JP2661453B2 - Electrode connection tool and semiconductor device electrode connection device - Google Patents

Electrode connection tool and semiconductor device electrode connection device

Info

Publication number
JP2661453B2
JP2661453B2 JP5336892A JP5336892A JP2661453B2 JP 2661453 B2 JP2661453 B2 JP 2661453B2 JP 5336892 A JP5336892 A JP 5336892A JP 5336892 A JP5336892 A JP 5336892A JP 2661453 B2 JP2661453 B2 JP 2661453B2
Authority
JP
Japan
Prior art keywords
electrode connection
electrode
connection tool
tool
heater
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP5336892A
Other languages
Japanese (ja)
Other versions
JPH05259229A (en
Inventor
千春 若松
良信 竹下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP5336892A priority Critical patent/JP2661453B2/en
Publication of JPH05259229A publication Critical patent/JPH05259229A/en
Application granted granted Critical
Publication of JP2661453B2 publication Critical patent/JP2661453B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は半導体素子の電極と外部
リードとを接続するための電極接続ツールおよび半導体
素子電極接続装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electrode connecting tool for connecting an electrode of a semiconductor device to an external lead and a semiconductor device electrode connecting device.

【0002】[0002]

【従来の技術】近年、半導体素子の実装方式としてワイ
ヤーボンド方式に替わり樹脂フィルム上に銅箔でリード
を形成したフィルムキャリヤ(以下TABテープ(TA
B:Tape Automated Bonding )という)を用いるTAB
実装方式が主流となってきている。TAB実装方式で半
導体素子上の電極とTABテープのリードを電気的に接
続するには電極を一つずつ接続していくシングルポイン
ト接合方式と、半導体素子の全電極を一括して接続する
ギャング接合方式があるが、半導体素子の高密度化、多
ピン化、高信頼性化に対応し易いシングルポイント接合
方式が注目されてきている。
2. Description of the Related Art In recent years, as a semiconductor element mounting method, a film carrier (hereinafter referred to as TAB tape (TAB)) in which a lead is formed on a resin film with a copper foil instead of a wire bond method.
B: TAB using Tape Automated Bonding)
The mounting method is becoming mainstream. In order to electrically connect the electrodes on the semiconductor device and the leads of the TAB tape in the TAB mounting method, a single point bonding method in which the electrodes are connected one by one and a gang bonding in which all the electrodes of the semiconductor device are connected collectively Although there is a method, a single-point bonding method, which is easy to cope with high density, high pin count, and high reliability of a semiconductor element, has been attracting attention.

【0003】以下に従来のシングルポイント接合方式に
使用する電極接続ツールおよび半導体素子電極接続装置
について説明する。図4(a)は従来の電極接続ツール
の上面図、図4(b)はその側面図である。これらの図
に示すように、電極接続ツール1はチタンカーバイト等
の丸棒を加工して製作され、その一方の端は保持部1
a、他方の端は円錐状に加工され先端面積を小さくしT
ABテープの電極リードに大きな圧力がかかるようにし
た圧着部1bとなっている。また電極接続ツール1の軸
中央部は丸棒のまま残し、そこにニクロム線等からなる
コイル状のヒータ2を巻きつけている。
An electrode connection tool and a semiconductor device electrode connection device used in a conventional single point bonding method will be described below. FIG. 4A is a top view of a conventional electrode connection tool, and FIG. 4B is a side view thereof. As shown in these figures, the electrode connection tool 1 is manufactured by processing a round bar such as titanium carbide, and one end thereof is held by the holding portion 1.
a, the other end is machined in a conical shape to reduce the tip area
The crimping portion 1b is configured to apply a large pressure to the electrode lead of the AB tape. A central portion of the axis of the electrode connection tool 1 is left as a round bar, and a coil-shaped heater 2 made of a nichrome wire or the like is wound therearound.

【0004】次に従来の半導体素子電極接続装置につい
て説明する。図5はその半導体素子電極接続装置の要部
斜視図である。図5に示すように、電極接続ユニット3
は保持ブロック4に超音波を伝達するホーン5を取り付
けた構成で、ホーン5の先端にはヒータ2を取り付けた
電極接続ツール1が装着されている。電極接続ツール1
の正面には、TABテープ6をガイドするテープガイド
7、半導体素子8を搭載したチップステージ9が配置さ
れている。
Next, a conventional semiconductor device electrode connection device will be described. FIG. 5 is a perspective view of a main part of the semiconductor device electrode connection device. As shown in FIG. 5, the electrode connection unit 3
Has a configuration in which a horn 5 for transmitting ultrasonic waves is attached to the holding block 4, and an electrode connection tool 1 to which a heater 2 is attached is attached to a tip of the horn 5. Electrode connection tool 1
A tape guide 7 for guiding a TAB tape 6 and a chip stage 9 on which a semiconductor element 8 is mounted are arranged in front of the device.

【0005】以上のように構成された半導体素子電極接
続装置の動作について、図6に示す電極接続ユニット3
の要部斜視図を参照しながら説明する。半導体接続装置
本体(図示せず)を運転するとチップステージ9上に載
せられた半導体素子8の電極10とTABテープ6のリ
ード11が対向するように位置合わせされる。次にヒー
タ2で加熱された電極接続ツール1が半導体素子8の電
極10に位置合わせされたTABテープ6の1つのリー
ド11の上に降下し、リード11を半導体素子8の電極
10に圧着する。この動作を順次各リード11について
繰り返し、半導体素子8とTABテープ6とが電気的、
機械的に接続される。このとき電極接続ツール1に取り
付けられたヒータ2には電極接続ツール1の動作や周囲
環境温度の変化に関係なく、予め設定された一定量の電
力が電源12から供給され、ヒータ2が発熱して電極接
続ツール1を加熱している。
[0005] The operation of the semiconductor device electrode connection device constructed as described above will be described with reference to the electrode connection unit 3 shown in FIG.
This will be described with reference to the perspective view of the main part of FIG. When the semiconductor connection device main body (not shown) is operated, the electrodes 10 of the semiconductor element 8 mounted on the chip stage 9 are aligned with the leads 11 of the TAB tape 6 so as to face each other. Next, the electrode connection tool 1 heated by the heater 2 is lowered onto one lead 11 of the TAB tape 6 aligned with the electrode 10 of the semiconductor element 8, and the lead 11 is pressed against the electrode 10 of the semiconductor element 8. . This operation is sequentially repeated for each lead 11 so that the semiconductor element 8 and the TAB tape 6 are electrically connected to each other.
Connected mechanically. At this time, a predetermined fixed amount of power is supplied from the power supply 12 to the heater 2 attached to the electrode connection tool 1 irrespective of the operation of the electrode connection tool 1 or a change in the ambient temperature, and the heater 2 generates heat. The electrode connection tool 1 is heated.

【0006】[0006]

【発明が解決しようとする課題】しかしながら上記の従
来の電極接続ツールでは、電極接続ツールの上下動によ
り電極接続ツールに取り付けられているコイル状のヒー
タが上下に動くので加熱ポイントが刻々変動し電極接続
ツールの温度が不安定になると共に、ヒータと電極接続
ツールの摺動によってヒータが摩耗し劣化して寿命が短
くなるという課題を有していた。また従来の電極接続ツ
ールを用いた半導体素子電極接続装置では予め設定され
た一定の電力が供給されてヒータが加熱されるため、電
極接続ツールの温度は外部温度や空気流動などの外乱の
発生や電極接続ツールの動作による状態変化に対応でき
ず、常に変動してしまうという課題を有していた。
However, in the above-mentioned conventional electrode connection tool, the coil-shaped heater attached to the electrode connection tool moves up and down due to the up and down movement of the electrode connection tool. There has been a problem that the temperature of the connection tool becomes unstable, and the heater wears and deteriorates due to sliding between the heater and the electrode connection tool, thereby shortening the life. Also, in a conventional semiconductor device electrode connection device using an electrode connection tool, a predetermined constant power is supplied to heat the heater, so that the temperature of the electrode connection tool may be caused by disturbances such as external temperature and air flow. There was a problem that it was not possible to cope with a state change due to the operation of the electrode connection tool, and the state always fluctuated.

【0007】本発明は上記の従来の課題を解決するもの
で、効率よく安定してヒータの熱を伝達でき、ヒータの
摺動摩耗等による劣化を抑止できる電極接続ツールおよ
びこの電極接続ツールを用いた半導体素子電極接続装置
を提供することを目的とする。
SUMMARY OF THE INVENTION The present invention solves the above-mentioned conventional problems, and uses an electrode connecting tool capable of efficiently and stably transmitting heat of a heater and suppressing deterioration due to sliding wear of the heater and a method of using the electrode connecting tool. It is an object of the present invention to provide a semiconductor device electrode connection device.

【0008】[0008]

【課題を解決するための手段】この目的を達成するため
に本発明の電極接続ツールは、円柱体の一方の端が保持
部で他方の端が半導体素子の電極に重ねたリードを圧着
するために円錐状に加工された圧着部であり、保持部側
の端面から軸方向に非貫通の穴を有し、かつ保持部と圧
着部との間に保持部より径の細い部分を有するものであ
る。
In order to achieve this object, an electrode connecting tool according to the present invention is designed to crimp a lead in which one end of a cylindrical body is held by a holding portion and the other end is overlapped with an electrode of a semiconductor element. A crimped portion processed into a conical shape, having a non-through hole in the axial direction from the end face on the holding portion side, and having a portion smaller in diameter than the holding portion between the holding portion and the crimping portion. is there.

【0009】また本発明の半導体素子電極接続装置はそ
の電極接続ユニットに上記の電極接続ツールが取り付け
られており、その電極接続ツールの径の細い部分にヒー
タ線が巻き付けられて外部から供給される電力により加
熱され、かつ保持部側の端面から軸方向に形成された穴
に挿入された温度測定素子からの情報を受けて電極接続
ツールの温度を制御する構成を有している。
Further, in the semiconductor device electrode connection device of the present invention, the above electrode connection tool is attached to the electrode connection unit, and a heater wire is wound around a narrow portion of the electrode connection tool and supplied from outside. It has a configuration in which the temperature of the electrode connection tool is controlled by receiving information from a temperature measuring element that is heated by electric power and inserted into a hole formed in the axial direction from the end face on the holding section side.

【0010】[0010]

【作用】この電極接続ツールの構成によって、上下動に
よるヒータの摺動摩耗を防ぎ、軸方向に設けた非貫通の
穴は温度測定素子の固定を容易にすると共に最も必要な
電極接続ツール先端の温度をより近い位置で測定して精
度の高い情報を得ることができる。
With the configuration of the electrode connection tool, sliding wear of the heater due to vertical movement is prevented, and a non-through hole provided in the axial direction facilitates fixing of the temperature measuring element and at the tip of the most necessary electrode connection tool. Temperature can be measured at a closer position to obtain highly accurate information.

【0011】また上記の電極接続ツールを用いた半導体
素子電極接続装置は、電極接続ツールの温度が外部温度
や空気流動などの外乱の発生や電極接続ツールの動作に
よる状態変化に即応することができるため、常に安定し
た電極接続ができる。
The semiconductor device electrode connecting device using the above electrode connecting tool can immediately respond to the temperature change of the electrode connecting tool due to the occurrence of disturbances such as an external temperature and air flow and the state change due to the operation of the electrode connecting tool. Therefore, stable electrode connection can always be achieved.

【0012】[0012]

【実施例】以下本発明の一実施例について、図面を参照
しながら説明する。図1(a)は本発明の一実施例にお
ける電極接続ツールの上面図、図1(b)はその側面図
である。これらの図に示すように、電極接続ツール21
はチタンカーバイト等の丸棒材を加工して製作され、そ
の一方の端は保持部21a、他端は円錐状に加工され先
端面積を小さくしTABテープの電極リードに大きな圧
力がかかるようにした圧着部21bであり、その中間部
は保持部21aより径の細い部分21c(以下ヒータ取
付部という)となっている。また保持部21a側の端面
から軸方向に非貫通の穴22が形成され、ヒータ取付部
21cにはヒータ23が取り付けられている。このヒー
タ取付部21cの加工深さはヒータ23の直径によって
適宜変更する必要がある。また図1(b)では温度測定
素子を挿入する穴22としてヒータ取付部21cの中間
まで加工した例を示したが、穴22の先端はできるだけ
圧着部21bに近い方がよい。
An embodiment of the present invention will be described below with reference to the drawings. FIG. 1A is a top view of an electrode connection tool according to an embodiment of the present invention, and FIG. 1B is a side view thereof. As shown in these figures, the electrode connection tool 21
Is manufactured by processing a round bar material such as titanium carbide, one end of which is formed into a holding portion 21a and the other end thereof is formed into a conical shape so that the tip area is reduced so that a large pressure is applied to the electrode lead of the TAB tape. The intermediate portion is a portion 21c having a smaller diameter than the holding portion 21a (hereinafter, referred to as a heater mounting portion). A non-through hole 22 is formed in the axial direction from the end face on the holding portion 21a side, and a heater 23 is mounted on the heater mounting portion 21c. The processing depth of the heater mounting portion 21c needs to be appropriately changed according to the diameter of the heater 23. FIG. 1B shows an example in which the hole 22 into which the temperature measuring element is inserted is formed up to the middle of the heater mounting portion 21c. However, the tip of the hole 22 is preferably as close as possible to the crimping portion 21b.

【0013】次に本発明の一実施例における半導体素子
電極接続装置について説明する。図2はその半導体素子
電極接続装置の要部斜視図である。図2に示すように、
電極接続ユニット24は保持ブロック25に超音波を伝
達するホーン26を取り付けた構成で、ホーン26の先
端にはヒータ23および熱電対27を取り付けた電極接
続ツール21が装着されている。電極接続ツール21の
正面には、TABテープ28をガイドするテープガイド
29、半導体素子30を搭載したチップステージ31が
配置されている。なお熱電対27は、図1に示した電極
接続ツール21の端面から軸方向に形成した穴22に挿
入されている。
Next, a semiconductor device electrode connecting device according to an embodiment of the present invention will be described. FIG. 2 is a perspective view of a main part of the semiconductor device electrode connection device. As shown in FIG.
The electrode connection unit 24 has a configuration in which a horn 26 for transmitting ultrasonic waves is attached to a holding block 25, and an electrode connection tool 21 to which a heater 23 and a thermocouple 27 are attached is attached to a tip of the horn 26. A tape guide 29 for guiding a TAB tape 28 and a chip stage 31 on which a semiconductor element 30 is mounted are arranged in front of the electrode connection tool 21. The thermocouple 27 is inserted into a hole 22 formed in the axial direction from the end face of the electrode connection tool 21 shown in FIG.

【0014】以上のように構成された半導体素子電極接
続装置の動作について、図3に示す電極接続ユニット2
4の要部斜視図を参照しながら説明する。半導体接続装
置本体(図示せず)を運転するとチップステージ31上
に載せられた半導体素子30の電極34とTABテープ
28のリード32が対向するように位置合わせされる。
次にヒータ23で加熱された電極接続ツール21が半導
体素子30の電極34に位置合わせされたTABテープ
28の1つのリード32の上に降下し、リード32を半
導体素子30の電極34に圧着する。この動作を順次各
リード32について繰り返し、半導体素子30とTAB
テープ28とが電気的、機械的に接続される。電極接続
ツール21はヒータ23で加熱され、熱電対27は電極
接続ツール21の温度を測定して熱起電力を温度調節器
32に送り、温度調整器32で予め設定した温度に対し
低いか高いかを判定してヒータ23に電流を供給する電
源33の出力を制御しヒータ23の発熱量を調節する。
このようにして電極接続ツール21の温度を制御し電極
接続に最適な温度を安定的に保つことができる
The operation of the semiconductor device electrode connection device constructed as described above will be described with reference to the electrode connection unit 2 shown in FIG.
4 will be described with reference to a perspective view of a main part. When the semiconductor connection device main body (not shown) is operated, the electrodes 34 of the semiconductor element 30 mounted on the chip stage 31 are aligned with the leads 32 of the TAB tape 28 so as to face each other.
Next, the electrode connection tool 21 heated by the heater 23 descends onto one lead 32 of the TAB tape 28 aligned with the electrode 34 of the semiconductor element 30, and presses the lead 32 to the electrode 34 of the semiconductor element 30. . This operation is sequentially repeated for each lead 32, and the semiconductor device 30 and the TAB
The tape 28 is electrically and mechanically connected. The electrode connecting tool 21 is heated by the heater 23, and the thermocouple 27 measures the temperature of the electrode connecting tool 21 and sends a thermoelectromotive force to the temperature controller 32, which is lower or higher than a temperature preset by the temperature controller 32. Then, the output of the power supply 33 that supplies a current to the heater 23 is controlled to adjust the amount of heat generated by the heater 23.
In this way, the temperature of the electrode connection tool 21 can be controlled to stably maintain the optimum temperature for electrode connection.

【0015】[0015]

【発明の効果】以上のように本発明は、TAB実装のシ
ングルポイント方式に用いる電極接続ツールにヒータを
取り付ける部分と温度測定素子を挿入する非貫通の穴を
設けた構成により温度安定性に優れ、長期間の使用に耐
える電極接続ツールを実現できるものであり、この電極
接続ツールを使用して温度測定素子による測定結果をヒ
ータ加熱電流にフィードバックすることにより電極接続
ツールの動作、周囲環境温度および空気流動等の変化に
対しても安定して電極接続ツールの温度を最適接合温度
に保持でき、高品質の電極接合ができる優れた半導体素
子電極接続装置を実現できるものである。
As described above, according to the present invention, the electrode connection tool used for the single point method of TAB mounting is provided with a portion for attaching a heater and a non-through hole for inserting a temperature measuring element, thereby providing excellent temperature stability. It can realize an electrode connection tool that can withstand long-term use. By using this electrode connection tool to feed back the measurement result of the temperature measuring element to the heater heating current, the operation of the electrode connection tool, the ambient environment temperature and It is possible to stably maintain the temperature of the electrode connection tool at an optimum bonding temperature even with a change in air flow or the like, and to realize an excellent semiconductor device electrode connection device capable of performing high quality electrode bonding.

【図面の簡単な説明】[Brief description of the drawings]

【図1】(a)は本発明の一実施例における電極接続ツ
ールの上面図 (b)は同電極接続ツールの側面図
FIG. 1A is a top view of an electrode connection tool according to an embodiment of the present invention. FIG. 1B is a side view of the electrode connection tool.

【図2】本発明の一実施例における半導体素子電極接続
装置の要部斜視図
FIG. 2 is a perspective view of a main part of a semiconductor device electrode connection device according to an embodiment of the present invention.

【図3】同半導体素子電極接続装置の電極接続ユニット
の要部斜視図
FIG. 3 is a perspective view of a main part of an electrode connection unit of the semiconductor device electrode connection device.

【図4】(a)は従来の電極接続ツールの上面図 (b)は同電極接続ツールの側面図FIG. 4A is a top view of a conventional electrode connection tool. FIG. 4B is a side view of the electrode connection tool.

【図5】従来の半導体素子電極接続装置の要部斜視図FIG. 5 is a perspective view of a main part of a conventional semiconductor device electrode connection device.

【図6】同半導体素子電極接続装置の電極接続ユニット
の要部斜視図
FIG. 6 is a perspective view of a main part of an electrode connection unit of the semiconductor device electrode connection device.

【符号の説明】[Explanation of symbols]

21 電極接続ツール 21a 保持部 21b 圧着部 21c ヒータ取付部(径の細い部分) 22 穴 21 electrode connection tool 21a holding part 21b crimping part 21c heater mounting part (part with small diameter) 22 hole

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 円柱体の一方の端が保持部で、他方の端
が半導体素子の電極に重ねたリードを圧着するために円
錐状に加工された圧着部であり、前記保持部側の端面か
ら軸方向に非貫通の穴を有し、かつ前記保持部と圧着部
との間に保持部より径の細い部分を有する電極接続ツー
ル。
1. One end of a cylindrical body is a holding portion, and the other end is a crimping portion processed into a conical shape for crimping a lead superposed on an electrode of a semiconductor element, and an end surface on the holding portion side. An electrode connection tool having a hole that is not penetrated in the axial direction from the first direction, and having a portion smaller in diameter than the holding portion between the holding portion and the crimping portion.
【請求項2】 少なくとも半導体素子を載置するステー
ジと、フィルムキャリヤを供給するフィルムキャリヤ供
給部と、フィルムキャリヤのリードと半導体素子上の電
極とを位置合わせする位置合わせ部と、前記リードと半
導体素子上の電極とを接合する電極接続ユニットとを有
し、前記電極接続ユニットには請求項1記載の電極接続
ツールが取り付けられており、その電極接続ツールの径
の細い部分にヒータが巻き付けられて外部から供給され
る電力により加熱され、かつ穴に挿入された温度測定素
子からの情報を受けて前記電極接続ツールの温度を制御
する半導体素子電極接続装置。
2. A stage for mounting at least a semiconductor element, a film carrier supply section for supplying a film carrier, an alignment section for aligning a lead of the film carrier with an electrode on the semiconductor element, and the lead and the semiconductor. An electrode connection unit for joining an electrode on the element, wherein the electrode connection tool according to claim 1 is attached to the electrode connection unit, and a heater is wound around a thin portion of the electrode connection tool. A semiconductor element electrode connection device for controlling the temperature of the electrode connection tool by receiving information from a temperature measuring element inserted into the hole and heated by externally supplied electric power.
JP5336892A 1992-03-12 1992-03-12 Electrode connection tool and semiconductor device electrode connection device Expired - Fee Related JP2661453B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5336892A JP2661453B2 (en) 1992-03-12 1992-03-12 Electrode connection tool and semiconductor device electrode connection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5336892A JP2661453B2 (en) 1992-03-12 1992-03-12 Electrode connection tool and semiconductor device electrode connection device

Publications (2)

Publication Number Publication Date
JPH05259229A JPH05259229A (en) 1993-10-08
JP2661453B2 true JP2661453B2 (en) 1997-10-08

Family

ID=12940877

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5336892A Expired - Fee Related JP2661453B2 (en) 1992-03-12 1992-03-12 Electrode connection tool and semiconductor device electrode connection device

Country Status (1)

Country Link
JP (1) JP2661453B2 (en)

Also Published As

Publication number Publication date
JPH05259229A (en) 1993-10-08

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