JP2025072256A - 監視モジュール、ｘ線回折装置および監視システム - Google Patents

監視モジュール、ｘ線回折装置および監視システム Download PDF

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Publication number
JP2025072256A
JP2025072256A JP2023182868A JP2023182868A JP2025072256A JP 2025072256 A JP2025072256 A JP 2025072256A JP 2023182868 A JP2023182868 A JP 2023182868A JP 2023182868 A JP2023182868 A JP 2023182868A JP 2025072256 A JP2025072256 A JP 2025072256A
Authority
JP
Japan
Prior art keywords
stepping motor
monitoring
monitoring module
unit
rotation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023182868A
Other languages
English (en)
Japanese (ja)
Other versions
JP2025072256A5 (https=
Inventor
雄二 畑山
Yuji Hatakeyama
義博 伊庭
Yoshihiro Iba
智康 上田
Tomoyasu Ueda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Rigaku Corp
Original Assignee
Rigaku Denki Co Ltd
Rigaku Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd, Rigaku Corp filed Critical Rigaku Denki Co Ltd
Priority to JP2023182868A priority Critical patent/JP2025072256A/ja
Priority to DE102024128883.3A priority patent/DE102024128883A1/de
Priority to CN202411486100.XA priority patent/CN119881636A/zh
Priority to US18/923,778 priority patent/US20250132706A1/en
Publication of JP2025072256A publication Critical patent/JP2025072256A/ja
Publication of JP2025072256A5 publication Critical patent/JP2025072256A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/34—Testing dynamo-electric machines
    • G01R31/343—Testing dynamo-electric machines in operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20016—Goniometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02P—CONTROL OR REGULATION OF ELECTRIC MOTORS, ELECTRIC GENERATORS OR DYNAMO-ELECTRIC CONVERTERS; CONTROLLING TRANSFORMERS, REACTORS OR CHOKE COILS
    • H02P8/00—Arrangements for controlling dynamo-electric motors rotating step by step
    • H02P8/34—Monitoring operation
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02P—CONTROL OR REGULATION OF ELECTRIC MOTORS, ELECTRIC GENERATORS OR DYNAMO-ELECTRIC CONVERTERS; CONTROLLING TRANSFORMERS, REACTORS OR CHOKE COILS
    • H02P2209/00—Indexing scheme relating to controlling arrangements characterised by the waveform of the supplied voltage or current
    • H02P2209/09—PWM with fixed limited number of pulses per period

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Control Of Stepping Motors (AREA)
JP2023182868A 2023-10-24 2023-10-24 監視モジュール、ｘ線回折装置および監視システム Pending JP2025072256A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2023182868A JP2025072256A (ja) 2023-10-24 2023-10-24 監視モジュール、ｘ線回折装置および監視システム
DE102024128883.3A DE102024128883A1 (de) 2023-10-24 2024-10-08 Überwachungsmodul, röntgenbeugungsvorrichtung und überwachungssystem
CN202411486100.XA CN119881636A (zh) 2023-10-24 2024-10-23 监视模块、x射线衍射装置以及监视系统
US18/923,778 US20250132706A1 (en) 2023-10-24 2024-10-23 Monitoring module, x-ray diffraction apparatus, and monitoring system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2023182868A JP2025072256A (ja) 2023-10-24 2023-10-24 監視モジュール、ｘ線回折装置および監視システム

Publications (2)

Publication Number Publication Date
JP2025072256A true JP2025072256A (ja) 2025-05-09
JP2025072256A5 JP2025072256A5 (https=) 2025-12-23

Family

ID=95251543

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023182868A Pending JP2025072256A (ja) 2023-10-24 2023-10-24 監視モジュール、ｘ線回折装置および監視システム

Country Status (4)

Country Link
US (1) US20250132706A1 (https=)
JP (1) JP2025072256A (https=)
CN (1) CN119881636A (https=)
DE (1) DE102024128883A1 (https=)

Also Published As

Publication number Publication date
CN119881636A (zh) 2025-04-25
DE102024128883A1 (de) 2025-04-24
US20250132706A1 (en) 2025-04-24

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