JP2809894B2 - Measurement terminal unit - Google Patents

Measurement terminal unit

Info

Publication number
JP2809894B2
JP2809894B2 JP3104185A JP10418591A JP2809894B2 JP 2809894 B2 JP2809894 B2 JP 2809894B2 JP 3104185 A JP3104185 A JP 3104185A JP 10418591 A JP10418591 A JP 10418591A JP 2809894 B2 JP2809894 B2 JP 2809894B2
Authority
JP
Japan
Prior art keywords
terminal
measuring
measurement
terminals
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP3104185A
Other languages
Japanese (ja)
Other versions
JPH04332872A (en
Inventor
好徳 相良
孝雄 大黒
武美 永岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm Co Ltd
Original Assignee
Rohm Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm Co Ltd filed Critical Rohm Co Ltd
Priority to JP3104185A priority Critical patent/JP2809894B2/en
Publication of JPH04332872A publication Critical patent/JPH04332872A/en
Application granted granted Critical
Publication of JP2809894B2 publication Critical patent/JP2809894B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、チップ抵抗器等の電子
部品の電気的特性(抵抗、電圧、電流等)を測定する際
に用いる測定端子ユニットに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a measuring terminal unit used for measuring electric characteristics (resistance, voltage, current, etc.) of an electronic component such as a chip resistor.

【0002】[0002]

【従来の技術】従来の一般的な測定端子ユニットを図4
に示す。このユニット10は、平面が四角形状を呈する
ベース11と、ベース11に取付けた対の基板ホルダ1
2と、基板ホルダ12に固定した基板13とを有する。
基板13の一端には測定端子14を、他端には測定端子
14と連絡すると共に測定器(図示せず)に接続するリ
ード線15を取付けてある。
2. Description of the Related Art A conventional general measuring terminal unit is shown in FIG.
Shown in The unit 10 includes a base 11 having a square planar shape, and a pair of substrate holders 1 attached to the base 11.
2 and a substrate 13 fixed to the substrate holder 12.
A measuring terminal 14 is attached to one end of the substrate 13, and a lead 15 connected to the measuring terminal 14 and connected to a measuring instrument (not shown) is attached to the other end.

【0003】このユニット10は、例えばチップ抵抗器
の抵抗値を測定するには、図4に示すように、抵抗器2
0の電極23に測定端子14をそれぞれ接触させて使用
する。なお、ここに示したチップ抵抗器20は、基板2
1と、基板21上に設けた抵抗体膜22と、抵抗体膜2
2に接触させて形成した電極23と、抵抗体膜22を覆
う保護外装24とからなる。
[0003] In order to measure the resistance value of a chip resistor, for example, as shown in FIG.
The measurement terminals 14 are used in contact with the 0 electrode 23, respectively. Note that the chip resistor 20 shown here is
1, a resistor film 22 provided on a substrate 21, and a resistor film 2
2, and a protective sheath 24 covering the resistor film 22.

【0004】[0004]

【発明が解決しようとする課題】上記のようなユニット
10は、測定端子14とリード線15を基板13にハン
ダ等によって接続することにより組立てている。そのた
め、多数の電子部品の電気的特性を一度に測定するため
に多数の測定端子14を有するユニットでは、組立に時
間がかかる不利がある。特に、チップ抵抗器等の電子部
品は小サイズであるため、全ての測定端子14について
電子部品の電極幅に対応するように各対の測定端子14
の先端を同一間隔に整列させる調整作業は、大変な手間
を要し、組立時間を長くする大きな要因である。
The unit 10 as described above is assembled by connecting the measuring terminals 14 and the lead wires 15 to the substrate 13 by soldering or the like. Therefore, a unit having a large number of measuring terminals 14 for measuring the electrical characteristics of a large number of electronic components at one time has a disadvantage that it takes time to assemble. In particular, since electronic components such as chip resistors are small in size, each pair of measuring terminals 14 is set so that all measuring terminals 14 correspond to the electrode width of the electronic component.
The adjustment work for aligning the tips of the dies at the same intervals requires a great deal of trouble and is a major factor in prolonging the assembly time.

【0005】又、上記ユニット10では、電子部品の電
極に測定端子14を何度も接触させているうちに、徐々
に測定端子14の先端が摩耗し、先端が不整列になる。
この場合、測定端子14が電極に不均一に接触するの
で、接触圧が一様ではなく、測定値に誤差が生ずる。更
に、従来のユニット10では測定端子14を基板13に
固定してあるのが通常であるため、電極と測定端子14
の先端との間に異物が在ると接触不良を起こし易く、こ
れも正確な測定を阻害することになる。
In the unit 10, while the measurement terminal 14 is in contact with the electrodes of the electronic component many times, the tip of the measurement terminal 14 gradually wears and the tip becomes misaligned.
In this case, since the measurement terminal 14 contacts the electrode non-uniformly, the contact pressure is not uniform and an error occurs in the measured value. Further, in the conventional unit 10, the measurement terminal 14 is usually fixed to the substrate 13, so that the electrode and the measurement terminal 14 are fixed.
If a foreign substance is present between the tip and the tip, poor contact is likely to occur, which also hinders accurate measurement.

【0006】従って、本発明の目的は、容易且つ安価に
製作できると共に、できるだけ測定誤差を少なくするこ
とができる測定端子ユニットを提供することにある。
Accordingly, it is an object of the present invention to provide a measuring terminal unit which can be manufactured easily and inexpensively, and which can reduce a measuring error as much as possible.

【0007】[0007]

【課題を解決するための手段】前記目的を達成するため
の本発明の測定端子ユニットは、ベース板と、電子部品
の電極に先端を接触させる複数の棒状測定端子と、前記
ベース板に移動可能に取付けられ、前記複数の棒状測定
端子を前記ベース板に対し斜方向に固定する固定手段を
有する対の端子ホルダとを備える測定端子ユニットにお
いて、前記対の端子ホルダの固定手段が、前記複数の棒
状測定端子の先端の間隔を個々に調整可能に固定するこ
とを特徴とするものである。
A measuring terminal unit according to the present invention for achieving the above object has a base plate, a plurality of rod-shaped measuring terminals for contacting tips of electrodes of an electronic component, and a movable terminal unit. And a pair of terminal holders having fixing means for fixing the plurality of rod-shaped measuring terminals to the base plate in an oblique direction, wherein the fixing means for the pair of terminal holders comprises the plurality of terminal holders. It is characterized in that the distance between the tips of the rod-shaped measurement terminals is individually adjustable and fixed.

【0008】本発明のユニットでは、従来のユニットの
測定端子に比べて測定端子が長い棒状を呈し、しかもベ
ース板に対して斜方向に測定端子を端子ホルダに取付け
てあるので、電子部品の電極に測定端子の先端を接触さ
せると、加えた力に応じて測定端子が撓み、測定時に必
要な接触圧が得られる。測定端子が摩耗して短くなって
も、端子ホルダを動かすことで必要な接触圧を確保する
ことができる。
In the unit of the present invention, the measuring terminal has a rod shape longer than the measuring terminal of the conventional unit, and the measuring terminal is attached to the terminal holder obliquely with respect to the base plate. When the tip of the measurement terminal is brought into contact with the measurement terminal, the measurement terminal bends in accordance with the applied force, and a contact pressure required for measurement is obtained. Even if the measuring terminal is worn and shortened, the necessary contact pressure can be secured by moving the terminal holder.

【0009】[0009]

【実施例】以下、本発明の測定端子ユニットを実施例に
基づいて説明する。図1にその一実施例を示す。このユ
ニット1は、平面が四角形状を呈するベース板2と、ベ
ース板2に矢印方向に移動可能に取付けた対の端子ホル
ダ3、4と、各端子ホルダ3、4にボルト等(図示せ
ず)で固定した長い棒状の測定端子5、6とを有する。
測定端子5、6はベース板2に対して斜方向に固定され
ており、ボルト等を操作して電子部品の両電極の幅に応
じて測定端子5、6の先端の間隔を調整することができ
る。更に測定端子5、6は測定ケーブル7、8に接続し
てあり、測定時には測定ケーブル7、8を測定器(図示
せず)に接続する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a measuring terminal unit according to the present invention will be described based on embodiments. FIG. 1 shows one embodiment. The unit 1 includes a base plate 2 having a square planar shape, a pair of terminal holders 3 and 4 movably attached to the base plate 2 in the direction of an arrow, and bolts and the like (not shown). ), And has long rod-shaped measurement terminals 5 and 6.
The measuring terminals 5 and 6 are fixed to the base plate 2 in an oblique direction, and the distance between the tips of the measuring terminals 5 and 6 can be adjusted by operating a bolt or the like according to the width of both electrodes of the electronic component. it can. Further, the measuring terminals 5 and 6 are connected to measuring cables 7 and 8, respectively. At the time of measurement, the measuring cables 7 and 8 are connected to a measuring instrument (not shown).

【0010】このようなユニット1は、測定端子5、6
を端子ホルダ3、4にボルト等で固定してあるので、多
数の測定端子を有する場合であっても測定端子を整列さ
せる調整作業は簡易であり、組立時間は従来ほど長くな
らない。上記ユニット1を用いて、例えば電子部品とし
てチップ抵抗器の抵抗値を測定するには次の如く行う。
図2に示すユニット1は基板30上に設けた多数の抵抗
体31(図2では9個)に対応する9対の測定端子5、
6を有する。勿論、各対の測定端子5、6の先端は一定
間隔に整列させてある。このユニット1を基板30の上
方から下げ、各対の測定端子5、6を各抵抗体31の電
極32、33に接触させる(図1参照)。
Such a unit 1 has measuring terminals 5 and 6
Are fixed to the terminal holders 3 and 4 with bolts or the like, so that even if there are a large number of measurement terminals, the adjustment work for aligning the measurement terminals is simple, and the assembling time is not as long as in the past. The following describes how to measure the resistance value of a chip resistor as an electronic component using the unit 1 as an example.
The unit 1 shown in FIG. 2 has nine pairs of measurement terminals 5 corresponding to a large number of resistors 31 (nine in FIG. 2) provided on a substrate 30.
6. Of course, the tips of the measuring terminals 5 and 6 of each pair are arranged at regular intervals. The unit 1 is lowered from above the substrate 30, and the measurement terminals 5 and 6 of each pair are brought into contact with the electrodes 32 and 33 of each resistor 31 (see FIG. 1).

【0011】この時、その接触状態の一部を拡大して示
す図3において、ベース板2を下方向に或る程度の力F
で押せば、測定端子5が撓んで電極32に接触する。こ
の測定端子5の接触形態により、測定時に必要な接触圧
が得られ、測定誤差が生じなくなる。又、測定端子5、
6の先端が使用に伴い摩耗して短くなれば、その都度、
端子ホルダ3、4を互いに接近する方向に動かして、測
定端子5、6の先端を所定間隔に整列させればよい。こ
れと併せて、測定端子5、6を電極32、33に押圧す
る力を大きくしていけば、摩滅以前の長さの測定端子
5、6の接触圧を確保することができる。
At this time, in FIG. 3 showing a part of the contact state in an enlarged manner, the base plate 2 is moved downward by a certain force F.
If it presses, the measuring terminal 5 will bend and contact the electrode 32. Due to the contact form of the measuring terminal 5, a necessary contact pressure is obtained at the time of measurement, and a measurement error does not occur. Also, measuring terminal 5,
When the tip of 6 wears out and shortens with use,
By moving the terminal holders 3 and 4 in a direction approaching each other, the tips of the measuring terminals 5 and 6 may be aligned at predetermined intervals. At the same time, if the force for pressing the measuring terminals 5 and 6 against the electrodes 32 and 33 is increased, the contact pressure of the measuring terminals 5 and 6 before the abrasion can be ensured.

【0012】更に、測定端子5、6の先端と電極32、
33との間に小さな異物が介在しても、力Fを受けた測
定端子5、6は、その先端が電極32、33に接触した
まま僅かに撓むので、小さな異物を容易に除去すること
ができ、正常な測定を行える。
Further, the tips of the measuring terminals 5 and 6 and the electrodes 32,
Even if a small foreign substance is interposed between the measuring terminals 5 and 6, the measuring terminals 5 and 6 that have received the force F slightly bend while their tips are in contact with the electrodes 32 and 33, so that the small foreign substance can be easily removed. And a normal measurement can be performed.

【0013】[0013]

【発明の効果】本発明の測定端子ユニットは、以上説明
したように構成されるので、下記の効果を奏する。 (1)複数の棒状測定端子を固定した端子ホルダ自体を
移動させることができるので、全体の棒状測定端子の先
端間の間隔の調整を行うことができると共に、測定端子
の先端を整列させる調整時間及び組立時間を短縮でき、
測定端子ユニットの組立コストを削減できる。 (2)固定手段により個々の棒状測定端子の先端の位置
を調節できるので、同一端子ホルダに固定されている測
定端子の先端の摩耗による先端間の間隔のバラツキを微
調整でき、摩耗による測定端子の長短によらずに常に一
定の接触圧を得ることができる。そのため、測定誤差が
生じないだけでなく、測定端子の寿命が大幅に延びる。 (3)測定端子と電極との間に異物が在っても、測定端
子が撓むと共に僅かに平行移動することにより、異物を
簡単に取り除くことができるので、異物による測定異常
が殆ど発生しない。
The measuring terminal unit of the present invention has the following effects because it is configured as described above. (1) Since the terminal holder itself to which the plurality of rod-shaped measurement terminals are fixed can be moved, the interval between the tips of the entire rod-shaped measurement terminals can be adjusted, and the adjustment time for aligning the ends of the measurement terminals can be adjusted. And assembly time can be reduced,
The assembly cost of the measuring terminal unit can be reduced. (2) Since the positions of the tips of the individual rod-shaped measurement terminals can be adjusted by the fixing means, variations in the interval between the tips due to wear of the tips of the measurement terminals fixed to the same terminal holder can be finely adjusted, and the measurement terminals due to wear can be finely adjusted. A constant contact pressure can always be obtained regardless of the length of the contact. Therefore, not only no measurement error occurs, but also the life of the measurement terminal is greatly extended. (3) Even if there is a foreign substance between the measuring terminal and the electrode, the measuring terminal bends and moves slightly in parallel, so that the foreign substance can be easily removed, so that measurement abnormality due to the foreign substance hardly occurs. .

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の測定端子ユニット、及びその使用例を
示す側面図である。
FIG. 1 is a side view showing a measuring terminal unit of the present invention and an example of its use.

【図2】図1のユニットの一部透視平面図である。FIG. 2 is a partially transparent plan view of the unit shown in FIG. 1;

【図3】図1のユニットにおける棒状の測定端子と電極
との接触状態の一部を示す拡大図である。
FIG. 3 is an enlarged view showing a part of a contact state between a rod-shaped measurement terminal and an electrode in the unit of FIG. 1;

【図4】従来の測定端子ユニット、及びその使用例を示
す側面図である。
FIG. 4 is a side view showing a conventional measurement terminal unit and an example of its use.

【符号の説明】[Explanation of symbols]

1 測定端子ユニット 2 ベース板 3、4 端子ホルダ 5、6 棒状の測定端子 7、8 測定ケーブル DESCRIPTION OF SYMBOLS 1 Measurement terminal unit 2 Base plate 3, 4 Terminal holder 5, 6 Rod-shaped measurement terminal 7, 8 Measurement cable

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平2−105079(JP,A) 特開 昭51−32181(JP,A) 実開 平3−12172(JP,U) 実開 昭63−95187(JP,U) (58)調査した分野(Int.Cl.6,DB名) G01R 1/073 G01R 31/26 H01L 21/66 G01R 27/02──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-2-105079 (JP, A) JP-A-51-32181 (JP, A) JP-A-3-12172 (JP, U) JP-A-63 95187 (JP, U) (58) Field surveyed (Int. Cl. 6 , DB name) G01R 1/073 G01R 31/26 H01L 21/66 G01R 27/02

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】ベース板と、電子部品の電極に先端を接触
させる複数の棒状測定端子と、前記ベース板に移動可能
に取付けられ、前記複数の捧状測定端子を前記ベース板
に対し斜方向に固定する固定手段を有する対の端子ホル
ダとを備える測定端子ユニットにおいて、 前記対の端子ホルダの固定手段は、前記複数の棒状測定
端子の先端の間隔を個々に調整可能に固定する ことを特
徴とする測定端子ユニット。
1. A tip is brought into contact with a base plate and an electrode of an electronic component.
Multiple rod-shaped measurement terminals to be moved and movable to the base plate
Attached to the base plate
Pair of terminal holders having fixing means for fixing obliquely with respect to
And a means for fixing the pair of terminal holders, wherein the plurality of rod-shaped measurement
A measuring terminal unit characterized in that the distances between the terminal ends are individually adjustable and fixed .
JP3104185A 1991-05-09 1991-05-09 Measurement terminal unit Expired - Fee Related JP2809894B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3104185A JP2809894B2 (en) 1991-05-09 1991-05-09 Measurement terminal unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3104185A JP2809894B2 (en) 1991-05-09 1991-05-09 Measurement terminal unit

Publications (2)

Publication Number Publication Date
JPH04332872A JPH04332872A (en) 1992-11-19
JP2809894B2 true JP2809894B2 (en) 1998-10-15

Family

ID=14373939

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3104185A Expired - Fee Related JP2809894B2 (en) 1991-05-09 1991-05-09 Measurement terminal unit

Country Status (1)

Country Link
JP (1) JP2809894B2 (en)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5811739B2 (en) * 1974-09-11 1983-03-04 松下電器産業株式会社 Hand-made Thai Soshisoku Teiyo Pro - Bubarino Seizouhou
JPS6395187U (en) * 1986-12-10 1988-06-20
JPH0711557B2 (en) * 1988-10-14 1995-02-08 旭化成電子株式会社 Multi-contact probe
JP3012172U (en) * 1994-09-22 1995-06-13 レック株式会社 Cleaning tools for storage cases and toilets

Also Published As

Publication number Publication date
JPH04332872A (en) 1992-11-19

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