an embodiment of the present invention. Referring to FIG. 1, the inspection apparatus includes first and second optical path forming units A1 and A2, and a control circuit unit 20 electrically connected to both optical path forming units A1 and A2. .

Each of the optical path forming portions A1 and A2 is attached to a block 30 of a cutting and peeling unit 3 of a continuous terminal crimping machine described later. Each optical path forming part A1, A
Reference numeral 2 denotes a structure in which the light emitting device 12 and the light receiving device 13 are attached so as to face each other with a certain interval. The light emitter 12 is formed of a semiconductor laser, and outputs coherent parallel light from the output surface (surface facing the light receiver 13) 12S toward the light receiver 13.

The light receiving surface 13S of the light receiver 13 is
And a slit 14 (see FIG. 2) is formed in the light receiving surface 13S as described later. The ends of the wires W to be inspected are indicated by arrows B1 and B2.
As shown by, the light passes between the light emitter 12 and the light receiver 13 of each of the optical path forming parts A1 and A2 at a substantially constant speed. Since the light emitted from the light emitter 12 is parallel light as described above, there is no divergence of light, and even when the end of the wire to be inspected passes near the light emitter 12, the light receiver 1
Also when passing near 3, the amount of light blocked by the end of the electric wire is constant. In addition, since the irradiation light is received in a state defined by a certain amount and a certain range through the slit 14 provided in the light receiver 13, the amount of light can be accurately detected.

Referring to FIG. 1, light emitting device 12 and light receiving device 13 are connected to control circuit unit 2 by connection cables 15 and 16.
Connected to 0. The control circuit unit 20 houses an electric circuit described later in a case 21. On the front face of the case 21, a power supply switch 22 and a part number display part 23 for displaying a part number to be operated, a CH1 display part 24 for displaying a read value of the first optical path forming part A1 connected to CH1.
a, a CH2 display unit 25a for displaying a read value of the second optical path forming unit A2 connected to CH2, an upper limit display unit 29a for displaying an upper limit tolerance for a reference value, and a lower limit for displaying a lower limit tolerance for a reference value. A display unit 29b, a RUN lamp 26a that is lit during the inspection, a HOLD lamp 26b that is lit when the display of the measured wire diameter is fixed, and HI lamps 24b and 2 that are lit when the inspection product exceeds the upper limit value.
5b, LOW light when inspection product falls below the lower limit
Lamps 24c and 25c, OK lamps 24d and 25d that are turned on when the inspection product is within a normal range, a setting switch 27, a reset switch 28, and the like are provided.

FIG. 2 is a diagram for explaining the shape of the slit 14 provided in the slit 13S of the light receiver 13 and the principle of operation of the light receiver 13. Referring to FIG. 2, a slit 14 is formed in the light receiving surface 13S of the light receiver 13. In this embodiment, the slit 14 has a width of 1 mm and a length of 10 mm.
Is irradiated with laser light from the light emitting unit 12. As the end of the wire W moves in the longitudinal direction, the shade of light blocked by the end of the wire W
Will cross.

The light receiving unit 13 detects a change in the amount of laser light obtained through the slit 14 and extracts the change as an analog output. Then, the result is stored in the control circuit unit 20.
It is used to judge the quality of the peeling process. FIG. 3 is a half-illustrated plan view of a continuous terminal crimping machine in which the apparatus for inspecting the end of a wire according to the present embodiment is installed. In addition, the left and right in the following are the left and right in the figure, and the up and down are the up and down in the figure.

Referring to FIG. 3, in a machine frame 1 of the continuous terminal crimping machine, a covered electric wire W fed from a not-shown electric wire feeding roll is measured along a feed path R extending in the vertical direction of the drawing. A pair of feed rollers 2a,
2b, the cutting and peeling unit 3 having the cutting blade 3a and the peeling blade 3b that perform cutting and covering notch by the opening and closing motion with respect to the covered electric wire W on the feeding path R, and sandwich the feeding path R. It has a pair of terminal crimping devices 4 and 5 arranged on the side of the cutting and stripping unit 3 in a state, and a clamp portion 64 for clamping the electric wire W on the upstream side of the cutting and stripping unit 3 in the feeding direction K. And a moving clamp device 6 for rotating the distal end Wa of the electric wire W in a plane orthogonal to the feed path R and moving it to the terminal crimping device 4, and a feed direction K downstream of the cutting and peeling unit 3. Has a plurality of clamp portions 71 for clamping the rear end portion Wb of the electric wire W, and rotates intermittently in a plane orthogonal to the feed path R to move to the terminal crimping device 5 and a discharge portion (not shown). Index table 7
Are provided. FIG. 3 shows a front end W of the electric wire W.
After the terminal T is crimped to a, a portion to be the rear end of the electric wire W is to be cut by the cutting and peeling unit 3 to perform a coating cut.

The pair of optical path forming units A1 and A2 of the skin peeling inspection apparatus according to the present embodiment sandwich the pair of blocks 30 of the cutting and peeling unit 3 on the upstream side and the downstream side in the feeding direction K. It is arranged in. Referring to FIG.
The peeling unit 3 is configured so that the pair of cutting blades 3a are moved in the feeding direction K.
And a known configuration in which a pair of skinning blades 3b are arranged before and after, and are held by a pair of blocks 30 facing each other in a direction orthogonal to the feeding direction K. 1 and 3
With reference to, after the cutting by the cutting blade 3a and the peeling blade 3b, the separated electric wire W on the upstream side in the feeding direction K is
The wire W on the downstream side in the feeding direction K, which is pulled by the moving clamp device 6 described later on the upstream side in the feeding direction K, is separated from the upstream side and the downstream side in the feeding direction K of the cutting and peeling unit 3. Are pulled to the downstream side in the feeding direction by the feeding rollers 2a and 2b. As a result, the pair of separated electric wires W is pulled up and down in FIG. 1, and accordingly, the stripped covering portion is peeled off.

Referring to FIG. 3, each terminal crimping device 4, 5
A fixed-side anvil 42 is attached to a base 41 fixed to the upper surface of the machine frame 1, and above the anvil 42,
It has a known configuration in which a crimper (not shown) that moves up and down is arranged. In the terminal crimping devices 4 and 5,
While crimping the plurality of connected terminals T one by one to the strip S of the electric wire W, a cut is made between each terminal T and the subsequent connection terminal row.

Referring to FIG. 3, the moving clamp device 6
Are paired along the paper surface direction and the machine frame 1
Column 61 (only one is shown in the figure), a shaft 62 rotatably supported by the column 61, and a base end rotatable with the shaft 62. And an arm 63 mounted so as to be relatively movable in the axial direction.
The clamp 6 fixed to the tip of the arm 63
4 and a clamp portion 64 via a shaft 62 and an arm 63.
A rotating mechanism (not shown) for rotating the lens in a predetermined angle range,
In order to strip the end of the cut wire W,
A longitudinal movement mechanism (not shown) for moving the arm 63 and the clamp portion 64 forward and backward along the feeding path R is provided.

In this continuous terminal crimping machine, the electric wire is cut by the cutting blade 3 from the state shown in FIG. 3, and the moving clamp device 6 and the index table 7 are moved in the front-rear direction to perform peeling. At the time of this stripping operation, the ends of the pair of electric wires W are connected to the cutting and stripping unit 3.
Passes through the first and second optical path forming portions A1 and A2 on the upstream side and the downstream side in the feeding direction K.
The quality of the skinning process is inspected. The ends of the pair of electric wires W correspond to the corresponding optical path forming portions A1,
A2 pass almost simultaneously, but each optical path forming part A at the time of passing
The output data of A1 and A2 are temporarily stored in the memory of the single control circuit unit 20, then read out sequentially, and processed for inspection.

FIG. 4 is a block diagram showing the electrical configuration of the peeling inspection apparatus according to this embodiment. Referring to FIG. 4, the control circuit unit 20 includes a CPU 30 as a control center for controlling the entire control circuit. Also,
A clock 31 for providing a machine clock as an operation clock to the CPU 30, an EPROM 32 storing an operation program including a mode setting and the like, and reference value data for judging pass / fail of the skinning (core wires for each type of electric wire in a normal case) EEPR that stores data on diameter
An OM 33 is provided and connected to the CPU 30. The above-mentioned EEPROM 33 has a backup SR
AM may be used.

Further, a display 35 and an operation switch 36 are connected to the CPU 30 via a display / operation switch control IC 34. The operation switch 36 includes the above-described inspection condition setting switch 27 (see FIG. 1). The display 35 includes a product number display section 23, a channel 1 display section 24a, a channel 2 display section 24b, an upper limit display section 25a, a lower limit display section 25b, and a RUN lamp 26.
a, HOLD lamp 26b, HI lamps 24b, 25
b, LOW lamps 24c and 25c, and OK lamp 2
4d and 25d (see FIG. 1).

Further, a power supply circuit 37 is provided.
30. The light path forming units A1 and A2 are connected to the power supply circuit 37, and power is supplied to the light emitter 12 via the sensor controller 38, respectively. The light emitter 12, ie, the semiconductor laser 12,
The semiconductor laser 1 is powered by power supplied from the power supply circuit 37.
2 outputs a laser beam. This laser light is received by the receiver 1
3 is received. As described above, the change in the amount of received light is extracted as an analog voltage from the light receiver 13 of each of the optical path forming units A1 and A2, and the analog protection circuit 3
9, the signal is input to an A / D converter 30a in the CPU 30, and is converted into a digital signal. Reference numeral 30b denotes a watchdog timer, which is used by the watchdog timer 30b when the software does not operate normally due to noise or the like.
30 is forcibly interrupted, thereby improving the reliability of the operation.

The CPU 30 converts the digital signal into E
By comparing it with the reference value data stored in the EPROM, it is determined whether or not the stripping of the end of the wire has been properly performed, and the result is given to the pass / fail determination circuit 40. When the result of the determination is a pass level, the OK lamps 24d of the channels corresponding to the optical path forming portions A1 and A2 are displayed.
25d is turned on.

When the result of the determination is reject, the reject signal is held so that the terminal crimping device does not operate. Even if the start switch is turned on next time, the reject signal is held. The crimping device is not activated. Therefore, the reset circuit 41 is for resetting the held reset signal. The buzzer 42
This is to emit a warning sound when the inspection fails. The external signal input circuit 43 connects the terminal peeling processing inspection device to the terminal crimping devices 4 and 5 and the like (for example, in a case where the terminal crimping is not performed in the case of peeling failure, etc.), the terminal crimping devices 4 and 5 are used. This is for inputting an operation signal.

Next, with reference to FIGS. 5 and 6, a change in the output signal of the light receiving section 13 during the actual peeling operation will be described. FIG. 6 is a diagram illustrating a change in signal level obtained by extracting a change in the amount of light detected by the light receiver 13 as a voltage value.
Then, the quality of the peeling process is determined based on the change in the voltage signal.

First, FIG. 5 shows the cutting blade 3a and the peeling blade 3
b shows the opened initial state. Next, the blocks 30 of the cutting and peeling unit 3 are brought close to each other, and FIG.
As shown in (2), the electric wire W is cut by the cutting blade 3a and cut by the peeling blade 3b into the covering portion. As a result, the electric wire becomes the electric wire W1 on the upstream side in the feeding direction K.
And the electric wire W2 on the downstream side in the feeding direction K, and the electric wire W1 and the electric wire W2 are pulled to the downstream side and the upstream side in the feeding direction K in a state where the peeling blade 3b is cut. As a result, the covering portion is peeled off as shown in FIG. 5 and the subsequent figures will be described focusing on the electric wire W1.

In the state of FIG. 5 and FIG.
Since the light path L is largely blocked by the covering portion, which is the thick portion, the output voltage VB is at the lowest level in the region P1 shown in FIG. 6 corresponding to FIGS. In the state shown in FIG. 5 where the core C, which is a thin portion of the electric wire W1, passes through the optical path L, an intermediate level output voltage Vd corresponding to the passage of the core is output in a region P2 in FIG. After the wire W1 is completely separated from the optical path L as shown in FIG. 5, the wire W1 is once moved to the terminal crimping device 4 to crimp the terminal T, and then returns to the feed path again as shown in FIG. In the state shown in FIGS. 5 and 5,
Since the electric wire W1 is completely separated from the optical path L and the optical path L is not interrupted, the maximum level output voltage Vcc corresponding to the region P3 in FIG. 6 is obtained.

Next, the electric wire W1 is sent in the transport direction K, as shown in FIGS. FIG. 5 shows a state in which the terminal T passes through the optical path L (corresponding to the area P4 in FIG. 6). Further, since the state in which the terminal T passes through the optical path L can be seen from FIG. 5, it can be determined whether or not the terminal T has been crimped normally. On the other hand, FIG.
(A region P5 in FIG. 6).

In the CPU, when the output voltage Vd corresponding to the passage of the core wire C in the area P2 of FIG. 6 is between the first reference value VH indicating the upper limit and the second reference value VL indicating the lower limit, Inspection is judged to be successful, and when the output voltage Vd is out of the range between the reference values VH and VL, the inspection is judged to have failed. According to this embodiment, since the inspection is performed along with the peeling operation, the inspection can be performed efficiently, and
Since it is not necessary to separately provide a means for relatively moving the electric wire W and the optical path forming portions A1 and A2, the structure can be simplified and the manufacturing cost can be reduced. Also, during the peeling operation,
Since the terminal of the electric wire W in a certain range can be continuously inspected along the longitudinal direction, it is not necessary to change the positions of the optical path forming portions A1 and A2 at all even if the stripping length of the electric wire W is different. Therefore, the applicable range is wide.

Further, since the optical path forming portions A1 and A2 are integrated into the block 30 of the cutting and stripping unit 3 to form a unit, the optical path forming portions A1 and A2 can be incorporated into the terminal crimping device without using a spacer. , The optical path forming portions A1 and A2 can be accurately positioned.
Further, since the light path forming parts A1 and A2 are constituted by the light emitting part 12 and the light receiving part 13 and are directly attached to the block 30, a required light path can be easily formed.

In addition, a pair of optical path forming portions A1, A2 correspond to the terminal crimping machine of the present embodiment in which a pair of electric wires separated by the cutting blade are moved so as to be separated in the longitudinal direction and are simultaneously peeled. Thus, the quality of the stripping process of the ends of the pair of electric wires can be determined at substantially the same time, and the inspection can be performed efficiently. The present invention is not limited to the above embodiment. For example, as shown in FIG. 7, a pair of reflectors R <b> 1 that sequentially reflect light emitted from the light emitting unit 12 and guide the light to the light receiving unit 13. R2
Are attached to the block 30, and these reflectors R1, R2
The optical path forming unit A1 (A2) may be configured by the above. With such reflectors R1 and R2, attachment is possible even in a narrow space.

Further, in the above embodiment, the peeling operation is performed by fixing the peeling blade and moving the electric wire in the longitudinal direction. However, the electric wire is fixed and the peeling blade moves. The present invention can also be applied to a type of peeling apparatus. In this case, the peeling blade and the optical path forming unit move integrally. In addition, various changes can be made within the scope of the present invention.

[0039]

According to the first aspect of the present invention, since the inspection is performed in accordance with the peeling operation, the inspection can be performed efficiently, and the electric wire and the optical path forming means are relatively moved. Need not be provided separately, so that the structure can be simplified and the manufacturing cost can be reduced. In addition, during the stripping operation, a predetermined range of wire ends can be continuously inspected along the longitudinal direction, so that it is not necessary to change the position of the optical path forming means even if the stripped length of the wires is different. Therefore, the applicable range is wide. In addition, electric wires with terminals crimped after peeling
Terminal passes through the optical path and is crimped by the pass / fail judgment means.
Can be determined. In particular, holding the peeling blade
The light path forming means was attached to the block
It is possible to accurately position the optical path forming means with respect to the blade.
it can. Also, treat the whole as an integrated unit
As a result, it can be easily incorporated into a terminal crimping machine or the like.

According to the second aspect of the present invention, a required optical path can be easily formed. According to the third aspect of the present invention, since the reflecting plate is used, the mounting can be performed even in a narrow space .

According to a fourth aspect of the present invention, in the peeling apparatus of the type in which the pair of wires separated by the cutting blade are moved so as to be separated in the longitudinal direction and peeled at the same time, the ends of the pair of wires are removed. The quality of the peeling process can be determined at the same time.

[Brief description of the drawings]

FIG. 1 is an illustrative view showing a configuration of a peeling inspection apparatus according to an embodiment of the present invention;

FIG. 2 is a diagram illustrating a shape of a slit provided on a light receiving surface of the light receiver and an operation principle of the light receiver.

FIG. 3 is an illustrative plan view of a continuous terminal crimping machine provided with the present peeling inspection apparatus.

FIG. 4 is a block diagram showing an electrical configuration of the present peeling inspection apparatus.

FIG. 5 is a plan view of a main part of a cutting and peeling unit sequentially showing cutting and peeling operations.

FIG. 6 is a diagram illustrating a change in signal level obtained by extracting a change in the amount of light detected by the light receiver as a voltage value.

FIG. 7 is a schematic view of a main part of a skin peeling inspection apparatus according to another embodiment of the present invention.

FIG. 8 is an illustrative view showing a state of a peeling process and a terminal crimping process;

FIG. 9 is an illustrative view showing an example in which the skinning process is appropriately performed and an inappropriate example.

FIG. 10 is an illustrative view showing a position of an optical path corresponding to a skinning length in a conventional skinning inspection;

FIG. 11 is an illustrative view showing an example in which it is determined in the conventional skinning inspection that the skinning is properly performed even though the skinning is inappropriate.

FIG. 12 is an illustrative view showing an example in which it is determined in the conventional skinning inspection that the skinning is properly performed, even though the skinning is appropriate.

[Explanation of symbols]

 Reference Signs List 3 cutting and peeling unit 3a cutting blade 3b peeling blade 12 light emitting device 13 light receiving device 30 block A1 first optical path forming section A2 second optical path forming section W electric wire L optical path 20 control circuit section R1, R2 reflector

──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-59-230411 (JP, A) JP-A-59-216044 (JP, A) JP-A-6-225423 (JP, A) JP-A-7-225 63684 (JP, A) JP-A-6-349562 (JP, A) JP-A-6-162839 (JP, A) JP-A-6-132700 (JP, A) (58) Fields investigated (Int. Cl. ⁷ , DB name) G01R 31/02 H02G 1/12 G01N 21/84-21/90 H01B 13/00

Claims (4)

(57) [Claims] An electric wire is coated by moving a pair of skinning blades cut into an electric wire fed in a longitudinal direction along a feed path and the electric wire relative to each other along the longitudinal direction of the electric wire. And a peeling device for peeling off the part
Terminal crimping device arranged on the side of the skin peeling device
In that terminal crimping machine, a stripping processing inspection apparatus which is applied to the skin stripping device, a light emitting unit, a light receiving unit for outputting a signal corresponding to the amount of received light receives light from the light emitting unit, stripping the skin An optical path forming means that is arranged in a state where a positional relationship is maintained at a predetermined interval in the longitudinal direction of the electric wire with respect to the blade, and forms a straight optical path through which a terminal of the electric wire passes during peeling operation, A signal corresponding to the passage of the end of the electric wire from the light receiving unit, comparing the signal with a comparative reference value set in advance, and a pass / fail determination unit that determines pass / fail of the skinning process , the optical path forming unit includes: Block that holds the peeling blade
The terminal is crimped by the above terminal crimping device after peeling.
At the end of the electric wire returned to the feed path,
Through the road, and the terminal crimping
A skin peeling inspection apparatus characterized in that pass / fail is determined . 2. The peeling inspection apparatus according to claim 1, wherein said optical path forming means is a light emitting section and a light receiving section. 3. The peeling inspection apparatus according to claim 1, wherein the optical path forming means is a pair of reflectors for sequentially reflecting the light emitted from the light emitting section and guiding the light to the light receiving section. Peeling inspection equipment. 4. A peeling inspection apparatus according to claim 1, wherein said peeling device sandwiches a cutting blade for cutting an electric wire.
In a pair, at predetermined intervals in the longitudinal direction of the wire.
Having a peeling blade placed thereon and separated by the cutting blade.
Cover the ends of each pair of wires
Pull both wires in the longitudinal direction with the stripping blade cut.
It is possible to perform a peeling operation by moving it apart.
It consists of, the optical path forming means, in response to the passage of each wire end 2
A skin peeling inspection apparatus, wherein a pair is provided .