JP3224124B2 - Evaluation method of liquid crystal display element - Google Patents
Evaluation method of liquid crystal display elementInfo
- Publication number
- JP3224124B2 JP3224124B2 JP27040995A JP27040995A JP3224124B2 JP 3224124 B2 JP3224124 B2 JP 3224124B2 JP 27040995 A JP27040995 A JP 27040995A JP 27040995 A JP27040995 A JP 27040995A JP 3224124 B2 JP3224124 B2 JP 3224124B2
- Authority
- JP
- Japan
- Prior art keywords
- liquid crystal
- crystal display
- display element
- polarizer
- evaluating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Description
【０００１】[0001]
【発明の属する技術分野】本発明は液晶表示素子のセル
ギャップの評価方法に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for evaluating a cell gap of a liquid crystal display device.
【０００２】[0002]
【従来の技術】近年、液晶表示素子の大容量化、高速応
答化、大量生産化へ向けての開発が進んでいる。液晶表
示素子のセルギャップは、液晶の複屈折率の積をとるこ
とでその光学位相差距離を示し、液晶表示素子の特性を
示す指標として広く用いられている。2. Description of the Related Art In recent years, the development of liquid crystal display elements for large capacity, high speed response, and mass production has been promoted. The cell gap of a liquid crystal display element indicates the optical retardation distance by taking the product of the birefringence of liquid crystal, and is widely used as an index indicating the characteristics of the liquid crystal display element.
【０００３】ホモジニアス配向した液晶表示素子におい
て、直交偏光子間に液晶分子長軸方向が偏光方向に４５
°となるように配置した場合、液晶の複屈折をΔｎ、液
晶表示素子のセルギャップをｄ、入射光強度をＩ0 、入
射光波長をλとすると、出射光強度Ｉは下記の（式１）
の相関で表される。（例えば、松本正一，角田市良：液
晶の基礎と応用 第４６頁 発行：株式会社工業調査
会）[0003] 45 in the liquid crystal display element homogeneously aligned, the liquid crystal molecular long axis direction between the Cartesian polarizer polarization direction
°, the birefringence of the liquid crystal is Δn, the cell gap of the liquid crystal display element is d, the incident light intensity is I 0 , and the incident light wavelength is λ. )
It is expressed by the correlation of (For example, Shoichi Matsumoto, Ichiyoshi Kakuda: Fundamentals and Applications of Liquid Crystals, page 46 Published by Industrial Research Institute, Inc.)
【０００４】[0004]
【数３】 (Equation 3)
【０００５】[0005]
【発明が解決しようとする課題】正または負の誘電異方
性を持つ液晶を用いたＳＴＮ型電界効果複屈折モードで
は、基板に垂直な方向に捻れによる光の旋光効果が加わ
り、前記（式１）の関係が成り立たない。In the STN type field effect birefringence mode using liquid crystal having positive or negative dielectric anisotropy, the optical rotation effect by twisting in the direction perpendicular to the substrate is added, and The relationship of 1) does not hold.
【０００６】本発明はＳＴＮ型液晶表示素子のセルの基
板間距離を、簡単かつ再現性良く光学的に測定できる液
晶表示素子の評価方法を提供することを目的とする。SUMMARY OF THE INVENTION An object of the present invention is to provide a method for evaluating a liquid crystal display device which can easily and optically measure the distance between substrates of cells of an STN type liquid crystal display device with good reproducibility.
【０００７】[0007]
【課題を解決するための手段】本発明の液晶表示素子の
評価方法は、一対の基板間に誘電異方性を有する液晶を
狭持してなるＳＴＮ型液晶表示素子を評価するに際し、
各々の基板の配向軸方向と４５°の角度に偏光子を配置
し、これの分光透過特性上のピーク値の極小値からその
液晶表示素子の基板間距離を算出してセルギャップを評
価することを特徴とし、液晶素子の光学距離を複屈折に
よるものと捻れによる光の旋光効果に分けることによっ
てセルギャップを測定する。According to the method for evaluating a liquid crystal display device of the present invention, when evaluating an STN type liquid crystal display device in which a liquid crystal having dielectric anisotropy is held between a pair of substrates,
A polarizer is arranged at an angle of 45 ° with respect to the orientation axis direction of each substrate, and the distance between the substrates of the liquid crystal display element is calculated from the minimum value of the peak value on the spectral transmission characteristics of the polarizer to evaluate the cell gap. The cell gap is measured by dividing the optical distance of the liquid crystal element into that due to birefringence and the optical rotation effect due to twist.
【０００８】[0008]
【発明の実施の形態】以下、本発明の液晶表示素子の評
価方法を具体的な実施の形態に基づいて説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a method for evaluating a liquid crystal display device according to the present invention will be described with reference to specific embodiments.
【０００９】図１は評価すべき液晶表示素子を測定する
検査装置での評価系を示している。ここで、評価すべき
液晶表示素子３は、一対の基板間に正または負の誘電異
方性を有する液晶を狭持してなる液晶パネル（例えば、
ＺＬＩ−２２９３：メルク・ジャパン株式会社製）であ
る。３ａは入射側基板の配向軸角度、３ｂは出射側基板
の配向軸角度を表している。FIG. 1 shows an evaluation system in an inspection apparatus for measuring a liquid crystal display element to be evaluated. Here, the liquid crystal display element 3 to be evaluated is a liquid crystal panel (for example, a liquid crystal panel having a liquid crystal having a positive or negative dielectric anisotropy between a pair of substrates).
ZLI-2293: manufactured by Merck Japan KK). 3a represents the orientation axis angle of the incident side substrate, and 3b represents the orientation axis angle of the exit side substrate.
【００１０】この評価すべき液晶表示素子３に可視光を
入射させて透過光を測定するに際して、評価すべき液晶
表示素子３の入射側に入射側偏光子１が配設され、出射
側に出射側偏光子２が配設されている。When a visible light is made incident on the liquid crystal display element 3 to be evaluated and the transmitted light is measured, an incident side polarizer 1 is disposed on the incident side of the liquid crystal display element 3 to be evaluated, and the light is emitted on the emission side. A side polarizer 2 is provided.
【００１１】入射側偏光子１としては、例えばＮＰＦ−
Ｇ１２２５ＤＵ；日東電工株式会社製を使用し、１ａは
偏光子１の吸収軸角度を表している。出射側偏光子２と
しては、例えば、ＮＰＦ−Ｇ１２２５ＤＵ；日東電工株
式会社製を使用し、２ａは偏光子２の吸収軸角度を表し
ている。As the incident side polarizer 1, for example, NPF-
G1225DU: manufactured by Nitto Denko Corporation, and 1a represents the absorption axis angle of the polarizer 1. As the exit-side polarizer 2, for example, NPF-G1225DU; manufactured by Nitto Denko Corporation is used, and 2a represents the absorption axis angle of the polarizer 2.
【００１２】図１の評価系に示されるように、偏光子１
の吸収軸角度１ａと液晶表示素子３の入射側基板の配向
軸角度３ａとの和が４５°の角度で配置されている。こ
れと同様に、偏光子２の吸収軸角度２ａと液晶表示素子
３の出射側基板の配向軸角度３ｂとの和が４５°の角度
で配置されている。As shown in the evaluation system of FIG.
And the sum of the absorption axis angle 1a and the orientation axis angle 3a of the incident side substrate of the liquid crystal display element 3 are arranged at an angle of 45 °. Similarly, the sum of the absorption axis angle 2a of the polarizer 2 and the orientation axis angle 3b of the emission side substrate of the liquid crystal display element 3 is arranged at an angle of 45 °.
【００１３】この入射側に配置した光源４から可視光を
入射させ、この評価系を通した分光特性を光検出器５で
測定する。なお、光源４としては可視光領域で少なくと
も一様な分光特性を有するものである。[0014] Visible light is made incident from the light source 4 arranged on the incident side, and the spectral characteristics passed through the evaluation system are measured by the photodetector 5. The light source 4 has at least uniform spectral characteristics in the visible light region.
【００１４】この測定の結果、光検出器５では図２に示
されるような特性が得られた。この例では、液晶表示素
子３としてＴＷＩＳＴ２４０°，液晶の複屈折率：Δｎ
＝０．１２０，実際のセルギャップｄ0 ＝７．１０μｍ
の試料を用いた。As a result of this measurement, characteristics as shown in FIG. 2 were obtained in the photodetector 5. In this example, the liquid crystal display element 3 has a TWIST of 240 ° and a liquid crystal birefringence: Δn.
= 0.120, actual cell gap d 0 = 7.10 μm
Was used.
【００１５】図２に示される極値の横軸座標がλb であ
り、この例では“５５０ｎｍ”の値を示している。これ
を下記の（式２）と（式３）に代入して ｄ＝７．０５μｍ という値を得ることができ、これが評価で求められるセ
ルギャップであって、ｄ 0 ＝７．１０μｍ に近い数値
を得ることができ、この方法でセルギャップを評価でき
ることが分かる。The abscissa coordinate of the extremum shown in FIG.b In
In this example, the value is “550 nm”. this
Is substituted into the following (Equation 2) and (Equation 3) to obtain a value of d = 7.05 μm, which is a value obtained by the evaluation.
The gap, d 0 = Numerical value close to 7.10 μm
And the cell gap can be evaluated in this way.
You can see that
【００１６】[0016]
【数４】 (Equation 4)
【００１７】[0017]
【数５】 (Equation 5)
【００１８】ここで（式１），（式２）に導入されるΔ
ｎ1 ，λ1 ，λ2 ，Ａ1 ，Ａ2 は、シミュレーションに
よる補正項である。同様に評価を行ったものを下記（表
１）に示す。Here, Δ introduced in (Equation 1) and (Equation 2)
n 1 , λ 1 , λ 2 , A 1 and A 2 are correction terms obtained by simulation. The results of the same evaluation are shown in the following (Table 1).
【００１９】[0019]
【表１】 [Table 1]
【００２０】これから明らかなように、本発明の液晶表
示素子の評価方法による値ｄは、実際のセルギャップｄ
0 と非常に一致した数値を示しており、非常に有用であ
る。また、パラメータにおいても一致した（表１）に示
されるように、様々な試料において一致した評価が得ら
れており、この点においても有用であると云える。As is apparent from the above, the value d obtained by the evaluation method of the liquid crystal display device of the present invention is equal to the actual cell gap d.
It shows a number that is very consistent with 0 , which is very useful. In addition, as shown in Table 1 where the parameters matched, the same evaluation was obtained in various samples, and it can be said that this is also useful in this respect.
【００２１】[0021]
【発明の効果】以上のように本発明によると、評価する
ＳＴＮ型液晶表示素子の入射側と出射側に第１の偏光
子，第２の偏光子を配置して分光透過特性上のピーク値
を測定して求めた極小値のピーク値からその液晶表示素
子の基板間距離を算出することができるので、液晶表示
素子のセルギャップを容易、かつ再現性良く評価でき
る。As described above, according to the present invention, the first polarizer and the second polarizer are disposed on the entrance side and the exit side of the STN type liquid crystal display element to be evaluated, and the peak value on the spectral transmission characteristic is obtained. Since the distance between the substrates of the liquid crystal display element can be calculated from the peak value of the minimum value obtained by measuring the value, the cell gap of the liquid crystal display element can be evaluated easily and with good reproducibility.
【図１】本発明の液晶表示素子の評価方法の具体的な実
施の形態を示す評価系の構成図である。FIG. 1 is a configuration diagram of an evaluation system showing a specific embodiment of a liquid crystal display element evaluation method of the present invention.
【図２】同実施の形態での測定で得られた分光特性図で
ある。FIG. 2 is a spectral characteristic diagram obtained by measurement in the same embodiment.
１ 入射側偏光子〔第１の偏光子〕 １ａ 偏光子の吸収軸角度 ２ 出射側偏光子〔第２の偏光子〕 ２ａ 偏光子の吸収軸角度 ３ 評価を受ける液晶表示素子 ３ａ 入射側基板の配向軸角度 ３ｂ 出射側基板の配向軸角度 ４ 光源 ５ 光検出器 Reference Signs List 1 incident side polarizer [first polarizer] 1a absorption axis angle of polarizer 2 emission side polarizer [second polarizer] 2a absorption axis angle of polarizer 3 liquid crystal display element to be evaluated 3a incident side substrate Orientation axis angle 3b Orientation axis angle of emission side substrate 4 Light source 5 Photodetector
フロントページの続き (72)発明者 岡田 裕之 大阪府門真市大字門真1006番地 松下電 器産業株式会社内 (56)参考文献 特開 平６−160800（ＪＰ，Ａ) (58)調査した分野(Int.Cl.7，ＤＢ名) G02F 1/13 G02F 1/133 Continuation of the front page (72) Inventor Hiroyuki Okada 1006 Kazuma Kadoma, Kadoma, Osaka Prefecture Inside Matsushita Electric Industrial Co., Ltd. (56) References JP-A-6-160800 (JP, A) .Cl. 7 , DB name) G02F 1/13 G02F 1/133
Claims (1)
を狭持してなるＳＴＮ型液晶表示素子を評価するに際
し、液晶表示素子と光源の間に液晶表示素子の入射側の
基板と配向軸方向と４５°の角度に第１の偏光子を配置
し、液晶表示素子と光検出器の間に液晶表示素子の出射
側の基板と配向軸方向と４５°の角度に第２の偏光子を
配置して分光透過特性上のピーク値を測定し、求めた極
小値のピーク値からその液晶表示素子の基板間距離を算
出する液晶表示素子の評価方法であって、求めた極小値
のピーク値の光の波長を下記式に代入して液晶表示素子
の基板間距離ｄを計算する液晶表示素子の評価方法。 【数１】 【数２】 In evaluating an STN type liquid crystal display device in which liquid crystal having dielectric anisotropy is sandwiched between a pair of substrates, a substrate on an incident side of the liquid crystal display device is interposed between the liquid crystal display device and a light source. A first polarizer is disposed at an angle of 45 ° with respect to the orientation axis direction, and a substrate on the emission side of the liquid crystal display element is disposed between the liquid crystal display element and the photodetector, and a second polarizer is arranged at an angle of 45 ° with the orientation axis direction. A method of evaluating a liquid crystal display element, in which a peak value on a spectral transmission characteristic is measured by arranging elements, and a distance between substrates of the liquid crystal display element is calculated from the peak value of the obtained minimum value.
Substituting the peak wavelength of light into the following equation
Method for evaluating a liquid crystal display element for calculating the distance d between substrates. (Equation 1) (Equation 2)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27040995A JP3224124B2 (en) | 1995-10-19 | 1995-10-19 | Evaluation method of liquid crystal display element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27040995A JP3224124B2 (en) | 1995-10-19 | 1995-10-19 | Evaluation method of liquid crystal display element |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH09113865A JPH09113865A (en) | 1997-05-02 |
| JP3224124B2 true JP3224124B2 (en) | 2001-10-29 |
Family
ID=17485867
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP27040995A Expired - Fee Related JP3224124B2 (en) | 1995-10-19 | 1995-10-19 | Evaluation method of liquid crystal display element |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3224124B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002169135A (en) | 2000-09-07 | 2002-06-14 | Seiko Epson Corp | Cell gap adjusting device, pressure-sealing device and manufacturing method of liquid crystal display device |
-
1995
- 1995-10-19 JP JP27040995A patent/JP3224124B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH09113865A (en) | 1997-05-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6636322B1 (en) | Method and device for measuring cell gap of liquid crystal display using near-IR radiation | |
| US6822737B2 (en) | Pretilt angle measuring method and measuring instrument | |
| JP3023443B2 (en) | Liquid crystal cell parameter detection method | |
| JP3063843B2 (en) | Liquid crystal initial alignment angle measuring method and liquid crystal initial alignment angle measuring device | |
| JP3224124B2 (en) | Evaluation method of liquid crystal display element | |
| KR100258172B1 (en) | Birefringent member cell gap measurement method and instrument | |
| JP3289386B2 (en) | Color liquid crystal display | |
| JP3813800B2 (en) | Liquid crystal cell parameter detector | |
| JP2898298B2 (en) | Liquid crystal layer thickness measuring apparatus and liquid crystal layer thickness measuring method using the liquid crystal layer thickness measuring apparatus | |
| JP3936712B2 (en) | Parameter detection method and detection apparatus for detection object | |
| JP3142805B2 (en) | Liquid crystal cell parameter detection method and apparatus | |
| KR100612986B1 (en) | Birefringence Phase Difference and Cell Spacing Measuring Device of Liquid Crystal Display | |
| JP2002311406A (en) | Apparatus for detecting parameter of liquid crystal panel | |
| JP2778935B2 (en) | Method for measuring azimuthal anchoring energy of nematic liquid crystal device | |
| JP3411433B2 (en) | Liquid crystal cell pretilt angle measuring device | |
| JP2820163B2 (en) | Cell thickness measurement device for liquid crystal cells | |
| JP3108938B2 (en) | Method for measuring tilt angle of liquid crystal molecules | |
| JP3944641B2 (en) | Gap thickness measuring device, gap thickness measuring method, and liquid crystal device manufacturing method | |
| JP3792315B2 (en) | Cell thickness measuring method, cell thickness measuring apparatus, and liquid crystal display manufacturing method | |
| JP2000321546A (en) | Liquid crystal display device, device and method to measure cell thickness of the device, and phase difference plate | |
| JP2003106817A (en) | Method for evaluating liquid crystal display element | |
| KR100949485B1 (en) | Detection equipment of cell gap in lcd and detection method with the same | |
| JPH0518859A (en) | Method for measuring thickness of liquid crystal layer | |
| JP3144125B2 (en) | Method for measuring optical characteristics of liquid crystal cell | |
| JP3282975B2 (en) | Alignment film forming method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20070824 Year of fee payment: 6 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080824 Year of fee payment: 7 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080824 Year of fee payment: 7 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090824 Year of fee payment: 8 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090824 Year of fee payment: 8 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100824 Year of fee payment: 9 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110824 Year of fee payment: 10 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120824 Year of fee payment: 11 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130824 Year of fee payment: 12 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130824 Year of fee payment: 12 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140824 Year of fee payment: 13 |
|
| S533 | Written request for registration of change of name |
Free format text: JAPANESE INTERMEDIATE CODE: R313533 |
|
| R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
| S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313113 |
|
| R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
| LAPS | Cancellation because of no payment of annual fees |