JP3050224B1 - Resin-sealed semiconductor device and lead terminal partial coating method - Google Patents

Resin-sealed semiconductor device and lead terminal partial coating method

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Publication number
JP3050224B1
JP3050224B1 JP11036959A JP3695999A JP3050224B1 JP 3050224 B1 JP3050224 B1 JP 3050224B1 JP 11036959 A JP11036959 A JP 11036959A JP 3695999 A JP3695999 A JP 3695999A JP 3050224 B1 JP3050224 B1 JP 3050224B1
Authority
JP
Japan
Prior art keywords
resin
insulating
adhesive
semiconductor device
insulating tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP11036959A
Other languages
Japanese (ja)
Other versions
JP2000236047A (en
Inventor
辰也 西村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanken Electric Co Ltd
Original Assignee
Sanken Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanken Electric Co Ltd filed Critical Sanken Electric Co Ltd
Priority to JP11036959A priority Critical patent/JP3050224B1/en
Application granted granted Critical
Publication of JP3050224B1 publication Critical patent/JP3050224B1/en
Publication of JP2000236047A publication Critical patent/JP2000236047A/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Adhesives Or Adhesive Processes (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Abstract

【要約】 【課題】 樹脂封止型半導体装置のリード端子間の絶縁
耐圧を高い水準で向上する。 【解決手段】 樹脂封止体(1)と、樹脂封止体(1)から導
出された複数のリード端子(2〜6)とを備えた樹脂封止型
半導体装置に、リード端子(2〜6)の各々に装着された絶
縁性チューブ(7)と、樹脂封止体(1)と絶縁性チューブ
(7)とを接着する絶縁性接着剤(8)とを設ける。絶縁性接
着剤(8)によって絶縁性チューブ(7)を樹脂封止体(1)に
接着するので、安定且つ確実に絶縁耐圧が改善される。
Abstract: PROBLEM TO BE SOLVED: To improve a withstand voltage between lead terminals of a resin-sealed semiconductor device at a high level. SOLUTION: A resin-sealed semiconductor device including a resin-sealed body (1) and a plurality of lead terminals (2 to 6) derived from the resin-sealed body (1) is provided with lead terminals (2 to 6). 6) Insulated tube (7) attached to each, resin sealed body (1) and insulated tube
And (7) an insulating adhesive (8). Since the insulating tube (7) is bonded to the resin sealing body (1) by the insulating adhesive (8), the withstand voltage is stably and surely improved.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、リード端子間で高
い絶縁耐圧が得られる樹脂封止型半導体装置及びそのリ
ード端子部分被覆法に属する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a resin-sealed semiconductor device having a high withstand voltage between lead terminals and a method of partially covering the lead terminals.

【0002】[0002]

【従来の技術】外囲体としての樹脂封止体から複数のリ
ード端子が導出された半導体装置は公知である。例え
ば、実願昭53−167163号(実開昭55−849
57号公報)は、半導体素子とその外部引出しリードの
一部を合成樹脂で包む樹脂封止半導体装置を示す。この
樹脂封止半導体装置では隣接する外部引出しリード間の
樹脂表面に樹脂による突起を形成して、外部引出しリー
ドが腐食し、金属イオンを多量に含む生成物が生じて
も、金属イオンの拡散及び樹脂表面の絶縁抵抗の劣化を
突起により防止している。
2. Description of the Related Art A semiconductor device in which a plurality of lead terminals are led out of a resin sealing body as an envelope is known. For example, Japanese Utility Model Application No. 53-167163 (Japanese Utility Model Application Laid-Open No. 55-849)
No. 57) discloses a resin-sealed semiconductor device in which a semiconductor element and a part of its external lead are wrapped with a synthetic resin. In this resin-encapsulated semiconductor device, a protrusion made of resin is formed on the resin surface between adjacent external lead leads, and even if the external lead leads are corroded and a product containing a large amount of metal ions is generated, diffusion of metal ions and The protrusion prevents the insulation resistance of the resin surface from deteriorating.

【0003】[0003]

【発明が解決しようとする課題】ところで、隣り合うリ
ード端子間に大きな電圧が印加される電力用半導体装置
では、隣り合うリード端子間の絶縁耐圧を更に十分に確
保する必要がある。リード端子間の絶縁耐圧を高める手
段として、リード端子に絶縁性のチューブを装着するこ
とが考えられるが、単に絶縁性チューブを装着してもチ
ューブと樹脂封止体との間の隙間を通じて放電が発生す
ることがあり、十分な解決には至らない。そこで、本発
明は、隣り合うリード端子間の絶縁耐圧を高い水準で向
上できる樹脂封止型半導体装置及びそのリード端子部分
被覆法を提供することを目的とする。
By the way, in a power semiconductor device in which a large voltage is applied between adjacent lead terminals, it is necessary to further ensure a withstand voltage between the adjacent lead terminals. As a means of increasing the dielectric strength between the lead terminals, it is conceivable to attach an insulating tube to the lead terminal. However, even if the insulating tube is simply attached, discharge occurs through the gap between the tube and the resin sealing body. May occur and may not be sufficient. Accordingly, an object of the present invention is to provide a resin-encapsulated semiconductor device capable of improving the dielectric strength between adjacent lead terminals at a high level and a method of partially covering the lead terminals.

【0004】[0004]

【課題を解決するための手段】本発明による樹脂封止型
半導体装置は、樹脂封止体(1)と、樹脂封止体(1)から導
出された複数のリード端子(2〜6)と、リード端子(2〜6)
の各々に装着された絶縁性チューブ(7)と、樹脂封止体
(1)と絶縁性チューブ(7)とを接着する絶縁性接着剤(8)
とを備えている。絶縁性接着剤(8)によって絶縁性チュ
ーブ(7)を樹脂封止体(1)に接着するので、安定且つ確実
に絶縁耐圧が改善される。また、絶縁性チューブ(7)を
取り付けたリード端子(2〜6)の樹脂封止体(1)側の化学
変化による腐食及び外部との接触による電気的短絡事故
を防止することができる。更に、リード端子(2〜6)に密
着する絶縁性チューブ(7)のリード端子(2〜6)からの脱
落を防止できる。
A resin-encapsulated semiconductor device according to the present invention comprises a resin-encapsulated body (1) and a plurality of lead terminals (2 to 6) derived from the resin-encapsulated body (1). , Lead terminals (2 to 6)
The insulating tube (7) attached to each of the
Insulating adhesive (8) for bonding (1) and insulating tube (7)
And Since the insulating tube (7) is bonded to the resin sealing body (1) by the insulating adhesive (8), the withstand voltage is stably and surely improved. Further, it is possible to prevent corrosion due to a chemical change on the resin sealing body (1) side of the lead terminals (2 to 6) to which the insulating tube (7) is attached and an electrical short circuit accident due to contact with the outside. Further, it is possible to prevent the insulating tube (7) coming into close contact with the lead terminals (2 to 6) from falling off from the lead terminals (2 to 6).

【0005】絶縁性チューブ(7)は塩化ビニル樹脂及び
ポリアミド樹脂から選択された材料により形成される。
絶縁性接着剤(8)は、熱可塑性ポリアミド、アクリル系
接着剤等の熱可塑性接着剤、エポキシ樹脂等の熱硬化性
接着剤、アクリル系感圧接着剤等の感圧接着剤、熱可塑
性樹脂を主体とするホットメルト接着剤、シアノクリレ
ート系接着剤等の嫌気性接着剤より選択された材料によ
り形成される。リード端子(2〜6)の各々は、樹脂封止体
(1)側に形成された幅広部(2a〜6a)と、樹脂封止体(1)か
ら離間した側に形成された一定幅の幅狭部(2b〜6b)と、
幅広部(2a〜6a)と幅狭部(2b〜6b)との間に形成された段
差部(2c〜6c)とを有する。絶縁性チューブ(7)は、リー
ド端子(2〜6)の各幅広部(2a〜6a)の全体及び段差部(2c
〜6c)と、幅狭部(2b〜6b)の幅広部(2a〜6a)側を包囲
し、樹脂封止体(1)に対し接着される。絶縁性接着剤(8)
によって絶縁性チューブ(7)を樹脂封止体(1)に接着する
ので、高い絶縁耐圧が得られる。また、絶縁性チューブ
(7)はリード端子(2〜6)の幅広部(2a〜6a)を完全に被覆
し、更に幅狭部(2b〜6b)まで被覆するので、リード端子
(2〜6)間の沿面距離を効果的に増大し、接着効果と相俟
って、高水準の絶縁耐圧効果が得られる。絶縁性チュー
ブ(7)は熱収縮性樹脂により形成された円筒形状のチュ
ーブからなり、相対的に径が大きく且つリード端子(2〜
6)の幅広部(2a〜6a)を包囲する大径部(7a)と、相対的に
径が小さく且つリード端子(2〜6)の幅狭部(2b〜6b)を包
囲する小径部(7b)と、大径部(7a)と小径部(7b)との間に
形成され且つ段差部(2c〜6c)を包囲する包囲する中間部
(7c)を有する。絶縁性接着剤(8)は、絶縁性チューブ(7)
と樹脂封止体(1)との間に形成される隙間を塞ぐ。絶縁
性チューブ(7)と樹脂封止体(1)との間の隙間を絶縁性接
着剤(8)によって完全に充填するので、高水準の絶縁耐
圧が達成される。
[0005] The insulating tube (7) is formed of a material selected from vinyl chloride resin and polyamide resin.
Insulating adhesives (8) include thermoplastic polyamides, thermoplastic adhesives such as acrylic adhesives, thermosetting adhesives such as epoxy resins, pressure-sensitive adhesives such as acrylic pressure-sensitive adhesives, and thermoplastic resins. It is formed of a material selected from anaerobic adhesives such as hot melt adhesives and cyanoacrylate adhesives mainly composed of Each of the lead terminals (2 to 6) is a resin seal
(1) wide portion formed on the side (2a ~ 6a), and a narrow portion (2b ~ 6b) of a certain width formed on the side separated from the resin sealing body (1),
It has step portions (2c to 6c) formed between the wide portions (2a to 6a) and the narrow portions (2b to 6b). The insulating tube (7) includes the entire wide portions (2a to 6a) of the lead terminals (2 to 6) and the step portions (2c
6c) and the wide portion (2a to 6a) side of the narrow portion (2b to 6b), and is adhered to the resin sealing body (1). Insulating adhesive (8)
Thereby, the insulating tube (7) is adhered to the resin sealing body (1), so that a high withstand voltage can be obtained. Also, insulating tube
(7) completely covers the wide portions (2a to 6a) of the lead terminals (2 to 6) and further covers the narrow portions (2b to 6b).
The creepage distance between (2 to 6) is effectively increased, and a high level of withstand voltage effect is obtained in combination with the bonding effect. The insulating tube (7) is a cylindrical tube formed of a heat-shrinkable resin, and has a relatively large diameter and lead terminals (2 to
The large diameter portion (7a) surrounding the wide portion (2a-6a) of the 6) and the small diameter portion (2b-6b) having a relatively small diameter and surrounding the narrow portion (2b-6b) of the lead terminal (2-6). 7b) and an intermediate portion formed between the large diameter portion (7a) and the small diameter portion (7b) and surrounding the step portion (2c to 6c).
(7c). Insulating adhesive (8), insulating tube (7)
The gap formed between the resin sealing body (1) and the resin sealing body (1) is closed. Since the gap between the insulating tube (7) and the resin sealing body (1) is completely filled with the insulating adhesive (8), a high level of dielectric strength is achieved.

【0006】本発明による樹脂封止型半導体装置のリー
ド端子部分被覆法は、樹脂封止体(1)と、樹脂封止体(1)
から導出された複数のリード端子(2〜6)を備えた樹脂封
止型半導体装置を用意する工程と、樹脂封止体(1)のリ
ード端子(2〜6)の導出部近傍に液状の絶縁性接着剤(8)
を塗布する工程と、絶縁性接着剤(8)が硬化しない状態
で、絶縁性接着剤(8)を塗布したリード端子(2〜6)に絶
縁性チューブ(7)を装着する工程と、絶縁性接着剤(8)を
硬化させて樹脂封止体(1)に絶縁性チューブ(7)を接着す
る工程とを含む。絶縁性接着剤(8)を塗布した後絶縁性
チューブ(7)をリード端子(2〜6)に装着するので、絶縁
性チューブ(7)と樹脂封止体(1)との間の隙間に絶縁性接
着剤(8)を確実に充填することができる。
The method for partially covering lead terminals of a resin-encapsulated semiconductor device according to the present invention comprises a resin encapsulant (1) and a resin encapsulant (1).
A step of preparing a resin-encapsulated semiconductor device having a plurality of lead terminals (2 to 6) derived from a resin-encapsulated semiconductor device; Insulating adhesive (8)
Applying an insulating tube (7) to the lead terminals (2 to 6) coated with the insulating adhesive (8) in a state where the insulating adhesive (8) is not cured; and Curing the conductive adhesive (8) and bonding the insulating tube (7) to the resin sealing body (1). After applying the insulating adhesive (8), the insulating tube (7) is attached to the lead terminals (2 to 6), so the gap between the insulating tube (7) and the resin sealing body (1) is The insulating adhesive (8) can be reliably filled.

【0007】本発明の実施の形態では、絶縁性接着剤
(8)により絶縁性チューブ(7)を樹脂封止体(1)に気密又
は液密に接着する工程、絶縁性チューブ(7)を絶縁性接
着剤(8)の粘性によってリード端子(2〜6)上で樹脂封止
体(1)に仮固着する工程、絶縁性接着剤(8)により絶縁性
チューブ(7)と樹脂封止体(1)との間を気密又は液密に密
閉する工程、絶縁性チューブ(7)と樹脂封止体(1)との間
に形成される隙間を絶縁性接着剤(8)により閉鎖する工
程、絶縁性チューブ(7)をリード端子(2〜6)に装着する
ときの圧力によって、絶縁性チューブ(7)の内側に絶縁
性接着剤(8)の一部を充填する工程又は絶縁性チューブ
(7)及び絶縁性接着剤(8)に熱処理を施して、絶縁性接着
剤(8)を硬化させると同時に、絶縁性チューブ(7)を熱収
縮させる工程を含んでもよい。絶縁性接着剤(8)の硬化
と絶縁性チューブ(7)の熱収縮とを同一の工程で行う
と、良好な生産性が得られる。
In an embodiment of the present invention, an insulating adhesive
(8) the step of bonding the insulating tube (7) to the resin sealing body (1) in an airtight or liquid-tight manner, and the insulating tube (7) is connected to the lead terminals (2 to 6) Step of temporarily fixing to the resin sealing body (1) above, airtight or liquid tight sealing between the insulating tube (7) and the resin sealing body (1) with the insulating adhesive (8) Process, a step of closing a gap formed between the insulating tube (7) and the resin sealing body (1) with the insulating adhesive (8), and connecting the insulating tube (7) to the lead terminals (2 to 6). Depending on the pressure when mounting on the insulating tube, a step of filling a part of the insulating adhesive (8) inside the insulating tube (7) or the insulating tube
The method may include a step of subjecting (7) and the insulating adhesive (8) to heat treatment to harden the insulating adhesive (8) and simultaneously heat-shrink the insulating tube (7). When the curing of the insulating adhesive (8) and the heat shrinkage of the insulating tube (7) are performed in the same step, good productivity can be obtained.

【0008】[0008]

【発明の実施の形態】以下、電力用半導体装置に適用し
た本発明による樹脂封止型半導体装置及び樹脂封止型半
導体装置のリード端子部分被覆法の実施の形態を図1〜
図4について説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of a resin-sealed semiconductor device according to the present invention applied to a power semiconductor device and a method of partially covering lead terminals of the resin-sealed semiconductor device according to the present invention are shown in FIGS.
Referring to FIG.

【0009】図1に示すように、本発明による半導体装
置は、樹脂封止体(1)と、樹脂封止体(1)から導出された
複数のリード端子(2〜6)と、各リード端子(2〜6)に装着
された短い円筒状の絶縁性チューブ(7)と、樹脂封止体
(1)と絶縁性チューブ(7)とを接着する絶縁性接着剤(8)
とを備えている。樹脂封止体(1)は、図示しない支持板
の全面を包囲して又は支持板の下面側を樹脂封止体(1)
から外部に露出させて周知の樹脂モールド方法で形成さ
れる。絶縁性チューブ(7)は例えば塩化ビニル樹脂、ポ
リアミド樹脂を使用することができる。絶縁性接着剤
(8)は、加熱処理、エージング、圧着又は酸化により硬
化する性質を有し、単一成分又は複数成分を混合した2
液性成分を含んでもよい。絶縁性接着剤(8)は例えば、
熱可塑性ポリアミド、アクリル系接着剤等の熱可塑性接
着剤、エポキシ樹脂等の熱硬化性接着剤、アクリル系感
圧接着剤等の感圧接着剤、熱可塑性樹脂を主体とするホ
ットメルト接着剤、シアノクリレート系接着剤等の嫌気
性接着剤を使用することができるが、樹脂封止体(1)に
対する良好な接着性を必要とするので、エポキシ樹脂等
の熱硬化性樹脂又はホットメルト接着剤を使用すること
が望ましい。
As shown in FIG. 1, a semiconductor device according to the present invention comprises a resin sealing body (1), a plurality of lead terminals (2 to 6) derived from the resin sealing body (1), and each lead. A short cylindrical insulating tube (7) attached to the terminals (2 to 6) and a resin seal
Insulating adhesive (8) for bonding (1) and insulating tube (7)
And The resin sealing body (1) surrounds the entire surface of the support plate (not shown) or the resin sealing body (1) on the lower surface side of the support plate.
And is formed by a well-known resin molding method. For the insulating tube (7), for example, a vinyl chloride resin or a polyamide resin can be used. Insulating adhesive
(8) has the property of being cured by heat treatment, aging, pressure bonding, or oxidation, and has a single component or a mixture of a plurality of components.
It may contain a liquid component. Insulating adhesive (8) is, for example,
Thermoplastic polyamides, thermoplastic adhesives such as acrylic adhesives, thermosetting adhesives such as epoxy resins, pressure-sensitive adhesives such as acrylic pressure-sensitive adhesives, hot melt adhesives mainly composed of thermoplastic resins, An anaerobic adhesive such as a cyanoacrylate adhesive can be used, but a good adhesive property to the resin sealing body (1) is required, so that a thermosetting resin such as an epoxy resin or a hot melt adhesive is used. It is desirable to use agents.

【0010】リード端子(2〜6)は、樹脂封止体(1)の一
方の端部から互いに並行に導出され、図示しないプリン
ト基板のスルーホールのインチピッチに適合させて導出
方向に対し直角な方向に一定間隔離間して配置される。
複数のリード端子(2〜6)の各々は、樹脂封止体(1)側に
形成された幅広部(2a〜6a)と、樹脂封止体(1)から離間
した側に一定幅で形成された幅狭部(2b〜6b)と、幅広部
(2a〜6a)と幅狭部(2b〜6b)との間にテーパ状に形成され
た段差部(2c〜6c)とを有する。絶縁性チューブ(7)は、
各リード端子(2〜6)の幅広部(2a〜6a)の全体及び段差部
(2c〜6c)と、幅狭部(2b〜6b)の幅広部(2a〜6a)側を包囲
し、樹脂封止体(1)に対し気密又は液密に接着される。
The lead terminals (2 to 6) are led out from one end of the resin sealing body (1) in parallel with each other, and are perpendicular to the lead-out direction in conformity with the inch pitch of a through hole of a printed board (not shown). It is arranged in a certain direction with a certain distance.
Each of the plurality of lead terminals (2 to 6) is formed with a wide portion (2a to 6a) formed on the resin sealing body (1) side and a fixed width on a side separated from the resin sealing body (1). Narrow part (2b-6b) and wide part
(2a to 6c) and a stepped portion (2c to 6c) formed in a tapered shape between the narrow portion (2b to 6b). The insulating tube (7)
The entire wide part (2a to 6a) of each lead terminal (2 to 6) and the step
(2c to 6c) and the wide portion (2a to 6a) side of the narrow portion (2b to 6b) are adhered to the resin sealing body (1) in an airtight or liquid tight manner.

【0011】絶縁性チューブ(7)は円筒形状の熱収縮性
のチューブからなり、図示のように相対的に径が大きく
且つリード端子(2〜6)の幅広部(2a〜6a)を包囲する大径
部(7a)と、相対的に径が小さく且つリード端子(2〜6)の
幅狭部(2b〜6b)を包囲する小径部(7b)と、大径部(7a)と
小径部(7b)との間に形成され且つ段差部(2c〜6c)を包囲
する包囲する中間部(7c)を有する。絶縁性接着剤(8)
は、樹脂封止体(1)のリード端子(2〜6)の導出部分近傍
に設けられ、絶縁性チューブ(7)と樹脂封止体(1)とを接
着するとともに、絶縁性チューブ(7)と樹脂封止体(1)と
の間に形成される隙間を塞ぐ。
The insulating tube (7) is a cylindrical heat-shrinkable tube, and has a relatively large diameter and surrounds the wide portions (2a to 6a) of the lead terminals (2 to 6) as shown in the figure. The large diameter portion (7a), the small diameter portion (7b) having a relatively small diameter and surrounding the narrow portion (2b-6b) of the lead terminal (2-6), the large diameter portion (7a) and the small diameter portion (7b) and an intermediate portion (7c) surrounding the step portions (2c to 6c). Insulating adhesive (8)
Are provided near the lead-out portions of the lead terminals (2 to 6) of the resin sealing body (1), and adhere the insulating tube (7) and the resin sealing body (1), as well as the insulating tube (7). ) And the resin sealing body (1).

【0012】図1に示す絶縁性チューブ(7)をリード端
子(2〜6)に装着する際に、図2に示すように、樹脂封止
体(1)と、樹脂封止体(1)から導出された複数のリード端
子(2〜6)を備えた半導体装置を用意する。次に、図3に
示すように、スポイト形状の塗布器、シリンジ等の供給
細管を使用して樹脂封止体(1)のリード端子(2〜6)の導
出部近傍でループ状に液状の絶縁性接着剤(8)を塗布す
る。塗布工程は、供給細管を使用するので、容易に行う
ことができる。
When attaching the insulating tube (7) shown in FIG. 1 to the lead terminals (2 to 6), as shown in FIG. 2, the resin sealing body (1) and the resin sealing body (1) A semiconductor device having a plurality of lead terminals (2 to 6) derived from is prepared. Next, as shown in FIG. 3, using a supply thin tube such as a syringe-shaped applicator or a syringe, a liquid-like liquid is formed in a loop shape in the vicinity of the lead-out portion of the lead terminal (2 to 6) of the resin sealing body (1). Apply an insulating adhesive (8). Since the application step uses the supply thin tube, it can be easily performed.

【0013】次に、図4に示すように、絶縁性接着剤
(8)が硬化しない状態で、絶縁性接着剤(8)を塗布したリ
ード端子(2〜6)に絶縁性チューブ(7)を装着すると、各
幅広部(2a〜6a)の導出部の周囲の樹脂封止体(1)に塗布
された絶縁性接着剤(8)の粘性によってリード端子(2〜
6)上に装着された円筒状の絶縁性チューブ(7)の環状端
部は全周に沿って樹脂封止体(1)に仮固着される。この
とき、絶縁性接着剤(8)は絶縁性チューブ(7)の環状端部
の全周と樹脂封止体(1)との間を気密又は液密に密閉す
るため、絶縁性チューブ(7)と樹脂封止体(1)との間に形
成される隙間は完全に閉鎖される。絶縁性チューブ(7)
をリード端子(2〜6)に装着するときの圧力によって、絶
縁性チューブ(7)の内側に絶縁性接着剤(8)の一部が充填
されてもよい。絶縁性チューブ(7)をリード端子(2〜6)
に装着したとき、図4に示すように、絶縁性チューブ
(7)は、リード端子(2〜6)の幅広部(2a〜6a)の全体と幅
狭部(2b〜6b)の幅広側を包囲して、一端から他端まで一
様の直径で環状断面を有する。環状断面の直径は、図1
に示す絶縁性チューブ(7)の樹脂封止体(1)側の直径より
若干大きい。
Next, as shown in FIG.
When the insulating tube (7) is attached to the lead terminals (2 to 6) coated with the insulating adhesive (8) in a state where (8) is not cured, the area around the lead-out part of each wide part (2a to 6a) Lead terminals (2 to 4) depending on the viscosity of the insulating adhesive (8) applied to the resin sealing body (1).
6) The annular end of the cylindrical insulating tube (7) mounted thereon is temporarily fixed to the resin sealing body (1) along the entire circumference. At this time, the insulating adhesive (8) air-tightly or liquid-tightly seals between the entire periphery of the annular end of the insulating tube (7) and the resin sealing body (1). ) And the resin seal (1) are completely closed. Insulating tube (7)
The inside of the insulating tube (7) may be filled with a part of the insulating adhesive (8) by the pressure at the time of mounting on the lead terminals (2 to 6). Insulating tube (7) with lead terminals (2-6)
When attached to the tube, as shown in FIG.
(7) surrounds the entire wide portion (2a to 6a) of the lead terminals (2 to 6) and the wide side of the narrow portion (2b to 6b), and has an annular shape with a uniform diameter from one end to the other end. Has a cross section. Fig. 1
Is slightly larger than the diameter of the insulating tube (7) on the resin sealing body (1) side shown in FIG.

【0014】次に、絶縁性チューブ(7)及び絶縁性接着
剤(8)に熱処理を施して、絶縁性接着剤(8)を硬化させる
と同時に、絶縁性チューブ(7)を熱収縮させて絶縁性チ
ューブ(7)に段差部(7a)を形成する。これにより、樹脂
封止体(1)とチューブ(7)とが固着されるとともに、収縮
したチューブ(7)は大径部(7a)と小径部(7b)が形成され
てリード端子(2〜6)に密着し、図1に示すように、絶縁
性チューブ(7)をリード端子(2〜6)に気密又は液密に取
り付けることができる。
Next, the insulating tube (7) and the insulating adhesive (8) are subjected to a heat treatment to harden the insulating adhesive (8) and, at the same time, to thermally shrink the insulating tube (7). A step (7a) is formed in the insulating tube (7). Thereby, the resin sealing body (1) and the tube (7) are fixed, and the contracted tube (7) is formed with the large-diameter portion (7a) and the small-diameter portion (7b), and the lead terminals (2 to 7) are formed. 6), and the insulating tube (7) can be air-tightly or liquid-tightly attached to the lead terminals (2 to 6) as shown in FIG.

【0015】本実施の形態では、以下の効果が得られ
る。 [1] 絶縁性接着剤(8)によって絶縁性チューブ(7)を樹
脂封止体(1)に接着するので、リード端子(2〜6)間で安
定且つ確実に絶縁耐圧が改善される。 [2] 絶縁性接着剤(8)によって絶縁性チューブ(7)の環
状端部を全周に沿って樹脂封止体(1)に気密又は液密に
接着するので、高い絶縁耐圧が得られる。 [3] 絶縁性チューブ(7)の樹脂封止体(1)との間の隙間
を絶縁性接着剤(8)によって完全に充填するので、高水
準の絶縁耐圧が達成される。 [4] 絶縁性チューブ(7)はリード端子(2〜6)の幅広部
(2a〜6a)を完全に被覆し、更に幅狭部(2b〜6b)まで被覆
するので、リード端子(2〜6)の幅広部(2a〜6a)間の沿面
距離を効果的に増大し、上記[1]及び[2]の効果と相俟
って、高水準の絶縁耐圧効果が得られる。 [5] リード端子(2〜6)に密着する絶縁性チューブ(7)
のリード端子(2〜6)からの脱落を防止できる。 [6] 絶縁性接着剤(8)を塗布した後絶縁性チューブ(7)
をリード端子(2〜6)に装着するので、絶縁性チューブ
(7)と樹脂封止体(1)との間の隙間に絶縁性接着剤(8)を
確実に充填することができる。 [7] 絶縁性接着剤(8)の硬化と絶縁性チューブ(7)の熱
収縮とを同一の工程で行うので、生産性に優れる。 [8] 絶縁性チューブ(7)を取り付けたリード端子(2〜
6)の樹脂封止体(1)側の化学変化による腐食及び外部と
の接触による電気的短絡事故を防止することができる。
In this embodiment, the following effects can be obtained. [1] Since the insulating tube (7) is bonded to the resin sealing body (1) by the insulating adhesive (8), the withstand voltage between the lead terminals (2 to 6) is stably and surely improved. [2] Since the insulating adhesive (8) adheres the annular end of the insulating tube (7) to the resin sealing body (1) in an air-tight or liquid-tight manner along the entire circumference, a high dielectric strength is obtained. . [3] Since the gap between the insulating tube (7) and the resin sealing body (1) is completely filled with the insulating adhesive (8), a high level of dielectric strength is achieved. [4] The insulating tube (7) is the wide part of the lead terminals (2 to 6)
(2a to 6a) is completely covered, and further to the narrow portion (2b to 6b), effectively increasing the creepage distance between the wide portions (2a to 6a) of the lead terminals (2 to 6). A high level of withstand voltage effect can be obtained in combination with the effects of [1] and [2]. [5] Insulating tube (7) closely attached to lead terminals (2 to 6)
From the lead terminals (2 to 6) can be prevented. [6] Insulating tube (7) after applying insulating adhesive (8)
Is attached to the lead terminals (2 to 6).
The gap between (7) and the resin sealing body (1) can be reliably filled with the insulating adhesive (8). [7] Since the curing of the insulating adhesive (8) and the heat shrinkage of the insulating tube (7) are performed in the same step, the productivity is excellent. [8] Lead terminal (2 ~
6) It is possible to prevent corrosion due to chemical change on the resin sealing body (1) side and electrical short circuit accident due to contact with the outside.

【0016】本発明の前記実施の形態は変更が可能であ
る。例えば、絶縁性接着剤(8)を加熱せずに、数秒〜数
分の所定時間放置して硬化させたり、絶縁性チューブ
(7)を絶縁性接着剤(8)に押しつけて硬化させてもよい。
The above embodiment of the present invention can be modified. For example, without heating the insulating adhesive (8), leaving it for a predetermined time period of several seconds to several minutes,
(7) may be pressed against the insulating adhesive (8) to be cured.

【0017】[0017]

【発明の効果】前記のように、本発明はリード端子間の
高い絶縁耐圧が得られるので、樹脂封止型半導体装置の
故障を回避し、信頼性が向上すると共に、樹脂封止型半
導体装置の寿命を延長することができる。
As described above, according to the present invention, a high withstand voltage between the lead terminals can be obtained, so that the failure of the resin-encapsulated semiconductor device is avoided, the reliability is improved, and the resin-encapsulated semiconductor device is improved. Life can be extended.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明による樹脂封止型半導体装置の平面図FIG. 1 is a plan view of a resin-sealed semiconductor device according to the present invention.

【図2】 絶縁性チューブを装着する前の樹脂封止型半
導体装置の平面図
FIG. 2 is a plan view of the resin-encapsulated semiconductor device before the insulating tube is mounted.

【図3】 絶縁性接着剤を塗布した状態を示す樹脂封止
型半導体装置の平面図
FIG. 3 is a plan view of the resin-encapsulated semiconductor device in a state where an insulating adhesive is applied.

【図4】 絶縁性チューブを装着した加熱前の樹脂封止
型半導体装置を示す平面図
FIG. 4 is a plan view showing a resin-encapsulated semiconductor device before heating with an insulating tube attached.

【符号の説明】[Explanation of symbols]

(1)・・樹脂封止体、 (2〜6)・・リード端子、 (2a〜
6a)・・幅広部、 (2b〜6b)・・幅狭部、 (2c〜6c)・
・段差部、 (7)・・絶縁性チューブ、 (7a)・・大径
部、 (7b)・・小径部、 (7c)・・中間部、 (8)・・
絶縁性接着剤、
(1) ・ ・ Resin sealed body, (2-6) ・ ・ Lead terminal, (2a〜
6a) ・ ・ Wide part, (2b〜6b) ・ ・ Narrow part, (2c〜6c) ・
・ Stepped part, (7) ・ ・ Insulated tube, (7a) ・ ・ Large diameter part, (7b) ・ ・ Small diameter part, (7c) ・ ・ Intermediate part, (8) ・ ・
Insulating adhesive,

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) H01L 23/28 H01L 23/50 ──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. 7 , DB name) H01L 23/28 H01L 23/50

Claims (13)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 樹脂封止体と、該樹脂封止体から導出さ
れた複数のリード端子とを備えた樹脂封止型半導体装置
において、 前記リード端子の各々に装着された絶縁性チューブと、
前記樹脂封止体と絶縁性チューブとを接着する絶縁性接
着剤とを備えたことを特徴とする樹脂封止型半導体装
置。
1. A resin-sealed semiconductor device comprising: a resin-sealed body; and a plurality of lead terminals led out of the resin-sealed body, wherein: an insulating tube mounted on each of the lead terminals;
A resin-sealed semiconductor device comprising an insulating adhesive for bonding the resin-sealed body and an insulating tube.
【請求項2】 前記絶縁性チューブは塩化ビニル樹脂及
びポリアミド樹脂から選択された材料により形成される
請求項1に記載の樹脂封止型半導体装置。
2. The resin-sealed semiconductor device according to claim 1, wherein said insulating tube is formed of a material selected from a vinyl chloride resin and a polyamide resin.
【請求項3】 前記絶縁性接着剤は、熱可塑性ポリアミ
ド、アクリル系接着剤等の熱可塑性接着剤、エポキシ樹
脂等の熱硬化性接着剤、アクリル系感圧接着剤等の感圧
接着剤、熱可塑性樹脂を主体とするホットメルト接着
剤、シアノクリレート系接着剤等の嫌気性接着剤より選
択された材料により形成される請求項1に記載の樹脂封
止型半導体装置。
3. The insulating adhesive includes a thermoplastic polyamide, a thermoplastic adhesive such as an acrylic adhesive, a thermosetting adhesive such as an epoxy resin, a pressure-sensitive adhesive such as an acrylic pressure-sensitive adhesive, The resin-encapsulated semiconductor device according to claim 1, wherein the resin-encapsulated semiconductor device is formed of a material selected from an anaerobic adhesive such as a hot melt adhesive mainly composed of a thermoplastic resin and a cyanoacrylate adhesive.
【請求項4】 前記リード端子の各々は、前記樹脂封止
体側に形成された幅広部と、前記樹脂封止体から離間し
た側に形成された一定幅の幅狭部と、幅広部と幅狭部と
の間に形成された段差部とを有し、 前記絶縁性チューブは、前記リード端子の各幅広部の全
体及び段差部と、前記幅狭部の幅広部側を包囲し、前記
樹脂封止体に対し接着される請求項1〜3のいずれか1
項に記載の樹脂封止型半導体装置。
4. Each of the lead terminals has a wide portion formed on the resin sealing body side, a narrow portion having a constant width formed on a side separated from the resin sealing body, and a wide portion and a width. A step portion formed between the narrow portion and the narrow portion; the insulating tube surrounds the entire wide portion and the step portion of each of the lead terminals, and surrounds the wide portion side of the narrow portion; 4. Any one of claims 1 to 3, which is adhered to a sealing body.
Item 13. A resin-sealed semiconductor device according to item 9.
【請求項5】 前記絶縁性チューブは熱収縮性樹脂によ
り形成された円筒形状のチューブからなり、相対的に径
が大きく且つリード端子の幅広部を包囲する大径部と、
相対的に径が小さく且つリード端子の幅狭部を包囲する
小径部と、前記大径部と小径部との間に形成され且つ段
差部を包囲する包囲する中間部を有する請求項1〜4の
いずれか1項に記載の樹脂封止型半導体装置。
5. An insulating tube comprising a cylindrical tube formed of a heat-shrinkable resin, having a relatively large diameter and surrounding a wide portion of a lead terminal;
5. A small diameter portion having a relatively small diameter and surrounding the narrow portion of the lead terminal, and an intermediate portion formed between the large diameter portion and the small diameter portion and surrounding the step portion. The resin-encapsulated semiconductor device according to any one of the above.
【請求項6】 前記絶縁性接着剤は、前記絶縁性チュー
ブと樹脂封止体との間に形成される隙間を塞ぐ請求項1
〜5のいずれか1項に記載の樹脂封止型半導体装置。
6. The insulating adhesive closes a gap formed between the insulating tube and the resin sealing body.
6. The resin-encapsulated semiconductor device according to any one of Items 5 to 5.
【請求項7】 樹脂封止体と、樹脂封止体から導出され
た複数のリード端子を備えた樹脂封止型半導体装置を用
意する工程と、 前記樹脂封止体のリード端子の導出部近傍に液状の絶縁
性接着剤を塗布する工程と、 前記絶縁性接着剤が硬化しない状態で、前記絶縁性接着
剤を塗布した前記リード端子に絶縁性チューブを装着す
る工程と、 前記絶縁性接着剤を硬化させて前記樹脂封止体に前記絶
縁性チューブを接着する工程とを含むことを特徴とする
樹脂封止型半導体装置のリード端子部分被覆法。
7. A step of preparing a resin-encapsulated semiconductor device having a resin-encapsulated body and a plurality of lead terminals derived from the resin-encapsulated body; Applying a liquid insulating adhesive to the lead terminal; attaching the insulating tube to the lead terminal to which the insulating adhesive is applied in a state where the insulating adhesive is not cured; Curing the resin tube and bonding the insulating tube to the resin sealing body.
【請求項8】 前記絶縁性接着剤により前記絶縁性チュ
ーブを前記樹脂封止体に気密又は液密に接着する工程を
含む請求項7に記載の樹脂封止型半導体装置のリード端
子部分被覆法。
8. The method according to claim 7, further comprising the step of air-tightly or liquid-tightly bonding the insulating tube to the resin sealing body with the insulating adhesive. .
【請求項9】 前記絶縁性チューブを前記絶縁性接着剤
の粘性によって前記リード端子上で前記樹脂封止体に仮
固着する工程を含む請求項7又は8に記載の樹脂封止型
半導体装置のリード端子部分被覆法。
9. The resin-encapsulated semiconductor device according to claim 7, further comprising a step of temporarily fixing the insulative tube to the resin encapsulant on the lead terminal by the viscosity of the insulative adhesive. Lead terminal partial coating method.
【請求項10】 前記絶縁性接着剤により前記絶縁性チ
ューブと前記樹脂封止体との間を気密又は液密に密閉す
る工程を含む請求項7〜9のいずれか1項に記載の樹脂
封止型半導体装置のリード端子部分被覆法。
10. The resin sealing according to claim 7, further comprising a step of air-tightly or liquid-tightly sealing between the insulating tube and the resin sealing body with the insulating adhesive. Partial coating method for lead terminals of fixed semiconductor devices.
【請求項11】 前記絶縁性チューブと前記樹脂封止体
との間に形成される隙間を前記絶縁性接着剤により閉鎖
する工程を含む請求項7〜10のいずれか1項に記載の
樹脂封止型半導体装置のリード端子部分被覆法。
11. The resin sealing according to claim 7, further comprising a step of closing a gap formed between the insulating tube and the resin sealing body with the insulating adhesive. Partial coating method for lead terminals of fixed semiconductor devices.
【請求項12】 前記絶縁性チューブを前記リード端子
に装着するときの圧力によって、前記絶縁性チューブの
内側に絶縁性接着剤の一部を充填する工程を含む請求項
7〜11のいずれか1項に記載の樹脂封止型半導体装置
のリード端子部分被覆法。
12. The method according to claim 7, further comprising a step of filling a part of the insulating adhesive inside the insulating tube by a pressure when the insulating tube is mounted on the lead terminal. Item 14. The method for partially covering lead terminals of a resin-encapsulated semiconductor device according to item 9.
【請求項13】 前記絶縁性チューブ及び絶縁性接着剤
に熱処理を施して、前記絶縁性接着剤を硬化させると同
時に、前記絶縁性チューブを熱収縮させる工程を含む請
求項7〜12のいずれか1項に記載の樹脂封止型半導体
装置のリード端子部分被覆法。
13. The method according to claim 7, further comprising a step of subjecting the insulating tube and the insulating adhesive to a heat treatment to cure the insulating adhesive and simultaneously heat-shrink the insulating tube. 2. The method for partially covering lead terminals of a resin-sealed semiconductor device according to claim 1.
JP11036959A 1999-02-16 1999-02-16 Resin-sealed semiconductor device and lead terminal partial coating method Expired - Fee Related JP3050224B1 (en)

Priority Applications (1)

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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
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Publication Number Publication Date
JP3050224B1 true JP3050224B1 (en) 2000-06-12
JP2000236047A JP2000236047A (en) 2000-08-29

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