JP2664088B2 - Thermal change temperature measurement method - Google Patents
Thermal change temperature measurement methodInfo
- Publication number
- JP2664088B2 JP2664088B2 JP1131790A JP13179089A JP2664088B2 JP 2664088 B2 JP2664088 B2 JP 2664088B2 JP 1131790 A JP1131790 A JP 1131790A JP 13179089 A JP13179089 A JP 13179089A JP 2664088 B2 JP2664088 B2 JP 2664088B2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- sample
- measured
- change temperature
- thermal change
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 title claims description 7
- 238000009529 body temperature measurement Methods 0.000 title 1
- 230000005855 radiation Effects 0.000 claims description 22
- 238000002844 melting Methods 0.000 description 19
- 230000008018 melting Effects 0.000 description 19
- 238000010438 heat treatment Methods 0.000 description 10
- 238000005259 measurement Methods 0.000 description 5
- 229910044991 metal oxide Inorganic materials 0.000 description 3
- 150000004706 metal oxides Chemical class 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 239000003086 colorant Substances 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 150000003671 uranium compounds Chemical class 0.000 description 1
Landscapes
- Radiation Pyrometers (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Description
【発明の詳細な説明】 ［産業上の利用分野］ 本発明は、放射温度計を用いて特に高温領域における
試料の融点その他の熱変化温度を求める熱変化温度測定
方法に関する。Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thermal change temperature measuring method for obtaining a melting point and other thermal change temperatures of a sample particularly in a high temperature region using a radiation thermometer.
［従来の技術］ 例えば、高融点金属、金属酸化物、あるいは、ウラン
化合物その他の融点が高い温度領域にあるような試料の
融点もしくは転移温度等の熱変化温度を測定する場合
は、一般に２色温度計等の放射温度計が用いられてい
る。[Prior Art] For example, when measuring a heat change temperature such as a melting point or a transition temperature of a sample having a high melting point, such as a high melting point metal, a metal oxide, or a uranium compound or the like in a high temperature range, generally uses two colors A radiation thermometer such as a thermometer is used.
ところで、この放射温度計は、一般に測定対象物の放
射率等に応じて所定の定数を選定する必要があり、この
定数が適切なものでないと測定誤差が大きくなる。Incidentally, in this radiation thermometer, it is generally necessary to select a predetermined constant according to the emissivity or the like of the object to be measured. If this constant is not appropriate, a measurement error increases.
［発明が解決しようとする課題］ しかしながら、前記放射温度計の定数を適切なものと
することは必ずしも容易ではなく、通常は、ある測定誤
差を含むことを前提として、大略の値が選定される。し
たがって、一般的に放射温度計によって精密な温度を測
定することは難しいとされている。[Problems to be Solved by the Invention] However, it is not always easy to make the constant of the radiation thermometer appropriate, and generally, an approximate value is selected on the assumption that a certain measurement error is included. . Therefore, it is generally considered difficult to accurately measure the temperature with a radiation thermometer.
このため、前記各物質の融点あるいは転移温度等の熱
変化温度を測定する場合のように、高温における試料の
熱変化温度を正確に求めることは困難であった。For this reason, it has been difficult to accurately determine the thermal change temperature of a sample at a high temperature, as in the case of measuring the thermal change temperature such as the melting point or the transition temperature of each substance.
本発明は、上述の背景のもとでなされたものであり、
比較的簡単な方法により放射温度計によって試料の正確
な熱変化温度を求めることを可能にした熱変化温度測定
方法を提供することを目的としたものである。The present invention has been made under the above-mentioned background,
It is an object of the present invention to provide a method for measuring a thermal change temperature, which enables an accurate thermal change temperature of a sample to be obtained by a radiation thermometer by a relatively simple method.
［課題を解決するための手段］ 本発明は、以下の構成とすることにより、上述の課題
を解決している。[Means for Solving the Problems] The present invention has solved the above-mentioned problems by adopting the following configuration.
熱変化温度が既知の標準試料と、熱変化温度が未知の
被測定試料とを同一の温度で昇降温される環境領域に載
置し、 前記標準試料及び被測定試料の熱変化温度を同一の放
射温度計で測定し、 前記標準試料の既知の熱変化温度に基づいて、前記放
射温度計による前記被測定試料の熱変化温度の測定値を
補正して該被測定試料の熱変化温度を求めることを特徴
とした構成。A standard sample having a known thermal change temperature and a sample to be measured whose thermal change temperature is unknown are placed in an environment area where the temperature is raised and lowered at the same temperature, and the thermal change temperatures of the standard sample and the sample to be measured are the same. Measured by a radiation thermometer, and based on the known thermal change temperature of the standard sample, corrects the measured value of the thermal change temperature of the measured sample by the radiation thermometer to determine the thermal change temperature of the measured sample Configuration characterized by that.
［作用］ 前記構成によれば、標準試料と、被測定試料とが同一
の温度で昇降温される環境領域に載置され、これら被測
定試料及び標準試料の熱変化温度が同一の放射温度計で
測定される。そして、前記放射温度計による前記被測定
試料の熱変化温度の測定値は、前記標準試料の既知の熱
変化温度に基づいて補正される。したがって、放射温度
計の定数如何にかかわらず、常に、被測定試料の正確な
熱変化温度を求めることができる。[Operation] According to the above configuration, the standard sample and the sample to be measured are placed in the environment region where the temperature is raised and lowered at the same temperature, and the radiation thermometer having the same thermal change temperature of the sample to be measured and the standard sample. Is measured. Then, the measured value of the thermal change temperature of the sample to be measured by the radiation thermometer is corrected based on the known thermal change temperature of the standard sample. Therefore, regardless of the constant of the radiation thermometer, an accurate thermal change temperature of the sample to be measured can always be obtained.
［実施例］ 第１図は本発明の一実施例にかかる熱変化温度測定方
法を実施する装置の構成を示す図、第２図は一実施例の
昇温カーブを示すグラフである。以下、これらの図を参
照しながら一実施例を詳細する。なお、この実施例は、
被測定試料の融点を求める例である。Embodiment FIG. 1 is a diagram showing a configuration of an apparatus for implementing a method of measuring a thermal change temperature according to an embodiment of the present invention, and FIG. 2 is a graph showing a heating curve of the embodiment. Hereinafter, an embodiment will be described in detail with reference to these drawings. In this example,
It is an example of obtaining the melting point of a sample to be measured.
第１図において、符号１は加熱ボート、符号２は前記
加熱ボート１を所望の温度カーブで昇・降温させる温度
制御装置、符号３及び４は固定反射鏡、符号５は回転反
射鏡、符号６は２色温度計である。In FIG. 1, reference numeral 1 denotes a heating boat, reference numeral 2 denotes a temperature controller for raising and lowering the temperature of the heating boat 1 at a desired temperature curve, reference numerals 3 and 4 denote fixed reflecting mirrors, reference numeral 5 denotes a rotating reflecting mirror, and reference numeral 6 Is a two-color thermometer.
前記加熱ボート１は融点が極めて高く、かつ、化学的
に安定な金属で構成されており、標準試料７を収容する
標準試料収容部11と、被測定試料８を収容する被測定試
料収容部12とが形成されている。この場合、前記被測定
試料７が、例えば、金属酸化物であるときは、前記標準
試料８として、前記金属酸化物の融点に近い融点を有す
ると予想される融点が既知の高純度物質を用いる。前記
温度制御装置２は、前記加熱ボート１に流す電流ｉを制
御して、該加熱ボートを所望の温度カーブにしたがっ
て、昇・降温する制御を行うもので、例えば、周知のプ
ログラム温度制御装置等で構成される。The heating boat 1 is made of a metal having an extremely high melting point and being chemically stable, and includes a standard sample container 11 for accommodating the standard sample 7 and a sample container 12 for accommodating the sample 8 to be measured. Are formed. In this case, when the sample 7 to be measured is, for example, a metal oxide, a high-purity substance having a known melting point expected to have a melting point close to the melting point of the metal oxide is used as the standard sample 8. . The temperature control device 2 controls a current i flowing through the heating boat 1 so as to raise and lower the temperature of the heating boat according to a desired temperature curve. For example, a known program temperature control device or the like is used. It consists of.
前記固定反射鏡３及び４、並びに、前記回転反射鏡５
は、前記加熱ボート１における標準試料収容部11と、被
測定試料収容部12とからそれぞれ輻射される熱輻射線h1
とh2とを反射してともに前記２色温度計６に導く。すな
わち、前記反射鏡３及び４は、前記標準試料収容部11か
ら図中垂直方向に輻射される熱輻射線h1と、前記被測定
試料収容部12から図中垂直方向に輻射される熱輻射線h2
とを図中平行方向に反射する。そして、前記回転反射鏡
５は、これら水平方向に反射された熱輻射線h1及びh2を
交互に反射して前記２色温度計６に導くものである。The fixed reflecting mirrors 3 and 4 and the rotating reflecting mirror 5
Is a heat radiation ray h 1 radiated from the standard sample storage unit 11 and the measured sample storage unit 12 in the heating boat 1, respectively.
And h 2 are reflected and guided together to the two-color thermometer 6. That is, the reflecting mirror 3 and 4, the standard sample storage unit 11 and the heat radiation h 1 radiated in the vertical direction in the figure, the thermal radiation radiated from the measured sample holding 12 in the vertical direction in FIG. Line h 2
Are reflected in a parallel direction in the figure. The rotary reflecting mirror 5 alternately reflects the heat radiation rays h 1 and h 2 reflected in the horizontal direction and guides the heat radiation rays h 1 and h 2 to the two-color thermometer 6.
前記２色温度計６は、前記熱輻射線h1及びh2を検出
し、放射率等に基づいて設定された定数によって温度に
換算して表示し、あるいは、外部に出力する。したがっ
て、例えば、前記温度制御装置２によって前記加熱ボー
ド１を一定の昇温速度装置で昇温させると、前記２色温
度計６で測定される温度は、第２図の直線Ａ（Ｔ＝at）
で示されるように変化する。なお、第２図において、横
軸は時間（ｔ）、縦軸は温度（Ｔ）である。The two-color thermometer 6 detects the thermal radiation h 1 and h 2, and displays in terms of temperature by setting constants based on the emissivity, etc., or output to the outside. Therefore, for example, when the temperature of the heating board 1 is increased by the temperature control device 2 with a constant heating rate device, the temperature measured by the two-color thermometer 6 becomes equal to the straight line A (T = at )
Changes as shown by. In FIG. 2, the horizontal axis represents time (t), and the vertical axis represents temperature (T).
ここで、時間tRにおいて、標準試料７が融解し、ま
た、時間tSにおいて、被測定試料８が融解したとする。
そうすると、これらそれぞれの時点において、測定温度
が前記直線Ａから僅にずれてそれぞれ小さなピーク状の
曲線pR及びpSを描く。これにより、各融点の測定値を知
ることができる。Here, at time t R, standard sample 7 melts, also at time t S, and the measurement sample 8 had melted.
Then, at each of these times, the measured temperature slightly deviates from the straight line A to draw small peak-shaped curves p R and p S , respectively. Thereby, the measured value of each melting point can be known.
いま、これら融点の測定値がそれぞれTR（標準試料）
及びTS（被測定試料）であり、一方、前記標準試料７の
真の融点（文献値）がTRCであったとする。この場合に
は、以下のようにして被測定試料８の真の融点TSCを求
めることができる。Now, the measured values of these melting points are T R (standard sample), respectively.
And T s (sample to be measured), while the true melting point (literature value) of the standard sample 7 is TRC . In this case, it is possible in the following finding a true melting point T SC of the measured sample 8.
直接Ａを表す式、Ｔ＝ａ・ｔから、 TRC＝ａ・tR である。したがって、 ａ＝TRC/tR である。よって、 TSC＝ａ・tS＝｛TRC/tR｝・tS ＝TRC｛tS/tR｝ ＝TRC｛TS/TR｝ すなわち、被測定試料８の真の融点TSCは、標準試料
７の真の融点（文献値＝既知）TRCと、前記２色温度計
６による被測定試料８及び標準試料７のそれぞれの融点
の測定温度TS及びTRから算出される。Expression directly representing the A, from T = a · t, which is T RC = a · t R. Therefore, it is a = T RC / t R. Therefore, T SC = a · t S = ｛T RC / t R ｝ · t S = T RC ｛t S / t R ｝ = T RC ｛T S / T R ｝ That is, the true melting point of the sample 8 to be measured TSC is calculated from the true melting point (reference value = known) TRC of the standard sample 7 and the measurement temperatures T S and T R of the melting points of the sample 8 and the standard sample 7 measured by the two-color thermometer 6. Is done.
上述の一実施例によれば、求められた被測定試料の融
点は、前記融点が既知の標準試料によって最終的に補正
されたものである。したがって、２色温度計の設定定数
如何にかかわらず、常に正確な温度を求めることができ
る。According to the above-described embodiment, the obtained melting point of the sample to be measured is finally corrected by a standard sample whose melting point is known. Therefore, an accurate temperature can always be obtained regardless of the setting constant of the two-color thermometer.
なお、前記一実施例では、標準試料を一種類用いる例
を掲げたが、これは、複数種類用いてもよく、その場合
には、さらに、正確な温度を求めることが可能となる。In the above-described embodiment, an example in which one type of standard sample is used has been described. However, a plurality of types may be used. In such a case, more accurate temperature can be obtained.
［発明の効果］ 以上、詳述したように、本発明は、 熱変化温度が既知の標準試料と、熱変化温度が未知の
被測定試料とを同一の温度で昇降温される環境領域に載
置し、 前記標準試料及び被測定試料の熱変化温度を同一の放
射温度計で測定し、 前記標準試料の既知の熱変化温度に基づいて、前期放
射温度計による前記被測定試料の熱変化温度の測定値を
補正して該被測定試料の熱変化温度を求めることを特徴
として構成とすることにより、比較的簡単に放射温度計
によって試料の正確な熱変化温度を求めることを可能に
したものである。[Effects of the Invention] As described above in detail, the present invention mounts a standard sample having a known thermal change temperature and a measured sample having an unknown thermal change temperature in an environment region where the temperature is raised and lowered at the same temperature. Measuring the thermal change temperature of the standard sample and the measured sample with the same radiation thermometer, and based on the known thermal change temperature of the standard sample, the thermal change temperature of the measured sample measured by the radiation thermometer. It is possible to obtain the accurate heat change temperature of the sample relatively easily by using a radiation thermometer, by compensating the measured value of the above and calculating the heat change temperature of the sample to be measured. It is.
第１図は本発明の一実施例にかかる熱変化温度測定方法
を実施する装置の構成を示す図、第２図は一実施例の昇
温カーブを示すグラフである。 １……加熱ボート、２……温度制御装置、3,4……固定
反射鏡、５……回転反射鏡、６……２色温度計、７……
標準試料、８……被測定試料、11……標準試料収容部、
12……被測定試料収容部。FIG. 1 is a diagram showing a configuration of an apparatus for performing a method of measuring a heat change temperature according to an embodiment of the present invention, and FIG. 2 is a graph showing a temperature rise curve of the embodiment. 1 ... heating boat, 2 ... temperature controller, 3,4 ... fixed reflecting mirror, 5 ... rotating reflecting mirror, 6 ... two-color thermometer, 7 ...
Standard sample, 8 ... Sample to be measured, 11 ... Standard sample container,
12 ... Measurement section for sample to be measured.
Claims (1)
度が未知の被測定試料とを同一の温度で昇降温される環
境領域に載置し、 前記標準試料及び被測定試料の熱変化温度を同一の放射
温度計で測定し、 前記標準試料の既知の熱変化温度に基づいて、前記放射
温度計による前記被測定試料の熱変化温度の測定値を補
正して該被測定試料の熱変化温度を求めることを特徴と
した熱変化温度測定方法。1. A standard sample whose thermal change temperature is known and a test sample whose thermal change temperature is unknown are placed in an environment region where the temperature is raised and lowered at the same temperature, and the heat of the standard sample and the test sample is measured. The change temperature is measured by the same radiation thermometer, and based on the known heat change temperature of the standard sample, the measured value of the heat change temperature of the sample to be measured by the radiation thermometer is corrected and the A method for measuring a thermal change temperature, which comprises determining a thermal change temperature.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1131790A JP2664088B2 (en) | 1989-05-25 | 1989-05-25 | Thermal change temperature measurement method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1131790A JP2664088B2 (en) | 1989-05-25 | 1989-05-25 | Thermal change temperature measurement method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02310451A JPH02310451A (en) | 1990-12-26 |
| JP2664088B2 true JP2664088B2 (en) | 1997-10-15 |
Family
ID=15066196
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1131790A Expired - Lifetime JP2664088B2 (en) | 1989-05-25 | 1989-05-25 | Thermal change temperature measurement method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2664088B2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE69133236T2 (en) * | 1991-04-26 | 2004-02-26 | Mitsubishi Materials Corp. | Single crystal growing method |
| JP4510393B2 (en) * | 2003-03-17 | 2010-07-21 | 日本碍子株式会社 | Temperature adjustment method |
| JP2012247381A (en) * | 2011-05-31 | 2012-12-13 | Ihi Corp | Device for measuring temperature of weld zone |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51985A (en) * | 1974-06-21 | 1976-01-07 | Seiichi Okuhara | Yokaishiteirumonoga gyokosurutokino ondohenkaokirokusurusochi |
-
1989
- 1989-05-25 JP JP1131790A patent/JP2664088B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH02310451A (en) | 1990-12-26 |
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