JP2892220B2 - Manufacturing method of ceramic wiring board - Google Patents

Manufacturing method of ceramic wiring board

Info

Publication number
JP2892220B2
JP2892220B2 JP16058892A JP16058892A JP2892220B2 JP 2892220 B2 JP2892220 B2 JP 2892220B2 JP 16058892 A JP16058892 A JP 16058892A JP 16058892 A JP16058892 A JP 16058892A JP 2892220 B2 JP2892220 B2 JP 2892220B2
Authority
JP
Japan
Prior art keywords
wiring board
insulating substrate
weight
semiconductor element
insulating base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP16058892A
Other languages
Japanese (ja)
Other versions
JPH066001A (en
Inventor
憲一 合原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP16058892A priority Critical patent/JP2892220B2/en
Publication of JPH066001A publication Critical patent/JPH066001A/en
Application granted granted Critical
Publication of JP2892220B2 publication Critical patent/JP2892220B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は半導体素子が搭載される
回路配線基板や半導体素子を収容する半導体素子収納用
パッケージに好適に使用されるセラミック配線基板の製
造方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a ceramic wiring board suitably used for a circuit wiring board on which a semiconductor element is mounted and a semiconductor element housing package for housing the semiconductor element.

【0002】[0002]

【従来の技術】従来、半導体素子等が搭載される回路配
線基板や半導体素子を収容する半導体素子収納用パッケ
ージ等に使用されるセラミック配線基板は酸化アルミニ
ウム質焼結体から成る絶縁基体と、該絶縁基体の表面に
焼き付けられている銅より成る配線用の導体層とにより
構成されている。
2. Description of the Related Art Conventionally, a ceramic wiring board used for a circuit wiring board on which a semiconductor element or the like is mounted, a semiconductor element housing package for housing the semiconductor element, or the like, includes an insulating base made of an aluminum oxide sintered body; A wiring conductor layer made of copper which is baked on the surface of the insulating base.

【0003】かかる従来のセラミック配線基板は通常、
電気絶縁性に優れた酸化アルミニウム質焼結体の表面
に、銅粉末に酸化亜鉛、酸化ホウ素、酸化珪素等から成
るガラスフリットと適当なバインダー及び溶剤を添加混
合して得た導体ペーストをスクリーン印刷法等の厚膜形
成技術を採用することによって所定パターンに印刷塗布
し、しかる後、これを還元雰囲気中、約 900℃の温度で
焼成し、ガラスフリットを溶融させ、該溶融したガラス
フリットを介して銅粉末を絶縁基体表面に接合させるこ
とによって製作されている。
[0003] Such a conventional ceramic wiring board is usually
Screen printing of a conductive paste obtained by adding and mixing a glass frit made of zinc oxide, boron oxide, silicon oxide, etc., and a suitable binder and solvent to copper powder on the surface of an aluminum oxide sintered body with excellent electrical insulation By applying a thick film forming technique such as a printing method, a predetermined pattern is printed and applied, and then fired at a temperature of about 900 ° C. in a reducing atmosphere to melt the glass frit and pass through the melted glass frit. It is manufactured by bonding copper powder to the surface of an insulating substrate.

【0004】しかしながら、従来の回路配線基板や半導
体素子収納用パッケージ等に使用されているセラミック
配線基板は絶縁基体が酸化アルミニウム質焼結体から成
り、熱伝導率が20W/m ・K と低いことから、近時の高密
度化、高集積化が進み、多量の熱を発するようになって
きた半導体素子を搭載、収容した場合、回路配線基板や
半導体素子収納用パッケージは半導体素子が発する熱を
大気中に良好に放出させることができず、半導体素子を
該半導体素子の発する熱によって高温とし、半導体素子
に熱破壊を起こさせたり、特性に熱劣化を招来し、半導
体素子を誤動作させるという欠点を有していた。
However, the ceramic wiring board used for the conventional circuit wiring board or the package for accommodating the semiconductor element has a low thermal conductivity of 20 W / m · K in which the insulating base is made of an aluminum oxide sintered body. In recent years, when high-density and high-integration technologies have been developed and semiconductor devices that generate a large amount of heat are mounted and housed, the circuit wiring board and the semiconductor device housing package generate heat generated by the semiconductor devices. The disadvantage is that the semiconductor element cannot be satisfactorily released into the atmosphere and is heated to a high temperature by the heat generated by the semiconductor element, causing thermal destruction of the semiconductor element or thermal degradation of the characteristics, resulting in malfunction of the semiconductor element. Had.

【0005】そこで上記欠点を解消するために回路配線
基板や半導体素子収納用パッケージ等に使用されるセラ
ミック配線基板の絶縁基体を熱伝導率が高く、熱を大気
中に良好に放出することが可能な窒化アルミニウム質焼
結体で形成することが考えられる。
In order to solve the above-mentioned drawbacks, the insulating base of a ceramic wiring board used for a circuit wiring board or a package for accommodating a semiconductor element has a high thermal conductivity and can satisfactorily release heat to the atmosphere. It is conceivable to form the aluminum nitride sintered body.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、セラミ
ック配線基板の絶縁基体を窒化アルミニウム質焼結体で
形成した場合、該窒化アルミニウム質焼結体は非酸化物
であり、絶縁基体表面の極性が弱いため、絶縁基体の表
面に銅粉末をガラスフリットを介し接合させることによ
って導体層を被着させる際、ガラスフリットと絶縁基体
との接合強度が低く、その結果、配線用の導体層を絶縁
基体表面に強固に被着させることができないという欠点
を誘発した。
However, when the insulating substrate of the ceramic wiring substrate is formed of an aluminum nitride sintered body, the aluminum nitride sintered body is non-oxide and the surface of the insulating substrate has a weak polarity. Therefore, when the copper powder is bonded to the surface of the insulating base via the glass frit to apply the conductive layer, the bonding strength between the glass frit and the insulating base is low, and as a result, the conductive layer for wiring is formed on the surface of the insulating base. Caused a drawback that it could not be firmly adhered to.

【0007】[0007]

【発明の目的】本発明者は上記欠点に鑑み種々の実験を
行った結果、導体ペースト中に鉛及び周期律表第2属の
元素の硝酸塩又は過酸化物の少なくとも1種を所定量含
有させておくと該導体ペーストを使用して絶縁基体表面
に配線用の導体層を被着形成させる際、導体ペースト中
のガラスフリットが絶縁基体に良好に濡れ( 反応し) 、
これによって配線用の導体層を非酸化物系セラミックス
から成る絶縁基体表面に強固に被着接合させ得ることを
知見した。
The present inventors conducted various experiments in view of the above drawbacks. As a result, the conductor paste contained a predetermined amount of lead and at least one nitrate or peroxide of an element of the second group of the periodic table. When the conductive paste is used to form a conductive layer for wiring on the surface of the insulating base using the conductive paste, the glass frit in the conductive paste wets (reacts) well on the insulating base,
As a result, it has been found that the conductor layer for wiring can be firmly adhered and bonded to the surface of the insulating base made of non-oxide ceramics.

【0008】本発明は上記知見に基づき、非酸化物系セ
ラミックスから成る絶縁基体表面に配線用の導体層を強
固に接合させ、且つ搭載、収容される半導体素子を長期
間にわたり正常、且つ安定に作動させることができるセ
ラミック配線基板の製造方法を提供することをその目的
とするものである。
According to the present invention, based on the above findings, a conductor layer for wiring is firmly bonded to the surface of an insulating base made of non-oxide ceramics, and a semiconductor element to be mounted and accommodated can be normally and stably maintained for a long period of time. It is an object of the present invention to provide a method of manufacturing a ceramic wiring board that can be operated.

【0009】[0009]

【課題を解決するための手段】本発明は非酸化物系セラ
ミックスから成る絶縁基体の表面に銅粉末及びガラスフ
リットを含む導体ペーストを厚膜形成技術により被着さ
せるとともにこれを還元雰囲気中で焼成し、絶縁基体表
面に銅から成る厚膜導体層を被着形成して成るセラミッ
ク配線基板の製造方法であって、前記導体ペーストはそ
の内部に、鉛及び周期律表第2属の元素の硝酸塩又は過
酸化物の少なくとも1種が外添加で0.1乃至3.0 重量%
含有されていることを特徴とするものである。
According to the present invention, a conductive paste containing copper powder and glass frit is applied to the surface of an insulating substrate made of non-oxide ceramics by a thick film forming technique and fired in a reducing atmosphere. And a method of manufacturing a ceramic wiring board by forming a thick film conductor layer made of copper on the surface of an insulating substrate, wherein said conductor paste contains lead and nitrate of an element belonging to Group 2 of the periodic table. Or at least one of peroxides is 0.1 to 3.0 wt% by external addition
It is characterized by being contained.

【0010】[0010]

【実施例】次に本発明を添付図面に基づき詳細に説明す
る。図1(a)(b)(c)は本発明のセラミック配線基板の製造
方法を説明するための各工程毎の断面図である。
BRIEF DESCRIPTION OF THE DRAWINGS FIG. FIGS. 1 (a), 1 (b) and 1 (c) are cross-sectional views for explaining the steps of a method for manufacturing a ceramic wiring board according to the present invention.

【0011】本発明のセラミック配線基板はまず図1(a)
に示す如く、窒化アルミニウム質焼結体から成る絶縁基
体1 を準備する。
First, the ceramic wiring board of the present invention is shown in FIG.
As shown in (1), an insulating substrate 1 made of an aluminum nitride sintered body is prepared.

【0012】前記窒化アルミニウム質焼結体から成る絶
縁基体1 は、例えば窒化アルミニウム(AlN) 、酸化エル
ビウム(Er 2 O 3 ) 、酸化イッテルビウム(Yb 2 O 3 )
等の原料粉末に適当なバインダー及び溶剤を添加混合し
て泥漿状となすとともにこれを従来周知のドクターブレ
ード法やカレンダーロール法等を採用することによって
セラミックグリーンシート( セラミック生シート) を形
成し、しかる後、前記セラミックグリーンシートに適当
な打ち抜き加工を施し、高温( 約1800℃) で焼成するこ
とによって得られる。
The insulating substrate 1 made of the aluminum nitride sintered body is made of, for example, aluminum nitride (AlN), erbium oxide (Er 2 O 3 ), ytterbium oxide (Yb 2 O 3 ).
A suitable binder and a solvent are added to the raw material powder and mixed to form a slurry, and a ceramic green sheet (ceramic green sheet) is formed by adopting a conventionally known doctor blade method or calender roll method. Thereafter, the ceramic green sheet is obtained by subjecting the ceramic green sheet to suitable punching and firing at a high temperature (about 1800 ° C.).

【0013】また前記絶縁基体1を構成する窒化アルミ
ニウム質焼結体はその熱伝導率が150W/m・K い高いた
め、絶縁基体1上に半導体素子を載置させ、該半導体素
子が熱を発生したとしても半導体素子の発生する熱は絶
縁基体1が吸収するとともに大気中に良好に放出し、半
導体素子を熱破壊や特性に熱変化を招来するような高温
となすことは皆無となる。
Since the thermal conductivity of the aluminum nitride sintered body constituting the insulating base 1 is as high as 150 W / m · K, a semiconductor element is mounted on the insulating base 1 and the semiconductor element transfers heat. Even if the heat is generated, the heat generated by the semiconductor element is absorbed by the insulating base 1 and satisfactorily released into the atmosphere, and the semiconductor element is never heated to a high temperature that causes thermal destruction or a change in characteristics.

【0014】次に前記絶縁基体1 は図1(b) に示す如
く、その上面に配線パターン2 が被着形成される。前記
配線パターン2 は銅粉末にガラスフリットと、鉛及び周
期律表第2属の元素の硝酸塩又は過酸化物の少なくとも
1種と、バインダー及び溶剤とを添加混合することによ
って得られる導体ペーストを絶縁基体1の上面に従来周
知のスクリーン印刷法等の厚膜形成技術を採用し印刷塗
布することによって絶縁基体1の上面に所定パターンに
被着される。
Next, as shown in FIG. 1 (b), a wiring pattern 2 is formed on the insulating substrate 1 on its upper surface. The wiring pattern 2 insulates a conductive paste obtained by adding and mixing a glass frit, lead and at least one of a nitrate or a peroxide of an element of the second group of the periodic table, a binder and a solvent to copper powder. The upper surface of the base 1 is adhered in a predetermined pattern on the upper surface of the insulating base 1 by printing and applying a known thick film forming technique such as a screen printing method.

【0015】尚、前記導体ペーストに添加されるガラス
フリットとしては酸化亜鉛(ZnO)15.0 重量%、酸化鉛(P
bO)45.0 重量%、酸化珪素(SiO 2 )10.0重量%、酸化ホ
ウ素(B2 O 3 )30.0 重量%から成るガラスが使用され、
バインダー及び溶剤としてはエチルセルロース及びアル
ファーテルピネオール等が添加される。また前記導体ペ
ーストは例えば、銅粉末100gに、酸化亜鉛(ZnO)15.0 重
量%、酸化鉛(PbO)45.0 重量%、酸化珪素(SiO 2 )10.0
重量%、酸化ホウ素(B2 O 3 )30.0 重量%から成るガラ
スフリットを5g配合して成るペースト原料に、過酸化鉛
(Pb 3 O 4 ) を0.1 〜3.0 重量%配合させ、更にこれに
バインダーとしてエチルセルロースを2g、溶剤としてア
ルファーテルピネオールを16g 添加し、これらを3 本ロ
ールの混練機にて約8 〜10回混練することによって形成
される。
As the glass frit added to the conductor paste, zinc oxide (ZnO) 15.0% by weight and lead oxide (P
bO) 45.0% by weight, silicon oxide (SiO 2 ) 10.0% by weight, boron oxide (B 2 O 3 ) 30.0% by weight glass is used,
Ethyl cellulose and alpha-terpineol are added as a binder and a solvent. The conductive paste is, for example, 15.0% by weight of zinc oxide (ZnO), 45.0% by weight of lead oxide (PbO), 10.0% by weight of silicon oxide (SiO 2 ) in 100 g of copper powder.
5% by weight of glass frit consisting of 30.0% by weight of boron oxide (B 2 O 3 )
0.1 to 3.0% by weight of (Pb 3 O 4 ), 2 g of ethyl cellulose as a binder and 16 g of alpha-terpineol as a solvent are added thereto, and these are kneaded about 8 to 10 times by a kneader of three rolls. Formed by

【0016】そして次に前記上面に配線パターン2を被
着させた絶縁基体1は還元雰囲気中、約900 ℃の温度で
焼成され、配線パターン2 中の銅粉末をガラスフリット
を介し絶縁基体1 表面に接合させることによって図1(c)
に示す如く、絶縁基体1 の上面に配線用の導体層3 を被
着させたセラミック配線基板が完成する。この場合、配
線パターン2 を形成する導体ペースト中には過酸化鉛が
含有されており、該過酸化鉛によってガラスフリットと
絶縁基体1 との接合が改善されていることから配線用の
導体層3 は絶縁基体1 の上面に極めて強固に被着され
る。
Then, the insulating substrate 1 on which the wiring pattern 2 is adhered on the upper surface is fired in a reducing atmosphere at a temperature of about 900 ° C., and the copper powder in the wiring pattern 2 is put on the surface of the insulating substrate 1 via a glass frit. Fig. 1 (c)
As shown in (1), a ceramic wiring board in which a conductor layer 3 for wiring is applied to the upper surface of an insulating base 1 is completed. In this case, the conductive paste for forming the wiring pattern 2 contains lead peroxide, and since the bonding between the glass frit and the insulating substrate 1 is improved by the lead peroxide, the conductive layer 3 for wiring is formed. Is extremely firmly adhered to the upper surface of the insulating substrate 1.

【0017】尚、前記導体ペースト中に含まれる過酸化
鉛はその含有量が0.1 重量%未満であると配線用の導体
層3 を絶縁基体1 表面に強固に被着させることができ
ず、また3.0 重量%を越えると配線導体中の銅粉末表面
に酸化物を生成させ、銅粉末の絶縁基体1 表面への被着
を弱めてしまう。従って、前記導体ペースト中に含まれ
る過酸化鉛はその含有量が0.1 乃至3.0 重量%の範囲に
特定される。
If the content of lead peroxide contained in the conductor paste is less than 0.1% by weight, the conductor layer 3 for wiring cannot be firmly adhered to the surface of the insulating base 1, and If the content exceeds 3.0% by weight, an oxide is generated on the surface of the copper powder in the wiring conductor, and the adhesion of the copper powder to the surface of the insulating substrate 1 is weakened. Therefore, the content of lead peroxide contained in the conductor paste is specified in the range of 0.1 to 3.0% by weight.

【0018】また前記配線用の導体層はその表面にニッ
ケル、金等の良導電性で、且つ耐蝕性に優れた金属をメ
ッキ法により1.0 乃至20.0μm の厚みに層着させておく
と導電層の酸化腐食を有効に防止しつつ導電層に半導体
素子の電極を良好に電気的接続することができる。従っ
て、前記導電層はその表面にニッケル、金等の良導電性
で、且つ耐蝕性に優れた金属をメッキ法により1.0 乃至
20.0μm の厚みに層着させておくことが好ましい。
The conductive layer for wiring may be formed by plating a metal having good conductivity and excellent corrosion resistance, such as nickel or gold, to a thickness of 1.0 to 20.0 μm by plating. Satisfactorily electrically connects the electrodes of the semiconductor element to the conductive layer while effectively preventing oxidative corrosion of the semiconductor element. Therefore, the conductive layer is formed of a highly conductive metal such as nickel or gold and a metal having excellent corrosion resistance on the surface by a plating method of 1.0 to 1.0.
It is preferable to coat the layer to a thickness of 20.0 μm.

【0019】更に上記実施例では導体ペースト中に含有
される鉛及び周期律表第2属の元素の硝酸塩又は過酸化
物として過酸化鉛を例に挙げて説明したが、硝酸ストロ
ンチウム(Sr(NO3 ) 2 ) 、硝酸鉛(Pb(NO3 ) 2 ) 等であ
ってもよい。
Furthermore, in the above embodiment, lead peroxide was used as an example of lead contained in the conductor paste and nitrate or peroxide of an element belonging to Group 2 of the periodic table. However, strontium nitrate (Sr (NO 3 ) 2 ) or lead nitrate (Pb (NO 3 ) 2 ).

【0020】(実験例) 次に本発明の作用効果を以下に
述べる実験例に基づき説明する。まず銅粉末に表1に示
す配合組成となるように酸化亜鉛(ZnO)15.0 重量%、酸
化鉛(PbO)45.0 重量%、酸化珪素(SiO 2 )10.0重量%、
酸化ホウ素(B2 O 3 )30.0 重量%から成るガラスフリッ
トと、過酸化鉛(Pb 3 O 4 ) とバインダーとしてのエチ
ルセルロース及び溶剤としてのアルファーテルピネオー
ルを16g 添加混合し、導体ペースト試料を得る。
(Experimental Example) Next, the operation and effect of the present invention will be described based on the experimental examples described below. First, 15.0% by weight of zinc oxide (ZnO), 45.0% by weight of lead oxide (PbO), 10.0% by weight of silicon oxide (SiO 2 ) were added to copper powder so as to have the composition shown in Table 1.
A glass frit composed of 30.0% by weight of boron oxide (B 2 O 3 ), lead peroxide (Pb 3 O 4 ), 16 g of ethyl cellulose as a binder and alpha-terpineol as a solvent are added and mixed to obtain a conductor paste sample.

【0021】次にこの各導体ペースト試料を窒化アルミ
ニウム質焼結体から成る絶縁基体表面にスクリーン印刷
法により長さ2mm 、幅2mm 、厚さ15μm に印刷塗布し、
しかる後、これを窒素雰囲気中、900 ℃の温度で焼成
し、絶縁基体表面に配線用の導体層を被着させる。
Next, each of the conductor paste samples is printed and applied to the surface of an insulating substrate made of an aluminum nitride sintered body to a length of 2 mm, a width of 2 mm and a thickness of 15 μm by a screen printing method.
Thereafter, this is fired in a nitrogen atmosphere at a temperature of 900 ° C., and a conductor layer for wiring is deposited on the surface of the insulating substrate.

【0022】そして最後に前記導体層表面に溶融半田(
錫:60 重量%、鉛:38 重量%、銀:2重量%) をディッピ
ングさせ、これに表面が錫メッキされた銅線を接合させ
るとともにその直後及び125 ℃の高温中に48時間、240
時間放置後、導線を絶縁基体表面に対し垂直方向に引っ
張り、導体層が絶縁基体から剥がれた際のそれぞれの引
っ張り強度を調べてこれを導体層と絶縁基体の被着強度
として評価した。
Finally, the molten solder (
(Tin: 60% by weight, Lead: 38% by weight, Silver: 2% by weight), dipped with a tin-plated copper wire, and immediately thereafter and at a high temperature of 125 ° C for 48 hours, 240 hours
After standing for a time, the conductor was pulled in a direction perpendicular to the surface of the insulating base, and the tensile strength when the conductor layer was peeled off from the insulating base was examined and evaluated as the adhesion strength between the conductor layer and the insulating base.

【0023】尚、表1 中、試料番号1 は銅粉末にガラス
フリットとバインダー及び溶剤を添加混合した従来、一
般に使用されている導電ペーストである。
In Table 1, Sample No. 1 is a conventional and generally used conductive paste obtained by adding a glass frit, a binder and a solvent to copper powder and mixing them.

【0024】また前記評価においては絶縁基体に被着さ
せる導体層を20個とし、その平均値を導体層と絶縁基
体の被着強度とした。
In the above evaluation, the number of the conductor layers to be attached to the insulating substrate was set to 20, and the average value was defined as the adhesion strength between the conductor layer and the insulating substrate.

【0025】上記の結果を表1 に示す。The results are shown in Table 1.

【0026】[0026]

【表1】 [Table 1]

【0027】[0027]

【発明の効果】上記実験結果からも判るように従来の銅
粉末にガラスフリットとバインダー及び溶剤を添加混合
した導体ペーストを使用して配線用の導体層を形成した
ものは非酸化物系セラミックスから成る絶縁基体と配線
用導体層との被着強度が高温中に240 時間放置した際、
0.60Kg/m2 以下に低下し、極めて弱いものであるのに対
し、本発明のもの、即ち、銅粉末にガラスフリットと鉛
及び周期律表第2属の元素の硝酸塩又は過酸化物の少な
くとも1種とバインダー及び溶剤を添加混合した導体ペ
ーストを使用して配線用の導体層を形成したものは非酸
化物系セラミックスから成る絶縁基体と配線用導体層と
の被着強度が高温中に放置した後も1.0Kg/m 2 以上と極
めて強く、配線用導体層が絶縁基体に強固に被着してい
ることが判る。
As can be seen from the above experimental results, a conductor layer for wiring formed by using a conductor paste obtained by adding and mixing a glass frit, a binder and a solvent to conventional copper powder is made of non-oxide ceramics. When the adhesion strength between the insulating base and the wiring conductor layer is left at high temperature for 240 hours,
0.60 kg / m 2 or less, which is extremely weak, whereas the copper powder of the present invention, that is, at least one of glass frit and lead and nitrate or peroxide of an element of the second group of the periodic table is added to the copper powder. When a conductor layer for wiring is formed using a conductor paste in which one kind, a binder and a solvent are added and mixed, the adhesion strength between the insulating base made of non-oxide ceramics and the conductor layer for wiring is left at high temperatures Even after this, it was extremely strong at 1.0 kg / m 2 or more, indicating that the wiring conductor layer was firmly adhered to the insulating base.

【0028】従って、本発明の製造方法によって製造さ
れるセラミック配線基板は発熱量が多い半導体素子を搭
載、収容する回路配線基板や半導体素子収納用パッケー
ジに好適に使用される。
Therefore, the ceramic wiring board manufactured by the manufacturing method of the present invention is suitably used for a circuit wiring board for mounting and housing a semiconductor element generating a large amount of heat and a package for housing a semiconductor element.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明のセラミック配線基板の製造方法を説明
するための各工程毎の断面図である。
FIG. 1 is a cross-sectional view of each process for describing a method for manufacturing a ceramic wiring board of the present invention.

【符号の説明】[Explanation of symbols]

1・・・・・・・絶縁基体 2・・・・・・・配線パターン 3・・・・・・・配線用の導体層 1 ····· Insulating substrate 2 ····· Wiring pattern 3 ····· Conductor layer for wiring

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】非酸化物系セラミックスから成る絶縁基体
の表面に銅粉末及びガラスフリットを含む導体ペースト
を厚膜形成技術により被着させるとともにこれを還元雰
囲気中で焼成し、絶縁基体表面に銅から成る厚膜導体層
を被着形成して成るセラミック配線基板の製造方法であ
って、前記導体ペーストはその内部に、鉛及び周期律表
第2属の元素の硝酸塩又は過酸化物の少なくとも1種が
外添加で0.1 乃至3.0重量%含有されていることを特徴
とするセラミック配線基板の製造方法。
1. A conductive paste containing copper powder and glass frit is applied to the surface of an insulating substrate made of non-oxide ceramics by a thick film forming technique and fired in a reducing atmosphere to form a copper paste on the surface of the insulating substrate. A method of manufacturing a ceramic wiring board, comprising: forming a thick-film conductor layer comprising: a conductive paste containing at least one of lead and a nitrate or peroxide of an element of Group 2 of the periodic table. A method for producing a ceramic wiring board, comprising 0.1 to 3.0% by weight of seeds by external addition.
JP16058892A 1992-06-19 1992-06-19 Manufacturing method of ceramic wiring board Expired - Fee Related JP2892220B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16058892A JP2892220B2 (en) 1992-06-19 1992-06-19 Manufacturing method of ceramic wiring board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16058892A JP2892220B2 (en) 1992-06-19 1992-06-19 Manufacturing method of ceramic wiring board

Publications (2)

Publication Number Publication Date
JPH066001A JPH066001A (en) 1994-01-14
JP2892220B2 true JP2892220B2 (en) 1999-05-17

Family

ID=15718206

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16058892A Expired - Fee Related JP2892220B2 (en) 1992-06-19 1992-06-19 Manufacturing method of ceramic wiring board

Country Status (1)

Country Link
JP (1) JP2892220B2 (en)

Also Published As

Publication number Publication date
JPH066001A (en) 1994-01-14

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