JP2623748B2 - Thick film circuit device - Google Patents

Thick film circuit device

Info

Publication number
JP2623748B2
JP2623748B2 JP63209895A JP20989588A JP2623748B2 JP 2623748 B2 JP2623748 B2 JP 2623748B2 JP 63209895 A JP63209895 A JP 63209895A JP 20989588 A JP20989588 A JP 20989588A JP 2623748 B2 JP2623748 B2 JP 2623748B2
Authority
JP
Japan
Prior art keywords
insulating cloth
printing
resistor
circuit device
film circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP63209895A
Other languages
Japanese (ja)
Other versions
JPH0258392A (en
Inventor
元一 渡辺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP63209895A priority Critical patent/JP2623748B2/en
Publication of JPH0258392A publication Critical patent/JPH0258392A/en
Application granted granted Critical
Publication of JP2623748B2 publication Critical patent/JP2623748B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Parts Printed On Printed Circuit Boards (AREA)
  • Non-Adjustable Resistors (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)

Description

【発明の詳細な説明】 (イ)産業上の利用分野 この発明は、ハイブリッドIC等の厚膜回路装置に関す
る。
The present invention relates to a thick film circuit device such as a hybrid IC.

(ロ)従来の技術 第3図(A)は、従来の厚膜回路装置を示す要部平面
図、第3図(B)は断面図である。
(B) Conventional technology FIG. 3 (A) is a plan view of a main part showing a conventional thick film circuit device, and FIG. 3 (B) is a sectional view.

厚膜回路装置は、第3図(A)に示すように基板71の
上面に、それぞれ対向する下層導体パターン72、72を印
刷形成し、各下層導体パターン72の基端部側の上面に直
交状に絶縁クロス73を印刷形成し、この絶縁クロス73上
に上層導体パターン74を印刷形成している。この上層導
体パターン74は、両端部を前記基板71上に形成した下層
導体75と接続している。更に、各下層導体パターン72の
先端側、つまり各上層導体パターン72を構成する2本の
上層導体72a、72aの先端側に、各上層導体72a、72a間を
接続する抵抗体76を印刷形成している。
In the thick film circuit device, as shown in FIG. 3 (A), opposing lower conductor patterns 72, 72 are formed on the upper surface of the substrate 71 by printing, respectively, An insulating cloth 73 is formed by printing in a shape, and an upper layer conductor pattern 74 is formed by printing on the insulating cloth 73. Both ends of the upper conductor pattern 74 are connected to a lower conductor 75 formed on the substrate 71. Further, a resistor 76 for connecting between the upper conductors 72a, 72a is formed by printing on the tip side of each lower conductor pattern 72, that is, on the tip side of the two upper conductors 72a, 72a constituting each upper conductor pattern 72. ing.

(ハ)発明が解決しようとする課題 一般に、厚膜回路装置において、抵抗体(印刷抵抗)
の抵抗値は、R=ρ・L/Wで表される。Lは長さ、Wは
幅、ρはシート抵抗である。つまり、ρは印刷時の乾燥
膜厚が一定での製造プロセスにおいて決定され、L及び
Wは各寸法につき印刷し一定の製造プロセスにおいてア
スペクト比(L/W)とRとの関係式として決定される。
従って、設計どおりの抵抗値を得るためには、印刷膜
厚、形状寸法が正しく印刷形成される必要がある。通
常、上層導体パターン及び下層導体パターンの焼成後の
平均膜厚は、12μ前後、絶縁クロスは25μ前後である。
また、抵抗体印刷膜厚は25μ前後である。
(C) Problems to be Solved by the Invention Generally, in a thick film circuit device, a resistor (printing resistor)
Is represented by R = ρ · L / W. L is the length, W is the width, and ρ is the sheet resistance. That is, ρ is determined in a manufacturing process in which the dry film thickness at the time of printing is constant, and L and W are determined as a relational expression between the aspect ratio (L / W) and R in a constant manufacturing process after printing for each dimension. You.
Therefore, in order to obtain a resistance value as designed, it is necessary that the printed film thickness and shape dimensions are printed correctly. Usually, the average film thickness of the upper conductor pattern and the lower conductor pattern after firing is about 12 μm, and the thickness of the insulating cloth is about 25 μm.
The printed thickness of the resistor is about 25 μm.

ところで、第3図(A)に示すように、回路パターン
のレイアウトの関係上、絶縁クロス(上層導体パターン
74と下層導体パターン72を分離する)73が、抵抗体76の
近傍に配置されることがある。この場合、抵抗体76が両
絶縁クロス73、73に囲まれた谷間に位置することとな
り、抵抗体印刷面が印刷スキージ面より見て極めて低い
位置となる。つまり、印刷基板面より印刷機スキージ面
よりの高さhが約49μ程度となる。抵抗印刷において、
シルクスクリーンの開口部よりスキージにより投下され
る抵抗ペーストは、高さhとシルクスクリーンのエマル
ジョン膜厚の加算された距離より行われる〔第3図
(B)参照〕。従って、従来の抵抗印刷では、この距離
が大き過ぎるため、基板面に抵抗ペーストが正しく付着
しない。或いは付着しても膜厚および形状寸法が設計ど
おりとならない不利がある。もとより、厚膜回路の抵抗
体は、通常はトリミング操作により、目的抵抗値に調整
するものであるが、上記のように抵抗初期値が許容値を
越えているか、或いはトリミング下限より低い場合には
トリミング不良となり、製品歩留り低下、性能不良、製
品コストアップ等を招来する不利があった。また、絶縁
クロスを可能な限り抵抗体より離して配置することで、
絶縁クロスによる不利を解消することも考えられるが、
この場合、回路パターン設計の自由度が損なわれる等の
不利があった。
By the way, as shown in FIG. 3A, due to the layout of the circuit pattern, an insulating cloth (upper conductor pattern) is required.
74 (which separates the lower conductor pattern 72 from the lower conductor pattern 72) may be arranged near the resistor 76. In this case, the resistor 76 is located in a valley surrounded by the insulating cloths 73, 73, and the resistor printed surface is at a position extremely lower than the printing squeegee surface. That is, the height h from the printing board surface to the printing press squeegee surface is about 49 μ. In resistance printing,
The resistance paste dropped by the squeegee from the opening of the silk screen is formed from the sum of the height h and the emulsion film thickness of the silk screen (see FIG. 3 (B)). Therefore, in the conventional resistance printing, the distance is too large, so that the resistance paste does not correctly adhere to the substrate surface. Alternatively, there is a disadvantage that the film thickness and shape dimensions do not become as designed even if they adhere. Of course, the resistor of the thick film circuit is usually adjusted to the target resistance value by a trimming operation, but if the initial resistance value exceeds the allowable value or is lower than the lower limit of the trimming as described above, There is a disadvantage in that trimming is inferior, resulting in lower product yield, lower performance, higher product cost, and the like. Also, by arranging the insulation cloth as far as possible from the resistor,
It is conceivable to eliminate disadvantages caused by insulating cloth,
In this case, there is a disadvantage that the degree of freedom in circuit pattern design is impaired.

この発明は、自由な回路パターンが得られ、且つ設計
どおりの正しい抵抗値が得られる厚膜回路装置を提供す
ることを目的とする。
SUMMARY OF THE INVENTION It is an object of the present invention to provide a thick film circuit device that can obtain a free circuit pattern and obtain a correct resistance value as designed.

(ニ)課題を解決するための手段及び作用 この目的を達成させるために、この発明の厚膜回路装
置では、次のような構成としている。
(D) Means and action for solving the problem In order to achieve this object, the thick film circuit device of the present invention has the following configuration.

厚膜回路装置は、基板上面に複数の下層導体パターン
を形成し、この下層導体パターン上に一定幅・長さ・厚
みを有する絶縁クロスを形成し、この絶縁クロス上に少
なくとも2本の上層導体から成る上層導体パターンを形
成し、この2本の上層導体間に抵抗体を接続形成して構
成している。
The thick-film circuit device forms a plurality of lower-layer conductor patterns on an upper surface of a substrate, forms an insulating cloth having a constant width, length, and thickness on the lower-layer conductor patterns, and forms at least two upper-layer conductors on the insulating cloth. Is formed, and a resistor is connected and formed between the two upper conductors.

このような構成を有する厚膜回路装置では、基板上
に、例えば2本の下層導体パターンを一定間隔を存して
平行状に印刷形成し、一定幅・長さ・厚みを有する絶縁
クロスを、この両下層導体パターン上面に跨がって印刷
形成している。そして、少なくとも2本の上層導体から
成る上層導体パターンは、この絶縁クロス上に印刷形成
されている。更に、この2本の上層導体間に抵抗体が印
刷形成される。従って、抵抗体の印刷形成時において
は、絶縁クロス面上の厚みが12μmである上層導体のみ
(12μ+スクリーンエマルジョン厚)を考慮すれば良
い。つまり、抵抗印刷において絶縁クロス面が印刷基板
面と等価と成り、抵抗印刷面(絶縁クロス面)とシルク
スクリーン面との距離が極めて接近する。これにより、
シルクスクリーンの開口部よりスキージーにより透過さ
れる抵抗ペーストは、設計どおりの形状寸法(幅、長
さ)、厚みで両上層導体間に印刷形成し得る。従って、
抵抗体の抵抗値は、トリミング可能な範囲を維持し得、
製品歩留りの向上、性能の向上を達成できる許りでな
く、回路パターンの設計自由度を確保し得る。
In the thick-film circuit device having such a configuration, for example, two lower-layer conductor patterns are printed in parallel at predetermined intervals on a substrate, and an insulating cloth having a constant width, length, and thickness is formed. It is formed by printing over the upper surfaces of both lower conductor patterns. An upper conductor pattern including at least two upper conductors is printed on the insulating cloth. Further, a resistor is formed by printing between the two upper layer conductors. Therefore, when printing the resistor, only the upper layer conductor (12 μm + screen emulsion thickness) having a thickness of 12 μm on the insulating cloth surface may be considered. That is, in the resistance printing, the insulating cloth surface is equivalent to the printed board surface, and the distance between the resistance printing surface (insulating cloth surface) and the silk screen surface is extremely short. This allows
The resistive paste transmitted by the squeegee through the opening of the silk screen can be printed and formed between the upper conductors with the designed dimensions (width, length) and thickness as designed. Therefore,
The resistance value of the resistor can maintain a trimmable range,
Not only can the product yield and the performance be improved, but also the degree of freedom in circuit pattern design can be ensured.

(ホ)実施例 第1図は、この発明に係る厚膜回路装置の具体的な一
実施例を示す要部平面図、第2図は、要部側面図であ
る。
(E) Embodiment FIG. 1 is a plan view of a principal part showing a specific embodiment of a thick film circuit device according to the present invention, and FIG. 2 is a side view of a principal part.

厚膜回路装置は、基板1の上面に一定間隔を存した2
本の下層導体パターン2、2を平行状に印刷形成し、こ
の2本の下層導体パターン2、2上に、一定幅・長さ・
厚みを有する矩形の絶縁クロス3を直交状に印刷形成し
ている。つまり、絶縁クロス3は、この2本の下層導体
パターン2、2上に跨がって印刷形成される。そして、
この絶縁クロス3上に、上層導体パターン4が印刷形成
される。この上層導体パターン4は、2本の上層導体4
1、41にて構成されている。実施例では、二つの上層導
体パターン4、4が、絶縁クロス3の両端部から中央部
へかけて対向状に配置してある。各上層導体パターン
(上層導体41)4の基端部、つまり絶縁クロス3端部側
は、基板1上に形成した下層導体5と接続してある。ま
た、各上層導体パターン4の上層導体41、41の先端部に
は、上層導体41、41間を接続する抵抗体(抵抗素子)6
が印刷形成してある。この抵抗体6の印刷形成に際して
は、従来と同様にシルクスクリーンを使用し(図示せ
ず)、スクリーンの開口部よりスキージーにより抵抗ペ
ーストを透過して印刷焼成して形成する。
The thick-film circuit device has two
The two lower conductor patterns 2 and 2 are printed and formed in parallel, and a fixed width, length and
A rectangular insulating cloth 3 having a thickness is printed and formed orthogonally. That is, the insulating cloth 3 is formed by printing over the two lower-layer conductor patterns 2 and 2. And
An upper conductor pattern 4 is printed on the insulating cloth 3. This upper conductor pattern 4 is composed of two upper conductors 4
1 and 41. In the embodiment, the two upper-layer conductor patterns 4, 4 are arranged to face each other from both ends of the insulating cloth 3 to the center. The base end of each upper conductor pattern (upper conductor 41) 4, that is, the end of the insulating cloth 3 is connected to the lower conductor 5 formed on the substrate 1. Also, a resistor (resistance element) 6 for connecting the upper layer conductors 41, 41 is provided at the tip of the upper layer conductors 41, 41 of each upper layer conductor pattern 4.
Is printed. In printing the resistor 6, a silk screen is used (not shown) as in the prior art, and the resistor paste is transmitted through a resistor paste through an opening of the screen with a squeegee and printed and fired.

このような構成を有する厚膜回路装置では、基板1上
の下層導体パターン2上面に、絶縁クロス3を形成し、
この絶縁クロス3上に上層導体パターン4を形成してい
る。従って、上層導体パターン4の上層導体41、41間に
接続形成する抵抗体6は、その印刷形成時において、絶
縁クロス3面が印刷基板面と等価となる。これにより、
第2図の断面図で示すように、低抗体6印刷形成時、絶
縁クロス3上の上層導体41厚み(12μ)とスクリーンエ
マルジョン厚みとを考慮するだけで良い。つまり、絶縁
クロス3面とシルクスクリーン面との間隔が極めて小さ
い(第2図で示す「h」参照)。従って、従来のように
抵抗印刷面の近傍に位置する厚みの厚い(基板1面より
高さの高い)絶縁クロス3が邪魔になることがなく、抵
抗ペーストは設計どおりの形状寸法(幅、長さ)、厚み
に形成し得る。
In the thick film circuit device having such a configuration, the insulating cloth 3 is formed on the upper surface of the lower conductor pattern 2 on the substrate 1,
An upper conductor pattern 4 is formed on the insulating cloth 3. Therefore, in the resistor 6 connected between the upper conductors 41, 41 of the upper conductor pattern 4, the surface of the insulating cloth 3 becomes equivalent to the surface of the printed board at the time of printing. This allows
As shown in the cross-sectional view of FIG. 2, it is only necessary to consider the thickness (12 μ) of the upper conductor 41 on the insulating cloth 3 and the thickness of the screen emulsion when forming the low antibody 6 print. That is, the distance between the insulating cloth 3 surface and the silk screen surface is extremely small (see “h” shown in FIG. 2). Accordingly, the thick insulating cloth 3 (having a height higher than the surface of the substrate 1) located in the vicinity of the resistive printing surface does not interfere with the conventional method, and the resistive paste has the designed shape and dimensions (width and length). ), It can be formed to a thickness

かくして、抵抗値はトリミング可能な範囲に形成で
き、製品の歩留りが改善され、結果的に性能向上、コス
トダウンを実現し得る。
Thus, the resistance value can be formed in a range that can be trimmed, the yield of the product is improved, and as a result, the performance can be improved and the cost can be reduced.

尚、印刷抵抗体6下の絶縁クロス3の印刷は、通常2
回であるが、他のスキージー印刷面の関係上、印刷回数
を増やして絶縁クロス3厚みを調節することで、より再
現性の良い印刷抵抗体6の実現が可能となる。
The printing of the insulating cloth 3 under the printing resistor 6 is usually performed by 2
Although the number of times, the number of times of printing is increased and the thickness of the insulating cloth 3 is adjusted in relation to other squeegee printing surfaces, so that a print resistor 6 with higher reproducibility can be realized.

(ヘ)発明の効果 この発明では、以上のように、基板の上面に形成した
下層導体パターンに、一定幅・長さ・厚みを有する絶縁
クロスを形成し、この絶縁クロス上に上層導体パターン
を形成することとしたから、上層導体パターンを構成す
る各上層導体間に抵抗体を形成する際、抵抗印刷時にお
いて絶縁クロス面が印刷基板面に等価となる。従って、
絶縁クロス面とシルクスクリーン面との間隔が極めて狭
く、設計どおりの長さ、幅、厚みをもった抵抗体が得ら
れる。これにより、従来のように抵抗体印刷面と絶縁ク
ロスとが近傍に位置する結果、抵抗体の抵抗値が設計ど
おりとならず、トリミング不能、製品歩留り悪化等が解
消される許かりでなく、パターン設計の自由度が確保さ
れ、且つ性能向上を達成する等、発明目的を達成した優
れた効果を有する。
(F) Effects of the Invention In the present invention, as described above, an insulating cloth having a fixed width, length, and thickness is formed on a lower conductive pattern formed on the upper surface of a substrate, and an upper conductive pattern is formed on the insulating cloth. When the resistor is formed between the upper conductors forming the upper conductor pattern, the insulating cloth surface is equivalent to the printed board surface during resistance printing. Therefore,
The distance between the insulating cloth surface and the silk screen surface is extremely small, and a resistor having the designed length, width and thickness can be obtained. As a result, the resistor printed surface and the insulating cloth are located close to each other as in the related art, so that the resistance value of the resistor is not as designed, trimming is impossible, and product yield deterioration is not allowed. It has excellent effects of achieving the object of the invention, such as securing the freedom of pattern design and improving the performance.

【図面の簡単な説明】[Brief description of the drawings]

第1図は、実施例厚膜回路装置を示す要部平面図、第2
図は、実施例厚膜回路装置を示す要部側面図、第3図
(A)は、従来の厚膜回路装置を示す要部平面図、第3
図(B)は、従来の厚膜回路装置を示す要部断面図であ
る。 1:基板、2:下層導体パターン、 3:絶縁クロス、4:上層導体パターン、 6:抵抗体。
FIG. 1 is a plan view of an essential part showing a thick film circuit device according to an embodiment, and FIG.
FIG. 1 is a side view of a main part showing a thick film circuit device according to an embodiment. FIG. 3 (A) is a plan view of a main part showing a conventional thick film circuit device.
FIG. 1B is a sectional view of a main part showing a conventional thick film circuit device. 1: substrate, 2: lower conductor pattern, 3: insulating cloth, 4: upper conductor pattern, 6: resistor.

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】基板上面に複数の下層導体パターンを形成
し、この下層導体パターン上に一定幅・長さ・厚みを有
する絶縁クロスを形成し、この絶縁クロス上に少なくと
も2本の上層導体から成る上層導体パターンを形成し、
この2本の上層導体間に抵抗体を接続形成して成る厚膜
回路装置。
A plurality of lower conductor patterns are formed on an upper surface of a substrate, and an insulating cloth having a constant width, length, and thickness is formed on the lower conductor pattern. At least two upper conductors are formed on the insulating cloth. Forming an upper conductor pattern,
A thick film circuit device comprising a resistor connected between the two upper conductors.
JP63209895A 1988-08-24 1988-08-24 Thick film circuit device Expired - Lifetime JP2623748B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63209895A JP2623748B2 (en) 1988-08-24 1988-08-24 Thick film circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63209895A JP2623748B2 (en) 1988-08-24 1988-08-24 Thick film circuit device

Publications (2)

Publication Number Publication Date
JPH0258392A JPH0258392A (en) 1990-02-27
JP2623748B2 true JP2623748B2 (en) 1997-06-25

Family

ID=16580423

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63209895A Expired - Lifetime JP2623748B2 (en) 1988-08-24 1988-08-24 Thick film circuit device

Country Status (1)

Country Link
JP (1) JP2623748B2 (en)

Also Published As

Publication number Publication date
JPH0258392A (en) 1990-02-27

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