JP2849967B2 - LED module short circuit inspection method - Google Patents
LED module short circuit inspection methodInfo
- Publication number
- JP2849967B2 JP2849967B2 JP4269555A JP26955592A JP2849967B2 JP 2849967 B2 JP2849967 B2 JP 2849967B2 JP 4269555 A JP4269555 A JP 4269555A JP 26955592 A JP26955592 A JP 26955592A JP 2849967 B2 JP2849967 B2 JP 2849967B2
- Authority
- JP
- Japan
- Prior art keywords
- led
- short
- led module
- short circuit
- inspection method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Description
【０００１】[0001]
【産業上の利用分野】本発明は、複数個のＬＥＤ素子が
直列に接続されたＬＥＤ素子群を複数個並列に接続して
なるＬＥＤモジュールの短絡検査方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a short-circuit inspection method for an LED module in which a plurality of LED elements each having a plurality of LED elements connected in series are connected in parallel.
【０００２】[0002]
【従来の技術】液晶表示装置のバックライトやＬＥＤ光
源アレイ等に用いられるＬＥＤモジュールは、複数個の
ＬＥＤ素子が直列に接続したＬＥＤ素子群を複数個並列
に接続することにより構成されている。かかるＬＥＤモ
ジュールを構成するＬＥＤ素子に短絡が生じることがあ
る。2. Description of the Related Art An LED module used for a backlight or an LED light source array of a liquid crystal display device is constructed by connecting a plurality of LED element groups in which a plurality of LED elements are connected in series. A short circuit may occur in the LED elements constituting such an LED module.
【０００３】このようなＬＥＤ素子の短絡は、ＬＥＤモ
ジュールを定格電圧又は定格電流で点灯させ、その点灯
した状態を目視又は光学的センサによって観察すること
によって検査している。[0003] Such a short circuit of the LED element is inspected by lighting the LED module at a rated voltage or a rated current, and observing the lit state visually or by an optical sensor.
【０００４】[0004]
【発明が解決しようとする課題】しかしながら、１つの
ＬＥＤ素子のみが不点灯であるＬＥＤモジュールを目視
検査したとてしも、見落としは必ず発生する。特に、多
くのＬＥＤ素子を使用するものであればあるほど、すな
わちＬＥＤ素子のドットピッチが密であればあるほど見
落としが発生し易くなる。However, even if an LED module in which only one LED element is not lit is visually inspected, oversight always occurs. In particular, as more LED elements are used, that is, the denser the dot pitch of the LED elements, the more easily oversight occurs.
【０００５】また、光学的センサをＬＥＤモジュールの
長さ方向に移動させて、前記センサの出力をモニターす
る方法で検査したとしても、短絡が発生したＬＥＤ素子
を含むＬＥＤ素子群では、短絡したＬＥＤ素子の分だけ
内部抵抗が低くなっているため、他のＬＥＤ素子群より
多くの電流が流れる。このため、残りのＬＥＤ素子が他
のＬＥＤ素子群のそれより明るくなり、不点灯のＬＥＤ
素子による照度降下を補うことになるので、短絡の有無
を発見することが困難になる。[0005] Even if the optical sensor is moved in the length direction of the LED module and inspected by a method of monitoring the output of the sensor, the short-circuited LED element group includes Since the internal resistance is lower by the elements, more current flows than in the other LED element groups. For this reason, the remaining LED elements become brighter than those of the other LED element groups, and the unlit LEDs
Since the decrease in illuminance due to the element is compensated for, it is difficult to detect the presence or absence of a short circuit.
【０００６】本発明は上記事情に鑑みて創案されたもの
で、ＬＥＤモジュールを構成するＬＥＤ素子の短絡を簡
単かつ確実に発見することができるＬＥＤモジュールの
短絡検査方法を提供することを目的としている。The present invention has been made in view of the above circumstances, and an object of the present invention is to provide an LED module short-circuit inspection method which can easily and surely detect a short circuit of an LED element constituting an LED module. .
【０００７】[0007]
【課題を解決するための手段】本発明に係るＬＥＤモジ
ュールの短絡検査方法は、複数個のＬＥＤ素子が直列に
接続されたＬＥＤ素子群を複数個並列に接続してなるＬ
ＥＤモジュールの短絡検査方法であって、定格電圧より
低い電圧を印加し、発光したＬＥＤ素子群があれば、当
該ＬＥＤ素子群を構成するＬＥＤ素子に短絡が発生して
いると判断する。According to the present invention, there is provided a short-circuit inspection method for an LED module, which comprises connecting a plurality of LED element groups in which a plurality of LED elements are connected in series.
In the method for inspecting a short circuit of an ED module, when a voltage lower than the rated voltage is applied and there is an LED element group that emits light, it is determined that a short circuit has occurred in the LED elements constituting the LED element group.
【０００８】また、本発明に係る他のＬＥＤモジュール
の短絡検査方法は、複数個のＬＥＤ素子が直列に接続さ
れたＬＥＤ素子群を複数個並列に接続してなるＬＥＤモ
ジュールの短絡検査方法であって、ＬＥＤモジュールに
印加する電圧を徐々に上昇させつつ電流値をモニター
し、電流値が上昇を始めるポイントが２以上あれば、い
ずれかのＬＥＤ素子に短絡が発生していると判断する。Another short-circuit inspection method for an LED module according to the present invention is a short-circuit inspection method for an LED module in which a plurality of LED elements in which a plurality of LED elements are connected in series are connected in parallel. Then, the current value is monitored while gradually increasing the voltage applied to the LED module. If there are two or more points where the current value starts to increase, it is determined that a short circuit has occurred in any one of the LED elements.
【０００９】[0009]
【実施例】図１は本発明の第１の実施例に係るＬＥＤモ
ジュールの短絡検査方法によって短絡が発生しているＬ
ＥＤ素子を含んだＬＥＤ素子群のみが点灯した状態を示
す概略的説明図、図２はＬＥＤモジュールの回路図、図
３はＬＥＤ素子の短絡の原因を示す説明図、図４は本発
明の第２の実施例に係るＬＥＤモジュールの短絡検査方
法を説明するグラフである。FIG. 1 shows an LED module according to a first embodiment of the present invention.
FIG. 2 is a schematic diagram showing a state in which only an LED element group including an ED element is turned on, FIG. 2 is a circuit diagram of an LED module, FIG. 3 is an explanatory diagram showing a cause of a short circuit of an LED element, and FIG. 9 is a graph illustrating a method for inspecting a short circuit of an LED module according to Example 2.
【００１０】まず、このＬＥＤモジュールの短絡検査方
法の検査対象であるＬＥＤモジュールの短絡検査方法に
ついて説明する。このＬＥＤモジュールは、複数個（図
面では20個) のＬＥＤ素子１〜20から構成されている。
すなわち、４個のＬＥＤ素子と１つの抵抗Ｒが直列に接
続されてなる５つのＬＥＤ素子群Ｇ1 〜Ｇ5 が並列に接
続されているのである。ＬＥＤ素子の短絡は、ボンディ
ングワイヤ30のタレ（図３の（Ａ）参照）や、導電物31
の付着（図３の（Ｂ）参照）によって発生する。なお、
図面中、32はＬＥＤチップ、33はダイボンディングパッ
ド、34はワイヤボンディングパッド、35はプリント基板
ベースをそれぞれ示している。First, a short-circuit inspection method for an LED module to be inspected by the LED module short-circuit inspection method will be described. This LED module includes a plurality of (20 in the drawing) LED elements 1 to 20.
That is, five LED element groups G 1 to G 5 each including four LED elements and one resistor R connected in series are connected in parallel. The short circuit of the LED element may be caused by sagging of the bonding wire 30 (see FIG.
(See FIG. 3B). In addition,
In the drawings, 32 indicates an LED chip, 33 indicates a die bonding pad, 34 indicates a wire bonding pad, and 35 indicates a printed circuit board base.
【００１１】第１の実施例に係るＬＥＤモジュールの短
絡検査方法は、前記ＬＥＤモジュールを構成するＬＥＤ
素子のうち短絡が発生しているＬＥＤ素子を含むＬＥＤ
素子群を特定するものであって、ＬＥＤモジュールに定
格電圧より低い電圧を印加し、発光したＬＥＤ素子群が
あれば、当該ＬＥＤ素子群を構成するＬＥＤ素子に短絡
が発生していると判断する。The short-circuit inspection method for an LED module according to the first embodiment includes the steps of:
LED including short-circuited LED element among elements
It specifies the element group, applies a voltage lower than the rated voltage to the LED module, and if there is an LED element group that emits light, it is determined that a short circuit has occurred in the LED elements constituting the LED element group. .
【００１２】例えば、ＬＥＤモジュールを構成する20個
のＬＥＤ素子１〜20のうち、第１のＬＥＤ素子群Ｇ1 に
含まれるＬＥＤ素子４が短絡しているとする。すると、
第１のＬＥＤ素子群Ｇ1 の内部抵抗は、短絡が発生して
いるＬＥＤ素子の分だけ低くなっている。従って、この
第１のＬＥＤ素子群Ｇ1 は、他の第２〜第５のＬＥＤ素
子群Ｇ2 〜Ｇ5 より低い電圧で点灯することになる。[0012] For example, among the 20 pieces of LED elements 20 constituting the LED module, the LED element 4 included in the first LED element group G 1 is short-circuited. Then
The internal resistance of the first LED element group G 1 is lower by the amount of the LED element a short circuit has occurred. Therefore, the LED element group G 1 of the first will be turned on at lower than the LED element group G 2 ~G 5 other second to fifth voltage.
【００１３】このため、定格電圧より低い電圧を印加し
たＬＥＤモジュールを目視又は光学的センサで検査する
ことにより、短絡が発生しているＬＥＤ素子４を含む第
１のＬＥＤ素子群Ｇ1 を容易に発見することができる。
なお、図１では、第１のＬＥＤ素子群Ｇ1 の点灯を点々
で示している。For this reason, the first LED element group G 1 including the short-circuited LED element 4 can be easily formed by visually or optically inspecting the LED module to which a voltage lower than the rated voltage is applied. Can be found.
Also shows in Fig. 1, the first lighting of the LED element group G 1 by dots.
【００１４】また、本発明の第２の実施例に係るＬＥＤ
モジュールの短絡検査方法は、ＬＥＤモジュールに印加
する電圧を徐々に上昇させつつ電流値をモニターし、電
流値が上昇を始めるポイントが２以上あれば、いずれか
のＬＥＤ素子に短絡が発生していると判断する。An LED according to a second embodiment of the present invention
In the module short-circuit inspection method, a current value is monitored while gradually increasing the voltage applied to the LED module. If there are two or more points at which the current value starts to increase, a short circuit has occurred in any one of the LED elements. Judge.
【００１５】すなわち、すべてのＬＥＤ素子１〜20に短
絡が発生していないとすると、印加される電圧を徐々に
上昇させた場合の電流値は、図４（Ａ）に示すように、
電流値が上昇を始めるポイントは１箇所だけであり、か
つ滑らかな曲線を描く。That is, assuming that no short circuit has occurred in all the LED elements 1 to 20, the current value when the applied voltage is gradually increased is as shown in FIG.
There is only one point where the current value starts to rise, and a smooth curve is drawn.
【００１６】これに対して、例えばＬＥＤ素子４に短絡
が発生しているとすると、このＬＥＤ素子４を含む第１
のＬＥＤ素子群Ｇ1 に、他のＬＥＤ素子群Ｇ2 〜Ｇ5 よ
り早く電流が流れ始める。このため、このような場合に
は、電流値は図４（Ｂ）に示すように上昇を始めるポイ
ントは２箇所になる。これによって、いずれかのＬＥＤ
素子に短絡が発生していると判断される。On the other hand, if a short circuit occurs in the LED element 4, for example, the first
The LED element group G 1 of the current starts to flow faster than the other LED element group G 2 ~G 5. Therefore, in such a case, the current value starts to rise at two points as shown in FIG. 4B. This will allow any LED
It is determined that a short circuit has occurred in the element.
【００１７】[0017]
【発明の効果】第１の発明は、複数個のＬＥＤ素子が直
列に接続されたＬＥＤ素子群を複数個並列に接続してな
るＬＥＤモジュールの短絡検査方法であって、短絡が発
生しているＬＥＤ素子を含むＬＥＤ素子群の内部抵抗は
他のＬＥＤ素子群のそれより低く、定格電圧より低い電
圧で点灯することを利用している。従って、定格電圧よ
り低い電圧を印加し、発光したＬＥＤ素子群があれば、
当該ＬＥＤ素子群を構成するＬＥＤ素子に短絡が発生し
ていると判断することができる。The first invention is a method for inspecting a short-circuit of an LED module in which a plurality of LED elements in which a plurality of LED elements are connected in series are connected in parallel. The internal resistance of the LED element group including the LED elements is lower than that of the other LED element groups, and utilizes the fact that the LED element is lit at a voltage lower than the rated voltage. Therefore, if there is an LED element group that emits light by applying a voltage lower than the rated voltage,
It can be determined that a short circuit has occurred in the LED elements constituting the LED element group.
【００１８】また、第２の発明は、同様の原理を応用し
ており、ＬＥＤモジュールに印加する電圧を徐々に上昇
させつつ電流値をモニターし、電流値が上昇を始めるポ
イントが２以上あれば、いずれかのＬＥＤ素子に短絡が
発生していると判断する。In the second invention, the same principle is applied. The current value is monitored while gradually increasing the voltage applied to the LED module, and if there are two or more points where the current value starts to increase, It is determined that a short circuit has occurred in any one of the LED elements.
【００１９】従って、両発明とも、従来の方法より簡単
かつ確実にＬＥＤモジュールを構成するＬＥＤ素子の短
絡を発見することができる。Therefore, in both of the inventions, a short circuit of the LED element constituting the LED module can be found more easily and more reliably than the conventional method.
【図面の簡単な説明】[Brief description of the drawings]
【図１】本発明の第１の実施例に係るＬＥＤモジュール
の短絡検査方法によって短絡が発生しているＬＥＤ素子
を含んだＬＥＤ素子群のみが点灯した状態を示す概略的
説明図である。FIG. 1 is a schematic explanatory view showing a state in which only an LED element group including an LED element in which a short circuit has occurred according to a short circuit inspection method for an LED module according to a first embodiment of the present invention.
【図２】ＬＥＤモジュールの回路図である。FIG. 2 is a circuit diagram of an LED module.
【図３】ＬＥＤ素子の短絡の原因を示す説明図である。FIG. 3 is an explanatory diagram showing a cause of a short circuit of an LED element.
【図４】本発明の第２の実施例に係るＬＥＤモジュール
の短絡検査方法を説明するグラフである。FIG. 4 is a graph illustrating an LED module short-circuit inspection method according to a second embodiment of the present invention.
１〜20 ＬＥＤ素子 ４ 短絡が発生しているＬＥＤ素子 Ｇ1 〜Ｇ5 ＬＥＤ素子群1 to 20 LED elements 4 Short-circuited LED elements G 1 to G 5 LED element group
フロントページの続き (58)調査した分野(Int.Cl.6，ＤＢ名) G01R 31/26 G01R 31/02 G09G 3/00 - 3/34 G09F 13/00 - 13/46Continuation of the front page (58) Field surveyed (Int.Cl. 6 , DB name) G01R 31/26 G01R 31/02 G09G 3/00-3/34 G09F 13/00-13/46
Claims (2)
ＬＥＤ素子群を複数個並列に接続してなるＬＥＤモジュ
ールの短絡検査方法において、定格電圧より低い電圧を
印加し、発光したＬＥＤ素子群があれば、当該ＬＥＤ素
子群を構成するＬＥＤ素子に短絡が発生していると判断
することを特徴とするＬＥＤモジュールの短絡検査方
法。1. A method for inspecting short-circuiting of an LED module comprising a plurality of LED elements in which a plurality of LED elements are connected in series, wherein the LED element group emits light by applying a voltage lower than a rated voltage. A short-circuit inspection method for an LED module, wherein it is determined that a short-circuit has occurred in the LED elements constituting the LED element group.
ＬＥＤ素子群を複数個並列に接続してなるＬＥＤモジュ
ールの短絡検査方法において、ＬＥＤモジュールに印加
する電圧を徐々に上昇させつつ電流値をモニターし、電
流値が上昇を始めるポイントが２以上あれば、いずれか
のＬＥＤ素子に短絡が発生していると判断することを特
徴とするＬＥＤモジュールの短絡検査方法。2. A method for inspecting a short circuit of an LED module comprising a plurality of LED elements in which a plurality of LED elements are connected in series, wherein the current value is gradually increased while gradually increasing the voltage applied to the LED module. A short-circuit inspection method for an LED module, wherein if there are two or more points at which the current value starts to rise, it is determined that a short circuit has occurred in any one of the LED elements.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4269555A JP2849967B2 (en) | 1992-09-11 | 1992-09-11 | LED module short circuit inspection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4269555A JP2849967B2 (en) | 1992-09-11 | 1992-09-11 | LED module short circuit inspection method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0694769A JPH0694769A (en) | 1994-04-08 |
| JP2849967B2 true JP2849967B2 (en) | 1999-01-27 |
Family
ID=17474014
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4269555A Expired - Lifetime JP2849967B2 (en) | 1992-09-11 | 1992-09-11 | LED module short circuit inspection method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2849967B2 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5247598B2 (en) * | 2009-06-09 | 2013-07-24 | 三菱電機株式会社 | LED abnormality detection circuit, train indicator, LED drive circuit, and LED abnormality detection method |
| JP2012149946A (en) * | 2011-01-18 | 2012-08-09 | Sharp Corp | Inspection device, inspection method and program |
| EP2752575B1 (en) * | 2011-09-02 | 2017-07-12 | Toyota Jidosha Kabushiki Kaisha | Fuel supply device for internal combustion engine |
| CN103558539A (en) * | 2013-11-07 | 2014-02-05 | 韦胜国 | LED detection method |
-
1992
- 1992-09-11 JP JP4269555A patent/JP2849967B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0694769A (en) | 1994-04-08 |
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