JP3175930U7 - - Google Patents

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Publication number
JP3175930U7
JP3175930U7 JP2012001491U JP2012001491U JP3175930U7 JP 3175930 U7 JP3175930 U7 JP 3175930U7 JP 2012001491 U JP2012001491 U JP 2012001491U JP 2012001491 U JP2012001491 U JP 2012001491U JP 3175930 U7 JP3175930 U7 JP 3175930U7
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JP
Japan
Prior art keywords
product
ray
continuous
packaged product
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2012001491U
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English (en)
Japanese (ja)
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JP3175930U (ja
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Publication date
Application filed filed Critical
Priority to JP2012001491U priority Critical patent/JP3175930U/ja
Priority claimed from JP2012001491U external-priority patent/JP3175930U/ja
Publication of JP3175930U publication Critical patent/JP3175930U/ja
Application granted granted Critical
Publication of JP3175930U7 publication Critical patent/JP3175930U7/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2012001491U 2012-03-16 2012-03-16 Ｘ線検査装置 Expired - Lifetime JP3175930U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012001491U JP3175930U (ja) 2012-03-16 2012-03-16 Ｘ線検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012001491U JP3175930U (ja) 2012-03-16 2012-03-16 Ｘ線検査装置

Publications (2)

Publication Number Publication Date
JP3175930U JP3175930U (ja) 2012-06-07
JP3175930U7 true JP3175930U7 (enExample) 2015-01-29

Family

ID=48002930

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012001491U Expired - Lifetime JP3175930U (ja) 2012-03-16 2012-03-16 Ｘ線検査装置

Country Status (1)

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JP (1) JP3175930U (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2887056B1 (en) 2012-10-17 2018-07-11 System Square Inc. Apparatus for inspecting packaging body
JP6224434B2 (ja) * 2013-09-26 2017-11-01 株式会社イシダ Ｘ線検査装置
US9733384B2 (en) 2013-10-03 2017-08-15 System Square Inc. Package inspection system
JP6318037B2 (ja) * 2014-07-23 2018-04-25 シブヤパッケージングシステム株式会社 包装袋の検査方法および包装袋の検査装置
JP6688582B2 (ja) * 2015-10-02 2020-04-28 大森機械工業株式会社 異物検査装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3943099B2 (ja) * 2003-06-09 2007-07-11 アンリツ産機システム株式会社 Ｘ線検査装置
JP5199633B2 (ja) * 2007-10-02 2013-05-15 アンリツ産機システム株式会社 Ｘ線質量測定装置
JP2011173609A (ja) * 2010-02-24 2011-09-08 Mitsuhashi Seisakusho:Kk 小袋投入装置

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