JP2901784B2 - How to create debug specifications and test program creation specifications - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for preparing a debug specification used when performing a debugging operation and a test program preparing specification used when performing a test program in an electronic circuit measuring apparatus.

[0002]

2. Description of the Related Art FIG. 3 shows a configuration of a general electronic circuit measuring device. A circuit under test 4 such as a semiconductor integrated circuit is set in a peripheral circuit for measurement 5. The electronic circuit measuring device 1 has a plurality of power supplies R1 to R4.
4 are connected to pins P1 to P4 of the circuit under test 4 via switches SW1 to SW4 provided in the peripheral circuit 5, respectively. The peripheral circuit 5 is provided with a switch SWa connected between the pin P2 of the circuit under test 4 and the ground. The electronic circuit measuring device 1 further includes a peripheral circuit control unit 2 for controlling on / off of the switches SW1 to SW4 and SWa of the peripheral circuit 5, and a tester controller for controlling the peripheral circuit control unit 2 and the power supplies R1 to R4 by a program. 3 are provided. The peripheral circuit 5 is added to the periphery of the circuit under test 4 when the electronic circuit measuring device 1 is not capable of realizing the measurement specifications, or when it is possible, it is inconvenient for measurement. is there.

A circuit under test 4 using such a measuring device
Is determined based on, for example, a measurement specification shown in Table 1 below.

[Table 1] Alternatively, the measurement is performed according to a test program obtained by converting the measurement specifications in Table 1 into a program. In Table 1, for example, leak current 1 and leak current 2 of measurement numbers 1 and 2
Test programs TEST1 and TE corresponding to the measurement of
ST2 is shown below.

[0004] TEST1: Leakage current 1 SET SW1 = ON, SW3 = ON SET PIN1 = 0.4V, MEAS. MODE = I SET PIN3 = 0V MEAS PIN1 JUDGE LO 1μA, HI 3μA TEST2: Leakage current 2 SET SW2 = ON, SW1 = OFF SET PIN1 = OFF SET PIN2 = 0.4V, MEAS. MODE = I MEAS PIN2 JUDGE LO 2μA, HI 4μA

[0005] These test programs include a series of sequence controls executable by the tester controller 3 of the electronic circuit measuring device 1. On the basis of these test programs, the switches SW1 to SW4 and SWa of the peripheral circuit 5 are turned on / off by the peripheral circuit control unit 2 of the electronic circuit measuring device 1, and electric signals are supplied from the power sources R1 to R4 to the circuit under test 4. Then, the output signal from the circuit under test 4 is measured to determine the quality.

[0006]

Prior to the actual execution of the measurement, debugging for confirming whether the measurement conditions set by the test program satisfy the measurement conditions indicated in the measurement specification. Work is required. In this debugging work, a waveform observing device such as an oscilloscope was connected to each of the pins P1 to P4 of the circuit under test 4 to confirm the electrical state of each of the pins P1 to P4. For example, in the measurement of the leak current 1 of TEST1, 0.4V is applied to the pin P1 of the circuit 4 to be measured.
A voltage of 0 V is applied to the pin P3 and the switch SW
1 and SW3 are confirmed to be in the ON state. In the measurement of the leak current 2 of the next test item TEST2, a voltage of 0.4 V is applied to the pin P2 of the circuit under test 4 and a voltage of 0 V is applied to the pin P3, and the switches SW2 and SW3 are turned on. It is confirmed that. Hereinafter, debugging operations are performed sequentially in the same manner.

As described above, in the conventional debugging method, the setting conditions are checked each time in a continuous measurement item, and there is a problem that a large amount of time and labor is required for the debugging work. In addition, when the measurement is executed after disconnecting the power supply or the like used in the previous stage, there is a possibility that an error may occur that the measurement is performed as it is without forgetting to disconnect the power supply or the like. The present invention has been made in order to solve such a problem, and an object of the present invention is to provide a method of creating a debug specification that can efficiently perform an accurate debugging operation. It is another object of the present invention to provide a method for creating a test program creation specification that enables efficient creation of a test program with a high execution speed.

[0008]

According to the present invention, there is provided a method for preparing a debug specification, comprising the steps of: setting a measurement condition, a standard value, and a setting condition of a terminal of a circuit to be measured and a peripheral circuit for each of a plurality of measurement items; Reads the specifications or the test program that controls the measuring device that measures the circuit under test, extracts the setting conditions for each of the multiple measurement items from the read measurement specifications or test program, and reads the circuit under test required for debugging. Is extracted as a confirmation terminal, and the setting conditions of this confirmation terminal are extracted as confirmation conditions, and the confirmation terminal and the confirmation condition in each extracted measurement item are the confirmation terminals in the immediately preceding measurement item that is the previous stage. If the confirmation condition has changed, the changed confirmation terminal and confirmation condition are extracted as change conditions, and the confirmation terminal and confirmation condition are extracted. There extracts a change timing at the time of change, all changes conditions is extracted and the change timing together with the measurement item is a method of outputting a debug specifications are summarized in table.

A method of preparing a test program preparation specification according to the present invention is a measurement specification which indicates measurement conditions, standard values, and setting conditions of terminals of a circuit to be measured and peripheral circuits for each of a plurality of measurement items. From the read measurement specifications, extract the setting conditions for each of the multiple measurement items, extract all the terminals of the circuit under test as confirmation terminals, and extract and extract the setting conditions of the confirmation terminals as confirmation conditions. If the confirmation terminals and confirmation conditions for each measurement item that have been changed have changed from the confirmation terminals and confirmation conditions for the immediately preceding measurement item that is the previous stage, the changed confirmation terminals and confirmation conditions are extracted as change conditions. , The change timing when the check terminal and the check condition change are extracted, and the measurement condition and standard The added are summarized in table together with the measurement item, is a method to output it as a test program to create specifications.

[0010]

In the method for creating a debug specification according to the present invention, terminals of a circuit under test and setting conditions required for debugging are extracted from a measurement specification or a test program as check terminals and check conditions. Debug specifications are created by extracting the changing points of the conditions and compiling them in a list together with the measurement items. Further, in the method for preparing a test program preparation specification of the present invention, all terminals of the circuit under test and their setting conditions are extracted from the measurement specification as confirmation terminals and confirmation conditions, and the changing points of these confirmation terminals and confirmation conditions are extracted. Then, a test program creation specification is created by adding a measurement condition and a standard value and compiling it in a list together with measurement items.

[0011]

Embodiments of the present invention will be described below with reference to the accompanying drawings. FIG. 1 is a flowchart illustrating a method for creating a debug specification according to an embodiment. First, step 1
In step 1, a measurement specification as shown in Table 1 is read into a debug specification creation tool such as a computer. Next, setting conditions are extracted from the contents of the read measurement specification, and a terminal necessary for debugging is extracted as a confirmation terminal in step 12, and a setting condition of this confirmation terminal is extracted as a confirmation condition in step 13. In step 14, it is determined whether the confirmation terminal and the confirmation condition of each measurement item extracted in this way have changed from the confirmation terminal and the confirmation condition of the immediately preceding measurement item which is the preceding stage. If it is determined in step 14 that the confirmation terminal and the confirmation condition have changed from the previous stage, the process proceeds to step 15 and the changed confirmation terminal and confirmation condition are extracted as the change condition.
Further, after extracting the measurement item at this time as a change timing in step 16, the process proceeds to the next measurement item in step 17. If the result of determination in step 14 is that the confirmation terminal and the confirmation conditions have not changed, the process proceeds from step 14 to step 17. The above steps 12 to 17 are repeated until it is determined in step 18 that the extraction of all the measurement items has been completed. If it is determined in step 18 that the extraction for all the measurement items has been completed,
A list of all the change conditions and change timings extracted so far is compiled in a list, which is output as a debug specification in step 19.

Table 2 shows the debug specifications created from the measurement specifications shown in Table 1 in this manner.

[Table 2] As can be seen from Table 2, the debug specification created in this embodiment is formed from data focusing only on the changing points of the setting conditions.

In the above-described embodiment, the measurement specifications are read in step 11 and then the confirmation terminals and the confirmation conditions are extracted from the measurement specifications. However, as shown by the broken line in FIG. It is also possible to read the test program instead of the specification and extract the check terminals and the check conditions from the test program. In this case, a more detailed debug specification is created by adding information indicating a specific execution sequence of the test program, for example, a test number, a program execution line number, and the like to the sequence item in the debug item column of Table 2. It becomes possible.

Further, in the present invention, a test program creation specification can be created in the same manner as the debug specification described above. A method of creating the test program creation specification will be described with reference to the flowchart of FIG. First, in steps 11 to 18, change conditions and change timings are extracted for all measurement items in the same manner as in steps 11 to 18 of the method for creating a debug specification shown in FIG. Conditions necessary for actual measurement, such as specification values, are added. Next, in step 22, all change conditions and change timings, measurement conditions, standard values, and the like are summarized in a list, and the list is output as a test program creation specification in step 22. It is to be noted that since the specifications are for preparing a test program, in step 12, not only the terminals necessary for debugging but also all terminals need to be extracted as confirmation terminals.

Table 3 shows the test program creation specifications created from the measurement specifications in Table 1 in this manner.

[Table 3] Since the change conditions and change timings extracted in steps 11 to 18 are formed from data focusing only on the change points of the set conditions, the execution speed is high and the efficiency is high by using this test program creation specification. A good test program can be created.

[0016]

As described above, in the method of preparing a debug specification according to the present invention, measurement conditions, standard values, and setting conditions of terminals of a circuit under test and peripheral circuits are shown for each of a plurality of measurement items. Read the measurement specifications or test program that controls the measuring device that measures the circuit under test, extract the setting conditions for each of the multiple measurement items from the read measurement specifications or test program, Extract the terminals of the measurement circuit as confirmation terminals, extract the setting conditions of the confirmation terminals as confirmation conditions, and confirm the confirmation terminals and confirmation conditions for each extracted measurement item in the immediately preceding measurement item that is the previous stage. When the terminal and the confirmation condition have changed, the changed confirmation terminal and confirmation condition are extracted as the change condition, and the confirmation terminal and Since the change timing when the recognition condition changes is extracted, and all the extracted change conditions and change timings are listed together with the measurement items in a list and output as a debug specification, accurate debug work can be performed efficiently. A debug specification that can be obtained is obtained.

Further, the method for preparing a test program preparation specification according to the present invention is a measurement specification which indicates measurement conditions, standard values, and setting conditions of terminals of a circuit to be measured and peripheral circuits for each of a plurality of measurement items. From the read measurement specifications, extract the setting conditions for each of the multiple measurement items, extract all the terminals of the circuit under test as confirmation terminals, and extract and extract the setting conditions of the confirmation terminals as confirmation conditions. If the confirmation terminals and confirmation conditions for each measurement item that have been changed have changed from the confirmation terminals and confirmation conditions for the immediately preceding measurement item that is the previous stage, the changed confirmation terminals and confirmation conditions are extracted as change conditions. , The change timing when the check terminal and the check condition change are extracted, and the measurement condition and the standard are added to all the extracted change conditions and change timings. It added to collectively tabulated together with the measurement item, since outputs it as a test program creation specifications, test program creation specifications to create fast and efficient test program execution speed is possible is obtained.

[Brief description of the drawings]

FIG. 1 is a flowchart illustrating a method for creating a debug specification according to an embodiment of the present invention.

FIG. 2 is a flowchart illustrating a method for creating a test program creation specification according to another embodiment.

FIG. 3 is a block diagram showing a conventional semiconductor measuring device.

Claims (2)

(57) [Claims] 1. A test for controlling a measuring device for measuring a circuit under measurement or a measurement specification indicating measurement conditions, standard values, setting conditions of terminals of a circuit under test and peripheral circuits for each of a plurality of measurement items. Load the program, extract the setting conditions for each of the multiple measurement items from the read measurement specifications or test program, extract the terminals of the circuit under test required for debugging as the confirmation terminals, and If the check terminals and check conditions for each extracted measurement item have been changed from the check terminals and check conditions for the immediately preceding measurement item that is the previous stage, the check terminals and check that have changed have been extracted as check conditions. The conditions are extracted as change conditions, and the check terminal and the change timing when the check condition changes are extracted. A method of creating a debug specification, wherein all change conditions and change timings are collected together with a measurement item in a list and output as a debug specification. 2. A measurement specification sheet indicating measurement conditions, standard values, setting conditions of terminals of a circuit under test and peripheral circuits for each of a plurality of measurement items is read, and a plurality of measurement items are read from the read measurement specification sheets. Extract the setting conditions for each of the above, extract all the terminals of the circuit under test as confirmation terminals, extract the setting conditions of the confirmation terminals as confirmation conditions, and confirm the confirmation terminals and confirmation conditions for each extracted measurement item before that. If there is a change from the confirmation terminal and the confirmation condition in the measurement item immediately before the stage, the changed confirmation terminal and the confirmation condition are extracted as the change condition, and the change timing when the confirmation terminal and the confirmation condition change is determined. The measurement conditions and standard values are added to all the extracted change conditions and change timings, and they are summarized in a list with the measurement items. A method for creating a test program creation specification, which is output as a program creation specification.